USD602882S1 - Wafer carrying-in/out apparatus - Google Patents
Wafer carrying-in/out apparatus Download PDFInfo
- Publication number
- USD602882S1 USD602882S1 US29/322,398 US32239808F USD602882S US D602882 S1 USD602882 S1 US D602882S1 US 32239808 F US32239808 F US 32239808F US D602882 S USD602882 S US D602882S
- Authority
- US
- United States
- Prior art keywords
- out apparatus
- wafer carrying
- wafer
- carrying
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
Claims (1)
- The ornamental design for a wafer carrying-in/out apparatus or the like, as shown and described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/322,398 USD602882S1 (en) | 2006-03-30 | 2008-08-04 | Wafer carrying-in/out apparatus |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006-008283 | 2006-03-30 | ||
| JP2006008283 | 2006-03-30 | ||
| US29/266,907 USD607424S1 (en) | 2006-03-30 | 2006-10-02 | Wafer carrying-in/out apparatus |
| US29/322,398 USD602882S1 (en) | 2006-03-30 | 2008-08-04 | Wafer carrying-in/out apparatus |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/266,907 Division USD607424S1 (en) | 2006-03-30 | 2006-10-02 | Wafer carrying-in/out apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD602882S1 true USD602882S1 (en) | 2009-10-27 |
Family
ID=41211418
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/266,907 Expired - Lifetime USD607424S1 (en) | 2006-03-30 | 2006-10-02 | Wafer carrying-in/out apparatus |
| US29/322,398 Expired - Lifetime USD602882S1 (en) | 2006-03-30 | 2008-08-04 | Wafer carrying-in/out apparatus |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/266,907 Expired - Lifetime USD607424S1 (en) | 2006-03-30 | 2006-10-02 | Wafer carrying-in/out apparatus |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | USD607424S1 (en) |
| TW (1) | TWD119731S1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD652395S1 (en) * | 2010-06-01 | 2012-01-17 | Hitachi Kokusai Electric Inc. | Semiconductor manufacturing equipment |
| TWD143036S1 (en) * | 2010-06-01 | 2011-10-01 | 日立國際電氣股份有限公司 | Semiconductor manufacturing machine |
| JP1728449S (en) * | 2022-03-30 | 2022-10-27 | Substrate processing equipment |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5364222A (en) | 1992-02-05 | 1994-11-15 | Tokyo Electron Limited | Apparatus for processing wafer-shaped substrates |
| US5498199A (en) * | 1992-06-15 | 1996-03-12 | Speedfam Corporation | Wafer polishing method and apparatus |
| US5628828A (en) | 1994-03-04 | 1997-05-13 | Hitachi , Ltd. | Processing method and equipment for processing a semiconductor device having holder/carrier with flattened surface |
| US6033521A (en) | 1997-06-04 | 2000-03-07 | Speedfam-Ipec Corporation | Tilt mechanism for wafer cassette |
| US20020028399A1 (en) | 2000-06-27 | 2002-03-07 | Mamoru Nakasuji | Inspection system by charged particle beam and method of manufacturing devices using the system |
| US6405610B1 (en) | 1995-11-14 | 2002-06-18 | Nikon Corporation | Wafer inspection apparatus |
| US6580087B1 (en) | 1999-10-15 | 2003-06-17 | Sony Corporation | Inspection apparatus |
| US20030169916A1 (en) | 2002-02-19 | 2003-09-11 | Toshiba Ceramics Co., Ltd. | Wafer inspection apparatus |
| US20040095575A1 (en) | 2002-11-19 | 2004-05-20 | Jai-Young Woo | Apparatus for inspecting a wafer |
| US20040141831A1 (en) | 2002-07-22 | 2004-07-22 | Ulysses Gilchrist | Substrate loading and uploading station with buffer |
| US20040146378A1 (en) | 2002-12-30 | 2004-07-29 | Tdk Corporation | Wafer processing apparatus having dust proof function |
| US7109483B2 (en) | 2000-11-17 | 2006-09-19 | Ebara Corporation | Method for inspecting substrate, substrate inspecting system and electron beam apparatus |
| US20070031236A1 (en) | 2005-08-05 | 2007-02-08 | Advanced Micro-Fabrication Equipment, Inc. Asia | Semiconductor processing system; a semiconductor processing chamber; and a method for loading, unloading and exchanging semiconductor work pieces from a semiconductor processing chamber |
| US20070098527A1 (en) | 2005-07-11 | 2007-05-03 | Hall Daniel A | Equipment storage for substrate processing apparatus |
-
2006
- 2006-09-27 TW TW095305411F patent/TWD119731S1/en unknown
- 2006-10-02 US US29/266,907 patent/USD607424S1/en not_active Expired - Lifetime
-
2008
- 2008-08-04 US US29/322,398 patent/USD602882S1/en not_active Expired - Lifetime
Patent Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5364222A (en) | 1992-02-05 | 1994-11-15 | Tokyo Electron Limited | Apparatus for processing wafer-shaped substrates |
| US5498199A (en) * | 1992-06-15 | 1996-03-12 | Speedfam Corporation | Wafer polishing method and apparatus |
| US5628828A (en) | 1994-03-04 | 1997-05-13 | Hitachi , Ltd. | Processing method and equipment for processing a semiconductor device having holder/carrier with flattened surface |
| US6405610B1 (en) | 1995-11-14 | 2002-06-18 | Nikon Corporation | Wafer inspection apparatus |
| US6033521A (en) | 1997-06-04 | 2000-03-07 | Speedfam-Ipec Corporation | Tilt mechanism for wafer cassette |
| US6580087B1 (en) | 1999-10-15 | 2003-06-17 | Sony Corporation | Inspection apparatus |
| US20020028399A1 (en) | 2000-06-27 | 2002-03-07 | Mamoru Nakasuji | Inspection system by charged particle beam and method of manufacturing devices using the system |
| US7109483B2 (en) | 2000-11-17 | 2006-09-19 | Ebara Corporation | Method for inspecting substrate, substrate inspecting system and electron beam apparatus |
| US20030169916A1 (en) | 2002-02-19 | 2003-09-11 | Toshiba Ceramics Co., Ltd. | Wafer inspection apparatus |
| US20040141831A1 (en) | 2002-07-22 | 2004-07-22 | Ulysses Gilchrist | Substrate loading and uploading station with buffer |
| US20040095575A1 (en) | 2002-11-19 | 2004-05-20 | Jai-Young Woo | Apparatus for inspecting a wafer |
| US20040146378A1 (en) | 2002-12-30 | 2004-07-29 | Tdk Corporation | Wafer processing apparatus having dust proof function |
| US20070098527A1 (en) | 2005-07-11 | 2007-05-03 | Hall Daniel A | Equipment storage for substrate processing apparatus |
| US20070031236A1 (en) | 2005-08-05 | 2007-02-08 | Advanced Micro-Fabrication Equipment, Inc. Asia | Semiconductor processing system; a semiconductor processing chamber; and a method for loading, unloading and exchanging semiconductor work pieces from a semiconductor processing chamber |
Also Published As
| Publication number | Publication date |
|---|---|
| USD607424S1 (en) | 2010-01-05 |
| TWD119731S1 (en) | 2007-11-01 |
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