USD559715S1 - Electrical test instrument body - Google Patents

Electrical test instrument body Download PDF

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Publication number
USD559715S1
USD559715S1 US29/258,975 US25897506F USD559715S US D559715 S1 USD559715 S1 US D559715S1 US 25897506 F US25897506 F US 25897506F US D559715 S USD559715 S US D559715S
Authority
US
United States
Prior art keywords
instrument body
test instrument
electrical test
design
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/258,975
Inventor
B. Matthew Marzynski
Tim Richter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Priority to US29/258,975 priority Critical patent/USD559715S1/en
Assigned to FLUKE CORPORATION reassignment FLUKE CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MARZYNSKI, B. MATTHEW, RICHTER, TIM
Application granted granted Critical
Publication of USD559715S1 publication Critical patent/USD559715S1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of an electrical test instrument body showing our new design.
FIG. 2 is a front elevational view of the design of FIG. 1.
FIG. 3 is a rear elevational view of the design of FIG. 1.
FIG. 4 is a top plan view of the design of FIG. 1.
FIG. 5 is a bottom plan view of the design of FIG. 1.
FIG. 6 is a right side elevational view of the design of FIG. 1; and,
FIG. 7 is a left side elevational view of the design of FIG. 1.
The details shown in broken lines are included for illustrative purposes only and form no part of the claimed design.

Claims (1)

    CLAIM
  1. I claim the ornamental design for an electrical test instrument body, as shown and described.
US29/258,975 2006-04-27 2006-04-27 Electrical test instrument body Expired - Lifetime USD559715S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/258,975 USD559715S1 (en) 2006-04-27 2006-04-27 Electrical test instrument body

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/258,975 USD559715S1 (en) 2006-04-27 2006-04-27 Electrical test instrument body

Publications (1)

Publication Number Publication Date
USD559715S1 true USD559715S1 (en) 2008-01-15

Family

ID=38921340

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/258,975 Expired - Lifetime USD559715S1 (en) 2006-04-27 2006-04-27 Electrical test instrument body

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US (1) USD559715S1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD719040S1 (en) 2013-07-12 2014-12-09 Milwaukee Electric Tool Corporation Electrical tester
USD724976S1 (en) 2013-12-31 2015-03-24 Milwaukee Electric Tool Corporation Electrical tester
US9664708B2 (en) 2014-01-09 2017-05-30 Milwaukee Electric Tool Corporation Test and measurement device including grooves for receiving probes in a use position
USD1096465S1 (en) * 2024-04-19 2025-10-07 Hopkins Manufacturing Corporation Wire testing device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD359006S (en) 1994-04-05 1995-06-06 Fluke Corporation Digital clamp meter
USD399150S (en) * 1997-10-29 1998-10-06 Fluke Corporation Electrical tester
US6043640A (en) * 1997-10-29 2000-03-28 Fluke Corporation Multimeter with current sensor
USD474704S1 (en) 2001-05-14 2003-05-20 Fluke Corporation Electrical test instrument body
USD490331S1 (en) * 2002-11-06 2004-05-25 Kyoritsu Electrical Instruments Works, Ltd. Volt-ammeter
US6967473B1 (en) * 2004-05-27 2005-11-22 Tektronix, Inc. Attachable/detachable variable spacing probing tip system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD359006S (en) 1994-04-05 1995-06-06 Fluke Corporation Digital clamp meter
USD399150S (en) * 1997-10-29 1998-10-06 Fluke Corporation Electrical tester
US6043640A (en) * 1997-10-29 2000-03-28 Fluke Corporation Multimeter with current sensor
USD474704S1 (en) 2001-05-14 2003-05-20 Fluke Corporation Electrical test instrument body
USD490331S1 (en) * 2002-11-06 2004-05-25 Kyoritsu Electrical Instruments Works, Ltd. Volt-ammeter
US6967473B1 (en) * 2004-05-27 2005-11-22 Tektronix, Inc. Attachable/detachable variable spacing probing tip system

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD719040S1 (en) 2013-07-12 2014-12-09 Milwaukee Electric Tool Corporation Electrical tester
USD724976S1 (en) 2013-12-31 2015-03-24 Milwaukee Electric Tool Corporation Electrical tester
USD738242S1 (en) 2013-12-31 2015-09-08 Milwaukee Electric Tool Corporation Electrical tester
US9664708B2 (en) 2014-01-09 2017-05-30 Milwaukee Electric Tool Corporation Test and measurement device including grooves for receiving probes in a use position
USD1096465S1 (en) * 2024-04-19 2025-10-07 Hopkins Manufacturing Corporation Wire testing device

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