USD511981S1 - Semiconductor integrated circuit test head - Google Patents

Semiconductor integrated circuit test head Download PDF

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Publication number
USD511981S1
USD511981S1 US29/201,978 US20197804F USD511981S US D511981 S1 USD511981 S1 US D511981S1 US 20197804 F US20197804 F US 20197804F US D511981 S USD511981 S US D511981S
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US
United States
Prior art keywords
integrated circuit
semiconductor integrated
test head
circuit test
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/201,978
Inventor
Wayne H. Miller
Ichiang Sun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Credence Systems Corp
Xcerra Corp
Original Assignee
Credence Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Credence Systems Corp filed Critical Credence Systems Corp
Priority to US29/201,978 priority Critical patent/USD511981S1/en
Assigned to CREDENCE SYSTEMS CORPORATION reassignment CREDENCE SYSTEMS CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MILLER, WAYNE H., SUN, ICHIANG
Application granted granted Critical
Publication of USD511981S1 publication Critical patent/USD511981S1/en
Assigned to SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT reassignment SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT SECURITY AGREEMENT Assignors: EVERETT CHARLES TECHNOLOGIES LLC, LTX-CREDENCE CORPORATION
Assigned to XCERRA CORPORATION reassignment XCERRA CORPORATION CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: LTX-CREDENCE CORPORATION
Assigned to SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT reassignment SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT SECURITY AGREEMENT Assignors: EVERETT CHARLES TECHNOLOGIES LLC, XCERRA CORPORATION
Assigned to EVERETT CHARLES TECHNOLOGIES LLC, XCERRA CORPORATION reassignment EVERETT CHARLES TECHNOLOGIES LLC RELEASE OF SECURITY INTEREST IN UNITED STATES PATENTS Assignors: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Assigned to SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT reassignment SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 7261561 AND REPLACE WITH PATENT NUMBER 7231561 PREVIOUSLY RECORDED ON REEL 034660 FRAME 0188. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Assignors: EVERETT CHARLES TECHNOLOGIES LLC, XCERRA CORPORATION
Assigned to DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT reassignment DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT PATENT SECURITY AGREEMENT Assignors: XCERRA CORPORATION
Assigned to DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT reassignment DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT STATEMENT THAT THIS DOCUMENT SERVES AS AN OATH/DECLARATION PREVIOUSLY RECORDED ON REEL 047185 FRAME 0628. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT. Assignors: XCERRA CORPORATION
Anticipated expiration legal-status Critical
Assigned to XCERRA CORPORATION reassignment XCERRA CORPORATION TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS, RECORDED AT REEL 047185, FRAME 0624 Assignors: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a perspective view of a semiconductor integrated circuit test head showing my new design,
FIG. 2 is an end elevation thereof, the opposite end elevation being of corresponding appearance,
FIG. 3 is a side elevation thereof; and,
FIG. 4 is a top plan view thereof.

Claims (1)

  1. The ornamental design for a semiconductor integrated circuit test head, as shown and described.
US29/201,978 2004-03-23 2004-03-23 Semiconductor integrated circuit test head Expired - Lifetime USD511981S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/201,978 USD511981S1 (en) 2004-03-23 2004-03-23 Semiconductor integrated circuit test head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/201,978 USD511981S1 (en) 2004-03-23 2004-03-23 Semiconductor integrated circuit test head

Publications (1)

Publication Number Publication Date
USD511981S1 true USD511981S1 (en) 2005-11-29

Family

ID=35405543

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/201,978 Expired - Lifetime USD511981S1 (en) 2004-03-23 2004-03-23 Semiconductor integrated circuit test head

Country Status (1)

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US (1) USD511981S1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD929248S1 (en) * 2019-10-10 2021-08-31 Aukey Technology Co., Ltd Laser level

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD345705S (en) * 1992-03-09 1994-04-05 Tti Testron, Inc. Head assembly for a printed circuit board test fixture
USD369983S (en) * 1995-06-12 1996-05-21 Hickok Incorporated Capacitive electronic sensor head
US6642729B2 (en) * 2001-06-16 2003-11-04 Samsung Electronics Co., Ltd. Probe card for tester head

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD345705S (en) * 1992-03-09 1994-04-05 Tti Testron, Inc. Head assembly for a printed circuit board test fixture
USD369983S (en) * 1995-06-12 1996-05-21 Hickok Incorporated Capacitive electronic sensor head
US6642729B2 (en) * 2001-06-16 2003-11-04 Samsung Electronics Co., Ltd. Probe card for tester head

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD929248S1 (en) * 2019-10-10 2021-08-31 Aukey Technology Co., Ltd Laser level

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