USD444401S1 - Electrical test probe wedge tip - Google Patents

Electrical test probe wedge tip Download PDF

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Publication number
USD444401S1
USD444401S1 US29/127,136 US12713600F USD444401S US D444401 S1 USD444401 S1 US D444401S1 US 12713600 F US12713600 F US 12713600F US D444401 S USD444401 S US D444401S
Authority
US
United States
Prior art keywords
test probe
electrical test
wedge tip
probe wedge
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/127,136
Inventor
Julie A. Campbell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teledyne LeCroy Inc
Original Assignee
Lecroy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US29/127,136 priority Critical patent/USD444401S1/en
Application filed by Lecroy Corp filed Critical Lecroy Corp
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CAMPBELL, JULIE A.
Application granted granted Critical
Publication of USD444401S1 publication Critical patent/USD444401S1/en
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION CHANGE OF ADDRESS Assignors: LECROY CORPORATION
Assigned to BANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENT reassignment BANK OF NEW YORK, THE, AS ADMINISTRATIVE AGENT GRANT OF SECURITY INTEREST Assignors: LECROY CORPORATION
Assigned to MANUFACTURERS AND TRADERS TRUST COMPANY reassignment MANUFACTURERS AND TRADERS TRUST COMPANY SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to MANUFACTURERS AND TRADERS TRUST COMPANY reassignment MANUFACTURERS AND TRADERS TRUST COMPANY SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT reassignment RBS CITIZENS, N.A., AS ADMINISTRATIVE AGENT SECURITY AGREEMENT Assignors: LECROY CORPORATION
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: MANUFACTURERS AND TRADERS TRUST COMPANY, AS AGENT
Assigned to TELEDYNE LECROY, INC. reassignment TELEDYNE LECROY, INC. MERGER (SEE DOCUMENT FOR DETAILS). Assignors: LECROY CORPORATION
Assigned to TELEDYNE LECROY, INC. reassignment TELEDYNE LECROY, INC. RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: RBS CITIZENS, N.A.
Assigned to LECROY CORPORATION reassignment LECROY CORPORATION RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). Assignors: JP MORGAN CHASE BANK, N.A. AS ADMINISTRATIVE AGENT SUCCESSOR ADMINISTRATIVE AGENT TO THE BANK OF NEW YORK
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a general perspective view of an electrical test probe wedge tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 2 is a front view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 3 is a right side view of the electrical test probe wedge tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a back view of the electrical test probe wedge tip, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 5 is a top view of the electrical test probe wedge tip; and,
FIG. 6 is a bottom view of the electrical test probe wedge tip.

Claims (1)

  1. The ornamental design for an electrical test probe wedge tip, as shown and described.
US29/127,136 2000-07-31 2000-07-31 Electrical test probe wedge tip Expired - Lifetime USD444401S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/127,136 USD444401S1 (en) 2000-07-31 2000-07-31 Electrical test probe wedge tip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US29/127,136 USD444401S1 (en) 2000-07-31 2000-07-31 Electrical test probe wedge tip

Publications (1)

Publication Number Publication Date
USD444401S1 true USD444401S1 (en) 2001-07-03

Family

ID=22428483

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/127,136 Expired - Lifetime USD444401S1 (en) 2000-07-31 2000-07-31 Electrical test probe wedge tip

Country Status (1)

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US (1) USD444401S1 (en)

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6846735B1 (en) 2002-09-05 2005-01-25 Bridge Semiconductor Corporation Compliant test probe with jagged contact surface
US7671613B1 (en) 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
US20110241708A1 (en) * 2005-02-11 2011-10-06 Wintec Industries, Inc. Apparatus for predetermined component placement to a target platform
USD700086S1 (en) * 2012-09-07 2014-02-25 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope probe
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US9253894B2 (en) 2005-02-11 2016-02-02 Wintec Industries, Inc. Electronic assembly with detachable components
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
USD904212S1 (en) * 2019-04-15 2020-12-08 Ingun Prüfmittelbau Gmbh Self-cleaning head shape
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD427091S (en) 1999-10-29 2000-06-27 Fluke Corporation Electrical probe
USD427535S (en) 1999-10-29 2000-07-04 Fluke Corporation Electrical probe

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD427091S (en) 1999-10-29 2000-06-27 Fluke Corporation Electrical probe
USD427535S (en) 1999-10-29 2000-07-04 Fluke Corporation Electrical probe

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6846735B1 (en) 2002-09-05 2005-01-25 Bridge Semiconductor Corporation Compliant test probe with jagged contact surface
US20110241708A1 (en) * 2005-02-11 2011-10-06 Wintec Industries, Inc. Apparatus for predetermined component placement to a target platform
US9253894B2 (en) 2005-02-11 2016-02-02 Wintec Industries, Inc. Electronic assembly with detachable components
US7671613B1 (en) 2006-01-06 2010-03-02 Lecroy Corporation Probing blade conductive connector for use with an electrical test probe
US8098078B1 (en) 2006-01-06 2012-01-17 Lecroy Corporation Probing blade with conductive connector for use with an electrical test probe
US9140724B1 (en) 2006-01-06 2015-09-22 Lecroy Corporation Compensating resistance probing tip optimized adapters for use with specific electrical test probes
US9404940B1 (en) 2006-01-06 2016-08-02 Teledyne Lecroy, Inc. Compensating probing tip optimized adapters for use with specific electrical test probes
USD700086S1 (en) * 2012-09-07 2014-02-25 Rohde & Schwarz Gmbh & Co. Kg Oscilloscope probe
US9810715B2 (en) 2014-12-31 2017-11-07 Tektronix, Inc. High impedance compliant probe tip
US10119992B2 (en) 2015-04-01 2018-11-06 Tektronix, Inc. High impedance compliant probe tip
USD904212S1 (en) * 2019-04-15 2020-12-08 Ingun Prüfmittelbau Gmbh Self-cleaning head shape
USD942290S1 (en) * 2019-07-12 2022-02-01 Johnstech International Corporation Tip for integrated circuit test pin

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