USD422518S - Electrical instrument probe tip - Google Patents
Electrical instrument probe tip Download PDFInfo
- Publication number
- USD422518S USD422518S US29/103,523 US10352399F USD422518S US D422518 S USD422518 S US D422518S US 10352399 F US10352399 F US 10352399F US D422518 S USD422518 S US D422518S
- Authority
- US
- United States
- Prior art keywords
- probe tip
- electrical instrument
- instrument probe
- electrical
- elevational view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 title claims description 6
Images
Description
FIG. 1 is a perspective view of an electrical instrument probe tip showing my new design;
FIG. 2 is a right side elevational view thereof, the left side elevational view being a mirror image of FIG. 2;
FIG. 3 is a top elevational view thereof;
FIG. 4 is a bottom elevational view thereof; and,
FIG. 5 is a front elevational view thereof.
The broken line representations of an electrical instrument in FIGS. 1-5 are exemplary and form no part of the claimed design.
Claims (1)
- The ornamental design for an electrical instrument probe tip, as shown and described.
Publications (1)
Publication Number | Publication Date |
---|---|
USD422518S true USD422518S (en) | 2000-04-11 |
Family
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030189437A1 (en) * | 2000-07-31 | 2003-10-09 | Lecroy Corporation | Notched electrical test probe tip |
US20070084903A1 (en) * | 2005-10-13 | 2007-04-19 | Alexander Leon | Pronged fork probe tip |
USD904212S1 (en) * | 2019-04-15 | 2020-12-08 | Ingun Prüfmittelbau Gmbh | Self-cleaning head shape |
US11016128B2 (en) | 2017-12-08 | 2021-05-25 | Jeff R. Magno | Method and apparatus for electrical line testing |
US11474162B2 (en) | 2017-12-08 | 2022-10-18 | Jeff R. Magno | Method and apparatus for electrical line testing |
Non-Patent Citations (1)
Title |
---|
FCB International Co., Walnut Creek, Cal., brochure entitled "Electric Finder", undated, admitted prior art. |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030189437A1 (en) * | 2000-07-31 | 2003-10-09 | Lecroy Corporation | Notched electrical test probe tip |
US6809535B2 (en) | 2000-07-31 | 2004-10-26 | Lecroy Corporation | Notched electrical test probe tip |
US20050052193A1 (en) * | 2000-07-31 | 2005-03-10 | Lecroy Corporation | Notched electrical test probe tip |
US7140105B2 (en) | 2000-07-31 | 2006-11-28 | Lecroy Corporation | Method of fabricating a notched electrical test probe tip |
US20070084903A1 (en) * | 2005-10-13 | 2007-04-19 | Alexander Leon | Pronged fork probe tip |
US11016128B2 (en) | 2017-12-08 | 2021-05-25 | Jeff R. Magno | Method and apparatus for electrical line testing |
US11474162B2 (en) | 2017-12-08 | 2022-10-18 | Jeff R. Magno | Method and apparatus for electrical line testing |
USD904212S1 (en) * | 2019-04-15 | 2020-12-08 | Ingun Prüfmittelbau Gmbh | Self-cleaning head shape |
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