USD400454S - Voltage tester - Google Patents
Voltage tester Download PDFInfo
- Publication number
- USD400454S USD400454S US29/070,516 US7051697F USD400454S US D400454 S USD400454 S US D400454S US 7051697 F US7051697 F US 7051697F US D400454 S USD400454 S US D400454S
- Authority
- US
- United States
- Prior art keywords
- voltage tester
- voltage
- tester
- elevational view
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front elevational view of the voltage tester according to our new design;
FIG. 2 is a side elevational view thereof, as seen from the right side of FIG. 1;
FIG. 3 is a side elevational view thereof, as seen from the left side of FIG. 1;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan view thereof.
Claims (1)
- The ornamental design for a voltage tester, as shown.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/070,516 USD400454S (en) | 1997-05-09 | 1997-05-09 | Voltage tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/070,516 USD400454S (en) | 1997-05-09 | 1997-05-09 | Voltage tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD400454S true USD400454S (en) | 1998-11-03 |
Family
ID=71612264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/070,516 Expired - Lifetime USD400454S (en) | 1997-05-09 | 1997-05-09 | Voltage tester |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD400454S (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD408307S (en) * | 1998-05-29 | 1999-04-20 | National Electric Mfg. Corp. | Circuit tester |
| USD427534S (en) * | 1999-04-19 | 2000-07-04 | Ch. Beha Gmbh Technische Neuentwicklungen | Measuring instrument |
| USD724592S1 (en) * | 2014-02-21 | 2015-03-17 | Amazon Technologies, Inc. | Scanner device |
| USD947694S1 (en) * | 2019-08-09 | 2022-04-05 | Pokit Innovations Pty Ltd | Electronic measurement device |
-
1997
- 1997-05-09 US US29/070,516 patent/USD400454S/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD408307S (en) * | 1998-05-29 | 1999-04-20 | National Electric Mfg. Corp. | Circuit tester |
| USD427534S (en) * | 1999-04-19 | 2000-07-04 | Ch. Beha Gmbh Technische Neuentwicklungen | Measuring instrument |
| USD724592S1 (en) * | 2014-02-21 | 2015-03-17 | Amazon Technologies, Inc. | Scanner device |
| USD947694S1 (en) * | 2019-08-09 | 2022-04-05 | Pokit Innovations Pty Ltd | Electronic measurement device |
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