USD308645S - Integrated circuit tester - Google Patents

Integrated circuit tester Download PDF

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Publication number
USD308645S
USD308645S US07/019,603 US1960387F USD308645S US D308645 S USD308645 S US D308645S US 1960387 F US1960387 F US 1960387F US D308645 S USD308645 S US D308645S
Authority
US
United States
Prior art keywords
integrated circuit
circuit tester
tester
elevational view
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US07/019,603
Inventor
Cheryl A. Hughes
Edmond C. Eng
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Priority to US07/019,603 priority Critical patent/USD308645S/en
Assigned to JOHN FLUKE MFG. CO., INC., FLUKE ELECTRONIC PARK, 6920 SEAWAY BLVD., EVERETT, WASHINGTON 98203 A WASHINGTON CORP. reassignment JOHN FLUKE MFG. CO., INC., FLUKE ELECTRONIC PARK, 6920 SEAWAY BLVD., EVERETT, WASHINGTON 98203 A WASHINGTON CORP. ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: ENG, EDMOND CHO, HUGHES, CHERYL A.
Application granted granted Critical
Publication of USD308645S publication Critical patent/USD308645S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top plan view of an integrated circuit tester showing our new design;
FIG. 2 is a front elevational view;
FIG. 3 is a rear elevational view;
FIG. 4 is a right side elevational view, the hinged keyboard shown extended;
FIG. 5 is a left side elevational view, the hinged keyboard shown extended;
FIG. 6 is a bottom plan view;
FIG. 7 is another right side elevational view, the hinged keyboard shown in the closed position;
FIG. 8 is another left side elevational view, the hinged keyboard shown in the closed position; and,
FIG. 9 is a top, front and right side perspective view thereof.

Claims (1)

  1. The ornamental design for an integrated circuit tester, as shown and described.
US07/019,603 1987-02-26 1987-02-26 Integrated circuit tester Expired - Lifetime USD308645S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US07/019,603 USD308645S (en) 1987-02-26 1987-02-26 Integrated circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/019,603 USD308645S (en) 1987-02-26 1987-02-26 Integrated circuit tester

Publications (1)

Publication Number Publication Date
USD308645S true USD308645S (en) 1990-06-19

Family

ID=64331444

Family Applications (1)

Application Number Title Priority Date Filing Date
US07/019,603 Expired - Lifetime USD308645S (en) 1987-02-26 1987-02-26 Integrated circuit tester

Country Status (1)

Country Link
US (1) USD308645S (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD319222S (en) 1989-04-27 1991-08-20 Sharp Corporation Computer
USD338416S (en) 1988-07-25 1993-08-17 Hewlett-Packard Company Printed circuit board tester
USD343799S (en) 1991-10-11 1994-02-01 Keithley Instruments, Inc. Electronic measuring/monitoring instrument
USD343800S (en) 1991-10-11 1994-02-01 Keithley Instruments, Inc. Electronic measuring/monitoring instrument
USD351352S (en) 1992-11-12 1994-10-11 Metrawatt Gmbh Repaired electrical appliance tester
USD366871S (en) 1993-07-14 1996-02-06 Fostex Research & Development, Inc. Audio workstation

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD255116S (en) 1978-03-03 1980-05-27 Gould Inc., Modicon Division Portable programmer for programmable controller
US4517512A (en) 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
US4528504A (en) 1982-05-27 1985-07-09 Harris Corporation Pulsed linear integrated circuit tester
US4532423A (en) 1982-05-31 1985-07-30 Tokyo Shibaura Denki Kabushiki Kaisha IC Tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested
US4616178A (en) 1982-05-27 1986-10-07 Harris Corporation Pulsed linear integrated circuit tester
USD289292S (en) 1984-01-17 1987-04-14 International Business Machines Corp. Transportable computer
US4669053A (en) 1984-05-31 1987-05-26 Zenith Electronics Corporation Portable personal computer
US4703858A (en) 1986-01-02 1987-11-03 Multitest Elektronische Systeme Gmbh Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips
USD299910S (en) 1986-06-23 1989-02-21 Snap-On Tools Corporation Engine analyzer
US4829241A (en) 1986-11-18 1989-05-09 Martin Maelzer Apparatus for testing printed circuit boards

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD255116S (en) 1978-03-03 1980-05-27 Gould Inc., Modicon Division Portable programmer for programmable controller
US4517512A (en) 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
US4528504A (en) 1982-05-27 1985-07-09 Harris Corporation Pulsed linear integrated circuit tester
US4616178A (en) 1982-05-27 1986-10-07 Harris Corporation Pulsed linear integrated circuit tester
US4532423A (en) 1982-05-31 1985-07-30 Tokyo Shibaura Denki Kabushiki Kaisha IC Tester using an electron beam capable of easily setting a probe card unit for wafers & packaged IC's to be tested
USD289292S (en) 1984-01-17 1987-04-14 International Business Machines Corp. Transportable computer
US4669053A (en) 1984-05-31 1987-05-26 Zenith Electronics Corporation Portable personal computer
US4703858A (en) 1986-01-02 1987-11-03 Multitest Elektronische Systeme Gmbh Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips
USD299910S (en) 1986-06-23 1989-02-21 Snap-On Tools Corporation Engine analyzer
US4829241A (en) 1986-11-18 1989-05-09 Martin Maelzer Apparatus for testing printed circuit boards

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD338416S (en) 1988-07-25 1993-08-17 Hewlett-Packard Company Printed circuit board tester
USD319222S (en) 1989-04-27 1991-08-20 Sharp Corporation Computer
USD343799S (en) 1991-10-11 1994-02-01 Keithley Instruments, Inc. Electronic measuring/monitoring instrument
USD343800S (en) 1991-10-11 1994-02-01 Keithley Instruments, Inc. Electronic measuring/monitoring instrument
USD351352S (en) 1992-11-12 1994-10-11 Metrawatt Gmbh Repaired electrical appliance tester
USD366871S (en) 1993-07-14 1996-02-06 Fostex Research & Development, Inc. Audio workstation

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