US6538867B1 - FET switch with overvoltage protection - Google Patents
FET switch with overvoltage protection Download PDFInfo
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- US6538867B1 US6538867B1 US09/713,587 US71358700A US6538867B1 US 6538867 B1 US6538867 B1 US 6538867B1 US 71358700 A US71358700 A US 71358700A US 6538867 B1 US6538867 B1 US 6538867B1
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- 238000012546 transfer Methods 0.000 claims abstract description 42
- 230000001105 regulatory effect Effects 0.000 claims abstract 2
- 238000000034 method Methods 0.000 claims description 10
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 230000001902 propagating effect Effects 0.000 claims 1
- 230000003071 parasitic effect Effects 0.000 description 12
- 239000004065 semiconductor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000000295 complement effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/30—Modifications for providing a predetermined threshold before switching
- H03K17/302—Modifications for providing a predetermined threshold before switching in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/06—Modifications for ensuring a fully conducting state
- H03K17/063—Modifications for ensuring a fully conducting state in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
- H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
- H03K17/0814—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the output circuit
- H03K17/08142—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the output circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors
Definitions
- the present invention relates to electronic switches.
- the present invention relates to semiconductor switches, including those formed of one or more metal-oxide-semiconductor (MOS) transistors. More particularly, the present invention relates to P-type MOS (PMOS) field effect transistor (FET) bus switches.
- MOS metal-oxide-semiconductor
- PMOS P-type MOS field effect transistor
- switches are widely used in many fields. They are used in all variety of large- and small-scale consumer products, including, but not limited to, automobiles and home electronics. They can be and are used as analog routers, gates, and relays. They are used as digital multiplexers, routers, and gates as well.
- a complementary pair of transistors, NMOS transistor M 1 and PMOS transistor M 2 conduct signals between nodes A and B, where each of those nodes is couplable to an extended circuit.
- a control signal OEN shown in FIG. 1 associated with node A as the input for purposes of illustration only, but which can also be associated with node B as the input
- transistor M 1 is turned on, and as a result of the inversion produced by inverter I 1 , transistor M 2 is also on. In this condition, the two transistors are “on” and the potential at node B is essentially the same as the potential at node A.
- overvoltage means the potential variation noted that occurs under static (DC) conditions as well as dynamic (AC) conditions. For that reason, overvoltage may be used interchangeably with overshoot. Passage of an overvoltage between nodes A and B when the signal at OEN requires the switch to be off is undesirable in that it will cause the passage of electric signals between the two nodes when none should be passed. This can disrupt the bus.
- FIG. 2 A device designed to resolve at least one portion of the problems associated with the complementary transfer gate of FIG. 1 is shown in FIG. 2 .
- the device involves removal of NMOS transistor M 1 , leaving PMOS transistor M 2 coupled between nodes A and B, where node A is the input from, or output to, a first extended circuit, and node B is the input from, or output to, a second extended circuit.
- control node OEN is designed to control enablement of M 2 .
- a logic level HIGH from OEN through inverter IV 1 to the gate of M 2 turns M 2 on and thereby permits a signal to pass between nodes A and B.
- a logic level LOW turns M 2 off and blocks the transfer of the signal between A and B.
- transistor M 1 Elimination of transistor M 1 resolves the problem when the potential at node A or node B exceeds GND because that transistor is not there to be turned on. Unfortunately, that does not eliminate the possibility that the transfer gate will turn on when it should be off under conditions of positive voltage exceeding Vcc.
- the first is the formation of a parasitic bipolar PNP transistor.
- the second is the unintended turning on of the PMOS FET switch in certain overvoltage situations.
- the drain (P-type collector), transistor bulk (N-type base), and source (P-type emitter) form the PNP transistor.
- Transistor fabrication steps currently in use in sub-micron processes can yield in this common-base parasitic bipolar transistor a current gain that is the equivalent of a common-emitter gain ( ⁇ ) of about 10.
- the other undesirable condition associated with the parasitic diode of the prior single-FET switch relates to the undesired conduction by the FET switch during an overvoltage event. Specifically, if current is developed from the high-potential rail through a lower-potential circuit node there is a potential drop across the substrate/bulk resistance that will cause the transistor to conduct current from one circuit node to the other, even during sub-threshold conditions. That conduction is significant enough to cause leakage resulting in unintended signal switching in certain instances.
- the second arbiter circuit regulates the transistor's bulk potential in relation to the potential at a second (output or input) circuit node.
- the higher of the potentials associated with the two arbiter circuits is passed to the bulk of the primary switch transistor.
- the arbiter sub-circuits are designed to ensure that the higher potential is passed to the pseudo high rail, regardless of whether electrical signal passage is from node A to node B or node B to node A.
- the bulk of the primary switch or transfer transistor of the present invention will always be at the highest potential possible and therefore will not develop either of the parasitic conduction conditions described.
- the circuit of the present invention further includes an enable control circuit designed to link the gate of the transfer transistor to the enable signal in a way that ensures complete operational capability of the bus switch under all conditions.
- the controller circuit preferably is an inverter having its output coupled to the transfer transistor's gate, and a high-potential node that is coupled to the pseudo high-potential rail.
- the circuit of the present invention further includes a branch for coupling the pseudo high-potential rail to the standard high-potential rail when there is no overvoltage event on either of the input/output nodes.
- the overvoltage tolerant switch circuit conducts as required when it is enabled, regardless of overvoltage events. Further, it does not conduct, nor does it leak current to the high-potential rail, when the switch is disabled and there is an overvoltage event on either node. Finally, it operates as desired when there are no overvoltage condition exists.
- FIG. 1 is a simplified schematic diagram of a prior-art transfer gate having a CMOS transistor pair as the primary transfer element of the transfer device.
- FIG. 2 is a simplified schematic diagram of a prior-art transfer gate having a single enhancement-mode PMOS transistor as the transfer device.
- FIG. 3 is a schematic block diagram of the overvoltage tolerant FET switch circuit of the present invention, showing the PMOS transfer transistor in combination with an arbitration circuit as the primary transfer components of a bus FET switch that is couplable to extended circuitry.
- FIG. 4 is a detailed schematic diagram of the overvoltage tolerant FET switch circuit of the present invention.
- FIG. 5 is a simplified block diagram representation showing the application of the present invention in context.
- the switch 10 includes an arbitration circuit 20 powered by high-potential power rail Vcc, a pseudo high-potential rail PVcc, and transfer transistor M 2 .
- An enable controller that is inverter IV 2 is supplied by low-potential power rail GND and by PVcc. IV 2 is used to define a selectable signal to activate the transfer transistor M 2 .
- An enable signal coming from a control circuit (not shown) by output enable node OEN is preferably coupled to the gate of M 2 through IV 2 .
- Transistor M 2 is the primary regulator of the transfer of a signal between nodes A and B. It is a P-type MOS transistor formed with an isolated N-type well. Either of node A or node B may be an input node or an output node, dependent upon the direction of the signal passing between the external circuitry coupled to those two nodes.
- the bulk of M 2 is coupled to the pseudo high-potential rail PVcc.
- Arbitration circuit 20 defines the potential of PVcc as always being the higher of the potential at node A, node B, or Vcc. It is to be noted that the circuit is designed such that the bulk of M 2 is “protected” regardless of whether overvoltage is experienced at node A or node B.
- the arbitration circuit 20 is coupled to nodes A and B and Vcc with means to select the higher potential associated with those three references to transmit to the bulk of M 2 .
- the arbitration circuit 20 senses node A, node B, and Vcc to drive the pseudo high-potential power rail PVcc to the higher of the potential at node A, node B, or Vcc.
- the circuit 10 shown in FIG.3 blocks parasitic conduction caused by the bipolar effect of transistor M 2 through the connection of the bulk of M 2 to PVcc and the arrangement of circuit 20 . Conduction would otherwise occur during overvoltage events occurring at both node A and node B. However, since the bulk of M 2 will be at the highest potential of either node, and therefore higher than the potential at Vcc during the overvoltage event, there is insufficient potential to cause a turning on of that device.
- the circuit 10 is also designed to prevent the parasitic conduction that can otherwise occur when field effect potential is sufficient within M 2 to cause a gate to bulk potential exceeding Vt. In particular, this is accomplished by referencing the inverter IV 2 to PVcc rather then to Vcc. The inverter IV 2 is powered in that way and coupled to the gate of M 2 such that when M 2 is supposed to be disabled, its gate is coupled to its bulk, ensuring that it cannot be turned on.
- the arbitration circuit 20 is preferably configured as shown in FIG. 4 . It includes first diode-wired arbitration transistor M 3 and second diode-wired arbitration transistor M 4 each having their respective drains, gates, and bulks coupled to PVcc. However, the source of M 4 is coupled to node A and the source of M 5 is coupled to node B. Although two diode-wired PMOS transistors are shown in FIG. 4, it is to be understood that alternative diode means may be substituted therefore including, but not limited to, any P-N junction, such as a diode, a diode-wired NMOS transistor, or a diode-wired bipolar transistor.
- the arbitration circuit 20 further includes a first clamping branch and a second clamping branch to prevent floating of the circuit 10 when neither node A nor node B is at a logic HIGH. Instead, those two branches ensure that PVcc is tied to Vcc in that situation.
- the first clamping branch includes transistors M 6 and M 7 in series. The gate of transistor M 6 is coupled to node A, its source is coupled to Vcc, its drain is coupled to the source of M 7 and its bulk is coupled to PVcc. Transistor M 7 has its gate coupled to node B, its source coupled to the drain of M 6 , and its drain and bulk coupled to PVcc.
- the second clamping branch includes transistors M 8 and M 9 in series.
- transistor M 8 The gate of transistor M 8 is coupled to node B, its source is coupled to Vcc, its drain is coupled to the source of M 9 and its bulk is coupled to PVcc.
- Transistor M 9 has its gate coupled to node A, its source coupled to the drain of M 8 , and its drain and bulk coupled to PVcc. It is to be understood that alternative logic means may be employed to couple PVcc to Vcc when circuit 10 is to pass a logic LOW signal between nodes A and B.
- FIG. 5 illustrates in a simplified way the circuit 10 of the present invention in context.
- a common bus 100 is used in any computer processing system to transfer signals among discrete external or internal devices. Such devices include, but are not limited to, a central processing unit 110 and peripherals 120 - 122 , that may be any sort of device, such as a printer, external or internal memory, remote wireless cellular phone, or the like. Any one or more of components 100 , 110 , 120 - 122 may include circuit 10 as a bus switch circuit to prevent undesirable effects caused by overvoltage events transferring from one devices to another, or even within devices.
- circuit 20 may be employed to protect against overvoltage when the transfer transistor is a lone PMOS transistor or in alternative switch circuits in which a PMOS transistor is employed to pass electrical signals including but not limited to, for example, the PMOS transistor of the pass gate of the prior art shown in FIG. 1 .
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Abstract
Description
Claims (16)
Priority Applications (1)
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US09/713,587 US6538867B1 (en) | 2000-11-15 | 2000-11-15 | FET switch with overvoltage protection |
Applications Claiming Priority (1)
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US09/713,587 US6538867B1 (en) | 2000-11-15 | 2000-11-15 | FET switch with overvoltage protection |
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US09/713,587 Expired - Lifetime US6538867B1 (en) | 2000-11-15 | 2000-11-15 | FET switch with overvoltage protection |
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Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070069797A1 (en) * | 2005-09-28 | 2007-03-29 | Esquivel John E | Back gate biasing overshoot and undershoot protection circuitry |
US7230810B1 (en) * | 2004-12-09 | 2007-06-12 | Lattice Semiconductor Corporation | Dynamic over-voltage protection scheme for integrated-circuit devices |
US20080231341A1 (en) * | 2007-03-23 | 2008-09-25 | Miske Myron J | Over-voltage tolerant pass-gate |
US20080278868A1 (en) * | 2007-05-09 | 2008-11-13 | Kohichi Morino | Overheat protection circuit |
US7505752B1 (en) | 2005-07-25 | 2009-03-17 | Lattice Semiconductor Corporation | Receiver for differential and reference-voltage signaling with programmable common mode |
US7547995B1 (en) | 2006-02-02 | 2009-06-16 | Lattice Semiconductor Corporation | Dynamic over-voltage protection scheme for interface circuitry |
US20090278571A1 (en) * | 2008-05-06 | 2009-11-12 | Freescale Semiconductor, Inc. | Device and technique for transistor well biasing |
CN102394490A (en) * | 2011-09-05 | 2012-03-28 | 上海贝岭股份有限公司 | Protective circuit for analogue switch |
CN102468646A (en) * | 2010-11-04 | 2012-05-23 | 帝奥微电子有限公司 | Overvoltage protection circuit used for USB analog switch under charged/uncharged condition |
US20120206845A1 (en) * | 2011-02-16 | 2012-08-16 | Nickole Gagne | pass gate off isolation |
US8279568B2 (en) | 2010-04-14 | 2012-10-02 | Fairchild Semiconductor Corporation | Charge pump switch power down protection |
US8710900B2 (en) | 2012-03-22 | 2014-04-29 | Fairchild Semiconductor Corporation | Methods and apparatus for voltage selection for a MOSFET switch device |
FR3030155A1 (en) * | 2014-12-12 | 2016-06-17 | Stmicroelectronics (Grenoble 2) Sas | ANALOG MULTIPLEXER |
US10396571B2 (en) | 2015-02-17 | 2019-08-27 | Fairchild Semiconductor Corporation | Adaptive overvoltage protection for adaptive power adapters |
US10396792B2 (en) | 2017-02-23 | 2019-08-27 | Stmicroelectronics (Grenoble 2) Sas | Bidirectional analog multiplexer |
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US5144165A (en) * | 1990-12-14 | 1992-09-01 | International Business Machines Corporation | CMOS off-chip driver circuits |
US5300835A (en) * | 1993-02-10 | 1994-04-05 | Cirrus Logic, Inc. | CMOS low power mixed voltage bidirectional I/O buffer |
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US6040711A (en) * | 1995-03-31 | 2000-03-21 | Sgs-Thomson Microelectronics S.R.L. | CMOS output buffer having a switchable bulk line |
US6377112B1 (en) * | 2000-12-05 | 2002-04-23 | Semiconductor Components Industries Llc | Circuit and method for PMOS device N-well bias control |
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2000
- 2000-11-15 US US09/713,587 patent/US6538867B1/en not_active Expired - Lifetime
Patent Citations (6)
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US5144165A (en) * | 1990-12-14 | 1992-09-01 | International Business Machines Corporation | CMOS off-chip driver circuits |
US5300835A (en) * | 1993-02-10 | 1994-04-05 | Cirrus Logic, Inc. | CMOS low power mixed voltage bidirectional I/O buffer |
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Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7230810B1 (en) * | 2004-12-09 | 2007-06-12 | Lattice Semiconductor Corporation | Dynamic over-voltage protection scheme for integrated-circuit devices |
US7844243B1 (en) * | 2005-07-25 | 2010-11-30 | Lattice Semiconductor Corporation | Receiver for differential and reference voltage signaling with programmable common mode |
US7505752B1 (en) | 2005-07-25 | 2009-03-17 | Lattice Semiconductor Corporation | Receiver for differential and reference-voltage signaling with programmable common mode |
US20070069797A1 (en) * | 2005-09-28 | 2007-03-29 | Esquivel John E | Back gate biasing overshoot and undershoot protection circuitry |
US7649400B2 (en) | 2005-09-28 | 2010-01-19 | Texas Instruments Incorporated | Back gate biasing overshoot and undershoot protection circuitry |
US7547995B1 (en) | 2006-02-02 | 2009-06-16 | Lattice Semiconductor Corporation | Dynamic over-voltage protection scheme for interface circuitry |
WO2008118291A1 (en) * | 2007-03-23 | 2008-10-02 | Fairchild Semiconductor Corporation | Over-voltage tolerant pass-gate |
US7514983B2 (en) | 2007-03-23 | 2009-04-07 | Fairchild Semiconductor Corporation | Over-voltage tolerant pass-gate |
US20080231341A1 (en) * | 2007-03-23 | 2008-09-25 | Miske Myron J | Over-voltage tolerant pass-gate |
US20080278868A1 (en) * | 2007-05-09 | 2008-11-13 | Kohichi Morino | Overheat protection circuit |
US7965475B2 (en) * | 2007-05-09 | 2011-06-21 | Ricoh Company, Ltd. | Overheat protection circuit |
US20090278571A1 (en) * | 2008-05-06 | 2009-11-12 | Freescale Semiconductor, Inc. | Device and technique for transistor well biasing |
US8164378B2 (en) * | 2008-05-06 | 2012-04-24 | Freescale Semiconductor, Inc. | Device and technique for transistor well biasing |
US8279568B2 (en) | 2010-04-14 | 2012-10-02 | Fairchild Semiconductor Corporation | Charge pump switch power down protection |
CN102468646A (en) * | 2010-11-04 | 2012-05-23 | 帝奥微电子有限公司 | Overvoltage protection circuit used for USB analog switch under charged/uncharged condition |
US8564918B2 (en) * | 2011-02-16 | 2013-10-22 | Fairchild Semiconductor Corporation | Pass gate off isolation |
CN102647178A (en) * | 2011-02-16 | 2012-08-22 | 快捷半导体(苏州)有限公司 | Pass gate off isolation |
US20120206845A1 (en) * | 2011-02-16 | 2012-08-16 | Nickole Gagne | pass gate off isolation |
CN102394490A (en) * | 2011-09-05 | 2012-03-28 | 上海贝岭股份有限公司 | Protective circuit for analogue switch |
CN102394490B (en) * | 2011-09-05 | 2014-05-07 | 上海贝岭股份有限公司 | Protective circuit for analogue switch |
US8710900B2 (en) | 2012-03-22 | 2014-04-29 | Fairchild Semiconductor Corporation | Methods and apparatus for voltage selection for a MOSFET switch device |
FR3030155A1 (en) * | 2014-12-12 | 2016-06-17 | Stmicroelectronics (Grenoble 2) Sas | ANALOG MULTIPLEXER |
US9520869B2 (en) | 2014-12-12 | 2016-12-13 | Stmicroelectronics (Grenoble 2) Sas | Analog multiplexer |
US10396571B2 (en) | 2015-02-17 | 2019-08-27 | Fairchild Semiconductor Corporation | Adaptive overvoltage protection for adaptive power adapters |
US10396792B2 (en) | 2017-02-23 | 2019-08-27 | Stmicroelectronics (Grenoble 2) Sas | Bidirectional analog multiplexer |
US10715145B2 (en) | 2017-02-23 | 2020-07-14 | Stmicroelectronics (Grenoble 2) Sas | Bidirectional analog multiplexer |
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