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Electrical energy transmission

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Publication number
US2376101A
US2376101A US43710942A US2376101A US 2376101 A US2376101 A US 2376101A US 43710942 A US43710942 A US 43710942A US 2376101 A US2376101 A US 2376101A
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Prior art keywords
transmission
means
sheath
conducting
insulating
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Expired - Lifetime
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Howard J Tyzzer
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Ferris Instr Corp
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    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P3/00Waveguides; Transmission lines of the waveguide type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B9/00Power cables
    • H01B9/04Concentric cables

Description

May 15, 1945. H. J. TY'zzER ELECTRICAL ENERGY TRANSMISSION Filed April l, 1942 mwa HGV/ARD J. TYZZR Patented May 15, 1945 UNITED STATES PATENT GFFICE 2,376,101 ELECTRICAL ENERGY TRANSMISSION Howard J. Tyzzer, Caldwell, N. J., assig'nor to Ferris Instrument Corporation, Boonton Township, N. J., a corporation of New Jersey Application April 1, 1942, Serial No. 437,109

(ci. iis- 44) Claims.

certing when the transmission involves electrical alternating current energies having in very large numbers frequencies of more than one hundred megacycles, the uses of which are becoming quite commonplace.

A particular object of my present invention is the one of making it possible to more accurately measure the amount of energy that remains after such transmission in cases of transmissions over a. wide range of frequencies without resorting to making adjustments at each frequency as the measuring progresses. For example, I have in mind accurately and yet speedily checking the response characteristics of radio devices built to be effectively responsive to radio signals of a wide range of frequencies in the neighborhood of and above one hundred megacycles with the aid of a so-called standard signal generator such as described by Malcolm Ferris in U. S. Patent 2,265,637 of December 9, 1941 It is the history of the art that when the said Ferris applied for his said patent in May, 1937, commercial radio transmission at frequencies in the neighborhood of one hundred megacycles did not exist, and I now find that the valuable contributions the said Ferris did mais@ to the art in the matter of the proper steps to take for dependable cable transmission of the energies of alternating currents at frequencies from ten megacycles upward are not sufllcient to meet in accuracy the present time requirements in the cases of devices calling for highly dependable results at great numbers of frequencies even far above one hundred megacycles.

I have discovered that the reason why the teachings of the said Ferris patent fail to provide for satisfactorily accurate transmissions at one hundred megacycles and above is that the radiations from his transmission means at such frequencies become too large to be ignored, and it is by the application thereto of my present invention that the resulting inaccuracies are satisfactorily overcome.

It is believed that my invention will be best understood by references to the figures of the accompanying drawing in which Figs. l and 2 are but slight'modications of each other, and in which like reference numerals and letters refer to parts having like functions.

The difference between Figs. l and 2 is that the former shows in elements l and 3 a coaxial cable as transmission means and the latter two parallel conductors l and 3 as transmission means. In both cases, the sheaths indicated by the even numbers 2, 4, etc. are of insulating material or materials, and the sheaths indicated by the odd numbers 3, 5, etc. are of conducting material or materials; that is, in both cases there are alternate sheaths of insulating and conducting material or materials, and while in both cases the sheaths are shown as cut short or pushed back for illustration purposes, in actual use they are all of the same length.

For convenience, these sheathed transmission means should be quite exible so as to permit of being readily moved for attachment to differently located devices being checked, and I have found that a braided conducting sheathcovered by a braided insulating covering, such as mercerized cotton, is quite effective; however, it is obvious that any combination of conducting and nonconducting sheaths is susceptible of being successfully employed. As to length of the transmission means in connection with standard signal generator work at frequencies of one hundred megacycles and above, although the severity of the problem of maintaining accuracy increases with increase of length of the transmission means, practical Working requirements call for a length of about three feet.

As to operation, referring to Fig. l, C indicates an ordinary metallic cabinet containing as indicated, variable in frequency, source of electrical alternating current marked AC, usually of socalled vacuum tube oscillator form (showing the details of whichv is not essential to a description of my present invention), the alternating current of which may be modulated at preferably one suitable to the average bearing of potential operators audio frequency by an indicated modulator M, and used to develop an alternating potential in a suitable impedance means such as indicated resistance Rl.. By connecting conductive elements l and 3 of the transmission means across a chosen portion of resistance Rl, such as the portion indicated by R2. a chosen amount of alternating current is caused to flow through the transmission means to and through resistance R, and there develop an alternating potential across terminals Tl and T2V for application to any device to be tested and/or checked as to its responsive characteristics. As taught by the above mentioned Ferris patent. I make the resistance value at each of the two ends oi' the transmission means substantially equal to the characteristic surge impedance of the transmission means per se.

I have found that by fully and closely covering the transmission means per se mth the indicated insulating sheath l and conductive sheath 5, and by grounding the latter in practically all cases from a point at the extreme end of the sheath near the cabinet C, which is ordinarily itself grounded, there results a very material reduction in the total loss of energy from the transmission means by radiation at the very high frequencies contemplated; and I have also found that a further reduction of said radiation loss is secured by further closely enveloping the first sheathed arrangement with insulating sheath 6 and conducting sheath 1, in which case it appears to be preferable not to conductively connect sheath 1 with any other element, and thus to, in effect, leave it 'floating so as to assume its own potential.

From the results I have obtained, I conceive that as the energy and/or frequency applied to the transmission means is or are increased, the

addition of insulating and conducting sheaths will act to keep the amount of radiation losses down, and, accordingly, I do not confine my present invention to any particular extent of sheathing.

As to the operation of the arrangement' of Fig;

2, it. is in all essential respects the same as that with the respective transmitted potentials thereof electrical alternating current energies having progressively maintainable frequencies from the order of megacycles to considerably above, transmission means comprising two maintained parallel conductors of the order of three feet in length terminated at each of their common ends by substantially equal resistances substantially equal in value to the value oi the characteristic surge impedance of said two conductors per se, and means for suppressing and thereby maintaining more nearly constant with variations in frequency accumulated inherent energy transmission losses by energy losing radiation from said conductors comprising a solid matter insulating sheath closely and fully enveloping said conductors and a conducting sheath closely and fully enveloping said insulating sheath grounded at its input end only.

2. The transmission means of claim 1 in which the combination of conductors and sheaths is reasonably ilexible.

3. The arrangement oi claim 1 in which a second solid matter-insulating sheath closely and fully envelopes said conducting sheath and a second conducting sheath closely and fully envelopes said second insulating sheath and is maintained free from any conductive relation to any other element and ground.

4. The arrangement of claim 1 in which a plurality of solid matter insulating sheaths and like plurality of conducting sheaths closely and fully envelope said conducting and one end grounded sheath, all maintained free from any conductive relation to any other element and ground.

5. The arrangement of claim 1 in which a housed source of variable in frequency from the order of 100 megacycles and considerably above electrical alternating currents is connected to supply the various energy inputs to the said transmission means.

HOWARD J. TYZZER.

US2376101A 1942-04-01 1942-04-01 Electrical energy transmission Expired - Lifetime US2376101A (en)

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Cited By (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2669695A (en) * 1952-09-23 1954-02-16 Breeze Corp High attenuation shielded lead structure
US2747160A (en) * 1951-12-21 1956-05-22 Breeze Corp Shielding efficiency measuring device
US2922835A (en) * 1956-10-03 1960-01-26 Dictograph Products Co Inc Electrical security cable
US3178661A (en) * 1961-05-31 1965-04-13 Bosch Gmbh Robert Arrangement for eliminating parastic waves
US3219029A (en) * 1963-03-25 1965-11-23 Groff De Remote control medical therapy instrument
US3697896A (en) * 1971-02-11 1972-10-10 Westinghouse Electric Corp Signal transmission system
US3961292A (en) * 1974-01-02 1976-06-01 Ross Alan Davis Radio frequency transformer
US3970969A (en) * 1973-12-18 1976-07-20 Les Cables De Lyon Device for the electrical protection of a coaxial cable by two connected circuits
US4376920A (en) * 1981-04-01 1983-03-15 Smith Kenneth L Shielded radio frequency transmission cable
US4642417A (en) * 1984-07-30 1987-02-10 Kraftwerk Union Aktiengesellschaft Concentric three-conductor cable
US5298682A (en) * 1992-08-20 1994-03-29 Wireworld By David Salz, Inc. Optimized symmetrical coaxial cable
US5408049A (en) * 1993-11-01 1995-04-18 Ford Motor Company Multiple-phase electrical system
US5457288A (en) * 1994-02-22 1995-10-10 Olsson; Mark S. Dual push-cable for pipe inspection
US5493070A (en) * 1993-07-28 1996-02-20 Hewlett-Packard Company Measuring cable and measuring system
US20050194983A1 (en) * 1992-06-11 2005-09-08 Schwindt Randy J. Wafer probe station having a skirting component
US6965081B2 (en) * 2001-06-19 2005-11-15 Koninklijke Philips Electronics, N.V. Cable
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7681312B2 (en) 1998-07-14 2010-03-23 Cascade Microtech, Inc. Membrane probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7759953B2 (en) 2003-12-24 2010-07-20 Cascade Microtech, Inc. Active wafer probe
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US20170149406A1 (en) * 2015-11-24 2017-05-25 Cisco Technology, Inc. Unified Power and Data Cable

Cited By (106)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2747160A (en) * 1951-12-21 1956-05-22 Breeze Corp Shielding efficiency measuring device
US2669695A (en) * 1952-09-23 1954-02-16 Breeze Corp High attenuation shielded lead structure
US2922835A (en) * 1956-10-03 1960-01-26 Dictograph Products Co Inc Electrical security cable
US3178661A (en) * 1961-05-31 1965-04-13 Bosch Gmbh Robert Arrangement for eliminating parastic waves
US3219029A (en) * 1963-03-25 1965-11-23 Groff De Remote control medical therapy instrument
US3697896A (en) * 1971-02-11 1972-10-10 Westinghouse Electric Corp Signal transmission system
US3970969A (en) * 1973-12-18 1976-07-20 Les Cables De Lyon Device for the electrical protection of a coaxial cable by two connected circuits
US3961292A (en) * 1974-01-02 1976-06-01 Ross Alan Davis Radio frequency transformer
US4376920A (en) * 1981-04-01 1983-03-15 Smith Kenneth L Shielded radio frequency transmission cable
US4642417A (en) * 1984-07-30 1987-02-10 Kraftwerk Union Aktiengesellschaft Concentric three-conductor cable
US7348787B2 (en) 1992-06-11 2008-03-25 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7595632B2 (en) 1992-06-11 2009-09-29 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US7589518B2 (en) 1992-06-11 2009-09-15 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7330023B2 (en) 1992-06-11 2008-02-12 Cascade Microtech, Inc. Wafer probe station having a skirting component
US7492147B2 (en) 1992-06-11 2009-02-17 Cascade Microtech, Inc. Wafer probe station having a skirting component
US20050194983A1 (en) * 1992-06-11 2005-09-08 Schwindt Randy J. Wafer probe station having a skirting component
US5298682A (en) * 1992-08-20 1994-03-29 Wireworld By David Salz, Inc. Optimized symmetrical coaxial cable
US5493070A (en) * 1993-07-28 1996-02-20 Hewlett-Packard Company Measuring cable and measuring system
US5408049A (en) * 1993-11-01 1995-04-18 Ford Motor Company Multiple-phase electrical system
US5457288A (en) * 1994-02-22 1995-10-10 Olsson; Mark S. Dual push-cable for pipe inspection
US7164279B2 (en) 1995-04-14 2007-01-16 Cascade Microtech, Inc. System for evaluating probing networks
US7321233B2 (en) 1995-04-14 2008-01-22 Cascade Microtech, Inc. System for evaluating probing networks
US7893704B2 (en) 1996-08-08 2011-02-22 Cascade Microtech, Inc. Membrane probing structure with laterally scrubbing contacts
US7541821B2 (en) 1996-08-08 2009-06-02 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7190181B2 (en) 1997-06-06 2007-03-13 Cascade Microtech, Inc. Probe station having multiple enclosures
US7626379B2 (en) 1997-06-06 2009-12-01 Cascade Microtech, Inc. Probe station having multiple enclosures
US7436170B2 (en) 1997-06-06 2008-10-14 Cascade Microtech, Inc. Probe station having multiple enclosures
US8451017B2 (en) 1998-07-14 2013-05-28 Cascade Microtech, Inc. Membrane probing method using improved contact
US7681312B2 (en) 1998-07-14 2010-03-23 Cascade Microtech, Inc. Membrane probing system
US7761986B2 (en) 1998-07-14 2010-07-27 Cascade Microtech, Inc. Membrane probing method using improved contact
US7533462B2 (en) 1999-06-04 2009-05-19 Cascade Microtech, Inc. Method of constructing a membrane probe
US7616017B2 (en) 1999-06-30 2009-11-10 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7138813B2 (en) 1999-06-30 2006-11-21 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7292057B2 (en) 1999-06-30 2007-11-06 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US7403025B2 (en) 2000-02-25 2008-07-22 Cascade Microtech, Inc. Membrane probing system
US20080252316A1 (en) * 2000-02-25 2008-10-16 Cascade Microtech, Inc. Membrane probing system
US7514915B2 (en) 2000-09-05 2009-04-07 Cascade Microtech, Inc. Chuck for holding a device under test
US7969173B2 (en) 2000-09-05 2011-06-28 Cascade Microtech, Inc. Chuck for holding a device under test
US7423419B2 (en) 2000-09-05 2008-09-09 Cascade Microtech, Inc. Chuck for holding a device under test
US7352168B2 (en) 2000-09-05 2008-04-01 Cascade Microtech, Inc. Chuck for holding a device under test
US7554322B2 (en) 2000-09-05 2009-06-30 Cascade Microtech, Inc. Probe station
US7688062B2 (en) 2000-09-05 2010-03-30 Cascade Microtech, Inc. Probe station
US7501810B2 (en) 2000-09-05 2009-03-10 Cascade Microtech, Inc. Chuck for holding a device under test
US7518358B2 (en) 2000-09-05 2009-04-14 Cascade Microtech, Inc. Chuck for holding a device under test
US7688097B2 (en) 2000-12-04 2010-03-30 Cascade Microtech, Inc. Wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7761983B2 (en) 2000-12-04 2010-07-27 Cascade Microtech, Inc. Method of assembling a wafer probe
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US6965081B2 (en) * 2001-06-19 2005-11-15 Koninklijke Philips Electronics, N.V. Cable
US7355420B2 (en) 2001-08-21 2008-04-08 Cascade Microtech, Inc. Membrane probing system
US7492175B2 (en) 2001-08-21 2009-02-17 Cascade Microtech, Inc. Membrane probing system
US7268533B2 (en) 2001-08-31 2007-09-11 Cascade Microtech, Inc. Optical testing device
US7368925B2 (en) 2002-01-25 2008-05-06 Cascade Microtech, Inc. Probe station with two platens
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7436194B2 (en) 2002-05-23 2008-10-14 Cascade Microtech, Inc. Shielded probe with low contact resistance for testing a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7295025B2 (en) 2002-11-08 2007-11-13 Cascade Microtech, Inc. Probe station with low noise characteristics
US7550984B2 (en) 2002-11-08 2009-06-23 Cascade Microtech, Inc. Probe station with low noise characteristics
US7138810B2 (en) 2002-11-08 2006-11-21 Cascade Microtech, Inc. Probe station with low noise characteristics
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7498828B2 (en) 2002-11-25 2009-03-03 Cascade Microtech, Inc. Probe station with low inductance path
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US7221146B2 (en) 2002-12-13 2007-05-22 Cascade Microtech, Inc. Guarded tub enclosure
US7639003B2 (en) 2002-12-13 2009-12-29 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7468609B2 (en) 2003-05-06 2008-12-23 Cascade Microtech, Inc. Switched suspended conductor and connection
US7876115B2 (en) 2003-05-23 2011-01-25 Cascade Microtech, Inc. Chuck for holding a device under test
US7898273B2 (en) 2003-05-23 2011-03-01 Cascade Microtech, Inc. Probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US8069491B2 (en) 2003-10-22 2011-11-29 Cascade Microtech, Inc. Probe testing structure
US7362115B2 (en) 2003-12-24 2008-04-22 Cascade Microtech, Inc. Chuck with integrated wafer support
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
US7688091B2 (en) 2003-12-24 2010-03-30 Cascade Microtech, Inc. Chuck with integrated wafer support
US7759953B2 (en) 2003-12-24 2010-07-20 Cascade Microtech, Inc. Active wafer probe
US7176705B2 (en) 2004-06-07 2007-02-13 Cascade Microtech, Inc. Thermal optical chuck
US7504823B2 (en) 2004-06-07 2009-03-17 Cascade Microtech, Inc. Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US7514944B2 (en) 2004-07-07 2009-04-07 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7940069B2 (en) 2005-01-31 2011-05-10 Cascade Microtech, Inc. System for testing semiconductors
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7750652B2 (en) 2006-06-12 2010-07-06 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US9429638B2 (en) 2008-11-21 2016-08-30 Cascade Microtech, Inc. Method of replacing an existing contact of a wafer probing assembly
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US20170149406A1 (en) * 2015-11-24 2017-05-25 Cisco Technology, Inc. Unified Power and Data Cable

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