US20160238759A1 - Near infrared optical interference filters with improved transmission - Google Patents
Near infrared optical interference filters with improved transmission Download PDFInfo
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- US20160238759A1 US20160238759A1 US15/046,889 US201615046889A US2016238759A1 US 20160238759 A1 US20160238759 A1 US 20160238759A1 US 201615046889 A US201615046889 A US 201615046889A US 2016238759 A1 US2016238759 A1 US 2016238759A1
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- 230000005540 biological transmission Effects 0.000 title abstract description 15
- 230000003287 optical effect Effects 0.000 title description 15
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 87
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 83
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 81
- 229910021417 amorphous silicon Inorganic materials 0.000 claims abstract description 54
- 239000000377 silicon dioxide Substances 0.000 claims abstract description 34
- 239000003989 dielectric material Substances 0.000 claims abstract description 24
- 229910052814 silicon oxide Inorganic materials 0.000 claims abstract description 17
- 229910052681 coesite Inorganic materials 0.000 claims abstract 7
- 229910052906 cristobalite Inorganic materials 0.000 claims abstract 7
- 229910052682 stishovite Inorganic materials 0.000 claims abstract 7
- 229910052905 tridymite Inorganic materials 0.000 claims abstract 7
- 229910020286 SiOxNy Inorganic materials 0.000 claims abstract 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 40
- 239000010703 silicon Substances 0.000 claims description 40
- 229910052710 silicon Inorganic materials 0.000 claims description 38
- 239000000758 substrate Substances 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 35
- 239000007789 gas Substances 0.000 claims description 33
- 230000008569 process Effects 0.000 claims description 27
- 239000001257 hydrogen Substances 0.000 claims description 25
- 229910052739 hydrogen Inorganic materials 0.000 claims description 25
- 238000004544 sputter deposition Methods 0.000 claims description 25
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 23
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 17
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 17
- 150000003376 silicon Chemical class 0.000 claims description 15
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 11
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 11
- 239000001301 oxygen Substances 0.000 claims description 11
- 229910052760 oxygen Inorganic materials 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 10
- 229910052786 argon Inorganic materials 0.000 claims description 8
- 239000011521 glass Substances 0.000 claims description 6
- 239000011261 inert gas Substances 0.000 claims description 6
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 6
- 230000007423 decrease Effects 0.000 abstract description 4
- 238000000151 deposition Methods 0.000 description 16
- 239000000463 material Substances 0.000 description 15
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 15
- 230000008021 deposition Effects 0.000 description 12
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 8
- 238000013461 design Methods 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- 238000005984 hydrogenation reaction Methods 0.000 description 6
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 5
- 238000013459 approach Methods 0.000 description 4
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- 238000010521 absorption reaction Methods 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- 230000000996 additive effect Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
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- 150000002431 hydrogen Chemical class 0.000 description 2
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- 230000004297 night vision Effects 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 230000010363 phase shift Effects 0.000 description 2
- 229910052715 tantalum Inorganic materials 0.000 description 2
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910003202 NH4 Inorganic materials 0.000 description 1
- -1 Ta2O5 Chemical compound 0.000 description 1
- 125000004429 atom Chemical group 0.000 description 1
- 230000008033 biological extinction Effects 0.000 description 1
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- 150000001875 compounds Chemical class 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005566 electron beam evaporation Methods 0.000 description 1
- 238000000521 electronic sputter etching Methods 0.000 description 1
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- 239000011159 matrix material Substances 0.000 description 1
- URLJKFSTXLNXLG-UHFFFAOYSA-N niobium(5+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Nb+5].[Nb+5] URLJKFSTXLNXLG-UHFFFAOYSA-N 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
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- 239000010409 thin film Substances 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G02B5/20—Filters
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- G02B5/281—Interference filters designed for the infrared light
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C—CHEMISTRY; METALLURGY
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
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- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/285—Interference filters comprising deposited thin solid films
Definitions
- the following relates to the optical arts, optical filter arts, and related arts.
- a known transmission interference filter employs a stack of alternating silicon and silicon dioxide (SiO 2 ) layers. Such devices are known for use in the short wave and mid wave infrared down to about 1100 nm, as both silicon and SiO 2 are transparent in this range.
- the lower wavelength threshold (corresponding to the upper photon energy threshold) is controlled by the onset of absorption by the silicon, which in its crystalline form has a bandgap of about 1.12 eV.
- a key advantage of silicon in these devices is its high refractive index.
- the spectral profile of an optical interference filter is, among other things, dependent on the angle of illumination. As the angles increase the filters shift to shorter wavelength. This angular shift is dependent on the materials used and the distribution of those materials. Higher refractive index results in less angle shift.
- the amount of angle shift limits the useful bandwidth of the filter when used in optical systems.
- a filter constructed such as to yield low angular shift can have a narrower passband and hence greater noise rejection than one constructed of materials with lower refractive index.
- an interference filter including a layers stack comprising plurality of layers of at least: layers of amorphous hydrogenated silicon with added nitrogen (a-Si:H,N) and layers of one or more dielectric materials having a refractive index lower than the refractive index of the a-Si:H,N.
- the one or more dielectric materials may include, by way of non-limiting example, SiO 2 , silicon suboxide (SiO x ), and/or silicon oxynitride (SiO x N y ).
- the one or more dielectric materials include layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
- the a-Si:H,N has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
- the layers stack may be supported by a transparent substrate, such as a glass substrate.
- an interference filter in another illustrative aspect disclosed herein, includes a layers stack comprising alternating a-Si:H,N and silicon based dielectric layers, in which the interference filter has at least one passband with center wavelength in the range 750 1100 nm inclusive, or more preferably in the range 800-1100 nm inclusive.
- the silicon based dielectric layers may comprise, by way of non-limiting example, silicon oxide (SiO x ) layers and/or silicon oxynitride (SiO x N y ) layers.
- the a-Si:H,N has an atomic concentration between 4% and 8% hydrogen and between 2% and 12% nitrogen.
- the layers stack may be supported by a transparent substrate, such as a glass substrate.
- a method of manufacturing an interference filter comprising alternating a-Si:H,N and SiO x layers.
- the method comprises sputtering silicon from a silicon target onto a filter substrate and, during the sputtering, alternating between (i) a process gas including hydrogen and nitrogen in order to deposit a Si:H,N and (ii) a process gas including oxygen in order to deposit SiOx.
- the sputtering may comprise applying a negative bias to the silicon target, and including an inert gas component in both the process gas including hydrogen and nitrogen and the process gas including oxygen.
- the inert gas may, for example, be argon.
- interference filters manufactured by this process are also disclosed.
- an interference filter in another illustrative aspect disclosed herein, includes a layers stack comprising plurality of layers of at least layers of amorphous hydrogenated silicon and layers of one or more dielectric materials having a refractive index lower than the refractive index of the amorphous hydrogenated silicon, including layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive.
- the layers of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive include one or more layers comprising Si 3 N 4 , SiO x N y with y large enough to provide a refractive index of 1.9 or higher, Ta 2 O 5 , Nb 2 O 5 , or TiO 2 .
- the layers stack includes at least one SiO 2 layer immediately adjacent a layer of a dielectric material having a refractive index in the range 1.9 to 2.7 inclusive with no intervening layer of amorphous hydrogenated silicon.
- the amorphous hydrogenated silicon includes nitrogen.
- the amorphous hydrogenated silicon including nitrogen has an atomic concentration between 1% and 4% hydrogen and between 2% and 6% nitrogen.
- FIG. 1 diagrammatically shows a sputter deposition system for fabricating near infrared optical interference filters with improved transmission and/or reduced angular shift as disclosed herein.
- FIG. 2 diagrammatically shows the impact of hydrogenation on the optical properties (transmission and refractive index) of amorphous hydrogenated silicon (a-Si:H).
- FIG. 3 diagrammatically shows the impact of nitrogen additive on the optical properties (transmission and refractive index) of a-Si:H of fixed hydrogenation level.
- FIG. 4 diagrammatically shows an interference filter suitably manufactured using the sputter deposition system of FIG. 1 .
- an interference filter comprising a stack of layer units with hydrogenated silicon (a-Si:H) layers is used for operation in the near infrared (800-1250 nm), because the hydrogenation of the silicon decreases the absorption losses (both from intrinsic silicon and disorder induced) sufficiently to provide acceptable filter transmission characteristics in the passband.
- a-Si:H hydrogenated silicon
- narrow band interference filters for high numerical aperture optical systems is a compromise between obtaining high transmission with the low angle shift in the near infrared region where the material characteristics are changing rapidly.
- High transmission corresponds to low extinction coefficient (obtainable with high amounts of hydrogen) while small angle shift is achieved by high refractive index (obtainable with small amounts of hydrogen).
- the disclosed improvement pertains to adding a controlled amount of nitrogen to the a-Si:H layers of Si-based interference filters for use in the near-infrared (800-1100 nm). Said another way, this improvement entails substituting a-Si:H,N for a-Si:H.
- adding nitrogen increases the transmission with a reduced concomitant reduction in refractive index.
- the impact of adding nitrogen on the refractive index is much less than the impact of hydrogenation, especially for nitrogen fractions in the range of 10% nitrogen or lower. Accordingly, this modification enables fabrication of near-infrared interference filters operating in the range 800-1100 nm with improved control of the angular shift, peak transmission and filter bandwidth.
- substituting a-Si:H,N for a-Si:H can provide improved transmission in the passband.
- substituting a-Si:H,N for a-Si:H enables fabrication of near-infrared interference filters with improved transmission in the passband as compared with equivalent a-Si:H-based device having the same refractive index step (and hence the same spectral passband width).
- the inventors have found that in this design paradigm the practical operational range of such filters can be extended down to 750 nm.
- the spectral range encompassed by the disclosed a-Si:H,N based interference filters encompasses passbands of technological importance, such as the 850 nm optical data communications window.
- the angular shift results from the light ray path length through a layer increasing with increasing angular deviation away from normal incidence. This increase in path length corresponds to a change in the phase retardation, which affects constructive/destructive interference so as to introduce the angle shift.
- d L the normal incidence path length through a layer
- d′ L d L /cos( ⁇ L ).
- d L ′ d L / 1 - ( ⁇ n L ) 2 .
- the high refractive index layers are a-Si:H (which could be replaced by a-Si:H,N as disclosed herein) while silicon dioxide (SiO 2 having n ⁇ 1.4-1.5) serves as the low refractive index layers.
- silicon dioxide SiO 2 having n ⁇ 1.4-1.5
- the substitute layer is a dielectric layer that has a refractive index in the range 1.9 to 2.7 inclusive.
- Si-compatible materials providing these values include silicon nitride (Si 3 N 4 having n ⁇ 2.0-2.2), silicon oxynitride (SiO x N y with y large enough to provide a refractive index of 1.9 or higher), tantalum pentoxide (Ta 2 O 5 having n ⁇ 2.1-2.2), niobium pentoxide (Nb 2 O 5 having n ⁇ 2.3-2.4), or titanium dioxide (TiO 2 having n ⁇ 2.6).
- silicon nitride (Si 3 N 4 ) is used.
- the high index a-Si:H or a-Si:H,N layer should have hydrogen (and optionally nitrogen) content sufficient to provide the desired refractive index contrast with the low index layers.
- Optical design software e.g. a ray tracing simulator
- a ray tracing simulator can be used to optimize layer placement and thicknesses for materials with known refractive index in order to achieve desired center band, bandwidth, and angle shift design basis characteristics.
- the illustrative system employs sputter deposition—however, other deposition methods are contemplated, such as vacuum evaporation, electron-beam evaporation, or so forth. In general, either a.c. or d.c. sputtering may be used.
- the illustrative sputter deposition system includes a process chamber 10 containing a sputter target holder 12 and a substrate carousel 14 .
- a silicon target 16 e.g. silicon wafer 16
- One or more substrates 20 are loaded into the substrate carousel 14 .
- the substrate(s) 20 are suitably of a material, such as glass, silica, or alumina, that is transparent in the wavelength range of interest (e.g. 800-1000 nm, or 750-1000 nm).
- sputter deposition energetic particles are directed toward the target 16 (in this case a silicon target 16 ), which particles have sufficient energy to remove (i.e. “sputter”) material off the target, which then transfers (ballistically and/or under the influence of a magnetic or electric field) to the surface of the substrate(s) 20 so as to coat the substrates 20 with the sputtered material.
- the illustrative sputter deposition system employs argon (Ar) gas from an illustrative Ar gas bottle 22 or from another argon source as the energetic particles.
- the substrate(s) 20 are biased more positively as compared with the target 16 , e.g. the substrate(s) 20 are grounded in the illustrative sputter system of FIG. 1 .
- the target 16 is the cathode
- the chamber 10 (and/or the substrate(s) 20 , e.g. in some embodiments the substrate carousel 14 may be grounded) is the anode, of an electric circuit.
- argon is the sputtering gas in the illustrative embodiment, other inert gases that can be ionized could be alternatively used, such as xenon.
- an oxygen (O 2 ) bottle 24 or other oxygen source is provided.
- a hydrogen (H 2 ) bottle 26 or other hydrogen source for example, ammonia, NH 4 , or silane, SiH 4
- a nitrogen (N 2 ) bottle 30 or other nitrogen source are provided.
- a (diagrammatically indicated) gas inlet manifold 32 is provided in order to admit a desired gas mixture into the process chamber 10 during the sputter deposition process.
- Flow regulators 34 are adjustable to set the flow of Ar, O 2 , H 2 , and N 2 , respectively.
- the process chamber 10 is also connected with a suitable exhaust 36 (e.g.
- Suitable nitrogen gas sources include ammonia (NH 4 ) or hydrazine (N 2 H 4 ).
- NH 4 ammonia
- N 2 H 4 hydrazine
- calibrations should be performed to account for the relative incorporation of nitrogen and hydrogen into the a-Si:H,N layer.
- Process parameters such as substrate temperature, target bias ( ⁇ V), process chamber pressure, total flow rate, and so forth may impact relative incorporate of nitrogen versus hydrogen.
- Two valves VA, VB are provided to switch between depositing SiO 2 and a-Si:H,N.
- valve VA controls admission of oxygen from the oxygen source 24 into the gas inlet manifold 32
- valve VB controls admission of the hydrogen/nitrogen mixture from the hydrogen and nitrogen sources 26 , 30 .
- the valves VA, VB are automated valves whose actuators are controlled by an electronic sputtering controller 40 in accordance with a filter recipe 42 .
- the sputtering controller 40 may comprise digital-to-analog (D/A) converters, a high voltage source, and a microprocessor or microcontroller programmed to operate the D/A converters generate electrical actuation signals to open or close respective valves VA, VB in accordance with the filter recipe 42 and to operate the voltage source to apply the voltage ⁇ V to the target/cathode 16 .
- D/A digital-to-analog
- VA digital-to-analog
- VB high voltage source
- a microprocessor or microcontroller programmed to operate the D/A converters generate electrical actuation signals to open or close respective valves VA, VB in accordance with the filter recipe 42 and to operate the voltage source to apply the voltage ⁇ V to the target/cathode 16 .
- a lower right-hand inset table 50 shown in FIG. 1 summarizes the settings for valves VA, VB to deposit SiO 2 and a-Si:H,N, respectively. To deposit SiO 2 the valve VA is open
- the resulting process gas is an argon/oxygen mixture.
- the valve VA is closed to block the oxygen and the valve VB is opened to admit process gas comprising an argon/hydrogen/nitrogen mixture to the gas inlet manifold 32 .
- the argon source 22 is connected to the gas inlet manifold 32 independently from the valves VA, VB.
- Separate manually operable shut-off valves are typically provided for each gas source 22 , 24 , 26 , 30 to enable manual shut-off of each gas source independently from the automatic valves VA, VB.
- additional gas sources may be provided along with suitable valving.
- an additional nitrogen (N 2 ) bottle 25 or other nitrogen source are provided, controlled by a valve VC, in order to deposit silicon nitride (Si 3 N 4 ) layers.
- Si 3 N 4 silicon nitride
- deposition of Si 3 N 4 is obtained when valve VC is open and both valves VA and VB are closed.
- the silicon component of the silicon nitride is supplied by the silicon-based sputtering target 20 .
- the desired stoichiometry is set by the flow regulator on the nitrogen bottle 25 using suitable calibration runs.
- the target holder 12 may have multiple target slots which are loaded with a silicon target and also another slot loaded with a suitable target containing, e.g., tantalum, niobium, or titanium, for use in depositing the non-silicon containing dielectric layers.
- a suitable target containing e.g., tantalum, niobium, or titanium
- the tantalum, niobium, titanium, et cetera may be provided by a gas source or other source.
- Sputter deposition is initiated by flowing the appropriate process gas via the gas inlet manifold 32 and applying the cathode bias ⁇ V to the target 16 in order to ionize Ar atoms which are driven by the electric field to sputter silicon off the silicon target 16 .
- the particular startup sequence depends upon the particular sputter deposition system and other design considerations: for example, in one approach the process gas flow is first initiated and then the cathode bias ⁇ V is applied to initiate sputter deposition; alternatively, the bias can be applied under an inert gas flow and sputter deposition initiated by admitting the appropriate process gas.
- valves VA and VB are opened and closed in accord with the filter recipe 42 and the valve settings of table 50 in order to alternate between depositing SiO 2 (and/or optionally Si 3 N 4 ) and a-Si:H,N layers.
- the layer thicknesses are controlled based on deposition time and a priori knowledge of deposition rates obtained from calibration depositions.
- Layer compositions are determined based on the process gas mixture controlled by the settings of the flow regulators 34 which are set based on calibration depositions (such calibration deposition should also include process parameters such as substrate temperature, target bias ( ⁇ V), chamber pressure, and total flow rate in the calibration test matrix, as such parameters may also impact layer composition).
- process gas flow and the bias voltage ⁇ V are removed (again, the particular shutdown sequence depends upon the particular deposition system and so forth), the process chamber 10 is brought up to atmospheric pressure, opened, and the coated substrates 20 are unloaded.
- the filter includes the substrate 102 (e.g. the glass, silica, or alumina substrate initially loaded onto the substrate carousel 14 ) and alternating layers of a-Si:H,N 104 and SiO 2 106 and/or Si 3 N 4 108 .
- the layer immediately adjacent the substrate 102 is an a-Si:H,N layer 104 , but in other embodiments a dielectric layer may be immediately adjacent the substrate.
- the topmost layer is an a-Si:H,N layer 104 , but in other embodiments a dielectric layer may be the topmost layer.
- the illustrative stack includes an instance of immediately adjacent SiO 2 /Si 3 N 4 layers, which may be included if in accord with the design.
- the illustrative interference filter 100 includes layer stacks 110 , 112 on opposite sides of the substrate 102 —to manufacture such a device, the sputtering chamber may need to be opened and the substrates “flipped over” on the substrate carousel 14 . (Alternatively, the substrate carousel 14 may be configured to enable such a maneuver to be performed robotically without breaking open the chamber).
- Such a filter with two filter sides 110 , 112 may, for example, be a passband filter in which the stack on one side is a high-pass filter and the stack on the other side is a low-pass filter—a passband is then defined by a wavelength range that is both above the high pass filter cut-off and below the low-pass filter cutoff.
- a known application of this kind of filter is in applications using silicon detectors. These wavelengths are particularly useful in active devices, in which a light source as well as a detector are present. In this spectral region, LEDs and lasers are readily available which are inexpensive, plentiful and efficient. Some major applications include, but are not limited to, infrared gesture controls of human-machine (e.g. computer) interaction, infrared night vision for automobiles, LIDAR, infrared night vision for security cameras and proximity CMOS sensors used in mobile phone and elsewhere. In these applications the useful wavelength is between 700 and 1100 nm. In this range the a-Si:H,N is a high index material suitable for optical applications.
- the a-Si:H,N layers includes between 2% and 8% hydrogen and between 3%-7% nitrogen with the balance being Si. In general, more hydrogen and nitrogen contents provide shorter wavelength operation. In general, nitrogen concentrations as high as 6% to 12% are contemplated.
- the a-Si:H,N layers 104 alternate with SiO 2 layers 106 .
- SiO 2 has advantageous properties for this purpose, including good chemical compatibility with a-Si:H,N and a low refractive index (n ⁇ 1.5) which provides a large refractive index step at the interface with a-Si:H,N.
- the dielectric may not have exact SiO 2 stoichiometry, e.g. the SiO 2 may be replaced by SiO x where x is not precisely two (also referred to herein as “silicon suboxide”).
- a silicon oxynitride (SiO x N y ) layer is contemplated as the dielectric layer in place of SiO 2 .
- SiO x N y silicon oxynitride
- the refractive index of increases with nitrogen content for example, stoichiometric silicon nitride (Si 3 N 4 ) has a refractive index of about 2.0.
- a small amount of nitrogen that is, SiO x N y where x ⁇ 2 and x>>y
- These compounds offer index tailoring that permit the construction of novel material combinations and continuously varying refractive index profiles.
- the thicknesses of the constituent layers are chosen such that, for the design-basis passband center wavelength, the optical path lengths through each layer and reflected at its interface with the next layer constructively combine, that is, are integer multiples of the wavelength.
- the illustrative interference filters include repeating units of two layers, it is contemplated to incorporate three or more layers into the repeating unit, such as an a-Si:H,N layer and two different dielectric layers, to achieve desired passband properties (e.g. center wavelength, FWHM, “flatness” of the passband, et cetera).
- desired passband properties e.g. center wavelength, FWHM, “flatness” of the passband, et cetera.
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US17/835,495 US20220299688A1 (en) | 2015-02-18 | 2022-06-08 | Near infrared optical interference filters with improved transmission |
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US201562117598P | 2015-02-18 | 2015-02-18 | |
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EP (4) | EP3259626B1 (ko) |
JP (1) | JP6920994B2 (ko) |
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EP4163683B1 (en) | 2024-07-24 |
TWI743031B (zh) | 2021-10-21 |
KR20230140612A (ko) | 2023-10-06 |
EP3839585B1 (en) | 2022-11-09 |
JP6920994B2 (ja) | 2021-08-18 |
KR102583883B1 (ko) | 2023-09-27 |
US20190212484A1 (en) | 2019-07-11 |
US11372144B2 (en) | 2022-06-28 |
WO2016134122A1 (en) | 2016-08-25 |
US20220299688A1 (en) | 2022-09-22 |
TW201643478A (zh) | 2016-12-16 |
EP4414756A2 (en) | 2024-08-14 |
CN107209306B (zh) | 2020-10-20 |
EP3839585A2 (en) | 2021-06-23 |
EP4163683A1 (en) | 2023-04-12 |
CN112285817A (zh) | 2021-01-29 |
JP2018506076A (ja) | 2018-03-01 |
EP3839585A3 (en) | 2021-09-01 |
KR20170117533A (ko) | 2017-10-23 |
CN107209306A (zh) | 2017-09-26 |
EP3259626B1 (en) | 2021-04-21 |
EP3259626A1 (en) | 2017-12-27 |
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