US20130278328A1 - Power transistor partial current sensing for high precision applications - Google Patents
Power transistor partial current sensing for high precision applications Download PDFInfo
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- US20130278328A1 US20130278328A1 US13/454,730 US201213454730A US2013278328A1 US 20130278328 A1 US20130278328 A1 US 20130278328A1 US 201213454730 A US201213454730 A US 201213454730A US 2013278328 A1 US2013278328 A1 US 2013278328A1
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- 229910002601 GaN Inorganic materials 0.000 claims description 5
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 claims description 5
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 229910044991 metal oxide Inorganic materials 0.000 claims description 2
- 150000004706 metal oxides Chemical group 0.000 claims description 2
- 238000001465 metallisation Methods 0.000 description 13
- 238000005538 encapsulation Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910000896 Manganin Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002991 molded plastic Substances 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
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Definitions
- FIG. 10 is a perspective view of a power transistor module containing two power transistors in a stacked configuration.
- a current sense resistor referred to as a shunt
- the shunt may be directly electrically connected to the first portion of the power transistor.
- a voltage drop across the shunt is used to estimate current through the first portion of the power transistor.
- An optional bias compensation circuit may provide a compensated bias to the first control node segment of the power transistor to compensate for the voltage drop across the shunt.
- a first segment 116 of the second power node 114 would be part of the first portion 110 of the power transistor 102 and would be aligned with the first gate segment 106 so that current modulated by the first gate segment 106 is directed through the first segment 116 of the second power node 114 .
- a second segment 118 of the second power node 114 would be part of the second portion 112 of the power transistor 102 and would be aligned with the second gate segment 108 so that current modulated by the second gate segment 108 is directed through the second segment 118 of the second power node 114 .
- a ratio of an area of the first transistor portion 110 to a combined area of the first transistor portion 110 and the second transistor portion 112 is 5 percent to 75 percent.
- the power transistor 102 may be formed on single crystal silicon. In another version, the power transistor 102 may be formed on gallium nitride, for example on a gallium nitride epitaxial layer disposed over a single crystal silicon Substrate.
- the first power node 104 may be attached and electrically connected to an electrically conductive transistor pad 120 such as a plated copper pad, for example using an electrically conductive adhesive.
- a first clip 122 is electrically connected to the second power node 114 over the first portion 110 of the power transistor 102 , and specifically to the first segment 116 of the second power node 114 if present.
- the first clip 122 may be electrically connected to a first module pad 124 of the power transistor module 100 , and a shunt 126 is electrically connected to the first module pad 124 in series with the first transistor portion 110 .
- the power transistor module 100 may further include an optional controller 134 which may be connected to measurement sites on the shunt 126 by shunt monitor links 136 .
- the shunt monitor links 136 may be, for example, wire bonds.
- the controller 134 may estimate the current through the first transistor portion 110 , and may also estimate the total current through power transistor 102 .
- the controller 134 may provide bias voltages to the first gate segment 106 and the second gate segment 108 through gate bias links 138 .
- the gate bias links 138 may be, for example, wire bonds, and may be formed concurrently with the shunt monitor links 136 .
- the shunt 126 may be a strip of metal including manganin or other metal with a temperature coefficient of resistivity below 1 ⁇ 10 ⁇ 4 K ⁇ 1 .
- the shunt 126 may have plated head regions 140 to provide desired electrical connections to the first module pad 124 and the second module pad 128 .
- the shunt 126 may be a transistor of a same type as the power transistor 102 , so as to match a temperature coefficient of resistivity of the power transistor 102 .
- the power transistor 102 is an n-channel MOS transistor formed on gallium nitride
- the shunt may also be an n-channel MOS transistor formed on gallium nitride.
- the power transistor module 100 may further include a package, not shown, such as a molded plastic encapsulation or a substrate and potting compound cover.
- the package may include leads or may be leadless. Multiple instances of the power transistor module 100 may be formed concurrently using leadframes with multiple instances of the first clip 122 and the second clip 130 and possibly the shunt 126 . The power transistor modules 100 may subsequently singulated after the power transistor module instances 100 are encapsulated.
- FIG. 2 depicts a first and second clip in a clip array which may be used in fabrication of a power transistor module according to the invention.
- the first clip 200 and the second clip 202 are attached to a frame 204 by tiebars 206 .
- the frame may include multiple instances of the first clip 200 and the second clip 202 held in place by corresponding instances of the tiebars 206 .
- the tiebars 206 hold the first clip 200 and the second clip 202 in a desired configuration as the first clip 200 and the second clip 202 are attached to a power transistor.
- FIG. 4 is a perspective view of a power transistor module formed according to an alternate embodiment.
- the power transistor module 400 includes a power transistor 402 as described in reference to FIG. 1 .
- a shunt 404 is electrically connected to a first portion 406 of the power transistor 402 .
- the shunt 404 is further electrically connected to a module bus 408 .
- a clip 410 is electrically connected to a second portion 412 of the power transistor 402 and to the module bus 408 .
- a transistor pad 414 may be electrically connected to a common first power node of the power transistor 402 as described in reference to FIG. 1 .
- FIG. 7A and FIG. 7B depict instances of a power transistor formed according to an embodiment in power transistor modules with different clip configurations.
- the power transistor 700 has a common first power node, not shown, and a gate which includes a plurality of separate gate elements 702 .
- the power transistor 700 has a common second power node 706 . Current modulated by each of the gate elements 702 flows through the common first power node and through the common second power node 706 .
- a number of gate elements 702 under the first instance of the first clip 708 may be different than a number of the gate elements 702 under the second instance of the first clip 724 .
- Forming the power transistor 700 to have a plurality of gate elements 702 which may be connected to separate bondpads through the first and second interconnects may advantageously allow the power transistor 700 to be used in different clip configurations by forming different configurations of the first and second interconnects.
- the shunt may be directly electrically attached to the power transistor 700 in place of the first clip 708 and/or 724 , as described in reference to FIG. 4 .
- a power transistor 900 has a first portion 902 and a second portion 904 .
- a first terminus of a shunt 906 is coupled to a source node of the first transistor portion 902 .
- Drain nodes of the first transistor portion 902 and second transistor portion 904 are coupled to a power node, labeled V DD .
- a source node of the second transistor portion 904 and a second terminus of the shunt 906 are coupled to a ground node.
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Inverter Devices (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electronic Switches (AREA)
- Power Conversion In General (AREA)
- Amplifiers (AREA)
Abstract
Description
- Embodiments of the invention relate to the field of power transistors modules.
- Power transistor modules may be used in switching mode to supply modulated current, for example in buck converter power supplies. It may be desirable to accurately measure the current in the power transistors while minimizing power consumption of the power transistor modules.
- The following presents a simplified summary in order to provide a basic understanding of one or more aspects of the invention. This summary is not an extensive overview of the invention, and is neither intended to identify key or critical elements of the invention, nor to delineate the scope thereof. Rather, the primary purpose of the summary is to present some concepts of the invention in a simplified form as a prelude to a more detailed description that is presented later.
- A power transistor module may include a power transistor with a common power node, such as a drain or source node for a metal oxide semiconductor (MOS) power transistor or a collector or emitter node for a bipolar power transistor, and a split control node, such as gate node for the MOS power transistor or a base node for the bipolar power transistor. A first segment of the control node modulates current through a first portion of the power transistor, and a second segment of the control node modulates current through a second portion of the power transistor. A first power module interconnect element, referred to as a first clip, is connected to the opposite power node of the power transistor, which is the source or drain node, respectively, for the MOS power transistor or the emitter or collector node, respectively, for the bipolar power transistor, so that current through the first portion of the power transistor is directed through the first clip. A second clip is connected to the opposite power node of the power transistor so that current through the second portion of the power transistor is directed through the second clip. The split control node and first and second clips are configured so that a ratio of an area of the first portion of the power transistor to an area of the second portion of the power transistor is 5 percent to 75 percent. A current sense resistor, referred to as a shunt, is coupled in series to the first clip. A voltage drop across the shunt is used to estimate current through the first portion of the power transistor. In an alternate version, the shunt may be directly electrically connected to the first portion of the power transistor.
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FIG. 1 is a perspective view of a power transistor module formed according to an embodiment. -
FIG. 2 depicts a first and second clip in a clip array which may be used in fabrication of a power transistor module according to an embodiment of the invention. -
FIG. 3 depicts an array of instances of a first clip and a second clip in a clip array. -
FIG. 4 is a perspective view of a power transistor module formed according to an alternate embodiment. -
FIG. 5 andFIG. 6 depict alternate embodiments of power transistors. -
FIG. 7A andFIG. 7B depict instances of a power transistor formed according to an embodiment in power transistor modules with different clip configurations. -
FIG. 8 andFIG. 9 depict compensation circuits to provide equivalent gate-source biases to a first gate segment and a second gate segment of a power transistor module with an n-channel MOS power transistor in a source-down configuration. -
FIG. 10 is a perspective view of a power transistor module containing two power transistors in a stacked configuration. - The invention is described with reference to the attached figures, wherein like reference numerals are used throughout the figures to designate similar or equivalent elements. The figures are not drawn to scale and they are provided merely to illustrate the invention. Several aspects of the invention are described below with reference to example applications for illustration. It should be understood that numerous specific details, relationships, and methods are set forth to provide an understanding of the invention. One skilled in the relevant art, however, will readily recognize that the invention can be practiced without one or more of the specific details or with other methods. In other instances, well-known structures or operations are not shown in detail to avoid obscuring the invention. The invention is not limited by the illustrated ordering of acts or events, as some acts may occur in different orders and/or concurrently with other acts or events. Furthermore, not all illustrated acts or events are required to implement a methodology in accordance with the invention.
- A power transistor module may include a power transistor with a common power node, such as a drain or source node for an MOS power transistor or a collector or emitter node for a bipolar power transistor, and a split control node, such as gate node for the MOS power transistor or a base node for the bipolar power transistor. A first segment of the control node modulates current through a first portion of the power transistor, and a second segment of the control node modulates current through a second portion of the power transistor. A first power module interconnect element, referred to as a first clip, is connected to an opposite power node of the power transistor, which is a source or drain node, respectively, for the MOS power transistor or a emitter or collector node, respectively, for the bipolar power transistor, so that current through the first portion of the power transistor is directed through the first clip. A second clip is connected to the opposite power node of the power transistor so that current through the second portion of the power transistor is directed through the second clip. The split control node and first and second clips are configured so that a ratio of an area of the first portion of the power transistor to a combined area of the first and second portions of the power transistor is 5 percent to 75 percent. A current sense resistor, referred to as a shunt, is coupled in series to the first clip. In an alternate version, the shunt may be directly electrically connected to the first portion of the power transistor. A voltage drop across the shunt is used to estimate current through the first portion of the power transistor. An optional bias compensation circuit may provide a compensated bias to the first control node segment of the power transistor to compensate for the voltage drop across the shunt.
- For the purposes of this Description, the term “clip” will be understood to refer to a preformed electrically conductive interconnect of a power transistor module which is attached to a power transistor after the power transistor is singulated from a semiconductor substrate containing other instances of power transistors. Interconnect elements which are formed as part of the power transistor fabrication sequence preceding singulation are not considered to be clips.
-
FIG. 1 is a perspective view of a power transistor module formed according to an embodiment. Thepower transistor module 100 includes a power transistor 102 which may be, for example, an MOS power transistor or a bipolar junction transistor. For the purpose of improving the readability of this Description, embodiments will be described for MOS power transistors. It will be recognized that bipolar power transistors may be used in the embodiments in place of the MOS power transistors. The power transistor 102 has a commonfirst power node 104, which may be a drain node in one version of the embodiment or a source node in another version. The power transistor 102 has a split control node with afirst control segment 106 and asecond control segment 108. In the version of the embodiment in which the power transistor 102 is an MOS transistor, the split control node is a split gate node, thefirst control segment 106 is afirst gate segment 106 and thesecond control segment 108 is asecond gate segment 108. Thefirst gate segment 106 modulates current through afirst portion 110 of the power transistor 102, and thesecond gate segment 108 modulates current through asecond portion 112 of the power transistor 102. - A
second power node 114 of the power transistor 102 is a source node in a version of the embodiment in which thefirst power node 104 is the drain node, and is a drain node in a version in which thefirst power node 104 is the source node. In one version of the embodiment, thesecond power node 114 may be common to thefirst portion 110 and thesecond portion 112 of the power transistor 102. In another version, depicted inFIG. 1 , thesecond power node 114 may be split into two segments. In such a version, afirst segment 116 of thesecond power node 114 would be part of thefirst portion 110 of the power transistor 102 and would be aligned with thefirst gate segment 106 so that current modulated by thefirst gate segment 106 is directed through thefirst segment 116 of thesecond power node 114. Similarly, asecond segment 118 of thesecond power node 114 would be part of thesecond portion 112 of the power transistor 102 and would be aligned with thesecond gate segment 108 so that current modulated by thesecond gate segment 108 is directed through thesecond segment 118 of thesecond power node 114. A ratio of an area of thefirst transistor portion 110 to a combined area of thefirst transistor portion 110 and thesecond transistor portion 112 is 5 percent to 75 percent. In one version of the embodiment, the power transistor 102 may be a vertical MOS transistor. In an alternate version, the power transistor 102 may be a planar MOS transistor. In another version, the power transistor 102 may be a bipolar transistor 102, thefirst power node 104 may be a collector node or an emitter node, thesecond power node 114 may be an emitter node or a collector node, respectively, the split control node may be a base node, thefirst control segment 106 may be afirst base segment 106, and thesecond control segment 108 may be asecond base segment 108. In a further version, the power transistor 102 may be an insulated gate bipolar transistor (IGBT). In one version, the power transistor 102 may be formed on single crystal silicon. In another version, the power transistor 102 may be formed on gallium nitride, for example on a gallium nitride epitaxial layer disposed over a single crystal silicon Substrate. - The
first power node 104 may be attached and electrically connected to an electricallyconductive transistor pad 120 such as a plated copper pad, for example using an electrically conductive adhesive. Afirst clip 122 is electrically connected to thesecond power node 114 over thefirst portion 110 of the power transistor 102, and specifically to thefirst segment 116 of thesecond power node 114 if present. In the embodiment, thefirst clip 122 may be electrically connected to afirst module pad 124 of thepower transistor module 100, and ashunt 126 is electrically connected to thefirst module pad 124 in series with thefirst transistor portion 110. Asecond module pad 128 may be electrically connected to theshunt 126 to form a first electrically connected path including, in order, thetransistor pad 120, thefirst transistor portion 110, thefirst clip 122, thefirst module pad 124, theshunt 126 and thesecond module pad 128. - A
second clip 130 is electrically connected to thesecond power node 114 over thesecond portion 112 of the power transistor 102, and specifically to thesecond segment 118 of thesecond power node 114 if present, and may be electrically connected to athird module pad 132, to form a second electrically connected path including, in order, thetransistor pad 120, thesecond transistor portion 112, thesecond clip 130 and thethird module pad 132. Thefirst clip 122 and thesecond clip 130 may be electrically connected to the power transistor 102 using, for example, solder or an electrically conductive adhesive. Theshunt 126 may be electrically connected to thefirst module pad 124 and thesecond module pad 128 using a same connection process as thefirst clip 122 and thesecond clip 130. Thefirst clip 122, thesecond clip 130 and theshunt 126 may be electrically connected concurrently. - During operation of the power transistor module 100 a voltage drop across the
shunt 126 is measured to estimate a current through thefirst transistor portion 110, for example by dividing the voltage drop by a resistance of theshunt 126. A total current through the power transistor 102 may be estimated by scaling the estimated first portion current by a ratio of the combined area of thefirst transistor portion 110 and thesecond transistor portion 112 to the area of thefirst transistor portion 110. Forming the power transistor 102 so that the ratio of the area of thefirst transistor portion 110 to a combined area of thefirst transistor portion 110 and thesecond transistor portion 112 is 5 percent to 75 percent may provide a desired accuracy of the estimated total current while maintaining a total power consumed by thepower transistor module 100 within a desired limit. - The
power transistor module 100 may further include anoptional controller 134 which may be connected to measurement sites on theshunt 126 byshunt monitor links 136. The shunt monitorlinks 136 may be, for example, wire bonds. Thecontroller 134 may estimate the current through thefirst transistor portion 110, and may also estimate the total current through power transistor 102. Thecontroller 134 may provide bias voltages to thefirst gate segment 106 and thesecond gate segment 108 through gate bias links 138. The gate bias links 138 may be, for example, wire bonds, and may be formed concurrently with theshunt monitor links 136. - In one version of the embodiment, the
shunt 126 may be a strip of metal including manganin or other metal with a temperature coefficient of resistivity below 1×10−4 K−1. Theshunt 126 may have platedhead regions 140 to provide desired electrical connections to thefirst module pad 124 and thesecond module pad 128. In another version of the embodiment, theshunt 126 may be a transistor of a same type as the power transistor 102, so as to match a temperature coefficient of resistivity of the power transistor 102. for example, if the power transistor 102 is an n-channel MOS transistor formed on gallium nitride, the shunt may also be an n-channel MOS transistor formed on gallium nitride. - The
power transistor module 100 may further include a package, not shown, such as a molded plastic encapsulation or a substrate and potting compound cover. The package may include leads or may be leadless. Multiple instances of thepower transistor module 100 may be formed concurrently using leadframes with multiple instances of thefirst clip 122 and thesecond clip 130 and possibly theshunt 126. Thepower transistor modules 100 may subsequently singulated after the powertransistor module instances 100 are encapsulated. -
FIG. 2 depicts a first and second clip in a clip array which may be used in fabrication of a power transistor module according to the invention. Thefirst clip 200 and thesecond clip 202 are attached to aframe 204 bytiebars 206. The frame may include multiple instances of thefirst clip 200 and thesecond clip 202 held in place by corresponding instances of thetiebars 206. Thetiebars 206 hold thefirst clip 200 and thesecond clip 202 in a desired configuration as thefirst clip 200 and thesecond clip 202 are attached to a power transistor. Fabrication of the power transistor module containing thefirst clip 200, thesecond clip 202 and the power transistor may possibly include an encapsulation operation which surrounds thefirst clip 200, thesecond clip 202 and the power transistor with an encapsulation compound such as epoxy. After encapsulation, the power transistor module may be singulated from theframe 204, for example by sawing, which severs thetiebars 206, separating thefirst clip 200 and thesecond clip 202 from theframe 204. -
FIG. 3 depicts an array of instances of a first clip and a second clip in a clip array. Theclip array 300 multiple instances of afirst clip 302 and asecond clip 304 attached bytiebars 306 to aframe 308, as described in reference toFIG. 2 . Fabricating a plurality of power transistor modules concurrently using theclip array 300 may advantageously reduce a cost of each power transistor module. -
FIG. 4 is a perspective view of a power transistor module formed according to an alternate embodiment. Thepower transistor module 400 includes apower transistor 402 as described in reference toFIG. 1 . Ashunt 404 is electrically connected to afirst portion 406 of thepower transistor 402. Theshunt 404 is further electrically connected to amodule bus 408. Aclip 410 is electrically connected to asecond portion 412 of thepower transistor 402 and to themodule bus 408. Atransistor pad 414 may be electrically connected to a common first power node of thepower transistor 402 as described in reference toFIG. 1 . A first electrically connected path of thepower transistor module 400 includes, in order, thetransistor pad 414, thefirst transistor portion 406, theshunt 404 and themodule bus 408. A second electrically connected path includes, in order, thetransistor pad 414, thesecond transistor portion 412, theclip 410 and themodule bus 408. Forming thepower transistor module 400 so that theshunt 404 is electrically connected to thefirst transistor portion 406 may advantageously provide a reduced size of thepower transistor module 400. - The
power transistor module 400 may further include anoptional controller 416, as described in reference toFIG. 1 , possibly disposed on theshunt 404 so as to advantageously reduce a size of thepower transistor module 400. Thecontroller 416 may be electrically connected to theshunt 404 throughshunt monitor links 418 and may be electrically connected to the gate bondpads of thepower transistor 402 through gate bias links 420. In another version of the embodiment, thecontroller 416 may be disposed adjacent to thepower transistor 402 as described in reference toFIG. 1 . In an alternate version of the embodiment, thecontroller 416 may be disposed outside of thepower transistor module 400, for example on a circuit board on which thepower transistor module 400 is mounted. -
FIG. 5 andFIG. 6 depict alternate embodiments of power transistors. Referring toFIG. 5 , thepower transistor 500 hasfirst transistor portion 502 and asecond transistor portion 504. Thepower transistor 500 has a first power node, not shown, which is common to thefirst transistor portion 502 and thesecond transistor portion 504, as described in reference toFIG. 1 . Thepower transistor 500 has a split gate with a first gate segment, not shown, and a second gate segment, not shown. The first gate segment modulates current through thefirst transistor portion 502, and the second gate segment modulates current through thesecond transistor portion 504, as described in reference toFIG. 1 . Thepower transistor 500 further includes a second power node which is split into a firstpower node segment 506 within thefirst transistor portion 502 and a secondpower node segment 508 within thesecond transistor portion 504. Thepower transistor 500 is formed so that the current modulated by the first gate segment flows through the firstpower node segment 506, and the current modulated by the second gate segment flows through the secondpower node segment 508. The firstpower node segment 506 has afirst metallization structure 510 within thefirst transistor portion 502 formed so that the current through the firstpower node segment 506 flows through thefirst metallization structure 510. Similarly, the secondpower node segment 508 has asecond metallization structure 512 within thesecond transistor portion 504 formed so that the current through the secondpower node segment 508 flows through thesecond metallization structure 512. Thefirst metallization structure 510 is physically separate from thesecond metallization structure 512. Afirst clip 514, as described in reference toFIG. 1 , is electrically connected to thefirst metallization structure 510 and asecond clip 516, as described in reference toFIG. 1 , is electrically connected to thesecond metallization structure 512. In an alternate version of the embodiment, ashunt 514 may be electrically connected to thefirst metallization structure 510 rather than a clip. - Referring to
FIG. 6 , thepower transistor 600 hasfirst transistor portion 602 and asecond transistor portion 604. Thepower transistor 600 has a first power node, not shown, which is common to thefirst transistor portion 602 and thesecond transistor portion 604, as described in reference toFIG. 1 . Thepower transistor 600 has a split gate with a first gate segment, not shown, and a second gate segment, not shown. The first gate segment modulates current through thefirst transistor portion 602, and the second gate segment modulates current through thesecond transistor portion 604, as described in reference toFIG. 1 . Thepower transistor 600 further includes asecond power node 606 which extends into thefirst transistor portion 602 and thesecond transistor portion 604. Thesecond power node 606 has ametallization structure 608 which extends into thefirst transistor portion 602 and thesecond transistor portion 604. Afirst clip 610 is electrically attached to themetallization structure 608 in thefirst transistor portion 602 and asecond clip 612 is electrically attached to themetallization structure 608 in thesecond transistor portion 604. Current modulated by the first gate segment flows through thefirst clip 610 and current modulated by the second gate flows through thesecond clip 612. A ratio of an area of thefirst transistor portion 602 to a combined area of thefirst transistor portion 602 and thesecond transistor portion 604 is 5 percent to 75 percent. Forming thepower transistor 600 to have ametallization structure 608 which extends into thefirst transistor portion 602 and thesecond transistor portion 604 may advantageously allow a second instance of thepower transistor 600 to be used with a different configuration of clips to provide a different area ratio. -
FIG. 7A andFIG. 7B depict instances of a power transistor formed according to an embodiment in power transistor modules with different clip configurations. Thepower transistor 700 has a common first power node, not shown, and a gate which includes a plurality ofseparate gate elements 702. Thepower transistor 700 has a commonsecond power node 706. Current modulated by each of thegate elements 702 flows through the common first power node and through the commonsecond power node 706. - Referring to
FIG. 7A , a first instance of afirst clip 708 is electrically attached to thesecond power node 706 over a first subset of thegate elements 702 of a first instance of thepower transistor 700, so that current modulated by thegate elements 702 under thefirst clip 708 flows through thefirst clip 708. A first instance of a shunt, not shown, is electrically attached to thefirst clip 708 so that the current from thepower transistor 700 flowing through thefirst clip 708 flows through the first instance of the shunt. A first instance of asecond clip 710 is electrically connected to thesecond power node 706 over a second subset of thegate elements 702, so that current modulated by thegate elements 702 under thesecond clip 710 flows through thesecond clip 710. Thegate elements 702 under thefirst clip 708 control current through afirst portion 712 of the first instance of thepower transistor 700. Thegate elements 702 under thesecond clip 710 control current through asecond portion 714 of the first instance of thepower transistor 700. A ratio of an area of thefirst transistor portion 712 to a combined area of thefirst transistor portion 712 and thesecond transistor portion 714 is 5 percent to 75 percent. Thegate elements 702 under thefirst clip 708 are electrically connected together and form a first gate segment. For example, thegate elements 702 under thefirst clip 708 may be electrically connected through a first interconnect element of thepower transistor 700 to afirst bondpad 704 on thepower transistor 700 and wirebonded 720 to afirst control circuit 716 of a first instance of acontroller 718. Similarly, thegate elements 702 under thesecond clip 710 are electrically connected together and form a second gate segment. For example, thegate elements 702 under thesecond clip 710 may be electrically connected through a second interconnect element of thepower transistor 700 to asecond bondpad 705 on thepower transistor 700 and wirebonded 720 to asecond control circuit 722 of the first instance of thecontroller 718. The first and second interconnects may be formed during a last step of fabricating thepower transistor 700. - Referring to
FIG. 7B , a second instance of afirst clip 724 is electrically attached to thesecond power node 706 over a first subset of thegate elements 702 of a second instance of thepower transistor 700, so that current modulated by thegate elements 702 under thefirst clip 724 flows through thefirst clip 724. A second instance of the shunt, not shown, is electrically attached to thefirst clip 724 so that the current from thepower transistor 700 flowing through thefirst clip 724 flows through the second instance of the shunt. A second instance of asecond clip 726 is electrically connected to thesecond power node 706 over a second subset of thegate elements 702, so that current modulated by thegate elements 702 under thesecond clip 726 flows through thesecond clip 726. Thegate elements 702 under thefirst clip 724 control current through afirst portion 728 of the second instance of thepower transistor 700. Thegate elements 702 under thesecond clip 726 control current through asecond portion 730 of the second instance of thepower transistor 700. A ratio of an area of thefirst transistor portion 728 to a combined area of thefirst transistor portion 728 and thesecond transistor portion 730 is 5 percent to 75 percent. Thegate elements 702 under thefirst clip 724 are electrically connected together, for example, to thefirst bondpad 704 and wirebonded 720 to thefirst control circuit 716 of a second instance of thecontroller 718. Similarly, thegate elements 702 under thesecond clip 726 are electrically connected together, for example to thesecond bondpad 705 and wirebonded 720 to thesecond control circuit 722 of the second instance of thecontroller 718. - A number of
gate elements 702 under the first instance of thefirst clip 708 may be different than a number of thegate elements 702 under the second instance of thefirst clip 724. Forming thepower transistor 700 to have a plurality ofgate elements 702 which may be connected to separate bondpads through the first and second interconnects may advantageously allow thepower transistor 700 to be used in different clip configurations by forming different configurations of the first and second interconnects. In either of the embodiments depicted inFIG. 7A andFIG. 7B , the shunt may be directly electrically attached to thepower transistor 700 in place of thefirst clip 708 and/or 724, as described in reference toFIG. 4 . -
FIG. 8 andFIG. 9 depict compensation circuits to provide equivalent gate-source biases to a first gate segment and a second gate segment of a power transistor module with an n-channel MOS power transistor in a source-down configuration, formed according to any of the embodiments described in reference toFIG. 1 throughFIG. 6 ,FIG. 7A andFIG. 7B . Referring toFIG. 8 , apower transistor 800 has afirst portion 802 and asecond portion 804. A first terminus of ashunt 806 is coupled to a source node of thefirst transistor portion 802. Drain nodes of thefirst transistor portion 802 andsecond transistor portion 804 are coupled to a power node, labeled VDD. A source node of thesecond transistor portion 804 and a second terminus of theshunt 806 are coupled to a ground node. - A gate signal, labeled ΦGATE, is coupled to an input of a
gate buffer 808. An output of thegate buffer 808 is coupled to a gate node of a second gate segment of thesecond transistor portion 804. The output of thegate buffer 808 is also coupled to a first portiongate compensation circuit 810. The first portiongate compensation circuit 810 includes anamplifier 812. The output of thegate buffer 808 is coupled to a non-inverting input of theamplifier 812 through aninput resistor R INPUT 814 of the first portiongate compensation circuit 810. The first terminus of theshunt 806 is coupled to the non-inverting input of theamplifier 812 through an offsetresistor R OFFSET 816 of the first portiongate compensation circuit 810 which has a resistance equal toR INPUT 814. The second terminus of theshunt 806 is coupled to an inverting input of theamplifier 812 through agrounding resistor R GND 818 of the first portiongate compensation circuit 810. An output of theamplifier 812 is coupled to the inverting input of theamplifier 812 through afeedback resistor R FEEDBACK 820 of the first portiongate compensation circuit 810 which has a resistance equal toR GND 818. The output of theamplifier 812 is coupled to a gate node of a first gate segment of thefirst transistor portion 802, possibly through an optionaloutput resistor R OUTPUT 822 of the first portiongate compensation circuit 810. - The first portion
gate compensation circuit 810 may advantageous provide a same gate-source bias to thefirst transistor portion 802 as is provided to thesecond transistor portion 804. It will be recognized that operation of the gate signal ΦGATE at voltage levels of VDD will require a voltage supply to theamplifier 812 above VDD. The first portiongate compensation circuit 810 may be contained in a controller of the power transistor module containing thepower transistor 800. - Referring to
FIG. 9 , apower transistor 900 has afirst portion 902 and asecond portion 904. A first terminus of ashunt 906 is coupled to a source node of thefirst transistor portion 902. Drain nodes of thefirst transistor portion 902 andsecond transistor portion 904 are coupled to a power node, labeled VDD. A source node of thesecond transistor portion 904 and a second terminus of theshunt 906 are coupled to a ground node. - A gate signal, labeled ΦGATE, is coupled to an input of a
gate buffer 908. An output of thegate buffer 908 is coupled to a gate node of a first gate segment of thefirst transistor portion 902. The output of thegate buffer 908 is also coupled to a second portiongate compensation circuit 910. The first portiongate compensation circuit 810 includes anamplifier 812. An out put of theamplifier 912 is coupled to a gate of an re-channel current limitingMOS transistor 914. A source node of the current limitingMOS transistor 914 is coupled to a first terminus of abias resistor R BIAS 916. A second terminus of thebias resistor R BIAS 916 is coupled to the second terminus of theshunt 906. A drain node of the current limitingMOS transistor 914 is coupled to a first terminus of an offsetresistor R OFFSET 918 which has a resistance equal toR BIAS 916. A second terminus of the offsetresistor R OFFSET 918 is coupled to the output of thegate buffer 908. The first terminus of thebias resistor R BIAS 916 is coupled to an inverting input of theamplifier 912. The first terminus of theshunt 906 is coupled to a non-inverting input of theamplifier 912. The first terminus of the offsetresistor R OFFSET 918 is coupled to a gate node of a second gate segment of thesecond transistor portion 904. - The second portion
gate compensation circuit 910 may advantageous provide a same gate-source bias to thesecond transistor portion 904 as is provided to thefirst transistor portion 902. It will be recognized that operation of the gate signal ΦGATE at voltage levels of VDD may not necessarily require a voltage supply to theamplifier 912 above VDD. The second portiongate compensation circuit 910 may be contained in a controller of the power transistor module containing thepower transistor 900. -
FIG. 10 is a perspective view of a power transistor module containing two power transistors in a stacked configuration. Thepower transistor module 1000 includes afirst power transistor 1002 attached to atransistor pad 1004. Thetransistor pad 1004 is electrically attached to a first power node of thefirst power transistor 1002. Anintermediate clip 1006 is electrically attached to a second power node of thefirst power transistor 1002. Asecond power transistor 1008 has afirst transistor portion 1010 and asecond transistor portion 1012, as described in reference toFIG. 1 . A common first power node, not shown, of thesecond power transistor 1008 is electrically attached to theintermediate clip 1006 opposite from thefirst power transistor 1002. Afirst clip 1014 is electrically attached to a first portion of a second power node of thesecond power transistor 1008 over thefirst transistor portion 1010, as described in reference toFIG. 1 . Asecond clip 1016 is electrically attached to a second portion of the second power node of thesecond power transistor 1008 over thesecond transistor portion 1012, as described in reference toFIG. 1 . - The
intermediate clip 1006, thefirst clip 1014 and thesecond clip 1016 may be electrically connected to 1018, 1020 and 1022 respectively. Amodule pads controller 1024 may be electrically connected to a gate of thefirst power transistor 1002 and to a first gate and a second gate of thesecond power transistor 1008, for example throughwirebonds 1026. The first gate of thesecond power transistor 1008 modulates current that flows through thefirst clip 1014, and the second gate modulates current that flows through thesecond clip 1016. A shunt may be directly electrically attached to thesecond power transistor 1008 in place of thefirst clip 1014, as described in reference toFIG. 4 . - While various embodiments of the invention have been described above, it should be understood that they have been presented by way of example only and not limitation. Numerous changes to the disclosed embodiments can be made in accordance with the disclosure herein without departing from the spirit or scope of the invention. Thus, the breadth and scope of the invention should not be limited by any of the above described embodiments. Rather, the scope of the invention should be defined in accordance with the following claims and their equivalents.
Claims (20)
Priority Applications (4)
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| US13/454,730 US8581660B1 (en) | 2012-04-24 | 2012-04-24 | Power transistor partial current sensing for high precision applications |
| JP2015509111A JP6089099B2 (en) | 2012-04-24 | 2013-04-24 | Power transistor module |
| CN201380021983.0A CN104247027B (en) | 2012-04-24 | 2013-04-24 | Power transistor module |
| PCT/US2013/038012 WO2013163308A1 (en) | 2012-04-24 | 2013-04-24 | Power transistor module |
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| US13/454,730 US8581660B1 (en) | 2012-04-24 | 2012-04-24 | Power transistor partial current sensing for high precision applications |
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- 2013-04-24 JP JP2015509111A patent/JP6089099B2/en active Active
- 2013-04-24 WO PCT/US2013/038012 patent/WO2013163308A1/en active Application Filing
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| US20140334051A1 (en) * | 2011-12-19 | 2014-11-13 | Denso Corporation | Current detection circuit and semiconductor integrated circuit device |
| US9531186B2 (en) * | 2011-12-19 | 2016-12-27 | Denso Corporation | Current detection circuit and semiconductor integrated circuit device |
| US20140306332A1 (en) * | 2013-04-11 | 2014-10-16 | Texas Instruments Incorporated | Integrating Multi-Output Power Converters Having Vertically Stacked Semiconductor Chips |
| US9214415B2 (en) * | 2013-04-11 | 2015-12-15 | Texas Instruments Incorporated | Integrating multi-output power converters having vertically stacked semiconductor chips |
| US9355991B2 (en) * | 2013-04-11 | 2016-05-31 | Texas Instruments Incorporated | Integrating multi-output devices having vertically stacked semiconductor chips |
| US9373571B2 (en) | 2013-04-11 | 2016-06-21 | Texas Instruments Incorporated | Integrating multi-output power converters having vertically stacked semiconductor chips |
| US9653388B2 (en) | 2013-04-11 | 2017-05-16 | Texas Instruments Incorporated | Integrating multi-output power converters having vertically stacked semiconductor chips |
| US10950509B2 (en) | 2018-05-09 | 2021-03-16 | Infineon Technologies Ag | Semiconductor device with integrated shunt resistor |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013163308A1 (en) | 2013-10-31 |
| CN104247027B (en) | 2017-09-12 |
| JP6089099B2 (en) | 2017-03-01 |
| JP2015519741A (en) | 2015-07-09 |
| US8581660B1 (en) | 2013-11-12 |
| CN104247027A (en) | 2014-12-24 |
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