US20130248714A1 - Uncooled infrared imaging device - Google Patents

Uncooled infrared imaging device Download PDF

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Publication number
US20130248714A1
US20130248714A1 US13/728,009 US201213728009A US2013248714A1 US 20130248714 A1 US20130248714 A1 US 20130248714A1 US 201213728009 A US201213728009 A US 201213728009A US 2013248714 A1 US2013248714 A1 US 2013248714A1
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Prior art keywords
infrared
pixels
heat
thermoelectric conversion
infrared detection
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Abandoned
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US13/728,009
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English (en)
Inventor
Hiroto Honda
Kazuhiro Suzuki
Hideyuki Funaki
Masaki Atsuta
Keita Sasaki
Koichi Ishii
Honam Kwon
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Toshiba Corp
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Individual
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Assigned to KABUSHIKI KAISHA TOSHIBA reassignment KABUSHIKI KAISHA TOSHIBA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ATSUTA, MASAKI, FUNAKI, HIDEYUKI, HONDA, HIROTO, ISHII, KOICHI, KWON, HONAM, SASAKI, KEITA, SUZUKI, KAZUHIRO
Publication of US20130248714A1 publication Critical patent/US20130248714A1/en
Priority to US14/693,661 priority Critical patent/US9170160B2/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02—Constructional details
    • G01J5/0225—Shape of the cavity itself or of elements contained in or suspended over the cavity
    • G01J5/023—Particular leg structure or construction or shape; Nanotubes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14649—Infrared imagers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/33—Transforming infrared radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077—Imaging

Definitions

  • An embodiment described herein relates generally to an uncooled infrared imaging device.
  • Infrared rays are radiated from a heat source even in the dark, and characteristically have higher permeability than visible light in smoke or fog. Accordingly, infrared imaging can be performed during day and night. Also, temperature information about an object can be obtained through infrared imaging. In view of this, infrared imaging can be applied to a wide variety of fields such as the defense field and the fields of security cameras and fire detecting cameras.
  • uncooled infrared imaging devices that do not require cooling mechanisms have been actively developed.
  • An uncooled or thermal infrared imaging device converts an incident infrared ray of approximately 10 ⁇ m in wavelength into heat with an absorption mechanism, and further converts the temperature change at the heat sensitive unit caused by the small amount of heat into an electrical signal with a thermoelectric conversion means.
  • the uncooled infrared imaging device reads the electrical signal, to obtain infrared image information.
  • infrared sensors each using a silicon pn junction that converts a temperature change into a voltage change by applying a constant forward current.
  • infrared sensors can be mass-produced through a silicon LSI manufacturing process using a SOI (Silicon On Insulator) substrate as a semiconductor substrate.
  • SOI Silicon On Insulator
  • the rectification properties of the silicon pn junctions serving as the thermoelectric conversion means are utilized to realize the row select function, and accordingly, the pixels can be designed to have very simple structures.
  • NETD Noise Equivalent Temperature Difference
  • Thermoelectric conversion elements are sensitive to temperature components other than temperature rises caused by incident infrared rays, or to the temperature of the semiconductor substrate and the self-heating temperature at the time of flowing of current. To correct those “offset temperatures”, reference pixels are provided.
  • a conventional reference pixel reflects the influence of the temperature of the semiconductor substrate, but has a different self-heating temperature from that of an infrared detection pixel.
  • the difference in self-heating temperature is much larger than a signal generated from an incident infrared ray, and therefore, it is necessary to correct the difference.
  • FIG. 1 is a circuit diagram of an uncooled infrared imaging device according to an embodiment
  • FIGS. 2( a ) and 2 ( b ) are a plan view and a cross-sectional view of an infrared detection pixel according to the embodiment, respectively;
  • FIGS. 3( a ) and 3 ( b ) are a plan view and a cross-sectional view of a reference pixel according to the embodiment, respectively;
  • FIGS. 4( a ) and 4 ( b ) are graphs showing the self-heating amounts in an infrared detection pixel and a reference pixel, respectively.
  • An uncooled infrared imaging device includes: a semiconductor substrate; an imaging region formed on the semiconductor substrate, a plurality of pixels being arranged in a matrix form in the imaging region, the plurality of pixels including a plurality of reference pixels arranged in at least one row, and a plurality of infrared detection pixels arranged in the remaining rows, each of the infrared detection pixels being configured to detect an incident infrared ray, each of the reference pixels including a first cell located above a first concave portion formed in a surface portion of the semiconductor substrate, the first cell including a first thermoelectric converting unit including a first infrared absorption film and a first thermoelectric conversion element, the first infrared absorption film being configured to absorb the incident infrared ray and convert the incident infrared ray into heat, the first thermoelectric conversion element being configured to convert the heat obtained by the first infrared absorption film into an electrical signal, each of the infrared detection pixels including a second cell located above a second conca
  • FIG. 1 shows an uncooled infrared imaging device (hereinafter also referred to as the infrared sensor) according to an embodiment.
  • the infrared sensor of this embodiment includes an imaging region formed on a semiconductor substrate.
  • an imaging region normally accommodates more pixels than the above, the imaging region in this embodiment accommodates pixels, or reference pixels and infrared detection pixels, which are arranged in three rows and two columns, for descriptive purposes.
  • Each of the pixels includes a pn junction (diodes) serving as a thermoelectric conversion element, which will be described later in detail.
  • the first terminal (the anode-side terminal of the pn junction) of each of the reference pixels 11 1 and 11 2 is connected to a row select line 45 0 .
  • the second terminals (the cathode-side terminals of the pn junctions) of the reference pixels 11 1 and 11 2 are connected to vertical signal lines (hereinafter also referred to simply as the signal lines) 44 1 and 44 2 , respectively.
  • the respective first terminals (the anode-side terminals of the pn junctions) of the infrared detection pixels 12 11 and 12 12 of the first row are connected to a row select line 45 1 .
  • the second terminals (the cathode-side terminals of the pn junctions) of the infrared detection pixels 12 11 and 12 12 are connected to the vertical signal lines 44 1 and 44 2 , respectively.
  • the respective first terminals (the anode-side terminals of the pn junctions) of the infrared detection pixels 12 21 and 12 22 of the second row are connected to a row select line 45 2 .
  • the second terminals (the cathode-side terminals of the pn junctions) of the infrared detection pixels 12 21 and 12 22 are connected to the vertical signal lines 44 1 and 44 2 , respectively.
  • Each of the row select lines 45 0 , 45 1 , and 45 2 is connected to a row select circuit 5 .
  • the rows are sequentially selected one by one by the row select circuit 5 , and a bias voltage Vd is applied to each selected row.
  • the load transistors 41 1 and 41 2 operate in a saturation region, and supply a constant current to the pixels of a selected row in accordance with a gate voltage GL 1 applied to the gates thereof. That is, the load transistors 41 function as constant current sources.
  • the source voltage of each of the load transistors 41 1 and 41 2 is represented by Vd0.
  • this differential clamp circuit holds signals that are output from the reference pixel connected to the corresponding signal line, and amplifies a differential signal when an infrared detection pixel connected to the corresponding signal line is selected.
  • a series voltage Vd ⁇ Vd0 is applied to the pn junctions of the reference pixels or the infrared detection pixels connected to the selected row. For example, if the row select line 45 0 is selected, the series voltage Vd ⁇ Vd0 is applied to the pn junctions of the reference pixels 11 1 and 11 2 . If the row select line 45 1 is selected, the series voltage Vd ⁇ Vd0 is applied to the pn junctions of the infrared detection pixels 12 11 and 12 12 . If the row select line 45 2 is selected, the series voltage Vd ⁇ Vd0 is applied to the pn junctions of the infrared detection pixels 12 21 and 12 22 .
  • the potential of each of the vertical signal lines 44 1 and 44 2 when any infrared ray is not received is defined as Vs1.
  • the object temperature varies by 1 K (Kelvin)
  • the thermoelectric conversion efficiency being 10 mV/K
  • the potential of each of the vertical signal lines 44 1 and 44 2 increases by approximately 50 ⁇ V, which is much smaller than the increase of the bias voltage Vd.
  • Vf0 represents the forward voltage of a pn junction when no infrared ray is received
  • Vsig represents the voltage signal based on the temperature rise in the later described thermoelectric converting unit of an infrared detection pixel
  • Vsh represents the change in voltage due to the Joule heat generated when a current is applied to the pn junction.
  • the self-heating amount is expressed by the following equation (1):
  • T cell ⁇ ( t ) I f ⁇ V f G th ⁇ ⁇ 1 - exp ⁇ ( - t C th / G th ) ⁇ ( 1 )
  • I f represents the amount of current determined by the operating points of the load transistors 41 1 and 41 2
  • V f represents the forward voltage of the pn junction
  • t represents the time elapsed from the start of flowing the current
  • t is sufficiently smaller than the value expressed by C th /G th
  • the equation (1) is approximated by the following equation (2), and the temperature increases in proportion to time.
  • T cell ⁇ ( t ⁇ 0 ) I f ⁇ V f C th ⁇ t ( 2 )
  • the SOI substrate includes a supporting substrate 181 , a buried insulating layer (a BOX layer) 182 , and a SOI (Silicon-On-Insulator) layer formed with silicon single crystals.
  • the SOI substrate has a concave portion 185 formed in a surface portion thereof. The concave portion 185 is formed by removing part of the supporting substrate 181 .
  • the cell 160 includes a thermoelectric converting unit 161 , and supporting structure units 167 a and 167 b that support the thermoelectric converting unit 161 above the concave portion 185 .
  • the thermoelectric converting unit 161 includes diodes (two diodes in FIG. 2( a )) 162 connected in series, an interconnect 163 connecting those diodes 162 , and an infrared absorption film 164 formed to cover the diodes 162 and the interconnect 163 .
  • the supporting structure unit 167 a includes: a connective interconnect 168 a that has one end connected to the corresponding vertical signal line and has the other end connected to one end of the series circuit formed with the series-connected diodes 162 ; and an insulating film 169 a coating the connective interconnect 168 a .
  • the other supporting structure unit 167 b includes: a connective interconnect 168 b that has one end connected to the corresponding row select line and has the other end connected to the other end of the series circuit formed with the series-connected diodes 162 ; and an insulating film 169 b coating the connective interconnect 168 b.
  • the infrared absorption film 164 generates heat upon receipt of an incident infrared ray.
  • the diodes 162 convert the heat generated by the infrared absorption film 164 into an electrical signal.
  • the supporting structure units 167 a and 167 b have elongate shapes so as to surround the thermoelectric converting unit 161 . With this arrangement, the thermoelectric converting unit 161 is supported on the SOI substrate, while being substantially heat-insulated from the SOI substrate.
  • the bias voltage Vd from the row select line 45 1 or 45 2 is transferred to the thermoelectric converting unit 161 via the interconnect 168 b .
  • the signal that has passed the thermoelectric converting unit 161 is transferred to the vertical signal line 44 1 or 44 2 via the interconnect 168 a.
  • the SOI substrate includes a supporting substrate 181 , a buried insulating layer (a BOX layer) 182 , and a SOI (Silicon-On-Insulator) layer formed with silicon single crystals.
  • the SOI substrate has a concave portion 185 a formed in a surface portion thereof.
  • the concave portion 185 a is formed by removing part of the supporting substrate 181 .
  • the cell 160 a includes a thermoelectric converting unit 161 a formed on the buried insulating layer 182 .
  • the thermoelectric converting unit 161 a includes diodes (two diodes in FIG. 3( a )) 162 a connected in series, an interconnect 163 a connecting those diodes 162 a, and an infrared absorption film 164 a formed to cover the diodes 162 a and the interconnect 163 a.
  • One end of the series circuit formed with the series-connected diodes 162 a is connected to a vertical signal line via an interconnect 165 a, and the other end of the series circuit is connected to a row select line via an interconnect 165 b.
  • the interconnects 165 a and 165 b are formed in regions where the concave portion 185 a is not formed.
  • the concave portion 185 a is formed below the thermoelectric converting unit 161 a.
  • the thermoelectric converting unit 161 a is connected to the portion of the buried insulating layer 182 formed outside the region where the concave portion 185 a is formed and to the portion of the insulating film 164 formed on the portion of the buried insulating layer 182 , via the buried insulating layer 182 and the insulating film 164 formed on the buried insulating layer 182 .
  • thermoelectric converting unit 161 a does not need to be supported above the concave portion 185 a by elongate supporting structure units. That is, unlike the thermoelectric converting unit 161 of each infrared detection pixel, the thermoelectric converting unit 161 a is not heat-insulated by elongate supporting structure units. Therefore, the heat generated from an infrared ray is smaller by several digits than that generated by an infrared detection pixel, and can be ignored. That is, in each reference pixel, the heat conductance G th , which is an indicator of heat insulating properties, is much higher than that of each infrared detection pixel, and heat easily escapes from each reference pixel.
  • the unit of the heat conductance G th is W/K, indicating how many watts of energy is transferred in a case where a heat conductor exists between two heat baths between which the temperature difference is 1 K.
  • the heat capacity C th is the indicator of how many joules of energy is required to increase the temperature of an object by 1K, and the unit thereof is J/K.
  • S represents the cross-sectional area of the supporting structure units 167 a and 167 b
  • L represents the length of the supporting structure units 167 a and 167 b
  • Lc and We represent the length and the width of the thermoelectric converting unit 161 , respectively
  • Hc represents the height of the thermoelectric converting unit 161 inclusive of the thickness of the buried insulating film 182
  • ⁇ 2 , c 2 , and d 2 represent the heat conductivity, the specific heat, and the density of each of the supporting structure units 167 a and 167 b, respectively.
  • G th — TB ⁇ 1 ⁇ S TB /L TB
  • S TB and L TB represent the cross-sectional area and the length of the connecting portion 166 between the thermoelectric converting unit 161 a and the interconnects 165 a and 165 b , respectively
  • Lc and Wc TB represent the length and the width of the thermoelectric converting unit 161 a, respectively
  • Hc represents the height of the thermoelectric converting unit 161 a inclusive of the thickness of the buried insulating film 182 .
  • ⁇ 1 , c 1 , and d 1 represent the heat conductivity, the specific heat, and the density of the connecting portion 166 between the thermoelectric converting unit 161 a and the interconnects 165 a and 165 b, respectively.
  • each reference pixel is lower than the heat conductance of each infrared detection pixel, and the heat capacity of each reference pixel is smaller than the heat capacity of each infrared detection pixel. That is, the following inequalities are satisfied:
  • the heat conductance G th — IMG is very low, and the ratio C th — IMG /G th — IMG is high. Accordingly, the thermal time constant is high, and the temperature increases according to the equation (2) at the time of short-time flowing of current.
  • the heat conductance G th — TB is higher than the heat conductance of each infrared detection pixel. Therefore, as indicated by the equation (1), the temperature increase rate becomes lower with time. In this case, the self-heating temperature rises of both pixels differ from each other when the flowing of current ends. This difference is on the order of approximately 100 mK in a case where a current of 1 ⁇ A is applied, and is larger than a signal with respect to an object temperature change by about two digits.
  • the self-heating temperatures can be made the same when the flowing of current ends, as shown in FIG. 4( b ).
  • the design parameters of each pixel should satisfy the following equation:
  • I f ⁇ V f G th_IMG ⁇ ⁇ 1 - exp ⁇ ( - tsel C th_IMG / G th_IMG ) ⁇ I f ⁇ V f G th_TB ⁇ ⁇ 1 - exp ⁇ ( - tsel C th_TB / G th_TB ) ⁇
  • G th — IMG and G th — TB represent the heat conductance of each infrared detection pixel and the heat conductance of each reference pixel, respectively
  • C th — IMG and C th — TB represent the heat capacity of the cell of each infrared detection pixel and the heat capacity of the cell of each reference pixel, respectively
  • tsel represents the duration of flowing of current to each pixel, and the equations (3) and (4) are satisfied. Since the heat capacities C th — IMG and C th — TB are proportional to the volumes of the respective cells, a desired heat capacitance C th ratio can be achieved by adjusting the area ratio, as long as the thicknesses are uniform.
  • the bias voltage Vd is applied to the row select line 45 0 to which the reference pixels 11 1 and 11 2 are connected. As a result of this, the potential of each of the vertical signal lines 44 1 and 44 2 becomes Vd ⁇ Vf0.
  • This voltage value is 1.0 V, for example.
  • the DC voltage V 2 is a constant voltage applied to the differential amplifiers of all the columns, and may be 1.5 V, for example.
  • the voltage of each of the coupling capacitors 22 1 and 22 2 on the side of the vertical signal lines 44 1 and 44 2 is 1.0 V, and the voltage of each of the coupling capacitors 22 1 and 22 2 on the side of the differential amplifiers 20 1 and 20 2 is 1.5 V.
  • the bias voltage Vd is applied to the row select line 45 1 to which the infrared detection pixels 12 11 and 12 12 are connected.
  • the potential of each of the vertical signal lines 44 1 and 44 2 becomes Vd ⁇ (Vf0 ⁇ Vsig). This voltage value is 1.001 V, for example.
  • the difference between the potentials at both ends of each of the coupling capacitors 22 1 and 22 2 is kept.
  • the potential on the side of the vertical signal lines 44 1 and 44 2 is higher than that in the first period by 0.001 V, the potential of V 11 (V 12 ) increases to 1.501 V.
  • this embodiment can provide an uncooled infrared imaging device that is capable of reducing the influence of the difference in self-heating temperature between the infrared detection pixels and the reference pixels.
  • thermoelectric conversion elements of the infrared detection pixels and the reference pixels in the above described embodiment are used as the thermoelectric conversion elements of the infrared detection pixels and the reference pixels in the above described embodiment, the same effects as above can be achieved by using series-connected resistors.

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9404963B2 (en) 2012-11-12 2016-08-02 Kabushiki Kaisha Toshiba Apparatus and method for inspecting infrared solid-state image sensor
US9799700B2 (en) 2014-09-12 2017-10-24 Kabushiki Kaisha Toshiba Infrared sensor

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11118961B2 (en) * 2016-09-02 2021-09-14 Sony Semiconductor Solutions Corporation Imaging apparatus with infrared-based temperature detection devices
CN110346052B (zh) * 2019-06-13 2020-05-05 无锡物联网创新中心有限公司 Mems非制冷红外探测器热学参数测试电路及测试方法
US11971306B2 (en) * 2020-02-10 2024-04-30 Mitsubishi Electric Corporation Infrared detecting device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090322922A1 (en) * 2008-06-30 2009-12-31 Canon Kabushiki Kaisha Solid-state imaging apparatus
US20100230594A1 (en) * 2009-03-13 2010-09-16 Kabushiki Kaisha Toshiba Infrared solid-state image sensor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1164111A (ja) * 1997-08-26 1999-03-05 Matsushita Electric Works Ltd 赤外線検出素子
JP2001304973A (ja) 2000-04-26 2001-10-31 Denso Corp 赤外線イメージセンサ
JP3409848B2 (ja) * 2000-08-29 2003-05-26 日本電気株式会社 熱型赤外線検出器
JP2008022315A (ja) * 2006-07-13 2008-01-31 Mitsubishi Electric Corp 熱型赤外線検出回路
JP2008241465A (ja) * 2007-03-27 2008-10-09 Toshiba Corp 固体撮像装置およびその駆動方法
JP4975669B2 (ja) 2008-03-25 2012-07-11 株式会社東芝 赤外線検出器およびこの赤外線検出器を備えた固体撮像素子
JP2010032410A (ja) 2008-07-30 2010-02-12 Toshiba Corp イメージセンサおよびその製造方法
JP5455844B2 (ja) * 2010-08-24 2014-03-26 株式会社東芝 非冷却赤外線イメージセンサ
JP5425127B2 (ja) 2011-03-09 2014-02-26 株式会社東芝 固体撮像素子

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090322922A1 (en) * 2008-06-30 2009-12-31 Canon Kabushiki Kaisha Solid-state imaging apparatus
US20100230594A1 (en) * 2009-03-13 2010-09-16 Kabushiki Kaisha Toshiba Infrared solid-state image sensor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9404963B2 (en) 2012-11-12 2016-08-02 Kabushiki Kaisha Toshiba Apparatus and method for inspecting infrared solid-state image sensor
US9799700B2 (en) 2014-09-12 2017-10-24 Kabushiki Kaisha Toshiba Infrared sensor

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