US20070102784A1 - Electronic component - Google Patents
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- US20070102784A1 US20070102784A1 US11/582,506 US58250606A US2007102784A1 US 20070102784 A1 US20070102784 A1 US 20070102784A1 US 58250606 A US58250606 A US 58250606A US 2007102784 A1 US2007102784 A1 US 2007102784A1
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- 239000000758 substrate Substances 0.000 claims abstract description 33
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/228—Terminals
- H01G4/252—Terminals the terminals being coated on the capacitive element
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/33—Thin- or thick-film capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H1/00—Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network
- H03H1/0007—Constructional details of impedance networks whose electrical mode of operation is not specified or applicable to more than one type of network of radio frequency interference filters
Definitions
- the present invention relates to an electronic component that includes a capacitor provided on a substrate, for example formed by semiconductor processing technology.
- each device In a radio frequency (RF) system such as a mobile phone or a wireless LAN, signals are subjected to phase-matching for satisfactory transmission among functional devices constituting the system. Accordingly, the input/output (I/O) terminal of each device is provided with a passive element that includes a passive component such as an inductor or a capacitor, and that acts as a phase shifter for controlling the phase of the signals.
- a passive element that includes a passive component such as an inductor or a capacitor, and that acts as a phase shifter for controlling the phase of the signals.
- a SAW filter is employed for use as a narrow-band frequency filter.
- the SAW filter which includes a piezoelectric element, produces a difference in potential between piezoelectric element electrodes because of a piezoelectric effect, when a physical impact or a thermal effect is applied to the SAW filter or the piezoelectric element thereof during the manufacturing process of the apparatus in which the SAW filter is incorporated.
- a predetermined voltage is applied to an electronic component electrically connected to the SAW filter.
- the capacitor included in the passive element is usually electrically connected to the SAW filter, and hence the capacitor has to have a high withstanding voltage (e.g. 150 V or higher), to prevent a dielectric breakdown between the capacitor electrodes, which may occur upon application of a voltage accidentally generated by the SAW filter or the piezoelectric element thereof.
- an integrated passive device (hereinafter, IPD) manufactured based on a semiconductor processing technology, which includes a plurality of predetermined passive components such as an inductor, a capacitor, a resistor and a filter densely integrated therein, may be employed the passive element (phase shifter).
- IPD integrated passive device
- the capacitor included therein still has to have a high withstanding voltage, for preventing a dielectric breakdown between the capacitor electrodes, as stated above.
- Techniques related to the IPD are found, for example, in JP-A-H04-61264 and JP-A-2002-33239.
- FIG. 9 is a schematic cross-sectional view showing a part of a conventional IPD 90 .
- the IPD 90 includes a substrate 91 , a plurality of passive components each including a capacitor 92 , integrated on the substrate 91 , an wiring 93 and a protecting film 94 .
- the capacitor 92 has a multilayer structure including an electrode film 92 a (lower electrode film), an electrode film 92 b (upper electrode film), and a dielectric film 92 c .
- the wiring 93 includes a joint portion 93 a connected to the electrode film 92 b.
- the electrode film 92 b has a thickness of approximately 1 ⁇ m.
- a conductor film which is to subsequently serve as the electrode film 92 b , is formed on the substrate 91 to cover the electrode film 92 a and the dielectric film 92 c already formed on the substrate 91 .
- a resist film given a pattern corresponding to the electrode film 92 b is then provided on the conductor film, and an ion milling process is performed utilizing the resist film as the mask, thus to shape the conductor film according to the pattern.
- the precision in area of the electrode film 92 b affects the precision in static capacitance of the capacitor 92 , which is why the electrode film 92 b is formed in a thickness of approximately 1 ⁇ m in the conventional IPD 90 , for achieving high precision in static capacitance.
- the wiring 93 (including the joint portion 93 a ) is formed in a relatively greater thickness. Making the wiring 93 thicker can reduce a resistance thereof, and the reduction in resistance is preferable from the viewpoint of reducing a signal loss through the IPD 90 . Accordingly, the wiring 93 is formed in a thickness of approximately 10 ⁇ m for example.
- the capacitor 92 of the conventional IPD 90 often has a withstanding voltage below a practically acceptable level, which has to be addressed.
- Increasing the thickness of the dielectric film 92 c requires increasing the area of the electrode film 92 b , because otherwise the static capacitance of the capacitor 92 cannot be maintained. Therefore, it is not preferable to increase the thickness of the dielectric film 92 c , from the viewpoint of suppressing an increase in dimensions of the capacitor 92 , hence the IPD 90 .
- the present invention has been proposed in the above-described situation. It is an object of the present invention to provide an electronic component including a capacitor that facilitates achieving a high withstanding voltage.
- the present invention provides an electronic component comprising a substrate, a capacitor, and a wiring.
- the capacitor has a multilayer structure including a first electrode film (lower electrode film) provided on the substrate, a second electrode film (upper electrode film) having a thickness of 2 to 4 ⁇ m and disposed to face the first electrode film, and a dielectric film interposed between the first and the second electrode film.
- the wiring includes a joint portion connected to the second electrode film on the opposite side of the dielectric film.
- the electronic component according to the present invention encompasses a single capacitor element as well as an integrated electronic component in which a capacitor element and other elements are combined.
- the dielectric film 92 c is prone to incur collapse of the film structure at a portion corresponding to a periphery of the joint portion 93 a of the wiring 93 , once a dielectric breakdown takes place.
- the inventors have also found that employing an upper electrode film of 10 ⁇ m in thickness in place of the electrode film 92 b provokes the collapse of the film structure, upon applying an excessive voltage, in a portion of the dielectric film 92 c corresponding to the periphery of the upper electrode film, rather than the portion thereof corresponding to the periphery of the joint portion 93 a . Since stress strain concentrates on the periphery of the upper electrode film itself, which is relatively thick, the stress strain is considered to propagate to the dielectric film 92 c before the emergence of the dielectric breakdown, thereby producing more flaws in the film structure in the portion of the dielectric film 92 c corresponding to the periphery of the upper electrode film, than in the remaining portions thereof. This is considered to be a reason that the dielectric film 92 c is prone to incur the collapse of the film structure in the portion corresponding to the periphery of the upper electrode film.
- the present inventors have discovered that the thickness of the upper electrode film affects the withstanding voltage of a capacitor element fabricated by, for example, a semiconductor processing technology, thereby accomplishing the present invention.
- the second electrode film (upper electrode film), interposed between the dielectric film of the capacitor and the joint portion of the wiring, is formed in a thickness of 2 ⁇ m or greater.
- the present inventors have discovered that the second electrode film of 2 ⁇ m or more in thickness can significantly suppress propagation of stress strain concentrating in the periphery of the joint portion of the wiring to the dielectric film, even when the joint portion is formed to be relatively thick (for example, 10 ⁇ m or more), thereby preventing emergence of a flaw in the film structure of the dielectric film originating from the propagation of the stress strain in the joint portion to the dielectric film.
- the second electrode film is formed in a thickness of 4 ⁇ m or less.
- the electronic component according to the present invention is provided based on these findings, and includes the capacitor that facilitates suppressing emergence of a flaw in the film structure of the dielectric film, and thus achieving a high withstanding voltage.
- the joint portion of the wiring may-be thicker than the second electrode film, and more preferably 10 ⁇ m or more in thickness. This is because forming the joint portion in a greater thickness can reduce the resistance of the joint portion and the wiring.
- the dielectric film of the capacitor may have a thickness of 1 ⁇ m or less. The thinner the dielectric film is, the larger static capacitance can be obtained in the capacitor.
- the second electrode film is formed by a plating process.
- the plating process is appropriate for efficiently forming the second electrode film in a thickness of 2 to 4 ⁇ m.
- the electronic component according to the present invention may further include a passive component provided on the substrate, and the wiring electrically may connect the passive component and the second electrode film of the capacitor.
- the electronic component according to the present invention may further include an electrode pad provided on the substrate, and the wiring electrically may connect the electrode pad and the second electrode film of the capacitor.
- the electronic component according to the present invention may be an integrated electronic component having such structure.
- FIG. 1 is a plan view showing an integrated electronic component according to the present invention
- FIG. 2 is a cross-sectional view taken along the line II-II of FIG. 1 ;
- FIG. 3 is a cross-sectional view taken along the line III-III of FIG. 1 ;
- FIG. 4 is an enlarged fragmentary cross-sectional view taken along the line IV-IV of FIG. 1 ;
- FIG. 5 is a circuit diagram of the electronic component shown in FIG. 1 ;
- FIG. 6 shows, in section, a manufacturing process of a portion around a capacitor in the integrated electronic component shown in FIG. 1 ;
- FIG. 7 shows, in section, manufacturing steps subsequent to those shown in FIG. 6 ;
- FIG. 8 is a graph showing measurement results of withstanding voltages with respect to preferred examples 1, 2 and comparative examples 1, 2;
- FIG. 9 is a schematic cross-sectional view showing a part of a conventional IPD.
- FIGS. 1 to 4 depict an integrated electronic component X according to the present invention.
- FIG. 1 is a plan view of the integrated electronic component X.
- FIGS. 2 and 3 are cross-sectional views taken along the line II-II and III-III of FIG. 1 , respectively.
- FIG. 4 is an enlarged fragmentary cross-sectional view taken along the line IV-IV of FIG. 1 .
- the integrated electronic component X includes a substrate S, capacitors 10 A, 10 B, a coil inductor 20 , electrode pads 30 A, 30 B, 30 C, 30 D, a wiring 40 , and a protecting film 50 (not shown in FIG. 1 ), and has a circuit configuration shown in FIG. 5 .
- the substrate S may be a semiconductor substrate, a quartz substrate, a glass substrate, a silicon on insulator (SOI) substrate, a silicon on quartz (SOQ) substrate, or a silicon on glass (SOG) substrate.
- the semiconductor substrate may be made of a silicon material, such as monocrystalline silicon.
- the capacitors 10 A, 10 B respectively have a multilayer structure including electrode films 11 , 12 and a dielectric film 13 , as explicitly shown in FIGS. 2 and 4 .
- the electrode film 11 is a lower electrode film formed in a pattern on the substrate S.
- the electrode film 11 may be made of Cu, Au, Ag or Al, and may have a multilayer structure including a plurality of conductor films.
- the electrode film 11 may have a thickness of 0.5 to 2 ⁇ m.
- the electrode film 12 is an upper electrode film formed to face the electrode film 11 via the dielectric film 13 , and may be made of Cu, Au, Ag or Al.
- the electrode film 12 has a thickness of 2 to 4 ⁇ m.
- the dielectric film 13 may be made of silicon oxide, silicon nitride, aluminum oxide, tantalum oxide or titanium oxide, for example.
- the dielectric film 13 may have a thickness of 0.1 to 1 ⁇ m. Making the dielectric film 13 thinner facilitates granting a larger static capacitance to the capacitors 10 A, 10 B.
- the coil inductor 20 is a flat spiral coil formed in a pattern on the substrate S as shown in FIGS. 1 and 3 , and has end portions 21 , 22 .
- Preferable materials of the coil inductor 20 include Cu, Au, Ag and Al.
- the electrode pads 30 A to 30 D serve for external connection.
- the electrode pads 30 A, 30 B serve as terminals for ground connection, while the electrode pads 30 C, 30 D serve as I/O terminals for electrical signals.
- the electrode pads 30 A to 30 D may be made of a Ni body with the upper surface coated with a Au film.
- the wiring 40 serves to electrically connect the components on the substrate S, and includes a joint portion 41 directly connected to the electrode film 12 of the capacitor 10 A, 10 B as shown in FIGS. 2 and 4 .
- Preferable materials of the wiring 40 include Cu, Au, Ag and Al.
- the wiring 40 and the joint portion 41 may have a thickness of 10 ⁇ m or greater. Forming the wiring 40 in a greater thickness leads to reduced resistance thereof, and the reduction in resistance is preferable from the viewpoint of reducing a signal loss in the integrated electronic component X.
- the capacitor 10 A is electrically connected to the electrode pads 30 A, 30 C and the coil inductor 20 . More specifically, the electrode film 11 of the capacitor 10 A is electrically connected to the electrode pad 30 A, and the electrode film 12 of the capacitor 10 A is electrically connected to the electrode pad 30 C and the end portion 21 of the coil inductor 20 .
- the capacitor 10 B is electrically connected to the electrode pads 30 B, 30 D and the coil inductor 20 . More specifically, the electrode film 11 of the capacitor 10 B is electrically connected to the electrode pad 30 B, and the electrode film 12 of the capacitor 10 B is electrically connected to the electrode pad 30 D and the other end portion 22 of the coil inductor 20 .
- the protecting film 50 may be made of a polyimide or benzocyclobutene (BCB), and covers the capacitors 10 A, 10 B, the coil inductor 20 and the wiring 40 , leaving exposed a portion of the electrode pads 30 A to 30 D.
- BCB benzocyclobutene
- FIGS. 6 and 7 show a manufacturing process of a portion around the capacitors 10 A, 10 B of the integrated electronic component X.
- FIGS. 6 ( a ) to 7 ( d ) represent the progress of the formation process of a capacitor 10 (corresponding to either of the capacitors 10 A, 10 B) shown in FIG. 7 ( d ), a joint portion of the wiring 40 with the capacitor 10 , and the protecting film 50 around the capacitor 10 , in cross-sectional drawings covering a similar section to that shown in FIG. 4 .
- the electrode film 11 is formed on the substrate S as shown in FIG. 6 ( a ).
- a sputtering process may be performed to deposit a predetermined metal material on the substrate S, and the metal film may be subjected to a wet or dry etching process to be shaped in a predetermined pattern, for forming the electrode film 11 .
- the dielectric film 13 is formed on the electrode film 11 .
- a sputtering process may be performed to deposit a predetermined dielectric material at least on the electrode film 11 , and the dielectric film may be subjected to a wet or dry etching process to be shaped in a predetermined pattern, for forming the dielectric film 13 .
- a seed layer (not shown) for electric plating is formed on the substrate S, to cover the electrode film 11 and the dielectric film 13 .
- the seed layer may be formed by vapor deposition or sputtering.
- a resist pattern 61 for forming the electrode film 12 is provided.
- the resist pattern 61 includes an opening 61 a defining the pattern shape of the electrode film 12 .
- a liquid photoresist is applied to the substrate S from above the electrode film 11 and the dielectric film 13 , and spin coating is performed to produce a film. Then the photoresist film is subjected to exposure and subsequent development, thus to be shaped into the resist pattern 61 .
- the above is followed by an electric plating process to form the electrode film 12 in the opening 61 a of the resist pattern 61 , as shown in FIG. 6 ( d ).
- the seed layer is energized.
- the electric plating process is appropriate for efficiently forming the electrode film 12 in a thickness of 2 to 4 ⁇ m.
- the resist pattern 61 is removed by applying a predetermined stripping solution. And the seed layer (the part at which the electrode film 12 is not formed) is removed (by a dry or wet etching process). Then as shown in FIG. 7 ( b ), an insulating film 51 is formed, which is to subsequently constitute a part of the protecting film 50 .
- the insulating film 51 includes an opening 51 a in which a portion of the electrode film 12 is exposed.
- the wiring 40 includes a joint portion 41 that fills in the opening 51 a of the insulating film 51 , thus to be connected to the electrode film 12 .
- Specific formation method of the wiring 40 includes forming a seed layer (not shown) for an electric plating process on the insulating film 51 as well as inside the opening 51 a shown in FIG. 7 ( b ), providing on the seed layer a resist pattern defining a predetermined opening for forming the wiring 40 , growing a predetermined conductive material by electric plating in the opening of the resist pattern, removing the resist pattern, and removing the seed layer (the part at which the wiring 40 is not formed).
- an insulating film 52 is formed to cover the wiring 40 .
- the capacitor 10 ( 10 A, 10 B) and the peripheral structure can be obtained, in the manufacturing process of the integrated electronic component X.
- the capacitor 92 of the conventional IPD 90 when undue stress is applied to the dielectric film between the electrode films of the capacitor element manufactured by the semiconductor processing technology, the portion of the dielectric film suffering the stress is prone to incur a flaw in the film structure, and hence prone to collapse when a high voltage is applied. Accordingly, presence of undue stress against the dielectric film impedes achieving a high withstanding voltage of the capacitor.
- the capacitor 10 A, 10 B in the integrated electronic component X according to the present invention allows achieving a high withstanding voltage.
- the wiring 40 and the joint portion 41 thereof are formed to be relatively thick such as 10 ⁇ m or more, and the respective electrode films 12 of the capacitors 10 A, 10 B are formed in a thickness of 2 to 4 ⁇ m.
- stress strain tends to concentrate on the periphery of the joint portion 41 , which is relatively thick, the propagation of the stress strain to -the dielectric film 13 can be significantly suppressed, because the electrode film 12 has a thickness of 2 ⁇ m or more.
- Such structure therefore, can prevent emergence of a flow in the film structure of the dielectric film 13 originating from the propagation of the stress strain from the joint portion 41 to the dielectric film 13 .
- the electrode film 12 itself, which has a thickness of 4 ⁇ m or less, does not incur therein unduly great stress strain, and hence barely provokes emergence of a flaw due to the stress strain, in the film structure of the dielectric film 13 .
- the capacitor 10 A, 10 B allows achieving a high withstanding voltage.
- the inventors produced several capacitor elements and measured their withstanding voltages for comparison. The results are as follows.
- a capacitor element was fabricated to have the structural features of the capacitor 10 A and its neighborhood shown in FIG. 4 .
- the substrate S was made of quartz.
- the electrode film 11 had a multilayer structure consisting of a Ti film (50 nm thick) provided on the substrate S, an Au film (500 nm thick) on the Ti film, an Ni film (50 nm thick) on the Au film, and another Au film (500 nm thick) on the Ni film.
- the electrode film 12 was an electrically plated Cu film (2 ⁇ m thick).
- the dielectric film 13 was an SiO 2 film (220 nm thick).
- the wiring 40 including the joint portion 41 , had a multilayer structure consisting of an electrically plated Ni film (10 ⁇ m thick) closer to the capacitor 10 , and an electrically plated Ai film (2 ⁇ m thick) formed on the Ni film.
- a capacitor element of Working Example 2 was fabricated to have a structure identical to that of the above capacitor element (Working Example 1), except that the Cu-plated electrode film 12 had a thickness of 4 ⁇ m instead of 2 ⁇ m.
- Capacitor elements were fabricated to have a structure identical to that of the capacitor element of Working Example 1, except that the upper electrode film (corresponding to the Cu-plated electrode film 12 ) had a thickness of 1 ⁇ m (Comparative Example 1) instead of 2 ⁇ m, or a thickness of 10 ⁇ m (Comparative Example 2).
- the withstanding voltage was measured with respect to the capacitor elements according to Working Examples 1, 2 and Comparative Examples 1, 2.
- the withstanding voltages of the capacitor elements according to Working Examples 1, 2 were 185 V and 172 V, respectively.
- the withstanding voltages of the capacitor elements according to Comparative Examples 1, 2 were 130 V and 133 V, respectively.
- FIG. 8 These results are shown in the graph of FIG. 8 , in which the horizontal axis represents the thickness [ ⁇ m] of the electrode film 12 (upper electrode film), and the vertical axis represents the withstanding voltage [V].
- the measurement results with respect to the capacitor elements according to Working Examples 1, 2 and Comparative Examples 1, 2 are plotted at points indicated by E 1 , E 2 , C 1 and C 2 , respectively.
- the withstanding voltages of the capacitor elements according to Comparative Examples 1, 2 did not exceed 135 V.
- the examining of the dielectric film 13 of the capacitor element according to Comparative Example 1 after the dielectric breakdown in the withstanding voltage measurement showed that the collapse of the film structure was observed mainly in a portion of the dielectric film 13 corresponding to the periphery of the joint portion 41 of the wiring 40 .
- stress strain tends to concentrate on a periphery of the joint portion 41 , which is relatively thick, and the strain propagates to the dielectric film 13 via the upper electrode film, which is as thin as 1 ⁇ m.
- the film structure in the portion of the dielectric film 13 corresponding to the periphery of the joint portion 41 suffers more flaws than in the other portions of the dielectric film 13 .
- the dielectric film 13 is prone to incur the collapse of the film structure in the portion corresponding to the periphery of the joint portion 41 .
- the withstanding voltages of the capacitor elements according to Working Examples 1, 2 exceeded 170 V and were greater by more than 35 V than those of the capacitor-elements according to Comparative Examples 1, 2. This is probably because the 2 ⁇ m-thick electrode film 12 of Working Example 1 and the 4 ⁇ m-thick electrode film 12 of Working Example 2 can suppress the propagation of stress strain from the joint portion 41 to the dielectric film 13 more effectively than the upper electrode film in Comparative Example 1, thereby suppressing emergence of flaws in the film structure of the dielectric film 13 . Also, the electrode films 12 of Working Examples 1, 2 merely incur smaller stress strain than the upper electrode film according to Comparative Example 2, which is advantageous to the suppression of the flaws in the dielectric film 13 .
Abstract
Description
- 1. Field of the Invention
- The present invention relates to an electronic component that includes a capacitor provided on a substrate, for example formed by semiconductor processing technology.
- 2. Description of the Related Art
- In a radio frequency (RF) system such as a mobile phone or a wireless LAN, signals are subjected to phase-matching for satisfactory transmission among functional devices constituting the system. Accordingly, the input/output (I/O) terminal of each device is provided with a passive element that includes a passive component such as an inductor or a capacitor, and that acts as a phase shifter for controlling the phase of the signals.
- In the RF system, a SAW filter is employed for use as a narrow-band frequency filter. The SAW filter, which includes a piezoelectric element, produces a difference in potential between piezoelectric element electrodes because of a piezoelectric effect, when a physical impact or a thermal effect is applied to the SAW filter or the piezoelectric element thereof during the manufacturing process of the apparatus in which the SAW filter is incorporated. In this case, a predetermined voltage is applied to an electronic component electrically connected to the SAW filter. The capacitor included in the passive element (phase shifter) is usually electrically connected to the SAW filter, and hence the capacitor has to have a high withstanding voltage (e.g. 150 V or higher), to prevent a dielectric breakdown between the capacitor electrodes, which may occur upon application of a voltage accidentally generated by the SAW filter or the piezoelectric element thereof.
- There has been a constant demand for reduction in dimensions of various parts composing RF systems, driven by the increase in number of parts for achieving a higher performance. For making the system smaller in dimensions, an integrated passive device (hereinafter, IPD) manufactured based on a semiconductor processing technology, which includes a plurality of predetermined passive components such as an inductor, a capacitor, a resistor and a filter densely integrated therein, may be employed the passive element (phase shifter). When employing the IPD, the capacitor included therein still has to have a high withstanding voltage, for preventing a dielectric breakdown between the capacitor electrodes, as stated above. Techniques related to the IPD are found, for example, in JP-A-H04-61264 and JP-A-2002-33239.
-
FIG. 9 is a schematic cross-sectional view showing a part of aconventional IPD 90. The IPD 90 includes asubstrate 91, a plurality of passive components each including a capacitor 92, integrated on thesubstrate 91, anwiring 93 and a protectingfilm 94. The capacitor 92 has a multilayer structure including anelectrode film 92 a (lower electrode film), anelectrode film 92 b (upper electrode film), and adielectric film 92 c. Thewiring 93 includes ajoint portion 93 a connected to theelectrode film 92 b. - The
electrode film 92 b has a thickness of approximately 1 μm. For forming theelectrode film 92 b, a conductor film, which is to subsequently serve as theelectrode film 92 b, is formed on thesubstrate 91 to cover theelectrode film 92 a and thedielectric film 92 c already formed on thesubstrate 91. A resist film given a pattern corresponding to theelectrode film 92 b is then provided on the conductor film, and an ion milling process is performed utilizing the resist film as the mask, thus to shape the conductor film according to the pattern. When performing such subtractive process to form theelectrode film 92 b, the thinner the conductor film, or theelectrode film 92 b is, the more accurately theelectrode film 92b can be formed in pattern (hence in area). The precision in area of theelectrode film 92 b affects the precision in static capacitance of the capacitor 92, which is why theelectrode film 92 b is formed in a thickness of approximately 1 μm in the conventional IPD 90, for achieving high precision in static capacitance. - In contrast, the wiring 93 (including the
joint portion 93 a) is formed in a relatively greater thickness. Making thewiring 93 thicker can reduce a resistance thereof, and the reduction in resistance is preferable from the viewpoint of reducing a signal loss through the IPD 90. Accordingly, thewiring 93 is formed in a thickness of approximately 10 μm for example. - The capacitor 92 of the
conventional IPD 90, however, often has a withstanding voltage below a practically acceptable level, which has to be addressed. For improving the withstanding voltage of the capacitor 92, it could be an option to form thedielectric film 92 c in a greater thickness. Increasing the thickness of thedielectric film 92 c, however, requires increasing the area of theelectrode film 92 b, because otherwise the static capacitance of the capacitor 92 cannot be maintained. Therefore, it is not preferable to increase the thickness of thedielectric film 92 c, from the viewpoint of suppressing an increase in dimensions of the capacitor 92, hence the IPD 90. - The present invention has been proposed in the above-described situation. It is an object of the present invention to provide an electronic component including a capacitor that facilitates achieving a high withstanding voltage.
- The present invention provides an electronic component comprising a substrate, a capacitor, and a wiring. The capacitor has a multilayer structure including a first electrode film (lower electrode film) provided on the substrate, a second electrode film (upper electrode film) having a thickness of 2 to 4 μm and disposed to face the first electrode film, and a dielectric film interposed between the first and the second electrode film. The wiring includes a joint portion connected to the second electrode film on the opposite side of the dielectric film. The electronic component according to the present invention encompasses a single capacitor element as well as an integrated electronic component in which a capacitor element and other elements are combined.
- According to studies pursued by the present inventors, it has been discovered that, in the capacitor 92 of the conventional IPD 90, the
dielectric film 92 c is prone to incur collapse of the film structure at a portion corresponding to a periphery of thejoint portion 93 a of thewiring 93, once a dielectric breakdown takes place. Stress strain concentrates on a periphery of thejoint portion 93 a, which is relatively thick, and the stress strain is considered to propagate to thedielectric film 92 c via theelectrode film 92 b which is as thin as approximately 1 μm, in the capacitor 92 before emergence of the dielectric breakdown, thereby producing more flaws in the film structure in the portion of thedielectric film 92 c corresponding to the periphery of thejoint portion 93 a, than in the remaining portions thereof. This is considered to be a reason why thedielectric film 92 c is prone to incur collapse -of the film structure in the portion corresponding to the periphery of thejoint portion 93 a, in the capacitor 92. - The inventors have also found that employing an upper electrode film of 10 μm in thickness in place of the
electrode film 92 b provokes the collapse of the film structure, upon applying an excessive voltage, in a portion of thedielectric film 92 c corresponding to the periphery of the upper electrode film, rather than the portion thereof corresponding to the periphery of thejoint portion 93 a. Since stress strain concentrates on the periphery of the upper electrode film itself, which is relatively thick, the stress strain is considered to propagate to thedielectric film 92 c before the emergence of the dielectric breakdown, thereby producing more flaws in the film structure in the portion of thedielectric film 92 c corresponding to the periphery of the upper electrode film, than in the remaining portions thereof. This is considered to be a reason that thedielectric film 92 c is prone to incur the collapse of the film structure in the portion corresponding to the periphery of the upper electrode film. - Based on the foregoing findings, the present inventors have discovered that the thickness of the upper electrode film affects the withstanding voltage of a capacitor element fabricated by, for example, a semiconductor processing technology, thereby accomplishing the present invention.
- In the electronic component according to the present invention, the second electrode film (upper electrode film), interposed between the dielectric film of the capacitor and the joint portion of the wiring, is formed in a thickness of 2 μm or greater. The present inventors have discovered that the second electrode film of 2 μm or more in thickness can significantly suppress propagation of stress strain concentrating in the periphery of the joint portion of the wiring to the dielectric film, even when the joint portion is formed to be relatively thick (for example, 10 μm or more), thereby preventing emergence of a flaw in the film structure of the dielectric film originating from the propagation of the stress strain in the joint portion to the dielectric film. Also, in the electronic component according to the present invention, the second electrode film is formed in a thickness of 4 μm or less. This is because the present inventors have discovered that the second electrode film of 4 μm or less in thickness does not incur therein unduly great stress strain, and hence barely provokes emergence of a flaw due to the stress strain, in the film structure of the dielectric film. The electronic component according to the present invention is provided based on these findings, and includes the capacitor that facilitates suppressing emergence of a flaw in the film structure of the dielectric film, and thus achieving a high withstanding voltage.
- According to the present invention, preferably the joint portion of the wiring may-be thicker than the second electrode film, and more preferably 10 μm or more in thickness. This is because forming the joint portion in a greater thickness can reduce the resistance of the joint portion and the wiring.
- Preferably, the dielectric film of the capacitor may have a thickness of 1 μm or less. The thinner the dielectric film is, the larger static capacitance can be obtained in the capacitor.
- It is preferable that the second electrode film is formed by a plating process. The plating process is appropriate for efficiently forming the second electrode film in a thickness of 2 to 4 μm.
- Preferably, the electronic component according to the present invention may further include a passive component provided on the substrate, and the wiring electrically may connect the passive component and the second electrode film of the capacitor. Under or in place of such structure, the electronic component according to the present invention may further include an electrode pad provided on the substrate, and the wiring electrically may connect the electrode pad and the second electrode film of the capacitor. The electronic component according to the present invention may be an integrated electronic component having such structure.
-
FIG. 1 is a plan view showing an integrated electronic component according to the present invention; -
FIG. 2 is a cross-sectional view taken along the line II-II ofFIG. 1 ; -
FIG. 3 is a cross-sectional view taken along the line III-III ofFIG. 1 ; -
FIG. 4 is an enlarged fragmentary cross-sectional view taken along the line IV-IV ofFIG. 1 ; -
FIG. 5 is a circuit diagram of the electronic component shown inFIG. 1 ; -
FIG. 6 shows, in section, a manufacturing process of a portion around a capacitor in the integrated electronic component shown inFIG. 1 ; -
FIG. 7 shows, in section, manufacturing steps subsequent to those shown inFIG. 6 ; -
FIG. 8 is a graph showing measurement results of withstanding voltages with respect to preferred examples 1, 2 and comparative examples 1, 2; and -
FIG. 9 is a schematic cross-sectional view showing a part of a conventional IPD. - FIGS. 1 to 4 depict an integrated electronic component X according to the present invention.
FIG. 1 is a plan view of the integrated electronic component X.FIGS. 2 and 3 are cross-sectional views taken along the line II-II and III-III ofFIG. 1 , respectively.FIG. 4 is an enlarged fragmentary cross-sectional view taken along the line IV-IV ofFIG. 1 . - The integrated electronic component X includes a substrate S,
capacitors coil inductor 20,electrode pads wiring 40, and a protecting film 50 (not shown inFIG. 1 ), and has a circuit configuration shown inFIG. 5 . - The substrate S may be a semiconductor substrate, a quartz substrate, a glass substrate, a silicon on insulator (SOI) substrate, a silicon on quartz (SOQ) substrate, or a silicon on glass (SOG) substrate. The semiconductor substrate may be made of a silicon material, such as monocrystalline silicon.
- The
capacitors electrode films dielectric film 13, as explicitly shown inFIGS. 2 and 4 . Theelectrode film 11 is a lower electrode film formed in a pattern on the substrate S. Theelectrode film 11 may be made of Cu, Au, Ag or Al, and may have a multilayer structure including a plurality of conductor films. Theelectrode film 11 may have a thickness of 0.5 to 2 μm. Theelectrode film 12 is an upper electrode film formed to face theelectrode film 11 via thedielectric film 13, and may be made of Cu, Au, Ag or Al. Theelectrode film 12 has a thickness of 2 to 4 μm. Thedielectric film 13 may be made of silicon oxide, silicon nitride, aluminum oxide, tantalum oxide or titanium oxide, for example. Thedielectric film 13 may have a thickness of 0.1 to 1 μm. Making thedielectric film 13 thinner facilitates granting a larger static capacitance to thecapacitors - The
coil inductor 20 is a flat spiral coil formed in a pattern on the substrate S as shown inFIGS. 1 and 3 , and hasend portions coil inductor 20 include Cu, Au, Ag and Al. - The
electrode pads 30A to 30D serve for external connection. Theelectrode pads electrode pads electrode pads 30A to 30D may be made of a Ni body with the upper surface coated with a Au film. - The
wiring 40 serves to electrically connect the components on the substrate S, and includes ajoint portion 41 directly connected to theelectrode film 12 of thecapacitor FIGS. 2 and 4 . Preferable materials of thewiring 40 include Cu, Au, Ag and Al. Thewiring 40 and thejoint portion 41 may have a thickness of 10 μm or greater. Forming thewiring 40 in a greater thickness leads to reduced resistance thereof, and the reduction in resistance is preferable from the viewpoint of reducing a signal loss in the integrated electronic component X. - Referring to
FIG. 5 , thecapacitor 10A is electrically connected to theelectrode pads coil inductor 20. More specifically, theelectrode film 11 of thecapacitor 10A is electrically connected to theelectrode pad 30A, and theelectrode film 12 of thecapacitor 10A is electrically connected to theelectrode pad 30C and theend portion 21 of thecoil inductor 20. Likewise, thecapacitor 10B is electrically connected to theelectrode pads coil inductor 20. More specifically, theelectrode film 11 of thecapacitor 10B is electrically connected to theelectrode pad 30B, and theelectrode film 12 of thecapacitor 10B is electrically connected to theelectrode pad 30D and theother end portion 22 of thecoil inductor 20. - The protecting
film 50 may be made of a polyimide or benzocyclobutene (BCB), and covers thecapacitors coil inductor 20 and thewiring 40, leaving exposed a portion of theelectrode pads 30A to 30D. -
FIGS. 6 and 7 show a manufacturing process of a portion around thecapacitors capacitors FIG. 7 (d), a joint portion of thewiring 40 with thecapacitor 10, and the protectingfilm 50 around thecapacitor 10, in cross-sectional drawings covering a similar section to that shown inFIG. 4 . - When forming the
capacitor 10, firstly theelectrode film 11 is formed on the substrate S as shown inFIG. 6 (a). A sputtering process may be performed to deposit a predetermined metal material on the substrate S, and the metal film may be subjected to a wet or dry etching process to be shaped in a predetermined pattern, for forming theelectrode film 11. - Proceeding to
FIG. 6 (b), thedielectric film 13 is formed on theelectrode film 11. A sputtering process may be performed to deposit a predetermined dielectric material at least on theelectrode film 11, and the dielectric film may be subjected to a wet or dry etching process to be shaped in a predetermined pattern, for forming thedielectric film 13. - Then a seed layer (not shown) for electric plating is formed on the substrate S, to cover the
electrode film 11 and thedielectric film 13. The seed layer may be formed by vapor deposition or sputtering. - Referring to
FIG. 6 (c), a resistpattern 61 for forming theelectrode film 12 is provided. The resistpattern 61 includes anopening 61 a defining the pattern shape of theelectrode film 12. For forming the resistpattern 61, firstly a liquid photoresist is applied to the substrate S from above theelectrode film 11 and thedielectric film 13, and spin coating is performed to produce a film. Then the photoresist film is subjected to exposure and subsequent development, thus to be shaped into the resistpattern 61. - The above is followed by an electric plating process to form the
electrode film 12 in theopening 61 a of the resistpattern 61, as shown inFIG. 6 (d). In this electric plating process, the seed layer is energized. The electric plating process is appropriate for efficiently forming theelectrode film 12 in a thickness of 2 to 4 μm. - Proceeding to
FIG. 7 (a), the resistpattern 61 is removed by applying a predetermined stripping solution. And the seed layer (the part at which theelectrode film 12 is not formed) is removed (by a dry or wet etching process). Then as shown inFIG. 7 (b), an insulatingfilm 51 is formed, which is to subsequently constitute a part of the protectingfilm 50. The insulatingfilm 51 includes anopening 51 a in which a portion of theelectrode film 12 is exposed. - Referring then to
FIG. 7 (c), thewiring 40 is formed. Thewiring 40 includes ajoint portion 41 that fills in theopening 51 a of the insulatingfilm 51, thus to be connected to theelectrode film 12. Specific formation method of thewiring 40 includes forming a seed layer (not shown) for an electric plating process on the insulatingfilm 51 as well as inside the opening 51 a shown inFIG. 7 (b), providing on the seed layer a resist pattern defining a predetermined opening for forming thewiring 40, growing a predetermined conductive material by electric plating in the opening of the resist pattern, removing the resist pattern, and removing the seed layer (the part at which thewiring 40 is not formed). - Then as shown in
FIG. 7 (d), an insulatingfilm 52 is formed to cover thewiring 40. Thus, the capacitor 10 (10A, 10B) and the peripheral structure can be obtained, in the manufacturing process of the integrated electronic component X. - As stated earlier regarding the capacitor 92 of the
conventional IPD 90, when undue stress is applied to the dielectric film between the electrode films of the capacitor element manufactured by the semiconductor processing technology, the portion of the dielectric film suffering the stress is prone to incur a flaw in the film structure, and hence prone to collapse when a high voltage is applied. Accordingly, presence of undue stress against the dielectric film impedes achieving a high withstanding voltage of the capacitor. In contrast, thecapacitor - In the integrated electronic component X, as described above, the
wiring 40 and thejoint portion 41 thereof are formed to be relatively thick such as 10 μm or more, and therespective electrode films 12 of thecapacitors joint portion 41, which is relatively thick, the propagation of the stress strain to -thedielectric film 13 can be significantly suppressed, because theelectrode film 12 has a thickness of 2 μm or more. Such structure, therefore, can prevent emergence of a flow in the film structure of thedielectric film 13 originating from the propagation of the stress strain from thejoint portion 41 to thedielectric film 13. Further, theelectrode film 12 itself, which has a thickness of 4 μm or less, does not incur therein unduly great stress strain, and hence barely provokes emergence of a flaw due to the stress strain, in the film structure of thedielectric film 13. For such reasons, thecapacitor - The inventors produced several capacitor elements and measured their withstanding voltages for comparison. The results are as follows.
- A capacitor element was fabricated to have the structural features of the
capacitor 10A and its neighborhood shown inFIG. 4 . Specifically, the substrate S was made of quartz. Theelectrode film 11 had a multilayer structure consisting of a Ti film (50 nm thick) provided on the substrate S, an Au film (500 nm thick) on the Ti film, an Ni film (50 nm thick) on the Au film, and another Au film (500 nm thick) on the Ni film. Theelectrode film 12 was an electrically plated Cu film (2 μm thick). Thedielectric film 13 was an SiO2 film (220 nm thick). Thewiring 40, including thejoint portion 41, had a multilayer structure consisting of an electrically plated Ni film (10 μm thick) closer to thecapacitor 10, and an electrically plated Ai film (2 μm thick) formed on the Ni film. - A capacitor element of Working Example 2 was fabricated to have a structure identical to that of the above capacitor element (Working Example 1), except that the Cu-plated
electrode film 12 had a thickness of 4 μm instead of 2 μm. - Capacitor elements were fabricated to have a structure identical to that of the capacitor element of Working Example 1, except that the upper electrode film (corresponding to the Cu-plated electrode film 12) had a thickness of 1 μm (Comparative Example 1) instead of 2 μm, or a thickness of 10 μm (Comparative Example 2).
- <Measurement of Withstanding Voltage>
- The withstanding voltage was measured with respect to the capacitor elements according to Working Examples 1, 2 and Comparative Examples 1, 2. The withstanding voltages of the capacitor elements according to Working Examples 1, 2 were 185 V and 172 V, respectively. The withstanding voltages of the capacitor elements according to Comparative Examples 1, 2 were 130 V and 133 V, respectively. These results are shown in the graph of
FIG. 8 , in which the horizontal axis represents the thickness [μm] of the electrode film 12 (upper electrode film), and the vertical axis represents the withstanding voltage [V]. The measurement results with respect to the capacitor elements according to Working Examples 1, 2 and Comparative Examples 1, 2 are plotted at points indicated by E1, E2, C1 and C2, respectively. - <Evaluation>
- As seen from
FIG. 8 , the withstanding voltages of the capacitor elements according to Comparative Examples 1, 2 did not exceed 135 V. The examining of thedielectric film 13 of the capacitor element according to Comparative Example 1 after the dielectric breakdown in the withstanding voltage measurement showed that the collapse of the film structure was observed mainly in a portion of thedielectric film 13 corresponding to the periphery of thejoint portion 41 of thewiring 40. In the capacitor element of Comparative Example 1 prior to the occurrence of a dielectric breakdown, stress strain tends to concentrate on a periphery of thejoint portion 41, which is relatively thick, and the strain propagates to thedielectric film 13 via the upper electrode film, which is as thin as 1 μm. As a result, the film structure in the portion of thedielectric film 13 corresponding to the periphery of thejoint portion 41 suffers more flaws than in the other portions of thedielectric film 13. Thus, thedielectric film 13 is prone to incur the collapse of the film structure in the portion corresponding to the periphery of thejoint portion 41. By examining thedielectric film 13 of the capacitor element according to Comparative Example 2 after the dielectric breakdown in the withstanding voltage measurement, it was found that the collapse of the film structure occurred in a portion of thedielectric film 13 corresponding to the periphery of the upper electrode film. Since stress strain concentrates in the periphery of the upper electrode film of Comparative Example 2, which is relatively thick, the stress strain propagates to thedielectric film 13 in the capacitor element according to the comparative example 2 before the dielectric breakdown occurred. Thus, more flaws were produced in the film structure in the portion of thedielectric film 13 corresponding to the periphery of the upper electrode film, than in the other portions. Accordingly, in the capacitor element according to Comparative Example 2, thedielectric film 13 is prone to incur the collapse of the film structure in the portion corresponding to the periphery of the upper electrode film. - On the other hand, the withstanding voltages of the capacitor elements according to Working Examples 1, 2 exceeded 170 V and were greater by more than 35 V than those of the capacitor-elements according to Comparative Examples 1, 2. This is probably because the 2 μm-
thick electrode film 12 of Working Example 1 and the 4 μm-thick electrode film 12 of Working Example 2 can suppress the propagation of stress strain from thejoint portion 41 to thedielectric film 13 more effectively than the upper electrode film in Comparative Example 1, thereby suppressing emergence of flaws in the film structure of thedielectric film 13. Also, theelectrode films 12 of Working Examples 1, 2 merely incur smaller stress strain than the upper electrode film according to Comparative Example 2, which is advantageous to the suppression of the flaws in thedielectric film 13.
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US7473981B2 (en) * | 2005-11-08 | 2009-01-06 | Fujitsu Limited | Electronic component |
KR20160054886A (en) * | 2014-11-07 | 2016-05-17 | 삼성전자주식회사 | Semiconductor device |
US11069615B2 (en) | 2018-11-20 | 2021-07-20 | Taiyo Yuden Co., Ltd. | Inductor, filter, and multiplexer |
US20220044875A1 (en) * | 2018-03-09 | 2022-02-10 | Tdk Corporation | Thin film capacitor |
US20220102261A1 (en) * | 2015-12-21 | 2022-03-31 | Intel Corporation | High performance integrated rf passives using dual lithography process |
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JP2011030208A (en) * | 2009-07-03 | 2011-02-10 | Panasonic Corp | Surface acoustic wave filter and duplexer using the same |
JP7238771B2 (en) * | 2017-05-31 | 2023-03-14 | Tdk株式会社 | Thin film capacitor and method for manufacturing thin film capacitor |
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CN100594567C (en) | 2010-03-17 |
CN1963963A (en) | 2007-05-16 |
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US7473981B2 (en) | 2009-01-06 |
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KR20070049565A (en) | 2007-05-11 |
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