US20060197886A1

US20060197886A1 - Thin film transistor array substrate and repairing method thereof

Info

Publication number: US20060197886A1
Application number: US11/306,052
Authority: US
Inventors: Han-Chung Lai
Original assignee: Individual
Current assignee: Individual
Priority date: 2004-04-22
Filing date: 2005-12-15
Publication date: 2006-09-07
Also published as: TWI236838B; US7023035B2; US20050251016A1; US20050253144A1; TW200536368A

Abstract

A thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes and a repairing circuit is provided. The scan lines and the data lines are disposed over the substrate, therefore a plurality of pixel areas are defined. Each thin film transistor is disposed in each pixel area respectively and driven by the corresponding scan line and data line. Each pixel electrode is disposed in each pixel area respectively and electrically connected to the corresponding thin film transistor. A repairing method for TFT array substrate is also provided. The method includes connecting the repairing circuit and the defect scan line besides the break to repair and convert the line defect into two-point defect, single defect, or totally repair the line defect.

Description

CROSS-REFERENCE TO RELATED APPLICATION

This application claims the priority benefit of Taiwan application serial no. 93111175, filed Apr. 23, 2004. All disclosure of the Taiwan application is incorporated herein by reference.

BACKGROUND OF THE INVENTION

1. Field of the Invention
The present invention relates to a thin film transistor (TFT) array substrate and a repairing method thereof. More particularly, the present invention relates to a TFT array substrate and a repairing method thereof for repairing a break of the scan line or the common line of the substrate.
2. Description of the Related Art
Recently, a variety of factories have exerted great effort on the development of display device since the requirement and the market of display device has grown rapidly. Conventionally, since the cathode ray tube (CRT) is fully developed and has good display quality, the CRT has been adopted in a variety of application. However, the CRT has the disadvantages of high power consumption, heavy weight, larger size and high radiation and can not meet the requirement of environmental protection. Therefore, the thin film transistor liquid crystal display (TFT-LCD) has been developed and become the major trend of the display device due to the advantages of high definition, small size, thin thickness, low power consumption, radiation free.
Conventionally, TFT LCD is mainly constructed by thin film transistor (TFT) array substrate, color filter array substrate and liquid crystal layer. The TFT array substrate is constructed by a plurality of thin film transistors and pixel electrodes disposed corresponding to the thin film transistors. The thin film transistors are adopted as the switching component of the pixel units of the liquid crystal display. The pixel unit is selected and controlled via the corresponding scan line and data line. Then, an applicable operation voltage is applied to the pixel unit to display a displaying data on the pixel. Generally, a portion of the pixel electrode described above is covered on the scan line or the common line, and the overlapped portion of the pixel electrodes is adopted as a storage capacitor (Cst). Therefore, the pixels of the TFT LCD may be operated for displaying the images by the storage capacitors.
It is noted that, a problem of line defect may be generated in the conventional TFT array substrate due to the break of the lines such as the scan line or the common line of the TFT array substrate. Therefore, the TFT array substrate is damaged and may be withdrawn.

SUMMARY OF THE INVENTION

Therefore, the present invention is directed to a TFT array substrate and a repairing method thereof for repairing a break of the scan line or the common line to avoid the withdrawal of the TFT array substrate.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes and a repairing circuit is provided. The scan lines are disposed over the substrate and include at least a defect scan line having a break, and the data lines are disposed over the substrate. Therefore, a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrode is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly, and a portion of each of the pixel electrodes is disposed over one of the scan lines correspondingly to construct a storage capacitor. The repairing circuit is disposed over the break for electrically connecting the defect scan line at two sides of the break, wherein the repairing circuit is electrically insulated with the pixel electrodes.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes and a repairing circuit is provided. The scan lines are disposed over the substrate and include at least a defect scan line having a break, the data lines are disposed over the substrate. Therefore, a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrode is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly, and a portion of each of the pixel electrodes is disposed over one of the scan lines correspondingly to construct a storage capacitor. The repairing circuit is disposed over the break, wherein the repairing circuit and at least one of the pixel electrodes is electrically connected with the defect scan lines at two sides of the break.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors and a plurality of pixel electrodes is provided. The scan lines are disposed over the substrate and include at least a defect scan line having a break, and the data lines are disposed over the substrate. Therefore, a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrode is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly, and a portion of each of the pixel electrodes is disposed over one of the scan lines correspondingly to construct a storage capacitor. Therefore, at least one of the pixel electrodes is electrically connected to the defect scan line at two sides of the break.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes, a plurality of common line and a repairing circuit is provided. The scan lines and the data lines are disposed over the substrate, therefore a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrode is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly. The common lines are disposed over the substrate, and a portion of each of the pixel electrodes is disposed over one of the common lines correspondingly to construct a storage capacitor, wherein the common lines comprise at least a defect common line comprising a break. The repairing circuit is disposed over the break for electrically connecting the defect scan line at two sides of the break, wherein the repairing circuit is electrically insulated with the pixel electrodes.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes, a plurality of common line and a repairing circuit is provided. The scan lines and the data lines are disposed over the substrate, therefore a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrode is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly. The common lines are disposed over the substrate, and a portion of each of the pixel electrodes is disposed over one of the common lines correspondingly to construct a storage capacitor, wherein the common lines comprise at least a defect common line comprising a break. The repairing circuit is disposed over the break, wherein the repairing circuit and at least one of the pixel electrodes are electrically connected to the defect common line at two sides of the break.
In accordance with one embodiment of the present invention, a thin film transistor (TFT) array substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of thin film transistors, a plurality of pixel electrodes and a plurality of common line is provided. The scan lines and the data lines are disposed over the substrate, therefore a plurality of pixel areas are defined by the scan lines and the data lines. Each thin film transistor is disposed in one of the pixel areas, and the thin film transistors are connected with and driven via the scan lines and the data lines. Each pixel electrodes is disposed in one of the pixel areas and electrically connected to one of the thin film transistors correspondingly. The common lines are disposed over the substrate, and a portion of each of the pixel electrodes is disposed over one of the common lines correspondingly to construct a storage capacitor, wherein the common lines comprise at least a defect common line comprising a break. In addition, at least one of the pixel electrodes is electrically connected to the defect common line at two sides of the break.
In accordance with one embodiment of the present invention, a repairing method of a thin film transistor (TFT) array substrate for repairing a TFT array substrate comprising

a storage capacitor on a gate (Cst on gate) or a storage capacitor on a common line (Cst on common) is provided. The repairing method includes, for example but not limited to, the following steps. First, a portion of at least one pixel electrode adjacent to a break of a scan line or a common line is removed. Then, a repairing circuit over the break is formed to electrically connect the repairing circuit and the scan line at two sides of the break or electrically connect the repairing circuit and the common line at two sides of the break, wherein the repairing circuit is electrically insulated with the pixel electrodes.

In accordance with one embodiment of the present invention, a repairing method of a thin film transistor (TFT) array substrate for repairing a TFT array substrate comprising a storage capacitor on a gate or a storage capacitor on a common line is provided. The repairing method includes, for example but not limited to, the following steps. Wherein, a portion of at least one pixel electrode adjacent to a break of a scan line or a common line is removed to electrically connect a portion of the pixel electrode with the scan line or the common line at two sides of the break.
In accordance with one embodiment of the present invention, a repairing method of a thin film transistor (TFT) array substrate for repairing a TFT array substrate comprising a storage capacitor on a gate or a storage capacitor on a common line is provided. The repairing method includes, for example but not limited to, the following steps. Wherein, at least one pixel electrode adjacent to a break of a scan line or a common line is electrically connected to the scan line or the common line at two sides of the break.
Accordingly, the present invention provides a repairing circuit for repairing the break of the scan line or the common line of the TFT array substrate. The defect scan line or the defect common line is repaired by electrically connecting the repairing circuit to the scan line or the common line at two sides of the break. In addition, the defect scan line or the defect common line may also be repaired by directly connecting the pixel electrode disposed over the break top to the scan line or the common line at two sides of the break.
One or parts or all of these and other features and advantages of the present invention will become readily apparent to those skilled in this art from the following description wherein there is shown and described a preferred embodiment of this invention, simply by way of illustration of one of the modes best suited to carry out the invention. As it will be realized, the invention is capable of different embodiments, and its several details are capable of modifications in various, obvious aspects all without departing from the invention. Accordingly, the drawings and descriptions will be regarded as illustrative in nature and not as restrictive.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide a further understanding of the present invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the present invention and, together with the description, serve to explain the principles of the present invention.
FIG. 1 is a schematic top view illustrates a thin film transistor (TFT) array substrate of storage capacitor on a gate according to one embodiment of the present invention.
FIG. 2A to FIG. 2F are top views schematically illustrating a method for repairing the defect scan line shown in FIG. 1 according to embodiments of the present invention.
FIG. 3A to FIG. 3F are top views schematically illustrating a method for repairing a defect common line according to embodiments of the present invention.

DESCRIPTION OF THE EMBODIMENTS

The present invention will be described fully hereinafter with reference to the accompanying drawings, in which preferred embodiments of the present invention are illustrated. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Like numbers refer to like elements in the accompanying drawings throughout.
FIG. 1 is a schematic top view illustrates a thin film transistor (TFT) array substrate of a storage capacitor on a gate according to one embodiment of the present invention. Referring to FIG. 1, a thin film transistor (TFT) array substrate comprises, for example but not limited to, a substrate 100, a plurality of scan lines 110, a plurality of data lines 120, a plurality of thin film transistors 130 and a plurality of pixel electrodes 140.
The scan lines 110 and the data lines 120 are disposed over the substrate 100, and a plurality of pixel areas 122 are defined by the scan lines 110 and the data lines 120. Each thin film transistor 130 is disposed in the corresponding pixel area 122, and the thin film transistors 130 are connected with and driven via the scan lines 110 and the data lines 120. Each pixel electrode 140 is disposed in the corresponding pixel area 122 to be electrically connected to the corresponding thin film transistor 130. In addition, a portion of each pixel electrode 140 is disposed over the corresponding scan line 110 to construct a storage capacitor. Therefore, the storage capacitor is constructed by the coupling of the scan line 110 and the pixel electrode 140 over the scan line 110, wherein a dielectric layer, for example but not limited to, a gate isolation layer and/or a protection layer is disposed between the scan line 110 and the pixel electrode 140.
It is noted that, sometimes at least a defect scan line 110 a may be generated in the scan lines 110 due to the defect in the process or other reasons. The defect scan line 110 a generally comprises at least a break A. When a defect scan line 110 a is generated in the scan lines 110, the pixel electrodes 140 connected after the break of the defect scan line 110 a don't work for displaying normally. Hereinafter, in the present invention, a break A of the defect scan line 110 a disposed between any two data lines 120 or under any data line 120 will be illustrated as an exemplary embodiment. In addition, a plurality of repairing methods for repairing the defect scan line 110 a will also be described. However, the present invention should not be limited to the embodiments and the descriptions of the invention.
FIG. 2A to FIG. 2F are top views schematically illustrating a repairing method corresponding to the defect scan line shown in FIG. 1 according to embodiments of the present invention.
Referring to FIG. 2A, if the break A of the defect scan line 10 a is disposed between any two of the data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, the following steps. First, a portion of the pixel electrode 140 above the break A is removed by using, for example but not limited to, a laser removing method. In one embodiment of the present, an opening 142 may be formed after the portion of the pixel electrode 140 is removed. Thereafter, a repairing circuit 150 may be formed in the opening 142 by using, for example but not limited to, a laser chemical vapor deposition (CVD) method. It is noted that, the repairing circuit 150 and the defect scan line 110 a at two sides of the break A are electrically connected by using, for example but not limited to, a laser welding method.
Alternatively, referring to FIG. 2B, if the break A of the defect scan line 110 a is disposed under one of the data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, the following steps. First, a portion of two pixel electrodes 140 adjacent to the break A is removed by using, for example but not limited to, a laser removing method. In one embodiment of the present invention, a gap 144 may be formed by removing the edges of the two pixel electrodes 140 respectively. In addition, a repairing circuit 150 is formed in the gap 144 and crosses over the data line 120 by using, for example but not limited to, a laser chemical vapor deposition (CVD) method. It is noted that, the repairing circuit 150 and the defect scan line 110 a at two sides of the break A are electrically connected by using, for example but not limited to, a laser welding method.
Accordingly, in the repairing method illustrated in FIG. 2A or FIG. 2B, since the repairing circuit 150 and the repaired pixel electrodes 140 are electrically insulated mutually, the repaired pixel electrode 140 can be used for displaying normally.
Moreover, referring to FIG. 2C, when the break A of the defect scan line 110 a is disposed under one of the data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, the following steps. First, the two pixel electrodes 140 adjacent to the break A are divided into a displaying portion 140 a and a repairing portion 140 b, wherein the displaying portion 140 a and the repairing portion 140 b are electrically insulated. In one embodiment of the present embodiment, the two pixel electrodes 140 are divided by using, for example but not limited to, a laser removing method. In addition, a repairing circuit 150 is formed over the break A, therefore the repairing circuit 150 and the repairing portion 140 b may be electrically connected to the defect scan line 110 a at two sides of the break A. It is noted that, the repairing circuit 150 is electrically connected to the defect scan line 110 a at two sides of the break A and the repairing portion 140 b by using, for example but not limited to, a laser welding method.
Alternatively, referring to FIG. 2D, when the break A of the defect scan line 110 a is disposed between any two data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, the following method. First, the pixel electrode 140 over the break A is divided into a displaying portion 140 a and a repairing portion 140 b surrounded by the displaying portion 140 a. The displaying portion 140 a and the repairing portion 140 b are electrically insulated. In one embodiment of the present invention, the pixel electrode 140 is divided by using, for example but not limited to, a laser removing method. Thereafter, the repairing portion 140 b is electrically connected to the defect scan line 110 a at two sides of the break A. In one embodiment of the present invention, the repairing portion 140 b and the defect scan line 110 a at two sides of the break A are electrically connected by using, for example but not limited to, a laser welding method.
Accordingly, in the repairing method shown in FIG. 2C and FIG. 2D, the pixel electrode 140 adjacent to the break A is divided into the displaying portion 140 a and the repairing portion 140 b. Then, the repairing portion 140 b is electrically connected to the defect scan line 110 a at two sides of the break A, therefore the break A is repaired. It is noted that, since the displaying portion 140 a and the repairing portion 140 b of the pixel electrode 140 are electrically insulated mutually, the displaying portion 140 a of the pixel electrode 140 can also be used for displaying normally and is not influenced by the repairing process.
Referring to FIG. 2E, when the break A of the defect scan line 110 a is disposed between any two of the data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, a laser welding method to electrically connect the pixel electrode 140 over the break A and the defect scan line 110 a at two sides of the break A directly. Therefore, since the defect scan line 110 a is repaired by the pixel electrode 140 over the break A, the line defect may be repaired and converted into a single defect.
Alternatively, referring to FIG. 2F, when the break A of the defect scan line 110 a is disposed under one of the data lines 120, the defect scan line 110 a may be repaired by, for example but not limited to, forming a repairing circuit 150 over the break A. In one embodiment of the present invention, the repairing circuit 150 is formed by, for example but not limited to, a laser chemical vapor deposition (CVD) method. It is noted that, the repairing circuit 150 is electrically connected to the defect common line 110 a at two sides of the break A and the pixel electrode 140 at two sides of the break A by using, for example but not limited to, a laser welding method.
Accordingly, in the repairing method illustrated in FIG. 2E and FIG. 2F, the line defect can be repaired by electrically connecting the pixel electrode 140 to the defect scan line 110 a at two sides of the break A directly.
Accordingly, the embodiments described above are provided for repairing the break of the defect scan line. However, the repairing method of the present invention is not only limited to the method of repairing the defect scan line, but also can be provided for repairing. For example but not limited to, the defect common line of the TFT array substrate. In general, the common line is disposed between every two adjacent scan lines, and the common line may be covered by a portion of the pixel electrode to form a storage capacitor on a common line (Cst on common). Therefore, when the defect common line of the common line is broken, a problem of line defect is also generated. Therefore, the present invention provides another repairing method for repairing the defect common line.
FIG. 3A to FIG. 3F are top views schematically illustrating a method for repairing a defect common line according to embodiments of the present invention. The TFT array substrate shown in FIG. 3A to FIG. 3F comprises a TFT array substrate of a storage capacitor on a common line (Cst on common) and has a structure similar to FIG. 2A to FIG. 2F. Therefore, only the technology different to the embodiments described above will be described in detail hereinafter.
In the structure of a storage capacitor on a common line (Cst on common), a common line 160 is disposed between any two adjacent scan lines 110 of the substrate 100. The storage capacitor (not shown) in each pixel is constructed from a portion of the pixel electrode 140 and the common line 160 over the pixel electrode 140. Similarly, the common line 160 and the pixel electrode 140 are generally separated by a dielectric layer (not shown), for example but not limited to, a gate isolation layer (not shown) and/or a protection layer (not shown). In general, at least a defect common line 160 a may be formed in the common lines 160, and the defect common line 160 a comprises a break B.
Referring to FIG. 3A, when the break B of the defect common line 160 a is disposed between any two of the data lines 120, the defect common line 160 a may be repairing by using, for example but not limited to, the following steps. First, a portion of the pixel electrode 140 over the break B is removed to form an opening 142. Thereafter, a repairing circuit 150 is formed in the opening 142 to electrically connect the repairing circuit 150 to the defect common line 160 a at two sides of the break B. Thus, the defect common line 160 a is repaired.
Referring to FIG. 3B, in one embodiment of the present invention, a portion of the pixel electrode 140 over the break B is removed to form a display area 140 a and an and a repairing area 140 b electrically insulated with the display area 140 a. Thereafter, the repairing area 140 b is electrically connected to the defect common line 160 a at two sides of the break B.
Referring to FIG. 3C, in one embodiment of the present invention, the pixel electrode 140 over the break B may be electrically connected to the defect common line 160 a at two sides of the break B directly by using a laser welding method.
Referring to FIG. 3D, when the break B of the defect common line 160 a is disposed under one of the data lines 120, the defect common line 160 a may be repaired by, for example but not limited to, the following steps. First, a portion of two pixel electrodes 140 adjacent to the break B is removed to form a gap 144 at the edges of the two pixel electrodes 140 respectively. Thereafter, a repairing circuit 150 is formed and crosses over the data line 120, wherein the repairing circuit 150 is in the gap 144 and electrically connected to the defect common line 160 a at two sides of the break B.
Referring to FIG. 3E, in one embodiment of the present invention, a portion of two pixel electrodes 140 adjacent to the remove break B may also be removed to form a display area 140 a and a repairing area 140 b electrically insulated with the display area 140 a. Thereafter, a repairing circuit 150 is formed and crosses over the data line 120, wherein the repairing circuit 150 is electrically connected to the repairing area 140 b and the defect common line 160 a at two sides of the break B.
Referring to FIG. 3F, in one embodiment of the present invention, a repairing circuit 150 may be directly formed and crosses over the data line 120, and then the repairing circuit 150 is electrically connected to the defect common line 160 a at two sides of the break B by using, for example, a laser welding method.
Accordingly, the repairing method of the present invention has the following advantages. First, the line defect generated in the scan line or the common line may be easily repaired by the repairing method of the present invention. The present invention is practicable. Next, the repairing method of the present invention is provided for repairing and converting the line defect into a two-point defect, a single defect, or even the defect is totally repaired (zero defect). Therefore, the yield is drastically enhanced.
The foregoing description of the preferred embodiment of the present invention has been presented for purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form or to exemplary embodiments disclosed. Accordingly, the foregoing description should be regarded as illustrative rather than restrictive. Obviously, many modifications and variations will be apparent to practitioners skilled in this art. The embodiments are chosen and described in order to best explain the principles of the invention and its best mode practical application, thereby to enable persons skilled in the art to understand the invention for various embodiments and with various modifications as are suited to the particular use or implementation contemplated. It is intended that the scope of the invention be defined by the claims appended hereto and their equivalents in which all terms are meant in their broadest reasonable sense unless otherwise indicated. It should be appreciated that variations may be made in the embodiments described by persons skilled in the art without departing from the scope of the present invention as defined by the following claims. Moreover, no element and component in the present disclosure is intended to be dedicated to the public regardless of whether the element or component is explicitly recited in the following claims.

Claims

1. A repairing method of a thin film transistor (TFT) array substrate, for repairing a TFT array substrate comprising a storage capacitor on a gate or a storage capacitor on a common line, the repairing method comprising:

removing a portion of at least one pixel electrode adjacent to a break of a scan line or a common line; and

forming a repairing circuit over the break to electrically connect the repairing circuit and the scan line at two sides of the break, or electrically connect the repairing circuit and the common line at two sides of the break, wherein the repairing circuit is electrically insulated with the pixel electrodes.

2. The repairing method of claim 1, wherein the break of the scan line or the common line is between two data lines and a step of removing the portion of the at least one pixel electrode comprises:

forming an opening corresponding to the break in the pixel electrode, wherein the repairing circuit is disposed in the opening, and electrically connected to the scan line or the common line at two sides of the break.

3. The repairing method of claim 1, wherein the break of the scan line or the common line is under a data line and a step of removing the portion of the at least one pixel electrode comprises:

forming a gap at an edge of two pixel electrodes adjacent to the break respectively, wherein the repairing circuit is crossed over the data line and is in the gap.

4. The repairing method of claim 1, wherein a method of removing the portion of the at least one pixel electrode comprises laser removing method.

5. The repairing method of claim 1, wherein a method of forming the repairing circuit comprises laser chemical vapor deposition (CVD) method.

6. A repairing method of a thin film transistor (TFT) array substrate, for repairing a TFT array substrate comprising a storage capacitor on a gate or a storage capacitor on a common line, the repairing method comprising:

removing a portion of at least one pixel electrode adjacent to a break of a scan line or a common line to electrically connect a portion of the pixel electrode with the scan line or the common line at two sides of the break.

7. The repairing method of claim 6, wherein the break of the scan line or the common line is between two data lines, and a step of removing the portion of the at least one pixel electrode comprises:

cutting the pixel electrode to divide the pixel electrode into a displaying portion and a repairing portion, wherein the displaying portion and the repairing portion are electrically insulated mutually, and the repairing portion is electrically connected to the scan line or the common line at two sides of the break.

8. The repairing method of claim 6, wherein the break of the scan line or the common line is under a data line, and a step of removing the portion of the at least one pixel electrode comprises:

cutting the pixel electrode to divide the pixel electrode into a displaying portion and a repairing portion, wherein the displaying portion and the repairing portion are electrically insulated mutually; and

forming a repairing circuit over the break, wherein the repairing circuit and the repairing portion are electrically connected to the scan line or the common line at two sides of break.

9. The repairing method of claim 6, wherein a method of removing the portion of the at least one pixel electrode comprises laser removing method.

10. The repairing method of claim 6, wherein a method of forming the repairing circuit comprises laser chemical vapor deposition (CVD) method.

11. A repairing method of a thin film transistor (TFT) array substrate, for repairing a TFT array substrate comprising a storage capacitor on a gate or a storage capacitor on a common line, the repairing method comprising:

electrically connecting at least one pixel electrode adjacent to a break of a scan line or a common line to the scan line or the common line at two sides of the break.

12. The repairing method of claim 11, wherein the break of the scan line or the common line is under a data line, further comprises:

forming a repairing circuit over the break, wherein the repairing circuit and two pixel electrodes adjacent to the break are electrically connected to the scan line or the common line at two sides of the break.

13. The repairing method of claim 11, wherein a method of electrically connecting the repairing circuit and the two pixel electrodes adjacent to the break with the scan line or the common line at the two sides of the break comprises laser welding method.