US20040108211A1 - Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) - Google Patents

Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) Download PDF

Info

Publication number
US20040108211A1
US20040108211A1 US10/313,830 US31383002A US2004108211A1 US 20040108211 A1 US20040108211 A1 US 20040108211A1 US 31383002 A US31383002 A US 31383002A US 2004108211 A1 US2004108211 A1 US 2004108211A1
Authority
US
United States
Prior art keywords
copper foil
surface treatment
concentration
solution
current density
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US10/313,830
Inventor
Chiu-Yen Chiu
Jung-Chou Oung
Jin-Yaw Liu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TAI HSIN COPPER & ALUMINA TECHNOLOGIES Co Ltd
Industrial Technology Research Institute ITRI
Original Assignee
Industrial Technology Research Institute ITRI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Industrial Technology Research Institute ITRI filed Critical Industrial Technology Research Institute ITRI
Priority to US10/313,830 priority Critical patent/US20040108211A1/en
Assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE reassignment INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHIU, CHIU-YEN, LIU, JIN-YAW, OUNG, JUNG-CHOU
Publication of US20040108211A1 publication Critical patent/US20040108211A1/en
Assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, TAI HSIN COPPER & ALUMINA TECHNOLOGIES CO., LTD. reassignment INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Abandoned legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/10Electroplating with more than one layer of the same or of different metals
    • C25D5/12Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
    • C25D5/14Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/56Electroplating: Baths therefor from solutions of alloys
    • C25D3/565Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of zinc
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/02Electroplating of selected surface areas
    • C25D5/028Electroplating of selected surface areas one side electroplating, e.g. substrate conveyed in a bath with inhibited background plating
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/34Pretreatment of metallic surfaces to be electroplated
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/48After-treatment of electroplated surfaces
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25FPROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
    • C25F1/00Electrolytic cleaning, degreasing, pickling or descaling
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/384Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/03Conductive materials
    • H05K2201/0332Structure of the conductor
    • H05K2201/0335Layered conductors or foils
    • H05K2201/0355Metal foils
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0307Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/03Metal processing
    • H05K2203/0392Pretreatment of metal, e.g. before finish plating, etching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/07Treatments involving liquids, e.g. plating, rinsing
    • H05K2203/0703Plating
    • H05K2203/0723Electroplating, e.g. finish plating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/14Related to the order of processing steps
    • H05K2203/1476Same or similar kind of process performed in phases, e.g. coarse patterning followed by fine patterning
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/02Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
    • H05K3/06Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
    • H05K3/07Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process being removed electrolytically
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/382Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
    • H05K3/383Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by microetching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/389Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane

Definitions

  • the present invention relates to a surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB), and more particularly to a surface treatment that makes the copper foil with low profile and high peel strength.
  • FPCB flexible printed circuit board
  • the copper foil Before wrought copper foil for use on a flexible PCB, the copper foil has to be degreased, acid-etched and, nodularized and plating with barrier layer, anti-tarnish layer and coating with a silane coupling agent to satisfy the necessary characteristics to the copper foil for use with a flexible PCB.
  • the copper foil When treating the copper foil so it can be laminated with a PI (polyimide) film for flexible PCB, the copper foil must have the following characteristics.
  • the copper foil must have anti-oxidation and anti-wrinkling properties when the copper foil is stored or transported.
  • the copper foil must have an anti-oxidation property, anti-eroding property with regard to chemical additives, non-breaking property and excellent bonding strength when the copper foil is laminatied with the PI film of the flexible PCB.
  • the copper foil must have good etching and dielectric properties when the copper foil is etched.
  • the copper foil must not generate pink ring during thermal shock when soft welding and drilling holes on the flexible PCB.
  • the copper foil has a roughened side and a glossy side.
  • the roughened side is laminated with the PI film, and the glossy side is exposed to the photoresist. Therefore, the roughened side and the glossy side must have different characteristics.
  • the surface can have no oxidation or surface defects after laminating the copper foil and the PCB and etching the copper foil. Moreover, the surface can have no residual dust on the surface of the copper foil after etching.
  • the glossy side cannot be oxidized when the copper foil and the PI film are laminated, and the glossy side must combine well with the photoresist, and the shining side must have good solderability.
  • the roughened side of the copper foil has to be nodularuzated before being laminated with the PI film to impart the peel strength.
  • the copper foil has to be treated by plating fine copper particles to the surface.
  • barrier layer must be plated to prevent erosion by the resin during the laminating process.
  • the copper foil must contact the electrode so achieving the copper foil characteristics previously mentioned is difficult.
  • the electrochemical acid etching process takes a long time and causes too many copper ions to accumulate in the etching solution. Additionally, other conventional surface treatment procedures make the copper foil excessively rough and easily torn.
  • the present invention provides a surface treatment for a wrought copper foil for use on a flexible PCB to mitigate or obviate the aforementioned problems.
  • the main objective of the invention is to provide a surface treatment for a wrought copper foil for a flexible PCB, which makes the copper foil have a very low surface roughness, excellent peel strength, heat resistance and resistance for the hydrochloric acid.
  • the copper foil possesses excellent characteristics for a copper foil adapted to laminate with PI film for a flexible PCB.
  • FIG. 1 is a block diagram of a surface treatment for a wrought copper foil for use on a flexible PCB in accordance with the present invention
  • FIG. 2 is a schematic diagram depicting the surface treatment for a copper foil in FIG. 1;
  • FIG. 3 is a schematic diagram of the bi-polar electrochemical degreasing process in FIG. 1;
  • FIG. 4 is a schematic diagram of the bi-polar electrochemical acid etching process in FIG. 1;
  • FIG. 5 is a schematic diagram of the two-stage electrochemical nodularization process in FIG. 1;
  • FIG. 6 is a schematic diagram of the barrier layer electroplating process in FIG. 1 ;
  • FIG. 7 is a schematic diagram of the anti-tarnish layer electroplating process in FIG. 1;
  • FIG. 8 is a schematic diagram of the silane coupling agent coating process in FIG. 1.
  • a surface treatment for a wrought copper foil for use on a flexible PCB comprises the steps of bi-polar electrochemical degreasing, acid etching and nodularization, electroplating a barrier layer and an anti-tarnish layer and coating with silane coupling agent g an organic silane layer.
  • copper foil is drawn off from a source roll ( 12 ) by a drive roll ( 16 ), passes between another drive roll ( 16 ) and a squeegee rool ( 15 ) and is fed to an electro-cleaning tank to perform the bi-polar electrochemical degreasing of the copper foil.
  • the bi-polar electrochemical degreasing is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source ( 23 ).
  • Each electrode is a pair of stainless steel sheets ( 20 ).
  • the copper foil passes between the two stainless steel sheets ( 20 ) of the positive charge at the current inlet, around a sinking roll ( 14 ) and between the two stainless steel sheets ( 20 ) of the negative charge at the current outlet.
  • the bi-polar electrochemical degreasing process utilizes a cleaning solution containing sodium hydroxide, an alkaline metal carbonate, an alkaline metal silicate as the electrolyte.
  • the current density in the range from about 1 ⁇ 5 A/dm 2 for about 10 ⁇ 40 seconds at a temperature of from about 50 ⁇ 80° C.
  • the advantages of using the bi-polar degreasing process are that the copper foil does not contact with the conductive roll and particle is not deposited on the copper foil at the current outlet because the copper foil at the current outlet is anode.
  • a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee excess solution from the copper foil before rinsing the copper foil twice with hot water in a rinsing tank ( 10 ).
  • the copper foil passes between a drive roll ( 16 ) and a squeegee roll ( 15 ) and is fed to an etching tank to perform the bi-polar electrochemical etching of the copper foil.
  • the bi-polar electrochemical etching is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source ( 23 ).
  • the bi-polar electrochemical acid etching is performed by passing the copper foil between two pairs of electrodes in a sulfuric acid solution. The electrodes in each pair are Pt/Ti sheets ( 21 ) and are oppositely charged.
  • the copper foil passes through the sulfuric acid solution between the first pair of Pt/Ti sheets ( 21 ) of negative charge at the current inlet, around a sinking roll ( 14 ) and between the second pair of Pt/Ti sheets ( 21 ) of positive charge at the current outlet.
  • the electro-etching utilizes a solution contain sulfuric acid and copper ions.
  • the sulfuric acid is present in an amount from about 30 ⁇ 90 g/L.
  • DC current source ( 23 ) maintains a current density in the range from about 2 ⁇ 10 A/dm 2 for about 5 ⁇ 20 seconds at a temperature of from about 30 ⁇ 60° C.
  • the copper foil does not contact other copper foil and copper ions do not accumulate on the copper foil in the etching solution.
  • the copper foil is squeezed between a drive roll ( 16 ) and a squeegee roll ( 15 ) before being cleaned with deionized water in a rinsing tank ( 10 ).
  • the nodularization process is performed by passing the copper foil through a first nodularization tank and a second nodularization tank containing an electrolytic solution.
  • the copper foil is connected to a negative electrode of a DC power source ( 23 ) through a conductive roll ( 17 ).
  • the copper foil passes through the electrolytic solution in close proximity to a positively charged electrode ( 22 ), around sinking roll ( 14 ) and out of the tank between a drive roll ( 16 ) and a squeegee roll ( 15 ).
  • the copper foil is nodularized by DC plating with high-density current to nucleate copper micro-particles on the surface of the copper foil facing the positive electrode.
  • the nodularization process utilizes a solution sulfuric acid, copper ions and additives.
  • the tank is carried out in an electrolytic solution containing 50 ⁇ 150 g/L sulfuric acid, 5 ⁇ 20 g/L copper ions and additives.
  • the copper foil is a cathode and the DSA (Dimension Stable Anode) becomes an anode.
  • the current density in a range from about 60 ⁇ 150 A/dm 2 for from 1 ⁇ 3 seconds at a temperature of from about 20 ⁇ 40° C.
  • the copper foil is also connected to the negative electrode of a DC power source ( 23 ) through another conductive roll ( 17 ) and passes in close proximity to a positive charged electrode ( 22 ) in the second nodularization tank, around a sinking roll ( 14 ), out of the tank between a drive roll ( 16 ) and a squeegee roll ( 15 ) and through a rinsing tank ( 10 ).
  • the copper foil is nodularized by direct current plating and treated with low-density current to growth the copper nodular on the surface of the copper foil.
  • the nodularization process in the second nodularization tank is carried out in the same solution in the first phase.
  • the current density in a range from about 10 ⁇ 60 A/dm 2 for from 4 ⁇ 10 seconds at a temperature of from about 20 ⁇ 40° C.
  • additives containing As +5 , As +3 , Ni +2 , W +6 , NO 3 ⁇ , Co +2 ions are added to the plating solution to inhibit the copper deposition.
  • the additive is present in the plating solution in the range from about 0.2 ⁇ 2.0 g/L, and preferably from about 0.5 ⁇ 1.5 g/L of As +5 .
  • a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee residual solution from the copper foil, and the copper foil is further cleaned with deionized water in a rinsing tank ( 10 ).
  • the Zn—Ni barrier layer is applied to the copper foil utilizes a solution containing the zone ion, nickel, boric acid, sodium sulfate as the electrolyte in the tank.
  • the copper foil is channeled into the g tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an inlet and leaves the tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an outlet.
  • the copper foil is connected to negative electrodes of three DC current sources ( 23 ) that are connected to the two conductive roll ( 17 ) at the inlet and the outlet of the tank.
  • the copper foil passes between two positively charged Pt/Ti electrodes ( 21 ) at the inlet, around a sinking roll ( 14 ) and in close proximity to another positively charged Pt/Ti electrode ( 21 ) at the outlet. Because the copper foil is negatively charged in the tank, a barrier layer is directly plated on the copper foil.
  • the barrier layer plating process is carried out in a 20 ⁇ 100 g/L boric acid solution containing 0.25 ⁇ 2.0 g/L Ni ions and 0.5 ⁇ 5.0 g/L Zn ions.
  • the current density in the range from about 0.5 ⁇ 2.0 A/dm 2 for from 2 ⁇ 10 seconds at a temperature of from about 30 ⁇ 60° C.
  • An additive selected from saccharine or benzyl tri-ethyl ammonium bromide is added to the solution in a range from about 50 ⁇ 300 ppm.
  • the pH of the plating solution is maintained at a range from about 4.0 ⁇ 6.0.
  • an Cr—Zn anti-tarnish layer is applied to the copper foil utilizes a solution contating chromic acid, zinc ion, sodium sulfate as the electrolyte in the tank.
  • the copper foil is channeled into the tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an inlet and leaves the plating tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an outlet.
  • the copper foil is connected to negative electrodes of two DC current sources ( 23 ) that are connected to the conductive roll ( 17 ) at inlet of the anti-tarnish layer plating tank.
  • the copper foil passes between two positively charged Pt/Ti electrodes ( 21 ) at the inlet, around a sinking roll ( 14 ) and out of the tank. Because the copper foil is negatively charged in the tank, an anti-tarnish layer is directly plated on the copper foil.
  • the anti-tarnish layer plating process is carried out in a 2 ⁇ 20 g/L sodium sulfate solution containing 0.2 ⁇ 2.0 g/L Zn ions and 0.5 ⁇ 5.0 g/L Cr acid.
  • the current density in the range from about 0.5 ⁇ 5.0 A/dm 2 for from 2 ⁇ 10 seconds at a temperature of from about 30 ⁇ 60° C.
  • a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank ( 10 ).
  • the roughened surface is coated with a silane coupling agent to form a thin film on the copper foil in a tank.
  • the copper foil is fed through the tank around a sinking roll ( 14 ), between a drive roll ( 16 ) and a squeegee roll ( 15 ) to a drying oven ( 11 ).
  • the tank holds a solution containing 0.2 ⁇ 2.0% 3-glycidoxypropyl trimethoxy silane to coat the silane coupling agent on the copper foil. Only the roughened side of the copper foil is coated with the silane coupling agent.
  • the copper foil leaves the tank, and a drive rool ( 16 ) and a squeegee roll ( 15 ) squeegee excess silane coupling agent from the copper foil before the copper foil is dried in the drying oven ( 11 ). Finally, the treated copper foil is rolled onto a copper roll ( 13 ).
  • 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
  • the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities.
  • the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density between the electrodes of 131 A/dm 2 for 1.0 sec.
  • the second nodularization plating stage was performed with a current density of 20A/dm 2 for 5 sec.
  • the roughened side of the copper foil was coated with a barrier layer by electroplating.
  • the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density of 0.75 A/dm 2 for 10 sec.
  • the current density on the glossy side of the copper foil was plated with current density of 0.2 A/dm 2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
  • silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
  • 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2A/dm 2 for 10 sec.
  • the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
  • the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 131 A/dm 2 for 1.0 sec.
  • the second nodularization plating stage was performed with a current density of 20 A/dm 2 for 5 sec.
  • the roughened side of the copper foil was coated with a barrier layer by electroplating.
  • the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm 2 for 10 sec.;
  • the current density on the glossy side of the copper foil was plated with a current of 0.2 A/dm 2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 1.8 A/dm 2 for 5 sec.
  • a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
  • 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of 10% base degreasing agent at 70° C. with a current density of 2A/dm 2 for 10 sec.
  • the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities.
  • the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration an 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
  • the second nodularization plating stage was performed with a current density of 20 A/dm 2 for 5 sec.
  • the roughened side of the copper foil was coated with a barrier layer by electroplating.
  • the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm 2 for 10 sec.
  • the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
  • a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
  • 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
  • the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 3 A/dm 2 for 10 sec.
  • One side of the copper foil was roughened in two plating stages having different current densities.
  • the first nodularization stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
  • the second nodularization plating stage was performed with a current density of 20 A/dm 2 for was 5 sec.
  • the roughened side of the copper foil was coated with a barrier layer by electroplating.
  • the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm 2 for 10 sec.
  • the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
  • a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
  • 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
  • the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2.2 A/dm 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities.
  • the first nodularization lating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
  • the second nodularization plating stage was performed with a current density 20 A/dm 2 for 5 sec.
  • the roughened side of the copper foil was coated with barrier layer by electroplating.
  • the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm 2 for 10 sec.
  • the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
  • a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
  • the surface treatment for a wrought copper foil for use on a flexible printed circuit board (PCB) as previously described has the numerous advantages over conventional procedures.
  • the degreasing, etching, nodularization and barrier layer and anti-oxidation layer plating steps in the process all have significant advantages.
  • the degreasing and etching processes are carried out using bi-polar techniques.
  • the copper foil does not contact the roller. Copper ions do not accumulate on the copper foil during etching processes.
  • the barrier layer plating process uses Zn—Ni type boric acid as a plating agent. Therefore, the pH is easily maintained, and the copper foil is easily cleaned with water.
  • the anti-tarnish layer plating process uses Cr—Zn type as a plating agent. The surface roughness is reduced, and the peel strength is increased. Furthermore, the HCl undercut of the treated copper foil was less than 5%, the thermal age was less than 30% and HTO at least 1 hr at 250° C. Therefore, the copper foil treated with the surface treatment procedure of the present invention has excellent physical properties to meet the requirements for producing a flexible PCB.

Abstract

A surface treatment for a wrought copper foil relatives to a surface treatment procedure for a wrought cooper foil for use on a flexible PCB. The surface treatment comprises the steps of bi-polar electrochemical degreasing, acid etching and nodularization, electroplating a barrier layer and an anti-tarnish layer and coating a silane coupling agent layer to a copper foil. One side of the copper foil is nodularization, and a Zn—Ni barrier layer and a Cr—Zn anti-tarnish layer are electroplated on the copper foil. Finally, the organic silane coupling agent is coated to the roughened surface of the copper foil to modify the surface characters to impart the peel strength. Whereby, the cooper foil has very low profile, high peel strength, finer-pattern property, low HCl undercut and high thermal oxidation property.

Description

    BACKGROUND OF THE INVENTION
  • 1. Field of the Invention [0001]
  • The present invention relates to a surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB), and more particularly to a surface treatment that makes the copper foil with low profile and high peel strength. [0002]
  • 2. Description of Related Art [0003]
  • Before wrought copper foil for use on a flexible PCB, the copper foil has to be degreased, acid-etched and, nodularized and plating with barrier layer, anti-tarnish layer and coating with a silane coupling agent to satisfy the necessary characteristics to the copper foil for use with a flexible PCB. When treating the copper foil so it can be laminated with a PI (polyimide) film for flexible PCB, the copper foil must have the following characteristics. [0004]
  • (1) The copper foil must have anti-oxidation and anti-wrinkling properties when the copper foil is stored or transported. [0005]
  • (2) The copper foil must have an anti-oxidation property, anti-eroding property with regard to chemical additives, non-breaking property and excellent bonding strength when the copper foil is laminatied with the PI film of the flexible PCB. [0006]
  • (3) The copper foil must have good etching and dielectric properties when the copper foil is etched. [0007]
  • (4) The copper foil must combine well with the photoresist during the exposure process and be easily cleaned by washing. Additionally, the etched lines on the copper foil cannot be eroded by hydrochloric acid. [0008]
  • (5) The copper foil must not generate pink ring during thermal shock when soft welding and drilling holes on the flexible PCB. [0009]
  • The copper foil has a roughened side and a glossy side. The roughened side is laminated with the PI film, and the glossy side is exposed to the photoresist. Therefore, the roughened side and the glossy side must have different characteristics. [0010]
  • (1) With regards to the roughened side: the surface can have no oxidation or surface defects after laminating the copper foil and the PCB and etching the copper foil. Moreover, the surface can have no residual dust on the surface of the copper foil after etching. [0011]
  • (2) With regards to the glossy side: the glossy side cannot be oxidized when the copper foil and the PI film are laminated, and the glossy side must combine well with the photoresist, and the shining side must have good solderability. [0012]
  • The largest difference between the characteristics of the roughened side and the glossy side is that the roughened side of the copper foil has to be nodularuzated before being laminated with the PI film to impart the peel strength. In the nodularization process, the copper foil has to be treated by plating fine copper particles to the surface. Additionally, barrier layer must be plated to prevent erosion by the resin during the laminating process. [0013]
  • With regard to a conventional electrochemical degreasing process, the copper foil must contact the electrode so achieving the copper foil characteristics previously mentioned is difficult. The electrochemical acid etching process takes a long time and causes too many copper ions to accumulate in the etching solution. Additionally, other conventional surface treatment procedures make the copper foil excessively rough and easily torn. [0014]
  • To overcome the shortcomings, the present invention provides a surface treatment for a wrought copper foil for use on a flexible PCB to mitigate or obviate the aforementioned problems. [0015]
  • SUMMARY OF THE INVENTION
  • The main objective of the invention is to provide a surface treatment for a wrought copper foil for a flexible PCB, which makes the copper foil have a very low surface roughness, excellent peel strength, heat resistance and resistance for the hydrochloric acid. In other words, the copper foil possesses excellent characteristics for a copper foil adapted to laminate with PI film for a flexible PCB. [0016]
  • Objectives, advantages and novel features of the invention will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings.[0017]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a block diagram of a surface treatment for a wrought copper foil for use on a flexible PCB in accordance with the present invention; [0018]
  • FIG. 2 is a schematic diagram depicting the surface treatment for a copper foil in FIG. 1; [0019]
  • FIG. 3 is a schematic diagram of the bi-polar electrochemical degreasing process in FIG. 1; [0020]
  • FIG. 4 is a schematic diagram of the bi-polar electrochemical acid etching process in FIG. 1; [0021]
  • FIG. 5 is a schematic diagram of the two-stage electrochemical nodularization process in FIG. 1; [0022]
  • FIG. 6 is a schematic diagram of the barrier layer electroplating process in FIG. [0023] 1;
  • FIG. 7 is a schematic diagram of the anti-tarnish layer electroplating process in FIG. 1; and [0024]
  • FIG. 8 is a schematic diagram of the silane coupling agent coating process in FIG. 1.[0025]
  • DETAILED DESCRIPTION OF PREFERRED EMBODIMENT
  • With reference to FIGS. 1 and 2, a surface treatment for a wrought copper foil for use on a flexible PCB comprises the steps of bi-polar electrochemical degreasing, acid etching and nodularization, electroplating a barrier layer and an anti-tarnish layer and coating with silane coupling agent g an organic silane layer. [0026]
  • With further reference to FIG. 3, copper foil is drawn off from a source roll ([0027] 12) by a drive roll (16), passes between another drive roll (16) and a squeegee rool (15) and is fed to an electro-cleaning tank to perform the bi-polar electrochemical degreasing of the copper foil. The bi-polar electrochemical degreasing is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source (23). Each electrode is a pair of stainless steel sheets (20). The copper foil passes between the two stainless steel sheets (20) of the positive charge at the current inlet, around a sinking roll (14) and between the two stainless steel sheets (20) of the negative charge at the current outlet. The bi-polar electrochemical degreasing process utilizes a cleaning solution containing sodium hydroxide, an alkaline metal carbonate, an alkaline metal silicate as the electrolyte. The current density in the range from about 1˜5 A/dm2 for about 10˜40 seconds at a temperature of from about 50˜80° C. The advantages of using the bi-polar degreasing process are that the copper foil does not contact with the conductive roll and particle is not deposited on the copper foil at the current outlet because the copper foil at the current outlet is anode. After the copper foil leaves the electro-cleaning tank, a drive roll (16) and a squeegee roll (15) squeegee excess solution from the copper foil before rinsing the copper foil twice with hot water in a rinsing tank (10).
  • With further reference to FIG. 4, the copper foil passes between a drive roll ([0028] 16) and a squeegee roll (15) and is fed to an etching tank to perform the bi-polar electrochemical etching of the copper foil. The bi-polar electrochemical etching is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source (23). The bi-polar electrochemical acid etching is performed by passing the copper foil between two pairs of electrodes in a sulfuric acid solution. The electrodes in each pair are Pt/Ti sheets (21) and are oppositely charged. The copper foil passes through the sulfuric acid solution between the first pair of Pt/Ti sheets (21) of negative charge at the current inlet, around a sinking roll (14) and between the second pair of Pt/Ti sheets (21) of positive charge at the current outlet. The electro-etching utilizes a solution contain sulfuric acid and copper ions. The sulfuric acid is present in an amount from about 30˜90 g/L. DC current source (23) maintains a current density in the range from about 2˜10 A/dm2 for about 5˜20 seconds at a temperature of from about 30˜60° C. The advantages of using the bi-polar electrochemical etching process are that the copper foil does not contact other copper foil and copper ions do not accumulate on the copper foil in the etching solution. After passing between the second pair of the Pt/Ti sheets (21) and out of the etching tank, the copper foil is squeezed between a drive roll (16) and a squeegee roll (15) before being cleaned with deionized water in a rinsing tank (10).
  • With reference to FIG. 5, the nodularization process is performed by passing the copper foil through a first nodularization tank and a second nodularization tank containing an electrolytic solution. In the first nodularization tank, the copper foil is connected to a negative electrode of a DC power source ([0029] 23) through a conductive roll (17). The copper foil passes through the electrolytic solution in close proximity to a positively charged electrode (22), around sinking roll (14) and out of the tank between a drive roll (16) and a squeegee roll (15). In the first tank, the copper foil is nodularized by DC plating with high-density current to nucleate copper micro-particles on the surface of the copper foil facing the positive electrode. The nodularization process utilizes a solution sulfuric acid, copper ions and additives. The tank is carried out in an electrolytic solution containing 50˜150 g/L sulfuric acid, 5˜20 g/L copper ions and additives. The copper foil is a cathode and the DSA (Dimension Stable Anode) becomes an anode. The current density in a range from about 60˜150 A/dm2 for from 1˜3 seconds at a temperature of from about 20˜40° C. When the copper foil leaves the first nodularization tank, residual solution is squeezed from the copper foil by a drive roll (16) and a squeegee roll (15) and passes through a rinsing tank (10) before moving into a second nodularization tank.
  • In the second nodularization tank, the copper foil is also connected to the negative electrode of a DC power source ([0030] 23) through another conductive roll (17) and passes in close proximity to a positive charged electrode (22) in the second nodularization tank, around a sinking roll (14), out of the tank between a drive roll (16) and a squeegee roll (15) and through a rinsing tank (10). In the second nodularization tank, the copper foil is nodularized by direct current plating and treated with low-density current to growth the copper nodular on the surface of the copper foil. The nodularization process in the second nodularization tank is carried out in the same solution in the first phase. The current density in a range from about 10˜60 A/dm2 for from 4˜10 seconds at a temperature of from about 20˜40° C. Additionally, additives containing As+5, As+3, Ni+2, W+6, NO3 , Co+2 ions are added to the plating solution to inhibit the copper deposition. The additive is present in the plating solution in the range from about 0.2˜2.0 g/L, and preferably from about 0.5˜1.5 g/L of As+5. When the copper foil leaves the second nodularization tank, a drive roll (16) and a squeegee roll (15) squeegee residual solution from the copper foil, and the copper foil is further cleaned with deionized water in a rinsing tank (10).
  • With reference to FIG. 6, the Zn—Ni barrier layer is applied to the copper foil utilizes a solution containing the zone ion, nickel, boric acid, sodium sulfate as the electrolyte in the tank. The copper foil is channeled into the g tank between a conductive roll ([0031] 17) and a squeegee roll (15) at an inlet and leaves the tank between a conductive roll (17) and a squeegee roll (15) at an outlet. The copper foil is connected to negative electrodes of three DC current sources (23) that are connected to the two conductive roll (17) at the inlet and the outlet of the tank. In the plating solution in the Zn—Ni alloy plating tank, the copper foil passes between two positively charged Pt/Ti electrodes (21) at the inlet, around a sinking roll (14) and in close proximity to another positively charged Pt/Ti electrode (21) at the outlet. Because the copper foil is negatively charged in the tank, a barrier layer is directly plated on the copper foil. The barrier layer plating process is carried out in a 20˜100 g/L boric acid solution containing 0.25˜2.0 g/L Ni ions and 0.5˜5.0 g/L Zn ions. The current density in the range from about 0.5˜2.0 A/dm2 for from 2˜10 seconds at a temperature of from about 30˜60° C. An additive selected from saccharine or benzyl tri-ethyl ammonium bromide is added to the solution in a range from about 50˜300 ppm. The pH of the plating solution is maintained at a range from about 4.0˜6.0. When the copper foil leaves the tank, the conductive roll (17) and the squeegee roll (15) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank (10).
  • With reference to FIG. 7, an Cr—Zn anti-tarnish layer is applied to the copper foil utilizes a solution contating chromic acid, zinc ion, sodium sulfate as the electrolyte in the tank. The copper foil is channeled into the tank between a conductive roll ([0032] 17) and a squeegee roll (15) at an inlet and leaves the plating tank between a conductive roll (17) and a squeegee roll (15) at an outlet. The copper foil is connected to negative electrodes of two DC current sources (23) that are connected to the conductive roll (17) at inlet of the anti-tarnish layer plating tank. The copper foil passes between two positively charged Pt/Ti electrodes (21) at the inlet, around a sinking roll (14) and out of the tank. Because the copper foil is negatively charged in the tank, an anti-tarnish layer is directly plated on the copper foil. The anti-tarnish layer plating process is carried out in a 2˜20 g/L sodium sulfate solution containing 0.2˜2.0 g/L Zn ions and 0.5˜5.0 g/L Cr acid. The current density in the range from about 0.5˜5.0 A/dm2 for from 2˜10 seconds at a temperature of from about 30˜60° C. When the copper foil leaves the g tank, a drive roll (16) and a squeegee roll (15) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank (10).
  • With reference to FIG. 8, the roughened surface is coated with a silane coupling agent to form a thin film on the copper foil in a tank. The copper foil is fed through the tank around a sinking roll ([0033] 14), between a drive roll (16) and a squeegee roll (15) to a drying oven (11). The tank holds a solution containing 0.2˜2.0% 3-glycidoxypropyl trimethoxy silane to coat the silane coupling agent on the copper foil. Only the roughened side of the copper foil is coated with the silane coupling agent. After the roughened side of the copper foil is coated with the silane coupling agent layer, the copper foil leaves the tank, and a drive rool (16) and a squeegee roll (15) squeegee excess silane coupling agent from the copper foil before the copper foil is dried in the drying oven (11). Finally, the treated copper foil is rolled onto a copper roll (13).
  • Several examples of the surface treatment of a copper foil for a flexible PCB to illustrate different operational conditions used in the performance of the process follow. [0034]
  • EXAMPLE 1
  • 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm[0035] 2 for 10 sec.
  • The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm[0036] 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As[0037] +5 concentration of 1.45 g/L at 30° C. with a direct current density between the electrodes of 131 A/dm2 for 1.0 sec. The second nodularization plating stage was performed with a current density of 20A/dm2 for 5 sec.
  • The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H[0038] 3BO3 concentration of 40 g/L at 50° C. with a current density of 0.75 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with current density of 0.2 A/dm2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO[0039] 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
  • An silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test. [0040]
  • EXAMPLE 2
  • 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2A/dm[0041] 2 for 10 sec.
  • The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm[0042] 2 for 10 sec.
  • One side of the copper foil was roughened in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As[0043] +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 131 A/dm2 for 1.0 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for 5 sec.
  • The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H[0044] 3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm2 for 10 sec.; The current density on the glossy side of the copper foil was plated with a current of 0.2 A/dm2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO[0045] 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 1.8 A/dm2 for 5 sec.
  • A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test. [0046]
  • EXAMPLE 3
  • 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of 10% base degreasing agent at 70° C. with a current density of 2A/dm[0047] 2 for 10 sec.
  • The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm[0048] 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As[0049] +5 concentration an 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for 5 sec.
  • The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L a Ni concentration of 0.75 g/L and an H[0050] 3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO[0051] 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
  • A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test. [0052]
  • EXAMPLE 4
  • 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm[0053] 2 for 10 sec.
  • The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 3 A/dm[0054] 2 for 10 sec.
  • One side of the copper foil was roughened in two plating stages having different current densities. The first nodularization stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As[0055] +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for was 5 sec.
  • The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H[0056] 3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO[0057] 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
  • A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test. [0058]
  • EXAMPLE 5
  • 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm[0059] 2 for 10 sec.
  • The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2.2 A/dm[0060] 2 for 10 sec.
  • One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization lating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As[0061] +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density 20 A/dm2 for 5 sec.
  • The roughened side of the copper foil was coated with barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H[0062] 3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
  • An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO[0063] 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
  • A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test. [0064]
  • The results of the peel strength, HCl undercut, thermal age, and HTO test in the five examples are provided in the following table: [0065]
    Ra Rz Rmax Peel (FR-4) Erosion Proportion Thermal-aged
    Number (μm) (μm) (μm) (kg/cm) to HCL*1 % Proportion*2 % Anti-oxidation Test*3
    Example 1 0.2343 1.757 2.478 1.310 4.10 23.45 Pass
    Example 2 0.2087 1.524 1.934 1.346 1.23 26.37 Pass
    Example 3 0.2001 1.353 1.618 1.326 3.54 17.04 Pass
    Example 4 0.1997 1.321 1.552 1.314 4.87 23.30 Pass
    Example 5 0.2321 1.616 2.225 1.375 1.83 25.69 Pass
  • 1. Resistance to hydrochloric acid was given as deterioation rate (%) of peel strength of a 8 mill pitch circuit measured after immersion in 18% HCL for 1 hour. [0066]
  • 2. Resistance to thermal deterioration was measured in terms of deterioration rate (%) of the peel strength after heating at 177° C. for 48 hours. [0067]
  • 3. Testing conditions 270° C., 1 hr. [0068]
  • The surface treatment for a wrought copper foil for use on a flexible printed circuit board (PCB) as previously described has the numerous advantages over conventional procedures. The degreasing, etching, nodularization and barrier layer and anti-oxidation layer plating steps in the process all have significant advantages. [0069]
  • The degreasing and etching processes are carried out using bi-polar techniques. The copper foil does not contact the roller. Copper ions do not accumulate on the copper foil during etching processes. [0070]
  • Carrying out the nodularization process in two plating stages respectively with different current densities prevents wrinkles from forming on the copper foil and enhances the uniformity of the copper foil. If a proper additive is used in the nodularization process, the surface roughness (Rz) is less than 2.3 μm, and the nodularization particles are controlled within 0.5˜0.8 μm. Additionally, the peel strength is larger than 1.3 kg/cm. [0071]
  • The barrier layer plating process uses Zn—Ni type boric acid as a plating agent. Therefore, the pH is easily maintained, and the copper foil is easily cleaned with water. The anti-tarnish layer plating process uses Cr—Zn type as a plating agent. The surface roughness is reduced, and the peel strength is increased. Furthermore, the HCl undercut of the treated copper foil was less than 5%, the thermal age was less than 30% and HTO at least 1 hr at 250° C. Therefore, the copper foil treated with the surface treatment procedure of the present invention has excellent physical properties to meet the requirements for producing a flexible PCB. [0072]
  • Even though numerous advantages of the present invention have been set forth in the foregoing description, the disclosure is illustrative only. Changes may be made in detail within the principles of the invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed. [0073]

Claims (9)

What is claimed is:
1. A surface treatment procedure of a copper foil for use on a flexible PCB comprising the following sequential acts:
electrochemically degreasing a copper foil;
acid etching the copper foil;
nodularization the roughened side of the copper foil in two stages of different current density;
electroplating a barrier layer on the copper foil;
electroplating an anti-tarnish layer on the copper foil; and
coating an silane coupling agent on the roughened surface of the copper foil;
wherein the electrochemically degreasing and acid etching processes are carried out by bi-polar electrochemical processes.
2. The surface treatment of a copper foil as claimed in claim 1, wherein the bi-polar electrochemical degreasing process is performed in a solution of a base degreasing agent with a current density of 1˜5 A/dm2 at 50˜80° C. for 10˜40 sec.
3. The surface treatment of a copper foil as claimed in claim 1, wherein the bi-polar acid etching process is performed in a solution of 30˜90 g/L sulfuric acid with a current density of 2˜10 A/dm2 at 30˜60° C. for 5˜20 sec.
4. The surface treatment of a copper foil as claimed in claim 1, wherein the nodularization process is performed in two stages where:
a first stage is performed just after the copper foil enters a solution of copper ions in a 5-20 g/L plating agent and 50˜150 g/L sulfuric acid and an additive to the plating agent containing As+5, As+3, Ni+2, W+6, NO3 , Co+2 with a current density of 60˜150 A/dm2 at 20˜40° C. for 1˜3 sec; and
a second stage just after the copper foil enters a solution the same as that in the first stage with a current density of 10˜60 A/dm2 at 20˜40° C. for 4˜10 sec.
5. The surface treatment of a copper foil as claimed in claim 4, wherein the additive in the nodularization process contains 0.5˜1.5 g/L of As+5.
6. The surface treatment of a copper foil as claimed in claim 1, wherein the barrier layer plating process is preformed in a Zn—Ni type boric acid solution with a 20˜100 g/L concentration of boric acid, 50˜300 ppm of an additive selected from saccharine or benzyl tri-ethyl ammonium bromide, a 0.5˜5.0 g/L concentration of Zn, a 0.25˜2.0 g/L concentration of Ni with a current density of 0.25˜2.0 A/dm2 30˜60° C. for 2˜10 sec and pH in the range of 4.0˜6.0.
7. The surface treatment of a copper foil as claimed in claim 1, wherein the anti-tarnish layer coating process is performed in a Cr—Zn type solution with a 2˜20 g/L concentration of sodium sulfate, a 0.2˜2.0 g/L concentration of Zn and a 0.5˜5.0 g/L concentration of chromic acid at 30˜60° C. with a current density of 0.5˜5.0 A/dm2 for 2˜10 sec.
8. The surface treatment of a copper foil as claimed in claim 1, wherein the organic silane layer spraying process is performed in a 3-glycidoxypropyl trimethoxy silane solution to coat the silane coupling agent on the roughened side of the copper foil.
9. The surface treatment of a copper foil as claimed in claim 8, wherein the concentration of the 3-glycidoxypropyl trimethoxy silane solution is 0.2˜2.0%.
US10/313,830 2002-12-06 2002-12-06 Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) Abandoned US20040108211A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US10/313,830 US20040108211A1 (en) 2002-12-06 2002-12-06 Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/313,830 US20040108211A1 (en) 2002-12-06 2002-12-06 Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB)

Publications (1)

Publication Number Publication Date
US20040108211A1 true US20040108211A1 (en) 2004-06-10

Family

ID=32468354

Family Applications (1)

Application Number Title Priority Date Filing Date
US10/313,830 Abandoned US20040108211A1 (en) 2002-12-06 2002-12-06 Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB)

Country Status (1)

Country Link
US (1) US20040108211A1 (en)

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040154930A1 (en) * 2003-02-12 2004-08-12 Furukawa Circuit Foil Co., Ltd. Copper foil for high frequency circuit and method of production of same
US20070032080A1 (en) * 2005-08-03 2007-02-08 Korea Institute Of Industrial Technology System and method for manufacturing flexible copper clad laminate film
CN102321889A (en) * 2011-01-18 2012-01-18 菏泽广源铜带股份有限公司 Degreasing and cleaning method for rolled copper foils
CN103160867A (en) * 2013-03-11 2013-06-19 福建清景铜箔有限公司 Copper foil production conjoint machine and high-bonding strength copper foil technology for lithium ion battery
CN104099652A (en) * 2014-07-09 2014-10-15 山东金宝电子股份有限公司 Surface treatment roughening process for electronic copper foils
CN104294352A (en) * 2014-10-09 2015-01-21 国网重庆市电力公司电力科学研究院 Coating pretreatment method of heavy anti-corrosive coating for workpiece
CN104562119A (en) * 2015-01-08 2015-04-29 河南红日铜箔科技有限公司 Multi-section non-arsenic roughening treatment method for electrolytic copper foil
CN104862768A (en) * 2015-05-27 2015-08-26 广州杰赛科技股份有限公司 Electroplating method and device of circuit boards
EP3067199A1 (en) * 2013-11-08 2016-09-14 Iljin Materials Co., Ltd. Electrodeposited copper, and electrical component and battery comprising same
CN107245735A (en) * 2017-05-26 2017-10-13 东强(连州)铜箔有限公司 The plating solution and preparation method of a kind of high drug-resistance and heat resistance alloy copper foil
US20190145014A1 (en) * 2017-11-15 2019-05-16 Industrial Technology Research Institute Copper foil for high frequency circuit and method for manufacturing the same
CN110359069A (en) * 2019-07-16 2019-10-22 吉林大学 A kind of more metal mixed increasing material manufacturing device and methods of liquid phase
CN110952117A (en) * 2018-09-27 2020-04-03 金居开发股份有限公司 Micro-rough electrolytic copper foil and copper foil substrate
US11053602B2 (en) 2018-09-17 2021-07-06 Co-Tech Development Corp. Micro-roughened electrodeposited copper foil and copper foil substrate
CN115066103A (en) * 2022-06-30 2022-09-16 刘芝兰 LED circuit board circuit etching equipment and method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3691027A (en) * 1970-06-16 1972-09-12 Allied Chem Method of producing corrosion resistant chromium plated articles
US5431803A (en) * 1990-05-30 1995-07-11 Gould Electronics Inc. Electrodeposited copper foil and process for making same
US5792333A (en) * 1994-10-06 1998-08-11 Circuit Foil Japan Co., Ltd. Method of surface-roughening treatment of copper foil
US5800930A (en) * 1994-01-21 1998-09-01 Olin Corporation Nodular copper/nickel alloy treatment for copper foil
US5908544A (en) * 1997-09-04 1999-06-01 Gould Electronics, Inc. Zinc-chromium stabilizer containing a hydrogen inhibiting additive

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3691027A (en) * 1970-06-16 1972-09-12 Allied Chem Method of producing corrosion resistant chromium plated articles
US5431803A (en) * 1990-05-30 1995-07-11 Gould Electronics Inc. Electrodeposited copper foil and process for making same
US5800930A (en) * 1994-01-21 1998-09-01 Olin Corporation Nodular copper/nickel alloy treatment for copper foil
US5792333A (en) * 1994-10-06 1998-08-11 Circuit Foil Japan Co., Ltd. Method of surface-roughening treatment of copper foil
US5908544A (en) * 1997-09-04 1999-06-01 Gould Electronics, Inc. Zinc-chromium stabilizer containing a hydrogen inhibiting additive

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040154930A1 (en) * 2003-02-12 2004-08-12 Furukawa Circuit Foil Co., Ltd. Copper foil for high frequency circuit and method of production of same
US20070032080A1 (en) * 2005-08-03 2007-02-08 Korea Institute Of Industrial Technology System and method for manufacturing flexible copper clad laminate film
US7678242B2 (en) 2005-08-03 2010-03-16 Korea Institute Of Industrial Technology System and method for manufacturing flexible copper clad laminate film
CN102321889A (en) * 2011-01-18 2012-01-18 菏泽广源铜带股份有限公司 Degreasing and cleaning method for rolled copper foils
CN103160867A (en) * 2013-03-11 2013-06-19 福建清景铜箔有限公司 Copper foil production conjoint machine and high-bonding strength copper foil technology for lithium ion battery
CN103160867B (en) * 2013-03-11 2016-04-06 福建清景铜箔有限公司 Copper Foil produces integrated machine and lithium ion battery high bond strength Copper Foil technique thereof
EP3067199A4 (en) * 2013-11-08 2017-05-10 Iljin Materials Co., Ltd. Electrodeposited copper, and electrical component and battery comprising same
EP3067199A1 (en) * 2013-11-08 2016-09-14 Iljin Materials Co., Ltd. Electrodeposited copper, and electrical component and battery comprising same
CN104099652A (en) * 2014-07-09 2014-10-15 山东金宝电子股份有限公司 Surface treatment roughening process for electronic copper foils
CN104294352A (en) * 2014-10-09 2015-01-21 国网重庆市电力公司电力科学研究院 Coating pretreatment method of heavy anti-corrosive coating for workpiece
CN104562119A (en) * 2015-01-08 2015-04-29 河南红日铜箔科技有限公司 Multi-section non-arsenic roughening treatment method for electrolytic copper foil
CN104862768A (en) * 2015-05-27 2015-08-26 广州杰赛科技股份有限公司 Electroplating method and device of circuit boards
CN107245735A (en) * 2017-05-26 2017-10-13 东强(连州)铜箔有限公司 The plating solution and preparation method of a kind of high drug-resistance and heat resistance alloy copper foil
US20190145014A1 (en) * 2017-11-15 2019-05-16 Industrial Technology Research Institute Copper foil for high frequency circuit and method for manufacturing the same
US20200332428A1 (en) * 2017-11-15 2020-10-22 Industrial Technology Research Institute Method for manufacturing copper foil for high frequency circuit
US11053602B2 (en) 2018-09-17 2021-07-06 Co-Tech Development Corp. Micro-roughened electrodeposited copper foil and copper foil substrate
CN110952117A (en) * 2018-09-27 2020-04-03 金居开发股份有限公司 Micro-rough electrolytic copper foil and copper foil substrate
CN110359069A (en) * 2019-07-16 2019-10-22 吉林大学 A kind of more metal mixed increasing material manufacturing device and methods of liquid phase
CN115066103A (en) * 2022-06-30 2022-09-16 刘芝兰 LED circuit board circuit etching equipment and method

Similar Documents

Publication Publication Date Title
KR100407732B1 (en) Composite foil containing nodular copper / nickel alloy coating, printed circuit board containing it and method of electrodeposition of nodular copper / nickel alloy coating
EP2544282A1 (en) Surface treatment method for copper foil, surface treated copper foil and copper foil for negative electrode collector of lithium ion secondary battery
US20040108211A1 (en) Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB)
US6777108B1 (en) Electrolytic copper foil with carrier foil and method for manufacturing the same and copper-clad laminate using the electrolytic copper foil with carrier foil
WO1987005182A1 (en) Method of producing conductor circuit boards
JPH07233497A (en) Non-cyan copper-zinc electroplating bath, surface treatment of copper foil for printed circuit board using the bath, and the copper foil for printed circuit board
JP2005076091A (en) Method of producing ultrathin copper foil with carrier, and ultrathin copper foil with carrier produced by the production method
JPS6255714B2 (en)
US5762778A (en) Non-cyanide brass plating bath and a method of making metallic foil having a brass layer using the non-cyanide brass plating bath
CN110344105B (en) Double-sided surface treatment method of rolled copper foil
US4961828A (en) Treatment of metal foil
JPH1018075A (en) Electrolytic copper foil
JP2975275B2 (en) Copper foil surface treatment method for printed circuit by submerged current collection method
JPH0441696A (en) Surface treatment of copper foil for printed circuit
US4551210A (en) Dendritic treatment of metallic surfaces for improving adhesive bonding
WO2001034880A1 (en) Electrolytic copper foil with carrier foil and method for manufacturing the same
JPH052744B2 (en)
EP0250195A2 (en) Double matte finish copper foil
JP2005288856A (en) Electrolytic copper foil with carrier foil and method for manufacturing the same and copper-clad laminated sheet using electrolytic copper foil with carrier foil
US4549941A (en) Electrochemical surface preparation for improving the adhesive properties of metallic surfaces
CN114086227B (en) Surface treatment process for improving peel strength of low-profile electrolytic copper foil
US4552627A (en) Preparation for improving the adhesion properties of metal foils
KR102323903B1 (en) Copper Foil Capable of Improving Dimension Stability of Flexible Printed Circuit Board, Method for Manufacturing The Same, and Flexible Copper Clad Laminate Comprising The Same
TW202221169A (en) Roughened copper foil, copper-clad laminate, and printed wiring board
KR20110050751A (en) Peel strength enhancement of copper laminates

Legal Events

Date Code Title Description
AS Assignment

Owner name: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, CHINA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:CHIU, CHIU-YEN;OUNG, JUNG-CHOU;LIU, JIN-YAW;REEL/FRAME:013558/0058

Effective date: 20021101

AS Assignment

Owner name: TAI HSIN COPPER & ALUMINA TECHNOLOGIES CO., LTD.,

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;REEL/FRAME:016009/0904

Effective date: 20050203

Owner name: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;REEL/FRAME:016009/0904

Effective date: 20050203

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION