US20040108211A1 - Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) - Google Patents
Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) Download PDFInfo
- Publication number
- US20040108211A1 US20040108211A1 US10/313,830 US31383002A US2004108211A1 US 20040108211 A1 US20040108211 A1 US 20040108211A1 US 31383002 A US31383002 A US 31383002A US 2004108211 A1 US2004108211 A1 US 2004108211A1
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- US
- United States
- Prior art keywords
- copper foil
- surface treatment
- concentration
- solution
- current density
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 180
- 239000011889 copper foil Substances 0.000 title claims abstract description 165
- 238000004381 surface treatment Methods 0.000 title claims abstract description 24
- 238000000034 method Methods 0.000 claims abstract description 40
- 230000004888 barrier function Effects 0.000 claims abstract description 23
- 238000005530 etching Methods 0.000 claims abstract description 21
- 238000005238 degreasing Methods 0.000 claims abstract description 13
- 239000006087 Silane Coupling Agent Substances 0.000 claims abstract description 12
- 238000009713 electroplating Methods 0.000 claims abstract description 11
- 239000002253 acid Substances 0.000 claims abstract description 9
- 238000000576 coating method Methods 0.000 claims abstract description 6
- 229910007567 Zn-Ni Inorganic materials 0.000 claims abstract description 5
- 229910007614 Zn—Ni Inorganic materials 0.000 claims abstract description 5
- 239000011248 coating agent Substances 0.000 claims abstract description 4
- 238000007747 plating Methods 0.000 claims description 40
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 36
- 239000000654 additive Substances 0.000 claims description 10
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 claims description 10
- PMZURENOXWZQFD-UHFFFAOYSA-L Sodium Sulfate Chemical compound [Na+].[Na+].[O-]S([O-])(=O)=O PMZURENOXWZQFD-UHFFFAOYSA-L 0.000 claims description 9
- 229910052938 sodium sulfate Inorganic materials 0.000 claims description 9
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 claims description 8
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 claims description 7
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims description 7
- 229910001431 copper ion Inorganic materials 0.000 claims description 7
- 229910000077 silane Inorganic materials 0.000 claims description 7
- 230000000996 additive effect Effects 0.000 claims description 6
- 239000013527 degreasing agent Substances 0.000 claims description 6
- 238000005237 degreasing agent Methods 0.000 claims description 6
- 238000005507 spraying Methods 0.000 claims description 6
- 239000004327 boric acid Substances 0.000 claims description 5
- 239000003795 chemical substances by application Substances 0.000 claims description 4
- 235000011152 sodium sulphate Nutrition 0.000 claims description 4
- CHQVQXZFZHACQQ-UHFFFAOYSA-M benzyl(triethyl)azanium;bromide Chemical compound [Br-].CC[N+](CC)(CC)CC1=CC=CC=C1 CHQVQXZFZHACQQ-UHFFFAOYSA-M 0.000 claims description 2
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 claims description 2
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 claims description 2
- CVHZOJJKTDOEJC-UHFFFAOYSA-N saccharin Chemical compound C1=CC=C2C(=O)NS(=O)(=O)C2=C1 CVHZOJJKTDOEJC-UHFFFAOYSA-N 0.000 claims description 2
- 230000003647 oxidation Effects 0.000 abstract description 2
- 238000007254 oxidation reaction Methods 0.000 abstract description 2
- 239000011888 foil Substances 0.000 abstract 2
- 239000000243 solution Substances 0.000 description 48
- 239000011701 zinc Substances 0.000 description 14
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- 239000010949 copper Substances 0.000 description 10
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 10
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 8
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 239000007832 Na2SO4 Substances 0.000 description 5
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 229960003280 cupric chloride Drugs 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- 238000007719 peel strength test Methods 0.000 description 5
- 230000003064 anti-oxidating effect Effects 0.000 description 4
- 239000008367 deionised water Substances 0.000 description 4
- 229910021641 deionized water Inorganic materials 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- 239000003792 electrolyte Substances 0.000 description 3
- 239000008151 electrolyte solution Substances 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 2
- 238000001035 drying Methods 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 1
- -1 Co+2 ions Chemical class 0.000 description 1
- PTFCDOFLOPIGGS-UHFFFAOYSA-N Zinc dication Chemical compound [Zn+2] PTFCDOFLOPIGGS-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000000866 electrolytic etching Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 229910052914 metal silicate Inorganic materials 0.000 description 1
- 239000011859 microparticle Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
- C25D5/14—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/565—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of zinc
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/028—Electroplating of selected surface areas one side electroplating, e.g. substrate conveyed in a bath with inhibited background plating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/34—Pretreatment of metallic surfaces to be electroplated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25F—PROCESSES FOR THE ELECTROLYTIC REMOVAL OF MATERIALS FROM OBJECTS; APPARATUS THEREFOR
- C25F1/00—Electrolytic cleaning, degreasing, pickling or descaling
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/384—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0307—Providing micro- or nanometer scale roughness on a metal surface, e.g. by plating of nodules or dendrites
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/03—Metal processing
- H05K2203/0392—Pretreatment of metal, e.g. before finish plating, etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/07—Treatments involving liquids, e.g. plating, rinsing
- H05K2203/0703—Plating
- H05K2203/0723—Electroplating, e.g. finish plating
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/14—Related to the order of processing steps
- H05K2203/1476—Same or similar kind of process performed in phases, e.g. coarse patterning followed by fine patterning
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/06—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process
- H05K3/07—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed chemically or electrolytically, e.g. by photo-etch process being removed electrolytically
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/383—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by microetching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/389—Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
Definitions
- the present invention relates to a surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB), and more particularly to a surface treatment that makes the copper foil with low profile and high peel strength.
- FPCB flexible printed circuit board
- the copper foil Before wrought copper foil for use on a flexible PCB, the copper foil has to be degreased, acid-etched and, nodularized and plating with barrier layer, anti-tarnish layer and coating with a silane coupling agent to satisfy the necessary characteristics to the copper foil for use with a flexible PCB.
- the copper foil When treating the copper foil so it can be laminated with a PI (polyimide) film for flexible PCB, the copper foil must have the following characteristics.
- the copper foil must have anti-oxidation and anti-wrinkling properties when the copper foil is stored or transported.
- the copper foil must have an anti-oxidation property, anti-eroding property with regard to chemical additives, non-breaking property and excellent bonding strength when the copper foil is laminatied with the PI film of the flexible PCB.
- the copper foil must have good etching and dielectric properties when the copper foil is etched.
- the copper foil must not generate pink ring during thermal shock when soft welding and drilling holes on the flexible PCB.
- the copper foil has a roughened side and a glossy side.
- the roughened side is laminated with the PI film, and the glossy side is exposed to the photoresist. Therefore, the roughened side and the glossy side must have different characteristics.
- the surface can have no oxidation or surface defects after laminating the copper foil and the PCB and etching the copper foil. Moreover, the surface can have no residual dust on the surface of the copper foil after etching.
- the glossy side cannot be oxidized when the copper foil and the PI film are laminated, and the glossy side must combine well with the photoresist, and the shining side must have good solderability.
- the roughened side of the copper foil has to be nodularuzated before being laminated with the PI film to impart the peel strength.
- the copper foil has to be treated by plating fine copper particles to the surface.
- barrier layer must be plated to prevent erosion by the resin during the laminating process.
- the copper foil must contact the electrode so achieving the copper foil characteristics previously mentioned is difficult.
- the electrochemical acid etching process takes a long time and causes too many copper ions to accumulate in the etching solution. Additionally, other conventional surface treatment procedures make the copper foil excessively rough and easily torn.
- the present invention provides a surface treatment for a wrought copper foil for use on a flexible PCB to mitigate or obviate the aforementioned problems.
- the main objective of the invention is to provide a surface treatment for a wrought copper foil for a flexible PCB, which makes the copper foil have a very low surface roughness, excellent peel strength, heat resistance and resistance for the hydrochloric acid.
- the copper foil possesses excellent characteristics for a copper foil adapted to laminate with PI film for a flexible PCB.
- FIG. 1 is a block diagram of a surface treatment for a wrought copper foil for use on a flexible PCB in accordance with the present invention
- FIG. 2 is a schematic diagram depicting the surface treatment for a copper foil in FIG. 1;
- FIG. 3 is a schematic diagram of the bi-polar electrochemical degreasing process in FIG. 1;
- FIG. 4 is a schematic diagram of the bi-polar electrochemical acid etching process in FIG. 1;
- FIG. 5 is a schematic diagram of the two-stage electrochemical nodularization process in FIG. 1;
- FIG. 6 is a schematic diagram of the barrier layer electroplating process in FIG. 1 ;
- FIG. 7 is a schematic diagram of the anti-tarnish layer electroplating process in FIG. 1;
- FIG. 8 is a schematic diagram of the silane coupling agent coating process in FIG. 1.
- a surface treatment for a wrought copper foil for use on a flexible PCB comprises the steps of bi-polar electrochemical degreasing, acid etching and nodularization, electroplating a barrier layer and an anti-tarnish layer and coating with silane coupling agent g an organic silane layer.
- copper foil is drawn off from a source roll ( 12 ) by a drive roll ( 16 ), passes between another drive roll ( 16 ) and a squeegee rool ( 15 ) and is fed to an electro-cleaning tank to perform the bi-polar electrochemical degreasing of the copper foil.
- the bi-polar electrochemical degreasing is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source ( 23 ).
- Each electrode is a pair of stainless steel sheets ( 20 ).
- the copper foil passes between the two stainless steel sheets ( 20 ) of the positive charge at the current inlet, around a sinking roll ( 14 ) and between the two stainless steel sheets ( 20 ) of the negative charge at the current outlet.
- the bi-polar electrochemical degreasing process utilizes a cleaning solution containing sodium hydroxide, an alkaline metal carbonate, an alkaline metal silicate as the electrolyte.
- the current density in the range from about 1 ⁇ 5 A/dm 2 for about 10 ⁇ 40 seconds at a temperature of from about 50 ⁇ 80° C.
- the advantages of using the bi-polar degreasing process are that the copper foil does not contact with the conductive roll and particle is not deposited on the copper foil at the current outlet because the copper foil at the current outlet is anode.
- a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee excess solution from the copper foil before rinsing the copper foil twice with hot water in a rinsing tank ( 10 ).
- the copper foil passes between a drive roll ( 16 ) and a squeegee roll ( 15 ) and is fed to an etching tank to perform the bi-polar electrochemical etching of the copper foil.
- the bi-polar electrochemical etching is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source ( 23 ).
- the bi-polar electrochemical acid etching is performed by passing the copper foil between two pairs of electrodes in a sulfuric acid solution. The electrodes in each pair are Pt/Ti sheets ( 21 ) and are oppositely charged.
- the copper foil passes through the sulfuric acid solution between the first pair of Pt/Ti sheets ( 21 ) of negative charge at the current inlet, around a sinking roll ( 14 ) and between the second pair of Pt/Ti sheets ( 21 ) of positive charge at the current outlet.
- the electro-etching utilizes a solution contain sulfuric acid and copper ions.
- the sulfuric acid is present in an amount from about 30 ⁇ 90 g/L.
- DC current source ( 23 ) maintains a current density in the range from about 2 ⁇ 10 A/dm 2 for about 5 ⁇ 20 seconds at a temperature of from about 30 ⁇ 60° C.
- the copper foil does not contact other copper foil and copper ions do not accumulate on the copper foil in the etching solution.
- the copper foil is squeezed between a drive roll ( 16 ) and a squeegee roll ( 15 ) before being cleaned with deionized water in a rinsing tank ( 10 ).
- the nodularization process is performed by passing the copper foil through a first nodularization tank and a second nodularization tank containing an electrolytic solution.
- the copper foil is connected to a negative electrode of a DC power source ( 23 ) through a conductive roll ( 17 ).
- the copper foil passes through the electrolytic solution in close proximity to a positively charged electrode ( 22 ), around sinking roll ( 14 ) and out of the tank between a drive roll ( 16 ) and a squeegee roll ( 15 ).
- the copper foil is nodularized by DC plating with high-density current to nucleate copper micro-particles on the surface of the copper foil facing the positive electrode.
- the nodularization process utilizes a solution sulfuric acid, copper ions and additives.
- the tank is carried out in an electrolytic solution containing 50 ⁇ 150 g/L sulfuric acid, 5 ⁇ 20 g/L copper ions and additives.
- the copper foil is a cathode and the DSA (Dimension Stable Anode) becomes an anode.
- the current density in a range from about 60 ⁇ 150 A/dm 2 for from 1 ⁇ 3 seconds at a temperature of from about 20 ⁇ 40° C.
- the copper foil is also connected to the negative electrode of a DC power source ( 23 ) through another conductive roll ( 17 ) and passes in close proximity to a positive charged electrode ( 22 ) in the second nodularization tank, around a sinking roll ( 14 ), out of the tank between a drive roll ( 16 ) and a squeegee roll ( 15 ) and through a rinsing tank ( 10 ).
- the copper foil is nodularized by direct current plating and treated with low-density current to growth the copper nodular on the surface of the copper foil.
- the nodularization process in the second nodularization tank is carried out in the same solution in the first phase.
- the current density in a range from about 10 ⁇ 60 A/dm 2 for from 4 ⁇ 10 seconds at a temperature of from about 20 ⁇ 40° C.
- additives containing As +5 , As +3 , Ni +2 , W +6 , NO 3 ⁇ , Co +2 ions are added to the plating solution to inhibit the copper deposition.
- the additive is present in the plating solution in the range from about 0.2 ⁇ 2.0 g/L, and preferably from about 0.5 ⁇ 1.5 g/L of As +5 .
- a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee residual solution from the copper foil, and the copper foil is further cleaned with deionized water in a rinsing tank ( 10 ).
- the Zn—Ni barrier layer is applied to the copper foil utilizes a solution containing the zone ion, nickel, boric acid, sodium sulfate as the electrolyte in the tank.
- the copper foil is channeled into the g tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an inlet and leaves the tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an outlet.
- the copper foil is connected to negative electrodes of three DC current sources ( 23 ) that are connected to the two conductive roll ( 17 ) at the inlet and the outlet of the tank.
- the copper foil passes between two positively charged Pt/Ti electrodes ( 21 ) at the inlet, around a sinking roll ( 14 ) and in close proximity to another positively charged Pt/Ti electrode ( 21 ) at the outlet. Because the copper foil is negatively charged in the tank, a barrier layer is directly plated on the copper foil.
- the barrier layer plating process is carried out in a 20 ⁇ 100 g/L boric acid solution containing 0.25 ⁇ 2.0 g/L Ni ions and 0.5 ⁇ 5.0 g/L Zn ions.
- the current density in the range from about 0.5 ⁇ 2.0 A/dm 2 for from 2 ⁇ 10 seconds at a temperature of from about 30 ⁇ 60° C.
- An additive selected from saccharine or benzyl tri-ethyl ammonium bromide is added to the solution in a range from about 50 ⁇ 300 ppm.
- the pH of the plating solution is maintained at a range from about 4.0 ⁇ 6.0.
- an Cr—Zn anti-tarnish layer is applied to the copper foil utilizes a solution contating chromic acid, zinc ion, sodium sulfate as the electrolyte in the tank.
- the copper foil is channeled into the tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an inlet and leaves the plating tank between a conductive roll ( 17 ) and a squeegee roll ( 15 ) at an outlet.
- the copper foil is connected to negative electrodes of two DC current sources ( 23 ) that are connected to the conductive roll ( 17 ) at inlet of the anti-tarnish layer plating tank.
- the copper foil passes between two positively charged Pt/Ti electrodes ( 21 ) at the inlet, around a sinking roll ( 14 ) and out of the tank. Because the copper foil is negatively charged in the tank, an anti-tarnish layer is directly plated on the copper foil.
- the anti-tarnish layer plating process is carried out in a 2 ⁇ 20 g/L sodium sulfate solution containing 0.2 ⁇ 2.0 g/L Zn ions and 0.5 ⁇ 5.0 g/L Cr acid.
- the current density in the range from about 0.5 ⁇ 5.0 A/dm 2 for from 2 ⁇ 10 seconds at a temperature of from about 30 ⁇ 60° C.
- a drive roll ( 16 ) and a squeegee roll ( 15 ) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank ( 10 ).
- the roughened surface is coated with a silane coupling agent to form a thin film on the copper foil in a tank.
- the copper foil is fed through the tank around a sinking roll ( 14 ), between a drive roll ( 16 ) and a squeegee roll ( 15 ) to a drying oven ( 11 ).
- the tank holds a solution containing 0.2 ⁇ 2.0% 3-glycidoxypropyl trimethoxy silane to coat the silane coupling agent on the copper foil. Only the roughened side of the copper foil is coated with the silane coupling agent.
- the copper foil leaves the tank, and a drive rool ( 16 ) and a squeegee roll ( 15 ) squeegee excess silane coupling agent from the copper foil before the copper foil is dried in the drying oven ( 11 ). Finally, the treated copper foil is rolled onto a copper roll ( 13 ).
- 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
- the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities.
- the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density between the electrodes of 131 A/dm 2 for 1.0 sec.
- the second nodularization plating stage was performed with a current density of 20A/dm 2 for 5 sec.
- the roughened side of the copper foil was coated with a barrier layer by electroplating.
- the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density of 0.75 A/dm 2 for 10 sec.
- the current density on the glossy side of the copper foil was plated with current density of 0.2 A/dm 2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
- silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2A/dm 2 for 10 sec.
- the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
- the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 131 A/dm 2 for 1.0 sec.
- the second nodularization plating stage was performed with a current density of 20 A/dm 2 for 5 sec.
- the roughened side of the copper foil was coated with a barrier layer by electroplating.
- the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm 2 for 10 sec.;
- the current density on the glossy side of the copper foil was plated with a current of 0.2 A/dm 2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 1.8 A/dm 2 for 5 sec.
- a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of 10% base degreasing agent at 70° C. with a current density of 2A/dm 2 for 10 sec.
- the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm 2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities.
- the first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration an 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
- the second nodularization plating stage was performed with a current density of 20 A/dm 2 for 5 sec.
- the roughened side of the copper foil was coated with a barrier layer by electroplating.
- the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm 2 for 10 sec.
- the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
- a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
- the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 3 A/dm 2 for 10 sec.
- One side of the copper foil was roughened in two plating stages having different current densities.
- the first nodularization stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
- the second nodularization plating stage was performed with a current density of 20 A/dm 2 for was 5 sec.
- the roughened side of the copper foil was coated with a barrier layer by electroplating.
- the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm 2 for 10 sec.
- the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
- a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 ⁇ m thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm 2 for 10 sec.
- the copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2.2 A/dm 2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities.
- the first nodularization lating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As +5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm 2 for 1.5 sec.
- the second nodularization plating stage was performed with a current density 20 A/dm 2 for 5 sec.
- the roughened side of the copper foil was coated with barrier layer by electroplating.
- the barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H 3 BO 3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm 2 for 10 sec.
- the current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm 2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO 3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na 2 SO 4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm 2 for 5 sec.
- a silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- the surface treatment for a wrought copper foil for use on a flexible printed circuit board (PCB) as previously described has the numerous advantages over conventional procedures.
- the degreasing, etching, nodularization and barrier layer and anti-oxidation layer plating steps in the process all have significant advantages.
- the degreasing and etching processes are carried out using bi-polar techniques.
- the copper foil does not contact the roller. Copper ions do not accumulate on the copper foil during etching processes.
- the barrier layer plating process uses Zn—Ni type boric acid as a plating agent. Therefore, the pH is easily maintained, and the copper foil is easily cleaned with water.
- the anti-tarnish layer plating process uses Cr—Zn type as a plating agent. The surface roughness is reduced, and the peel strength is increased. Furthermore, the HCl undercut of the treated copper foil was less than 5%, the thermal age was less than 30% and HTO at least 1 hr at 250° C. Therefore, the copper foil treated with the surface treatment procedure of the present invention has excellent physical properties to meet the requirements for producing a flexible PCB.
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Abstract
Description
- 1. Field of the Invention
- The present invention relates to a surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB), and more particularly to a surface treatment that makes the copper foil with low profile and high peel strength.
- 2. Description of Related Art
- Before wrought copper foil for use on a flexible PCB, the copper foil has to be degreased, acid-etched and, nodularized and plating with barrier layer, anti-tarnish layer and coating with a silane coupling agent to satisfy the necessary characteristics to the copper foil for use with a flexible PCB. When treating the copper foil so it can be laminated with a PI (polyimide) film for flexible PCB, the copper foil must have the following characteristics.
- (1) The copper foil must have anti-oxidation and anti-wrinkling properties when the copper foil is stored or transported.
- (2) The copper foil must have an anti-oxidation property, anti-eroding property with regard to chemical additives, non-breaking property and excellent bonding strength when the copper foil is laminatied with the PI film of the flexible PCB.
- (3) The copper foil must have good etching and dielectric properties when the copper foil is etched.
- (4) The copper foil must combine well with the photoresist during the exposure process and be easily cleaned by washing. Additionally, the etched lines on the copper foil cannot be eroded by hydrochloric acid.
- (5) The copper foil must not generate pink ring during thermal shock when soft welding and drilling holes on the flexible PCB.
- The copper foil has a roughened side and a glossy side. The roughened side is laminated with the PI film, and the glossy side is exposed to the photoresist. Therefore, the roughened side and the glossy side must have different characteristics.
- (1) With regards to the roughened side: the surface can have no oxidation or surface defects after laminating the copper foil and the PCB and etching the copper foil. Moreover, the surface can have no residual dust on the surface of the copper foil after etching.
- (2) With regards to the glossy side: the glossy side cannot be oxidized when the copper foil and the PI film are laminated, and the glossy side must combine well with the photoresist, and the shining side must have good solderability.
- The largest difference between the characteristics of the roughened side and the glossy side is that the roughened side of the copper foil has to be nodularuzated before being laminated with the PI film to impart the peel strength. In the nodularization process, the copper foil has to be treated by plating fine copper particles to the surface. Additionally, barrier layer must be plated to prevent erosion by the resin during the laminating process.
- With regard to a conventional electrochemical degreasing process, the copper foil must contact the electrode so achieving the copper foil characteristics previously mentioned is difficult. The electrochemical acid etching process takes a long time and causes too many copper ions to accumulate in the etching solution. Additionally, other conventional surface treatment procedures make the copper foil excessively rough and easily torn.
- To overcome the shortcomings, the present invention provides a surface treatment for a wrought copper foil for use on a flexible PCB to mitigate or obviate the aforementioned problems.
- The main objective of the invention is to provide a surface treatment for a wrought copper foil for a flexible PCB, which makes the copper foil have a very low surface roughness, excellent peel strength, heat resistance and resistance for the hydrochloric acid. In other words, the copper foil possesses excellent characteristics for a copper foil adapted to laminate with PI film for a flexible PCB.
- Objectives, advantages and novel features of the invention will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings.
- FIG. 1 is a block diagram of a surface treatment for a wrought copper foil for use on a flexible PCB in accordance with the present invention;
- FIG. 2 is a schematic diagram depicting the surface treatment for a copper foil in FIG. 1;
- FIG. 3 is a schematic diagram of the bi-polar electrochemical degreasing process in FIG. 1;
- FIG. 4 is a schematic diagram of the bi-polar electrochemical acid etching process in FIG. 1;
- FIG. 5 is a schematic diagram of the two-stage electrochemical nodularization process in FIG. 1;
- FIG. 6 is a schematic diagram of the barrier layer electroplating process in FIG.1;
- FIG. 7 is a schematic diagram of the anti-tarnish layer electroplating process in FIG. 1; and
- FIG. 8 is a schematic diagram of the silane coupling agent coating process in FIG. 1.
- With reference to FIGS. 1 and 2, a surface treatment for a wrought copper foil for use on a flexible PCB comprises the steps of bi-polar electrochemical degreasing, acid etching and nodularization, electroplating a barrier layer and an anti-tarnish layer and coating with silane coupling agent g an organic silane layer.
- With further reference to FIG. 3, copper foil is drawn off from a source roll (12) by a drive roll (16), passes between another drive roll (16) and a squeegee rool (15) and is fed to an electro-cleaning tank to perform the bi-polar electrochemical degreasing of the copper foil. The bi-polar electrochemical degreasing is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source (23). Each electrode is a pair of stainless steel sheets (20). The copper foil passes between the two stainless steel sheets (20) of the positive charge at the current inlet, around a sinking roll (14) and between the two stainless steel sheets (20) of the negative charge at the current outlet. The bi-polar electrochemical degreasing process utilizes a cleaning solution containing sodium hydroxide, an alkaline metal carbonate, an alkaline metal silicate as the electrolyte. The current density in the range from about 1˜5 A/dm2 for about 10˜40 seconds at a temperature of from about 50˜80° C. The advantages of using the bi-polar degreasing process are that the copper foil does not contact with the conductive roll and particle is not deposited on the copper foil at the current outlet because the copper foil at the current outlet is anode. After the copper foil leaves the electro-cleaning tank, a drive roll (16) and a squeegee roll (15) squeegee excess solution from the copper foil before rinsing the copper foil twice with hot water in a rinsing tank (10).
- With further reference to FIG. 4, the copper foil passes between a drive roll (16) and a squeegee roll (15) and is fed to an etching tank to perform the bi-polar electrochemical etching of the copper foil. The bi-polar electrochemical etching is performed with two electrodes respectively at the current inlet and the current outlet with DC power provided from a controllable DC power source (23). The bi-polar electrochemical acid etching is performed by passing the copper foil between two pairs of electrodes in a sulfuric acid solution. The electrodes in each pair are Pt/Ti sheets (21) and are oppositely charged. The copper foil passes through the sulfuric acid solution between the first pair of Pt/Ti sheets (21) of negative charge at the current inlet, around a sinking roll (14) and between the second pair of Pt/Ti sheets (21) of positive charge at the current outlet. The electro-etching utilizes a solution contain sulfuric acid and copper ions. The sulfuric acid is present in an amount from about 30˜90 g/L. DC current source (23) maintains a current density in the range from about 2˜10 A/dm2 for about 5˜20 seconds at a temperature of from about 30˜60° C. The advantages of using the bi-polar electrochemical etching process are that the copper foil does not contact other copper foil and copper ions do not accumulate on the copper foil in the etching solution. After passing between the second pair of the Pt/Ti sheets (21) and out of the etching tank, the copper foil is squeezed between a drive roll (16) and a squeegee roll (15) before being cleaned with deionized water in a rinsing tank (10).
- With reference to FIG. 5, the nodularization process is performed by passing the copper foil through a first nodularization tank and a second nodularization tank containing an electrolytic solution. In the first nodularization tank, the copper foil is connected to a negative electrode of a DC power source (23) through a conductive roll (17). The copper foil passes through the electrolytic solution in close proximity to a positively charged electrode (22), around sinking roll (14) and out of the tank between a drive roll (16) and a squeegee roll (15). In the first tank, the copper foil is nodularized by DC plating with high-density current to nucleate copper micro-particles on the surface of the copper foil facing the positive electrode. The nodularization process utilizes a solution sulfuric acid, copper ions and additives. The tank is carried out in an electrolytic solution containing 50˜150 g/L sulfuric acid, 5˜20 g/L copper ions and additives. The copper foil is a cathode and the DSA (Dimension Stable Anode) becomes an anode. The current density in a range from about 60˜150 A/dm2 for from 1˜3 seconds at a temperature of from about 20˜40° C. When the copper foil leaves the first nodularization tank, residual solution is squeezed from the copper foil by a drive roll (16) and a squeegee roll (15) and passes through a rinsing tank (10) before moving into a second nodularization tank.
- In the second nodularization tank, the copper foil is also connected to the negative electrode of a DC power source (23) through another conductive roll (17) and passes in close proximity to a positive charged electrode (22) in the second nodularization tank, around a sinking roll (14), out of the tank between a drive roll (16) and a squeegee roll (15) and through a rinsing tank (10). In the second nodularization tank, the copper foil is nodularized by direct current plating and treated with low-density current to growth the copper nodular on the surface of the copper foil. The nodularization process in the second nodularization tank is carried out in the same solution in the first phase. The current density in a range from about 10˜60 A/dm2 for from 4˜10 seconds at a temperature of from about 20˜40° C. Additionally, additives containing As+5, As+3, Ni+2, W+6, NO3 −, Co+2 ions are added to the plating solution to inhibit the copper deposition. The additive is present in the plating solution in the range from about 0.2˜2.0 g/L, and preferably from about 0.5˜1.5 g/L of As+5. When the copper foil leaves the second nodularization tank, a drive roll (16) and a squeegee roll (15) squeegee residual solution from the copper foil, and the copper foil is further cleaned with deionized water in a rinsing tank (10).
- With reference to FIG. 6, the Zn—Ni barrier layer is applied to the copper foil utilizes a solution containing the zone ion, nickel, boric acid, sodium sulfate as the electrolyte in the tank. The copper foil is channeled into the g tank between a conductive roll (17) and a squeegee roll (15) at an inlet and leaves the tank between a conductive roll (17) and a squeegee roll (15) at an outlet. The copper foil is connected to negative electrodes of three DC current sources (23) that are connected to the two conductive roll (17) at the inlet and the outlet of the tank. In the plating solution in the Zn—Ni alloy plating tank, the copper foil passes between two positively charged Pt/Ti electrodes (21) at the inlet, around a sinking roll (14) and in close proximity to another positively charged Pt/Ti electrode (21) at the outlet. Because the copper foil is negatively charged in the tank, a barrier layer is directly plated on the copper foil. The barrier layer plating process is carried out in a 20˜100 g/L boric acid solution containing 0.25˜2.0 g/L Ni ions and 0.5˜5.0 g/L Zn ions. The current density in the range from about 0.5˜2.0 A/dm2 for from 2˜10 seconds at a temperature of from about 30˜60° C. An additive selected from saccharine or benzyl tri-ethyl ammonium bromide is added to the solution in a range from about 50˜300 ppm. The pH of the plating solution is maintained at a range from about 4.0˜6.0. When the copper foil leaves the tank, the conductive roll (17) and the squeegee roll (15) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank (10).
- With reference to FIG. 7, an Cr—Zn anti-tarnish layer is applied to the copper foil utilizes a solution contating chromic acid, zinc ion, sodium sulfate as the electrolyte in the tank. The copper foil is channeled into the tank between a conductive roll (17) and a squeegee roll (15) at an inlet and leaves the plating tank between a conductive roll (17) and a squeegee roll (15) at an outlet. The copper foil is connected to negative electrodes of two DC current sources (23) that are connected to the conductive roll (17) at inlet of the anti-tarnish layer plating tank. The copper foil passes between two positively charged Pt/Ti electrodes (21) at the inlet, around a sinking roll (14) and out of the tank. Because the copper foil is negatively charged in the tank, an anti-tarnish layer is directly plated on the copper foil. The anti-tarnish layer plating process is carried out in a 2˜20 g/L sodium sulfate solution containing 0.2˜2.0 g/L Zn ions and 0.5˜5.0 g/L Cr acid. The current density in the range from about 0.5˜5.0 A/dm2 for from 2˜10 seconds at a temperature of from about 30˜60° C. When the copper foil leaves the g tank, a drive roll (16) and a squeegee roll (15) squeegee residual solution from the copper foil before rinsing the copper foil with deionized water in a rinsing tank (10).
- With reference to FIG. 8, the roughened surface is coated with a silane coupling agent to form a thin film on the copper foil in a tank. The copper foil is fed through the tank around a sinking roll (14), between a drive roll (16) and a squeegee roll (15) to a drying oven (11). The tank holds a solution containing 0.2˜2.0% 3-glycidoxypropyl trimethoxy silane to coat the silane coupling agent on the copper foil. Only the roughened side of the copper foil is coated with the silane coupling agent. After the roughened side of the copper foil is coated with the silane coupling agent layer, the copper foil leaves the tank, and a drive rool (16) and a squeegee roll (15) squeegee excess silane coupling agent from the copper foil before the copper foil is dried in the drying oven (11). Finally, the treated copper foil is rolled onto a copper roll (13).
- Several examples of the surface treatment of a copper foil for a flexible PCB to illustrate different operational conditions used in the performance of the process follow.
- 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm2 for 10 sec.
- The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As+5 concentration of 1.45 g/L at 30° C. with a direct current density between the electrodes of 131 A/dm2 for 1.0 sec. The second nodularization plating stage was performed with a current density of 20A/dm2 for 5 sec.
- The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H3BO3 concentration of 40 g/L at 50° C. with a current density of 0.75 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with current density of 0.2 A/dm2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
- An silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2A/dm2 for 10 sec.
- The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm2 for 10 sec.
- One side of the copper foil was roughened in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As+5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 131 A/dm2 for 1.0 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for 5 sec.
- The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm2 for 10 sec.; The current density on the glossy side of the copper foil was plated with a current of 0.2 A/dm2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 1.8 A/dm2 for 5 sec.
- A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of 10% base degreasing agent at 70° C. with a current density of 2A/dm2 for 10 sec.
- The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2 A/dm2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization plating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As+5 concentration an 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for 5 sec.
- The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L a Ni concentration of 0.75 g/L and an H3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
- A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm2 for 10 sec.
- The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 3 A/dm2 for 10 sec.
- One side of the copper foil was roughened in two plating stages having different current densities. The first nodularization stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As+5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density of 20 A/dm2 for was 5 sec.
- The roughened side of the copper foil was coated with a barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.87 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
- A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- 35 μm thick wrought copper foil was electrochemically degreased using a bi-polar setup in a solution of a 10% base degreasing agent at 70° C. with a current density of 2 A/dm2 for 10 sec.
- The copper foil was then electrochemically etched using a bi-polar setup in a 45 g/L concentration of sulfuric acid at 45° C. with a current density of 2.2 A/dm2 for 10 sec.
- One side of the copper foil was nodularized in two plating stages having different current densities. The first nodularization lating stage was performed in a solution with a copper concentration of 14 g/L, a sulfuric acid concentration of 90 g/L and an As+5 concentration of 1.45 g/L at 30° C. with a direct current density at the inlet of 90 A/dm2 for 1.5 sec. The second nodularization plating stage was performed with a current density 20 A/dm2 for 5 sec.
- The roughened side of the copper foil was coated with barrier layer by electroplating. The barrier layer plating was performed in a solution with a Zn concentration of 2.0 g/L, a Ni concentration of 0.75 g/L and an H3BO3 concentration of 40 g/L at 50° C. with a current density at the inlet of 0.75 A/dm2 for 10 sec. The current density on the glossy side of the copper foil was plated with a current density of 0.2A/dm2 for 2.5 sec.
- An anti-tarnish layer was plated on both surfaces of the copper foil in a solution with a CrO3 concentration of 1.6 g/L, a Zn concentration of 0.5 g/L and a Na2SO4 concentration of 10 g/L at 35° C. with a current density of 2 A/dm2 for 5 sec.
- A silane coupling layer was coated to the roughened side of the copper foil by spraying with a 0.5% 3-glycidoxypropyl trimethoxy silane solution. Then FR-4 was laminated with copper foil. Finally, the laminated copper foil was etched with cupric chloride and subjected to a peel strength test.
- The results of the peel strength, HCl undercut, thermal age, and HTO test in the five examples are provided in the following table:
Ra Rz Rmax Peel (FR-4) Erosion Proportion Thermal-aged Number (μm) (μm) (μm) (kg/cm) to HCL*1 % Proportion*2 % Anti-oxidation Test*3 Example 1 0.2343 1.757 2.478 1.310 4.10 23.45 Pass Example 2 0.2087 1.524 1.934 1.346 1.23 26.37 Pass Example 3 0.2001 1.353 1.618 1.326 3.54 17.04 Pass Example 4 0.1997 1.321 1.552 1.314 4.87 23.30 Pass Example 5 0.2321 1.616 2.225 1.375 1.83 25.69 Pass - 1. Resistance to hydrochloric acid was given as deterioation rate (%) of peel strength of a 8 mill pitch circuit measured after immersion in 18% HCL for 1 hour.
- 2. Resistance to thermal deterioration was measured in terms of deterioration rate (%) of the peel strength after heating at 177° C. for 48 hours.
- 3. Testing conditions 270° C., 1 hr.
- The surface treatment for a wrought copper foil for use on a flexible printed circuit board (PCB) as previously described has the numerous advantages over conventional procedures. The degreasing, etching, nodularization and barrier layer and anti-oxidation layer plating steps in the process all have significant advantages.
- The degreasing and etching processes are carried out using bi-polar techniques. The copper foil does not contact the roller. Copper ions do not accumulate on the copper foil during etching processes.
- Carrying out the nodularization process in two plating stages respectively with different current densities prevents wrinkles from forming on the copper foil and enhances the uniformity of the copper foil. If a proper additive is used in the nodularization process, the surface roughness (Rz) is less than 2.3 μm, and the nodularization particles are controlled within 0.5˜0.8 μm. Additionally, the peel strength is larger than 1.3 kg/cm.
- The barrier layer plating process uses Zn—Ni type boric acid as a plating agent. Therefore, the pH is easily maintained, and the copper foil is easily cleaned with water. The anti-tarnish layer plating process uses Cr—Zn type as a plating agent. The surface roughness is reduced, and the peel strength is increased. Furthermore, the HCl undercut of the treated copper foil was less than 5%, the thermal age was less than 30% and HTO at least 1 hr at 250° C. Therefore, the copper foil treated with the surface treatment procedure of the present invention has excellent physical properties to meet the requirements for producing a flexible PCB.
- Even though numerous advantages of the present invention have been set forth in the foregoing description, the disclosure is illustrative only. Changes may be made in detail within the principles of the invention to the full extent indicated by the broad general meaning of the terms in which the appended claims are expressed.
Claims (9)
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US10/313,830 US20040108211A1 (en) | 2002-12-06 | 2002-12-06 | Surface treatment for a wrought copper foil for use on a flexible printed circuit board (FPCB) |
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US20040154930A1 (en) * | 2003-02-12 | 2004-08-12 | Furukawa Circuit Foil Co., Ltd. | Copper foil for high frequency circuit and method of production of same |
US20070032080A1 (en) * | 2005-08-03 | 2007-02-08 | Korea Institute Of Industrial Technology | System and method for manufacturing flexible copper clad laminate film |
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US20070032080A1 (en) * | 2005-08-03 | 2007-02-08 | Korea Institute Of Industrial Technology | System and method for manufacturing flexible copper clad laminate film |
US7678242B2 (en) | 2005-08-03 | 2010-03-16 | Korea Institute Of Industrial Technology | System and method for manufacturing flexible copper clad laminate film |
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EP3067199A4 (en) * | 2013-11-08 | 2017-05-10 | Iljin Materials Co., Ltd. | Electrodeposited copper, and electrical component and battery comprising same |
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US20200332428A1 (en) * | 2017-11-15 | 2020-10-22 | Industrial Technology Research Institute | Method for manufacturing copper foil for high frequency circuit |
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