US12235360B2 - Laser arrangement with optical filter - Google Patents
Laser arrangement with optical filter Download PDFInfo
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- US12235360B2 US12235360B2 US16/919,135 US202016919135A US12235360B2 US 12235360 B2 US12235360 B2 US 12235360B2 US 202016919135 A US202016919135 A US 202016919135A US 12235360 B2 US12235360 B2 US 12235360B2
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- 230000003287 optical effect Effects 0.000 title claims abstract description 252
- 238000002310 reflectometry Methods 0.000 claims abstract description 51
- 239000000758 substrate Substances 0.000 claims abstract description 40
- 238000005259 measurement Methods 0.000 claims abstract description 13
- 238000001514 detection method Methods 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 8
- 238000001914 filtration Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000002849 thermal shift Methods 0.000 claims description 4
- 230000004044 response Effects 0.000 claims description 3
- 230000003321 amplification Effects 0.000 description 8
- 238000003199 nucleic acid amplification method Methods 0.000 description 8
- 238000012545 processing Methods 0.000 description 8
- 125000006850 spacer group Chemical group 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 238000003491 array Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 238000004590 computer program Methods 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000005086 pumping Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000002269 spontaneous effect Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
- G01S17/06—Systems determining position data of a target
- G01S17/08—Systems determining position data of a target for measuring distance only
- G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
- G01S17/88—Lidar systems specially adapted for specific applications
- G01S17/89—Lidar systems specially adapted for specific applications for mapping or imaging
- G01S17/894—3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4811—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver
- G01S7/4812—Constructional features, e.g. arrangements of optical elements common to transmitter and receiver transmitted and received beams following a coaxial path
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/481—Constructional features, e.g. arrangements of optical elements
- G01S7/4814—Constructional features, e.g. arrangements of optical elements of transmitters alone
- G01S7/4815—Constructional features, e.g. arrangements of optical elements of transmitters alone using multiple transmitters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/483—Details of pulse systems
- G01S7/486—Receivers
- G01S7/4861—Circuits for detection, sampling, integration or read-out
- G01S7/4863—Detector arrays, e.g. charge-transfer gates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
Definitions
- the present invention relates to a laser arrangement with optical filter for time-of-flight measurements, a detector arrangement for time-of-flight measurements, a time-of-flight camera, a method of determining a depth image, and a corresponding computer program product.
- VCSEL arrays comprising, for example, a Vertical Cavity Surface Emitting Laser (VCSEL) array can be used for infrared illumination devices.
- VCSEL arrays are, for example, applied in time-of-flight applications.
- Such applications comprise, e.g. short-range gesture recognition for portable devices and 3D space recognition.
- VCSEL arrays of about 1 mm 2 area with output power in the 1-10 W range are discussed for such applications.
- a specific field of illumination or view is defined by the application (e.g., a time-of-flight camera observing e.g. 70° ⁇ 50°.
- EP 3 176 888 A1 discloses a sensor chip suited for time-of-flight measurements.
- the sensor chip comprises one or more lasers and photodetectors, which are arranged next to each other on the same semiconductor substrate.
- the lasers or laser structures and photodetectors or photodetector structures are processed on the same wafer in the same processing steps. The variations between the structures of the lasers and the photodetectors can therefore be minimized.
- the resonant photodetectors are arranged to be sensitive in the wavelength range in which the lasers emit laser light.
- the optical passband of the resonant photodetectors is broader than the optical passband of a laser cavity of the lasers. Variations of the emission wavelengths of the laser light, which may, for example, be caused by temperature differences between the light emitting laser and the resonant photodetector can therefore be compensated.
- FIG. 1 shows a first detector arrangement
- FIG. 2 shows a second detector arrangement
- FIG. 3 shows a third detector arrangement
- FIG. 4 shows a time-of-flight camera
- FIG. 5 shows a method of recording a depth image.
- Embodiments of the present invention provide an improved laser arrangement for time-of-flight measurements.
- a laser arrangement for time-of-flight measurements comprises at least one laser and at least one optical filter arranged adjacent to the at least one laser.
- the at least one laser and the at least one optical filter each comprise a substrate, a first mirror, a second mirror, and an active layer arranged between the first mirror and the second mirror.
- the at least one laser is arranged to emit laser light in a first direction.
- the optical filter is arranged to receive received light.
- the received light comprises laser light reflected from an object.
- the laser light is emitted through the first mirror of the at least one laser and the received light is received through the first mirror of the at least one optical filter.
- the first mirror of the at least one laser and the first mirror of the at least one optical filter have an equal reflectivity.
- the second mirror of the at least one laser and the second mirror of the at least one optical filter have an equal reflectivity or the reflectivity of the second mirror of the at least one optical filter is reduced with respect to the reflectivity of the second mirror of the at least one laser.
- the optical filter is further arranged to filter the received light such that laser light reflected from the object and received from the first direction passes the optical filter.
- the at least one laser and the at least one optical filter may be arranged side by side.
- the at least one laser may preferably be arranged to emit laser light of the wavelengths for which the substrate is transparent.
- the wavelength of the emitted laser light may, for example, be longer than around 900 nm in case of a GaAs substrate (depending on the thickness of the substrate).
- the substrate may alternatively or in addition be removed such that reflected laser light can enter the optical filter via the first mirror and at least a part of the reflected laser light filtered by the optical filter can leave the optical filter via the second mirror (or vice versa).
- Laser and optical filter are characterized by a semiconductor epitaxial layer stack comprising amongst others the first mirror, the second mirror and the active layer.
- the first mirror, the second mirror and the active layer may be characterized by the same optical characteristics.
- Laser and optical filter are therefore preferably processed in the same production process in order to avoid or at least limit the influence of production spread.
- the semiconductor layer stack is (essentially) the same for both devices.
- the optical filter is therefore arranged such that the filter wavelength matches during operation the emission wavelength of the laser.
- Laser and optical filter are thermally coupled in a way such that the temperatures of the laser and the optical filter during operation of the laser arrangement are essentially the same in order to compensate for thermal shift of the emission wavelength of the laser.
- the laser arrangement is therefore arranged to emit laser light in the first direction and receive reflected laser light from the same first direction such that the optical filter suppresses ambient light with different wavelength and/or direction of reception.
- the laser arrangement therefore enables a very sensitive detector arrangement.
- the substrate may be a common substrate, wherein the at least one laser and the optical filter are arranged on the common substrate.
- the at least one laser is a Vertical Cavity Surface Emitting Laser (VCSEL).
- VCSELs can be processed in parallel such that neighboring VCSEL structures share the same epitaxial layer stack.
- the first VCSEL structure of two neighboring VCSEL structures may be used as laser, and a second VCSEL structure of the two neighboring VCSEL structures may be used as optical filter.
- VCSEL arrays have a laser wavelength spread of about 10-20 nm and a thermal shift of the wavelength of 0.07 nm/K, resulting in another 10 nm spread for, e.g., automotive conditions from ⁇ 40° C. to 105° C.
- Using two (or more) neighboring VCSEL devices therefore enables compensation of production spread, and because of the strong thermal coupling, avoids or at least reduces thermal drift and different temperatures of both VCSEL devices.
- the first and the second mirror are optimized for laser operation towards one side, which can be the substrate side or the epitaxial site (bottom emitter or top emitter).
- One of the mirrors may be characterized by a high reflectivity >99.9% and the other one, through which the light is emitted, by a somewhat lower reflectivity of about 99.5%.
- Reflectivity of the DBR with higher reflectivity may be reduced (e.g., by etching or providing additional layers) for the VCSEL structure building the optical filter such that both DBRs are characterized by the same reflectivity (e.g., 99.5%).
- the same reflectivity of the first and the second DBR (or more generally first or second mirror) enables an optimized transmission of the optical filter for the intended filter wavelength (emission wavelength of the neighboring VCSEL structure building the laser) received from the first direction.
- the reflectivity of the first and the second DBR may, according to an alternative embodiment, be lowered (e.g., between 95% and 99.5%) such that only gain-switching operation of the laser is enabled.
- a design would enable a higher transmission through the neighboring optical filter at the same time.
- the at least one laser and the at least one optical filter may be arranged to receive a common drive current.
- the at least one laser is in this embodiment characterized by a first threshold current.
- the at least one optical filter is characterized by a second threshold current higher than the first threshold current.
- the at least one laser and the at least one optical filter may, for example, share common electrodes.
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- Providing different threshold currents e.g., by different diameters of the corresponding VCSEL structure
- the laser arrangement may further comprise at least a second laser and at least a second optical filter.
- Each laser and each optical filter is optically coupled with an optical device.
- the optical device is arranged such that laser light emitted by the second laser is emitted in a second direction different than the first direction.
- the optical device is further arranged to receive received light.
- the received light comprises reflected laser light emitted by the second laser.
- the second optical filter is further arranged to filter the received light such that reflected laser light received from the second direction passes the second optical filter.
- the optical device enables angular selective emission and reception of the laser light.
- Two, three, four, or more pairs of lasers and corresponding optical filters may be arranged to emit laser light in different directions and receive reflected laser light from the respective direction such that the reflected laser light can pass the corresponding optical filter.
- One or more subgroup of the pairs of lasers and corresponding optical filters may be arranged to emit laser light in the same direction and receive reflected laser light from this direction such that the reflected laser light received from this direction can pass the optical filters of the respective subgroup.
- the optical device may be a common optical device or each laser and each optical filter may be coupled to a separate optical device.
- a detector arrangement for time-of-flight measurements may be a time-of-flight detector module.
- the detector arrangement comprises at least one laser, at least one optical filter, at least one carrier structure, and at least one first driver.
- the at least one laser and the at least one optical filter comprise a substrate, a first mirror, a second mirror, and an active layer arranged between the first mirror and the second mirror.
- the at least one laser is arranged to emit laser light in a first direction.
- the optical filter is arranged to receive received light.
- the received light comprises laser light reflected from an object.
- the laser light is emitted through the first mirror of the at least one laser and the received light is received through the first mirror of the at least one optical filter.
- the first mirror of the at least one laser and the first mirror of the at least one optical filter have an equal reflectivity.
- the second mirror of the at least one laser and the second mirror of the at least one optical filter have an equal reflectivity or the reflectivity of the second mirror of the at least one optical filter is reduced with respect to the reflectivity of the second mirror of the at least one laser.
- the object is arranged in a predefined detection range.
- the optical filter is further arranged to filter the received light such that laser light reflected from the object and received from the first direction passes the optical filter.
- the at least one laser and the at least one optical filter are attached to the carrier structure.
- the carrier structure comprises at least one optical sensor.
- the at least one optical sensor is arranged to detect the received light filtered by the optical filter.
- the first driver is arranged to control the at least one laser such that laser light of a predetermined pulse length is emitted.
- the predetermined pulse length is shorter than 20 ns, preferably shorter than 10 ns.
- the predetermined pulse length is shorter than a time period for receiving laser light reflected from the object in the predefined detection range.
- a detector arrangement comprising a laser and a separate optical filter (laser arrangement described above) may be electrically driven such that longer laser pulses may be emitted (longer than the time period for receiving the light reflected from the object.
- a detector arrangement comprising such a laser arrangement may therefore not be bound to the limitation with respect to first driver.
- the first driver may in this case be arranged such that laser light of a predetermined pulse length is emitted.
- the predetermined pulse length may in this case comprise any pulse length, which is suited to provide a reliable time-of-flight measurement.
- the at least one laser and the at least one optical filter may comprise the same physical structure. This means that the physical structure acts in the first moment in time as a laser and in a second different moment in time as an optical filter.
- the laser and the optical filter may be arranged on a first chip, which is mounted on the carrier structure (second chip).
- a transparent spacer may be implemented between the two chips (can be a Si chip with vias for electrical connection) to further decrease the amount of amplified spontaneous emission (ASE) emitted from the optical filter to the optical sensor as the ASE is emitted in all directions while the filtered (and/or amplified see below) received light is perpendicular to the epitaxial layer structure of the laser.
- ASE amplified spontaneous emission
- the optical sensor may be arranged to provide a nonlinear response upon detection of the received light.
- the nonlinear response may enable detection of very low optical intensities resulting from the received light.
- the optical sensor may, for example, comprise a single photon avalanche diode (SPAD), which is well-suited to detect time-of-flight signals.
- SPAD single photon avalanche diode
- the carrier structure may further comprise at least the first driver arranged to provide a drive current at least to the at least one laser. Integration of the first driver may enable a very compact design.
- the substrate may be a common substrate.
- the at least one laser and the optical filter are arranged adjacent to each other on the common substrate.
- the at least one laser is a VCSEL.
- the optical filter may be a VCSEL structure being identical with the corresponding VCSEL or sharing essentially the same epitaxial layer structure as the VCSEL.
- the at least one laser may be characterized by a first threshold current.
- the at least one optical filter is in this embodiment characterized by a second threshold current higher than the first threshold current.
- the first driver is arranged to provide a first drive current to the at least one laser and the at least one optical filter.
- the first drive current is arranged between the first threshold current and the second threshold current.
- the at least one optical filter may, for example, be a VCSEL with an active area (area of the active layer receiving the drive current as defined, for example, by a corresponding current confinement structure (e.g. oxide aperture)) which is bigger than an active area of the at least one laser.
- the optical filter and the first drive current may be arranged to amplify reflected laser light received from the object.
- the second drive current may, for example, enable lasing of the optical filter upon reception of reflected laser light.
- the DBR may remain unetched (reflectivity of the first and the second mirror is not the same). Amplification of the received laser light may provide sufficient light for the optical sensor, which will be coupled off the high-reflectivity side of the DBR towards the optical sensor.
- Use of independent first and second drive currents may therefore increase flexibility and performance (especially sensitivity) of the detector arrangement.
- a time-of-flight camera comprises the detector arrangement according to any embodiment described above.
- the time-of-flight camera further comprises an evaluator.
- the evaluator is arranged to determine a distance to the object by means of detection of received light.
- the drive current and the heating current may be characterized by the same current strength if the first threshold is lower than the second threshold as discussed above.
- a computer program product comprises code means, which can be saved on at least one memory device comprised by the time-of-flight camera described above.
- the code means are arranged such that the method described above can be executed by means of at least one processing device comprised by the time-of-flight camera.
- the memory device or devices may be any physical device being arranged to store information especially digital information.
- the memory device may be especially selected out of the group solid-state memory or optical memory.
- Emission wavelength of the laser light 121 is above 900 nm, preferably above 930 nm, such that the substrate 101 is essentially transparent for laser light 121 .
- the laser arrangement 101 is mounted with the second electrode 111 on top of a spacer 130 , which consists, in this embodiment, out of material that is transparent for laser light 121 .
- the spacer 130 is arranged to provide electrical connection of the first electrode 103 and the second electrode 111 .
- the spacer 130 is mounted on the carrier structure 150 which comprises a first driver which is arranged to provide the drive current to the VCSEL.
- the carrier structure 150 further comprises an optical sensor 151 .
- the optical sensor 151 may, for example, be a single photon avalanche diode which is integrated in the carrier structure and which is aligned with the openings of the first electrical contact 103 and the second electrical contact 111 .
- the first driver 153 is therefore arranged to lower the drive current below the laser threshold of the VCSEL after the predetermined time period.
- the first driver 153 is further arranged to provide a subsequent or second drive current to the VCSEL, which is slightly below the laser threshold of the VCSEL.
- the second drive current may be provided as soon as the laser starts lasing or during a predetermined time period starting later than reduction of the drive current below laser threshold.
- the second drive current enables amplification of the received light 123 , which is received from the same direction in which the laser emitted the laser light 121 .
- the received light 123 is filtered by means of the layer stack of the optical resonator (and the substrate 101 ) such that essentially no ambient light reaches the active layer 107 .
- the second mirror 109 (second DBR) of these first VCSEL structures is completely covered by a second electrode 111 .
- Second VCSEL structures are arranged to filter received light 123 comprising reflected laser light 121 .
- the second VCSEL structures are therefore optical filters.
- the second mirror 109 (second DBR) of these second VCSEL structures is partly covered by an, e.g., ring shaped second electrical contact 111 such that filtered received light 123 can pass the second VCSEL structures through the opening in the second electrical contact 111 .
- the first and the second VCSEL structures comprise a common first electrical contact 103 . Openings in the first electrical contact 103 are aligned with the first and the second VCSEL structures in order to enable emission of laser light 121 and reception of received light 123 .
- FIG. 4 shows a principal sketch of a time-of-flight camera 200 .
- the time-of-flight camera 200 comprises a detector arrangement 10 in accordance with one of the embodiments discussed above.
- the detector arrangement 10 comprises an array of VCSEL structures operating as lasers and/or optical filters.
- the lasers are arranged to emit short laser pulses (laser light 121 ) hitting an object 300 .
- a part of the laser light 121 is reflected by the object 300 such that received light 123 comprising reflected laser light 121 is received by the detector arrangement 10 and filtered by the optical filters in accordance with the emission direction of the corresponding laser light 121 as described above.
- the filtered reflected laser light 121 causes a corresponding electrical signal in a corresponding optical sensor of the detector arrangement 10 as discussed above.
- the transferred data can be used to calculate the time-of-flight of the laser light 121 and therefore distances between the time-of-flight sensor module 200 and the object 300 for each direction in which laser light 121 is emitted.
- the time-of-flight sensor module 200 may alternatively comprise an evaluator electrically connected with the controller 250 (or may comprise or be comprised by controller 250 ) to determine the distances to the object.
- the controller may be further arranged to reconstruct a depth image of the object 300 based on the distance measurements by means of a corresponding reconstruction algorithm.
- the epitaxial structure of the laser arrangements 10 discussed above is optimized for high gain and amplification and high outcoupling, such that the laser only emits an ultra-short gain-switching peak of the laser light 121 for a high laser current.
- the current can be lowered or maybe even kept constant to stay in amplifying mode until the reflected laser light 121 comprised by the received light 123 will arrive back from the longest distance that should be measured. Then the current can be switched off while, for example, image processing is done, to reduce the amount of heat in the detector arrangement 100 .
- This optimization for gain-switching can also be done by lowering the reflectivity of the high-reflectivity mirror as discussed above, which is quite unconventional compared to known VCSEL structures.
- the epitaxial structure is optimized on low absorption at the cost of higher electrical losses compared to known VCSELs or VCSEL structures, because currents in the application is usually low and pulsed. High resistance may be used to heat the optical filter with small currents, while the low optical losses allow a better amplification and transmission in the optical filter in order to enable optimized filtering and optionally amplification.
- FIG. 5 shows a principal sketch of a method of recording a depth image of a scene.
- Laser light 121 is emitted in step 410 in a multitude of different directions. At least one laser emits laser light in at least one of the multitude of directions.
- Received light 123 comprising laser light 121 reflected by an object 300 in the scene for each of the multitude of directions is filtered in step 420 by means of at least one optical filter for each direction.
- At least one optical filter is associated with the at least one laser emitting laser light in the corresponding direction.
- Each optical filter comprises an optical passband in the wavelength range of the laser light for the corresponding direction.
- the filtered received light 123 is detected in step 430 by means of at least one optical sensor 151 for each optical filter.
- the distances to the object 300 are determined in step 440 by means of a time of emission of the laser light 121 and a time of detection of the corresponding filtered received light 123 .
- An embodiment of the present inventions uses the epitaxial structure first as laser and second as a selective optical filter having the exact same wavelength as the laser and a method to couple this to a separate array optical sensors 151 to form an ultra-compact light source and sun-light resistant detector array for a time-of-flight camera 200 .
- a silicon chip (carrier structure 150 ) containing the array of optical sensors 151 contains a first driver 153 and optionally a second driver 155 for electrically driving the lasers and optionally to optimize filter transmission.
- the optical filter can be further optimized to function as an optical amplifier for the laser light 121 reflected back from the object 300 to be measured to increase the sensitivity.
- the semiconductor chip also contains optical devices 120 (especially wafer level integrated optical devices 120 ) to form a full ultra-flat integrated time-of-flight or 3D sensor.
- the recitation of “at least one of A, B and C” should be interpreted as one or more of a group of elements consisting of A, B and C, and should not be interpreted as requiring at least one of each of the listed elements A, B and C, regardless of whether A, B and C are related as categories or otherwise.
- the recitation of “A, B and/or C” or “at least one of A, B or C” should be interpreted as including any singular entity from the listed elements, e.g., A, any subset from the listed elements, e.g., A and B, or the entire list of elements A, B and
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Abstract
Description
-
- emitting laser light in a multitude of different directions, wherein at least one laser emits laser light in at least one of the multitude of directions,
- filtering received light comprising laser light reflected by an object in the scene for each of the multitude of directions by means of at least one optical filter for each direction, wherein at least one optical filter is associated with the at least one laser emitting laser light in the corresponding direction, wherein each optical filter comprises an optical passband in the wavelength range of the laser light for the corresponding direction,
- detecting the filtered received light by means of at least one optical sensor for each optical filter, and
- determining distances to the object by means of a time of emission of the laser light and a time of detection of the filtered received light.
-
- the step of emitting laser light comprises the step of providing a drive current above a first threshold current of the lasers to the lasers, and
- the step of filtering received light comprises the step of providing a heating current below a second threshold current of the optical filters to the optical filters.
- 10 detector arrangement
- 100 laser arrangement
- 101 substrate
- 103 first electrical contact
- 105 first mirror
- 107 active layer
- 109 second mirror
- 111 second electrical contact
- 120 optical device
- 121 laser light
- 123 received light
- 130 spacer
- 150 carrier structure
- 151 optical sensor
- 153 first driver
- 155 second driver
- 200 time-of-flight camera
- 230 electrical driver
- 235 interface
- 250 controller
- 300 object
- 410 step of emitting laser light
- 420 step of filtering received light
- 430 step of detecting filtered received light
- 440 step of determining distances
Claims (16)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP18150431.7A EP3508880A1 (en) | 2018-01-05 | 2018-01-05 | Laser arrangement with optical filter |
| EP18150431.7 | 2018-01-05 | ||
| EP18150431 | 2018-01-05 | ||
| PCT/EP2018/086903 WO2019134885A1 (en) | 2018-01-05 | 2018-12-31 | Laser arrangement with optical filter |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/EP2018/086903 Continuation WO2019134885A1 (en) | 2018-01-05 | 2018-12-31 | Laser arrangement with optical filter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20200333445A1 US20200333445A1 (en) | 2020-10-22 |
| US12235360B2 true US12235360B2 (en) | 2025-02-25 |
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ID=60937623
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US16/919,135 Active 2041-08-03 US12235360B2 (en) | 2018-01-05 | 2020-07-02 | Laser arrangement with optical filter |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US12235360B2 (en) |
| EP (2) | EP3508880A1 (en) |
| JP (1) | JP6953637B2 (en) |
| CN (1) | CN111742238B (en) |
| WO (1) | WO2019134885A1 (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11073618B2 (en) * | 2018-04-03 | 2021-07-27 | GM Global Technology Operations LLC | Optical amplifier in return path of coherent lidar system |
| DE102019210946A1 (en) * | 2019-07-24 | 2021-01-28 | Robert Bosch Gmbh | LIDAR sensor for optical detection of a field of view and method for optical detection of a field of view |
| CN114641907A (en) * | 2019-11-06 | 2022-06-17 | ams传感器亚洲私人有限公司 | Lidar transmitter, system and method |
| GB2592584A (en) * | 2020-02-28 | 2021-09-08 | Rushmere Tech Limited | Optical system and LIDAR system |
| EP3982165B1 (en) | 2020-10-06 | 2026-01-28 | TRUMPF Photonic Components GmbH | Diffusor lens, light source, method of fabricating a light source and method of illuminating a scene |
| US20240006850A1 (en) * | 2020-11-06 | 2024-01-04 | Sony Semiconductor Solutions Corporation | Semiconductor laser driving apparatus, lidar including semiconductor laser driving apparatus, and vehicle including semiconductor laser driving apparatus |
| JP2024005895A (en) * | 2022-06-30 | 2024-01-17 | 株式会社小糸製作所 | Measuring device and irradiation device |
| JP2024024483A (en) * | 2022-08-09 | 2024-02-22 | 株式会社小糸製作所 | Measuring equipment and bandpass filter |
| JP2024005894A (en) * | 2022-06-30 | 2024-01-17 | 株式会社小糸製作所 | Measurement device |
| CN119301475A (en) * | 2022-06-30 | 2025-01-10 | 株式会社小糸制作所 | Measuring device, irradiation device and bandpass filter |
| CN116826507A (en) * | 2023-04-14 | 2023-09-29 | 苏州立琻半导体有限公司 | Light source module |
Citations (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5960024A (en) * | 1998-03-30 | 1999-09-28 | Bandwidth Unlimited, Inc. | Vertical optical cavities produced with selective area epitaxy |
| US5974071A (en) | 1997-05-20 | 1999-10-26 | Motorola, Inc. | VCSEL with integrated photodetectors for automatic power control and signal detection in data storage |
| US5978401A (en) * | 1995-10-25 | 1999-11-02 | Honeywell Inc. | Monolithic vertical cavity surface emitting laser and resonant cavity photodetector transceiver |
| GB2374201A (en) | 2001-04-03 | 2002-10-09 | Khaled Karrai | Laser |
| US20050200832A1 (en) * | 2004-03-09 | 2005-09-15 | Nobuharu Kawai | Object detecting apparatus having light radiation power regulating function |
| US20070133642A1 (en) | 2005-12-08 | 2007-06-14 | Mi Ran Park | Vertical cavity surface emitting laser module having monitoring photodiode and method of fabricating the same |
| US20070181810A1 (en) | 2006-02-06 | 2007-08-09 | Tan Michael R T | Vertical cavity surface emitting laser (VCSEL) array laser scanner |
| US20080094605A1 (en) | 2004-12-16 | 2008-04-24 | Ulrich Drodofsky | Laser-System |
| US20080291953A1 (en) * | 2005-12-06 | 2008-11-27 | Commissariat A L'energie Atomique | Light-Emitting System Provided with an Integrated Control Photosensor and a Method for Producing Said System |
| US20100027104A1 (en) * | 2006-10-06 | 2010-02-04 | Esener Sadik C | Photonic Devices Based On Vertical-Cavity Semiconductor Optical Amplifiers |
| US20100328680A1 (en) * | 2008-02-28 | 2010-12-30 | Koninklijke Philips Electronics N.V. | Optical sensor |
| WO2014018684A1 (en) | 2012-07-24 | 2014-01-30 | Joseph John R | Multibeam array of top emitting vcsel elements |
| GB2518454A (en) | 2013-09-24 | 2015-03-25 | St Microelectronics Res & Dev | Improvements in or relating to proximity sensors |
| US20150219764A1 (en) | 2014-02-06 | 2015-08-06 | GM Global Technology Operations LLC | Low cost small size lidar for automotive |
| US20150340841A1 (en) * | 2009-02-17 | 2015-11-26 | Trilumina Corp | Laser arrays for variable optical properties |
| US20150362585A1 (en) | 2013-07-12 | 2015-12-17 | Princeton Optronics Inc. | 2-D Planar VCSEL Source for 3-D Imaging |
| WO2015189025A1 (en) | 2014-06-11 | 2015-12-17 | Robert Bosch Gmbh | Vehicle lidar system |
| US20160227194A1 (en) * | 2015-01-30 | 2016-08-04 | Samsung Electronics Co., Ltd. | Optical imaging system for 3d image acquisition apparatus and 3d image acquisition apparatus including the optical imaging system |
| US20160266242A1 (en) * | 2015-03-13 | 2016-09-15 | Advanced Scientific Concepts, Inc. | Beam steering ladar sensor |
| US20170102461A1 (en) | 2015-10-09 | 2017-04-13 | Fujitsu Limited | Distance measuring apparatus, distance measuring method, and table creating method |
| EP3176888A1 (en) * | 2015-12-03 | 2017-06-07 | Koninklijke Philips N.V. | Sensor chip |
| US9705283B1 (en) | 2014-05-20 | 2017-07-11 | University Of Central Florida Research Foundation, Inc. | Diffused channel semiconductor light sources |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102015101722A1 (en) * | 2014-02-06 | 2015-08-06 | Gm Global Technology Operations, Llc | Cost-effective compact LiDAR for automobiles |
-
2018
- 2018-01-05 EP EP18150431.7A patent/EP3508880A1/en not_active Withdrawn
- 2018-12-31 EP EP18827137.3A patent/EP3735598B1/en active Active
- 2018-12-31 WO PCT/EP2018/086903 patent/WO2019134885A1/en not_active Ceased
- 2018-12-31 JP JP2020537243A patent/JP6953637B2/en active Active
- 2018-12-31 CN CN201880089783.1A patent/CN111742238B/en active Active
-
2020
- 2020-07-02 US US16/919,135 patent/US12235360B2/en active Active
Patent Citations (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5978401A (en) * | 1995-10-25 | 1999-11-02 | Honeywell Inc. | Monolithic vertical cavity surface emitting laser and resonant cavity photodetector transceiver |
| US5974071A (en) | 1997-05-20 | 1999-10-26 | Motorola, Inc. | VCSEL with integrated photodetectors for automatic power control and signal detection in data storage |
| US5960024A (en) * | 1998-03-30 | 1999-09-28 | Bandwidth Unlimited, Inc. | Vertical optical cavities produced with selective area epitaxy |
| GB2374201A (en) | 2001-04-03 | 2002-10-09 | Khaled Karrai | Laser |
| US20050200832A1 (en) * | 2004-03-09 | 2005-09-15 | Nobuharu Kawai | Object detecting apparatus having light radiation power regulating function |
| US20080094605A1 (en) | 2004-12-16 | 2008-04-24 | Ulrich Drodofsky | Laser-System |
| US20080291953A1 (en) * | 2005-12-06 | 2008-11-27 | Commissariat A L'energie Atomique | Light-Emitting System Provided with an Integrated Control Photosensor and a Method for Producing Said System |
| US20070133642A1 (en) | 2005-12-08 | 2007-06-14 | Mi Ran Park | Vertical cavity surface emitting laser module having monitoring photodiode and method of fabricating the same |
| US20070181810A1 (en) | 2006-02-06 | 2007-08-09 | Tan Michael R T | Vertical cavity surface emitting laser (VCSEL) array laser scanner |
| US20100027104A1 (en) * | 2006-10-06 | 2010-02-04 | Esener Sadik C | Photonic Devices Based On Vertical-Cavity Semiconductor Optical Amplifiers |
| US20100328680A1 (en) * | 2008-02-28 | 2010-12-30 | Koninklijke Philips Electronics N.V. | Optical sensor |
| US20150340841A1 (en) * | 2009-02-17 | 2015-11-26 | Trilumina Corp | Laser arrays for variable optical properties |
| WO2014018684A1 (en) | 2012-07-24 | 2014-01-30 | Joseph John R | Multibeam array of top emitting vcsel elements |
| US20150362585A1 (en) | 2013-07-12 | 2015-12-17 | Princeton Optronics Inc. | 2-D Planar VCSEL Source for 3-D Imaging |
| GB2518454A (en) | 2013-09-24 | 2015-03-25 | St Microelectronics Res & Dev | Improvements in or relating to proximity sensors |
| US20150219764A1 (en) | 2014-02-06 | 2015-08-06 | GM Global Technology Operations LLC | Low cost small size lidar for automotive |
| US9705283B1 (en) | 2014-05-20 | 2017-07-11 | University Of Central Florida Research Foundation, Inc. | Diffused channel semiconductor light sources |
| WO2015189025A1 (en) | 2014-06-11 | 2015-12-17 | Robert Bosch Gmbh | Vehicle lidar system |
| US20170090032A1 (en) | 2014-06-11 | 2017-03-30 | Robert Bosch Gmbh | Vehicle lidar system |
| US20160227194A1 (en) * | 2015-01-30 | 2016-08-04 | Samsung Electronics Co., Ltd. | Optical imaging system for 3d image acquisition apparatus and 3d image acquisition apparatus including the optical imaging system |
| US20160266242A1 (en) * | 2015-03-13 | 2016-09-15 | Advanced Scientific Concepts, Inc. | Beam steering ladar sensor |
| US20170102461A1 (en) | 2015-10-09 | 2017-04-13 | Fujitsu Limited | Distance measuring apparatus, distance measuring method, and table creating method |
| EP3176888A1 (en) * | 2015-12-03 | 2017-06-07 | Koninklijke Philips N.V. | Sensor chip |
Non-Patent Citations (1)
| Title |
|---|
| Moench, et al., "VCSEL-based Sensors for Distance and Velocity," Proceedings of the SPIE 9766: 97660A-97660A (Mar. 4, 2016). XP060066637. |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3508880A1 (en) | 2019-07-10 |
| JP2021509956A (en) | 2021-04-08 |
| CN111742238B (en) | 2025-02-18 |
| EP3735598A1 (en) | 2020-11-11 |
| US20200333445A1 (en) | 2020-10-22 |
| WO2019134885A1 (en) | 2019-07-11 |
| EP3735598B1 (en) | 2025-10-22 |
| CN111742238A (en) | 2020-10-02 |
| JP6953637B2 (en) | 2021-10-27 |
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