US12058892B2 - Display panel having at least one light-transmitting portion - Google Patents
Display panel having at least one light-transmitting portion Download PDFInfo
- Publication number
- US12058892B2 US12058892B2 US17/527,912 US202117527912A US12058892B2 US 12058892 B2 US12058892 B2 US 12058892B2 US 202117527912 A US202117527912 A US 202117527912A US 12058892 B2 US12058892 B2 US 12058892B2
- Authority
- US
- United States
- Prior art keywords
- area
- electrode
- disposed
- light
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/82—Cathodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1216—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/126—Shielding, e.g. light-blocking means over the TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/35—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
- H10K59/351—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels comprising more than three subpixels, e.g. red-green-blue-white [RGBW]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/60—OLEDs integrated with inorganic light-sensitive elements, e.g. with inorganic solar cells or inorganic photodiodes
- H10K59/65—OLEDs integrated with inorganic image sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/805—Electrodes
- H10K59/8052—Cathodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/1201—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Definitions
- the present disclosure relates to a display panel including an imaging area in which pixels for reproducing images are disposed and a method of fabricating the display panel.
- Electroluminescence display devices are generally classified into inorganic light emitting display devices and organic light emitting display devices according to materials included in an emission layer.
- An organic light emitting display device of an active matrix type can include an organic light emitting diode (hereinafter, referred to as “OLED”) having self-emitting property.
- OLED organic light emitting diode
- the OLED can be disposed on each of the pixels included in the organic light emitting display device.
- the organic light emitting display device has an advantage of a short response time, a high luminous efficiency, an excellent luminance, a wide viewing angle, and the like.
- the organic light emitting display device has a high contrast ratio and excellent color gamut because such a display device can express black in the range of gray levels as complete black.
- a camera is built into a smart phone by default, and the resolution of such a camera has been upgraded to the level of a conventional digital camera.
- one or more cameras typically located in an upper portion of the smart phone limits the design of an associated display screen, which can make it difficult to design the screen.
- embodiments of the present disclosure described herein provide a display panel capable of enhancing transmittance of an imaging area in a display screen, and a method for simplifying a process of fabricating the display panel.
- a display panel in accordance with one aspect of the present disclosure, includes a first area in which a plurality of pixels are disposed, a second area in which a plurality of pixel groups are disposed, and at least one light-transmitting portion disposed between the plurality of pixel groups in the second area.
- Each of the one or more light-transmitting portions can be, or include, a circular light-transmitting portion arranged in a zigzag pattern along a first direction and a second direction intersecting the first direction in the second area.
- Each of the plurality of pixel groups in the second area can include a second electrode. At least part of the second electrode can be removed from a light-transmitting area of the second area to form the light-transmitting portion.
- a display device including above display panel is provided.
- a method for fabricating a display panel.
- the display panel is provided with a display area including a first pixel area in which a plurality of pixels are disposed, and an imaging area including a second pixel area in which a plurality of pixel groups are disposed, and at least one light-transmitting portion disposed between the plurality of pixel groups.
- the method can include forming a capacitor electrode in the pixel area of the imaging area, and forming the light-transmitting portion by removing at least part of a second electrode of the imaging area through the irradiation of the laser beam using the capacitor electrode as a mask.
- a display panel in accordance with further another aspect of the present disclosure, can include a first area in which a plurality of pixels are disposed, a second area in which a plurality of pixel groups are disposed, and at least one light-transmitting portion disposed between the plurality of pixel groups in the second area.
- Each of the at least one light-transmitting portion can be located in an area in which at least part of a second electrode included in the plurality of pixel groups disposed in the second area is removed.
- Each of the at least one light-transmitting portion can be located in at least a part of an area except for an area in which a capacitor electrode included in the plurality of pixel groups disposed in the second area is disposed.
- the second electrode disposed in the second area can be removed in an area other than an area in which the capacitor electrode disposed in the second area is disposed.
- the second electrode disposed in the second area can be located in an area overlapping the capacitor electrode disposed in the second area.
- a light-transmitting portion can be patterned by using a lower metal layer without an additional etching mask when removing a metal layer for forming the light-transmitting portion in the imaging area using a laser beam.
- an associated display panel can be fabricated with a simplified process and a reduced manufacturing cost.
- the transmittance of the imaging area can be increased, and a margin between the display area and the imaging area can be minimized.
- the transmittance of the imaging area can be increased and noises of the captured image data can be reduced.
- FIG. 1 illustrates schematically a display area and an imaging area in a screen of a display panel according to aspects of the present disclosure.
- FIG. 2 illustrates schematically an arrangement of pixels in a first area (display area DA) in the display panel according to aspects of the present disclosure.
- FIG. 3 illustrates schematically an arrangement of pixel groups and at least one light-transmitting portion in a second area (imaging area CA) in the display panel according to aspects of the present disclosure.
- FIG. 4 illustrates specifically a cross-sectional structure of a pixel in the first area DA of the display panel according to aspects of the present disclosure.
- FIGS. 5 to 7 are cross-sectional views illustrating a pixel including a light-transmitting portion of the second area CA in the display panel in various embodiments according to aspects of the present disclosure.
- module can represent a unit, an element, a part, a component, a device, etc.
- any dimensions and relative sizes of layers, areas and regions include a tolerance or error range even when a specific description is not conducted.
- the display area DA and the imaging area CA include a pixel array in which pixels to which pixel data are written are arranged.
- the number of pixels per unit area of the imaging area CA for example, pixels per inch (PPI), can be lower than that of the display area DA in order to ensure the transmittance of the imaging area CA.
- the pixel array of the display area DA can include a pixel area (i.e., the first pixel area) in which a plurality of pixels having a relative high PPI is disposed.
- the pixel array of the imaging area CA can be spaced apart by at least one light-transmitting portion and include a pixel area (i.e., the second pixel area) in which a plurality of pixel groups having a relative low PPI is disposed.
- external light can pass through the display panel 900 through at least one light-transmitting portion having a high light transmittance and can be received by a camera module or an image capture module under the display panel 900 .
- the display area DA and the imaging area CA include pixels, input images can be reproduced in the display area DA and the imaging area CA.
- Each of pixels in the display area DA and the imaging area CA includes sub-pixels having different colors to implement images with colors.
- Each sub-pixel can be one of a red sub-pixel (hereinafter, referred to as “R sub-pixel”), a green sub-pixel (hereinafter, referred to as “G sub-pixel”), and a blue sub-pixel (hereinafter, referred to as “B sub-pixel”).
- Each pixel P can further include a white sub-pixel (hereinafter” referred to as “W sub-pixel”).
- Each sub-pixel can include a pixel circuit and a light emitting element, such as a light emitting diode, more specifically, an organic light emitting diode (OLED).
- OLED organic light emitting diode
- the imaging area CA can include pixels, and a camera module or an image capture module (hereinafter, referred to as “image capture module”) disposed under the screen of the display panel 900 .
- image capture module an image capture module
- the image capture module can capture external still or moving images and output still or moving image data.
- the lens of the image capture module can face the imaging area CA. As external light enters the imaging area CA and reaches the lens of the image capture module, then, the lens can condense the incident light to an image sensor.
- the image capture module captures external still or moving images and outputs still or moving image data.
- an image quality compensation algorithm can be applied for compensating for the luminance and color coordinates of pixels in the imaging area CA due to pixels removed from the imaging area CA.
- the display area of the screen may not be limited due to the image capture module, and therefore, full-screen display can be implemented.
- the display panel 900 included in a display device can include a circuit layer disposed over a substrate, and a light emitting element layer disposed over the circuit layer.
- a polarizing plate can be disposed over the light emitting element layer, and a cover glass can be disposed on or over the polarizing plate.
- the circuit layer can include a pixel circuit connected to lines such as data lines, gate lines, and power lines, and a gate driver connected to the gate lines, and the like.
- the circuit layer can include circuit elements such as transistors, for example, thin film transistors (TFT), at least one capacitor, and the like.
- TFT thin film transistors
- the lines and circuit elements of the circuit layer can be implemented or disposed in or with a plurality of insulating layers, two or more metal layers separated by an insulating layer therebetween, and an active layer including a semiconductor material.
- the light emitting element layer can include a light emitting element driven by a pixel circuit.
- the light emitting element can be implemented as an organic light emitting diode (OLED).
- OLED includes an organic compound layer located between an anode and a cathode.
- the organic compound layer can include a hole injection layer (HIL), a hole transport layer (HTL), an emission layer (EML), an electron transport layer (ETL), an electron injection layer (EIL) and the like; however, embodiments of the present disclosure are not limited thereto.
- HIL hole injection layer
- HTL hole transport layer
- EML emission layer
- ETL electron transport layer
- EIL electron injection layer
- the light emitting element layer can be disposed on or over pixels that selectively transmit respective wavelengths of red light, green light, and blue light, and further include a color filter array.
- the light emitting element layer can be covered by a passivation layer, and the passivation layer can be covered by an encapsulation layer.
- the passivation layer and the encapsulation layer can have a multilayer structure in which one or more organic films and one or more inorganic films are alternately stacked.
- the inorganic film can block the penetration of moisture or oxygen.
- the organic film can enable a surface of the inorganic film to be flat. In the multilayer structure stacked with one or more organic films and one or more inorganic films, a path through which moisture or oxygen travels can become longer when compared with a structure having a single layer, and therefore, the penetration of moisture/oxygen affecting the light emitting element layer can be effectively prevented or reduced.
- the polarizing plate can be adhered to the encapsulation layer.
- the polarizing plate leads to the improvement of outdoor visibility of the display device.
- the polarizing plate can reduce light reflected from a surface of the display panel 900 and block light reflected from a metal of the circuit layer, thereby improving brightness of pixels.
- FIG. 2 illustrates an example of pixels arranged in the first area DA.
- FIG. 3 illustrates an example of pixel groups and light-transmitting portions disposed in the second area CA.
- lines connected to pixels are omitted.
- the first area DA includes pixels arranged in a high PPI.
- Each of the pixels can include R, G and B sub-pixels or can include two sub-pixels of different colors.
- Each of the pixels can further include a W sub-pixel omitted in the drawings. Other variations of pixel arrangement are possible in the first area DA.
- Luminous efficiency of respective light emitting elements included in sub-pixels can be different on a color basis. Taking account of this, sizes of the sub-pixels can be different on a color basis. For example, B sub-pixels of R, G, and B sub-pixels, can be the largest and G sub-pixels can be the smallest.
- the pixels can be arranged along a first direction (e.g., an X-axis direction), a second direction (e.g., a Y-axis direction) perpendicular to the first direction, and an inclined angle direction between the first and second directions (e.g., a direction defined by OX-axis and OY-axis).
- a first direction e.g., an X-axis direction
- a second direction e.g., a Y-axis direction
- an inclined angle direction between the first and second directions e.g., a direction defined by OX-axis and OY-axis.
- the direction defined by OX-axis and OY-axis denotes an inclined direction in which the X-axis and Y-axis are rotated by 45°, respectively.
- pixels included in the second area CA can be organized into a plurality of pixel groups PG each including one or two pixels.
- the pixel groups PG may be spaced apart by a predetermined distance from one another.
- Each light-transmitting portion AG can be disposed in a space between the pixel groups PG.
- External light can be incident on the lens of the image capture module through light-transmitting portions AG.
- the light-transmitting portions AG can include transparent media having high transmittance without including a metal so that the light can be incident with minimal light loss.
- the light-transmitting portions AG can be formed of transparent insulating materials without including metal lines or pixels.
- the transmittance of the imaging area CA increases as the number, or the size, of the light-transmitting portions AG increase. Therefore, as the light-transmitting portions AG are disposed between the pixel groups PG, the PPI of the second area CA becomes lower than the PPI of the first area DA.
- Each of the pixel groups PG can include one or two pixels, or can include three or four sub-pixels (R, G, and/or B sub-pixels). Furthermore, each of the pixel groups PG can further include one or more W sub-pixels. Other variations of pixel arrangement are possible in the second area CA or in the pixel groups PG.
- each pixel group PG disposed in the second area CA can include four sub-pixels.
- Each pixel group PG can include two pixels PIX 1 and PIX 2 .
- the first pixel PIX 1 can include R and G sub-pixels
- the second pixel PIX 2 can include B and G sub-pixels; however, embodiments of the present disclosure are not limited thereto.
- resulting insufficient color representation in each of the first and second pixels PIX 1 and PIX 2 can be compensated for by an average value of corresponding color data between neighboring pixels.
- the white color can be expressed by combining R, G, and B sub-pixels of the first and second pixels PIX 1 and PIX 2 .
- the light-transmitting portions AG can have various shapes.
- the light-transmitting portions AG can have a circular or elliptical shape, or similar thereto, in order to obtain a captured image with a minimized flare phenomenon and increasing transmittance.
- the pixel group PG can be designed to have a rhombus or square shape in order to enlarge light-transmitting portions AG with the circular or elliptical shape or similar thereto.
- the light-transmitting portions AG can be defined as areas in the screen, in which all metal layers are removed.
- All or some of one or metal electrode materials in the light-transmitting portions AG can be removed.
- a metal used as a cathode electrode can be uniformly deposited on the entire screen, and then, parts of the deposited material corresponding to only the light-transmitting portions AG of the imaging area CA can be removed in a laser process.
- Each of the pixel groups PG includes a circuit layer where respective pixel circuits of the sub-pixels are disposed and a light emitting element layer, as described above. At least a part of the circuit layer can overlap, or be spatially separated from, at least a part of the light emitting element layer.
- the circuit layer of the pixel group PG can be disposed in a rhombus or square shape.
- FIG. 4 illustrates specifically a cross-sectional structure of a sub-pixel in the first area DA of the display panel according to aspects of the present disclosure.
- each light emitting element 500 can be located in each sub-pixel.
- Each light emitting element 500 can emit light representing a specific color.
- each light emitting element 500 can include a first electrode 510 , an emission layer 520 , and a second electrode 530 , which are sequentially stacked.
- the first electrode 510 can include a conductive material.
- the first electrode 510 can include a metal having a relatively high reflectivity.
- the first electrode 510 can have a multilayer structure.
- the first electrode 510 can have a structure in which a reflective electrode formed of a metal such as aluminum (Al), silver (Ag), or the like is located between transparent electrodes formed of a transparent conductive material such as ITO, IZO, or the like.
- the emission layer 520 can generate light having a luminance level corresponding to a voltage difference between the first electrode 510 and the second electrode 530 .
- the emission layer 520 can include a light emitting material layer EML including a light emitting material.
- the light emitting material can include an organic material, an inorganic material, or a hybrid material.
- the display device according to aspects of the present disclosure can be an organic light emitting display device including the emission layer 520 formed of an organic material.
- the emission layer 520 can have a multilayer structure in order to increase luminous efficiency.
- the emission layer 520 can further include at least one first organic layer located between the first electrode 510 and the light emitting material layer, and at least one second organic layer located between the light emitting material layer and the second electrode 530 .
- the first organic layer can include at least one of a hole injection layer HIL and a hole transport layer HTL.
- the second organic layer can include at least one of an electron transport layer ETL and an electron injection layer EIL.
- the first organic layer can include at least one of the electron transport layer ETL and the electron injection layer EIL
- the second organic layer can include at least one of the hole injection layer HIL and the hole transport layer HTL.
- the second electrode 530 can include a conductive material.
- the second electrode 530 can include a material different from the first electrode 510 .
- the second electrode 530 can be a transparent electrode formed of a transparent conductive material such as ITO, IZO, or the like. Accordingly, in the display device according to embodiments described herein, light generated by the emission layer 520 of each pixel can travel toward the outside through the second electrode 530 .
- an encapsulation portion 170 can be disposed to cover the light emitting element 500 .
- the encapsulation portion 170 for preventing penetration of moisture can be disposed on the second electrode 530 of the light emitting element 500 .
- the encapsulation portion 170 can include at least one inorganic encapsulation layer and at least one organic encapsulation layer.
- the encapsulation portion 170 can include a first encapsulation layer 171 including an inorganic material, a second encapsulation layer 172 including an organic material, and a third encapsulation layer 173 including an inorganic material.
- the first encapsulation layer 171 of the encapsulation portion 170 can be disposed on the second electrode 530 .
- the second encapsulation layer 172 can be disposed on the first encapsulation layer 171 .
- the third encapsulation layer 173 can be disposed on the second encapsulation layer 172 .
- the first encapsulation layer 171 and the third encapsulation layer 173 of the encapsulation portion 170 can be formed of an inorganic material such as silicon nitride (SiNx), silicon oxide (SiOx), or the like.
- the second encapsulation layer 172 of the encapsulation portion 170 can be formed of an organic materials such as an acrylic resin, an epoxy resin, a phenolic resin, a polyamide resin, a polyimide resin, or the like.
- a driving current corresponding to a gate signal supplied through a corresponding gate line and a data signal supplied through a corresponding data line can be supplied to each light emitting element 500 .
- a driving circuit electrically connected to the light emitting element 500 can be located in each pixel.
- the driving circuit can control the operation of the light emitting element 500 according to the gate signal and the data signal.
- the driving circuit can include a first thin film transistor 200 , a second thin film transistor 300 , and a storage capacitor 400 .
- the first thin film transistor 200 can include a first semiconductor pattern 210 , a first gate insulating film 220 , a first gate electrode 230 , a first interlayer insulating film 240 , and a first source electrode 250 , and a first drain electrode 260 .
- the first semiconductor pattern 210 can be located close to the substrate 100 .
- the first semiconductor pattern 210 can include a semiconductor material.
- the first semiconductor pattern 210 can include poly-silicon (Poly-Si), which is a polycrystalline semiconductor material.
- the first semiconductor pattern 210 can include low temperature poly-silicon (LTPS).
- the first semiconductor pattern 210 can include a first source region, a first drain region, and a first channel region.
- the first channel region can be located between the first source region and the first drain region.
- the first channel region can have a relatively lower conductivity than the first source region and the first drain region.
- the first source region and the first drain region can have a higher content of conductivity type impurities than the first channel region.
- the first gate insulating film 220 can be disposed on the first semiconductor pattern 210 .
- the first gate insulating film 220 can extend beyond two side outer edges of the first semiconductor pattern 210 .
- the first gate insulating film 220 can include an insulating material.
- the first gate insulating film 220 can include a silicon oxide-based (SiOx) material.
- the silicon oxide-based (SiOx) material can include silicon dioxide (SiO2).
- the first gate electrode 230 can be located on the first gate insulating film 220 .
- the first gate electrode 230 can overlap a first channel region of the first semiconductor pattern 210 .
- the first gate electrode 230 can be insulated from the first semiconductor pattern 210 due to the first gate insulating film 220 located therebetween.
- the first gate electrode 230 can include a conductive material.
- the first gate electrode 230 can include a metal such as aluminum (Al), chromium (Cr), copper (Cu), titanium (Ti), molybdenum (Mo), tungsten (W), or the like.
- the first interlayer insulating film 240 can be disposed on or over the first gate insulating film 220 and the first gate electrode 230 .
- the first interlayer insulating film 240 can extend along the first gate insulating film 220 .
- the first interlayer insulating film 240 can include an insulating material.
- the first interlayer insulating film 240 can include a material different from the first gate insulating film 220 .
- the first interlayer insulating film 240 can include a silicon nitride-based material (SiNx).
- the first source electrode 250 can be electrically connected to the first source region of the first semiconductor pattern 210 .
- the first interlayer insulating film 240 can include a first source contact hole exposing a part of the first source region of the first semiconductor pattern 210 .
- a part of the first source electrode 250 can overlap the first source region of the first semiconductor pattern 210 .
- the first source electrode 250 can include a conductive material.
- the first source electrode 250 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first drain electrode 260 can be electrically connected to the first drain region of the first semiconductor pattern 210 .
- the first interlayer insulating film 240 can include a first drain contact hole exposing a part of the first drain region of the first semiconductor pattern 210 .
- a part of the first drain electrode 260 can overlap the first drain region of the first semiconductor pattern 210 .
- the first drain electrode 260 can include a conductive material.
- the first drain electrode 260 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first drain electrode 260 can include the same material as the first source electrode 250 .
- the first drain electrode 260 can be formed by the same process as the first source electrode 250 .
- the first source electrode 250 and the first drain electrode 260 can have a multilayer structure.
- the first source electrode 250 and the first drain electrode 260 can be made up of three layers.
- the top layer and the bottom layer can be a titanium (Ti) metal layer
- the intermediate layer located between the top layer and the bottom layer can be an aluminum (Al) metal layer.
- the second thin film transistor 300 can be formed through a process different from that of the first thin film transistor 200 .
- the second thin film transistor 300 can be located on a second separation insulating film 130 of the first thin film transistor 200 .
- the second separation insulating film 130 can include an insulating material.
- the second separation insulating film 130 can include a material different from the first interlayer insulating film 240 .
- the second separation insulating film 130 can include a silicon oxide-based (SiOx) material.
- the second thin film transistor 300 can have the same structure as the first thin film transistor 200 .
- the second thin film transistor 300 can include a second semiconductor pattern 310 , a second gate insulating film 320 , a second gate electrode 330 , and a second interlayer insulating film 340 , a second source electrode 350 , and a second drain electrode 360 .
- the second semiconductor pattern 310 can be located close to the second separation insulating film 130 .
- the second semiconductor pattern 310 can directly contact the second separation insulating film 130 .
- the second semiconductor pattern 310 can include a semiconductor material.
- the second semiconductor pattern 310 can include a material different from the first semiconductor pattern 210 .
- the second semiconductor pattern 310 can include an oxide semiconductor such as IGZO, or the like.
- the second semiconductor pattern 310 can include a second source region, a second drain region, and a second channel region.
- the second channel region can be located between the second source region and the second drain region. Resistance of the second source region and resistance of the second drain region can be lower than resistance of the second channel region.
- the second source region and the second drain region can be regions modified to act as a conducting material.
- the second channel region can be a region not modified to act as a conducting material.
- a doping process can be performed for enabling the second source region and the second drain region to act as a conducting material.
- the second gate insulating film 320 can be located on the second semiconductor pattern 310 .
- the second gate insulating film 320 can include an insulating material.
- the second gate insulating film 320 can include a silicon oxide-based (SiOx) material, a silicon nitride-based (SiNx) material, and/or a material with a high dielectric constant (high-k material.
- the second gate insulating film 320 can have a multilayer structure.
- the second gate electrode 330 can be located on the second gate insulating film 320 .
- the second gate electrode 330 can overlap a second channel region of the second semiconductor pattern 310 .
- the second gate insulating film 320 can include a second source contact hole and a second drain contact hole which expose at least a part of the second source region, and at least a part of the second drain region, of the second semiconductor pattern 310 , respectively.
- the second gate electrode 330 can include a conductive material.
- the second gate electrode 330 can include a metal such as aluminum (Al), chromium (Cr), copper (Cu), titanium (Ti), molybdenum (Mo), tungsten (W), or the like.
- the second gate electrode 330 can include the same material as the first gate electrode 230 .
- the second interlayer insulating film 340 can be disposed on or over the second semiconductor pattern 310 and the second gate electrode 330 .
- the second interlayer insulating film 340 can include an insulating material.
- the second interlayer insulating film 340 can include a material different from the first interlayer insulating film 240 .
- the second interlayer insulating film 340 can include a silicon oxide-based material (SiOx).
- the second source electrode 350 can be located on the second interlayer insulating film 340 .
- the second source electrode 350 can be electrically connected to the second source region of the second semiconductor pattern 310 .
- the second interlayer insulating film 340 can include a second source contact hole exposing at least a part of the second source region of the second semiconductor pattern 310 .
- a part of the second source electrode 350 can overlap the second source region of the second semiconductor pattern 310 .
- the second source electrode 350 can include a conductive material.
- the second source electrode 350 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the second source electrode 350 can include the same material as the first source electrode 250 .
- the second drain electrode 360 can be located on the second interlayer insulating film 340 .
- the second drain electrode 360 can be electrically connected to the second drain region of the second semiconductor pattern 310 .
- the second interlayer insulating film 340 can include a second drain contact hole exposing at least a part of the second drain region of the second semiconductor pattern 310 .
- a part of the second drain electrode 360 can overlap the second drain region of the second semiconductor pattern 310 .
- the second drain electrode 360 can include a conductive material.
- the second drain electrode 360 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the second drain electrode 360 can include the same material as the second source electrode 350 .
- the second drain electrode 360 can be formed by the same process as the second source electrode 350 .
- the second source electrode 350 and the second drain electrode 360 can have a multilayer structure.
- the second source electrode 350 and the second drain electrode 360 can be made up of three layers.
- the top layer and the bottom layer can be a titanium (Ti) metal layer
- the intermediate layer located between the top layer and the bottom layer can be an aluminum (Al) metal layer.
- the first source electrode 250 and the first drain electrode 260 , the second source electrode 350 , and the second drain electrode 360 are located on the second interlayer insulating film 340 , and can be formed in the same process and formed of the same material.
- the storage capacitor 400 can be formed between the substrate 100 and the second thin film transistor 300 .
- the storage capacitor 400 can include a first storage electrode 410 disposed on the same layer as the first gate electrode 230 and a second storage electrode 420 disposed over the first storage electrode 410 .
- the first storage electrode 410 can include a conductive material.
- the first storage electrode 410 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first storage electrode 410 can include the same material as the first gate electrode 230 .
- the first storage electrode 410 can be formed by the same process as the first gate electrode 230 .
- the second storage electrode 420 can include a conductive material.
- the second storage electrode 420 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first interlayer insulating film 240 can extend to run between the first storage electrode 410 and the second storage electrode 420 .
- the second storage electrode 420 can be located on the first interlayer insulating film 240 .
- the first source electrode 250 and the first drain electrode 260 can be located on a layer different from the first storage electrode 420 .
- a first separation insulating film 120 covering the second storage electrode 420 can run between the first interlayer insulating film 240 and the first source electrode 250 and between the first interlayer insulating film 240 and the first drain electrode 260 .
- the first interlayer insulating film 240 and the first separation insulating film 120 can be sequentially stacked between the first gate electrode 230 and the first source electrode 250 and between the first gate electrode 230 and the first drain electrode 260 .
- the second storage electrode 420 can include a material different from the first source electrode 250 and the first drain electrode 260 .
- the first separation insulating film 120 can include an insulating material.
- the first separation insulating film 120 can include a silicon oxide-based material (SiOx) and/or a silicon nitride-based material (SiNx).
- the first separation insulating film 120 can have a multilayer structure.
- the first source electrode 250 and the first drain electrode 260 can be located on the second interlayer insulating film 340 .
- embodiments of the present disclosure are not limited thereto.
- the first storage electrode 410 can be electrically connected to the second drain electrode 360 of the second thin film transistor 300 .
- a first intermediate electrode 610 can be disposed that is connected to the first storage electrode 410 by passing through the first interlayer insulating film 240 , the first separation insulating film 120 , the second separation insulating film 130 , the second gate insulating film 320 , and the second interlayer insulating film 340 .
- the second drain electrode 360 can be connected to the first intermediate electrode 610 .
- the first intermediate electrode 610 can include a conductive material.
- the first intermediate electrode 610 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first intermediate electrode 610 can include the same material as the first source electrode 250 , the first drain electrode 260 , the second source electrode 350 , and the second drain electrode 360 .
- the first intermediate electrode 610 can be formed by the same process as the first source electrode 250 , the first drain electrode 260 , the second source electrode 350 , and the second drain electrode 360 .
- a buffer insulating film 110 can be located between the substrate 100 and a driving circuit (e.g., at least one thin film transistor and at least one storage capacitor) of each sub-pixel.
- the buffer insulating film 110 can prevent contamination by the substrate 100 in a process of forming the driving circuit.
- the buffer insulating film 110 can run between the substrate 100 and the first semiconductor pattern 210 of each sub-pixel.
- the buffer insulating film 110 can include an insulating material.
- the buffer insulating film 110 can include a silicon oxide-based (SiOx) material and/or a silicon nitride-based (SiNx) material.
- the buffer insulating film 110 can have a multilayer structure.
- the buffer insulating film 110 can have a stacked structure including a first buffer insulating film 111 and a second buffer insulating film 112 including a material different from that of the first buffer insulating film 111 .
- a first planarization layer 140 and a second planarization layer 150 can be sequentially stacked between the second thin film transistor 300 and the light emitting element 500 of each sub-pixel.
- the first planarization layer 140 and the second planarization layer 150 can remove a step difference due to a driving circuit of each pixel.
- a surface of the second planarization layer 150 facing the light emitting element 500 of each sub-pixel can be a flat surface.
- the first planarization layer 140 and the second planarization layer 150 can include an insulating material.
- the first planarization layer 140 and the second planarization layer 150 can include a material different from the second interlayer insulating film 340 .
- the first planarization layer 140 and the second planarization layer 150 can include an organic insulating material.
- the second planarization layer 150 can include a material different from the first planarization layer 140 .
- the light emitting element 500 of each sub-pixel can be electrically connected to the first thin film transistor 200 of the corresponding pixel, and the first electrode 510 can be electrically connected to the first drain electrode 260 through a first connection electrode 620 .
- the first connection electrode 620 can be located between the first planarization layer 140 and the second planarization layer 150 .
- the first connection electrode 620 can be connected to the first drain electrode 260 by passing through the first planarization layer 140
- the first electrode 510 can be connected to the first connection electrode 620 by passing through the second planarization layer 150 .
- the first connection electrode 620 can include a conductive material.
- the first connection electrode 620 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the light emitting element 500 of each sub-pixel can be independently driven.
- the first electrode 510 of each sub-pixel can be insulated from the first electrode 510 of an adjacent sub-pixel.
- An edge of each first electrode 510 can be covered by a bank/spacer insulating film 160 including a bank insulating film 161 and a spacer insulating film 162 .
- the bank/spacer insulating film 160 can be located on the second planarization layer 150 .
- the emission layer 520 and the second electrode 530 of each pixel can be disposed on the corresponding first electrode 510 exposed by the bank/spacer insulating film 160 .
- the bank/spacer insulating film 160 can include an insulating material.
- the bank/spacer insulating film 160 can include an organic insulating material.
- the bank/spacer insulating film 160 can include a material different from that of the second planarization layer 150 .
- At least a part of the emission layer 520 of each sub-pixel can extend to run along the bank/spacer insulating film 160 .
- the first organic layer and the second organic layer of each sub-pixel can be connected to the first organic layer and the second organic layer of an adjacent sub-pixel, respectively.
- the light emitting material layer EML of each sub-pixel can be spaced apart from the light emitting material layer EML of an adjacent sub-pixel.
- the second electrode 530 of each pixel can extend to run along the bank/spacer insulating film 160 .
- the second electrode 530 of each sub-pixel can be connected to the second electrode 530 of an adjacent pixel.
- the first thin film transistor 200 can serve as a driving transistor. Accordingly, the first electrode 510 of the light emitting element 500 can be connected to the first thin film transistor 200 ; however, embodiments of the present disclosure are not limited thereto.
- the first electrode 510 of the light emitting element 500 can be connected to the second thin film transistor 300 .
- the second thin film transistor 300 can serve as a driving transistor.
- FIG. 5 illustrates specifically a cross-sectional structure of a sub-pixel in the second area CA of the display panel according to aspects of the present disclosure.
- the process of disposing a second thin film transistor 300 , a light emitting element 500 , an encapsulation portion 170 , a bank/spacer insulating film 160 , and the like included in the second area CA of the display panel 900 can substantially equal to the process of disposing the elements of the first region DA illustrated in FIG. 4 .
- a substrate 100 of the second area CA can include sub-pixels defined by gate lines and data lines.
- a light emitting element 500 can be located in each sub-pixel.
- Each light emitting element 500 can emit light representing a specific color.
- each light emitting element 500 can include a first electrode 510 , an emission layer 520 , and a second electrode 530 A, which are sequentially stacked.
- the first electrode 510 can include a conductive material.
- the first electrode 510 can include a metal having a relatively high reflectivity.
- the first electrode 510 can have a multilayer structure.
- the first electrode 510 can have a structure in which a reflective electrode formed of a metal such as aluminum (Al), silver (Ag), or the like is located between transparent electrodes formed of a transparent conductive material such as ITO, IZO, or the like.
- the emission layer 520 can generate light having a luminance level corresponding to a voltage difference between the first electrode 510 and the second electrode 530 A.
- the emission layer 520 can include a light emitting material layer EML including a light emitting material.
- the light emitting material can include an organic material, an inorganic material, or a hybrid material.
- the display device according to aspects of the present disclosure can be an organic light emitting display device including the emission layer 520 formed of an organic material.
- the emission layer 520 can have a multilayer structure in order to increase luminous efficiency.
- the emission layer 520 can further include at least one first organic layer located between the first electrode 510 and the light emitting material layer, and at least one second organic layer located between the light emitting material layer and the second electrode 530 A.
- the first organic layer can include at least one of a hole injection layer HIL and a hole transport layer HTL.
- the second organic layer can include at least one of an electron transport layer ETL and an electron injection layer EIL.
- the first organic layer can include at least one of the electron transport layer ETL and the electron injection layer EIL
- the second organic layer can include at least one of the hole injection layer HIL and the hole transport layer HTL.
- the second electrode 530 A can include a conductive material.
- the second electrode 530 A can include a material different from the first electrode 510 .
- the second electrode 530 A can be a transparent electrode formed of a transparent conductive material such as ITO, IZO, or the like. Accordingly, in the display device according to embodiments described herein, light generated by the emission layer 520 of each pixel can travel toward the outside through the second electrode 530 A.
- an encapsulation portion 170 can be disposed to cover the light emitting element 500 .
- the encapsulation portion 170 for preventing penetration of moisture can be disposed on the second electrode 530 A of the light emitting element 500 .
- the encapsulation portion 170 can include at least one inorganic encapsulation layer and at least one organic encapsulation layer.
- the encapsulation portion 170 can include a first encapsulation layer 171 including an inorganic material, a second encapsulation layer 172 including an organic material, and a third encapsulation layer 173 including an inorganic material.
- the first encapsulation layer 171 of the encapsulation portion 170 can be disposed on the second electrode 530 A.
- the second encapsulation layer 172 can be disposed on the first encapsulation layer 171 .
- the third encapsulation layer 173 can be disposed on the second encapsulation layer 172 .
- the first encapsulation layer 171 and the third encapsulation layer 173 of the encapsulation portion 170 can be formed of an inorganic material such as silicon nitride (SiNx), silicon oxide (SiOx), or the like.
- the second encapsulation layer 172 of the encapsulation portion 170 can be formed of an organic materials such as an acrylic resin, an epoxy resin, a phenolic resin, a polyamide resin, a polyimide resin, or the like.
- a driving current corresponding to a gate signal supplied through a corresponding gate line and a data signal supplied through a corresponding data line can be supplied to each light emitting element 500 .
- a driving circuit electrically connected to the light emitting element 500 can be located in each pixel.
- the driving circuit can control the operation of the light emitting element 500 according to the gate signal and the data signal.
- the driving circuit can include a second thin film transistor 300 , and a storage capacitor 710 .
- the second thin film transistor 300 can be formed through a process different from the first thin film transistor 200 of the first area DA.
- the second thin film transistor 300 can be located on a second separation insulating film 130 of the first thin film transistor 200 .
- the second separation insulating film 130 can include an insulating material.
- the second separation insulating film 130 can include a material different from the first interlayer insulating film 240 .
- the second separation insulating film 130 can include a silicon oxide-based (SiOx) material.
- the structure of the second thin film transistor 300 can include a second semiconductor pattern 310 , a second gate insulating film 320 , a second gate electrode 330 , and a second interlayer insulating film 340 , a second source electrode 350 , and a second drain electrode 360 .
- the second semiconductor pattern 310 can be located close to the second separation insulating film 130 .
- the second semiconductor pattern 310 can directly contact the second separation insulating film 130 .
- the second semiconductor pattern 310 can include a semiconductor material.
- the second semiconductor pattern 310 can include an oxide semiconductor such as IGZO, or the like.
- the second semiconductor pattern 310 can include a second source region, a second drain region, and a second channel region.
- the second channel region can be located between the second source region and the second drain region. Resistance of the second source region and resistance of the second drain region can be lower than resistance of the second channel region.
- the second source region and the second drain region can be regions modified to act as a conducting material.
- the second channel region can be a region not modified to act as a conducting material.
- a doping process can be performed for enabling the second source region and the second drain region to act as a conducting material.
- the second gate insulating film 320 can be located on the second semiconductor pattern 310 .
- the second gate insulating film 320 can include an insulating material.
- the second gate insulating film 320 can include a silicon oxide-based (SiOx) material, a silicon nitride-based (SiNx) material, and/or a material with a high dielectric constant (high-k) material.
- the second gate insulating film 320 can have a multilayer structure.
- the second gate electrode 330 can be located on the second gate insulating film 320 .
- the second gate electrode 330 can overlap a second channel region of the second semiconductor pattern 310 .
- the second gate insulating film 320 can include a second source contact hole and a second drain contact hole which expose at least a part of the second source region, and at least a part of the second drain region, of the second semiconductor pattern 310 , respectively.
- the second gate electrode 330 can include a conductive material.
- the second gate electrode 330 can include a metal such as aluminum (Al), chromium (Cr), copper (Cu), titanium (Ti), molybdenum (Mo), tungsten (W), or the like.
- the second interlayer insulating film 340 can be disposed on or over the second semiconductor pattern 310 and the second gate electrode 330 .
- the second interlayer insulating film 340 can include an insulating material.
- the second interlayer insulating film 340 can include a material different from the first interlayer insulating film 240 .
- the second interlayer insulating film 340 can include a silicon oxide-based material (SiOx).
- the second source electrode 350 can be located on the second interlayer insulating film 340 .
- the second source electrode 350 can be electrically connected to the second source region of the second semiconductor pattern 310 .
- the second interlayer insulating film 340 can include a second source contact hole exposing at least a part of the second source region of the second semiconductor pattern 310 .
- a part of the second source electrode 350 can overlap the second source region of the second semiconductor pattern 310 .
- the second source electrode 350 can include a conductive material.
- the second source electrode 350 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the second source electrode 350 can include the same material as the first source electrode 250 .
- the second drain electrode 360 can be located on the second interlayer insulating film 340 .
- the second drain electrode 360 can be electrically connected to the second drain region of the second semiconductor pattern 310 .
- the second interlayer insulating film 340 can include a second drain contact hole exposing at least a part of the second drain region of the second semiconductor pattern 310 .
- a part of the second drain electrode 360 can overlap the second drain region of the second semiconductor pattern 310 .
- the second drain electrode 360 can include a conductive material.
- the second drain electrode 360 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the second drain electrode 360 can include the same material as the second source electrode 350 .
- the second drain electrode 360 can be formed by the same process as the second source electrode 350 .
- the second source electrode 350 and the second drain electrode 360 can have a multilayer structure.
- the second source electrode 350 and the second drain electrode 360 can be made up of three layers.
- the top layer and the bottom layer can be a titanium (Ti) metal layer
- the intermediate layer located between the top layer and the bottom layer can be an aluminum (Al) metal layer.
- the storage capacitor 710 can be formed between the substrate 100 and the second thin film transistor 300 .
- the storage capacitor 710 can include a first storage electrode 711 disposed on the same layer as the first gate electrode 230 disposed in the first area DA, and a second storage electrode 712 disposed in the same layer as the second storage electrode 420 disposed in the first area DA and located on the first storage electrode 711 .
- the second electrode 530 A disposed in the second area is located within an area overlapping the capacitor electrode 711 disposed in the second area.
- the thin film transistor 300 disposed in the first area is disposed in a layer different from a layer in which a thin film transistor 300 disposed in the second area is disposed.
- the first storage electrode 711 can include a conductive material.
- the first storage electrode 711 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first storage electrode 711 can include the same material as the first gate electrode 230 of the first area DA.
- the first storage electrode 711 can be formed by the same process as the first gate electrode 230 of the first area DA.
- the second storage electrode 712 can include a conductive material.
- the second storage electrode 712 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the first interlayer insulating film 240 can extend to run between the first storage electrode 711 and the second storage electrode 712 .
- the second storage electrode 712 can be located on the first interlayer insulating film 240 .
- the first separation insulating film 120 can include an insulating material.
- the first separation insulating film 120 can include a silicon oxide-based material (SiOx) and/or a silicon nitride-based material (SiNx).
- the first separation insulating film 120 can have a multilayer structure.
- the first storage electrode 711 can be electrically connected to the second drain electrode 360 of the second thin film transistor 300 .
- a first intermediate electrode 610 can be disposed that is connected to the first storage electrode 711 by passing through the first interlayer insulating film 240 , the first separation insulating film 120 , the second separation insulating film 130 , the second gate insulating film 320 , and the second interlayer insulating film 340 .
- the second drain electrode 360 can be connected to the first intermediate electrode 610 .
- the first intermediate electrode 610 can include a conductive material.
- the first intermediate electrode 610 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the second source electrode 350 can include the same material as the second drain electrode 360 .
- the first intermediate electrode 610 can be formed by the same process as the second source electrode 350 and the second drain electrode 360 .
- a buffer insulating film 110 can be located between the substrate 100 and a driving circuit (e.g., at least one thin film transistor and at least one storage capacitor) of each sub-pixel.
- the buffer insulating film 110 can prevent contamination by the substrate 100 in a process of forming the driving circuit.
- the buffer insulating film 110 can include a silicon oxide-based (SiOx) material and/or a silicon nitride-based (SiNx) material.
- the buffer insulating film 110 can have a multilayer structure.
- the buffer insulating film 110 can have a stacked structure including a first buffer insulating film 111 and a second buffer insulating film 112 including a material different from the first buffer insulating film 111 .
- a first planarization layer 140 and a second planarization layer 150 can be sequentially stacked between the second thin film transistor 300 and the light emitting element 500 of each sub-pixel.
- the first planarization layer 140 and the second planarization layer 150 can remove a step difference due to a driving circuit of each pixel.
- a surface of the second planarization layer 150 facing the light emitting element 500 of each sub-pixel can be a flat surface.
- the first planarization layer 140 and the second planarization layer 150 can include an insulating material.
- the first planarization layer 140 and the second planarization layer 150 can include a material different from the second interlayer insulating film 340 .
- the first planarization layer 140 and the second planarization layer 150 can include an organic insulating material.
- the second planarization layer 150 can include a material different from the first planarization layer 140 .
- the light emitting element 500 of each sub-pixel can be electrically connected to the second thin film transistor 300 of the corresponding pixel, and the first electrode 510 can be electrically connected to the second drain electrode 360 through a first connection electrode 620 .
- the first connection electrode 620 can be located between the first planarization layer 140 and the second planarization layer 150 .
- the first connection electrode 620 can be connected to the second drain electrode 360 by passing through the first planarization layer 140
- the first electrode 510 can be connected to the first connection electrode 620 by passing through the second planarization layer 150 .
- the first connection electrode 620 can include a conductive material.
- the first connection electrode 620 can include a metal such as aluminum (Al), chromium (Cr), molybdenum (Mo), tungsten (W), titanium (Ti), copper (Cu), or the like.
- the light emitting element 500 of each sub-pixel can be independently driven.
- the first electrode 510 of each sub-pixel can be insulated from the first electrode 510 of an adjacent sub-pixel.
- An edge of each first electrode 510 can be covered by a bank/spacer insulating film 160 including a bank insulating film 161 and a spacer insulating film 162 .
- the bank/spacer insulating film 160 can be located on the second planarization layer 150 .
- the emission layer 520 and the second electrode 530 A of each pixel can be disposed on the corresponding first electrode 510 exposed by the bank/spacer insulating film 160 .
- the bank/spacer insulating film 160 can include an insulating material.
- the bank/spacer insulating film 160 can include an organic insulating material.
- the bank/spacer insulating film 160 can include a material different from that of the second planarization layer 150 .
- At least a part of the emission layer 520 of each sub-pixel can extend to run along the bank/spacer insulating film 160 .
- the first organic layer and the second organic layer of each sub-pixel can be connected to the first organic layer and the second organic layer of an adjacent sub-pixel, respectively.
- the light emitting material layer EML of each sub-pixel can be spaced apart from the light emitting material layer EML of an adjacent sub-pixel.
- a part of the second electrode 530 A of each pixel corresponding to the light-transmitting portion AG of the second area CA can be removed through a laser patterning process.
- the second electrode 530 A can be removed by using the first storage electrode 711 as a mask.
- the part of the second electrode 530 A cannot be removed from the laser beam, and as a part of the second electrode 530 A, in which the first storage electrode 711 is not present, is exposed to the laser beam, this part of the second electrode 530 A can be removed to form a light-transmitting portion AG.
- the light-transmitting portion AG can include a part that does not extend onto the bank/spacer insulating film 160 because the second electrode 530 A corresponding to the light-transmitting portion AG is removed.
- the second electrode 530 A of each sub-pixel can include a part not connected to the second electrode 530 A of an adjacent pixel.
- FIGS. 6 and 7 illustrate second areas CA included in the display panel 900 in other embodiments according to aspects of the present disclosure.
- a first thin film transistor 200 , a second thin film transistor 300 , a storage capacitor 400 , and a light emitting element included in a first area DA included in each of the display panels of FIGS. 6 and 7 can be the same as or substantially the same as to those illustrated in FIG. 4 .
- a second thin film transistor 300 , a light emitting element 500 , an encapsulation portion 170 , and a bank/spacer insulating film 160 included in the second area CA thereof can be the same as or substantially the same as to those illustrated in FIG. 5 .
- a storage capacitor 720 includes a first storage electrode 721 , a second storage electrode 722 , and a third storage electrode 723 .
- the first storage electrode 721 and the second storage electrode 722 can be substantially equal to the first storage electrode 711 and the second storage electrode 712 of FIG. 5 .
- the third storage electrode of FIG. 6 can be located on the second separation insulating film 130 and formed of an oxide semiconductor modified to act as a conducting material.
- the third storage electrode 723 can include an oxide semiconductor such as IGZO, and can be modified to act as a conducting material by a doping process.
- a storage capacitor 730 includes a first storage electrode 731 and a second storage electrode 732 .
- the first storage electrode 731 can be substantially equal to the second storage electrode 712 of FIG. 5
- the second storage electrode 732 can be substantially equal to the third storage electrode 723 of FIG. 6 .
- the second storage electrode 732 of FIG. 7 can be located on the second separation insulating film 130 and formed of an oxide semiconductor modified to act as a conducting material.
- the second storage electrode 732 can include an oxide semiconductor such as IGZO, and can be modified to act as a conducting material by a doping process.
- a part of a second electrode 530 B corresponding to a light-transmitting portion AG of the second area CA can be removed through a laser patterning process.
- the second electrode 530 B can be removed by using the first storage electrode 731 as a mask.
- the part of the second electrode 530 B cannot be removed from the laser beam, and as a part of the second electrode 530 B, in which the first storage electrode 731 is not present, is exposed to the laser beam, this part of the second electrode 530 B can be removed to form a light-transmitting portion AG.
- the light-transmitting portion AG can include a part that does not extend onto the bank/spacer insulating film 160 because the second electrode 530 B corresponding to the light-transmitting portion AG is removed.
- the second electrode 530 B of each sub-pixel can include a part not connected to the second electrode 530 B of an adjacent pixel.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Geometry (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Optics & Photonics (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
Claims (13)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US18/518,019 US12256603B2 (en) | 2020-12-16 | 2023-11-22 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
| US18/674,652 US12433101B2 (en) | 2020-12-16 | 2024-05-24 | Method of fabricating a display panel having at least one light-transmitting portion |
| US19/052,067 US20250194338A1 (en) | 2020-12-16 | 2025-02-12 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2020-0176852 | 2020-12-16 | ||
| KR1020200176852A KR20220086418A (en) | 2020-12-16 | 2020-12-16 | Display panel and method for fabricating the same |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US18/518,019 Continuation US12256603B2 (en) | 2020-12-16 | 2023-11-22 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
| US18/674,652 Division US12433101B2 (en) | 2020-12-16 | 2024-05-24 | Method of fabricating a display panel having at least one light-transmitting portion |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20220190080A1 US20220190080A1 (en) | 2022-06-16 |
| US12058892B2 true US12058892B2 (en) | 2024-08-06 |
Family
ID=79021622
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US17/527,912 Active 2042-04-22 US12058892B2 (en) | 2020-12-16 | 2021-11-16 | Display panel having at least one light-transmitting portion |
| US18/518,019 Active US12256603B2 (en) | 2020-12-16 | 2023-11-22 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
| US18/674,652 Active US12433101B2 (en) | 2020-12-16 | 2024-05-24 | Method of fabricating a display panel having at least one light-transmitting portion |
| US19/052,067 Pending US20250194338A1 (en) | 2020-12-16 | 2025-02-12 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US18/518,019 Active US12256603B2 (en) | 2020-12-16 | 2023-11-22 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
| US18/674,652 Active US12433101B2 (en) | 2020-12-16 | 2024-05-24 | Method of fabricating a display panel having at least one light-transmitting portion |
| US19/052,067 Pending US20250194338A1 (en) | 2020-12-16 | 2025-02-12 | Display panel including a first conductive member in a first area and a second conductive member in a second area |
Country Status (4)
| Country | Link |
|---|---|
| US (4) | US12058892B2 (en) |
| EP (2) | EP4016634B1 (en) |
| KR (1) | KR20220086418A (en) |
| CN (2) | CN114639699A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116801659B (en) * | 2023-08-01 | 2023-12-22 | 惠科股份有限公司 | Display panel and display device |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003008205A (en) * | 2001-06-21 | 2003-01-10 | Nitto Denko Corp | Printed circuit board and manufacturing method thereof |
| US20150243722A1 (en) | 2014-02-25 | 2015-08-27 | Lg Display Co., Ltd. | Organic light emitting display device |
| CN106398551A (en) | 2016-08-31 | 2017-02-15 | 桐乡嘉力丰实业股份有限公司 | Mildew-resistant type wallpaper adhesive containing natural plant extract and preparation method thereof |
| US20170345881A1 (en) | 2016-05-26 | 2017-11-30 | Samsung Display Co., Ltd | Organic light-emitting display device and method of manufacturing the same |
| KR20180012442A (en) * | 2016-07-27 | 2018-02-06 | 엘지디스플레이 주식회사 | Hybrid Thin Film Transistor And Organic Light Emitting Display Using The Same |
| US10283529B2 (en) | 2015-12-21 | 2019-05-07 | Samsung Display Co., Ltd. | Method of manufacturing thin-film transistor, thin-film transistor substrate, and flat panel display apparatus |
| US20190180073A1 (en) | 2017-12-13 | 2019-06-13 | Boe Technology Group Co., Ltd. | Fingerprint identification display panel and fabricating method thereof, fingerprint identification display device |
| CN111029390A (en) | 2019-12-23 | 2020-04-17 | 武汉天马微电子有限公司 | Display panel, driving method thereof and display device |
| CN111710707A (en) | 2020-06-30 | 2020-09-25 | 湖北长江新型显示产业创新中心有限公司 | A display panel and display device |
| US20200373372A1 (en) | 2019-05-23 | 2020-11-26 | Samsung Display Co., Ltd. | Display device |
| US20210193782A1 (en) * | 2019-12-23 | 2021-06-24 | Samsung Display Co., Ltd. | Display panel and electronic device including the same |
| US20210241671A1 (en) * | 2020-02-03 | 2021-08-05 | Samsung Display Co., Ltd. | Display device |
| EP3933931A1 (en) | 2020-07-02 | 2022-01-05 | LG Display Co., Ltd. | Display panel and method of fabricating the same |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105929593A (en) * | 2016-07-11 | 2016-09-07 | 京东方科技集团股份有限公司 | Array substrate, transparent display substrate and transparent display device |
| US11063091B2 (en) * | 2018-08-10 | 2021-07-13 | Au Optronics Corporation | Display panel |
| US11489032B2 (en) * | 2019-04-03 | 2022-11-01 | Boe Technology Group Co., Ltd. | Display panel and display device with light shielding portions having curved profile |
| KR102814725B1 (en) * | 2019-05-13 | 2025-05-30 | 삼성디스플레이 주식회사 | Display apparatus |
-
2020
- 2020-12-16 KR KR1020200176852A patent/KR20220086418A/en active Pending
-
2021
- 2021-09-24 CN CN202111123486.4A patent/CN114639699A/en active Pending
- 2021-09-24 CN CN202411635578.4A patent/CN119604139A/en active Pending
- 2021-11-16 US US17/527,912 patent/US12058892B2/en active Active
- 2021-12-06 EP EP21212635.3A patent/EP4016634B1/en active Active
- 2021-12-06 EP EP25198395.3A patent/EP4633338A3/en active Pending
-
2023
- 2023-11-22 US US18/518,019 patent/US12256603B2/en active Active
-
2024
- 2024-05-24 US US18/674,652 patent/US12433101B2/en active Active
-
2025
- 2025-02-12 US US19/052,067 patent/US20250194338A1/en active Pending
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003008205A (en) * | 2001-06-21 | 2003-01-10 | Nitto Denko Corp | Printed circuit board and manufacturing method thereof |
| US20150243722A1 (en) | 2014-02-25 | 2015-08-27 | Lg Display Co., Ltd. | Organic light emitting display device |
| US10283529B2 (en) | 2015-12-21 | 2019-05-07 | Samsung Display Co., Ltd. | Method of manufacturing thin-film transistor, thin-film transistor substrate, and flat panel display apparatus |
| US20170345881A1 (en) | 2016-05-26 | 2017-11-30 | Samsung Display Co., Ltd | Organic light-emitting display device and method of manufacturing the same |
| KR20180012442A (en) * | 2016-07-27 | 2018-02-06 | 엘지디스플레이 주식회사 | Hybrid Thin Film Transistor And Organic Light Emitting Display Using The Same |
| CN106398551A (en) | 2016-08-31 | 2017-02-15 | 桐乡嘉力丰实业股份有限公司 | Mildew-resistant type wallpaper adhesive containing natural plant extract and preparation method thereof |
| US20190180073A1 (en) | 2017-12-13 | 2019-06-13 | Boe Technology Group Co., Ltd. | Fingerprint identification display panel and fabricating method thereof, fingerprint identification display device |
| US20200373372A1 (en) | 2019-05-23 | 2020-11-26 | Samsung Display Co., Ltd. | Display device |
| CN111029390A (en) | 2019-12-23 | 2020-04-17 | 武汉天马微电子有限公司 | Display panel, driving method thereof and display device |
| US20210193782A1 (en) * | 2019-12-23 | 2021-06-24 | Samsung Display Co., Ltd. | Display panel and electronic device including the same |
| US11119596B2 (en) | 2019-12-23 | 2021-09-14 | Wuhan Tianma Micro-Electronics Co., Ltd. | Display panel and driving method, and display device |
| US20210241671A1 (en) * | 2020-02-03 | 2021-08-05 | Samsung Display Co., Ltd. | Display device |
| CN111710707A (en) | 2020-06-30 | 2020-09-25 | 湖北长江新型显示产业创新中心有限公司 | A display panel and display device |
| US11515375B2 (en) | 2020-06-30 | 2022-11-29 | Hubei Yangtze Industrial Innovation Center of Advanced Display Co., Ltd. | Display panel and display device |
| EP3933931A1 (en) | 2020-07-02 | 2022-01-05 | LG Display Co., Ltd. | Display panel and method of fabricating the same |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20220086418A (en) | 2022-06-23 |
| US20250194338A1 (en) | 2025-06-12 |
| US12256603B2 (en) | 2025-03-18 |
| US12433101B2 (en) | 2025-09-30 |
| EP4016634A1 (en) | 2022-06-22 |
| US20240315079A1 (en) | 2024-09-19 |
| US20240090268A1 (en) | 2024-03-14 |
| EP4016634B1 (en) | 2025-09-17 |
| CN114639699A (en) | 2022-06-17 |
| US20220190080A1 (en) | 2022-06-16 |
| EP4633338A2 (en) | 2025-10-15 |
| EP4633338A3 (en) | 2026-01-07 |
| CN119604139A (en) | 2025-03-11 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8963129B2 (en) | Organic light emitting display device | |
| US12189911B2 (en) | Display device | |
| US11737329B2 (en) | Display apparatus having column spacer between emission panel and color panel | |
| CN121127044A (en) | Display device | |
| US12120912B2 (en) | Display device having lower density pixels in area overlapping with camera module | |
| US12069906B2 (en) | Display device | |
| CN113644220A (en) | Display panel, preparation method of display panel and display device | |
| US12501772B2 (en) | Display panel and display device including the same for light transmittance in light-transmitting areas and enhancing reliability of display panel | |
| US20250151510A1 (en) | Display apparatus | |
| US20250194338A1 (en) | Display panel including a first conductive member in a first area and a second conductive member in a second area | |
| CN118284211A (en) | Display device | |
| US20240114749A1 (en) | Display device and manufacturing method thereof | |
| US20250204228A1 (en) | Display apparatus having light-emitting devices |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
| AS | Assignment |
Owner name: LG DISPLAY CO., LTD., KOREA, REPUBLIC OF Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SHIN, MINHEE;KANG, MINHA;YOO, JUHNSUK;AND OTHERS;REEL/FRAME:058161/0310 Effective date: 20211015 |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS |
|
| ZAAA | Notice of allowance and fees due |
Free format text: ORIGINAL CODE: NOA |
|
| ZAAB | Notice of allowance mailed |
Free format text: ORIGINAL CODE: MN/=. |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED |
|
| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
| STPP | Information on status: patent application and granting procedure in general |
Free format text: AWAITING TC RESP., ISSUE FEE NOT PAID |
|
| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |