US11807792B2 - Semiconductor processing liquid and method for processing substrate - Google Patents

Semiconductor processing liquid and method for processing substrate Download PDF

Info

Publication number
US11807792B2
US11807792B2 US17/181,352 US202117181352A US11807792B2 US 11807792 B2 US11807792 B2 US 11807792B2 US 202117181352 A US202117181352 A US 202117181352A US 11807792 B2 US11807792 B2 US 11807792B2
Authority
US
United States
Prior art keywords
processing liquid
semiconductor processing
acid
etching
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US17/181,352
Other versions
US20210324271A1 (en
Inventor
Takahiro Eto
Lihong Liu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Priority to US17/181,352 priority Critical patent/US11807792B2/en
Priority to TW110106793A priority patent/TW202200756A/en
Priority to JP2021028789A priority patent/JP2021150644A/en
Assigned to TOKYO OHKA KOGYO CO., LTD. reassignment TOKYO OHKA KOGYO CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ETO, TAKAHIRO, LIU, LIHONG
Publication of US20210324271A1 publication Critical patent/US20210324271A1/en
Priority to US17/812,587 priority patent/US11773324B2/en
Application granted granted Critical
Publication of US11807792B2 publication Critical patent/US11807792B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00—Etching, surface-brightening or pickling compositions
    • C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00—Etching, surface-brightening or pickling compositions
    • C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/06—Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00—Etching, surface-brightening or pickling compositions
    • C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
    • C09K13/08—Etching, surface-brightening or pickling compositions containing an inorganic acid containing a fluorine compound
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604—Chemical etching
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105—After-treatment
    • H01L21/311—Etching the insulating layers by chemical or physical means
    • H01L21/31105—Etching inorganic layers
    • H01L21/31111—Etching inorganic layers by chemical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321—After treatment
    • H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
    • H01L21/32134—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
    • H10P50/283—
    • H10P50/642—
    • H10P50/667—

Definitions

  • the present invention relates to a semiconductor processing liquid and a method for processing a substrate.
  • a conductive metal film deposited by CVD or an insulating film such as a SiO 2 film is formed on a substrate such as a silicon wafer or glass.
  • a photoresist is uniformly coated onto the conductive metal film or the insulating film and selectively exposed and subjected to a development process to form a photoresist pattern.
  • the conductive metal film or the insulating film is selectively etched to form a fine circuit, and then an unnecessary photoresist layer is removed with a stripping solution to carry out the manufacturing.
  • Japanese Unexamined Patent Publication No. 2007-150118 discloses a chemical solution in which hydrogen fluoride and two types of solvent satisfying specific requirements are combined as a microfabrication processing agent capable of selectively microfabricating only a high dielectric constant film.
  • Japanese Unexamined Patent Publication No. 2015-108041 discloses a cleaning composition including a fluorine-containing compound and hexafluoroisopropyl alcohol (1,1,1,3,3,3-hexafluoro-2-propanol) and that such a cleaning composition makes it possible to obtain a material capable of selectively etching a boron phosphorus glass film with respect to a thermal oxide film.
  • the present invention was made in view of the above problems and has an object of providing a semiconductor processing liquid capable of processing, with high selectivity, only a desired material among various types of constituent materials present in a semiconductor substrate.
  • the present inventors conducted intensive research focusing on the components contained in the semiconductor processing liquid. As a result, it was found that it is possible to solve the problems described above through the inclusion of a specific organic solvent, thereby completing the present invention. More specifically, the present invention provides the following.
  • the present invention provides a semiconductor processing liquid including hydrofluoric acid (A), and an organic solvent (B), in which the organic solvent (B) contains a compound represented by Formula (1).
  • A hydrofluoric acid
  • B organic solvent
  • the present invention provides a method for processing a substrate including a step of bringing the semiconductor processing liquid described above into contact with a semiconductor substrate.
  • a semiconductor processing liquid capable of processing, with high selectivity, only a desired material among various types of constituent materials present in a semiconductor substrate.
  • a semiconductor processing liquid according to a first aspect of the present invention includes hydrofluoric acid (A) and an organic solvent (B).
  • the semiconductor processing liquid according to the present embodiment includes hydrofluoric acid (DHF).
  • DHF hydrofluoric acid
  • the content ratio of hydrofluoric acid in the entire semiconductor processing liquid is preferably 0.001% by mass or more and 1.0% by mass or less, more preferably 0.005% by mass or more and 0.5% by mass or less, even more preferably 0.01% by mass or more and 0.3% by mass or less, and yet more preferably 0.05% by mass or more and 0.2% by mass or less.
  • the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is easily improved.
  • the uniformity of etching in the wafer is easily improved.
  • the organic solvent (B) includes a compound represented by Formula (1) (may be referred to below as “compound (1)”).
  • Compound (1) may be referred to below as “compound (1)”.
  • examples of the alkylene group having 1 to 6 carbon atoms in X 1 include a linear alkylene group and a branched chain alkylene group.
  • linear alkylene group examples include a methylene group [—CH 2 —], an ethylene group [—(CH 2 ) 2 —], a trimethylene group [—(CH 2 ) 3 —], a tetramethylene group [—(CH 2 ) 4 —], a pentamethylene group [—(CH 2 ) 5 —], a hexamethylene group [—(CH 2 ) 6 —] and the like.
  • Examples of the branched chain alkylene group include alkylalkylene groups such as alkylmethylene groups such as —CH(CH 3 )—, —CH(CH 2 CH 3 )—, —C(CH 3 ) 2 —, —C(CH 3 )(CH 2 CH 3 )—, —C(CH 3 )(CH 2 CH 2 CH 3 )—, and —C(CH 2 CH 3 ) 2 —; alkylethylene groups such as —CH(CH 3 )CH 2 —, —CH(CH 3 )CH(CH 3 )—, —C(CH 3 ) 2 CH 2 —, —CH(CH 2 CH 3 )CH 2 —, and —C(CH 2 CH 3 ) 2 —CH 2 —; alkyltrimethylene groups such as —CH(CH 3 )CH 2 CH 2 —, and —CH 2 CH(CH 3 )CH 2 —; alkyltetramethylene groups such as —CH(CH
  • X 1 a single bond, a methylene group [—CH 2 —], an ethylene group [—(CH 2 ) 2 ], and a trimethylene group [—(CH 2 ) 3 —] or —CH(CH 2 CH 3 )—, —CH(CH 3 )CH 2 CH 2 —, —CH 2 CH 2 —O—CH 2 CH 2 — or —CH(CH 2 CH 3 )— are preferable.
  • Y 10 is one selected from the group consisting of —O—, —(C ⁇ O)—, —O—(C ⁇ O)—, and —(C ⁇ O)—O—, and —O—, —(C ⁇ O)—, or —O—(C ⁇ O)— is preferable.
  • X 1 is a single bond
  • Y 10 is not —O—.
  • Y 20 is one selected from the group consisting of —(C ⁇ O)—, —O—(C ⁇ O)—, and —(C ⁇ O)—O—.
  • examples of the alkylene groups having 1 to 6 carbon atoms in which an ether bond may be interposed in Y 11 and Y 21 include alkylene groups having 1 to 6 carbon atoms in X 1 , groups in which an ether group is interposed in an alkylene group having 1 to 6 carbon atoms in X 1 , and the like.
  • Y 11 a single bond, a methylene group [—CH 2 —], a trimethylene group [—(CH 2 ) 3 —], —O—CH 2 — or —O—C 3 H 6 — is preferable.
  • Y 21 a single bond or a methylene group [—CH 2 —] is preferable.
  • compound (1) at least one type selected from the group consisting of diethyl oxalate, diethyl malonate, diethyl succinate, propylene glycol monomethyl ether acetate, dipropylene glycol methyl ether acetate, acetylacetone, 3-methoxy-3-methyl-1-butyl acetate, 3-methoxy-1-butyl acetate, diethyleneglycol monobutyl ether acetate and propyleneglycol diacetate is preferable.
  • one type may be used alone, or two or more types may be used in combination.
  • the ratio of the compound (1) in the organic solvent (B) is preferably 50% by mass or more with respect to the total mass of the organic solvent (B), more preferably 75% by mass or more, and may be 100% by mass.
  • the organic solvent (B) may contain an organic solvent other than the compound (1).
  • organic solvents other than the compound (1) include organic carboxylic acid solvents (for example, acetic acid, formic acid, and the like), alcohol-based solvents (for example, methanol, ethanol, ethylene glycol, propylene glycol, glycerin, 1,3-propanediol, 1,3-butanediol, 1,4-butanediol, diethylene glycol, dipropylene glycol, furfuryl alcohol, and 2-methyl-2,4-pentanediol, and the like), dimethyl sulfoxide, ether-based solvents (for example, tetrahydrofuran, ethylene glycol dimethyl ether, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, and propylene glycol dimethyl ether), acetone, acetonitrile, and the like.
  • organic carboxylic acid solvents for example, acetic acid, formic acid, and the like
  • the ratio of the organic solvent (B) in the entire semiconductor processing liquid of the present embodiment is preferably 70% by mass or more and 99.999% by mass or less, more preferably 80% by mass or more and 99.99% by mass or less, even more preferably 90% by mass or more and 99.95% by mass or less, and yet more preferably 95% by mass or more and 99.9% by mass or less.
  • the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is improved.
  • the semiconductor processing liquid of the present embodiment may include other components in addition to the components described above in a range in which the effects of the present invention are not impaired.
  • other components include water, a pH adjuster, a surfactant, an oxidizing agent, and the like.
  • the semiconductor processing liquid of the present embodiment preferably includes water as a solvent for the components described above. Water may include trace components which are inevitably mixed therein.
  • the water used for the semiconductor processing liquid of the present embodiment is preferably water subjected to a purification treatment such as distilled water, ion-exchanged water, and ultrapure water, and more preferably ultrapure water generally used for semiconductor manufacturing.
  • the content of water in the semiconductor processing liquid of the present embodiment is not particularly limited, but is preferably 0.001% by mass or more, more preferably 0.01% by mass or more, and even more preferably 0.05% by mass or more.
  • the upper limit value is not particularly limited, but is preferably less than 1.0% by mass, more preferably 0.5% by mass or less, and even more preferably 0.3% by mass or less.
  • the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
  • the semiconductor processing liquid of the present embodiment may include a pH adjuster within a range which does not impair the object of the present invention.
  • At least one type selected from the group consisting of acids and salts thereof is preferable.
  • examples thereof include methanesulfonic acid, trifluoromethanesulfonic acid, oxalic acid dihydrate, citric acid, tartaric acid, picolinic acid, succinic acid, acetic acid, lactic acid, sulfosuccinic acid, benzoic acid, propionic acid, formic acid, pyruvate, maleic acid, malonic acid, fumaric acid, malic acid, ascorbic acid, mandelic acid, heptanic acid, butyric acid, valeric acid, glutaric acid, phthalic acid, hypophosphoric acid, salicylic acid, 5-sulfosalicylic acid, hydrochloric acid, ethanesulfonic acid, butane sulfonic acid, p-toluene sulfonic acid, dichloroacetic acid, difluoroacetic acid, monochlor
  • the semiconductor processing liquid of the present embodiment may include a basic compound as a pH adjuster. It is possible to use organic alkaline compounds and inorganic alkaline compounds as such basic compounds and suitable examples of the organic alkaline compound include quaternary ammonium salts including organic quaternary ammonium hydroxides, salts of alkylamines such as trimethylamine and triethylamine and derivatives thereof.
  • examples of inorganic alkaline compounds include inorganic compounds including alkali metals or alkaline earth metals and salts thereof. Examples thereof include lithium hydroxide, sodium hydroxide, potassium hydroxide, rubidium hydroxide, cesium hydroxide, and the like.
  • one type of pH adjuster may be used alone, or two or more types may be used in combination.
  • the content of the pH adjuster is, for example, 0.01 to 10% by mass with respect to the total mass of the semiconductor processing liquid, preferably 0.02 to 4.5% by mass, more preferably 0.03 to 4% by mass, and even more preferably 0.05 to 3% by mass.
  • the semiconductor processing liquid of the present embodiment may include a passivation agent for germanium.
  • passivation agents include ascorbic acid, L (+)-ascorbic acid, isoascorbic acid, ascorbic acid derivatives, boric acid, ammonium diborate, borate (for example, ammonium pentaborate, sodium tetraborate, and ammonium diborate), alanine, arginine, asparagine, aspartic acid, cysteine, glutamate, glutamine, histidine, isoleucine, leucine, lysine, methionine, phenylalanine, proline, serine, threonine, tryptophan, tyrosine, valine, sodium bromide, potassium bromide, rubidium bromide, magnesium bromide, calcium bromide, ammonium bromide having the formula NR 1 R 2 R 3 R 4 Br (in the formula, R 1 , R 2 , R 3 and R 4 may be the same or different from each other and are selected from the group consisting of hydrogen and branched or straight
  • one type of passivation agent may be used alone, or two or more types may be used in combination.
  • the semiconductor processing liquid of the present embodiment includes a passivation agent, for example, 0.01 to 5% by mass with respect to the total mass of the semiconductor processing liquid is preferable, and 0.1 to 1% by mass is more preferable.
  • the semiconductor processing liquid of the present embodiment may include a surfactant for the purpose of adjusting the wettability of the semiconductor processing liquid with respect to the object to be processed, or the like.
  • a surfactant for the purpose of adjusting the wettability of the semiconductor processing liquid with respect to the object to be processed, or the like.
  • the surfactant it is possible to use a nonionic surfactant, an anionic surfactant, a cationic surfactant, or an amphoteric surfactant, and these may be used in combination.
  • nonionic surfactants include polyalkylene oxide alkylphenyl ether surfactants, polyalkylene oxide alkyl ether surfactants, block polymer surfactants formed of polyethylene oxide and polypropylene oxide, polyoxyalkylene distyrenated phenyl ether surfactants, polyalkylene tribenzylphenyl ether surfactants, acetylene polyalkylene oxide surfactants, and the like.
  • anionic surfactants include alkyl sulfonic acid, alkyl benzene sulfonic acid, alkyl naphthalene sulfonic acid, alkyl diphenyl ether sulfonic acid, fatty acid amide sulfonic acid, polyoxyethylene alkyl ether carboxylic acid, polyoxyethylene alkyl ether acetic acid, polyoxyethylene alkyl ether propionic acid, alkyl phosphonic acid, fatty acid salts, and the like.
  • salts include ammonium salt, sodium salt, potassium salt, tetramethylammonium salt, and the like.
  • cationic surfactants include a quaternary ammonium salt surfactant or an alkyl pyridium surfactant or the like.
  • amphoteric surfactants examples include betaine surfactants, amino acid surfactants, imidazoline surfactants, amine oxide surfactants, and the like.
  • surfactants are generally commercially available. One type of surfactant may be used alone, or two or more types may be used in combination.
  • the semiconductor processing liquid of the present embodiment has a pH of preferably 2.0 or less, more preferably 1.8 or less, even more preferably 1.5 or less, and yet more preferably 1.2 or less.
  • the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
  • the semiconductor processing liquid of the present embodiment has a fluorine ion concentration of preferably 1 ppm or more and 1000 ppm or less, more preferably 5 ppm or more and 500 ppm or less, and even more preferably 10 ppm or more and 300 ppm or less.
  • the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
  • the semiconductor processing liquid of the present embodiment is preferably applied as an etching liquid.
  • the semiconductor processing liquid of the present embodiment to, for example, the processing of residues after dry etching.
  • a ratio (BPS G/TEOS) of the etching rate of a boron phosphorus glass film (BPSG) at 25° C. with respect to the etching rate of the thermal oxide film (TEOS) at 25° C. is preferably 250 or more, more preferably 260 or more, even more preferably 270 or more, and yet more preferably 300 or more.
  • the etching selectivity with respect to BPSG is good.
  • the semiconductor processing liquid of the present embodiment includes hydrofluoric acid (A) and an organic solvent (B), and includes at least a compound (compound (1)) represented by Formula (1) as the organic solvent (B).
  • the compound (1) includes a carbonyl group or a carboxy group in the structure thereof and does not include a hydroxyl group. Therefore, the semiconductor processing liquid of the present embodiment has appropriate hydrophilicity, the hydrofluoric acid is appropriately dissociated into hydrogen ions and fluorine ions, and it is possible to process, with high selectivity, only a desired material.
  • the method for processing a substrate includes a step of bringing the semiconductor processing liquid into contact with a semiconductor substrate.
  • the semiconductor substrate is not particularly limited and examples thereof include various substrates such as a semiconductor wafer, a glass substrate for a photomask, a glass substrate for a liquid crystal display, a glass substrate for a plasma display, a substrate for a Field Emission Display (FED), a substrate for an optical disc, a substrate for a magnetic disk, and substrate for a magneto-optical disc.
  • a substrate used for semiconductor device production is preferable.
  • a thermal oxide film (TEOS), a boron phosphorus glass film (BPSG), or the like is formed on the substrate.
  • the substrate may have various layers and structures as appropriate, such as, for example, metal wiring, a gate structure, a source structure, a drain structure, an insulating layer, a ferromagnetic layer, and a non-magnetic layer.
  • the size, thickness, shape, layer structure, and the like of the substrate are not particularly limited and appropriate selection according to the purpose is possible.
  • Examples of the step of bringing the semiconductor processing liquid into contact with the semiconductor substrate include a step of etching the semiconductor substrate using the semiconductor processing liquid, a step of bringing the semiconductor processing liquid into contact with the surface of the semiconductor substrate after dry etching and removing the residue on the semiconductor substrate, and the like.
  • the etching process method is not particularly limited and it is possible to use a known etching method. Examples of such methods include a spray method, an immersion method, a liquid filling method, or the like, without being limited thereto.
  • the semiconductor substrate is transported or rotated in a predetermined direction, the semiconductor processing liquid is ejected into the space such that the semiconductor processing liquid is brought into contact with the semiconductor substrate.
  • the semiconductor processing liquid may be sprayed while rotating the substrate using a spin coater.
  • the semiconductor substrate is immersed in the semiconductor processing liquid and the semiconductor processing liquid is brought into contact with the semiconductor substrate.
  • the semiconductor processing liquid is filled in the semiconductor substrate and the semiconductor substrate and the semiconductor processing liquid are brought into contact with each other.
  • the amount of the semiconductor processing liquid supplied to the semiconductor substrate may be any amount by which the surface to be processed in the semiconductor substrate is sufficiently wetted by the semiconductor processing liquid.
  • the purpose of the etching process is not particularly limited and may be microfabrication processing for a semiconductor substrate surface to be processed including material to be processed, may be removal of a deposit attached to the semiconductor substrate, or may be cleaning of a semiconductor substrate surface to be processed including a coating film.
  • the temperature at which the etching process is performed is not particularly limited as long as the temperature is a temperature at which the material to be processed dissolves in the semiconductor processing liquid.
  • Examples of the temperature for the etching process include 15° C. to 60° C.
  • the etching rate is increased by increasing the temperature of the semiconductor processing liquid, but it is possible to appropriately select the processing temperature in consideration of suppressing composition changes in the semiconductor processing liquid to be small, or workability, safety, cost, and the like.
  • the time for performing the etching process may be appropriately selected according to the purpose of the etching process, the amount of the material to be processed to be removed by the etching (for example, the thickness of the layer containing the material to be processed, the amount of the deposits of material to be processed, and the like), and the etching process conditions.
  • the method for processing a substrate according to the present embodiment may include other steps in addition to the step of bringing the semiconductor processing liquid into contact with the semiconductor substrate.
  • the other steps are not particularly limited and examples thereof include known steps performed when manufacturing a semiconductor element. Examples of such steps include a step of forming each structure such as channel formation, High-K/metal gate formation, a metal wiring, a gate structure, a source structure, a drain structure, an insulating layer, a ferromagnetic layer, and a non-magnetic layer (layer formation, etching other than the etching process described above, chemical mechanical polishing, modification, and the like), a resist film formation step, an exposure step, a development step, a heating process step, a cleaning step, an inspection step, and the like, without being limited thereto. It is possible to appropriately perform these other steps before or after the etching process step as necessary.
  • the fluorine ion concentration at 25° C. was measured using a fluorine ion meter.
  • the etching rate and selection ratio of each Example with respect to a test substrate on which a boron phosphorus glass film (BPSG) or a TEOS film was formed on the silicon substrate were determined.
  • the etching rate was determined by measuring the film thickness of each film before and after etching using an ellipsometer.
  • the etching rate of each etching liquid is calculated by etching each film using each etching liquid and dividing the difference in film thickness before and after etching by the etching time. The results are shown in Tables 1 to 3.
  • Example 1 Example 2
  • Example 3 Diethyl oxalate Diethyl malonate Diethyl succinate Propylene glycol monomethyl ether acetate Organic solvent pH 1.1 0.9 0.7 0.5 Fluorine 50 100 30 10 ion concen- tration (ppm) BPSG 49.3 39.5 39.2 43.5 etching rate ( ⁇ /min) TEOS 0.10 0.09 0.09 0.09 etching rate ( ⁇ /min) BPSG/ 490 440 435 485 TEOS etching selectivity
  • Example 5 Example 6
  • Example 7 Propylene glycol Acetylacetone 3-methoxy-3- methyl ether acetate methyl-1-butyl acetate Organic solvent pH 1.0 0.2 0.2 Fluorine 210 170 290 ion concen- tration (ppm) BPSG 44.6 60.0 58.1 etching rate ( ⁇ /min) TEOS 0.12 0.15 0.19 etching rate ( ⁇ /min) BPSG/ 370 400
  • Example 10 Organic solvent 3-methoxy-1-butylacetate diethyleneglycol Propyleneglycol monobutyl ether acetate diacetate pH 0.2 0.3 0.8 Fluorine ion 270 160 150 concentration (ppm) BPSG etching 41.7 54.1 40.8 rate ( ⁇ /min) TEOS etching 0.11 0.15 0.10 rate ( ⁇ /min) BPSG/TEOS 320 350 410 etching selectivity

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Inorganic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Weting (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

A semiconductor processing liquid including hydrofluoric acid, and an organic solvent, in which the organic solvent contains a compound represented by the formula below in which X1 is a single bond or an alkylene group having 1 to 6 carbon atoms, in which an ether bond may be interposed, Y10 is one of —O—, —(C═O)—, —O—(C═O)—, and —(C═O)—O—, Y20 is one of —(C═O)—, —O—(C═O)—, and —(C═O)—O—, and Y11 and Y21 are each independently a single bond or an alkylene group having 1 to 6 carbon atoms in which an ether bond may be interposed, provided that, X1, Y11, and Y21 do not contain hydroxyl groups in structures thereof, and when X1 is a single bond, Y10 is not —O—)H3C—Y11—Y10—X1—Y20—Y21—CH3  (1).

Description

Priority is claimed on U.S. Provisional Application No. 62/991,590, filed Mar. 19, 2020, the content of which is incorporated herein by reference.
BACKGROUND OF THE INVENTION Field of the Invention
The present invention relates to a semiconductor processing liquid and a method for processing a substrate.
Description of Related Art
In the manufacturing of semiconductor elements such as ICs and LSIs and liquid crystal panel elements, first, a conductive metal film deposited by CVD or an insulating film such as a SiO2 film is formed on a substrate such as a silicon wafer or glass. Next, a photoresist is uniformly coated onto the conductive metal film or the insulating film and selectively exposed and subjected to a development process to form a photoresist pattern. Then, using this pattern as a mask, the conductive metal film or the insulating film is selectively etched to form a fine circuit, and then an unnecessary photoresist layer is removed with a stripping solution to carry out the manufacturing.
Materials for performing such selective etching are widely studied in the related art. For example, Japanese Unexamined Patent Publication No. 2007-150118 discloses a chemical solution in which hydrogen fluoride and two types of solvent satisfying specific requirements are combined as a microfabrication processing agent capable of selectively microfabricating only a high dielectric constant film.
In addition, Japanese Unexamined Patent Publication No. 2015-108041 discloses a cleaning composition including a fluorine-containing compound and hexafluoroisopropyl alcohol (1,1,1,3,3,3-hexafluoro-2-propanol) and that such a cleaning composition makes it possible to obtain a material capable of selectively etching a boron phosphorus glass film with respect to a thermal oxide film.
CITATION LIST
[Patent Document]
[Patent Document 1]
  • Japanese Unexamined Patent Publication No. 2007-150118
[Patent Document 2]
  • Japanese Unexamined Patent Publication No. 2015-108041
SUMMARY OF THE INVENTION
However, the miniaturization of wiring in semiconductor substrates has progressed further in recent years, creating a situation in which it is difficult to selectively etch only a desired region with the semiconductor processing liquids of the related art.
The present invention was made in view of the above problems and has an object of providing a semiconductor processing liquid capable of processing, with high selectivity, only a desired material among various types of constituent materials present in a semiconductor substrate.
In order to solve the problems described above, the present inventors conducted intensive research focusing on the components contained in the semiconductor processing liquid. As a result, it was found that it is possible to solve the problems described above through the inclusion of a specific organic solvent, thereby completing the present invention. More specifically, the present invention provides the following.
The present invention provides a semiconductor processing liquid including hydrofluoric acid (A), and an organic solvent (B), in which the organic solvent (B) contains a compound represented by Formula (1).
[Chemical Formula 1]
H3C—Y11—Y10—X1—Y20—Y21—CH3  (1)
[In Formula (1),
    • X1 is a single bond or an alkylene group having 1 to 6 carbon atoms, in which an ether bond may be interposed,
    • Y10 is one selected from the group consisting of —O—, —(C═O)—, —O—(C═O)—, and —(C═O)—O—,
    • Y20 is one selected from the group consisting of —(C═O)—, —O—(C═O)—, and —(C═O)—O—,
    • Y11 and Y21 are each independently a single bond or an alkylene group having 1 to 6 carbon atoms in which an ether bond may be interposed,
    • provided that X1, Y11, and Y21 do not contain hydroxyl groups in structures thereof, and, when X1 is a single bond, Y10 is not —O—.]
In addition, the present invention provides a method for processing a substrate including a step of bringing the semiconductor processing liquid described above into contact with a semiconductor substrate.
According to the present invention, there is provided a semiconductor processing liquid capable of processing, with high selectivity, only a desired material among various types of constituent materials present in a semiconductor substrate.
DETAILED DESCRIPTION OF THE INVENTION
A detailed description will be given below of embodiments of the present invention, but the present invention is not limited to the following embodiments and is able to be implemented by adding appropriate modifications within the range of the object of the present invention.
(Semiconductor Processing Liquid)
A semiconductor processing liquid according to a first aspect of the present invention includes hydrofluoric acid (A) and an organic solvent (B).
<Hydrofluoric Acid (A)>
The semiconductor processing liquid according to the present embodiment includes hydrofluoric acid (DHF).
The content ratio of hydrofluoric acid in the entire semiconductor processing liquid is preferably 0.001% by mass or more and 1.0% by mass or less, more preferably 0.005% by mass or more and 0.5% by mass or less, even more preferably 0.01% by mass or more and 0.3% by mass or less, and yet more preferably 0.05% by mass or more and 0.2% by mass or less.
When the content of hydrofluoric acid is within the above ranges, the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is easily improved. In addition, when the content of hydrofluoric acid is within the above ranges, the uniformity of etching in the wafer is easily improved.
<Organic Solvent (B)>
The organic solvent (B) includes a compound represented by Formula (1) (may be referred to below as “compound (1)”).
[Chemical Formula 2]
H3C—Y11—Y10—X1—Y20—Y21—CH3  (1)
[In Formula (1),
    • X1 is a single bond or an alkylene group having 1 to 6 carbon atoms, in which an ether bond may be interposed,
    • Y10 is one selected from the group consisting of —O—, —(C═O)—, —O—(C═O)—, and —(C═O)—O—,
    • Y20 is one selected from the group consisting of —(C═O)—, —O—(C═O)—, and —(C═O)—O—,
    • Y11 and Y21 are each independently a single bond or an alkylene group having 1 to 6 carbon atoms in which an ether bond may be interposed,
    • provided that, X1, Y11, and Y21 do not contain hydroxyl groups in structures thereof, and, when X1 is a single bond, Y10 is not —O—.]
In Formula (1), examples of the alkylene group having 1 to 6 carbon atoms in X1 include a linear alkylene group and a branched chain alkylene group.
Examples of the linear alkylene group include a methylene group [—CH2—], an ethylene group [—(CH2)2—], a trimethylene group [—(CH2)3—], a tetramethylene group [—(CH2)4—], a pentamethylene group [—(CH2)5—], a hexamethylene group [—(CH2)6—] and the like.
Examples of the branched chain alkylene group include alkylalkylene groups such as alkylmethylene groups such as —CH(CH3)—, —CH(CH2CH3)—, —C(CH3)2—, —C(CH3)(CH2CH3)—, —C(CH3)(CH2CH2CH3)—, and —C(CH2CH3)2—; alkylethylene groups such as —CH(CH3)CH2—, —CH(CH3)CH(CH3)—, —C(CH3)2CH2—, —CH(CH2CH3)CH2—, and —C(CH2CH3)2—CH2—; alkyltrimethylene groups such as —CH(CH3)CH2CH2—, and —CH2CH(CH3)CH2—; alkyltetramethylene groups such as —CH(CH3)CH2CH2CH2—, and —CH2CH(CH3)CH2CH2, and the like.
Among the above, as X1, a single bond, a methylene group [—CH2—], an ethylene group [—(CH2)2], and a trimethylene group [—(CH2)3—] or —CH(CH2CH3)—, —CH(CH3)CH2CH2—, —CH2CH2—O—CH2CH2— or —CH(CH2CH3)— are preferable.
In Formula (1), Y10 is one selected from the group consisting of —O—, —(C═O)—, —O—(C═O)—, and —(C═O)—O—, and —O—, —(C═O)—, or —O—(C═O)— is preferable. However, in a case where X1 is a single bond, Y10 is not —O—.
In Formula (1), Y20 is one selected from the group consisting of —(C═O)—, —O—(C═O)—, and —(C═O)—O—.
In Formula (1), examples of the alkylene groups having 1 to 6 carbon atoms in which an ether bond may be interposed in Y11 and Y21 include alkylene groups having 1 to 6 carbon atoms in X1, groups in which an ether group is interposed in an alkylene group having 1 to 6 carbon atoms in X1, and the like.
Among these, as Y11, a single bond, a methylene group [—CH2—], a trimethylene group [—(CH2)3—], —O—CH2— or —O—C3H6— is preferable.
As Y21, a single bond or a methylene group [—CH2—] is preferable.
Among these, as compound (1), at least one type selected from the group consisting of diethyl oxalate, diethyl malonate, diethyl succinate, propylene glycol monomethyl ether acetate, dipropylene glycol methyl ether acetate, acetylacetone, 3-methoxy-3-methyl-1-butyl acetate, 3-methoxy-1-butyl acetate, diethyleneglycol monobutyl ether acetate and propyleneglycol diacetate is preferable.
As the compound (1), one type may be used alone, or two or more types may be used in combination.
The ratio of the compound (1) in the organic solvent (B) is preferably 50% by mass or more with respect to the total mass of the organic solvent (B), more preferably 75% by mass or more, and may be 100% by mass.
The organic solvent (B) may contain an organic solvent other than the compound (1).
Examples of organic solvents other than the compound (1) include organic carboxylic acid solvents (for example, acetic acid, formic acid, and the like), alcohol-based solvents (for example, methanol, ethanol, ethylene glycol, propylene glycol, glycerin, 1,3-propanediol, 1,3-butanediol, 1,4-butanediol, diethylene glycol, dipropylene glycol, furfuryl alcohol, and 2-methyl-2,4-pentanediol, and the like), dimethyl sulfoxide, ether-based solvents (for example, tetrahydrofuran, ethylene glycol dimethyl ether, diethylene glycol dimethyl ether, triethylene glycol dimethyl ether, tetraethylene glycol dimethyl ether, and propylene glycol dimethyl ether), acetone, acetonitrile, and the like.
The ratio of the organic solvent (B) in the entire semiconductor processing liquid of the present embodiment is preferably 70% by mass or more and 99.999% by mass or less, more preferably 80% by mass or more and 99.99% by mass or less, even more preferably 90% by mass or more and 99.95% by mass or less, and yet more preferably 95% by mass or more and 99.9% by mass or less.
When the content of hydrofluoric acid is within the above ranges, the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is improved.
<Other Components>
The semiconductor processing liquid of the present embodiment may include other components in addition to the components described above in a range in which the effects of the present invention are not impaired. Examples of other components include water, a pH adjuster, a surfactant, an oxidizing agent, and the like.
Water (W)
The semiconductor processing liquid of the present embodiment preferably includes water as a solvent for the components described above. Water may include trace components which are inevitably mixed therein. The water used for the semiconductor processing liquid of the present embodiment is preferably water subjected to a purification treatment such as distilled water, ion-exchanged water, and ultrapure water, and more preferably ultrapure water generally used for semiconductor manufacturing.
The content of water in the semiconductor processing liquid of the present embodiment is not particularly limited, but is preferably 0.001% by mass or more, more preferably 0.01% by mass or more, and even more preferably 0.05% by mass or more. In addition, the upper limit value is not particularly limited, but is preferably less than 1.0% by mass, more preferably 0.5% by mass or less, and even more preferably 0.3% by mass or less.
When the water content is within the range described above, the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
pH Adjuster
The semiconductor processing liquid of the present embodiment may include a pH adjuster within a range which does not impair the object of the present invention.
As the pH adjuster, at least one type selected from the group consisting of acids and salts thereof is preferable. Specifically, examples thereof include methanesulfonic acid, trifluoromethanesulfonic acid, oxalic acid dihydrate, citric acid, tartaric acid, picolinic acid, succinic acid, acetic acid, lactic acid, sulfosuccinic acid, benzoic acid, propionic acid, formic acid, pyruvate, maleic acid, malonic acid, fumaric acid, malic acid, ascorbic acid, mandelic acid, heptanic acid, butyric acid, valeric acid, glutaric acid, phthalic acid, hypophosphoric acid, salicylic acid, 5-sulfosalicylic acid, hydrochloric acid, ethanesulfonic acid, butane sulfonic acid, p-toluene sulfonic acid, dichloroacetic acid, difluoroacetic acid, monochloroacetic acid, monofluoroacetic acid, trichloroacetic acid, trifluoroacetic acid, hydrobromic acid (62% by weight), sulfuric acid, ammonium acetate, sodium acetate, potassium acetate, tetramethylammonium acetate and other tetraalkylammonium acetate, phosphonium acetate, ammonium butyrate, ammonium trifluoroacetate, ammonium carbonate, ammonium chloride, ammonium sulfate, phosphoric acid, diammonium hydrogen phosphate, ammonium dihydrogen phosphate, hydrogen phosphate bis(tetramethylammonium), disodium hydrogen phosphate, sodium dihydrogen phosphate, dipotassium hydrogen phosphate, potassium dihydrogen phosphate, ditetraalkylammonium hydrogen phosphate, ditetraalkylammonium dihydrogen phosphate, diphosphonium hydrogen phosphate, phosphonium dihydrogen phosphate, ammonium phosphonate, tetraalkylammonium phosphonate, sodium phosphonate, potassium phosphonate, phosphonium phosphonate, etidronic acid, and salts thereof, and the like.
In addition, the semiconductor processing liquid of the present embodiment may include a basic compound as a pH adjuster. It is possible to use organic alkaline compounds and inorganic alkaline compounds as such basic compounds and suitable examples of the organic alkaline compound include quaternary ammonium salts including organic quaternary ammonium hydroxides, salts of alkylamines such as trimethylamine and triethylamine and derivatives thereof.
In addition, examples of inorganic alkaline compounds include inorganic compounds including alkali metals or alkaline earth metals and salts thereof. Examples thereof include lithium hydroxide, sodium hydroxide, potassium hydroxide, rubidium hydroxide, cesium hydroxide, and the like.
In the semiconductor processing liquid of the present embodiment, one type of pH adjuster may be used alone, or two or more types may be used in combination.
In a case where the semiconductor processing liquid of the present embodiment includes a pH adjuster, the content of the pH adjuster is, for example, 0.01 to 10% by mass with respect to the total mass of the semiconductor processing liquid, preferably 0.02 to 4.5% by mass, more preferably 0.03 to 4% by mass, and even more preferably 0.05 to 3% by mass.
Passivation Agent
The semiconductor processing liquid of the present embodiment may include a passivation agent for germanium.
Examples of passivation agents include ascorbic acid, L (+)-ascorbic acid, isoascorbic acid, ascorbic acid derivatives, boric acid, ammonium diborate, borate (for example, ammonium pentaborate, sodium tetraborate, and ammonium diborate), alanine, arginine, asparagine, aspartic acid, cysteine, glutamate, glutamine, histidine, isoleucine, leucine, lysine, methionine, phenylalanine, proline, serine, threonine, tryptophan, tyrosine, valine, sodium bromide, potassium bromide, rubidium bromide, magnesium bromide, calcium bromide, ammonium bromide having the formula NR1R2R3R4Br (in the formula, R1, R2, R3 and R4 may be the same or different from each other and are selected from the group consisting of hydrogen and branched or straight chain alkyls having 1 to 6 carbon atoms (for example, methyl, ethyl, propyl, butyl, pentyl, or hexyl)), or the like.
In the semiconductor processing liquid of the present embodiment, one type of passivation agent may be used alone, or two or more types may be used in combination.
In a case where the semiconductor processing liquid of the present embodiment includes a passivation agent, for example, 0.01 to 5% by mass with respect to the total mass of the semiconductor processing liquid is preferable, and 0.1 to 1% by mass is more preferable.
Surfactant
The semiconductor processing liquid of the present embodiment may include a surfactant for the purpose of adjusting the wettability of the semiconductor processing liquid with respect to the object to be processed, or the like. As the surfactant, it is possible to use a nonionic surfactant, an anionic surfactant, a cationic surfactant, or an amphoteric surfactant, and these may be used in combination.
Examples of nonionic surfactants include polyalkylene oxide alkylphenyl ether surfactants, polyalkylene oxide alkyl ether surfactants, block polymer surfactants formed of polyethylene oxide and polypropylene oxide, polyoxyalkylene distyrenated phenyl ether surfactants, polyalkylene tribenzylphenyl ether surfactants, acetylene polyalkylene oxide surfactants, and the like.
Examples of anionic surfactants include alkyl sulfonic acid, alkyl benzene sulfonic acid, alkyl naphthalene sulfonic acid, alkyl diphenyl ether sulfonic acid, fatty acid amide sulfonic acid, polyoxyethylene alkyl ether carboxylic acid, polyoxyethylene alkyl ether acetic acid, polyoxyethylene alkyl ether propionic acid, alkyl phosphonic acid, fatty acid salts, and the like. Examples of “salts” include ammonium salt, sodium salt, potassium salt, tetramethylammonium salt, and the like.
Examples of cationic surfactants include a quaternary ammonium salt surfactant or an alkyl pyridium surfactant or the like.
Examples of amphoteric surfactants include betaine surfactants, amino acid surfactants, imidazoline surfactants, amine oxide surfactants, and the like.
These surfactants are generally commercially available. One type of surfactant may be used alone, or two or more types may be used in combination.
The semiconductor processing liquid of the present embodiment has a pH of preferably 2.0 or less, more preferably 1.8 or less, even more preferably 1.5 or less, and yet more preferably 1.2 or less.
Due to the pH of the semiconductor processing liquid being within the preferable range described above, the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
The semiconductor processing liquid of the present embodiment has a fluorine ion concentration of preferably 1 ppm or more and 1000 ppm or less, more preferably 5 ppm or more and 500 ppm or less, and even more preferably 10 ppm or more and 300 ppm or less.
When the content of hydrofluoric acid is within the range described above, the etching selectivity with respect to, for example, a boron phosphorus glass film (BPSG) is more easily improved.
The semiconductor processing liquid of the present embodiment is preferably applied as an etching liquid.
In addition, it is also possible to apply the semiconductor processing liquid of the present embodiment to, for example, the processing of residues after dry etching.
In a case where the semiconductor processing liquid of the present embodiment is applied as an etching liquid, a ratio (BPS G/TEOS) of the etching rate of a boron phosphorus glass film (BPSG) at 25° C. with respect to the etching rate of the thermal oxide film (TEOS) at 25° C. is preferably 250 or more, more preferably 260 or more, even more preferably 270 or more, and yet more preferably 300 or more.
When the BPSG/TEOS ratio is within the preferable range described above, the etching selectivity with respect to BPSG is good.
The semiconductor processing liquid of the present embodiment includes hydrofluoric acid (A) and an organic solvent (B), and includes at least a compound (compound (1)) represented by Formula (1) as the organic solvent (B).
The compound (1) includes a carbonyl group or a carboxy group in the structure thereof and does not include a hydroxyl group. Therefore, the semiconductor processing liquid of the present embodiment has appropriate hydrophilicity, the hydrofluoric acid is appropriately dissociated into hydrogen ions and fluorine ions, and it is possible to process, with high selectivity, only a desired material.
(Method for Processing Substrate)
The method for processing a substrate according to the present embodiment includes a step of bringing the semiconductor processing liquid into contact with a semiconductor substrate. The semiconductor substrate is not particularly limited and examples thereof include various substrates such as a semiconductor wafer, a glass substrate for a photomask, a glass substrate for a liquid crystal display, a glass substrate for a plasma display, a substrate for a Field Emission Display (FED), a substrate for an optical disc, a substrate for a magnetic disk, and substrate for a magneto-optical disc. As the substrate, a substrate used for semiconductor device production is preferable. Typically, a thermal oxide film (TEOS), a boron phosphorus glass film (BPSG), or the like is formed on the substrate. In addition, the substrate may have various layers and structures as appropriate, such as, for example, metal wiring, a gate structure, a source structure, a drain structure, an insulating layer, a ferromagnetic layer, and a non-magnetic layer.
The size, thickness, shape, layer structure, and the like of the substrate are not particularly limited and appropriate selection according to the purpose is possible.
Examples of the step of bringing the semiconductor processing liquid into contact with the semiconductor substrate include a step of etching the semiconductor substrate using the semiconductor processing liquid, a step of bringing the semiconductor processing liquid into contact with the surface of the semiconductor substrate after dry etching and removing the residue on the semiconductor substrate, and the like.
The etching process method is not particularly limited and it is possible to use a known etching method. Examples of such methods include a spray method, an immersion method, a liquid filling method, or the like, without being limited thereto.
In the spray method, for example, the semiconductor substrate is transported or rotated in a predetermined direction, the semiconductor processing liquid is ejected into the space such that the semiconductor processing liquid is brought into contact with the semiconductor substrate. As necessary, the semiconductor processing liquid may be sprayed while rotating the substrate using a spin coater.
In the immersion method, the semiconductor substrate is immersed in the semiconductor processing liquid and the semiconductor processing liquid is brought into contact with the semiconductor substrate.
In the liquid filling method, the semiconductor processing liquid is filled in the semiconductor substrate and the semiconductor substrate and the semiconductor processing liquid are brought into contact with each other.
It is possible to appropriately select these etching process methods depending on the structure, materials, and the like of the semiconductor substrate. In a case of the spray method or the liquid filling method, the amount of the semiconductor processing liquid supplied to the semiconductor substrate may be any amount by which the surface to be processed in the semiconductor substrate is sufficiently wetted by the semiconductor processing liquid.
The purpose of the etching process is not particularly limited and may be microfabrication processing for a semiconductor substrate surface to be processed including material to be processed, may be removal of a deposit attached to the semiconductor substrate, or may be cleaning of a semiconductor substrate surface to be processed including a coating film.
The temperature at which the etching process is performed is not particularly limited as long as the temperature is a temperature at which the material to be processed dissolves in the semiconductor processing liquid. Examples of the temperature for the etching process include 15° C. to 60° C. In a case of any of the spray method, the immersion method, and the liquid filling method, the etching rate is increased by increasing the temperature of the semiconductor processing liquid, but it is possible to appropriately select the processing temperature in consideration of suppressing composition changes in the semiconductor processing liquid to be small, or workability, safety, cost, and the like.
The time for performing the etching process may be appropriately selected according to the purpose of the etching process, the amount of the material to be processed to be removed by the etching (for example, the thickness of the layer containing the material to be processed, the amount of the deposits of material to be processed, and the like), and the etching process conditions.
<Other Steps>
The method for processing a substrate according to the present embodiment may include other steps in addition to the step of bringing the semiconductor processing liquid into contact with the semiconductor substrate. The other steps are not particularly limited and examples thereof include known steps performed when manufacturing a semiconductor element. Examples of such steps include a step of forming each structure such as channel formation, High-K/metal gate formation, a metal wiring, a gate structure, a source structure, a drain structure, an insulating layer, a ferromagnetic layer, and a non-magnetic layer (layer formation, etching other than the etching process described above, chemical mechanical polishing, modification, and the like), a resist film formation step, an exposure step, a development step, a heating process step, a cleaning step, an inspection step, and the like, without being limited thereto. It is possible to appropriately perform these other steps before or after the etching process step as necessary.
EXAMPLES
A more detailed description will be given below of the present invention with reference to Examples, but the present invention is not limited to these Examples.
<Preparation of Semiconductor Processing Liquid>
Examples 1 to 10, Comparative Examples 1 to 8
A 49% hydrofluoric acid aqueous solution was added to the organic solvents shown in Tables 1 to 3 to prepare semiconductor processing liquids for each Example.
[pH of Semiconductor Processing Liquid]
For the semiconductor processing liquid of each Example, the pH at 25° C. was measured using a pH meter. The results are shown in Tables 1 to 3.
[Fluorine Ion Concentration of Semiconductor Processing Liquid]
For the semiconductor processing liquid of each Example, the fluorine ion concentration at 25° C. was measured using a fluorine ion meter.
[Evaluation of Etching Selectivity]
The etching rate and selection ratio of each Example with respect to a test substrate on which a boron phosphorus glass film (BPSG) or a TEOS film was formed on the silicon substrate were determined. The etching rate was determined by measuring the film thickness of each film before and after etching using an ellipsometer. The etching rate of each etching liquid is calculated by etching each film using each etching liquid and dividing the difference in film thickness before and after etching by the etching time. The results are shown in Tables 1 to 3.
TABLE 1
Example 1 Example 2 Example 3 Example 4
Diethyl oxalate Diethyl malonate Diethyl succinate Propylene glycol
monomethyl ether
acetate
Organic solvent
Figure US11807792-20231107-C00001
Figure US11807792-20231107-C00002
Figure US11807792-20231107-C00003
Figure US11807792-20231107-C00004
pH 1.1 0.9 0.7 0.5
Fluorine 50 100 30 10
ion
concen-
tration
(ppm)
BPSG 49.3 39.5 39.2 43.5
etching
rate
(Å/min)
TEOS 0.10 0.09 0.09 0.09
etching
rate
(Å/min)
BPSG/ 490 440 435 485
TEOS
etching
selectivity
Example 5 Example 6 Example 7
Propylene glycol Acetylacetone 3-methoxy-3-
methyl ether acetate methyl-1-butyl
acetate
Organic solvent
Figure US11807792-20231107-C00005
Figure US11807792-20231107-C00006
Figure US11807792-20231107-C00007
pH 1.0 0.2 0.2
Fluorine 210 170 290
ion
concen-
tration
(ppm)
BPSG 44.6 60.0 58.1
etching
rate
(Å/min)
TEOS 0.12 0.15 0.19
etching
rate
(Å/min)
BPSG/ 370 400 305
TEOS
etching
selectivity
TABLE 2
Example 8 Example 9 Example 10
Organic solvent 3-methoxy-1-butylacetate diethyleneglycol Propyleneglycol
monobutyl ether acetate diacetate
Figure US11807792-20231107-C00008
Figure US11807792-20231107-C00009
Figure US11807792-20231107-C00010
pH 0.2 0.3 0.8
Fluorine ion 270 160 150
concentration
(ppm)
BPSG etching 41.7 54.1 40.8
rate (Å/min)
TEOS etching 0.11 0.15 0.10
rate (Å/min)
BPSG/TEOS 320 350 410
etching
selectivity
TABLE 3
Comparative Comparative Comparative Comparative
Example 1 Example 2 Example 3 Example 4
Organic Acetonitrile Dipropylene Triethylene Propylene
solvent glycol glycol glycol
dimethyl monomethyl monomethyl
ether ether ether
Figure US11807792-20231107-C00011
 		CH3OC3H6OC3H6OCH3
Figure US11807792-20231107-C00012
Figure US11807792-20231107-C00013
pH 0.0 1.0 3.9 4.5
Fluorine ion 20 1240 60 2670
concentration
(ppm)
BPSG 563.8 490.8 33.5 34.2
etching rate
(Å/min)
TEOS 2.68 2.39 0.25 0.24
etching rate
(Å/min)
BPSG/TEOS 210 205 133 145
etching
selectivity
Comparative Comparative Comparative Comparative
Example 5 Example 6 Example 7 Example 8
Organic Diethylene Tetraethylene Dimethyl N-ethyl
solvent glycol glycol imidazolidine pyrrolidone
monomethyl
ether
CH3OCH2CH2OCH2CH2OH
Figure US11807792-20231107-C00014
Figure US11807792-20231107-C00015
Figure US11807792-20231107-C00016
pH 7.5 7.7 5.8 10.1
Fluorine ion 570 1970 >9999 >9999
concentration
(ppm)
BPSG 31.4 28.2 7.9 2.1
etching rate
(Å/min)
TEOS 0.23 0.38 1.04 0.13
etching rate
(Å/min)
BPSG/TEOS 136 73 7.6 16
etching
selectivity
From the results shown in Tables 1 to 3, it was confirmed that the semiconductor processing liquids of Examples 1 to 10 had improved BPSG etching selectivity in comparison with the semiconductor processing liquids of Comparative Examples 1 to 8.
While preferred embodiments of the invention have been described and illustrated above, it should be understood that these are exemplary of the invention and are not to be considered as limiting. Additions, omissions, substitutions, and other modifications can be made without departing from the spirit or scope of the present invention. Accordingly, the invention is not to be considered as being limited by the foregoing description, and is only limited by the scope of the appended claims.

Claims (5)

What is claimed is:
1. A semiconductor processing liquid comprising:
hydrofluoric acid; and
an organic solvent,
wherein the organic solvent contains dipropylene glycol methyl ether acetate, a content of the organic solvent is 70% by mass or more of the entire semiconductor processing liquid, and
wherein the semiconductor processing liquid has a pH of 1.2 or less.
2. The semiconductor processing liquid according to claim 1, further comprising water.
3. The semiconductor processing liquid according to claim 1, wherein the semiconductor processing liquid is an etching liquid.
4. The semiconductor processing liquid according to claim 3, wherein a ratio (BPSG/TEOS) of an etching rate of a boron phosphorus glass film (BPSG) at 25*C with respect to an etching rate of a thermal oxide film (TEOS) at 25° C. is 250 or more.
5. A method for processing a substrate comprising bringing the semiconductor processing liquid according to claim 1 into contact with a semiconductor substrate.
US17/181,352 2020-03-19 2021-02-22 Semiconductor processing liquid and method for processing substrate Active US11807792B2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US17/181,352 US11807792B2 (en) 2020-03-19 2021-02-22 Semiconductor processing liquid and method for processing substrate
TW110106793A TW202200756A (en) 2020-03-19 2021-02-25 Semiconductor processing liquid and method for processing substrate
JP2021028789A JP2021150644A (en) 2020-03-19 2021-02-25 Semiconductor processing solution and method for processing substrate
US17/812,587 US11773324B2 (en) 2020-03-19 2022-07-14 Semiconductor processing liquid and method for processing substrate

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202062991590P 2020-03-19 2020-03-19
US17/181,352 US11807792B2 (en) 2020-03-19 2021-02-22 Semiconductor processing liquid and method for processing substrate

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US17/812,587 Division US11773324B2 (en) 2020-03-19 2022-07-14 Semiconductor processing liquid and method for processing substrate

Publications (2)

Publication Number Publication Date
US20210324271A1 US20210324271A1 (en) 2021-10-21
US11807792B2 true US11807792B2 (en) 2023-11-07

Family

ID=78082387

Family Applications (1)

Application Number Title Priority Date Filing Date
US17/181,352 Active US11807792B2 (en) 2020-03-19 2021-02-22 Semiconductor processing liquid and method for processing substrate

Country Status (1)

Country Link
US (1) US11807792B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4561326A3 (en) * 2019-12-05 2025-08-20 Microsoft Technology Licensing LLC Method of selectively etching a metal component

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1150342A1 (en) 1998-11-24 2001-10-31 Daikin Industries, Ltd. Etching solution, etched article and method for etched article
JP2006098421A (en) * 2003-06-10 2006-04-13 Daikin Ind Ltd Removal liquid and removal method for antireflection film containing silicon and filling material
JP2007150118A (en) 2005-11-30 2007-06-14 Stella Chemifa Corp Microfabrication processing agent and microfabrication processing method using same
JP2015108041A (en) 2013-12-03 2015-06-11 ダイキン工業株式会社 Cleaning composition
KR20150112498A (en) * 2014-03-28 2015-10-07 동우 화인켐 주식회사 Non-aquaneous etching composition for silicon-based compound layer
US20160053384A1 (en) * 2013-04-12 2016-02-25 Mitsubishi Gas Chemicalcompany, Inc. Liquid composition used in etching copper - and titanium - containing multilayer film, etching method in which said composition is used, method for manufacturing multilayer-film wiring, and substrate
US20160185595A1 (en) * 2013-07-31 2016-06-30 Advanced Technology Materials, Inc. AQUEOUS FORMULATIONS FOR REMOVING METAL HARD MASK AND POST-ETCH RESIDUE WITH Cu/W COMPATIBILITY
US20170309492A1 (en) * 2015-02-12 2017-10-26 Fujifilm Corporation Removal liquid and method for removing oxide of group iii-v element, treatment liquid for treating compound of group iii-v element, oxidation prevention liquid for preventing oxidation of group iii-v element, treatment liquid for treating semiconductor substrate, and method for producing semiconductor substrate product

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1150342A1 (en) 1998-11-24 2001-10-31 Daikin Industries, Ltd. Etching solution, etched article and method for etched article
JP2006098421A (en) * 2003-06-10 2006-04-13 Daikin Ind Ltd Removal liquid and removal method for antireflection film containing silicon and filling material
JP2007150118A (en) 2005-11-30 2007-06-14 Stella Chemifa Corp Microfabrication processing agent and microfabrication processing method using same
US20160053384A1 (en) * 2013-04-12 2016-02-25 Mitsubishi Gas Chemicalcompany, Inc. Liquid composition used in etching copper - and titanium - containing multilayer film, etching method in which said composition is used, method for manufacturing multilayer-film wiring, and substrate
US20160185595A1 (en) * 2013-07-31 2016-06-30 Advanced Technology Materials, Inc. AQUEOUS FORMULATIONS FOR REMOVING METAL HARD MASK AND POST-ETCH RESIDUE WITH Cu/W COMPATIBILITY
JP2015108041A (en) 2013-12-03 2015-06-11 ダイキン工業株式会社 Cleaning composition
KR20150112498A (en) * 2014-03-28 2015-10-07 동우 화인켐 주식회사 Non-aquaneous etching composition for silicon-based compound layer
US20170309492A1 (en) * 2015-02-12 2017-10-26 Fujifilm Corporation Removal liquid and method for removing oxide of group iii-v element, treatment liquid for treating compound of group iii-v element, oxidation prevention liquid for preventing oxidation of group iii-v element, treatment liquid for treating semiconductor substrate, and method for producing semiconductor substrate product

Also Published As

Publication number Publication date
US20210324271A1 (en) 2021-10-21

Similar Documents

Publication Publication Date Title
JP7282938B2 (en) Compositions and methods for etching silicon nitride-containing substrates
JP7573678B2 (en) Etching solution and method for manufacturing semiconductor device
JP7668626B2 (en) Etching solution and method for manufacturing semiconductor device
US11119410B2 (en) Cleaning liquid, and method of cleaning substrate provided with metal resist
US11131933B2 (en) Cleaning liquid, and method of cleaning substrate provided with metal resist
TWI867126B (en) Etching liquid, and method for manufacturing semiconductor device
US20200190672A1 (en) Etching solution, method for processing object to be processed, and method for manufacturing semiconductor element
US20210104411A1 (en) Etching solution, and method of producing semiconductor device
EP1635224A2 (en) Composition for removing a photoresist residue and polymer residue, and residue removal process using the same
US11773324B2 (en) Semiconductor processing liquid and method for processing substrate
US11807792B2 (en) Semiconductor processing liquid and method for processing substrate
KR101159933B1 (en) Manufacturing method of semiconductor device
JP2024164666A (en) Etching solution, etching method, and semiconductor device manufacturing method
KR20250160922A (en) Method for treating a workpiece, a removal solution for removing boron content, and a method for treating a substrate
KR20240165281A (en) Etching solution, etching method, and method for manufacturing semiconductor device
KR20070013777A (en) Thinner composition for removing photoresist

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

AS Assignment

Owner name: TOKYO OHKA KOGYO CO., LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:ETO, TAKAHIRO;LIU, LIHONG;REEL/FRAME:055499/0880

Effective date: 20210216

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: FINAL REJECTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION

STPP Information on status: patent application and granting procedure in general

Free format text: NON FINAL ACTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: FINAL REJECTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION

STPP Information on status: patent application and granting procedure in general

Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT RECEIVED

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED

STCF Information on status: patent grant

Free format text: PATENTED CASE