US10088376B2 - Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure - Google Patents
Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure Download PDFInfo
- Publication number
- US10088376B2 US10088376B2 US14/820,653 US201514820653A US10088376B2 US 10088376 B2 US10088376 B2 US 10088376B2 US 201514820653 A US201514820653 A US 201514820653A US 10088376 B2 US10088376 B2 US 10088376B2
- Authority
- US
- United States
- Prior art keywords
- light
- material layer
- spectrum analyzer
- pressure
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 12
- 238000001228 spectrum Methods 0.000 claims abstract description 69
- 239000000463 material Substances 0.000 claims abstract description 44
- 230000031700 light absorption Effects 0.000 claims abstract description 24
- 238000000862 absorption spectrum Methods 0.000 claims abstract description 19
- 238000004458 analytical method Methods 0.000 claims abstract description 6
- 238000005102 attenuated total reflection Methods 0.000 claims description 57
- 239000000758 substrate Substances 0.000 claims description 36
- 238000013507 mapping Methods 0.000 claims description 3
- 238000003745 diagnosis Methods 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000010183 spectrum analysis Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/3103—Atomic absorption analysis
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0414—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means using force sensing means to determine a position
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/042—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
- G06F3/0421—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by interrupting or reflecting a light beam, e.g. optical touch-screen
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
- G01L1/241—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/25—Measuring force or stress, in general using wave or particle radiation, e.g. X-rays, microwaves, neutrons
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L11/00—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00
- G01L11/02—Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by means not provided for in group G01L7/00 or G01L9/00 by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
- G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
- G01L9/0076—Transmitting or indicating the displacement of flexible diaphragms using photoelectric means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N2021/178—Methods for obtaining spatial resolution of the property being measured
- G01N2021/1785—Three dimensional
- G01N2021/1787—Tomographic, i.e. computerised reconstruction from projective measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
- G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
- G06F2203/04104—Multi-touch detection in digitiser, i.e. details about the simultaneous detection of a plurality of touching locations, e.g. multiple fingers or pen and finger
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
- G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
- G06F2203/04109—FTIR in optical digitiser, i.e. touch detection by frustrating the total internal reflection within an optical waveguide due to changes of optical properties or deformation at the touch location
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/0304—Detection arrangements using opto-electronic means
- G06F3/0325—Detection arrangements using opto-electronic means using a plurality of light emitters or reflectors or a plurality of detectors forming a reference frame from which to derive the orientation of the object, e.g. by triangulation or on the basis of reference deformation in the picked up image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/042—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/042—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
- G06F3/0421—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by interrupting or reflecting a light beam, e.g. optical touch-screen
- G06F3/0423—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by interrupting or reflecting a light beam, e.g. optical touch-screen using sweeping light beams, e.g. using rotating or vibrating mirror
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/042—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means
- G06F3/0428—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by opto-electronic means by sensing at the edges of the touch surface the interruption of optical paths, e.g. an illumination plane, parallel to the touch surface which may be virtual
Definitions
- Apparatuses and methods consistent with exemplary embodiments relate to obtaining data generated by contacting a subject, and more particularly to, a contact pressure measuring apparatus, a method of measuring contact pressure using the apparatus and a method of manufacturing the apparatus.
- Various types of data regarding a subject may be obtained when diagnosing the subject.
- the subject when the subject is a living body, the subject may move during a diagnosis process, and thus desired information regarding the subject may be affected due movement of the subject when diagnosis is performed.
- the reliability of information obtained through diagnosis may be increased by correcting the information or by using a correction system embedded in a diagnosis device during the diagnosis.
- An example of information obtained through a subject diagnosis process may be subject contact pressure.
- the accuracy of measured data may be increased by consistently maintaining the subject contact pressure.
- the subject contact pressure may be currently measured in a mechanical way.
- One or more exemplary embodiments provide an apparatus for measuring contact pressure in an optical way.
- one or more exemplary embodiments provide a method of manufacturing apparatuses for measuring contact pressure in an optical way.
- one or more exemplary embodiments provide a method of measuring contact pressure using the apparatuses for measuring contact pressure in an optical way
- an apparatus for measuring contact pressure including: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity.
- the spectrum analyzer and the pressure calculator may be mounted on a same substrate.
- the pressure calculator may be separately independently provided from the material layer and the spectrum layer.
- the apparatus may further include a substrate on which the spectrum analyzer is mounted, and the pressure calculator is provided outside the substrate, the pressure calculator is electrically connected to the spectrum analyzer through the substrate.
- the apparatus may further include a substrate on which the spectrum analyzer is mounted, a contact pad formed on the substrate, wherein the pressure calculator is electrically connected to the spectrum analyzer through the contact pad.
- the spectrum analyzer may include light absorption spectrum data measured at various contact pressures.
- the pressure calculator may include mapping data indicating relation between a plurality of contact pressure values and a corresponding plurality of light intensity values.
- the material layer may be an attenuated total reflectance (ATR) crystalline layer.
- ATR attenuated total reflectance
- the apparatus may further include a light source configured to emit the incident light to the material layer with an incidence angle and adjust the incidence angle to be greater than a critical angle to occur total internal reflection.
- the spectrum analyzer may be further configured to perform the light absorption spectrum analysis based on a wavelength or a range of wavelengths of the detected light
- the pressure calculator may be further configured to consider the wavelength or the range of wavelengths of the detected light to determine the contact pressure.
- a method of manufacturing a contact pressure measuring apparatus including: providing a light source and a spectrum analyzer on a substrate; forming, on the substrate, a structure that covers the light source and the spectrum analyzer; forming a material layer which is disposed on a surface of the structure and has a total reflection characteristic; and providing a pressure calculator connected to the spectrum analyzer.
- the pressure calculator may be provided on the substrate.
- the pressure calculator may be provided outside the substrate.
- the structure may be a housing or a material layer.
- the surface of the structure may correspond to a ceiling of the housing and the structure is mounted on the substrate to cover the light source and the spectrum analyzer.
- the method may further include: when the structure is the material layer, forming a groove to mount the material layer thereon; and attaching the material onto the groove.
- a method of a contract pressure measuring apparatus including: detecting a light absorption spectrum with respect to a subject; analyzing the detected light absorption spectrum; obtaining light intensity data that corresponds to a result of the analyzing; and outputting a pressure value corresponding to the obtained light intensity data.
- the detecting the light absorption spectrum may include: recognizing that a material layer of the apparatus is in contact with the subject; radiating light into the material layer; and detecting light emitted through a light emission surface of the material layer.
- the method may further include: displaying the output pressure value on a display.
- FIG. 1 is a block diagram of a subject contact pressure measuring apparatus according to an exemplary embodiment
- FIG. 2 is a detailed diagram of the subject contact pressure measuring apparatus of FIG. 1 according to an exemplary embodiment
- FIG. 3 is a cross-sectional view of a subject pressure measuring apparatus including a pressure calculator of FIG. 2 that is connected to a substrate and independently separate from other elements, according to an exemplary embodiment;
- FIG. 4 is a cross-sectional view of a pressure measuring apparatus including a pressure calculator of FIG. 2 that is connected to a spectrum analyzer through a contact pad and independently separate from other elements, according to an exemplary embodiment;
- FIGS. 5 through 7 are cross-sectional views of a subject contact pressure measuring apparatus for explaining a method of manufacturing the subject contact pressure measuring apparatus according to an exemplary embodiment.
- FIG. 8 is a flowchart of a method of measuring a subject contact pressure by using an apparatus for measuring subject contact pressure according to an exemplary embodiment.
- An subject contact pressure measuring apparatus using optical absorptivity of subject (hereinafter, a pressure measuring apparatus) according to an exemplary embodiment will be described as well as a method of manufacturing the pressure measuring apparatus and a method of measuring subject contact pressure using the pressure measuring apparatus.
- FIG. 1 is a block diagram of a pressure measuring apparatus 100 according to an exemplary embodiment.
- the pressure measuring apparatus 100 includes a light source 20 , an attenuated total reflectance (ATR) device 30 including a total reflection material layer, a spectrum analyzer 40 , and a pressure calculator 50 .
- the light source 20 radiates light onto the ATR device 30 .
- the light source 20 may be, for example, a laser light source, a light-emitting diode (LED), etc.
- the laser light source may be a semiconductor laser.
- the light radiated onto the ATR device 30 from the light source 20 may be transferred to the spectrum analyzer 40 through internal total reflection.
- the ATR device 30 may include a crystal of a high refractive index, and light incident on the ATR device 30 may undergo multiple internal reflections in the crystal and be collected by the spectrum analyzer 40 as it exits the crystal.
- a subject is in contact with the ATR device 30 during the internal total reflections, a part of the light is absorbed by the subject and the remaining light is transferred to the spectrum analyzer 40 . That is, a light absorption spectrum of the subject is transferred to the spectrum analyzer 40 .
- a spectrum of the light transferred to the spectrum analyzer 40 may be analyzed so that data of the spectrum intensity (for example, the intensity of light having a wavelength) of the transferred light may be output.
- the spectrum of the transferred light may be analyzed by using a specific wavelength or a range of wavelengths that belongs to a spectrum range.
- the intensity of light corresponding to the specific wavelength or the range of wavelengths may be analyzed from the spectrum of the transferred light and data of the intensity of the light having the specific wavelength or the range of wavelengths may be output.
- the specific wavelength or the range of wavelengths may correspond to a wavelength having no an optical reaction (for example, light absorption) or having a minimum optical reaction with structure (or chemical) constituting the subject.
- the output data is transferred to the pressure calculator 50 .
- the pressure calculator may be implemented by a processor and a memory.
- the pressure calculator 50 calculates pressure from the data transferred from the spectrum analyzer 40 based on a predetermined algorithm.
- the calculated pressure is subject contact pressure with respect to the pressure measuring apparatus 100 (or the ATR device 30 ).
- Data of the light absorption spectrum of the subject measured at various contact pressures may be stored in the spectrum analyzer 40 during a process of manufacturing the pressure measuring apparatus 100 .
- the spectrum analyzer 40 may compare and analyze the light absorption spectrum transferred from the ATR device 30 by using the stored data as a database to obtain data regarding the intensity of the light absorption spectrum at a specific location.
- the pressure calculator 50 may store data of the intensity of the light absorption spectrum—the contact pressure based on data regarding the intensity of the light absorption spectrum of the subject that is measured at various contact pressures and data regarding the various contact pressures during the process of manufacturing the pressure measuring apparatus 100 .
- the pressure calculator 50 may use mapping data indicating relation between a plurality of contact pressure values and a corresponding plurality of light intensity values.
- the pressure measuring apparatus 100 may include a display window to display the output subject contact window.
- the pressure measuring apparatus 100 may transfer data regarding the output subject contact pressure to a display 200 that is spaced apart therefrom to display the output subject contact pressure on the display 200 .
- FIG. 2 is a detailed diagram of the pressure measuring apparatus 100 of FIG. 1 .
- a light source 62 a spectrum analyzer 64 , and a pressure calculator 66 are provided on a substrate 60 .
- the substrate 60 may be, for example, a printed circuit board.
- the spectrum analyzer 64 may be provided at a location facing a light emission surface 68 S 2 of an ATR crystalline layer 68 .
- the spectrum analyzer 64 may detect and analyze light emitted from the light emission surface 68 S 2 of the ATR crystalline layer 68 .
- the spectrum analyzer 64 and the pressure calculator 66 are spatially spaced apart from each other but are electrically connected to each other. That is, the spectrum analyzer 64 and the pressure calculator 66 may be connected to each other by an electric wiring for data transfer.
- the light source 62 may be, for example, a laser diode (LD), an LED, etc. but is not limited thereto.
- An incident angle of light incident onto a light incident surface 68 S 1 of the ATR crystalline layer 68 from the light source 62 may be an angle at which the light incident onto the ATR crystalline layer 68 makes total reflection in upper and lower surfaces of the ATR crystalline layer 68 .
- the incident angle of the light is adjusted to be greater than a critical angle, the light does not cross the boundaries of the ATR crystalline layer 68 and be totally reflected back internally.
- the critical angle refers to an angle above which total internal reflection occurs.
- a total reflection condition for the upper surface of the ATR crystalline layer 68 may differ than when the subject 72 is not in contact with the ATR crystalline layer 68 .
- a part of the light incident onto the upper surface of the ATR crystalline layer 68 is absorbed by the subject 72 , and the remaining light is reflected into the ATR crystalline layer 68 .
- the light reflected into the ATR crystalline layer 68 is totally reflected from the lower surface of the ATR crystalline layer 68 .
- the light incident in the ATR crystalline layer 68 transmits the ATR crystalline layer 68 in the manner described above and is emitted through the light emission surface 68 S 2 .
- the light emitted through the light emission surface 68 S 2 of the ATR crystalline layer 68 includes light absorption information regarding a plurality of regions of the subject 72 .
- the spectrum analyzer 64 may detect the light emitted through the light emission surface 68 S 2 of the ATR crystalline layer 68 and extract light intensity data regarding a specific location of an absorption spectrum of the detected light through spectrum analysis.
- the extracted light intensity data is transferred to the pressure calculator 66 via the electric wiring.
- the pressure calculator 66 analyzes the light intensity data transferred from the spectrum analyzer 64 and outputs contact pressure corresponding to the light intensity data.
- a structure 70 may cover the light source 62 , the spectrum analyzer 64 , and the pressure calculator 66 .
- the structure 70 is a housing (or a case)
- the ATR crystalline layer 68 may be attached to a ceiling of the structure 70 .
- a part of the structure 70 contacting the ATR crystalline layer 68 may be transparent.
- the structure 70 is not the housing and may be a material layer covering the light source 62 , the spectrum analyzer 64 , and the pressure calculator 66 and may include a groove for mounting the ATR crystalline layer 68 .
- a refractive index of the structure 70 may be smaller than that of the ATR crystalline layer 68 that may be mounted in the groove.
- the ATR crystalline layer 68 may be an example of a material layer exhibiting an ATR characteristic.
- the pressure calculator 66 may be separate from other elements including the substrate 60 and may be independently provided as the examples illustrated in FIGS. 3 and 4 .
- the pressure calculator 66 is present outside the substrate 60 and the structure 70 .
- the pressure calculator 66 may be electrically connected to the substrate 60 .
- the pressure calculator 66 may be electrically connected to the spectrum analyzer 64 through the substrate 60 .
- the pressure calculator 66 disposed outside the substrate 60 and the structure 70 may be electrically connected to the spectrum analyzer 64 through a contact pad 80 provided on the substrate 60 .
- the contact pad 80 is spatially spaced apart from the spectrum analyzer 64 but is electrically connected thereto.
- the pressure calculator 66 of FIGS. 3 and 4 may be provided with a display apparatus on which contact pressure output by the pressure calculator 66 is displayed.
- FIGS. 5 through 7 A method of manufacturing a pressure measuring apparatus, according to an embodiment, will now be described with reference to FIGS. 5 through 7 .
- the same reference numerals denote the same elements throughout.
- the light source 62 , the spectrum analyzer 64 , and the pressure calculator 66 are mounted on the substrate 60 .
- the light source 62 and the spectrum analyzer 64 may be disposed in consideration of locations of light incident and emission surfaces of the ATR crystalline layer 68 .
- the pressure calculator 66 may not be mounted on the substrate 60 but may be separately provided outside the substrate 60 (see FIGS. 3 and 4 ).
- the structure 70 that covers the light source 62 , the spectrum analyzer 64 , and the pressure calculator 66 are formed on the substrate 60 .
- the structure 70 is a housing, the ATR crystalline layer 68 is attached to a ceiling of the structure 70 before the structure 70 is mounted on the substrate 60 . Thereafter, the structure 70 may be mounted in such a way that the ATR crystalline layer 68 is disposed between the light source 62 and the spectrum analyzer 64 .
- the structure 70 is a material layer having a refractive index that is smaller than that of the structure 70 , as shown in FIG.
- the structure 70 that covers the light source 62 , the spectrum analyzer 64 , and the pressure calculator 66 is formed on the substrate 60 , and then a groove 68 G for attaching the ATR crystalline layer 68 is formed in a location on which the ATR crystalline layer 68 of the structure 70 is to be attached.
- one side of an inclination surface of the groove 68 G is parallel to the light incident surface of the ATR crystalline layer 68 , and the other side thereof is parallel to the light emission surface of the ATR crystalline layer 68 .
- the ATR crystalline layer 68 is attached into the groove 68 G of the structure 70 .
- an adhesive agent that does not prevent light from being incident and emitted may be used to attach the ATR crystalline layer 68 into the groove 68 G.
- a refractive index of the adhesive agent is smaller than that of the ATR crystalline layer 68 .
- a method of measuring subject contact pressure by using the pressure measuring apparatus 100 according to an embodiment will now be described with reference to FIGS. 1 and 8 .
- light is radiated onto the subject 72 (operation S 1 ) through the ATR crystalline layer 68 of the pressure measuring apparatus 100 .
- Light incident onto the ATR crystalline layer 68 with an incident angle between the light incident surface 6851 of the ATR crystalline layer 68 and the line perpendicular to the light incident surface 68 S 1 is reflected from an upper surface of the ATR crystalline layer 68 and a part of the light is absorbed by the subject 72 .
- degree of light absorption of the subject 72 may differ according to contact pressure of the subject 72 contacting the ATR crystalline layer 68 .
- a light absorption spectrum with respect to the subject 72 is measured (detected) (operation S 2 ).
- the light incident onto the ATR crystalline layer 68 is repeatedly reflected from upper and lower surfaces of the ATR crystalline layer 68 and is emitted through the light emission surface 68 S 2 of the ATR crystalline layer 68 .
- part of the light incident on the upper surface of the ATR crystalline layer 68 is absorbed by the subject 72 .
- the light emitted through the light emission surface 68 S 2 of the ATR crystalline layer 68 includes light absorption information of the subject 72 .
- the light emitted through the light emission surface 68 S 2 of the ATR crystalline layer 68 is incident onto and detected by the spectrum analyzer 64 .
- the spectrum analyzer 64 analyzes a spectrum of the detected light (operation S 3 ). Light intensity data of a predetermined location of the spectrum of the detected light may be determined by the spectrum analysis. Contact pressure is output by the light intensity data obtained through the spectrum analysis (operation S 4 ). The contact pressure may be output by using a program that uses a light intensity-contact pressure database. The output contact pressure may be a contact pressure of the subject 72 .
- the subject 72 provided in the pressure measuring apparatus and the manufacturing and measuring methods described above may be, for example, the skin of a living body, a finger, a toe, etc. but is not limited thereto.
- An apparatus for measuring subject contact pressure measures the subject contact pressure by using a change in light absorption of a subject.
- a configuration of the apparatus may be simpler than that of an existing mechanical apparatus, and the reliability of measured data may be increased.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measuring Fluid Pressure (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Optics & Photonics (AREA)
Abstract
An apparatus and method for measuring a contact pressure and a method of manufacturing the apparatus. The apparatus includes: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity.
Description
This application claims priority from Korean Patent Application No. 10-2014-0119371, filed on Sep. 5, 2014 in the Korean Intellectual Property Office, the disclosure of which is incorporated herein in its entirety by reference.
1. Field
Apparatuses and methods consistent with exemplary embodiments relate to obtaining data generated by contacting a subject, and more particularly to, a contact pressure measuring apparatus, a method of measuring contact pressure using the apparatus and a method of manufacturing the apparatus.
2. Description of the Related Art
Various types of data regarding a subject may be obtained when diagnosing the subject. However, when the subject is a living body, the subject may move during a diagnosis process, and thus desired information regarding the subject may be affected due movement of the subject when diagnosis is performed.
Accordingly, the reliability of information obtained through diagnosis may be increased by correcting the information or by using a correction system embedded in a diagnosis device during the diagnosis.
An example of information obtained through a subject diagnosis process may be subject contact pressure. The accuracy of measured data may be increased by consistently maintaining the subject contact pressure. The subject contact pressure may be currently measured in a mechanical way.
One or more exemplary embodiments provide an apparatus for measuring contact pressure in an optical way.
Further, one or more exemplary embodiments provide a method of manufacturing apparatuses for measuring contact pressure in an optical way.
Further still, one or more exemplary embodiments provide a method of measuring contact pressure using the apparatuses for measuring contact pressure in an optical way
According to an aspect of an exemplary embodiment, there is provided an apparatus for measuring contact pressure, the apparatus including: a material layer configured to provide a light path along which incident light travels to a subject being in contact with the material layer; a spectrum analyzer configured to detect light emitted from the material layer and perform a light absorption spectrum analysis on the detected light to determine an intensity of the detected light; and a pressure calculator configured to determine the contact pressure of the subject based on the determined intensity.
The spectrum analyzer and the pressure calculator may be mounted on a same substrate.
The pressure calculator may be separately independently provided from the material layer and the spectrum layer. The apparatus may further include a substrate on which the spectrum analyzer is mounted, and the pressure calculator is provided outside the substrate, the pressure calculator is electrically connected to the spectrum analyzer through the substrate. The apparatus may further include a substrate on which the spectrum analyzer is mounted, a contact pad formed on the substrate, wherein the pressure calculator is electrically connected to the spectrum analyzer through the contact pad.
The spectrum analyzer may include light absorption spectrum data measured at various contact pressures.
The pressure calculator may include mapping data indicating relation between a plurality of contact pressure values and a corresponding plurality of light intensity values.
The material layer may be an attenuated total reflectance (ATR) crystalline layer.
The apparatus may further include a light source configured to emit the incident light to the material layer with an incidence angle and adjust the incidence angle to be greater than a critical angle to occur total internal reflection.
The spectrum analyzer may be further configured to perform the light absorption spectrum analysis based on a wavelength or a range of wavelengths of the detected light, and the pressure calculator may be further configured to consider the wavelength or the range of wavelengths of the detected light to determine the contact pressure.
According to an aspect of another exemplary embodiment, there is provided a method of manufacturing a contact pressure measuring apparatus, the method including: providing a light source and a spectrum analyzer on a substrate; forming, on the substrate, a structure that covers the light source and the spectrum analyzer; forming a material layer which is disposed on a surface of the structure and has a total reflection characteristic; and providing a pressure calculator connected to the spectrum analyzer.
The pressure calculator may be provided on the substrate.
The pressure calculator may be provided outside the substrate.
The structure may be a housing or a material layer. When the structure is the housing, the surface of the structure may correspond to a ceiling of the housing and the structure is mounted on the substrate to cover the light source and the spectrum analyzer.
The method may further include: when the structure is the material layer, forming a groove to mount the material layer thereon; and attaching the material onto the groove.
According to an aspect of another exemplary embodiment, there is provided a method of a contract pressure measuring apparatus, the method including: detecting a light absorption spectrum with respect to a subject; analyzing the detected light absorption spectrum; obtaining light intensity data that corresponds to a result of the analyzing; and outputting a pressure value corresponding to the obtained light intensity data.
The detecting the light absorption spectrum may include: recognizing that a material layer of the apparatus is in contact with the subject; radiating light into the material layer; and detecting light emitted through a light emission surface of the material layer.
The method may further include: displaying the output pressure value on a display.
The above and/or other aspects will become apparent and more readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings in which:
Exemplary embodiments are described in greater detail below with reference to the accompanying drawings.
In the following description, like drawing reference numerals are used for like elements, even in different drawings. The matters defined in the description, such as detailed construction and elements, are provided to assist in a comprehensive understanding of the exemplary embodiments. However, it is apparent that the exemplary embodiments can be practiced without those specifically defined matters. Also, well-known functions or constructions are not described in detail since they would obscure the description with unnecessary detail.
An subject contact pressure measuring apparatus using optical absorptivity of subject (hereinafter, a pressure measuring apparatus) according to an exemplary embodiment will be described as well as a method of manufacturing the pressure measuring apparatus and a method of measuring subject contact pressure using the pressure measuring apparatus.
First, a pressure measuring apparatus according to an embodiment is described.
As shown in FIG. 1 , the pressure measuring apparatus 100 includes a light source 20, an attenuated total reflectance (ATR) device 30 including a total reflection material layer, a spectrum analyzer 40, and a pressure calculator 50. The light source 20 radiates light onto the ATR device 30. The light source 20 may be, for example, a laser light source, a light-emitting diode (LED), etc. The laser light source may be a semiconductor laser. The light radiated onto the ATR device 30 from the light source 20 may be transferred to the spectrum analyzer 40 through internal total reflection. Specifically, the ATR device 30 may include a crystal of a high refractive index, and light incident on the ATR device 30 may undergo multiple internal reflections in the crystal and be collected by the spectrum analyzer 40 as it exits the crystal. When a subject is in contact with the ATR device 30 during the internal total reflections, a part of the light is absorbed by the subject and the remaining light is transferred to the spectrum analyzer 40. That is, a light absorption spectrum of the subject is transferred to the spectrum analyzer 40. A spectrum of the light transferred to the spectrum analyzer 40 may be analyzed so that data of the spectrum intensity (for example, the intensity of light having a wavelength) of the transferred light may be output. The spectrum of the transferred light may be analyzed by using a specific wavelength or a range of wavelengths that belongs to a spectrum range. For example, the intensity of light corresponding to the specific wavelength or the range of wavelengths may be analyzed from the spectrum of the transferred light and data of the intensity of the light having the specific wavelength or the range of wavelengths may be output. The specific wavelength or the range of wavelengths may correspond to a wavelength having no an optical reaction (for example, light absorption) or having a minimum optical reaction with structure (or chemical) constituting the subject.
The output data is transferred to the pressure calculator 50. The pressure calculator may be implemented by a processor and a memory. The pressure calculator 50 calculates pressure from the data transferred from the spectrum analyzer 40 based on a predetermined algorithm. The calculated pressure is subject contact pressure with respect to the pressure measuring apparatus 100 (or the ATR device 30). Data of the light absorption spectrum of the subject measured at various contact pressures may be stored in the spectrum analyzer 40 during a process of manufacturing the pressure measuring apparatus 100. The spectrum analyzer 40 may compare and analyze the light absorption spectrum transferred from the ATR device 30 by using the stored data as a database to obtain data regarding the intensity of the light absorption spectrum at a specific location.
The pressure calculator 50 may store data of the intensity of the light absorption spectrum—the contact pressure based on data regarding the intensity of the light absorption spectrum of the subject that is measured at various contact pressures and data regarding the various contact pressures during the process of manufacturing the pressure measuring apparatus 100. Specifically, the pressure calculator 50 may use mapping data indicating relation between a plurality of contact pressure values and a corresponding plurality of light intensity values. Thus, if the intensity of a predetermined location of the light absorption spectrum of the subject is provided to the pressure measuring apparatus 100, the subject contact pressure may be output. The pressure measuring apparatus 100 may include a display window to display the output subject contact window. Alternatively, the pressure measuring apparatus 100 may transfer data regarding the output subject contact pressure to a display 200 that is spaced apart therefrom to display the output subject contact pressure on the display 200.
As shown in FIG. 2 , a light source 62, a spectrum analyzer 64, and a pressure calculator 66 are provided on a substrate 60. The substrate 60 may be, for example, a printed circuit board. The spectrum analyzer 64 may be provided at a location facing a light emission surface 68S2 of an ATR crystalline layer 68. The spectrum analyzer 64 may detect and analyze light emitted from the light emission surface 68S2 of the ATR crystalline layer 68. The spectrum analyzer 64 and the pressure calculator 66 are spatially spaced apart from each other but are electrically connected to each other. That is, the spectrum analyzer 64 and the pressure calculator 66 may be connected to each other by an electric wiring for data transfer. The light source 62 may be, for example, a laser diode (LD), an LED, etc. but is not limited thereto. An incident angle of light incident onto a light incident surface 68S1 of the ATR crystalline layer 68 from the light source 62 may be an angle at which the light incident onto the ATR crystalline layer 68 makes total reflection in upper and lower surfaces of the ATR crystalline layer 68. For example, if the incident angle of the light is adjusted to be greater than a critical angle, the light does not cross the boundaries of the ATR crystalline layer 68 and be totally reflected back internally. Here, the critical angle refers to an angle above which total internal reflection occurs.
When a subject 72 contacts the upper surface of the ATR crystalline layer 68, a total reflection condition for the upper surface of the ATR crystalline layer 68 may differ than when the subject 72 is not in contact with the ATR crystalline layer 68. For example, a part of the light incident onto the upper surface of the ATR crystalline layer 68 is absorbed by the subject 72, and the remaining light is reflected into the ATR crystalline layer 68. The light reflected into the ATR crystalline layer 68 is totally reflected from the lower surface of the ATR crystalline layer 68. The light incident in the ATR crystalline layer 68 transmits the ATR crystalline layer 68 in the manner described above and is emitted through the light emission surface 68S2. The light emitted through the light emission surface 68S2 of the ATR crystalline layer 68 includes light absorption information regarding a plurality of regions of the subject 72. Thus, the spectrum analyzer 64 may detect the light emitted through the light emission surface 68S2 of the ATR crystalline layer 68 and extract light intensity data regarding a specific location of an absorption spectrum of the detected light through spectrum analysis. The extracted light intensity data is transferred to the pressure calculator 66 via the electric wiring. The pressure calculator 66 analyzes the light intensity data transferred from the spectrum analyzer 64 and outputs contact pressure corresponding to the light intensity data.
A structure 70 may cover the light source 62, the spectrum analyzer 64, and the pressure calculator 66. When the structure 70 is a housing (or a case), the ATR crystalline layer 68 may be attached to a ceiling of the structure 70. A part of the structure 70 contacting the ATR crystalline layer 68 may be transparent.
According to another example, the structure 70 is not the housing and may be a material layer covering the light source 62, the spectrum analyzer 64, and the pressure calculator 66 and may include a groove for mounting the ATR crystalline layer 68. In this case, a refractive index of the structure 70 may be smaller than that of the ATR crystalline layer 68 that may be mounted in the groove. The ATR crystalline layer 68 may be an example of a material layer exhibiting an ATR characteristic.
The pressure calculator 66 may be separate from other elements including the substrate 60 and may be independently provided as the examples illustrated in FIGS. 3 and 4 .
As shown in FIG. 3 , the pressure calculator 66 is present outside the substrate 60 and the structure 70. The pressure calculator 66 may be electrically connected to the substrate 60. Thus, the pressure calculator 66 may be electrically connected to the spectrum analyzer 64 through the substrate 60.
As shown in FIG. 4 , the pressure calculator 66 disposed outside the substrate 60 and the structure 70 may be electrically connected to the spectrum analyzer 64 through a contact pad 80 provided on the substrate 60. The contact pad 80 is spatially spaced apart from the spectrum analyzer 64 but is electrically connected thereto. The pressure calculator 66 of FIGS. 3 and 4 may be provided with a display apparatus on which contact pressure output by the pressure calculator 66 is displayed.
A method of manufacturing a pressure measuring apparatus, according to an embodiment, will now be described with reference to FIGS. 5 through 7 . The same reference numerals denote the same elements throughout.
As shown in FIG. 5 , the light source 62, the spectrum analyzer 64, and the pressure calculator 66 are mounted on the substrate 60. The light source 62 and the spectrum analyzer 64 may be disposed in consideration of locations of light incident and emission surfaces of the ATR crystalline layer 68. The pressure calculator 66 may not be mounted on the substrate 60 but may be separately provided outside the substrate 60 (see FIGS. 3 and 4 ).
As shown in FIG. 6 , the structure 70 that covers the light source 62, the spectrum analyzer 64, and the pressure calculator 66 are formed on the substrate 60. When the structure 70 is a housing, the ATR crystalline layer 68 is attached to a ceiling of the structure 70 before the structure 70 is mounted on the substrate 60. Thereafter, the structure 70 may be mounted in such a way that the ATR crystalline layer 68 is disposed between the light source 62 and the spectrum analyzer 64. When the structure 70 is a material layer having a refractive index that is smaller than that of the structure 70, as shown in FIG. 7 , the structure 70 that covers the light source 62, the spectrum analyzer 64, and the pressure calculator 66 is formed on the substrate 60, and then a groove 68G for attaching the ATR crystalline layer 68 is formed in a location on which the ATR crystalline layer 68 of the structure 70 is to be attached. In this regard, one side of an inclination surface of the groove 68G is parallel to the light incident surface of the ATR crystalline layer 68, and the other side thereof is parallel to the light emission surface of the ATR crystalline layer 68. After the groove 68G is formed, the ATR crystalline layer 68 is attached into the groove 68G of the structure 70. In this regard, an adhesive agent that does not prevent light from being incident and emitted may be used to attach the ATR crystalline layer 68 into the groove 68G. A refractive index of the adhesive agent is smaller than that of the ATR crystalline layer 68.
A method of measuring subject contact pressure by using the pressure measuring apparatus 100 according to an embodiment will now be described with reference to FIGS. 1 and 8 .
As shown in FIG. 8 , light is radiated onto the subject 72 (operation S1) through the ATR crystalline layer 68 of the pressure measuring apparatus 100. Light incident onto the ATR crystalline layer 68 with an incident angle between the light incident surface 6851 of the ATR crystalline layer 68 and the line perpendicular to the light incident surface 68S1 is reflected from an upper surface of the ATR crystalline layer 68 and a part of the light is absorbed by the subject 72. In this regard, degree of light absorption of the subject 72 may differ according to contact pressure of the subject 72 contacting the ATR crystalline layer 68.
Thereafter, a light absorption spectrum with respect to the subject 72 is measured (detected) (operation S2). In more detail, the light incident onto the ATR crystalline layer 68 is repeatedly reflected from upper and lower surfaces of the ATR crystalline layer 68 and is emitted through the light emission surface 68S2 of the ATR crystalline layer 68. During the process, part of the light incident on the upper surface of the ATR crystalline layer 68 is absorbed by the subject 72. Thus, the light emitted through the light emission surface 68S2 of the ATR crystalline layer 68 includes light absorption information of the subject 72. The light emitted through the light emission surface 68S2 of the ATR crystalline layer 68 is incident onto and detected by the spectrum analyzer 64. The spectrum analyzer 64 analyzes a spectrum of the detected light (operation S3). Light intensity data of a predetermined location of the spectrum of the detected light may be determined by the spectrum analysis. Contact pressure is output by the light intensity data obtained through the spectrum analysis (operation S4). The contact pressure may be output by using a program that uses a light intensity-contact pressure database. The output contact pressure may be a contact pressure of the subject 72.
The subject 72 provided in the pressure measuring apparatus and the manufacturing and measuring methods described above may be, for example, the skin of a living body, a finger, a toe, etc. but is not limited thereto.
An apparatus for measuring subject contact pressure, according to at least one embodiment, measures the subject contact pressure by using a change in light absorption of a subject. Thus, a configuration of the apparatus may be simpler than that of an existing mechanical apparatus, and the reliability of measured data may be increased.
Claims (17)
1. An apparatus for measuring a contact pressure, the apparatus comprising:
a first material layer configured to provide a light path along which incident light travels to a subject being in contact with the first material layer;
a spectrum analyzer configured to detect light emitted from the first material layer and perform a light absorption spectrum analysis on the detected light based on a wavelength or a range of wavelengths of the detected light to determine an intensity of the detected light;
a pressure calculator configured to determine a contact pressure of the subject based on the determined intensity based on the wavelength or the range of wavelengths of the detected light; and
a second material layer configured to embed the entire structure of the spectrum analyzer,
wherein the light emitted from the first material layer is incident on the spectrum analyzer through the second material layer.
2. The apparatus of claim 1 , further comprising a substrate on which the spectrum analyzer and the pressure calculator are mounted.
3. The apparatus of claim 1 , wherein the pressure calculator is separately and independently provided from the first material layer and the spectrum analyzer.
4. The apparatus of claim 3 , further comprising a substrate on which the spectrum analyzer is mounted,
wherein the pressure calculator is provided outside the substrate, and the pressure calculator is electrically connected to the spectrum analyzer through the substrate.
5. The apparatus of claim 3 , further comprising:
a substrate on which the spectrum analyzer is mounted,
a contact pad provided on the substrate, wherein the pressure calculator is electrically connected to the spectrum analyzer through the contact pad.
6. The apparatus of claim 1 , wherein the spectrum analyzer comprises light absorption spectrum data measured at various contact pressures.
7. The apparatus of claim 1 , wherein the pressure calculator comprises mapping data indicating relation between a plurality of contact pressure values and a corresponding plurality of light intensity values.
8. The apparatus of claim 1 , wherein the first material layer is an attenuated total reflectance crystalline layer.
9. The apparatus of claim 1 , further comprising a light source configured to emit the incident light to the first material layer with an incidence angle and adjust the incidence angle to be greater than a critical angle to occur total internal reflection.
10. A method of manufacturing a contact pressure measuring apparatus, the method comprising:
providing a light source and a spectrum analyzer on a substrate, the spectrum analyzer being configured to perform light absorption spectrum analysis based on a wavelength or a range of wavelengths of a detected light from the light source;
forming, on the substrate, a structure that covers the light source and the spectrum analyzer;
forming a first material layer which is disposed on a surface of the structure and has a total reflection characteristic; and
providing a pressure calculator connected to the spectrum analyzer, the pressure calculator being configured to determine a contact pressure based on the wavelength or the range of wavelengths of the detected light,
wherein light emitted from the first material layer is incident on the spectrum analyzer through the structure, and
wherein the structure is a second material, which embeds the entire structure of the spectrum analyzer.
11. The method of claim 10 , wherein the pressure calculator is provided on the substrate.
12. The method of claim 10 , wherein the pressure calculator is provided outside the substrate.
13. The method of claim 10 , wherein
the method further comprises:
forming a groove on the second material layer to mount the first material layer thereon; and
attaching the first material layer onto the groove.
14. The method of claim 10 , wherein the first material layer is an attenuated total reflectance crystalline layer.
15. A method of measuring subject contact pressure, the method comprising:
detecting a light emitted from a first material layer provided in a light path along which incident light travels to a subject being in contact with the first material layer;
analyzing the detected light by performing a light absorption spectrum analysis, by a spectrum analyzer, on the detected light based on a wavelength or a range of wavelengths of the detected light;
obtaining light intensity data based on a result of the analyzing; and
outputting a pressure value corresponding to the obtained light intensity data based on the wavelength or the range of wavelengths of the detected light,
wherein the entire structure of the spectrum analyzer is embedded in a second material layer, and
wherein the light emitted from the first material layer is incident on the spectrum analyzer through the second material layer.
16. The method of claim 15 , wherein the detecting the light comprises:
radiating light into the first material layer; and
detecting the light emitted through a light emission surface of the first material layer.
17. The method of claim 15 , further comprising displaying the output pressure value on a display.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140119371A KR102277902B1 (en) | 2014-09-05 | 2014-09-05 | Object contact pressure meter and methods of manufacturing and measuring the same |
KR10-2014-0119371 | 2014-09-05 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20160069756A1 US20160069756A1 (en) | 2016-03-10 |
US10088376B2 true US10088376B2 (en) | 2018-10-02 |
Family
ID=55437251
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US14/820,653 Active 2036-04-05 US10088376B2 (en) | 2014-09-05 | 2015-08-07 | Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure |
Country Status (2)
Country | Link |
---|---|
US (1) | US10088376B2 (en) |
KR (1) | KR102277902B1 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI597910B (en) * | 2016-10-03 | 2017-09-01 | 國立交通大學 | Optical device, pressure sensing device and pressure sensing apparatus |
CN107421681B (en) * | 2017-07-31 | 2019-10-01 | 京东方科技集团股份有限公司 | A kind of pressure sensor and preparation method thereof |
WO2019073300A1 (en) * | 2017-10-10 | 2019-04-18 | Rapt Ip Limited | Thin couplers and reflectors for sensing waveguides |
WO2020225605A1 (en) | 2019-05-03 | 2020-11-12 | Rapt Ip Limited | Waveguide-based image capture |
Citations (57)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4120585A (en) * | 1976-11-19 | 1978-10-17 | Calspan Corporation | Fingerprint identification system using a pliable optical prism |
US4254333A (en) * | 1978-05-31 | 1981-03-03 | Bergstroem Arne | Optoelectronic circuit element |
US5004913A (en) | 1982-08-06 | 1991-04-02 | Marcos Kleinerman | Remote measurement of physical variables with fiber optic systems - methods, materials and devices |
US5596320A (en) * | 1995-04-28 | 1997-01-21 | Optical Sensor Consultants Inc. | System for detection of ice, water, glycol solution, and other chemical species |
US5619586A (en) * | 1990-12-20 | 1997-04-08 | Thorn Emi Plc | Method and apparatus for producing a directly viewable image of a fingerprint |
US6424851B1 (en) | 1998-10-13 | 2002-07-23 | Medoptix, Inc. | Infrared ATR glucose measurement system (II) |
US20030176775A1 (en) * | 1998-10-13 | 2003-09-18 | Medoptix, Inc. | Cleaning kit for an infrared glucose measurement system |
JP2004163311A (en) | 2002-11-14 | 2004-06-10 | Konica Minolta Holdings Inc | Infrared absorption spectrum measuring method and device |
US6912912B2 (en) | 2002-02-11 | 2005-07-05 | Leoni Bordnetz-Systeme Gmbh & Co. Kg | Pressure sensor having an optical waveguide and method for pressure detection |
JP2006194800A (en) | 2005-01-14 | 2006-07-27 | Canon Inc | Polishing measuring method and polishing device |
US20080007542A1 (en) * | 2006-07-06 | 2008-01-10 | O-Pen A/S | Optical touchpad with three-dimensional position determination |
US20080007541A1 (en) * | 2006-07-06 | 2008-01-10 | O-Pen A/S | Optical touchpad system and waveguide for use therein |
US20100001962A1 (en) * | 2008-07-07 | 2010-01-07 | Nortel Networks Limited | Multi-touch touchscreen incorporating pen tracking |
US7697141B2 (en) * | 2004-12-09 | 2010-04-13 | Halliburton Energy Services, Inc. | In situ optical computation fluid analysis system and method |
US7705835B2 (en) * | 2005-03-28 | 2010-04-27 | Adam Eikman | Photonic touch screen apparatus and method of use |
US20100123678A1 (en) * | 2008-11-14 | 2010-05-20 | Korea Research Institute Of Standards And Science | Touch input device and method of acquiring contact location and intensity of force using the same |
US20100167451A1 (en) * | 2007-04-05 | 2010-07-01 | Micron Technology, Inc. | Methods of manufacturing imaging device packages |
US20110074736A1 (en) * | 2009-09-25 | 2011-03-31 | Hideya Takakura | Optical pointing device and electronic equipments |
US7991257B1 (en) * | 2007-05-16 | 2011-08-02 | Fusion Optix, Inc. | Method of manufacturing an optical composite |
US7995039B2 (en) * | 2005-07-05 | 2011-08-09 | Flatfrog Laboratories Ab | Touch pad system |
US20120068971A1 (en) * | 2010-09-17 | 2012-03-22 | Nigel Patrick Pemberton-Pigott | Touch-sensitive display with optical sensor and method |
US8144271B2 (en) * | 2006-08-03 | 2012-03-27 | Perceptive Pixel Inc. | Multi-touch sensing through frustrated total internal reflection |
US20120162142A1 (en) * | 2009-09-02 | 2012-06-28 | Flatfrog Laboratories Ab | Touch-sensitive system and method for controlling the operation thereof |
US20120170056A1 (en) * | 2009-07-16 | 2012-07-05 | Opdi Technologies A/S | Device, a system and a method of encoding a position of an object |
US20120169672A1 (en) * | 2009-09-11 | 2012-07-05 | Flatfrog Laboratories Ab | Touch surface with variable refractive index |
US20120182265A1 (en) * | 2009-09-04 | 2012-07-19 | Cambridge Display Technology Limited | Apparatus with Correlated Emitter-Detector Pairs |
US20120188188A1 (en) * | 2009-09-04 | 2012-07-26 | Cambridge Display Technology Limited | Touch Screen Display Device |
US20120201716A1 (en) * | 2009-10-05 | 2012-08-09 | Konica Minolta Holdings, Inc. | Surface plasmon-enhanced fluorescence measuring apparatus |
US20120200538A1 (en) * | 2009-10-19 | 2012-08-09 | Flatfrog Laboratories Ab | Touch surface with two-dimensional compensation |
US8248588B2 (en) * | 2007-05-21 | 2012-08-21 | Thermo Scientific Portable Analytical Instruments Inc. | Handheld infrared and raman measurement devices and methods |
US20120256882A1 (en) * | 2009-12-21 | 2012-10-11 | Flatfrog Laboratories Ab | Touch surface with identification of reduced performance |
US20120306815A1 (en) * | 2011-06-02 | 2012-12-06 | Omnivision Technologies, Inc. | Optical touchpad for touch and gesture recognition |
US8441467B2 (en) * | 2006-08-03 | 2013-05-14 | Perceptive Pixel Inc. | Multi-touch sensing display through frustrated total internal reflection |
US20130141364A1 (en) * | 2011-11-18 | 2013-06-06 | Sentons Inc. | User interface interaction using touch input force |
US20130187891A1 (en) * | 2009-02-15 | 2013-07-25 | Neonode Inc. | Resilient light-based touch surface |
US20130222785A1 (en) * | 2012-02-29 | 2013-08-29 | Canon Kabushiki Kaisha | Measurement apparatus and method of manufacturing article |
US8553014B2 (en) * | 2008-06-19 | 2013-10-08 | Neonode Inc. | Optical touch screen systems using total internal reflection |
US20130285977A1 (en) * | 2012-04-30 | 2013-10-31 | Corning Incorporated | Pressure-sensing touch system utilizing total-internal reflection |
US20140085241A1 (en) * | 2011-05-16 | 2014-03-27 | Flatfrog Laboratories Ab | Device and method for determining reduced performance of a touch sensitive apparatus |
US20140098058A1 (en) * | 2012-10-04 | 2014-04-10 | Corning Incorporated | Pressure-sensing touch system utilizing optical and capacitive systems |
US8736581B2 (en) * | 2009-06-01 | 2014-05-27 | Perceptive Pixel Inc. | Touch sensing with frustrated total internal reflection |
US8803848B2 (en) * | 2007-12-17 | 2014-08-12 | Victor Manuel SUAREZ ROVERE | Method and apparatus for tomographic touch imaging and interactive system using same |
US8847925B2 (en) * | 2009-04-24 | 2014-09-30 | Teknologian Tutkimuskeskus Vtt | User input arrangement and related method of manufacture |
US8896575B2 (en) * | 2002-11-04 | 2014-11-25 | Neonode Inc. | Pressure-sensitive touch screen |
US20140363293A1 (en) * | 2011-12-29 | 2014-12-11 | Vestas Wind Systems A/S | Wind turbine and a method for determining the presence and/or thickness of an ice layer on a blade body of a wind turbine |
US20150177142A1 (en) * | 2012-08-06 | 2015-06-25 | Perkinelmer Singapore Pte Ltd | Diamond atr artefact correction |
US9134842B2 (en) * | 2012-10-04 | 2015-09-15 | Corning Incorporated | Pressure sensing touch systems and methods |
US20150265190A1 (en) * | 2014-03-18 | 2015-09-24 | Seiko Epson Corporation | Biological measurement apparatus and a biological measurement method |
US20150323385A1 (en) * | 2014-05-09 | 2015-11-12 | Samsung Electronics Co., Ltd. | Spectro-sensor and spectrometer employing the same |
US20150331546A1 (en) * | 2012-12-20 | 2015-11-19 | Flatfrog Laboratories Ab | Improvements in tir-based optical touch systems of projection-type |
US20160045143A1 (en) * | 2014-08-12 | 2016-02-18 | Samsung Electronics Co., Ltd. | Apparatus for noninvasively measuring bio-analyte and method of noninvasively measuring bio-analyte |
US20160051175A1 (en) * | 2014-08-25 | 2016-02-25 | Samsung Electronics Co., Ltd. | Apparatus and method of measuring stress |
US20160058381A1 (en) * | 2014-08-27 | 2016-03-03 | Samsung Electronics Co., Ltd. | Biosignal processing apparatus and biosignal processing method |
US20160084973A1 (en) * | 2013-05-16 | 2016-03-24 | Ibex Innovations Ltd. | Multi-Spectral X-Ray Detection Apparatus |
US20160089088A1 (en) * | 2014-09-29 | 2016-03-31 | Samsung Electronics Co., Ltd. | Device for correcting light absorption spectrum, method of manufacturing the device, and method of correcting light absorption spectrum |
US9405382B2 (en) * | 2012-07-24 | 2016-08-02 | Rapt Ip Limited | Augmented optical waveguide for use in an optical touch sensitive device |
US9554738B1 (en) * | 2016-03-30 | 2017-01-31 | Zyomed Corp. | Spectroscopic tomography systems and methods for noninvasive detection and measurement of analytes using collision computing |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4615726B2 (en) * | 1998-12-04 | 2011-01-19 | ウェザーフォード/ラム インコーポレーテッド | Bragg grating pressure sensor |
KR101765972B1 (en) * | 2010-04-02 | 2017-08-07 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | Alignment registration feature for analyte sensor optical reader |
-
2014
- 2014-09-05 KR KR1020140119371A patent/KR102277902B1/en active IP Right Grant
-
2015
- 2015-08-07 US US14/820,653 patent/US10088376B2/en active Active
Patent Citations (63)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4120585A (en) * | 1976-11-19 | 1978-10-17 | Calspan Corporation | Fingerprint identification system using a pliable optical prism |
US4254333A (en) * | 1978-05-31 | 1981-03-03 | Bergstroem Arne | Optoelectronic circuit element |
US5004913A (en) | 1982-08-06 | 1991-04-02 | Marcos Kleinerman | Remote measurement of physical variables with fiber optic systems - methods, materials and devices |
US5619586A (en) * | 1990-12-20 | 1997-04-08 | Thorn Emi Plc | Method and apparatus for producing a directly viewable image of a fingerprint |
US5596320A (en) * | 1995-04-28 | 1997-01-21 | Optical Sensor Consultants Inc. | System for detection of ice, water, glycol solution, and other chemical species |
US6424851B1 (en) | 1998-10-13 | 2002-07-23 | Medoptix, Inc. | Infrared ATR glucose measurement system (II) |
US20030176775A1 (en) * | 1998-10-13 | 2003-09-18 | Medoptix, Inc. | Cleaning kit for an infrared glucose measurement system |
US6912912B2 (en) | 2002-02-11 | 2005-07-05 | Leoni Bordnetz-Systeme Gmbh & Co. Kg | Pressure sensor having an optical waveguide and method for pressure detection |
US8896575B2 (en) * | 2002-11-04 | 2014-11-25 | Neonode Inc. | Pressure-sensitive touch screen |
JP2004163311A (en) | 2002-11-14 | 2004-06-10 | Konica Minolta Holdings Inc | Infrared absorption spectrum measuring method and device |
US8947666B2 (en) * | 2004-12-09 | 2015-02-03 | Halliburton Energy Services, Inc. | Optical data transformation |
US7697141B2 (en) * | 2004-12-09 | 2010-04-13 | Halliburton Energy Services, Inc. | In situ optical computation fluid analysis system and method |
US8525995B2 (en) * | 2004-12-09 | 2013-09-03 | Halliburton Energy Services, Inc. | Optical data transformation |
JP2006194800A (en) | 2005-01-14 | 2006-07-27 | Canon Inc | Polishing measuring method and polishing device |
US7705835B2 (en) * | 2005-03-28 | 2010-04-27 | Adam Eikman | Photonic touch screen apparatus and method of use |
US7995039B2 (en) * | 2005-07-05 | 2011-08-09 | Flatfrog Laboratories Ab | Touch pad system |
US20080007541A1 (en) * | 2006-07-06 | 2008-01-10 | O-Pen A/S | Optical touchpad system and waveguide for use therein |
US20080007542A1 (en) * | 2006-07-06 | 2008-01-10 | O-Pen A/S | Optical touchpad with three-dimensional position determination |
US8441467B2 (en) * | 2006-08-03 | 2013-05-14 | Perceptive Pixel Inc. | Multi-touch sensing display through frustrated total internal reflection |
US8259240B2 (en) * | 2006-08-03 | 2012-09-04 | Perceptive Pixel Inc. | Multi-touch sensing through frustrated total internal reflection |
US8144271B2 (en) * | 2006-08-03 | 2012-03-27 | Perceptive Pixel Inc. | Multi-touch sensing through frustrated total internal reflection |
US20100167451A1 (en) * | 2007-04-05 | 2010-07-01 | Micron Technology, Inc. | Methods of manufacturing imaging device packages |
US8249408B2 (en) * | 2007-05-16 | 2012-08-21 | Fusion Optix, Inc. | Method of manufacturing an optical composite |
US7991257B1 (en) * | 2007-05-16 | 2011-08-02 | Fusion Optix, Inc. | Method of manufacturing an optical composite |
US8248588B2 (en) * | 2007-05-21 | 2012-08-21 | Thermo Scientific Portable Analytical Instruments Inc. | Handheld infrared and raman measurement devices and methods |
US8803848B2 (en) * | 2007-12-17 | 2014-08-12 | Victor Manuel SUAREZ ROVERE | Method and apparatus for tomographic touch imaging and interactive system using same |
US20140071094A1 (en) * | 2008-06-19 | 2014-03-13 | Neonode Inc. | Optical touch screen using total internal reflection |
US8553014B2 (en) * | 2008-06-19 | 2013-10-08 | Neonode Inc. | Optical touch screen systems using total internal reflection |
US20100001962A1 (en) * | 2008-07-07 | 2010-01-07 | Nortel Networks Limited | Multi-touch touchscreen incorporating pen tracking |
US20100123678A1 (en) * | 2008-11-14 | 2010-05-20 | Korea Research Institute Of Standards And Science | Touch input device and method of acquiring contact location and intensity of force using the same |
US20130187891A1 (en) * | 2009-02-15 | 2013-07-25 | Neonode Inc. | Resilient light-based touch surface |
US20160026250A1 (en) * | 2009-02-15 | 2016-01-28 | Neonode Inc. | Resilient haptic touch surface |
US8847925B2 (en) * | 2009-04-24 | 2014-09-30 | Teknologian Tutkimuskeskus Vtt | User input arrangement and related method of manufacture |
US8736581B2 (en) * | 2009-06-01 | 2014-05-27 | Perceptive Pixel Inc. | Touch sensing with frustrated total internal reflection |
US20120170056A1 (en) * | 2009-07-16 | 2012-07-05 | Opdi Technologies A/S | Device, a system and a method of encoding a position of an object |
US20120162142A1 (en) * | 2009-09-02 | 2012-06-28 | Flatfrog Laboratories Ab | Touch-sensitive system and method for controlling the operation thereof |
US20120182265A1 (en) * | 2009-09-04 | 2012-07-19 | Cambridge Display Technology Limited | Apparatus with Correlated Emitter-Detector Pairs |
US20120188188A1 (en) * | 2009-09-04 | 2012-07-26 | Cambridge Display Technology Limited | Touch Screen Display Device |
US20120169672A1 (en) * | 2009-09-11 | 2012-07-05 | Flatfrog Laboratories Ab | Touch surface with variable refractive index |
US20110074736A1 (en) * | 2009-09-25 | 2011-03-31 | Hideya Takakura | Optical pointing device and electronic equipments |
US20120201716A1 (en) * | 2009-10-05 | 2012-08-09 | Konica Minolta Holdings, Inc. | Surface plasmon-enhanced fluorescence measuring apparatus |
US20120200538A1 (en) * | 2009-10-19 | 2012-08-09 | Flatfrog Laboratories Ab | Touch surface with two-dimensional compensation |
US20120256882A1 (en) * | 2009-12-21 | 2012-10-11 | Flatfrog Laboratories Ab | Touch surface with identification of reduced performance |
US20120068971A1 (en) * | 2010-09-17 | 2012-03-22 | Nigel Patrick Pemberton-Pigott | Touch-sensitive display with optical sensor and method |
US20140085241A1 (en) * | 2011-05-16 | 2014-03-27 | Flatfrog Laboratories Ab | Device and method for determining reduced performance of a touch sensitive apparatus |
US20120306815A1 (en) * | 2011-06-02 | 2012-12-06 | Omnivision Technologies, Inc. | Optical touchpad for touch and gesture recognition |
US20130141364A1 (en) * | 2011-11-18 | 2013-06-06 | Sentons Inc. | User interface interaction using touch input force |
US20140363293A1 (en) * | 2011-12-29 | 2014-12-11 | Vestas Wind Systems A/S | Wind turbine and a method for determining the presence and/or thickness of an ice layer on a blade body of a wind turbine |
US20130222785A1 (en) * | 2012-02-29 | 2013-08-29 | Canon Kabushiki Kaisha | Measurement apparatus and method of manufacturing article |
US20130285977A1 (en) * | 2012-04-30 | 2013-10-31 | Corning Incorporated | Pressure-sensing touch system utilizing total-internal reflection |
US9405382B2 (en) * | 2012-07-24 | 2016-08-02 | Rapt Ip Limited | Augmented optical waveguide for use in an optical touch sensitive device |
US20150177142A1 (en) * | 2012-08-06 | 2015-06-25 | Perkinelmer Singapore Pte Ltd | Diamond atr artefact correction |
US20140098058A1 (en) * | 2012-10-04 | 2014-04-10 | Corning Incorporated | Pressure-sensing touch system utilizing optical and capacitive systems |
US9134842B2 (en) * | 2012-10-04 | 2015-09-15 | Corning Incorporated | Pressure sensing touch systems and methods |
US20150331546A1 (en) * | 2012-12-20 | 2015-11-19 | Flatfrog Laboratories Ab | Improvements in tir-based optical touch systems of projection-type |
US20160084973A1 (en) * | 2013-05-16 | 2016-03-24 | Ibex Innovations Ltd. | Multi-Spectral X-Ray Detection Apparatus |
US20150265190A1 (en) * | 2014-03-18 | 2015-09-24 | Seiko Epson Corporation | Biological measurement apparatus and a biological measurement method |
US20150323385A1 (en) * | 2014-05-09 | 2015-11-12 | Samsung Electronics Co., Ltd. | Spectro-sensor and spectrometer employing the same |
US20160045143A1 (en) * | 2014-08-12 | 2016-02-18 | Samsung Electronics Co., Ltd. | Apparatus for noninvasively measuring bio-analyte and method of noninvasively measuring bio-analyte |
US20160051175A1 (en) * | 2014-08-25 | 2016-02-25 | Samsung Electronics Co., Ltd. | Apparatus and method of measuring stress |
US20160058381A1 (en) * | 2014-08-27 | 2016-03-03 | Samsung Electronics Co., Ltd. | Biosignal processing apparatus and biosignal processing method |
US20160089088A1 (en) * | 2014-09-29 | 2016-03-31 | Samsung Electronics Co., Ltd. | Device for correcting light absorption spectrum, method of manufacturing the device, and method of correcting light absorption spectrum |
US9554738B1 (en) * | 2016-03-30 | 2017-01-31 | Zyomed Corp. | Spectroscopic tomography systems and methods for noninvasive detection and measurement of analytes using collision computing |
Also Published As
Publication number | Publication date |
---|---|
US20160069756A1 (en) | 2016-03-10 |
KR102277902B1 (en) | 2021-07-15 |
KR20160029597A (en) | 2016-03-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10088376B2 (en) | Contact pressure measuring apparatus, method of manufacturing the same and method of measuring contact pressure | |
US9615798B2 (en) | Biological information processing apparatus, and biological information processing method | |
US10362996B2 (en) | Device for correcting light absorption spectrum, method of manufacturing the device, and method of correcting light absorption spectrum | |
US20150216458A1 (en) | Biological information processing method, biological information processing apparatus, computer system, and wearable apparatus | |
US20150216454A1 (en) | Biological information measurement apparatus and biological information measurement method | |
US20180325397A1 (en) | Photoplethysmography device | |
US20150216457A1 (en) | Blood glucose level measurement apparatus and blood glucose level measurement method | |
KR102247499B1 (en) | Apparatus and method for attenuated total reflection spectroscopic analysis apparatus having measuring apparatus for specimen contacting area | |
US10664684B2 (en) | Fingerprint sensor with liveness detection | |
JP6769171B2 (en) | Biometric information acquisition device and biometric information acquisition method | |
US9773937B2 (en) | Information acquisition apparatus | |
US20200041342A1 (en) | Apparatus and method for analyzing component of object, and image sensor | |
KR102522203B1 (en) | Apparatus and method for measuring bio-information | |
JP2009106373A (en) | Sensing apparatus for biological surface tissue | |
JP2008154873A (en) | Optical measuring instrument | |
US10718709B2 (en) | Device for measuring radiation backscattered by a sample and measurement method using such a device | |
CN110192201B (en) | Method and device for calibrating image and electronic equipment | |
KR101380700B1 (en) | A test table with solar cells for light-emitting components and a test method thereof | |
JP2020030143A (en) | Optical sensor | |
JP5665324B2 (en) | Total light measurement system, total light measurement device, and total light measurement method | |
US11334742B2 (en) | Fingerprint identification method and apparatus, electronic device, and computer-readable storage medium | |
US20110181713A1 (en) | Wet detection device, wet device, and wet detecting method | |
JP6705593B2 (en) | measuring device | |
WO2020196488A1 (en) | Blood pressure measurement device and method therefor | |
US20230133711A1 (en) | Detecting device and measuring device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: SAMSUNG ELECTRONICS CO., LTD., KOREA, REPUBLIC OF Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KIM, SANGKYU;LEE, JOONHYUNG;CHO, SEONGHO;REEL/FRAME:036275/0014 Effective date: 20150304 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 4 |