TWM560019U - IC inspection machine with temporarily fixed function - Google Patents

Abstract

An IC inspection machine having a temporary fixing effect comprises: a mounting platform; a fine-tuning Z-axis platform disposed on the mounting platform; and a photographing unit disposed on the fine-tuning Z-axis platform, the photographing unit mainly having a camera and a camera a light source, an optical module, and a lens, the lens is disposed at a top end of the optical module and facing upward, the camera and the light source are disposed on the optical module; and a socket is disposed on the mounting platform, the socket has a hollow portion and a plurality of air holes, the plurality of air holes are located beside the hollow portion, the hollow portion is located above the lens, and the lens is taken up from the bottom portion through the hollow portion.

Description

IC inspection machine with temporary fixing effect

The present invention relates to an inspection technique of an integrated circuit (IC), and more particularly to an IC inspection machine having a temporary fixing effect.

Most of the currently known IC inspection techniques are electrically conducted to measure the resistance value or operate it to determine whether the function is normal. For example, Patent No. I 364832 of the Republic of China discloses that the electrical resistance is measured by electrical conduction. Technology. Such a technique can confirm whether the function of the IC is normal.

The above detection technology mainly detects the IC that has been manufactured to confirm whether it can work normally. However, if there is a detection technology to confirm whether the IC is in the normal state before the IC is completed, It is possible to filter out products with poor wire punching in advance, so as to avoid unnecessary processing of defective products in the process, resulting in unnecessary waste. In addition, the yield of subsequent products can be further improved.

The main purpose of the present invention is to provide an IC inspection machine having a temporary fixing effect, which can check whether the wiring condition of the IC is good.

A further object of the present invention is to provide an IC inspection machine having a temporary fixing effect, which can temporarily vacuum the IC carrier tape when the IC is inspected, thereby improving the quality of the inspection.

In order to achieve the above object, the present invention provides an IC inspection machine having a temporary fixing effect, comprising: a mounting platform; a fine-tuning Z-axis platform disposed on the mounting platform; and a photographing unit disposed on the fine-tuning Z-axis platform, The photographing unit mainly has a camera, a light source, an optical module and a lens, the lens is disposed at the top of the optical module and faces upward, the camera and the light source are disposed on the optical module; and a socket is disposed on the The mounting base has a hollow portion and a plurality of air holes, the plurality of air holes are located beside the hollow portion, the hollow portion is located above the lens, and the lens is taken up from the bottom portion through the hollow portion.

In this way, the creation can not only check whether the IC is in good condition, but also can check a large number of ICs in accordance with the continuous feeding method. In addition, the creation can temporarily fix the IC carrier tape by vacuum suction at the time of inspection, thereby improving the quality of the inspection.

In order to explain in detail the technical features of the present invention, the following preferred embodiments are described below with reference to the following:

As shown in FIG. 1 to FIG. 3, an IC inspection machine 10 having a temporary fixing effect is provided by a mounting table 11, a fine adjustment Z-axis platform 21, and a photographing unit 31. And a seat 41 consisting of:

The mounting table 11 may be in a state of being fixed to a certain base without being moved. However, in this embodiment, the mounting stage 11 is disposed on an XYZ axis platform 51. The XYZ axis platform 51 is combined by an X-axis platform 52, a Y-axis platform 54, and a Z-axis platform 56. The mounting table 11 is provided on the XYZ axis platform 51. The XYZ axis platform 51 is fixed to a base 58 for operation to cause the mounting table 11 to move in the X-axis direction, the Y-axis direction, and the Z-axis direction.

The fine adjustment Z-axis stage 21 is provided on the mounting table 11.

The camera unit 31 has a camera 32, a light source 34, an optical module 36, and a lens 38. The lens 38 is disposed at the top of the optical module 36 and faces upward. The camera 32 and the light source 34 are disposed on the camera. Optical module 36. In actual implementation, the optical module 36 has a bifurcation tube 37, a plurality of mirrors (not shown), and a plurality of lenses (not shown), and the plurality of mirrors and the plurality of lenses are located in the bifurcation tube 37, the branching pipe 37 is composed of a main pipe 371 and a pipe 372 which is coupled to the pipe body of the main pipe 371 at one end, and the end of the pipe 372 is directed downward, and the lens 38 is disposed at the end. The main surface of the main pipe 371 is disposed at the bottom end of the main pipe 371. The camera 32 is disposed at the bottom end of the main pipe 371. The lens is optically coaxial with the lens 38 by the guiding of the plurality of mirrors and the plurality of lenses. At the end of the branch 372, the emitted light is coaxial with the optical axis of the lens 38 by the guiding of the complex mirror and the complex lens, and is illuminated by the lens 38. The photographing unit 31 is provided in the trimming Z-axis unit by the branching pipe 37. Among them, the technique that the two bifurcated optical axes are combined into a coaxial by a complex lens and a mirror is a conventional technique in the field of optics, and the position of the lens and the mirror is no longer represented by a figure.

The socket 41 is disposed on the mounting base 11 . The socket 41 has a hollow portion 42 and a plurality of air holes 44 . The plurality of air holes 44 are located beside the hollow portion 42 . The hollow portion 42 is located above the lens 38 . The 38 system is imaged by the hollow portion 42 from the bottom to the top.

The above describes the structure of this creation, and then explains the operational status of this creation.

Please refer to FIG. 1 to FIG. 5 . Before use, as shown in FIG. 4 and FIG. 5 , the present invention 10 is first installed under a pressing device 90 , and the pressing device 90 can perform an IC carrier tape 91 . Pressing, the IC carrier tape 91 loads the complex IC 92 in a serial manner.

In use, an IC carrier tape 91 is movably disposed on the pressing device 90. The complex IC 92 is located on a surface above the IC carrier tape 91, and the XYZ axis platform 51 is adjusted to move the mounting table 11, Thereby the socket 41 is located directly below the IC carrier tape as shown in FIG. The height of the photographing unit 31 relative to the socket 41 is adjusted by the fine adjustment of the Z-axis platform 21, thereby adjusting the focal length of the photographing.

As shown in FIGS. 4 to 5, during the inspection, the IC carrier tape 91 is moved so that each of the ICs 92 on the IC carrier tape 91 passes through the lens 38 of the present creation, when an IC 92 is aligned. In the case of the lens 38 of the present invention, the pressing device 90 presses the IC carrier tape 91, and sucks the IC carrier tape 91 by the air source (not shown) through the plurality of air holes 44 to temporarily fix the lens. At this time, the light emitted by the light source 34 is irradiated onto the IC carrier tape 91 through the lens 38, and the reflected light enters through the lens 38 and is captured by the camera 32, and the captured image is available for the background. The IC 92 judges the wire condition. After the camera 32 is photographed, the air source is controlled so that the plurality of air holes 44 are no longer inhaled to release the IC carrier tape 91 to be in a movable state, and the pressing device 90 also releases the pressing action, and then can be moved again. The IC carrier tape 91 causes the next IC 92 to be aligned with the lens 38 of the present creation, thereby repeating the above actions for inspection. It should be added that, when controlling and controlling the air source to release the IC carrier tape 91, in addition to not inhaling, the air source can be controlled to make the plurality of air holes 44 to be ejected, thereby allowing the IC carrier tape 91 to be subjected to The thrust of the air floats slightly above the socket 41 without contact, which further assists the IC carrier tape 91 to move in a more dragless and frictionless manner.

As can be seen from the above description, the present invention is to inspect the complex IC 92 located on the top surface of the IC carrier tape 91 on the bottom surface of the IC carrier tape 91. When inspecting, the light is applied to the bottom surface of the IC carrier tape 91 and photographed. Further, the image of the plurality of ICs 92 is obtained by the IC carrier tape 91, and is inspected by image processing.

In summary, this creation can check whether the IC is in good condition, and it is also possible to check a large number of ICs in a continuous feed. Moreover, the IC carrier tape can be vacuum-attracted at the time of inspection to temporarily fix it, thereby improving the quality of the inspection.

10‧‧‧IC inspection machine with temporary fixing effect
11‧‧‧Installation table
21‧‧‧ Fine-tuning Z-axis platform
31‧‧‧Photographic unit
32‧‧‧ camera
34‧‧‧Light source
36‧‧‧Optical module
37‧‧‧fork tube
371‧‧‧Supervisor
372‧‧‧ branch
38‧‧‧ lens
41‧‧‧ 承座
42‧‧‧镂空部
44‧‧‧ stomata
51‧‧‧XYZ axis platform
52‧‧‧X-axis platform
54‧‧‧Y-axis platform
56‧‧‧Z-axis platform
58‧‧‧Base
90‧‧‧Compression device
91‧‧‧IC carrier tape
92‧‧‧IC

Figure 1 is a perspective view of a preferred embodiment of the present invention. Figure 2 is another perspective view of a preferred embodiment of the present invention showing different viewing angles. Figure 3 is a front elevational view of a preferred embodiment of the present invention. Figure 4 is a schematic view of the assembly of a preferred embodiment of the present invention. Figure 5 is a schematic diagram of the action of a preferred embodiment of the present invention.

Claims (5)

An IC inspection machine having a temporary fixing effect, comprising: a mounting platform; a fine-tuning Z-axis platform disposed on the mounting platform; a photographing unit disposed on the fine-tuning Z-axis platform, the photographing unit mainly having a camera and a camera a light source, an optical module, and a lens, the lens is disposed at a top end of the optical module and facing upward, the camera and the light source are disposed on the optical module; and a socket is disposed on the mounting platform, the socket has a hollow portion and a plurality of air holes, the plurality of air holes are located beside the hollow portion, the hollow portion is located above the lens, and the lens is taken up from the bottom portion through the hollow portion. An IC inspection machine having a temporary fixing effect according to the first aspect of the patent application, wherein the optical module has a furcation tube, a plurality of mirrors, and a plurality of lenses, and the plurality of mirrors and the plurality of lenses are located in the branch tube The lens is disposed at the top of the bifurcation tube and faces upwards. The camera is disposed on the bifurcation tube, and is optically coaxial with the lens by the guiding of the plurality of mirrors and the plurality of lenses, so as to cooperate with the image capturing. The light source is disposed on the branching tube, and the emitted light is coaxial with the optical axis of the lens by the guiding of the plurality of mirrors and the plurality of lenses, and is irradiated by the lens. An IC inspection machine having a temporary fixing effect according to the second aspect of the patent application, wherein the photographing unit is provided in the fine adjustment Z-axis unit by the branching tube. An IC inspection machine having a temporary fixing effect according to item 2 of the patent application scope, wherein: the branching pipe is composed of a main pipe and a pipe, and the pipe is coupled to the pipe body of the main pipe at one end, and the branch pipe is The end is down, the lens is at the top of the main tube, the camera is at the bottom of the main tube, and the light source is at the end of the tube. An IC inspection machine having a temporary fixing effect according to claim 1 of the patent application scope, further comprising: a base and an XYZ axis platform, the XYZ axis platform comprises an X-axis platform, a Y-axis platform and a Z-axis The platform is combined. The mounting platform is disposed on the XYZ axis platform. The XYZ axis platform is disposed on the base, and is operable to cause the mounting table to move in the X-axis direction, the Y-axis direction, and the Z-axis direction.