TWI827551B - Adhesive film for semiconductor device manufacturing, semiconductor device and manufacturing method thereof - Google Patents

Adhesive film for semiconductor device manufacturing, semiconductor device and manufacturing method thereof Download PDF

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TWI827551B
TWI827551B TW107132902A TW107132902A TWI827551B TW I827551 B TWI827551 B TW I827551B TW 107132902 A TW107132902 A TW 107132902A TW 107132902 A TW107132902 A TW 107132902A TW I827551 B TWI827551 B TW I827551B
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adhesive
film
adhesive sheet
semiconductor device
carrier film
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TW107132902A
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Chinese (zh)
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TW201921524A (en
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大久保恵介
藤尾俊介
夏川昌典
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日商力森諾科股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B37/00Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding
    • B32B37/12Methods or apparatus for laminating, e.g. by curing or by ultrasonic bonding characterised by using adhesives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/02Physical, chemical or physicochemical properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • B32B7/14Interconnection of layers using interposed adhesives or interposed materials with bonding properties applied in spaced arrangements, e.g. in stripes
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/52Mounting semiconductor bodies in containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2203/00Applications of adhesives in processes or use of adhesives in the form of films or foils
    • C09J2203/326Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)
  • Die Bonding (AREA)
  • Wire Bonding (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Laminated Bodies (AREA)

Abstract

本揭示的接著膜包括:寬度100 mm以下的帶狀的載體膜;以及以沿載體膜的長邊方向排列的方式配置於載體膜上的多個接著劑片;並且接著劑片具有於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀。本揭示的半導體裝置包括:半導體晶片;與半導體晶片電性連接的基板;以及配置於半導體晶片與基板之間且將半導體晶片與基板接著的接著劑片;並且半導體晶片的形狀與接著劑片的形狀不同。The adhesive film of the present disclosure includes: a strip-shaped carrier film with a width of 100 mm or less; and a plurality of adhesive sheets arranged on the carrier film in a manner arranged along the longitudinal direction of the carrier film; and the adhesive sheet has a shape of rectangular or At least one side of the square is formed in a shape having at least one of a convex portion and a concave portion. The semiconductor device of the present disclosure includes: a semiconductor wafer; a substrate electrically connected to the semiconductor wafer; and an adhesive sheet disposed between the semiconductor wafer and the substrate to bond the semiconductor wafer and the substrate; and the shape of the semiconductor wafer is consistent with the shape of the adhesive sheet. The shapes are different.

Description

半導體裝置製造用接著膜以及半導體裝置及其製造方法Adhesive film for semiconductor device manufacturing, semiconductor device and manufacturing method thereof

本揭示是有關於一種半導體裝置的製造製程中所使用的接著膜以及半導體裝置及其製造方法。The present disclosure relates to an adhesive film used in a manufacturing process of a semiconductor device and a semiconductor device and a manufacturing method thereof.

先前,半導體裝置是經過以下的步驟而製造。首先,將半導體晶圓貼附於切晶用黏著片,於該狀態下,將半導體晶圓單片化為半導體晶片。其後,實施拾取步驟、裝配步驟、回焊步驟及黏晶步驟等。專利文獻1揭示兼具於切晶步驟中將半導體晶圓固定的功能及於黏晶步驟中使半導體晶片與基板接著的功能的黏接著片(切晶黏晶片)。 [現有技術文獻] [專利文獻]Previously, semiconductor devices were manufactured through the following steps. First, the semiconductor wafer is attached to the die cutting adhesive sheet, and in this state, the semiconductor wafer is diced into semiconductor wafers. Thereafter, the picking step, the assembly step, the reflow step, the die bonding step, etc. are implemented. Patent Document 1 discloses an adhesive sheet (die-bonding wafer) that has both the function of fixing the semiconductor wafer in the die-cutting step and the function of bonding the semiconductor wafer to the substrate in the die-bonding step. [Prior Art Documents] [Patent Documents]

[專利文獻1]日本專利特開2007-288170號公報[Patent Document 1] Japanese Patent Application Laid-Open No. 2007-288170

[發明所欲解決之課題] 然而,近年來,伴隨面向以智慧型手機為代表的小型元件的半導體裝置的進化,與先前相比,半導體裝置的製造製程亦發生顯著變化。例如,不實施使用專利文獻1中記載的黏接著片(切晶黏晶片)的切晶步驟及黏晶步驟的製程或者不實施回焊步驟的製程的實用化正在推進。伴隨於此,對半導體裝置的製造製程中所使用的接著膜亦要求新的態樣。除所述情況以外,本發明者等人為了應對搭載半導體裝置的小型元件的高功能化及薄型化等,而推進開發一種對於在基板的所限定的特定的區域內接著與其相對應的形狀的半導體晶片而言好用的接著膜。[Problem to be Solved by the Invention] However, in recent years, with the evolution of semiconductor devices for small components represented by smartphones, the manufacturing process of semiconductor devices has also undergone significant changes compared with the past. For example, the practical application of a process that does not perform the die cutting step and the die bonding step using the adhesive wafer (die die bonding wafer) described in Patent Document 1 or the process that does not implement the reflow step is advancing. Along with this, new aspects are also required for adhesive films used in the manufacturing process of semiconductor devices. In addition to the above-mentioned cases, the inventors of the present invention have been promoting the development of a method for attaching a shape corresponding to a defined specific area of a substrate in order to cope with the increase in functionality and thinness of small components equipped with semiconductor devices. A useful adhesive film for semiconductor wafers.

於先前的半導體裝置中,通常半導體晶片的形狀與用以將其接著於基板的接著劑片的形狀相同,例如該些的形狀為長方形或正方形。但是,例如,於應接著半導體晶片的基板的區域有限制的情況下,或者於需要在和先前不同的位置將半導體晶片與基板電性連接的情況下,使用較先前的形狀而言複雜的形狀的接著劑片的需求提高。In previous semiconductor devices, the shape of the semiconductor wafer is usually the same as the shape of the adhesive sheet used to bond it to the substrate, such as a rectangle or a square. However, for example, when the area of the substrate to which the semiconductor wafer should be connected is limited, or when the semiconductor wafer and the substrate need to be electrically connected at a different position than before, a more complicated shape than the previous shape is used. The demand for adhesive tablets has increased.

本揭示的目的在於提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,本揭示的目的在於提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。 [解決課題之手段]An object of the present disclosure is to provide an adhesive film including a complex-shaped adhesive sheet that is useful for efficiently performing an adhesive step in a manufacturing process of a semiconductor device. In addition, an object of this disclosure is to provide a semiconductor device using a complex-shaped adhesive sheet and a manufacturing method thereof. [Means to solve the problem]

本揭示的半導體裝置製造用接著膜包括:寬度100 mm以下的帶狀的載體膜;以及以沿載體膜的長邊方向排列的方式配置於載體膜上的多個接著劑片;並且接著劑片具有於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀。The adhesive film for semiconductor device manufacturing of the present disclosure includes: a strip-shaped carrier film with a width of 100 mm or less; and a plurality of adhesive sheets arranged on the carrier film so as to be arranged along the longitudinal direction of the carrier film; and the adhesive sheets It has a shape in which at least one of a convex part and a concave part is formed on at least one side of a rectangle or a square.

根據該接著膜,可依次拾取以排列於載體膜上的方式配置的多個接著劑片,其後,將各接著劑片配置於基板的規定的區域,且可有效率地實施基板與半導體晶片的接著步驟。例如,若設為將帶狀的接著膜捲繞於捲軸的態樣,則可藉由輥對輥方式而更進一步有效率地實施接著步驟。如上所述,接著劑片具有較長方形或正方形而言複雜的形狀。接著劑片的形狀只要根據應接著半導體晶片的基板的區域的形狀或半導體晶片的形狀而適宜設定即可。例如,接著劑片可具有6個以上的角,亦可具有8個以上的角。再者,作為具有6個角的接著劑片的形狀的一例,可列舉L字型。According to this adhesive film, a plurality of adhesive sheets arranged so as to be arranged on the carrier film can be picked up in order, and then each adhesive sheet can be arranged in a predetermined area of the substrate, and the substrate and the semiconductor wafer can be efficiently connected. next steps. For example, if the tape-shaped adhesive film is wound on a reel, the adhesive step can be performed more efficiently by a roll-to-roll system. As described above, the adhesive sheet has a complex shape such as a rectangular or square shape. The shape of the adhesive sheet may be appropriately set according to the shape of the region of the substrate to which the semiconductor wafer is to be bonded or the shape of the semiconductor wafer. For example, the adhesive sheet may have 6 or more corners, or may have 8 or more corners. In addition, an L-shape is mentioned as an example of the shape of the adhesive sheet which has 6 corners.

配置於載體膜上的接著劑片的尺寸及個數等只要根據所製造的半導體裝置的設計而適宜設定即可。例如,一個接著劑片的面積可設為10 mm2 ~200 mm2 的範圍。以載體膜的面積為基準,載體膜的表面且為被多個接著劑片覆蓋的區域的比例可設為10%~60%。於載體膜上亦可形成一個或多個包含所述多個接著劑片的行。The size, number, etc. of the adhesive sheets arranged on the carrier film may be appropriately set according to the design of the semiconductor device to be manufactured. For example, the area of one adhesive sheet can be set in the range of 10 mm 2 to 200 mm 2 . Based on the area of the carrier film, the proportion of the surface of the carrier film that is covered by the plurality of adhesive sheets can be set to 10% to 60%. One or more rows containing the plurality of adhesive sheets may also be formed on the carrier film.

多個接著劑片例如可藉由將以覆蓋載體膜的表面的方式形成的接著劑層模切而形成。就接著膜的加工性的觀點(進行模切時及其後,防止接著劑片自載體膜不經意地剝離的方面)而言,載體膜與接著劑片之間的密接力較佳為0.5 N/m~18 N/m。The plurality of adhesive sheets can be formed, for example, by die-cutting the adhesive layer formed so as to cover the surface of the carrier film. From the viewpoint of the processability of the adhesive film (the aspect of preventing the adhesive sheet from being inadvertently peeled off from the carrier film during die-cutting and thereafter), the adhesion force between the carrier film and the adhesive sheet is preferably 0.5 N/ m~18 N/m.

本揭示的接著膜亦可進而包括保護構件,所述保護構件覆蓋接著劑片的與載體膜側的第一面相反的一側的第二面且具有與接著劑片相同的形狀。藉由設為利用保護構件覆蓋接著劑片的狀態,可防止塵埃等附著於接著劑片,直至使用時為止。接著劑片及保護構件可藉由將以覆蓋載體膜的表面的方式形成的接著劑層與以覆蓋接著劑層的方式配置的保護膜模切而形成。The adhesive film of the present disclosure may further include a protective member that covers the second surface of the adhesive sheet on the opposite side to the first surface on the carrier film side and has the same shape as the adhesive sheet. By covering the adhesive sheet with the protective member, dust and the like can be prevented from adhering to the adhesive sheet until use. The adhesive sheet and the protective member can be formed by die-cutting the adhesive layer formed to cover the surface of the carrier film and the protective film arranged to cover the adhesive layer.

保護構件的光透過率較佳為低於載體膜的光透過率。藉由採用所述構成,可利用相機等元件來識別接著劑片的位置,且容易使接著步驟完全自動化。The light transmittance of the protective member is preferably lower than the light transmittance of the carrier film. By adopting the above structure, the position of the adhesive sheet can be recognized using elements such as a camera, and the bonding step can be easily fully automated.

就半導體晶片與基板的接著步驟的作業性的觀點而言,接著劑片與保護構件之間的密接力較佳為16 N/m以下。例如,於接著劑片包含具有熱硬化性的樹脂組成物的情況下,較佳為:於在100℃下進行10分鐘的熱處理後,接著劑片與保護構件之間的密接力為16 N/m以下。 [發明的效果]From the viewpoint of the workability of the bonding step between the semiconductor wafer and the substrate, the adhesive force between the adhesive sheet and the protective member is preferably 16 N/m or less. For example, when the adhesive sheet contains a thermosetting resin composition, it is preferable that the adhesive force between the adhesive sheet and the protective member is 16 N/ m or less. [Effects of the invention]

根據本揭示,可提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,根據本揭示,可提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。According to the present disclosure, it is possible to provide an adhesive film including a complex-shaped adhesive sheet that is useful for efficiently performing an adhesive step in a manufacturing process of a semiconductor device. In addition, according to the present disclosure, a semiconductor device using a complex-shaped adhesive sheet and a manufacturing method thereof can be provided.

以下,一邊適宜參照圖式,一邊對本揭示的實施形態進行說明。再者,本發明並不限定於以下的實施形態。於本說明書中,所謂(甲基)丙烯酸,是指丙烯酸或甲基丙烯酸。Hereinafter, embodiments of the present disclosure will be described with appropriate reference to the drawings. In addition, the present invention is not limited to the following embodiments. In this specification, (meth)acrylic acid means acrylic acid or methacrylic acid.

<半導體裝置製造用接著膜> 圖1是示意性表示本實施形態的接著膜的立體圖。圖2是圖1所示的II-II線的剖面圖。該些圖所示的接著膜10包括:寬度100 mm以下的帶狀的載體膜1;以沿載體膜1的長邊方向(圖1所示的箭頭X的方向)排列的方式配置於載體膜1上的多個接著劑片3p;以及覆蓋接著劑片3p的表面F2且具有與接著劑片3p相同的形狀的保護構件5p。如圖2所示,接著劑片3p的表面F2(第二面)為接著劑片3p的與載體膜1側的面F1(第一面)相反的一側的面。<Adhesive film for semiconductor device manufacturing> Fig. 1 is a perspective view schematically showing the adhesive film of this embodiment. FIG. 2 is a cross-sectional view along line II-II shown in FIG. 1 . The adhesive film 10 shown in these figures includes: a strip-shaped carrier film 1 with a width of 100 mm or less; and is arranged on the carrier film so as to be arranged along the longitudinal direction of the carrier film 1 (the direction of the arrow X shown in Figure 1). a plurality of adhesive sheets 3p on 1; and a protective member 5p that covers the surface F2 of the adhesive sheet 3p and has the same shape as the adhesive sheet 3p. As shown in FIG. 2 , surface F2 (second surface) of the adhesive sheet 3 p is the surface on the opposite side to the surface F1 (first surface) on the carrier film 1 side of the adhesive sheet 3 p.

接著膜10可應用於半導體裝置的製造製程中的各種接著步驟(例如,半導體晶片與基板的接著)。根據接著膜10,可依次拾取以排列於載體膜1上的方式配置的多個接著劑片3p,其後,將各接著劑片3p配置於基板的規定的區域,且可有效率地實施基板與半導體晶片的接著步驟。再者,於圖1、圖2中,圖示了於載體膜1上設置有一行包含多個接著劑片3p的行3A的情況,亦可於載體膜1上設置兩個以上的行3A。The bonding film 10 can be applied to various bonding steps in the manufacturing process of semiconductor devices (eg, bonding a semiconductor wafer and a substrate). According to the adhesive film 10, a plurality of adhesive sheets 3p arranged so as to be arranged on the carrier film 1 can be picked up sequentially, and each adhesive sheet 3p can then be arranged in a predetermined area of the substrate, and the substrate can be efficiently implemented. Subsequent step with semiconductor wafer. Furthermore, FIGS. 1 and 2 illustrate a case where one row 3A including a plurality of adhesive sheets 3 p is provided on the carrier film 1 , but two or more rows 3A may be provided on the carrier film 1 .

如圖1所示,本實施形態的接著劑片3p具有如粗T字般的形狀(T字型)。如圖3(a)所示,該形狀具有8個角C1~角C8。再者,該形狀可稱為於長方形的一邊的中央部形成有一個凸部的形狀,亦可稱為於長方形的一邊的兩端分別形成有各一個凹部的形狀。As shown in FIG. 1 , the adhesive sheet 3 p of this embodiment has a shape like a thick T (T-shape). As shown in Figure 3(a), this shape has eight corners C1 to C8. Furthermore, this shape may be called a shape in which a convex part is formed in the center of one side of the rectangle, or may be called a shape in which a concave part is formed in both ends of one side of the rectangle.

接著劑片3p的形狀並不限定於圖3(a)所示的形狀,只要為於長方形或正方形的至少一邊形成有凸部及凹部的至少一者的形狀即可。例如,如圖3(b)所示,可為L字型,且可具有6個角C1~角C6。如圖3(c)所示,亦可為於長方形或正方形中形成有一個凹部的形狀且具有8個角C1~角C8。如圖3(d)所示,亦可為於長方形或正方形的一個角部(圖3(d)中的左下方)形成有凹部且於一邊(圖3(d)中的右側)形成有凸部的形狀且具有10個角C1~角C10。如圖3(e)所示,亦可為於長方形或正方形的一邊形成有凸部且於另一邊形成有凹部的形狀且具有12個角C1~角C12。再者,如圖3(f)所示,凹部或凸部的形狀可為三角形,亦可為圓弧狀。The shape of the adhesive tablet 3p is not limited to the shape shown in FIG. 3(a) , as long as it is a shape in which at least one of a convex part and a recessed part is formed on at least one side of a rectangle or a square. For example, as shown in FIG. 3(b) , it may be L-shaped and may have six corners C1 to C6. As shown in FIG. 3(c) , it may be a shape in which one recess is formed in a rectangle or a square, and may have eight corners C1 to C8. As shown in Figure 3(d), a recess may be formed at one corner of the rectangle or square (the lower left in Figure 3(d)) and a convex part may be formed on one side (the right side in Figure 3(d)). The shape of the part has 10 corners C1 to C10. As shown in FIG. 3(e) , it may be a shape in which a convex part is formed on one side of a rectangle or a square and a recessed part is formed on the other side, and it may have 12 corners C1 to C12. Furthermore, as shown in FIG. 3(f) , the shape of the concave portion or the convex portion may be triangular or arc-shaped.

接著劑片的形狀只要根據應接著半導體晶片的基板的區域的形狀或半導體晶片的形狀而適宜設定即可。另外,半導體晶片例如具有長方形或正方形的形狀且於其角部設置有多個端子,於需要將該些端子與基板的配線連接的情況下,可以端子與配線不被接著劑片覆蓋的方式決定接著劑片的形狀。圖4是示出T字型的接著劑片3p與長方形的半導體晶片S的配置的一例的平面圖。圖4所示的區域R1、區域R2中,於基板與半導體晶片之間不存在接著劑,而可於該些區域R1、區域R2中將基板與半導體晶片電性連接。The shape of the adhesive sheet may be appropriately set according to the shape of the region of the substrate to which the semiconductor wafer is to be bonded or the shape of the semiconductor wafer. In addition, the semiconductor wafer has a rectangular or square shape, for example, and a plurality of terminals are provided at its corners. When it is necessary to connect these terminals to wiring on the substrate, the connection can be determined so that the terminals and wiring are not covered by the adhesive sheet. Tablet shape. FIG. 4 is a plan view showing an example of the arrangement of the T-shaped adhesive sheet 3 p and the rectangular semiconductor wafer S. In the regions R1 and R2 shown in FIG. 4 , there is no adhesive between the substrate and the semiconductor wafer, and the substrate and the semiconductor wafer can be electrically connected in these regions R1 and R2 .

本實施形態中的接著劑片3p假定為尺寸充分小者,一個接著劑片3p的面積例如為10 mm2 ~200 mm2 ,亦可為20 mm2 ~160 mm2 或25 mm2 ~100 mm2 。以載體膜1的面積為基準,載體膜1的表面且為被多個接著劑片3p覆蓋的區域的比例(接著劑片的面積率)例如為10%~60%,亦可為10%~35%或15%~33%。該面積率可藉由如下方式來算出:將一個接著劑片3p的面積A除以設置於載體膜1上的接著劑片3p的間距(圖1中的間距P)與載體膜1的寬度(圖1中的寬度W)的積。即,該面積率R亦可設為利用以下的式所算出的值。 面積率R(%)=A/(P×W)×100The adhesive sheet 3p in this embodiment is assumed to be sufficiently small in size. The area of one adhesive sheet 3p is, for example, 10 mm 2 to 200 mm 2 , or may be 20 mm 2 to 160 mm 2 or 25 mm 2 to 100 mm. 2 . Based on the area of the carrier film 1, the proportion of the surface of the carrier film 1 that is covered by the plurality of adhesive sheets 3p (the area ratio of the adhesive sheets) is, for example, 10% to 60%, or may be 10% to 3p. 35% or 15%~33%. This area ratio can be calculated by dividing the area A of one adhesive sheet 3p by the pitch (pitch P in FIG. 1 ) of the adhesive sheets 3p provided on the carrier film 1 and the width of the carrier film 1 ( The product of the width W) in Figure 1. That is, the area ratio R may be a value calculated using the following equation. Area ratio R (%) = A/(P×W)×100

以下,對接著膜10的構成進行說明。 [載體膜] 如上所述,載體膜1為帶狀且具有100 mm以下的寬度。載體膜1的寬度只要根據配置於其上的接著劑片3p的尺寸及行3A的數量而適宜設定即可。例如,如圖1所示,於行3A的數量為一個的情況下,載體膜1的寬度較佳為10 mm~50 mm,亦可為10 mm~30 mm或10 mm~20 mm。藉由載體膜1的寬度為10 mm以上,於採用輥對輥方式的情況下,容易防止因撚載體膜1而導致作業性降低。Hereinafter, the structure of the adhesive film 10 is demonstrated. [Carrier Film] As described above, the carrier film 1 is strip-shaped and has a width of 100 mm or less. The width of the carrier film 1 may be appropriately set according to the size of the adhesive sheet 3p placed thereon and the number of rows 3A. For example, as shown in Figure 1, when the number of rows 3A is one, the width of the carrier film 1 is preferably 10 mm to 50 mm, and may also be 10 mm to 30 mm or 10 mm to 20 mm. When the width of the carrier film 1 is 10 mm or more, when the roll-to-roll method is used, it is easy to prevent the carrier film 1 from being twisted, resulting in a decrease in workability.

關於載體膜1的材質,若為可充分耐受於接著膜10的製造製程及半導體裝置的製造製程中所施加的張力者,則並無特別限制。關於載體膜1,就配置於其上的接著劑片3p及/或保護構件5p的視認性的觀點而言,較佳為透明。作為載體膜1,可使用聚對苯二甲酸乙二酯膜等聚酯系膜、聚四氟乙烯膜、聚乙烯膜、聚丙烯膜、聚甲基戊烯膜、聚乙烯乙酸酯膜、聚-4-甲基戊烯-1、乙烯-乙酸乙烯酯共聚物、乙烯-丙烯酸乙酯共聚物等均聚物或共聚物或者該些的混合物等聚烯烴系膜、聚氯乙烯膜、聚醯亞胺膜等塑膠膜等。載體膜1可為單層結構,亦可為多層結構。The material of the carrier film 1 is not particularly limited as long as it can sufficiently withstand the tension applied during the manufacturing process of the adhesive film 10 and the semiconductor device. The carrier film 1 is preferably transparent from the viewpoint of visibility of the adhesive sheet 3p and/or the protective member 5p placed thereon. As the carrier film 1, polyester films such as polyethylene terephthalate films, polytetrafluoroethylene films, polyethylene films, polypropylene films, polymethylpentene films, polyethylene acetate films, Homopolymers or copolymers such as poly-4-methylpentene-1, ethylene-vinyl acetate copolymer, ethylene-ethyl acrylate copolymer, or mixtures thereof, such as polyolefin films, polyvinyl chloride films, polyethylene films, etc. Imide film and other plastic films. The carrier film 1 can be a single-layer structure or a multi-layer structure.

載體膜1的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為10 μm~200 μm,亦可為20 μm~100 μm或25 μm~80 μm。該些厚度範圍為於實用方面無問題且於經濟方面亦有效的範圍。The thickness of the carrier film 1 may be appropriately selected within a range that does not impair workability, for example, 10 μm to 200 μm, 20 μm to 100 μm, or 25 μm to 80 μm. These thickness ranges are a range that has no practical problems and is also economically effective.

為了提高接著劑片3p相對於載體膜1的密接力,可對載體膜1的表面實施電暈處理、鉻酸處理、臭氧暴露、火焰暴露、高壓電擊暴露、離子化放射線處理等化學性或物理性表面處理。作為載體膜1,亦可使用包含氟樹脂的表面能量低的膜。作為此種膜,例如存在帝人膜解決方案(Teijin film solutions)股份有限公司製造的A-63(模切處理劑:改質矽酮系)及帝人膜解決方案(Teijin film solutions)股份有限公司製造的A-31(模切處理劑:Pt系矽酮系)等。In order to improve the adhesive force of the adhesive sheet 3p relative to the carrier film 1, the surface of the carrier film 1 can be subjected to chemical or physical treatments such as corona treatment, chromic acid treatment, ozone exposure, flame exposure, high-voltage electric shock exposure, and ionizing radiation treatment. Sexual surface treatment. As the carrier film 1, a film containing a fluororesin and having a low surface energy can also be used. Examples of such films include A-63 (die-cutting treatment agent: modified silicone type) manufactured by Teijin Film Solutions Co., Ltd. and Teijin Film Solutions Co., Ltd. A-31 (Die-cutting treatment agent: Pt-based silicone-based), etc.

為了防止接著劑片3p相對於載體膜1的密接力過度變高,亦可於載體膜1的表面形成包含矽酮系剝離劑、氟系剝離劑、長鏈烷基丙烯酸酯系剝離劑等模切劑的模切層。In order to prevent the adhesive force of the adhesive sheet 3 p with respect to the carrier film 1 from becoming excessively high, a mold containing a silicone-based release agent, a fluorine-based release agent, a long-chain alkyl acrylate-based release agent, etc. may also be formed on the surface of the carrier film 1 Die-cut layer of cutting agent.

載體膜1與接著劑片3p之間的密接力較佳為0.5 N/m~18 N/m,更佳為2 N/m~10 N/m,亦可為2 N/m~6 N/m或2 N/m~4 N/m。藉由該密接力為0.5 N/m以上,於製造接著膜10的過程中,容易防止接著劑片3p自載體膜1不經意地剝離,另一方面,藉由該密接力為18 N/m以下,在使用接著膜10時,容易自載體膜1穩定地拾取接著劑片3p及覆蓋其的保護構件5p。再者,接著劑片3p相對於載體膜1的密接力是指90°剝離強度,具體而言,是指如下剝離強度:準備於載體膜1上形成有包含與接著劑片3p相同的組成的寬度20 mm的接著劑層的試樣,以90°的角度且以剝離速度50 mm/min將該接著劑層自載體膜剝離時所測定的剝離強度。The adhesion force between the carrier film 1 and the adhesive sheet 3p is preferably 0.5 N/m to 18 N/m, more preferably 2 N/m to 10 N/m, and may also be 2 N/m to 6 N/m. m or 2 N/m~4 N/m. When the adhesive force is 0.5 N/m or more, it is easy to prevent the adhesive sheet 3p from being inadvertently peeled off from the carrier film 1 during the manufacturing process of the adhesive film 10. On the other hand, when the adhesive force is 18 N/m or less , when using the adhesive film 10, it is easy to stably pick up the adhesive sheet 3p and the protective member 5p covering it from the carrier film 1. In addition, the adhesive force of the adhesive sheet 3p with respect to the carrier film 1 refers to the 90° peel strength. Specifically, it refers to the peeling strength prepared by forming on the carrier film 1 a film containing the same composition as the adhesive sheet 3p. The peel strength of a sample of an adhesive layer with a width of 20 mm is measured when the adhesive layer is peeled off from the carrier film at an angle of 90° and a peeling speed of 50 mm/min.

[接著劑片] 接著劑片3p是藉由將以覆蓋載體膜1的表面的方式形成的接著劑層3與以覆蓋接著劑層3的方式配置的保護膜5同時模切而與保護構件5p一起形成者(參照圖6)。接著劑片3p的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為3 μm~50 μm,亦可為5 μm~40 μm或7 μm~30 μm。藉由接著劑片3p的厚度為3 μm以上,容易確保充分的接著性,另一方面,藉由接著劑片3p的厚度為50 μm以下,容易抑制構成接著劑片3p的接著劑組成物自保護構件5p滲出。[Adhesive sheet] The adhesive sheet 3p is formed with the protective member 5p by simultaneously die-cutting the adhesive layer 3 formed to cover the surface of the carrier film 1 and the protective film 5 arranged to cover the adhesive layer 3. formed together (see Figure 6). The thickness of the adhesive sheet 3p may be appropriately selected within a range that does not impair workability, for example, 3 μm to 50 μm, 5 μm to 40 μm, or 7 μm to 30 μm. When the thickness of the adhesive sheet 3p is 3 μm or more, it is easy to ensure sufficient adhesion. On the other hand, when the thickness of the adhesive sheet 3p is 50 μm or less, it is easy to suppress the self-adhesion of the adhesive composition constituting the adhesive sheet 3p. The protective member 5p leaked out.

構成接著劑片3p的接著劑組成物只要具有可無問題地用於半導體裝置的製造製程中的性質(例如,接著性及相對於150℃左右的熱的耐熱性)即可,只要適宜採用先前於半導體裝置的製造製程中所使用者即可。接著劑片3p較佳為包含熱塑性樹脂、熱硬化性樹脂、硬化促進劑及填料,視需要亦可包含光反應性單體及光聚合起始劑等。伴隨基板的薄化,而存在使用耐熱性低的基板的傾向,且存在要求半導體裝置的製造製程的低溫化的傾向。接著劑片3p較佳為可於160℃以下的溫度條件下接著對象物。The adhesive composition constituting the adhesive sheet 3p only needs to have properties (for example, adhesiveness and heat resistance to heat of about 150°C) that can be used without problems in the manufacturing process of semiconductor devices. Those used in the manufacturing process of semiconductor devices can be used. The adhesive sheet 3p preferably contains a thermoplastic resin, a thermosetting resin, a hardening accelerator and a filler, and may also contain a photoreactive monomer, a photopolymerization initiator, etc. if necessary. As the substrate becomes thinner, there is a tendency to use a substrate with low heat resistance, and there is a tendency to require a lower temperature in the manufacturing process of the semiconductor device. The adhesive sheet 3p is preferably capable of adhering to the object under temperature conditions of 160° C. or lower.

(熱塑性樹脂) 作為熱塑性樹脂,可使用具有熱塑性的樹脂、或至少於未硬化狀態下具有熱塑性且於加熱後形成交聯結構的樹脂。作為熱塑性樹脂,就作為半導體加工用膠帶而收縮性、耐熱性及剝離性優異的觀點而言,較佳為具有反應性基的(甲基)丙烯酸共聚物(以下,亦有時稱為「含反應性基的(甲基)丙烯酸共聚物」)。 於包含含反應性基的(甲基)丙烯酸共聚物作為熱塑性樹脂的情況下,接著劑片3p亦可為不含熱硬化性樹脂的態樣。即,亦可為包含含反應性基的(甲基)丙烯酸共聚物、硬化促進劑及填料的態樣。 (Thermoplastic Resin) As the thermoplastic resin, a resin having thermoplasticity or a resin having thermoplasticity at least in an uncured state and forming a cross-linked structure after heating can be used. The thermoplastic resin is preferably a (meth)acrylic copolymer having a reactive group (hereinafter, sometimes also referred to as "containing (Meth)acrylic acid copolymer with reactive groups"). When containing a reactive group-containing (meth)acrylic copolymer as the thermoplastic resin, the adhesive sheet 3p may be in a form that does not contain a thermosetting resin. That is, an aspect including a reactive group-containing (meth)acrylic copolymer, a hardening accelerator, and a filler may be used.

熱塑性樹脂可單獨使用一種或組合使用兩種以上。 Thermoplastic resin can be used individually by 1 type or in combination of 2 or more types.

作為(甲基)丙烯酸共聚物,可列舉丙烯酸樹脂、丙烯酸橡膠等(甲基)丙烯酸酯共聚物等,較佳為丙烯酸橡膠。丙烯酸橡膠較佳為以丙烯酸酯為主成分且藉由選自(甲基)丙烯酸酯及丙烯腈中的單體的共聚而形成者。 Examples of the (meth)acrylic copolymer include (meth)acrylate copolymers such as acrylic resin and acrylic rubber, and acrylic rubber is preferred. The acrylic rubber is preferably formed by copolymerizing a monomer selected from (meth)acrylate and acrylonitrile, mainly containing acrylate.

作為(甲基)丙烯酸酯,可列舉:丙烯酸甲酯、丙烯酸乙酯、丙烯酸丙酯、丙烯酸異丙酯、丙烯酸丁酯、丙烯酸異丁酯、丙烯酸己酯、丙烯酸環己酯、丙烯酸2-乙基己酯、丙烯酸月桂酯、甲基丙烯酸甲酯、甲基丙烯酸乙酯、甲基丙烯酸丙酯、甲基丙烯酸異丙酯、甲基丙烯酸丁酯、甲基丙烯酸異丁酯、甲基丙烯酸己酯、甲基丙烯酸環己酯、甲基丙烯酸2-乙基己酯、甲基丙烯酸月桂酯等。 Examples of (meth)acrylates include methyl acrylate, ethyl acrylate, propyl acrylate, isopropyl acrylate, butyl acrylate, isobutyl acrylate, hexyl acrylate, cyclohexyl acrylate, and 2-ethyl acrylate. Hexyl methacrylate, lauryl acrylate, methyl methacrylate, ethyl methacrylate, propyl methacrylate, isopropyl methacrylate, butyl methacrylate, isobutyl methacrylate, hexyl methacrylate Ester, cyclohexyl methacrylate, 2-ethylhexyl methacrylate, lauryl methacrylate, etc.

作為(甲基)丙烯酸酯共聚物,較佳為包含丙烯酸丁酯及丙烯腈作為共聚成分的共聚物、包含丙烯酸乙酯及丙烯腈作為共聚成分的共聚物。 As the (meth)acrylate copolymer, a copolymer containing butyl acrylate and acrylonitrile as copolymerization components, and a copolymer containing ethyl acrylate and acrylonitrile as copolymerization components are preferred.

含反應性基的(甲基)丙烯酸共聚物較佳為包含具有反應性基的(甲基)丙烯酸單體作為共聚成分的含反應性基的(甲基)丙烯酸共聚物。此種含反應性基的(甲基)丙烯酸共聚物可藉由使包含具有反應性基的(甲基)丙烯酸單體與所述單體的單量體組成物共聚而獲得。The reactive group-containing (meth)acrylic acid copolymer is preferably a reactive group-containing (meth)acrylic acid copolymer containing a (meth)acrylic acid monomer having a reactive group as a copolymerization component. Such a reactive group-containing (meth)acrylic acid copolymer can be obtained by copolymerizing a monomer composition containing a (meth)acrylic acid monomer having a reactive group and the monomer.

作為反應性基,就提高耐熱性的觀點而言,較佳為環氧基、羧基、丙烯醯基、甲基丙烯醯基、羥基、環硫基,其中,就交聯性的方面而言,更佳為環氧基及羧基。As the reactive group, from the viewpoint of improving heat resistance, an epoxy group, a carboxyl group, an acrylic group, a methacrylic group, a hydroxyl group, and an episulfide group are preferred. Among them, in terms of crosslinkability, More preferred are epoxy group and carboxyl group.

於本實施形態中,含反應性基的(甲基)丙烯酸共聚物較佳為包含具有環氧基的(甲基)丙烯酸單體作為共聚成分的含環氧基的(甲基)丙烯酸共聚物。於該情況下,作為具有環氧基的(甲基)丙烯酸單體,可列舉:丙烯酸縮水甘油酯、丙烯酸4-羥基丁酯縮水甘油醚、丙烯酸3,4-環氧環己基甲酯、甲基丙烯酸縮水甘油酯、甲基丙烯酸4-羥基丁酯縮水甘油醚、甲基丙烯酸3,4-環氧環己基甲酯等。就耐熱性的觀點而言,具有反應性基的(甲基)丙烯酸單體較佳為丙烯酸縮水甘油酯、甲基丙烯酸縮水甘油酯。In this embodiment, the reactive group-containing (meth)acrylic copolymer is preferably an epoxy group-containing (meth)acrylic copolymer containing a (meth)acrylic monomer having an epoxy group as a copolymer component. . In this case, examples of the (meth)acrylic monomer having an epoxy group include glycidyl acrylate, 4-hydroxybutyl acrylate glycidyl ether, 3,4-epoxycyclohexylmethyl acrylate, and methyl acrylate. Glycidyl acrylate, 4-hydroxybutyl methacrylate glycidyl ether, 3,4-epoxycyclohexylmethyl methacrylate, etc. From the viewpoint of heat resistance, the (meth)acrylic monomer having a reactive group is preferably glycidyl acrylate or glycidyl methacrylate.

熱塑性樹脂的Tg較佳為-50℃~50℃。若熱塑性樹脂的Tg為50℃以下,則容易確保接著劑片3p的柔軟性。另外,在貼附於被黏著體時,於存在凹凸的情況下,容易追隨且具有適度的接著性。另一方面,若熱塑性樹脂的Tg為-50℃以上,則容易抑制接著劑片3p的柔軟性變得過高,可達成優異的處理性及接著性、剝離性。The Tg of the thermoplastic resin is preferably -50°C to 50°C. If the Tg of the thermoplastic resin is 50° C. or less, the flexibility of the adhesive sheet 3p can be easily ensured. In addition, when it is attached to an adherend, it is easy to follow and has moderate adhesion even if there are irregularities. On the other hand, if the Tg of the thermoplastic resin is -50° C. or higher, it is easy to suppress the flexibility of the adhesive sheet 3p from becoming too high, and it is possible to achieve excellent handleability, adhesiveness, and peelability.

熱塑性樹脂的Tg為藉由示差掃描熱量測定(Differential Scanning Calorimetry,DSC)而獲得的中間點玻璃轉移溫度值。具體而言,熱塑性樹脂的Tg為於升溫速度10℃/min、測定溫度:-80℃~80℃的條件下測定熱量變化,藉由依據JIS K 7121:1987的方法而算出的中間點玻璃轉移溫度。The Tg of a thermoplastic resin is the midpoint glass transition temperature value obtained by differential scanning calorimetry (DSC). Specifically, the Tg of the thermoplastic resin is the midpoint glass transition calculated by measuring the heat change under the conditions of a temperature increase rate of 10°C/min and a measurement temperature of -80°C to 80°C, and calculating it based on the method of JIS K 7121:1987. temperature.

熱塑性樹脂的重量平均分子量較佳為10萬以上、200萬以下。若重量平均分子量為10萬以上,則在用於暫時固定的用途時,容易確保耐熱性。另一方面,若重量平均分子量為200萬以下,則在用於暫時固定的用途時,容易抑制流動性(flow)的降低及貼附性的降低。就所述觀點而言,熱塑性樹脂的重量平均分子量更佳為50萬以上、200萬以下,進而更佳為100萬以上、200萬以下。再者,重量平均分子量為利用凝膠滲透層析法(Gel Permeation Chromatography,GPC)並使用標準聚苯乙烯的標準曲線而得的聚苯乙烯換算值。The weight average molecular weight of the thermoplastic resin is preferably not less than 100,000 and not more than 2,000,000. If the weight average molecular weight is 100,000 or more, heat resistance can be easily ensured when used for temporary fixation. On the other hand, if the weight average molecular weight is 2 million or less, when used for temporary fixation, it is easy to suppress a decrease in flow and adhesion. From this viewpoint, the weight average molecular weight of the thermoplastic resin is more preferably 500,000 or more and 2,000,000 or less, and further more preferably 1,000,000 or more and 2,000,000 or less. In addition, the weight average molecular weight is a polystyrene-converted value obtained by gel permeation chromatography (GPC) using a standard polystyrene calibration curve.

於具有反應性基的(甲基)丙烯酸共聚物包含丙烯酸縮水甘油酯或甲基丙烯酸縮水甘油酯作為共聚成分的情況下,以共聚成分總量為基準,該些的含量以合計計較佳為0.1質量%~20質量%,更佳為0.5質量%~15質量%,進而更佳為1.0質量%~10質量%。若含量為所述範圍內,則容易以更高水準達成接著劑片3p的柔軟性、接著性及剝離性的全部。When the (meth)acrylic copolymer having a reactive group contains glycidyl acrylate or glycidyl methacrylate as a copolymer component, the total content of these components is preferably 0.1 based on the total amount of the copolymer components. The content is % by mass to 20% by mass, preferably 0.5% by mass to 15% by mass, and further preferably 1.0% by mass to 10% by mass. When the content is within the above range, it is easy to achieve all of the flexibility, adhesiveness and peelability of the adhesive sheet 3p at a higher level.

作為如上所述的具有反應性基的(甲基)丙烯酸共聚物,亦可使用藉由珠狀聚合(pearl polymerization)、溶液聚合等聚合方法而獲得者。或者,亦可使用HTR-860P-3CSP(商品名,長瀨化成(Nagase ChemteX)股份有限公司製造)等市售品。As the above-mentioned (meth)acrylic acid copolymer having a reactive group, one obtained by polymerization methods such as pearl polymerization and solution polymerization can also be used. Alternatively, commercially available products such as HTR-860P-3CSP (trade name, manufactured by Nagase ChemteX Co., Ltd.) can also be used.

(熱硬化性樹脂) 作為熱硬化性樹脂,若為藉由熱而硬化的樹脂,則可無特別限制地使用。作為熱硬化性樹脂,可列舉:環氧樹脂、丙烯酸樹脂、矽酮樹脂、酚樹脂、熱硬化型聚醯亞胺樹脂、聚胺基甲酸酯樹脂、三聚氰胺樹脂、脲樹脂等。該些可單獨使用一種或組合使用兩種以上。(Thermosetting resin) As the thermosetting resin, if it is a resin that hardens by heat, it can be used without particular limitation. Examples of the thermosetting resin include epoxy resin, acrylic resin, silicone resin, phenol resin, thermosetting polyimide resin, polyurethane resin, melamine resin, urea resin, and the like. These can be used individually by 1 type or in combination of 2 or more types.

關於環氧樹脂,只要為進行硬化而具有耐熱作用者,則並無特別限定。環氧樹脂可使用雙酚A型環氧等二官能環氧樹脂;苯酚酚醛清漆型環氧樹脂、甲酚酚醛清漆型環氧樹脂等酚醛清漆型環氧樹脂等。另外,環氧樹脂可使用多官能環氧樹脂、縮水甘油胺型環氧樹脂、含雜環的環氧樹脂、脂環式環氧樹脂等現有公知者。The epoxy resin is not particularly limited as long as it has a heat-resistant effect for curing. As the epoxy resin, bifunctional epoxy resins such as bisphenol A type epoxy; novolak type epoxy resins such as phenol novolak type epoxy resin and cresol novolak type epoxy resin can be used. In addition, as the epoxy resin, conventionally known ones such as polyfunctional epoxy resin, glycidyl amine type epoxy resin, heterocyclic ring-containing epoxy resin, alicyclic epoxy resin, etc. can be used.

作為雙酚A型環氧樹脂,可列舉:愛皮克特(Epikote)807、愛皮克特(Epikote)815、愛皮克特(Epikote)825、愛皮克特(Epikote)827、愛皮克特(Epikote)828、愛皮克特(Epikote)834、愛皮克特(Epikote)1001、愛皮克特(Epikote)1004、愛皮克特(Epikote)1007、愛皮克特(Epikote)1009(均為三菱化學股份有限公司製造);DER-330、DER-301、DER-361(均為陶氏化學(Dow Chemical)公司製造);YD8125、YDF8170(均為新日鐵住金化學股份有限公司製造)等。 作為苯酚酚醛清漆型環氧樹脂,可列舉:愛皮克特(Epikote)152、愛皮克特(Epikote)154(均為三菱化學股份有限公司製造);EPPN-201(日本化藥股份有限公司製造);DEN-438(陶氏化學(Dow Chemical)公司製造)等。 As bisphenol A-type epoxy resin, there are: Epikote 807, Epikote 815, Epikote 825, Epikote 827, Epikote Epikote 828, Epikote 834, Epikote 1001, Epikote 1004, Epikote 1007, Epikote 1009 (all manufactured by Mitsubishi Chemical Co., Ltd.); DER-330, DER-301, DER-361 (all manufactured by Dow Chemical Co., Ltd.); YD8125, YDF8170 (all manufactured by Nippon Steel and Sumitomo Metal Chemical Co., Ltd. manufactured by the company), etc. Examples of phenol novolak type epoxy resins include: Epikote 152, Epikote 154 (both manufactured by Mitsubishi Chemical Co., Ltd.); EPPN-201 (Nippon Chemical Co., Ltd. (manufactured by Dow Chemical Company); DEN-438 (manufactured by Dow Chemical Company), etc.

作為鄰甲酚酚醛清漆型環氧樹脂,可列舉:YDCN-700-10(新日鐵住金化學股份有限公司製造);EOCN-102S、EOCN-103S、EOCN-104S、EOCN-1012、EOCN-1025、EOCN-1027(均為日本化藥股份有限公司製造);YDCN701、YDCN702、YDCN703、YDCN704(均為新日鐵住金化學股份有限公司製造)等。 Examples of o-cresol novolac type epoxy resin include: YDCN-700-10 (manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd.); EOCN-102S, EOCN-103S, EOCN-104S, EOCN-1012, and EOCN-1025 , EOCN-1027 (all manufactured by Nippon Chemical Co., Ltd.); YDCN701, YDCN702, YDCN703, YDCN704 (all manufactured by Nippon Steel & Sumitomo Metal Chemical Co., Ltd.), etc.

作為多官能環氧樹脂,可列舉:愛普恩(Epon)1031S(三菱化學股份有限公司製造);愛牢達(Araldite)0163(日本巴斯夫(BASF Japan)公司製造);代那科(Denacol)EX-611、EX-614、EX-614B、EX-622、EX-512、EX-521、EX-421、EX-411、EX-321(均為長瀨化成(Nagase ChemteX)股份有限公司製造)等。 Examples of multifunctional epoxy resins include: Epon 1031S (manufactured by Mitsubishi Chemical Co., Ltd.); Araldite 0163 (manufactured by BASF Japan); Denacol EX-611, EX-614, EX-614B, EX-622, EX-512, EX-521, EX-421, EX-411, EX-321 (all manufactured by Nagase ChemteX Co., Ltd.) wait.

作為胺型環氧樹脂,可列舉:愛皮克特(Epikote)604(三菱化學股份有限公司製造);YH-434(新日鐵住金化學股份有限公司製造);泰拉德(TETRAD)-X、泰拉德(TETRAD)-C(均為三菱瓦斯化學(Mitsubishi Gas Chemical)股份有限公司製造);ELM-120(住友化學股份有限公司製造)等。 Examples of amine-type epoxy resins include: Epikote 604 (manufactured by Mitsubishi Chemical Co., Ltd.); YH-434 (manufactured by Nippon Steel and Sumitomo Metal Chemical Co., Ltd.); TETRAD-X , TETRAD-C (both manufactured by Mitsubishi Gas Chemical Co., Ltd.); ELM-120 (manufactured by Sumitomo Chemical Co., Ltd.), etc.

作為含雜環的環氧樹脂,可列舉:愛牢達(Araldite)PT810(日本巴斯夫(BASF Japan)公司製造);ERL4234、ERL4299、ERL4221、ERL4206(均為聯合碳化物(Union Carbide)公司製造)等。該些環氧樹脂可單獨使用一種或組合使用兩種以上。 Examples of heterocyclic-containing epoxy resins include: Araldite PT810 (manufactured by BASF Japan); ERL4234, ERL4299, ERL4221, and ERL4206 (all manufactured by Union Carbide) wait. These epoxy resins can be used individually by 1 type or in combination of 2 or more types.

關於作為熱硬化性樹脂成分的一部分的環氧樹脂硬化劑,可使用通常所使用的公知的樹脂。具體而言,可列舉:胺類;聚醯胺;酸酐;多硫化物;三氟化硼;如雙酚A、雙酚F、雙酚S般的於一分子中具有兩個以上酚性羥基的雙酚類;苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、甲酚酚醛清漆樹脂等酚樹脂等。作為環氧樹脂硬化劑,特別是就吸濕時的耐電蝕性優異的觀點而言,較佳為苯酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、甲酚酚醛清漆樹脂等酚樹脂。 再者,環氧硬化劑可與環氧樹脂同時使用,亦可單獨使用。As the epoxy resin hardener that is a part of the thermosetting resin component, a commonly used known resin can be used. Specifically, examples include: amines; polyamides; acid anhydrides; polysulfides; boron trifluoride; those having two or more phenolic hydroxyl groups in one molecule such as bisphenol A, bisphenol F, and bisphenol S. Bisphenols; phenol novolac resin, bisphenol A novolac resin, cresol novolac resin and other phenolic resins. As the epoxy resin hardener, in particular, from the viewpoint of excellent resistance to electric corrosion when absorbing moisture, phenol resins such as phenol novolak resin, bisphenol A novolak resin, and cresol novolak resin are preferred. Furthermore, epoxy hardener can be used simultaneously with epoxy resin or alone.

所述酚樹脂硬化劑中,較佳為使用費恩利特(Phenolite)LF4871、費恩利特(Phenolite)TD-2090、費恩利特(Phenolite)TD-2149、費恩利特(Phenolite)VH-4150、費恩利特(Phenolite)VH4170(均為迪愛生(DIC)股份有限公司製造,商品名);H-1(明和化成股份有限公司製造,商品名);艾匹庫(Epi-Cure)MP402FPY、艾匹庫(Epi-Cure)YL6065、艾匹庫(Epi-Cure)YLH129B65、美萊克(Milex)XL、美萊克(Milex)XLC、美萊克(Milex)XLC-LL、美萊克(Milex)RN、美萊克(Milex)RS、美萊克(Milex)VR(均為三菱化學股份有限公司製造,商品名)等具有結構的材料。Among the phenolic resin hardeners, it is preferable to use Phenolite LF4871, Phenolite TD-2090, Phenolite TD-2149, Phenolite VH-4150, Phenolite VH4170 (both manufactured by DIC Co., Ltd., trade name); H-1 (manufactured by Meiwa Chemical Co., Ltd., trade name); Epi- Cure) MP402FPY, Epi-Cure YL6065, Epi-Cure YLH129B65, Milex XL, Milex XLC, Milex XLC-LL, Milex ( Milex) RN, Milex (Milex) RS, Milex (Milex) VR (all manufactured by Mitsubishi Chemical Co., Ltd., trade names) and other structural materials.

相對於熱塑性樹脂100質量份,接著劑片3p中的熱硬化性樹脂的含量較佳為10質量份~500質量份,更佳為30質量份~450質量份,進而更佳為50質量份~400質量份。若熱硬化性樹脂的含量為所述範圍內,則容易達成接著劑片3p的熱硬化後的優異的密接性。The content of the thermosetting resin in the adhesive sheet 3p is preferably from 10 parts by mass to 500 parts by mass, more preferably from 30 parts by mass to 450 parts by mass, and further preferably from 50 parts by mass to 100 parts by mass of the thermoplastic resin. 400 parts by mass. When the content of the thermosetting resin is within the above range, it is easy to achieve excellent adhesiveness after thermosetting of the adhesive sheet 3p.

(硬化促進劑) 作為硬化促進劑,可列舉:咪唑類、雙氰胺衍生物、二羧酸二醯肼、三苯基膦、四苯基鏻四苯基硼酸鹽、2-乙基-4-甲基咪唑-四苯基硼酸鹽、1,8-二氮雜雙環[5,4,0]十一烯-7-四苯基硼酸鹽等。該些可單獨使用一種或組合使用兩種以上。(Harding accelerator) Examples of the hardening accelerator include: imidazoles, dicyandiamide derivatives, dicarboxylic acid dihydrazide, triphenylphosphine, tetraphenylphosphonium tetraphenylborate, and 2-ethyl-4 -Methylimidazole-tetraphenylborate, 1,8-diazabicyclo[5,4,0]undecene-7-tetraphenylborate, etc. These can be used individually by 1 type or in combination of 2 or more types.

於接著劑片3p含有具有環氧基的(甲基)丙烯酸共聚物的情況下,較佳為含有促進所述丙烯酸共聚物中所含的環氧基的硬化的硬化促進劑。作為促進環氧基的硬化的硬化促進劑,可列舉:酚系硬化劑、酸酐系硬化劑、胺系硬化劑、咪唑系硬化劑、咪唑啉系硬化劑、三嗪系硬化劑及膦系硬化劑。該些中,就快速硬化性、耐熱性及剝離性的觀點而言,較佳為可期待步驟時間的縮短及作業性的提高的咪唑系硬化劑。該些化合物可單獨使用一種或組合使用兩種以上。When the adhesive sheet 3p contains a (meth)acrylic copolymer having an epoxy group, it is preferable to contain a curing accelerator that accelerates curing of the epoxy groups contained in the acrylic copolymer. Examples of hardening accelerators that accelerate the hardening of epoxy groups include phenol-based hardeners, acid anhydride-based hardeners, amine-based hardeners, imidazole-based hardeners, imidazoline-based hardeners, triazine-based hardeners, and phosphine-based hardeners. agent. Among these, from the viewpoints of rapid curing properties, heat resistance, and peelability, an imidazole-based curing agent can be expected to shorten the step time and improve the workability. These compounds can be used individually by 1 type or in combination of 2 or more types.

相對於熱塑性樹脂100質量份,接著劑片3p中的硬化促進劑的含量較佳為0.01質量份~50質量份,更佳為0.02質量份~20質量份,進而更佳為0.025質量份~10質量份。若硬化促進劑的含量為所述範圍內,則存在可提高接著劑片3p的硬化性,同時可充分抑制保存穩定性的降低的傾向。The content of the hardening accelerator in the adhesive sheet 3p is preferably 0.01 to 50 parts by mass, more preferably 0.02 to 20 parts by mass, and still more preferably 0.025 to 10 parts by mass relative to 100 parts by mass of the thermoplastic resin. parts by mass. When the content of the curing accelerator is within the above range, the curing properties of the adhesive sheet 3p can be improved while the decrease in storage stability tends to be sufficiently suppressed.

(無機填料) 接著劑片3p較佳為含有無機填料。作為無機填料,可列舉:銀粉、金粉、銅粉等金屬填料;二氧化矽(silica)、氧化鋁(alumina)、氮化硼、二氧化鈦(titania)、玻璃(glass)、氧化鐵、陶瓷(ceramic)等非金屬無機填料等。無機填料可根據所期望的功能而進行選擇。(Inorganic filler) The adhesive tablet 3p preferably contains an inorganic filler. Examples of inorganic fillers include metal fillers such as silver powder, gold powder, and copper powder; silica, alumina, boron nitride, titania, glass, iron oxide, and ceramics. ) and other non-metallic inorganic fillers. Inorganic fillers can be selected based on desired functionality.

所述無機填料較佳為表面具有有機基者。藉由無機填料的表面經有機基修飾,容易使製備用以形成接著劑片3p的清漆時於有機溶劑中的分散性以及接著劑片3p的高彈性係數及優異的剝離性併存。The inorganic filler preferably has an organic group on its surface. By modifying the surface of the inorganic filler with an organic group, it is easy to achieve both the dispersibility in the organic solvent when preparing the varnish used to form the adhesive sheet 3p and the high elastic modulus and excellent peelability of the adhesive sheet 3p.

表面具有有機基的無機填料例如可藉由如下方式來獲得:將下述式(B-1)所表示的矽烷偶合劑與無機填料混合,於30℃以上的溫度下進行攪拌。無機填料的表面經有機基修飾可利用紫外線(UV)測定、紅外線(Infrared Radiation,IR)測定、X射線光電子光譜(X-ray photoelectron spectroscopy,XPS)測定等來確認。The inorganic filler having an organic group on the surface can be obtained, for example, by mixing a silane coupling agent represented by the following formula (B-1) and an inorganic filler, and stirring at a temperature of 30° C. or higher. The surface modification of the inorganic filler with organic groups can be confirmed by ultraviolet (UV) measurement, infrared ray (Infrared Radiation, IR) measurement, X-ray photoelectron spectroscopy (XPS) measurement, etc.

[化1] [Chemical 1]

式(B-1)中,X表示選自由苯基、縮水甘油氧基、丙烯醯基、甲基丙烯醯基、巰基、胺基、乙烯基、異氰酸酯基及甲基丙烯醯氧基所組成的群組中的有機基,s表示0或1~10的整數,R11 、R12 及R13 分別獨立地表示碳數1~10的烷基。 作為碳數1~10的烷基,可列舉:甲基、乙基、丙基、丁基、戊基、己基、庚基、辛基、壬基、癸基、異丙基、異丁基等。 就容易獲取的觀點而言,碳數1~10的烷基較佳為甲基、乙基及戊基。就耐熱性的觀點而言,X較佳為胺基、縮水甘油氧基、巰基及異氰酸酯基,更佳為縮水甘油氧基及巰基。就抑制高熱時的膜流動性並提高耐熱性的觀點而言,式(B-1)中的s較佳為0~5,更佳為0~4。In formula (B-1), As for the organic group in the group, s represents 0 or an integer from 1 to 10, and R 11 , R 12 and R 13 each independently represent an alkyl group having 1 to 10 carbon atoms. Examples of the alkyl group having 1 to 10 carbon atoms include methyl, ethyl, propyl, butyl, pentyl, hexyl, heptyl, octyl, nonyl, decyl, isopropyl, isobutyl, etc. . From the viewpoint of easy availability, the alkyl group having 1 to 10 carbon atoms is preferably a methyl group, an ethyl group and a pentyl group. From the viewpoint of heat resistance, X is preferably an amino group, a glycidoxy group, a mercapto group and an isocyanate group, and more preferably a glycidyloxy group and a mercapto group. From the viewpoint of suppressing film fluidity at high heat and improving heat resistance, s in formula (B-1) is preferably 0 to 5, and more preferably 0 to 4.

作為矽烷偶合劑,可列舉:三甲氧基苯基矽烷、二甲基二甲氧基苯基矽烷、三乙氧基苯基矽烷、二甲氧基甲基苯基矽烷、乙烯基三甲氧基矽烷、乙烯基三乙氧基矽烷、乙烯基三(2-甲氧基乙氧基)矽烷、N-(2-胺基乙基)-3-胺基丙基甲基二甲氧基矽烷、N-(2-胺基乙基)-3-胺基丙基三甲氧基矽烷、3-胺基丙基三乙氧基矽烷、3-胺基丙基三甲氧基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-縮水甘油氧基丙基甲基二甲氧基矽烷、2-(3,4-環氧環己基)乙基三甲氧基矽烷、3-異氰酸酯基丙基三乙氧基矽烷、3-甲基丙烯醯氧基丙基三甲氧基矽烷、3-巰基丙基三甲氧基矽烷、3-脲基丙基三乙氧基矽烷、N-(1,3-二甲基亞丁基)-3-(三乙氧基矽烷基)-1-丙胺、N,N'-雙(3-(三甲氧基矽烷基)丙基)乙二胺、聚氧乙烯丙基三烷氧基矽烷、聚乙氧基二甲基矽氧烷等。 該些中,較佳為3-胺基丙基三乙氧基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-異氰酸酯基丙基三乙氧基矽烷、3-巰基丙基三甲氧基矽烷,更佳為三甲氧基苯基矽烷、3-縮水甘油氧基丙基三甲氧基矽烷、3-巰基丙基三甲氧基矽烷。矽烷偶合劑可單獨使用一種或組合使用兩種以上。Examples of the silane coupling agent include trimethoxyphenylsilane, dimethyldimethoxyphenylsilane, triethoxyphenylsilane, dimethoxymethylphenylsilane, and vinyltrimethoxysilane. , vinyltriethoxysilane, vinyltris(2-methoxyethoxy)silane, N-(2-aminoethyl)-3-aminopropylmethyldimethoxysilane, N -(2-Aminoethyl)-3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-glycidoxysilane Propyltrimethoxysilane, 3-glycidoxypropylmethyldimethoxysilane, 2-(3,4-epoxycyclohexyl)ethyltrimethoxysilane, 3-isocyanatopropyltriethyl Oxysilane, 3-methacryloxypropyltrimethoxysilane, 3-mercaptopropyltrimethoxysilane, 3-ureidopropyltriethoxysilane, N-(1,3-dimethyl Butylene)-3-(triethoxysilyl)-1-propylamine, N,N'-bis(3-(trimethoxysilyl)propyl)ethylenediamine, polyoxyethylene propyltriane Oxysilane, polyethoxydimethylsiloxane, etc. Among these, 3-aminopropyltriethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-isocyanatopropyltriethoxysilane, and 3-mercaptopropyltrimethyl Oxysilane is more preferably trimethoxyphenylsilane, 3-glycidoxypropyltrimethoxysilane, and 3-mercaptopropyltrimethoxysilane. A silane coupling agent can be used individually by 1 type or in combination of 2 or more types.

就實現耐熱性與保存穩定性的平衡的觀點而言,相對於無機填料100質量份,所述偶合劑的含量較佳為0.01質量份~50質量份,更佳為0.05質量份~20質量份,就提高耐熱性的觀點而言,進而更佳為0.5質量份~10質量份。From the viewpoint of achieving a balance between heat resistance and storage stability, the content of the coupling agent is preferably 0.01 to 50 parts by mass, and more preferably 0.05 to 20 parts by mass relative to 100 parts by mass of the inorganic filler. , from the viewpoint of improving heat resistance, it is more preferably 0.5 parts by mass to 10 parts by mass.

相對於熱塑性樹脂100質量份,接著劑片3p中的無機填料的含量較佳為600質量份以下,更佳為500質量份以下,進而更佳為400質量份以下。無機填料的含量的下限並無特別限制,相對於熱塑性樹脂100質量份,較佳為5質量份以上,更佳為8質量份以上。藉由將無機填料的含量設為所述範圍,可抑制伴隨熱硬化的收縮,並且容易使接著劑片3p的高彈性係數及優異的剝離性併存。The content of the inorganic filler in the adhesive sheet 3p is preferably 600 parts by mass or less, more preferably 500 parts by mass or less, and still more preferably 400 parts by mass or less based on 100 parts by mass of the thermoplastic resin. The lower limit of the content of the inorganic filler is not particularly limited, but it is preferably 5 parts by mass or more, and more preferably 8 parts by mass or more based on 100 parts by mass of the thermoplastic resin. By setting the content of the inorganic filler within the above range, shrinkage associated with thermal hardening can be suppressed, and the high elastic modulus and excellent peelability of the adhesive sheet 3p can be easily coexisted.

(有機填料) 接著劑片3p亦可含有有機填料。作為有機填料,可列舉:碳、橡膠系填料、矽酮系微粒子、聚醯胺微粒子、聚醯亞胺微粒子等。相對於熱塑性樹脂100質量份,有機填料的含量較佳為300質量份以下,更佳為200質量份以下,進而更佳為100質量份以下。有機填料的含量的下限並無特別限制,相對於熱塑性樹脂100質量份,較佳為5質量份以上。(Organic filler) The adhesive sheet 3p may contain an organic filler. Examples of organic fillers include carbon, rubber-based fillers, silicone-based fine particles, polyamide fine particles, polyimide fine particles, and the like. The content of the organic filler is preferably 300 parts by mass or less, more preferably 200 parts by mass or less, and still more preferably 100 parts by mass or less based on 100 parts by mass of the thermoplastic resin. The lower limit of the content of the organic filler is not particularly limited, but is preferably 5 parts by mass or more based on 100 parts by mass of the thermoplastic resin.

(有機溶劑) 接著劑片3p視需要亦可使用有機溶劑進行稀釋。有機溶劑並無特別限定,可根據沸點來考慮製膜時的揮發性等而決定。具體而言,就在製膜時難以進行膜的硬化的觀點而言,較佳為甲醇、乙醇、2-甲氧基乙醇、2-乙氧基乙醇、2-丁氧基乙醇、甲基乙基酮、丙酮、甲基異丁基酮、甲苯、二甲苯等沸點相對低的溶劑。另外,出於提高製膜性等的目的,較佳為使用二甲基乙醯胺、二甲基甲醯胺、N-甲基吡咯啶酮、環己酮等沸點相對高的溶劑。該些溶劑可單獨使用一種或組合使用兩種以上。(Organic solvent) The adhesive tablet 3p can be diluted with an organic solvent if necessary. The organic solvent is not particularly limited and can be determined based on the boiling point, taking into consideration the volatility during film formation, etc. Specifically, from the viewpoint of difficulty in hardening the film during film formation, methanol, ethanol, 2-methoxyethanol, 2-ethoxyethanol, 2-butoxyethanol, and methylethyl alcohol are preferred. Solvents with relatively low boiling points such as ketone, acetone, methyl isobutyl ketone, toluene, and xylene. In addition, for the purpose of improving film-forming properties, it is preferable to use a solvent with a relatively high boiling point such as dimethylacetamide, dimethylformamide, N-methylpyrrolidone, and cyclohexanone. These solvents can be used individually by 1 type or in combination of 2 or more types.

[保護構件] 保護構件5p是藉由將以覆蓋載體膜1的表面的方式形成的接著劑層3與以覆蓋接著劑層3的方式配置的保護膜5同時模切而與接著劑片3p一起形成者(參照圖6)。本實施形態的保護構件5p是藉由模切而與接著劑片3p同時形成者,因此實質為與接著劑片3p相同的形狀。作為保護膜5,只要為於接著膜10的製造製程中可進行衝壓加工且於半導體裝置的製造製程中可容易將保護構件5p自接著劑片3p剝離者即可。[Protective Member] The protective member 5 p is formed together with the adhesive sheet 3 p by simultaneously die-cutting the adhesive layer 3 formed to cover the surface of the carrier film 1 and the protective film 5 arranged to cover the adhesive layer 3 Former (see Figure 6). The protective member 5p of this embodiment is formed simultaneously with the adhesive sheet 3p by die cutting, and therefore has substantially the same shape as the adhesive sheet 3p. The protective film 5 may be any one that can be press-processed in the manufacturing process of the adhesive film 10 and the protective member 5p can be easily peeled off from the adhesive sheet 3p in the manufacturing process of the semiconductor device.

接著劑片3p與保護構件5p之間的密接力較佳為16 N/m以下,更佳為10 N/m以下,亦可為5 N/m以下或4.5 N/m以下。特別是,於接著劑片3p包含具有熱硬化性的樹脂組成物的情況下,較佳為:於在100℃下進行10分鐘的熱處理後,保護構件5p相對於接著劑片3p的密接力為所述範圍。藉由該密接力為16 N/m以下,可於使由保護構件5p覆蓋的狀態的接著劑片3p例如於100℃下且於3秒的條件下暫時壓接於被黏著體(例如基板)後,利用黏著膠帶等容易將保護構件5p自接著劑片3p剝離。再者,保護構件5p相對於接著劑片3p的密接力是指90°剝離強度,具體而言,是指如下剝離強度:準備於包含與接著劑片3p相同的組成的寬度20 mm的接著劑層上配置有相同寬度的保護膜的試樣,以90°的角度且以剝離速度300 mm/min將該保護膜自接著劑層剝離時所測定的剝離強度。The adhesive force between the adhesive sheet 3p and the protective member 5p is preferably 16 N/m or less, more preferably 10 N/m or less, and may be 5 N/m or less or 4.5 N/m or less. In particular, when the adhesive sheet 3p contains a thermosetting resin composition, it is preferable that the adhesive force of the protective member 5p with respect to the adhesive sheet 3p is: the stated range. By having the adhesion force of 16 N/m or less, the adhesive sheet 3 p in a state covered with the protective member 5 p can be temporarily pressure-bonded to an adherend (such as a substrate) under conditions such as 100° C. and 3 seconds. Afterwards, the protective member 5p can be easily peeled off from the adhesive sheet 3p using an adhesive tape or the like. In addition, the adhesive force of the protective member 5p with respect to the adhesive sheet 3p refers to the 90° peel strength. Specifically, it refers to the peeling strength prepared from a 20 mm wide adhesive containing the same composition as the adhesive sheet 3p. Peel strength measured when the protective film is peeled off from the adhesive layer at an angle of 90° and a peeling speed of 300 mm/min for a sample with a protective film of the same width placed on the layer.

作為保護膜5,可使用聚對苯二甲酸乙二酯膜等聚酯系膜、聚四氟乙烯膜、聚乙烯膜、聚丙烯膜、聚甲基戊烯膜、聚乙烯乙酸酯膜、聚-4-甲基戊烯-1、乙烯-乙酸乙烯酯共聚物、乙烯-丙烯酸乙酯共聚物等均聚物或共聚物或者該些的混合物等聚烯烴系膜、聚氯乙烯膜、聚醯亞胺膜等塑膠膜等。保護膜5可為單層結構,亦可為多層結構。藉由利用保護膜5覆蓋接著劑層3,可抑制對接著劑層3施加過度的張力,並且在模切時,可防止異物混入至接著劑層3中。As the protective film 5, polyester films such as polyethylene terephthalate film, polytetrafluoroethylene film, polyethylene film, polypropylene film, polymethylpentene film, polyethylene acetate film, etc. can be used. Homopolymers or copolymers such as poly-4-methylpentene-1, ethylene-vinyl acetate copolymer, ethylene-ethyl acrylate copolymer, or mixtures thereof, such as polyolefin films, polyvinyl chloride films, polyethylene films, etc. Imide film and other plastic films. The protective film 5 may have a single-layer structure or a multi-layer structure. By covering the adhesive layer 3 with the protective film 5 , excessive tension on the adhesive layer 3 can be suppressed, and foreign matter can be prevented from being mixed into the adhesive layer 3 during die cutting.

保護膜5的厚度只要於不損及作業性的範圍內適宜選擇即可,例如為10 μm~200 μm,亦可為20 μm~100 μm或25 μm~80 μm。該些厚度範圍為於實用方面無問題且於經濟方面亦有效的範圍。The thickness of the protective film 5 can be appropriately selected within a range that does not impair workability, for example, 10 μm to 200 μm, 20 μm to 100 μm, or 25 μm to 80 μm. These thickness ranges are a range that has no practical problems and is also economically effective.

保護構件5p的光透過率較佳為低於載體膜1的光透過率。藉由採用所述構成,可利用相機等元件來識別接著劑片3p的位置及朝向等,且容易使半導體裝置的製造製程中的接著步驟自動化。例如,作為保護構件5p,較佳為使用著色成波長500 nm的光的透過率未滿10%(更佳為未滿7%)者。The light transmittance of the protective member 5 p is preferably lower than the light transmittance of the carrier film 1 . By adopting the above structure, the position, orientation, etc. of the adhesive sheet 3p can be recognized using elements such as a camera, and the bonding step in the manufacturing process of the semiconductor device can be easily automated. For example, as the protective member 5p, it is preferable to use one colored so that the transmittance of light with a wavelength of 500 nm is less than 10% (more preferably less than 7%).

<接著膜的製造方法> 繼而,對接著膜10的製造方法進行說明。本實施形態的製造方法包括以下的步驟。 (A)準備積層體20的步驟,所述積層體20具有寬度100 mm以下的帶狀的載體膜1、以覆蓋載體膜1的表面的方式形成的接著劑層3及以覆蓋接著劑層3的方式配置的保護膜5。 (B)藉由將積層體20中的接著劑層3及保護膜5模切而獲得以沿載體膜1的長邊方向排列的方式配置於載體膜1上的多個接著劑片3p的步驟。<The manufacturing method of the adhesive film> Next, the manufacturing method of the adhesive film 10 is demonstrated. The manufacturing method of this embodiment includes the following steps. (A) The step of preparing the laminated body 20 having a strip-shaped carrier film 1 with a width of 100 mm or less, an adhesive layer 3 formed to cover the surface of the carrier film 1, and an adhesive layer 3 covering the surface of the carrier film 1. The protective film is configured in 5 ways. (B) A step of die-cutting the adhesive layer 3 and the protective film 5 in the laminated body 20 to obtain a plurality of adhesive sheets 3 p arranged on the carrier film 1 so as to be arranged along the longitudinal direction of the carrier film 1 .

圖5是示意性表示利用(A)步驟所準備的積層體20的剖面圖。積層體20可以如下方式製作。首先,準備使接著劑層3的原料樹脂組成物溶解於有機溶劑等溶媒中並加以清漆化而成的塗敷液。將該塗敷液塗敷於載體膜1上後,將溶媒去除,藉此形成接著劑層3。作為塗敷方法,可列舉:刀塗法、輥塗法、噴塗法、凹版塗佈法、棒塗法及簾塗法等。繼而,於常溫~60℃的條件下將保護膜5貼合於接著劑層3的表面。藉此,可獲得積層體20。再者,亦可將接著劑層3形成於寬度廣的載體膜上後,以覆蓋其的方式貼合保護膜5,藉此製作積層膜,並將所述積層膜切斷(縱切)成100 mm以下的寬度,藉此獲得積層體20。FIG. 5 is a cross-sectional view schematically showing the laminated body 20 prepared in step (A). The laminated body 20 can be produced as follows. First, a coating liquid in which the raw resin composition of the adhesive layer 3 is dissolved in a solvent such as an organic solvent and varnished is prepared. After applying this coating liquid on the carrier film 1, the solvent is removed, thereby forming the adhesive layer 3. Examples of coating methods include knife coating, roller coating, spray coating, gravure coating, rod coating, curtain coating, and the like. Then, the protective film 5 is bonded to the surface of the adhesive layer 3 under conditions of normal temperature to 60°C. Thereby, the laminated body 20 can be obtained. Furthermore, a laminated film may be produced by forming the adhesive layer 3 on a carrier film with a wide width and then laminating the protective film 5 so as to cover it, and then cut (slit) the laminated film into With a width of 100 mm or less, the laminate 20 is obtained.

圖6是表示藉由(B)步驟中的模切而於載體膜1上形成多個接著劑片3p及覆蓋其的保護構件5p的情況的立體圖。如圖6所示,積層體20通過外周面具有用以實施模切的多個刀片51c的旋轉體51與和旋轉體51成對的輥52之間,藉此於載體膜1上連續地形成與刀片51c的形狀相對應的接著劑片3p及保護構件5p。此時,關於積層體20,保護膜5側的面朝向旋轉體51,載體膜1側的面朝向輥52。藉由調整旋轉體51的旋轉軸51a與輥52的旋轉軸52a的距離或變更刀片51c的高度,可調整藉由刀片51c而形成於積層體20上的切口的深度。FIG. 6 is a perspective view showing a state in which a plurality of adhesive sheets 3 p and a protective member 5 p covering them are formed on the carrier film 1 by die cutting in step (B). As shown in FIG. 6 , the laminated body 20 passes between a rotary body 51 having a plurality of blades 51 c for die-cutting on the outer circumference and a roller 52 paired with the rotary body 51 , whereby the laminated body 20 is continuously formed on the carrier film 1 . The shape of the blade 51c corresponds to the adhesive sheet 3p and the protective member 5p. At this time, the surface of the laminated body 20 on the protective film 5 side faces the rotating body 51 , and the surface on the carrier film 1 side faces the roller 52 . By adjusting the distance between the rotation axis 51a of the rotary body 51 and the rotation axis 52a of the roller 52 or changing the height of the blade 51c, the depth of the cut formed on the laminated body 20 by the blade 51c can be adjusted.

如圖6所示,通過旋轉體51及輥52之間的積層體20分離為接著膜10與不需要部分30,並捲繞於各自的捲軸(未圖示)。不需要部分30包含挖出了接著劑片3p及保護構件5p的接著劑層3與保護膜5。As shown in FIG. 6 , the laminated body 20 passing between the rotary body 51 and the roller 52 is separated into the adhesive film 10 and the unnecessary portion 30, and is wound on respective reels (not shown). The unnecessary portion 30 includes the adhesive layer 3 and the protective film 5 from which the adhesive sheet 3p and the protective member 5p are dug out.

<接著膜的使用方法> 繼而,對接著膜10的使用方法進行說明。圖7是示意性表示自載體膜1拾取接著劑片3p及覆蓋其的保護構件5p的情況的剖面圖。於對接著膜10賦予一定的張力的狀態下,一邊使接著膜10的載體膜1側的面抵接於楔狀構件60,一邊使接著膜10沿圖7所示的箭頭的方向移動。藉此如該圖所示,成為接著劑片3p及保護構件5p的前方自載體膜1浮起的狀態。在為該狀態時,例如利用具有吸引力的拾取裝置65拾取接著劑片3p及保護構件5p。例如,藉由使用包括視認保護構件5p的相機等的拾取裝置作為拾取裝置65,可掌握接著劑片3p及保護構件5p的有無以及朝向等資訊。基於該些資訊,可適當地實施之後的接著步驟。<How to use the adhesive film> Next, how to use the adhesive film 10 will be described. FIG. 7 is a cross-sectional view schematically showing the state of picking up the adhesive sheet 3 p and the protective member 5 p covering it from the carrier film 1 . In a state where a certain tension is applied to the adhesive film 10 , the adhesive film 10 is moved in the direction of the arrow shown in FIG. 7 while the surface of the adhesive film 10 on the carrier film 1 side is in contact with the wedge-shaped member 60 . As a result, as shown in this figure, the front sides of the adhesive sheet 3p and the protective member 5p are in a state of being lifted from the carrier film 1. In this state, for example, the adhesive sheet 3p and the protective member 5p are picked up using the pickup device 65 with an attractive force. For example, by using a pickup device including a camera that visually recognizes the protective member 5p as the pickup device 65, information such as the presence and orientation of the adhesive sheet 3p and the protective member 5p can be grasped. Based on this information, subsequent steps can be appropriately implemented.

繼而,以基板(未圖示)的規定的位置及朝向配置由保護構件5p覆蓋的狀態的接著劑片3p。於該狀態下,進行接著劑片3p相對於基板的暫時壓接。暫時壓接只要於例如溫度60℃~150℃、按壓力0.05MPa~1MPa的條件下進行0.1秒~10秒即可。藉由暫時壓接,接著劑片3p以相對於基板而言弱,但不自基板剝離的程度密接。於該狀態下,使用黏著膠帶等將保護構件5p自接著劑片3p剝離。將與接著劑片3p不同形狀的半導體晶片配置於因保護構件5p的剝離而露出的接著劑片3p的表面後,進行半導體晶片相對於基板的壓接。壓接只要於例如溫度60℃~150℃、按壓力0.05MPa~1MPa的條件下進行0.1秒~10秒即可。再者,伴隨基板的薄化,加熱溫度理想為低,壓接溫度較佳為160℃以下,其後的熱硬化溫度亦較佳為160℃以下。 Next, the adhesive sheet 3p covered with the protective member 5p is arranged at a predetermined position and orientation on the substrate (not shown). In this state, the adhesive sheet 3p is temporarily pressed against the substrate. Temporary crimping only needs to be performed for 0.1 to 10 seconds under conditions such as a temperature of 60°C to 150°C and a pressing force of 0.05MPa to 1MPa. By temporary pressure bonding, the adhesive sheet 3p is in close contact with the substrate to an extent that it is weak but does not peel off from the substrate. In this state, the protective member 5p is peeled off from the adhesive sheet 3p using an adhesive tape or the like. After a semiconductor wafer having a different shape from the adhesive sheet 3p is placed on the surface of the adhesive sheet 3p exposed by peeling off the protective member 5p, the semiconductor wafer is press-bonded to the substrate. Crimping only needs to be performed for 0.1 to 10 seconds under conditions such as a temperature of 60°C to 150°C and a pressing force of 0.05MPa to 1MPa. Furthermore, as the substrate becomes thinner, the heating temperature is preferably lower, the pressure bonding temperature is preferably 160°C or lower, and the subsequent thermal hardening temperature is also preferably 160°C or lower.

<半導體裝置> <Semiconductor device>

圖8是示意性表示使用接著劑片3p而製造的半導體裝置的一例的剖面圖。該圖所示的半導體裝置100包括:半導體晶片S;與半導體晶片S電性連接的基板50;以及配置於半導體晶片S與基板50之間且將半導體晶片S與基板50接著的接著劑片3p。半導體晶片S的形狀例如為長方形或正方形,相對於此,接著劑片3p的形狀為T字型,半導體晶片S的形狀與接著劑片3p的形狀不同。藉由採用所述構成,如圖8所示,於區域R1、區域R2中,可藉由導電材料A1、導電材料A2而將基板50與半導體晶片S電性連接。FIG. 8 is a cross-sectional view schematically showing an example of a semiconductor device manufactured using the adhesive sheet 3 p. The semiconductor device 100 shown in the figure includes: a semiconductor wafer S; a substrate 50 electrically connected to the semiconductor wafer S; and an adhesive sheet 3 p disposed between the semiconductor wafer S and the substrate 50 and bonding the semiconductor wafer S and the substrate 50 . . The shape of the semiconductor wafer S is, for example, rectangular or square, whereas the shape of the adhesive sheet 3p is T-shaped, and the shape of the semiconductor wafer S is different from the shape of the adhesive sheet 3p. By adopting the above structure, as shown in FIG. 8 , in the regions R1 and R2 , the substrate 50 and the semiconductor chip S can be electrically connected through the conductive materials A1 and A2.

半導體裝置100的製造方法包括:準備依序積層有基板50、接著劑片3p及半導體晶片S的積層體(未圖示)的步驟;以及藉由對積層體進行加熱而介隔接著劑片來將基板50與半導體晶片S接著的步驟。將基板50與半導體晶片S接著時的溫度較佳為低溫,例如為160℃以下。The manufacturing method of the semiconductor device 100 includes the steps of preparing a laminate (not shown) in which the substrate 50, the adhesive sheet 3p and the semiconductor wafer S are sequentially laminated; and heating the laminate to separate the adhesive sheets. The step of bonding the substrate 50 and the semiconductor wafer S. The temperature when the substrate 50 and the semiconductor wafer S are bonded is preferably low, for example, 160° C. or lower.

以上,對本揭示的實施形態進行了詳細說明,但本揭示並不限定於所述實施形態。例如,於所述實施形態中,為了可利用相機等掌握保護構件5p的有無及朝向等,而例示了使用經著色的保護膜5的情況,取而代之,亦可於保護構件5p的規定的位置標注標記。另外,若設為接著劑片3p被著色的態樣,則亦可不設置保護構件5p。再者,於接著劑片3p的朝向不會成為問題的情況下,無需識別朝向。 [實施例]The embodiments of the present disclosure have been described in detail above, but the present disclosure is not limited to the embodiments. For example, in the above-described embodiment, the colored protective film 5 is used so that the presence, orientation, etc. of the protective member 5p can be grasped using a camera. Alternatively, a predetermined position of the protective member 5p may be marked. mark. In addition, if the adhesive sheet 3p is colored, the protective member 5p does not need to be provided. In addition, when the orientation of the adhesive sheet 3p does not become a problem, there is no need to recognize the orientation. [Example]

以下,基於實施例而對本揭示進行說明。本揭示並不限定於以下的實施例。Hereinafter, this disclosure is demonstrated based on an Example. This disclosure is not limited to the following Examples.

<實施例1> (接著劑清漆的製備) 藉由混合以下的材料,並且進行真空脫氣,從而獲得接著劑清漆。 ×熱塑性樹脂:HTR-860P-3(商品名,長瀨化成(Nagase ChemteX)股份有限公司製造,含縮水甘油基的丙烯酸橡膠,分子量100萬,Tg-7℃)100質量份 ×熱硬化性樹脂:YDCN-700-10(商品名,新日鐵住金化學股份有限公司製造,鄰甲酚酚醛清漆型環氧樹脂,環氧當量210)30質量份 ×熱硬化性樹脂:LF-4871(商品名,迪愛生(DIC)股份有限公司製造,雙酚A型環氧樹脂,環氧當量118)95質量份 ×熱硬化性樹脂:YDF-8170C(商品名,新日鐵住金化學股份有限公司製造,雙酚F型環氧樹脂,環氧當量157)100質量份 ×硬化促進劑:2PZ-CN(商品名,四國化成工業股份有限公司製造,咪唑化合物)0.3質量份 ×表面處理填料:SC-2050-HLG(商品名,亞都瑪科技(Admatechs)股份有限公司製造)330質量份 ×矽烷偶合劑:A-189(商品名,NUC股份有限公司製造,γ-巰基丙基三甲氧基矽烷)0.9質量份 ×矽烷偶合劑:A-1160(商品名,NUC股份有限公司製造,γ-脲基丙基三乙氧基矽烷)2質量份<Example 1> (Preparation of Adhesive Varnish) The following materials were mixed and vacuum degassed to obtain an adhesive varnish. × Thermoplastic resin: HTR-860P-3 (trade name, manufactured by Nagase ChemteX Co., Ltd., glycidyl group-containing acrylic rubber, molecular weight 1 million, Tg-7°C) 100 parts by mass × thermosetting resin : YDCN-700-10 (trade name, manufactured by Nippon Steel & Sumitomo Metal Chemical Co., Ltd., o-cresol novolak type epoxy resin, epoxy equivalent: 210) 30 parts by mass × Thermosetting resin: LF-4871 (trade name , manufactured by DIC Co., Ltd., bisphenol A type epoxy resin, epoxy equivalent 118) 95 parts by mass × thermosetting resin: YDF-8170C (trade name, manufactured by Nippon Steel & Sumitomo Metal Chemical Co., Ltd., Bisphenol F type epoxy resin, epoxy equivalent 157) 100 parts by mass × hardening accelerator: 2PZ-CN (trade name, manufactured by Shikoku Chemical Industry Co., Ltd., imidazole compound) 0.3 parts by mass × surface treatment filler: SC- 2050-HLG (trade name, manufactured by Admatechs Co., Ltd.) 330 parts by mass × Silane coupling agent: A-189 (trade name, manufactured by NUC Co., Ltd., γ-mercaptopropyltrimethoxysilane) 0.9 Parts by mass × Silane coupling agent: A-1160 (trade name, manufactured by NUC Co., Ltd., γ-ureidopropyltriethoxysilane) 2 parts by mass

(接著膜的製作) 將所述接著劑清漆塗敷於厚度50 μm的表面模切處理聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)A-63)上。經過乾燥步驟,從而獲得於所述聚對苯二甲酸乙二酯膜(載體膜)的一面形成有厚度25 μm的接著劑層的膜。藉由將該膜與經著色的厚度50 μm的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,TDM-1)貼合,從而獲得積層膜。藉由將該積層膜縱切成15 mm寬度,從而獲得帶狀的積層體。(Preparation of adhesive film) The adhesive varnish was applied to a surface die-cut polyethylene terephthalate film with a thickness of 50 μm (manufactured by Teijin Film Solutions Co., Ltd., trade name: Teijin tetoron film (A-63) on. After the drying step, a film with an adhesive layer having a thickness of 25 μm formed on one side of the polyethylene terephthalate film (carrier film) was obtained. This film was bonded to a colored 50 μm-thick polyethylene film (TDM-1, manufactured by Tamapoly Co., Ltd.) to obtain a laminated film. By cutting the laminated film into a width of 15 mm, a strip-shaped laminated body is obtained.

使用圖6所示的構成的裝置對以所述方式獲得的積層體進行模切,藉此獲得本實施例的接著膜。接著劑片的形狀設為縱約7 mm×橫約6 mm的矩形的欠缺一部分角的形狀(面積:29 mm2 )。間距P設為約9 mm。接著劑片的面積率R為23%。The laminate obtained in the above manner was die-cut using an apparatus having the structure shown in FIG. 6 , thereby obtaining the adhesive film of this example. Next, the shape of the tablet was set to a rectangular shape of approximately 7 mm in length and 6 mm in width, with some corners missing (area: 29 mm 2 ). The pitch P is set to approximately 9 mm. The area ratio R of the adhesive tablet was 23%.

<實施例2> 除變更接著劑片的尺寸及間距以外,與實施例1同樣地製作接著膜。<Example 2> An adhesive film was produced in the same manner as in Example 1, except that the size and pitch of the adhesive sheets were changed.

<實施例3> 使用與實施例2中所使用的載體膜不同的實施了表面處理的載體膜且變更接著劑片的形狀,除此以外,與實施例2同樣地製作接著膜。作為載體膜,使用厚度50 μm的表面模切處理聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)A-53)。<Example 3> An adhesive film was produced in the same manner as in Example 2, except that a surface-treated carrier film different from the carrier film used in Example 2 was used and the shape of the adhesive sheet was changed. As a carrier film, a surface die-cut polyethylene terephthalate film with a thickness of 50 μm (manufactured by Teijin Film Solutions Co., Ltd., trade name: teijin tetoron film) was used A-53).

<實施例4> 除使用與實施例2中所使用的保護膜不同的保護膜以外,與實施例2同樣地製作接著膜。作為保護膜,使用未著色的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,商品名:NF-13,厚度:20 μm)。<Example 4> An adhesive film was produced in the same manner as in Example 2, except that a protective film different from that used in Example 2 was used. As a protective film, an uncolored polyethylene film (manufactured by Tamapoly Co., Ltd., trade name: NF-13, thickness: 20 μm) was used.

<實施例5> 除使用與實施例2中所使用的保護膜不同的保護膜以外,與實施例2同樣地製作接著膜。作為保護膜,使用未著色的聚乙烯膜(塔瑪坡力(Tamapoly)股份有限公司製造,商品名:GF-3,厚度:30 μm)。<Example 5> An adhesive film was produced in the same manner as in Example 2, except that a protective film different from that used in Example 2 was used. As a protective film, an uncolored polyethylene film (manufactured by Tamapoly Co., Ltd., trade name: GF-3, thickness: 30 μm) was used.

<實施例6> 除使用與實施例2中所使用的載體膜不同的載體膜以外,與實施例2同樣地製作接著膜。作為載體膜,使用未進行表面模切處理的聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)G2,厚度:50 μm)。<Example 6> An adhesive film was produced in the same manner as in Example 2, except that a carrier film different from that used in Example 2 was used. As the carrier film, a polyethylene terephthalate film without surface die-cutting treatment (manufactured by Teijin Film Solutions Co., Ltd., trade name: Teijin Tetoron Film G2) was used. , thickness: 50 μm).

<實施例7> 除使用與實施例2中所使用的載體膜不同的載體膜以外,與實施例2同樣地製作接著膜。作為載體膜,使用未進行表面模切處理的聚對苯二甲酸乙二酯膜(帝人膜解決方案(Teijin film solutions)股份有限公司製造,商品名:帝人帝特綸膜(teijin tetoron film)G2,厚度:38 μm)。<Example 7> An adhesive film was produced in the same manner as in Example 2, except that a carrier film different from that used in Example 2 was used. As the carrier film, a polyethylene terephthalate film without surface die-cutting treatment (manufactured by Teijin Film Solutions Co., Ltd., trade name: Teijin Tetoron Film G2) was used. , thickness: 38 μm).

<實施例8> 除變更接著劑片的尺寸以外,與實施例2同樣地製作接著膜。<Example 8> An adhesive film was produced in the same manner as in Example 2, except that the size of the adhesive sheet was changed.

<實施例9> 除變更接著劑片的尺寸以外,與實施例2同樣地製作接著膜。<Example 9> An adhesive film was produced in the same manner as in Example 2, except that the size of the adhesive sheet was changed.

對所述實施例的接著膜進行以下項目的評價。將結果示於表1及表2中。 (1)接著劑片的面積率R 將表1所示的接著劑片的面積A(mm2 )、間距P(mm)及載體膜的寬度W(mm)代入下述式中,從而算出接著劑片的面積率R(%)。 面積率R(%)=A/(P×W)×100The following items were evaluated for the adhesive films of the Examples. The results are shown in Table 1 and Table 2. (1) Area ratio R of the adhesive sheet. The area A (mm 2 ), pitch P (mm), and width W (mm) of the carrier film shown in Table 1 are substituted into the following formula to calculate the adhesive sheet. Tablet area ratio R (%). Area ratio R (%) = A/(P×W)×100

(2)光透過率 使用日本分光股份有限公司製造的V-570(商品名)來測定於載體膜上設置有接著劑片及覆蓋其的保護構件的區域的波長500 nm的光的透過率。(2) Light transmittance The transmittance of light at a wavelength of 500 nm was measured using V-570 (trade name) manufactured by JASCO Co., Ltd. in the area where the adhesive sheet and the protective member covering it were provided on the carrier film.

(3)載體膜密接力(90°剝離強度) 將未進行模切的積層膜(載體膜/接著劑層/保護膜)切成20 mm寬度。使用雙面膠帶將載體膜側的面貼附於鋁板後,剝離保護膜。其後,一邊將接著劑層相對於載體膜的角度維持為90°,一邊向上方提拉接著劑層,藉此使接著劑層自載體膜剝離。提拉速度設為50 mm/min,測定環境溫度設為23℃±2℃。測定提拉所需要的力。將該測定值(mN)及試樣的寬度(20 mm)代入下述式中,藉此算出載體膜與接著劑層之間的密接力。 密接力(N/m)=測定值(mN)/20(mm)(3) Carrier film adhesion (90° peel strength) Cut the undie-cut laminated film (carrier film/adhesive layer/protective film) into a width of 20 mm. Use double-sided tape to attach the carrier film side to the aluminum plate, and then peel off the protective film. Thereafter, while maintaining the angle of the adhesive layer with respect to the carrier film at 90°, the adhesive layer is pulled upward to peel off the adhesive layer from the carrier film. The pulling speed was set to 50 mm/min, and the measurement ambient temperature was set to 23°C ± 2°C. Determine the force required to pull. The measured value (mN) and the width of the sample (20 mm) are substituted into the following formula to calculate the adhesive force between the carrier film and the adhesive layer. Adhesion force (N/m) = measured value (mN)/20 (mm)

(4)保護膜密接力(90°剝離強度) 將未進行模切的積層膜(載體膜/接著劑層/保護膜)切成20 mm寬度。剝離載體膜後,使用雙面膠帶將接著劑層側的面貼附於鋁板後,其後,一邊將保護膜相對於接著劑層的角度維持為90°,一邊向上方提拉保護膜,藉此使接著劑層自保護膜剝離。提拉速度設為300 mm/min,測定環境溫度設為23℃±2℃。測定提拉所需要的力。將該測定值(mN)及試樣的寬度(20 mm)代入下述式中,藉此算出保護膜與接著劑層的密接力。 密接力(N/m)=測定值(mN)/20(mm)(4) Protective film adhesion (90° peel strength) Cut the undie-cut laminated film (carrier film/adhesive layer/protective film) into a width of 20 mm. After peeling off the carrier film, use double-sided tape to attach the adhesive layer side to the aluminum plate. Then, while maintaining the angle of the protective film relative to the adhesive layer at 90°, pull the protective film upward to This causes the adhesive layer to peel off from the protective film. The pulling speed was set to 300 mm/min, and the measurement ambient temperature was set to 23°C ± 2°C. Determine the force required to pull. The measured value (mN) and the width of the sample (20 mm) are substituted into the following formula to calculate the adhesive force between the protective film and the adhesive layer. Adhesion force (N/m) = measured value (mN)/20 (mm)

[表1] [Table 1]

[表2] [產業上的可利用性][Table 2] [Industrial availability]

根據本揭示,可提供一種對於有效率地實施半導體裝置的製造製程中的接著步驟而言有用的包括複雜形狀的接著劑片的接著膜。另外,根據本揭示,可提供一種使用複雜形狀的接著劑片的半導體裝置及其製造方法。According to the present disclosure, it is possible to provide an adhesive film including a complex-shaped adhesive sheet that is useful for efficiently performing an adhesive step in a manufacturing process of a semiconductor device. In addition, according to the present disclosure, a semiconductor device using a complex-shaped adhesive sheet and a manufacturing method thereof can be provided.

1‧‧‧載體膜3‧‧‧接著劑層3A‧‧‧行3p‧‧‧接著劑片5‧‧‧保護膜5p‧‧‧保護構件10‧‧‧接著膜20‧‧‧積層體30‧‧‧不需要部分50‧‧‧基板51‧‧‧旋轉體51a、52a‧‧‧旋轉軸51c‧‧‧刀片52‧‧‧輥60‧‧‧楔狀構件65‧‧‧拾取裝置100‧‧‧半導體裝置A1、A2‧‧‧導電材料C1~C12‧‧‧接著劑片的角F1‧‧‧接著劑片的面(第一面)F2‧‧‧接著劑片的面(第二面)P‧‧‧間距R1、R2‧‧‧區域S‧‧‧半導體晶片W‧‧‧寬度X‧‧‧箭頭II-II‧‧‧剖面線1‧‧‧Carrier film 3‧‧‧Adhesive layer 3A‧‧‧row 3p‧‧‧Adhesive sheet 5‧‧‧Protective film 5p‧‧‧Protective member 10‧‧‧Adhesive film 20‧‧‧Laminate 30 ‧‧‧Unnecessary part 50‧‧‧Base plate 51‧‧‧Rotating body 51a, 52a‧‧‧Rotating shaft 51c‧‧‧Blade 52‧‧‧Roller 60‧‧‧Wedge member 65‧‧‧Picking device 100‧ ‧‧Semiconductor devices A1, A2‧‧‧Conductive materials C1~C12‧‧‧Corner of the adhesive sheet F1‧‧‧Surface of the adhesive sheet (first side) F2‧‧‧Surface of the adhesive sheet (second side) )P‧‧‧Pitch R1, R2‧‧‧Area S‧‧‧Semiconductor wafer W‧‧‧Width X‧‧‧Arrow II-II‧‧‧Hatch line

圖1是示意性表示本揭示的接著膜的一實施形態的立體圖。 圖2是圖1所示的II-II線的剖面圖。 圖3(a)至圖3(f)是表示接著劑片的形狀的變動的平面圖。 圖4是示出T字型的接著劑片與半導體晶片的配置的一例的平面圖。 圖5是示意性表示依序積層有載體膜、接著劑層及保護膜的積層體的剖面圖。 圖6是表示藉由模切而於載體膜上形成多個接著劑片的情況的立體圖。 圖7是示意性表示自載體膜拾取接著劑片及覆蓋其的保護構件的情況的剖面圖。 圖8是示意性表示使用本揭示的接著劑片而製造的半導體裝置的一例的剖面圖。FIG. 1 is a perspective view schematically showing an embodiment of the adhesive film of the present disclosure. FIG. 2 is a cross-sectional view along line II-II shown in FIG. 1 . 3(a) to 3(f) are plan views showing changes in the shape of the adhesive sheet. 4 is a plan view showing an example of the arrangement of a T-shaped adhesive sheet and a semiconductor wafer. FIG. 5 is a cross-sectional view schematically showing a laminate in which a carrier film, an adhesive layer, and a protective film are laminated in this order. 6 is a perspective view showing a state in which a plurality of adhesive sheets are formed on a carrier film by die cutting. 7 is a cross-sectional view schematically showing a state of picking up an adhesive sheet and a protective member covering it from a carrier film. 8 is a cross-sectional view schematically showing an example of a semiconductor device manufactured using the adhesive sheet of the present disclosure.

1‧‧‧載體膜 1‧‧‧Carrier film

3A‧‧‧行 Row 3A‧‧‧

3p‧‧‧接著劑片 3p‧‧‧Adhesive tablets

5p‧‧‧保護構件 5p‧‧‧Protective components

10‧‧‧接著膜 10‧‧‧Adhesion film

P‧‧‧間距 P‧‧‧spacing

W‧‧‧寬度 W‧‧‧Width

X‧‧‧箭頭 X‧‧‧arrow

II-II‧‧‧剖面線 II-II‧‧‧Hatch line

Claims (15)

一種半導體裝置製造用接著膜,其包括:寬度100mm以下的帶狀的載體膜;以及以沿所述載體膜的長邊方向排列的方式配置於所述載體膜上的多個接著劑片;並且所述接著劑片具有於長方形或正方形的至少一邊的兩端的至少一者形成有凹部的形狀,所述半導體裝置製造用接著膜進而包括保護構件,所述保護構件覆蓋所述接著劑片的與所述載體膜側的第一面相反的一側的第二面且具有與所述接著劑片相同的形狀,所述保護構件的光透過率低於所述載體膜的光透過率。 An adhesive film for semiconductor device manufacturing, comprising: a strip-shaped carrier film with a width of 100 mm or less; and a plurality of adhesive sheets arranged on the carrier film so as to be arranged along the longitudinal direction of the carrier film; and The adhesive sheet has a shape in which a recess is formed at at least one of both ends of at least one side of a rectangle or a square, and the adhesive film for semiconductor device manufacturing further includes a protective member covering the adhesive sheet and The second surface on the side opposite to the first surface on the carrier film side has the same shape as the adhesive sheet, and the light transmittance of the protective member is lower than the light transmittance of the carrier film. 如申請專利範圍第1項所述的半導體裝置製造用接著膜,其中所述接著劑片具有6個以上的角。 The adhesive film for manufacturing a semiconductor device according to claim 1, wherein the adhesive sheet has six or more corners. 如申請專利範圍第2項所述的半導體裝置製造用接著膜,其中所述接著劑片的形狀為L字型。 The adhesive film for semiconductor device manufacturing according to claim 2, wherein the adhesive sheet is L-shaped. 如申請專利範圍第1項所述的半導體裝置製造用接著膜,其中所述接著劑片具有8個以上的角。 The adhesive film for semiconductor device manufacturing according to claim 1, wherein the adhesive sheet has eight or more corners. 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中所述接著劑片的面積為10mm2~200mm2The adhesive film for manufacturing semiconductor devices as described in any one of items 1 to 4 of the patent application scope, wherein the area of the adhesive sheet is 10mm 2 ~200mm 2 . 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中以所述載體膜的面積為基準,所述載 體膜的表面且為被所述多個接著劑片覆蓋的區域的比例為10%~60%。 The adhesive film for semiconductor device manufacturing according to any one of claims 1 to 4, wherein the carrier film is based on the area of the carrier film. The proportion of the surface of the body membrane that is covered by the plurality of adhesive sheets is 10% to 60%. 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中於所述載體膜上形成有一個或多個包含所述多個接著劑片的行。 The adhesive film for semiconductor device manufacturing according to any one of claims 1 to 4, wherein one or more rows including the plurality of adhesive sheets are formed on the carrier film. 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中所述接著劑片是藉由將以覆蓋所述載體膜的表面的方式形成的接著劑層進行模切而形成者。 The adhesive film for semiconductor device manufacturing according to any one of claims 1 to 4, wherein the adhesive sheet is an adhesive layer formed to cover the surface of the carrier film Formed by die cutting. 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中所述載體膜與所述接著劑片之間的密接力為0.5N/m~18N/m。 The adhesive film for semiconductor device manufacturing according to any one of items 1 to 4 of the patent application, wherein the adhesive force between the carrier film and the adhesive sheet is 0.5N/m~18N/m . 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中所述接著劑片藉由將以覆蓋所述載體膜的表面的方式形成的接著劑層進行模切而形成且所述保護構件藉由將以覆蓋所述接著劑層的方式配置的保護膜進行模切而形成。 The adhesive film for semiconductor device manufacturing according to any one of claims 1 to 4, wherein the adhesive sheet is formed by an adhesive layer formed to cover the surface of the carrier film. The protective member is formed by die-cutting a protective film disposed so as to cover the adhesive layer. 如申請專利範圍第1項至第4項中任一項所述的半導體裝置製造用接著膜,其中所述接著劑片與所述保護構件之間的密接力為16N/m以下。 The adhesive film for semiconductor device manufacturing according to any one of claims 1 to 4, wherein the adhesive force between the adhesive sheet and the protective member is 16 N/m or less. 一種半導體裝置,其包括:基板;半導體晶片;以及 如申請專利範圍第1項至第11項中任一項所述的半導體裝置製造用接著膜的所述接著劑片;並且所述接著劑片配置於所述基板與所述半導體晶片之間且將所述基板與所述半導體晶片接著,所述半導體晶片的形狀與所述接著劑片的形狀不同。 A semiconductor device including: a substrate; a semiconductor wafer; and The adhesive sheet of the adhesive film for semiconductor device manufacturing according to any one of claims 1 to 11; and the adhesive sheet is disposed between the substrate and the semiconductor wafer, and The substrate and the semiconductor wafer are bonded, and the shape of the semiconductor wafer is different from the shape of the adhesive sheet. 一種半導體裝置的製造方法,其中使用如申請專利範圍第1項至第11項中任一項所述的半導體裝置製造用接著膜的所述接著劑片。 A method of manufacturing a semiconductor device using the adhesive sheet of the adhesive film for manufacturing a semiconductor device according to any one of claims 1 to 11 of the claims. 如申請專利範圍第13項所述的半導體裝置的製造方法,其包括:準備依序積層有基板、所述接著劑片及半導體晶片的積層體的步驟;以及藉由對所述積層體進行加熱而介隔所述接著劑片來將所述基板與所述半導體晶片接著的步驟;並且所述半導體晶片的形狀與所述接著劑片的形狀不同。 The manufacturing method of a semiconductor device according to claim 13, which includes: preparing a laminated body in which a substrate, the adhesive sheet, and a semiconductor wafer are sequentially laminated; and heating the laminated body. The step of bonding the substrate and the semiconductor wafer via the adhesive sheet; and the shape of the semiconductor wafer is different from the shape of the adhesive sheet. 如申請專利範圍第14項所述的半導體裝置的製造方法,其中藉由將所述積層體加熱至160℃以下的溫度而利用所述接著劑片將所述半導體晶片與所述基板接著。 The manufacturing method of a semiconductor device according to claim 14, wherein the semiconductor wafer and the substrate are bonded by using the adhesive sheet by heating the laminated body to a temperature of 160° C. or lower.
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