TWI814365B - Optical inspection system based on laser light source and laser optical system - Google Patents

Optical inspection system based on laser light source and laser optical system Download PDF

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TWI814365B
TWI814365B TW111116355A TW111116355A TWI814365B TW I814365 B TWI814365 B TW I814365B TW 111116355 A TW111116355 A TW 111116355A TW 111116355 A TW111116355 A TW 111116355A TW I814365 B TWI814365 B TW I814365B
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laser light
light source
target object
light
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TW202342961A (en
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林伯聰
黃冠勳
李岳龍
黃建文
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由田新技股份有限公司
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/6402Atomic fluorescence; Laser induced fluorescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/48Laser speckle optics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106General arrangement of respective parts
    • G01N2021/0112Apparatus in one mechanical, optical or electronic block
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/04Batch operation; multisample devices
    • G01N2201/0407Batch operation; multisample devices with multiple optical units, e.g. one per sample
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/10Scanning

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Abstract

An optical inspection system based on laser light source including at least one laser light source device, at least one sensing device, and an image inspection device is provided. By an illumination optical path, the laser light source device provides a laser to a target, so that the target generates a fluorescence. By the imaging optical path, the sensing device receives the fluorescence generated from the target to generate a fluorescent image. The image inspection device is connected to the sensing device, and configured to receive and analyze the fluorescent image to obtain a fluorescent inspection result. A laser optical system is also provided.

Description

基於雷射光源之光學檢測系統及雷射光學系統Optical detection system and laser optical system based on laser light source

本發明是有關於一種基於雷射光源之光學檢測系統及雷射光學系統。The invention relates to an optical detection system and a laser optical system based on a laser light source.

隨著自動化工業的進展,自動光學檢測(Automated Optical Inspection, AOI)取代人工檢測而普遍應用在工業生產中。而自動光學檢測通常是利用攝影機取得目標物的表面影像後,再利用影像處理的技術來分析異常物體或影像異常等瑕疵。而螢光檢測利用目標物內的有機物來產生螢光,可提供更高的檢測品質,因此成為自動光學檢測的選項之一。例如,透明膠體可透過膠體被照射激發光後所產生的螢光來明確凸顯其樣貌。With the development of the automation industry, Automated Optical Inspection (AOI) has replaced manual inspection and is widely used in industrial production. Automatic optical inspection usually uses a camera to obtain the surface image of the target object, and then uses image processing technology to analyze defects such as abnormal objects or image anomalies. Fluorescence detection uses organic matter in the target to generate fluorescence, which can provide higher detection quality, so it has become one of the options for automatic optical detection. For example, a transparent colloid can clearly highlight its appearance through the fluorescence produced when the colloid is irradiated with excitation light.

另外,在自動光學檢測的光源使用上,由於雷射光源可提供波長範圍接近單一的光,使螢光產生的能量轉換效率較高,因此雷射光源可做為螢光檢測較佳的光源。然而,基於雷射光具有良好的同調性,使得雷射光因在傳遞的過程中的干涉現象而容易在目標物上產生光斑(speckle)圖案(即明暗不均勻的圖案)。因此,使用雷射光源導致影像品質不佳,進而影響影像分析後的檢測結果。In addition, in the use of light sources for automatic optical detection, since laser light sources can provide light with a wavelength range close to a single wavelength, the energy conversion efficiency generated by fluorescence is higher, so laser light sources can be used as a better light source for fluorescence detection. However, due to the good coherence of laser light, laser light is prone to produce speckle patterns (i.e., uneven light and dark patterns) on the target due to interference phenomena during transmission. Therefore, the use of laser light sources results in poor image quality, which in turn affects the detection results after image analysis.

本發明之一目的係提供一種基於雷射光源之光學檢測系統。One object of the present invention is to provide an optical detection system based on a laser light source.

本發明之另一目的係提供一種雷射光學系統,其可有效降低激發光照射在目標物上的光斑現象,因此成像品質較佳,使檢測結果的可靠度提高。Another object of the present invention is to provide a laser optical system that can effectively reduce the spot phenomenon of excitation light irradiating on the target, so the imaging quality is better and the reliability of the detection results is improved.

本發明的一實施例提供一種基於雷射光源之光學檢測系統,其包括至少一雷射光源裝置、至少一感測裝置以及影像檢測裝置。經由照明光路,雷射光源裝置提供雷射光至目標物上,使目標物產生螢光。經由成像光路,感測裝置接收自目標物產生的螢光,以產生螢光影像。影像檢測裝置連接至感測裝置,用以接收並分析螢光影像,以獲得螢光檢測結果。An embodiment of the present invention provides an optical detection system based on a laser light source, which includes at least one laser light source device, at least one sensing device and an image detection device. Through the illumination light path, the laser light source device provides laser light to the target object, causing the target object to generate fluorescence. Through the imaging light path, the sensing device receives fluorescence generated from the target object to generate a fluorescence image. The image detection device is connected to the sensing device for receiving and analyzing fluorescence images to obtain fluorescence detection results.

本發明的一實施例提供一種基於雷射光源之光學檢測系統,其包括物鏡、雷射光源裝置、光源濾鏡模組、線掃描攝影機、感測裝置濾鏡模組以及影像檢測裝置。物鏡經由成像光路對目標物成像。經由照明光路,雷射光源裝置透過物鏡提供雷射光至目標物上,使目標物產生螢光。經由該照明光路,光源濾鏡模組使雷射光的激發光波長成分通過至目標物上。經由該成像光路,線掃描攝影機透過物鏡接收自目標物上的螢光,以獲得螢光影像。經由成像光路,感測裝置濾鏡模組使螢光的波長成分通過,藉以產生螢光影像。影像檢測裝置連接至線掃描攝影機,接收並分析該螢光影像,以獲得螢光檢測結果。An embodiment of the present invention provides an optical detection system based on a laser light source, which includes an objective lens, a laser light source device, a light source filter module, a line scan camera, a sensing device filter module, and an image detection device. The objective lens images the target object through the imaging optical path. Through the illumination light path, the laser light source device provides laser light to the target object through the objective lens, causing the target object to produce fluorescence. Through the illumination light path, the light source filter module allows the excitation light wavelength component of the laser light to pass to the target object. Through the imaging optical path, the line scan camera receives fluorescence from the target object through the objective lens to obtain a fluorescence image. Through the imaging light path, the filter module of the sensing device passes the wavelength components of the fluorescence, thereby generating a fluorescence image. The image detection device is connected to the line scan camera, receives and analyzes the fluorescence image to obtain the fluorescence detection result.

本發明的一實施例提供一種雷射光學系統,包括發光單元、勻化光纖以及高頻振盪器。經由照明光路,發光單元提供雷射光至目標物上,使雷射光於感測裝置上產生目標物影像。經由照明光路,勻化光纖接收並傳輸雷射光。高頻振盪器設置在勻化光纖的入光端,並振動勻化光纖,藉以降低目標物影像上的光斑。An embodiment of the present invention provides a laser optical system, including a light-emitting unit, a homogenizing optical fiber and a high-frequency oscillator. Through the illumination light path, the light-emitting unit provides laser light to the target object, so that the laser light generates an image of the target object on the sensing device. Through the illumination optical path, the homogenizing optical fiber receives and transmits the laser light. The high-frequency oscillator is installed at the light input end of the homogenizing fiber and vibrates the homogenizing fiber to reduce the spot on the target image.

基於上述,在本發明的一實施例的光學檢測系統及雷射光學系統中,除了利用勻化光纖將雷射光進行勻化,還利用高頻振盪器使雷射光在勻化光纖內的傳遞路徑不固定,以抑制雷射光的干涉效應,進一步抑制了目標物影像上的光斑,使檢測結果的可靠度提高。Based on the above, in the optical detection system and the laser optical system according to one embodiment of the present invention, in addition to using the homogenizing fiber to homogenize the laser light, a high-frequency oscillator is also used to adjust the transmission path of the laser light in the homogenizing fiber. It is not fixed to suppress the interference effect of laser light, further suppressing the light spots on the target image and improving the reliability of the detection results.

圖1是根據本發明第一實施例的光學檢測系統的示意圖。請參考圖1,本發明的一實施例提供一種基於雷射光源之光學檢測系統10(或一種雷射光學系統),其包括至少一雷射光源裝置110、至少一感測裝置200以及影像檢測裝置300。Figure 1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention. Please refer to Figure 1. An embodiment of the present invention provides an optical detection system 10 (or a laser optical system) based on a laser light source, which includes at least one laser light source device 110, at least one sensing device 200 and an image detection system. Device 300.

圖2是圖1中的雷射光源裝置的示意圖。請參考圖1與圖2,在本實施例中,雷射光源裝置110包括發光單元114、勻化光纖120以及高頻振盪器130。發光單元114包括高斯分布的雷射光源。經由照明光路EO,發光單元114用以提供雷射光L至目標物W上,使雷射光L於感測裝置200上產生目標物影像。其中,雷射光L可為紅光、綠光、藍光、UV光、IR光或其他色光。目標物W包含但不限於,例如包括半導體裝置、半導體晶圓、半導體晶片、電路板或顯示面板。FIG. 2 is a schematic diagram of the laser light source device in FIG. 1 . Please refer to FIGS. 1 and 2 . In this embodiment, the laser light source device 110 includes a light emitting unit 114 , a homogenizing optical fiber 120 and a high-frequency oscillator 130 . The light emitting unit 114 includes a Gaussian distributed laser light source. Through the illumination light path EO, the light-emitting unit 114 is used to provide laser light L to the target object W, so that the laser light L generates an image of the target object on the sensing device 200 . Among them, the laser light L can be red light, green light, blue light, UV light, IR light or other colored light. The target object W includes, but is not limited to, a semiconductor device, a semiconductor wafer, a semiconductor wafer, a circuit board or a display panel.

在本實施例中,勻化光纖120連接至發光單元114。經由照明光路EO,勻化光纖120自發光單元114接收並傳輸雷射光L。高頻振盪器130設置在勻化光纖120的入光端120S1,並振動勻化光纖120,藉以降低目標物影像上的光斑。其中,勻化光纖120可為多模光纖(Multi-mode Fiber)、或在入光端120S1或出光端120S2施加粗化處理的光纖、或由不同直徑的子光纖接合起來的光纖。高頻振盪器130可為由壓電材料(piezoelectric material)製成的振盪器,但本發明不以此為限。In this embodiment, the homogenizing optical fiber 120 is connected to the light emitting unit 114 . Via the illumination light path EO, the homogenizing optical fiber 120 receives and transmits the laser light L from the light emitting unit 114 . The high-frequency oscillator 130 is disposed at the light input end 120S1 of the homogenizing optical fiber 120 and vibrates the homogenizing optical fiber 120 to reduce the light spots on the target image. The homogenized optical fiber 120 may be a multi-mode optical fiber (Multi-mode Fiber), an optical fiber roughened at the light input end 120S1 or the light output end 120S2, or an optical fiber spliced by sub-fibers of different diameters. The high-frequency oscillator 130 may be an oscillator made of piezoelectric material, but the present invention is not limited thereto.

請參考圖1,在本實施例中,經由成像光路IO,感測裝置200接收自目標物W反射的雷射光R,以產生目標物影像。其中,感測裝置200的類型可包括線掃描攝影機(Line Scan Camera)及/或面掃描攝影機(Area Scan Camera)。在一實施例中,可通過線掃描攝影機進行高精確度的檢測,再通過面掃描攝影機進行複檢程序,藉此於同一系統上實現影像檢測及影像複檢的功能。Please refer to FIG. 1. In this embodiment, through the imaging optical path IO, the sensing device 200 receives the laser light R reflected from the target object W to generate an image of the target object. Among them, the type of the sensing device 200 may include a line scan camera (Line Scan Camera) and/or an area scan camera (Area Scan Camera). In one embodiment, a line scan camera can be used to perform high-precision inspection, and an area scan camera can be used to perform a re-inspection process, thereby realizing the functions of image inspection and image re-inspection on the same system.

在本實施例中,影像檢測裝置300連接至感測裝置200,且用以接收並分析目標物影像,以獲得影像檢測結果。其中,影像檢測裝置300例如是中央處理單元(central processing unit,CPU)、微處理器(microprocessor)、數位訊號處理器(digital signal processor,DSP)、可程式化處理裝置、可程式化邏輯裝置(programmable logic device,PLD)或其他類似裝置或這些裝置的組合,本發明並不加以限制。此外,在一實施例中,影像檢測裝置300的各功能可被實作為多個程式碼。這些程式碼會被儲存在一個記憶體中,由影像檢測裝置300來執行這些程式碼。或者,在一實施例中,影像檢測裝置300的各功能可被實作為一或多個電路。本發明並不限制用軟體或硬體的方式來實作影像檢測裝置300的各功能。In this embodiment, the image detection device 300 is connected to the sensing device 200 and is used to receive and analyze target object images to obtain image detection results. The image detection device 300 is, for example, a central processing unit (CPU), a microprocessor, a digital signal processor (DSP), a programmable processing device, a programmable logic device ( programmable logic device (PLD) or other similar devices or combinations of these devices, the present invention is not limited. In addition, in one embodiment, each function of the image detection device 300 can be implemented as a plurality of program codes. These program codes will be stored in a memory, and the image detection device 300 will execute these program codes. Alternatively, in one embodiment, each function of the image detection device 300 may be implemented as one or more circuits. The present invention is not limited to using software or hardware to implement each function of the image detection device 300.

在一實施例中,上述的反射的雷射光R可為螢光(如圖3A所示的螢光F)。也就是說,雷射光L照射至目標物W上,使目標物W產生螢光,且感測裝置200接收自目標物W產生的螢光,以產生螢光影像。影像檢測裝置300連接至感測裝置200,用以接收並分析螢光影像,以獲得螢光檢測結果。其中,目標物W還可包含但不限於,例如包括半導體裝置、半導體晶圓、半導體晶片、電路板、顯示面板或其他含有有機物的物體。舉例來說,雷射光L可為紫外光或藍光,並且目標物W可將紫外光(雷射光L)轉換為藍光(螢光F)或可將藍光(雷射光L)轉換為綠光(螢光F),但本發明不以此為限。In one embodiment, the above-mentioned reflected laser light R may be fluorescent light (fluorescent light F as shown in FIG. 3A ). That is to say, the laser light L is irradiated onto the target object W, causing the target object W to generate fluorescence, and the sensing device 200 receives the fluorescence generated from the target object W to generate a fluorescence image. The image detection device 300 is connected to the sensing device 200 for receiving and analyzing fluorescence images to obtain fluorescence detection results. The target object W may also include, but is not limited to, for example, a semiconductor device, a semiconductor wafer, a semiconductor wafer, a circuit board, a display panel or other objects containing organic matter. For example, the laser light L can be ultraviolet light or blue light, and the target object W can convert the ultraviolet light (laser light L) into blue light (fluorescent light F) or can convert the blue light (laser light L) into green light (fluorescent light). Light F), but the present invention is not limited to this.

在本實施例中,光學檢測系統10更包括分光鏡140。經由照明光路EO,分光鏡140自雷射光源裝置110引導雷射光L至目標物W上,並經由成像光路IO,自目標物W引導反射的雷射光R(或螢光)至感測裝置200。In this embodiment, the optical detection system 10 further includes a beam splitter 140 . Via the illumination optical path EO, the spectroscope 140 guides the laser light L from the laser light source device 110 to the target W, and via the imaging optical path IO, guides the reflected laser light R (or fluorescence) from the target W to the sensing device 200 .

基於上述,在本發明的一實施例的光學檢測系統10中,除了利用勻化光纖120將雷射光L進行勻化,還利用高頻振盪器130使雷射光L在勻化光纖120內的傳遞路徑不固定,以抑制雷射光L的干涉效應,進一步抑制了目標物影像上的光斑。而在一實施例中,雷射光源裝置110包括高斯分布的雷射光源112,因此,雷射光L通過勻化光纖120後形成能量均勻的平頂光型,除了降低光斑的影響,且能量損耗可低於10%。Based on the above, in the optical detection system 10 according to an embodiment of the present invention, in addition to using the homogenizing fiber 120 to homogenize the laser light L, a high-frequency oscillator 130 is also used to transmit the laser light L in the homogenizing fiber 120 The path is not fixed to suppress the interference effect of the laser light L, further suppressing the light spots on the target image. In one embodiment, the laser light source device 110 includes a Gaussian distributed laser light source 112. Therefore, the laser light L forms a flat-top light pattern with uniform energy after passing through the homogenizing fiber 120. In addition to reducing the influence of light spots, energy loss is also reduced. Can be less than 10%.

圖3A是根據本發明第二實施例的光學檢測系統的示意圖。請參考圖3A,本實施例基於雷射光源之光學檢測系統20與圖1的光學檢測系統10相似,其差異如下。在本實施例中,光學檢測系統20更包含光源濾鏡模組150以及感測裝置濾鏡模組210。光源濾鏡模組150設置在雷射光源裝置110與分光鏡140之間。經由照明光路IO,光源濾鏡模組150使雷射光L的激發光波長成分通過至目標物W上。感測裝置濾鏡模組210設置在感測裝置200與分光鏡140之間。經由成像光路IO,感測裝置濾鏡模組210,使螢光F的波長成分通過,藉以產生螢光影像。Figure 3A is a schematic diagram of an optical detection system according to a second embodiment of the present invention. Please refer to FIG. 3A . The optical detection system 20 based on the laser light source of this embodiment is similar to the optical detection system 10 of FIG. 1 , with the following differences. In this embodiment, the optical detection system 20 further includes a light source filter module 150 and a sensing device filter module 210 . The light source filter module 150 is disposed between the laser light source device 110 and the beam splitter 140 . Through the illumination light path IO, the light source filter module 150 allows the excitation light wavelength component of the laser light L to pass onto the target object W. The sensing device filter module 210 is disposed between the sensing device 200 and the beam splitter 140 . Through the imaging light path IO, the sensing device filter module 210 allows the wavelength component of the fluorescent light F to pass through, thereby generating a fluorescent image.

圖3B是圖3A中的一種物鏡系統的示意圖。請參考圖3A與圖3B,在本實施例中,經由照明光路EO,感測裝置200透過物鏡系統或定焦鏡系統160接收自目標物W產生的螢光F,以產生螢光影像。物鏡系統或定焦鏡系統160在照明光路EO或成像光路IO上設置在分光鏡140與目標物W之間。以圖3B為例,物鏡系統可包括複數個物鏡162以及旋轉盤164。每一個物鏡162具有不同的物鏡孔徑。旋轉盤164承載物鏡162,藉以切換物鏡162中的任一個物鏡162移動至照明光路EO或成像光路IO上。Figure 3B is a schematic diagram of an objective lens system in Figure 3A. Please refer to FIG. 3A and FIG. 3B. In this embodiment, through the illumination light path EO, the sensing device 200 receives the fluorescence F generated from the target object W through the objective lens system or the fixed focus lens system 160 to generate a fluorescence image. The objective lens system or fixed focus lens system 160 is disposed between the beam splitter 140 and the target object W on the illumination light path EO or the imaging light path IO. Taking FIG. 3B as an example, the objective lens system may include a plurality of objective lenses 162 and a rotating disk 164. Each objective lens 162 has a different objective aperture. The rotating disk 164 carries the objective lenses 162, thereby switching any one of the objective lenses 162 to move to the illumination light path EO or the imaging light path IO.

基於上述,本實施例的光學檢測系統20的優點大致相似於圖1的光學檢測系統10,在此不再贅述。Based on the above, the advantages of the optical detection system 20 of this embodiment are generally similar to the optical detection system 10 of FIG. 1 , and will not be described again here.

圖4是根據本發明第三實施例的光學檢測系統的示意圖。請參考圖4,光學檢測系統30與圖3A的光學檢測系統20相似,其主要差異在於:光學檢測系統30的雷射光源裝置110包括複數個側光源116,以不同的入射角度照射目標物W,使目標物W產生螢光F。由於光學檢測系統30中的側光源116以不同的入射角度照射W目標物,因此雷射光L照射在目標物W上的光型較為均勻。而且,設置多個光源的方式有助於提高照明能量,因而使螢光影像的訊噪比提高,進而提高檢測速度。而光學檢測系統30的其餘優點相似於圖3A的光學檢測系統20,在此不再贅述。Figure 4 is a schematic diagram of an optical detection system according to a third embodiment of the present invention. Please refer to FIG. 4 . The optical detection system 30 is similar to the optical detection system 20 of FIG. 3A . The main difference is that the laser light source device 110 of the optical detection system 30 includes a plurality of side light sources 116 to illuminate the target object W at different incident angles. , causing the target W to produce fluorescence F. Since the side light source 116 in the optical detection system 30 irradiates the target object W at different incident angles, the light pattern of the laser light L irradiating the target object W is relatively uniform. Moreover, setting up multiple light sources helps to increase the lighting energy, thereby improving the signal-to-noise ratio of fluorescent images, thereby increasing the detection speed. The remaining advantages of the optical detection system 30 are similar to the optical detection system 20 of FIG. 3A and will not be described again here.

圖5是根據本發明第四實施例的光學檢測系統的示意圖。請參考圖5,光學檢測系統40與圖3A的光學檢測系統20相似,其主要差異在於:基於雷射光源之光學檢測系統40包括物鏡162、雷射光源裝置110、光源濾鏡模組150、線掃描攝影機200’’’、感測裝置濾鏡模組210以及影像檢測裝置300。在本實施例中,經由成像光路IO,物鏡162對目標物W成像。經由照明光路EO,雷射光源裝置110透過物鏡162提供雷射光L至目標物W上,使目標物W產生螢光F。經由成像光路IO,線掃描攝影機200’’’透過物鏡162接收自目標物W上的螢光F,以獲得螢光影像。影像檢測裝置300連接至線掃描攝影機200’’’,接收並分析螢光影像,以獲得螢光檢測結果。Figure 5 is a schematic diagram of an optical detection system according to a fourth embodiment of the present invention. Please refer to Figure 5. The optical detection system 40 is similar to the optical detection system 20 of Figure 3A. The main difference is that the optical detection system 40 based on the laser light source includes an objective lens 162, a laser light source device 110, a light source filter module 150, Line scan camera 200'''', sensing device filter module 210 and image detection device 300. In this embodiment, the objective lens 162 images the target object W via the imaging optical path 10. Through the illumination light path EO, the laser light source device 110 provides the laser light L to the target object W through the objective lens 162, so that the target W generates fluorescence F. Through the imaging optical path 10, the line scan camera 200''' receives the fluorescence F from the target object W through the objective lens 162 to obtain a fluorescence image. The image detection device 300 is connected to the line scan camera 200''', receives and analyzes the fluorescence image to obtain the fluorescence detection result.

在本實施例中,光學檢測系統40更包含分光鏡140。分光鏡140設置於照明光路EO與成像光路IO之間,自雷射光源裝置110引導雷射光L至目標物W上,並經由成像光路IO,自目標物W引導螢光F至線掃描攝影機200’’’。In this embodiment, the optical detection system 40 further includes a beam splitter 140 . The spectroscope 140 is disposed between the illumination light path EO and the imaging light path IO, guides the laser light L from the laser light source device 110 to the target object W, and guides the fluorescent light F from the target object W to the line scan camera 200 via the imaging light path IO. '''.

基於上述,本實施例的光學檢測系統40的其餘優點相似於圖3A的光學檢測系統20,在此不再贅述。Based on the above, the remaining advantages of the optical detection system 40 of this embodiment are similar to the optical detection system 20 of FIG. 3A and will not be described again here.

綜上所述,在本發明的一實施例的光學檢測系統及雷射光學系統中,除了利用勻化光纖將雷射光進行勻化,還利用高頻振盪器使雷射光在勻化光纖內的傳遞路徑不固定,以抑制雷射光的干涉效應,進一步抑制了目標物影像上的光斑。而在一實施例中,雷射光源裝置包括高斯分布的雷射光源,因此,雷射光通過勻化光纖後形成能量均勻的平頂光型,除了降低光斑的影響,且能量損耗可低於10%。To sum up, in the optical detection system and the laser optical system according to one embodiment of the present invention, in addition to using the homogenizing fiber to homogenize the laser light, a high-frequency oscillator is also used to make the laser light in the homogenizing fiber. The transmission path is not fixed to suppress the interference effect of laser light, further suppressing the light spots on the target image. In one embodiment, the laser light source device includes a Gaussian distributed laser light source. Therefore, the laser light forms a flat-top light pattern with uniform energy after passing through the homogenized optical fiber. In addition to reducing the impact of light spots, the energy loss can be less than 10 %.

10、20、30、40:光學檢測系統 110:雷射光源裝置 114:發光單元 116:側光源 120:勻化光纖 120S1:入光端 120S2:出光端 130:高頻振盪器 140:分光鏡 150:光源濾鏡模組 160:物鏡系統或定焦鏡系統 162:物鏡 164:旋轉盤 200:感測裝置 200’’’:線掃描攝影機 210:感測裝置濾鏡模組 300:影像檢測裝置 F:螢光 L、R:雷射光 W:目標物 EO:照明光路 IO:成像光路 10, 20, 30, 40: Optical detection system 110:Laser light source device 114:Light-emitting unit 116: Side light source 120: Homogenized optical fiber 120S1: light input end 120S2: light output end 130: High frequency oscillator 140: Beam splitter 150:Light source filter module 160: Objective lens system or fixed focus lens system 162:Objective lens 164: Rotating disk 200: Sensing device 200''': Line scan camera 210: Sensing device filter module 300:Image detection device F: Fluorescence L, R: laser light W: target EO: lighting path IO: imaging optical path

圖1是根據本發明第一實施例的光學檢測系統的示意圖。 圖2是圖1中的雷射光源裝置的示意圖。 圖3A是根據本發明第二實施例的光學檢測系統的示意圖。 圖3B是圖3A中的一種物鏡系統的示意圖。 圖4是根據本發明第三實施例的光學檢測系統的示意圖。 圖5是根據本發明第四實施例的光學檢測系統的示意圖。 Figure 1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention. FIG. 2 is a schematic diagram of the laser light source device in FIG. 1 . Figure 3A is a schematic diagram of an optical detection system according to a second embodiment of the present invention. Figure 3B is a schematic diagram of an objective lens system in Figure 3A. Figure 4 is a schematic diagram of an optical detection system according to a third embodiment of the present invention. Figure 5 is a schematic diagram of an optical detection system according to a fourth embodiment of the present invention.

10:光學檢測系統 10: Optical detection system

110:雷射光源裝置 110:Laser light source device

140:分光鏡 140: Beam splitter

200:感測裝置 200: Sensing device

300:影像檢測裝置 300:Image detection device

L、R:雷射光 L, R: laser light

W:目標物 W: target

EO:照明光路 EO: lighting path

IO:成像光路 IO: imaging optical path

Claims (16)

一種基於雷射光源之光學檢測系統,包括:至少一雷射光源裝置,經由一照明光路,提供一雷射光至一目標物上,使該目標物產生螢光;至少一感測裝置,經由一成像光路,接收自該目標物產生的該螢光,以產生一螢光影像;以及一影像檢測裝置,連接至該至少一感測裝置,用以接收並分析該螢光影像,以獲得一螢光檢測結果,其中該至少一雷射光源裝置包括:一發光單元,用以提供該雷射光;一勻化光纖,連接至該發光單元,接收並傳輸該雷射光;以及一高頻振盪器,設置在該勻化光纖的入光端,藉以振動該勻化光纖。 An optical detection system based on a laser light source, including: at least one laser light source device, providing a laser light to a target object through an illumination light path, so that the target object generates fluorescence; at least one sensing device, through an illumination light path The imaging light path receives the fluorescence generated from the target object to generate a fluorescence image; and an image detection device is connected to the at least one sensing device for receiving and analyzing the fluorescence image to obtain a fluorescence image. Light detection results, wherein the at least one laser light source device includes: a light-emitting unit to provide the laser light; a homogenizing optical fiber connected to the light-emitting unit to receive and transmit the laser light; and a high-frequency oscillator, It is arranged at the light input end of the homogenized optical fiber to vibrate the homogenized optical fiber. 如請求項1所述的基於雷射光源之光學檢測系統,其中該目標物包括半導體裝置、半導體晶圓、半導體晶片、電路板、顯示面板或其他含有有機物的物體。 The optical detection system based on laser light source as claimed in claim 1, wherein the target object includes a semiconductor device, a semiconductor wafer, a semiconductor chip, a circuit board, a display panel or other objects containing organic matter. 如請求項1所述的基於雷射光源之光學檢測系統,其中該雷射光源裝置包括複數個側光源,以不同的入射角度照射該目標物,使該目標物產生螢光。 The optical detection system based on a laser light source as claimed in claim 1, wherein the laser light source device includes a plurality of side light sources that illuminate the target object at different incident angles to cause the target object to generate fluorescence. 如請求項1所述的基於雷射光源之光學檢測系統,更包含: 一分光鏡,經由該照明光路,自該雷射光源裝置引導該雷射光至該目標物上,並經由該成像光路,自該目標物引導該螢光至該感測裝置。 The optical detection system based on laser light source as described in claim 1 further includes: A beam splitter guides the laser light from the laser source device to the target object through the illumination light path, and guides the fluorescence from the target object to the sensing device through the imaging light path. 如請求項1所述的基於雷射光源之光學檢測系統,其中感測裝置,經由該照明光路,透過一物鏡系統或一定焦鏡系統接收自該目標物產生的該螢光,以產生該螢光影像。 The optical detection system based on the laser light source as described in claim 1, wherein the sensing device receives the fluorescence generated from the target object through the illumination light path through an objective lens system or a certain focus lens system to generate the fluorescence light image. 如請求項1所述的基於雷射光源之光學檢測系統,其中該感測裝置的類型包括線掃描攝影機及/或面掃描攝影機。 The optical detection system based on laser light source as claimed in claim 1, wherein the type of the sensing device includes a line scan camera and/or an area scan camera. 如請求項1所述的基於雷射光源之光學檢測系統,更包含:一光源濾鏡模組,經由該照明光路,使該雷射光的激發光波長成分通過至目標物上;以及一感測裝置濾鏡模組,經由該成像光路,使該螢光的波長成分通過,藉以產生該螢光影像。 The optical detection system based on the laser light source as described in claim 1 further includes: a light source filter module that allows the excitation light wavelength component of the laser light to pass to the target object through the illumination light path; and a sensor A filter module is installed to pass the wavelength component of the fluorescent light through the imaging light path, thereby generating the fluorescent image. 如請求項1所述的基於雷射光源之光學檢測系統,其中該發光單元包括高斯分布的雷射光源。 The optical detection system based on a laser light source as claimed in claim 1, wherein the light-emitting unit includes a Gaussian distributed laser light source. 一種基於雷射光源之光學檢測系統,包括:一物鏡,經由一成像光路對一目標物成像;一雷射光源裝置,經由一照明光路,透過該物鏡提供一雷射光至該目標物上,使該目標物產生螢光;一光源濾鏡模組,經由該照明光路,使該雷射光的激發光波長成分通過至該目標物上; 一線掃描攝影機,經由該成像光路,透過該物鏡接收自該目標物上的該螢光,以獲得一螢光影像;一感測裝置濾鏡模組,經由該成像光路,使該螢光的波長成分通過,藉以產生該螢光影像;以及一影像檢測裝置,連接至該線掃描攝影機,接收並分析該螢光影像,以獲得一螢光檢測結果,其中該雷射光源裝置包括:一發光單元,用以提供該雷射光;一勻化光纖,連接至該發光單元,接收並傳輸該雷射光;以及一高頻振盪器,設置在該勻化光纖的入光端,藉以振動該勻化光纖。 An optical detection system based on a laser light source, including: an objective lens, which images a target object through an imaging light path; a laser light source device, which provides a laser light to the target object through the objective lens through an illumination light path, so that The target object generates fluorescence; a light source filter module allows the excitation light wavelength component of the laser light to pass to the target object through the illumination light path; A line scanning camera receives the fluorescence from the target object through the objective lens through the imaging light path to obtain a fluorescence image; a sensing device filter module uses the imaging light path to adjust the wavelength of the fluorescence The components pass through to generate the fluorescent image; and an image detection device is connected to the line scan camera to receive and analyze the fluorescent image to obtain a fluorescence detection result, wherein the laser light source device includes: a light-emitting unit , used to provide the laser light; a homogenizing optical fiber, connected to the light-emitting unit, receiving and transmitting the laser light; and a high-frequency oscillator, arranged at the light input end of the homogenizing optical fiber, to vibrate the homogenizing optical fiber . 如請求項9所述的基於雷射光源之光學檢測系統,其中該目標物包括半導體裝置、半導體晶圓、半導體晶片、電路板、顯示面板或其他含有有機物的物體。 The optical detection system based on a laser light source as claimed in claim 9, wherein the target object includes a semiconductor device, a semiconductor wafer, a semiconductor chip, a circuit board, a display panel or other objects containing organic matter. 如請求項9所述的基於雷射光源之光學檢測系統,更包含:一分光鏡,設置於該照明光路與該成像光路之間,自該雷射光源裝置引導該雷射光至該目標物上,並經由該成像光路,自該目標物引導該螢光至該線掃描攝影機。 The optical detection system based on the laser light source as described in claim 9, further comprising: a beam splitter, disposed between the illumination light path and the imaging light path, guiding the laser light from the laser light source device to the target object , and guide the fluorescent light from the target to the line scan camera through the imaging optical path. 如請求項9所述的基於雷射光源之光學檢測系統,其中該發光單元包括高斯分布的雷射光源。 The optical detection system based on a laser light source as claimed in claim 9, wherein the light-emitting unit includes a Gaussian distributed laser light source. 一種雷射光學系統,包括:一發光單元,經由一照明光路,提供一雷射光至一目標物上,使該雷射光於一感測裝置上產生一目標物影像;一勻化光纖,經由該照明光路,自該發光單元接收並傳輸該雷射光;一高頻振盪器,設置在該勻化光纖的入光端,振動該勻化光纖,藉以降低該目標物影像上的光斑。 A laser optical system includes: a light-emitting unit that provides a laser light to a target object through an illumination light path, so that the laser light generates a target object image on a sensing device; a homogenizing optical fiber that passes through the The illumination light path receives and transmits the laser light from the light-emitting unit; a high-frequency oscillator is provided at the light input end of the homogenizing optical fiber to vibrate the homogenizing optical fiber to reduce the light spot on the target image. 如請求項13所述的之雷射光學系統,其中該發光單元包括高斯分布的雷射光源。 The laser optical system of claim 13, wherein the light-emitting unit includes a Gaussian distributed laser light source. 如請求項13所述的之雷射光學系統,其中更包括:該感測裝置,經由一成像光路,接收自該目標物反射的該雷射光,以產生該目標物影像;以及一影像檢測裝置,連接至該感測裝置,用以接收並分析該目標物影像,以獲得一影像檢測結果。 The laser optical system of claim 13, further comprising: the sensing device receives the laser light reflected from the target object through an imaging optical path to generate an image of the target object; and an image detection device , connected to the sensing device, for receiving and analyzing the target image to obtain an image detection result. 如請求項13所述的之雷射光學系統,其中更包括:一分光鏡,經由該照明光路,自該光源裝置引導該雷射光至該目標物上,並經由該成像光路,自該目標物引導該雷射光至該感測裝置。 The laser optical system as claimed in claim 13, further comprising: a beam splitter, which guides the laser light from the light source device to the target object through the illumination light path, and guides the laser light from the target object through the imaging light path. Guide the laser light to the sensing device.
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TW201331568A (en) * 2012-01-17 2013-08-01 Univ Nat Taiwan Science Tech Photoluminescence measuring system and measuring method thereof
TW201710785A (en) * 2015-08-19 2017-03-16 富士軟片股份有限公司 Dye composition, fluorescence sensor, and production method for fluorescence sensor
TW202009473A (en) * 2018-08-20 2020-03-01 友達晶材股份有限公司 Defect detecting equipment and defect detecting method
CN212514276U (en) * 2020-05-27 2021-02-09 苏州影睿光学科技有限公司 Wide-spectrum fluorescence multi-channel real-time imaging system

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Publication number Priority date Publication date Assignee Title
TW201331568A (en) * 2012-01-17 2013-08-01 Univ Nat Taiwan Science Tech Photoluminescence measuring system and measuring method thereof
TW201710785A (en) * 2015-08-19 2017-03-16 富士軟片股份有限公司 Dye composition, fluorescence sensor, and production method for fluorescence sensor
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CN212514276U (en) * 2020-05-27 2021-02-09 苏州影睿光学科技有限公司 Wide-spectrum fluorescence multi-channel real-time imaging system

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