TWI814365B - Optical inspection system based on laser light source and laser optical system - Google Patents
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Abstract
Description
本發明是有關於一種基於雷射光源之光學檢測系統及雷射光學系統。The invention relates to an optical detection system and a laser optical system based on a laser light source.
隨著自動化工業的進展,自動光學檢測(Automated Optical Inspection, AOI)取代人工檢測而普遍應用在工業生產中。而自動光學檢測通常是利用攝影機取得目標物的表面影像後,再利用影像處理的技術來分析異常物體或影像異常等瑕疵。而螢光檢測利用目標物內的有機物來產生螢光,可提供更高的檢測品質,因此成為自動光學檢測的選項之一。例如,透明膠體可透過膠體被照射激發光後所產生的螢光來明確凸顯其樣貌。With the development of the automation industry, Automated Optical Inspection (AOI) has replaced manual inspection and is widely used in industrial production. Automatic optical inspection usually uses a camera to obtain the surface image of the target object, and then uses image processing technology to analyze defects such as abnormal objects or image anomalies. Fluorescence detection uses organic matter in the target to generate fluorescence, which can provide higher detection quality, so it has become one of the options for automatic optical detection. For example, a transparent colloid can clearly highlight its appearance through the fluorescence produced when the colloid is irradiated with excitation light.
另外,在自動光學檢測的光源使用上,由於雷射光源可提供波長範圍接近單一的光,使螢光產生的能量轉換效率較高,因此雷射光源可做為螢光檢測較佳的光源。然而,基於雷射光具有良好的同調性,使得雷射光因在傳遞的過程中的干涉現象而容易在目標物上產生光斑(speckle)圖案(即明暗不均勻的圖案)。因此,使用雷射光源導致影像品質不佳,進而影響影像分析後的檢測結果。In addition, in the use of light sources for automatic optical detection, since laser light sources can provide light with a wavelength range close to a single wavelength, the energy conversion efficiency generated by fluorescence is higher, so laser light sources can be used as a better light source for fluorescence detection. However, due to the good coherence of laser light, laser light is prone to produce speckle patterns (i.e., uneven light and dark patterns) on the target due to interference phenomena during transmission. Therefore, the use of laser light sources results in poor image quality, which in turn affects the detection results after image analysis.
本發明之一目的係提供一種基於雷射光源之光學檢測系統。One object of the present invention is to provide an optical detection system based on a laser light source.
本發明之另一目的係提供一種雷射光學系統,其可有效降低激發光照射在目標物上的光斑現象,因此成像品質較佳,使檢測結果的可靠度提高。Another object of the present invention is to provide a laser optical system that can effectively reduce the spot phenomenon of excitation light irradiating on the target, so the imaging quality is better and the reliability of the detection results is improved.
本發明的一實施例提供一種基於雷射光源之光學檢測系統,其包括至少一雷射光源裝置、至少一感測裝置以及影像檢測裝置。經由照明光路,雷射光源裝置提供雷射光至目標物上,使目標物產生螢光。經由成像光路,感測裝置接收自目標物產生的螢光,以產生螢光影像。影像檢測裝置連接至感測裝置,用以接收並分析螢光影像,以獲得螢光檢測結果。An embodiment of the present invention provides an optical detection system based on a laser light source, which includes at least one laser light source device, at least one sensing device and an image detection device. Through the illumination light path, the laser light source device provides laser light to the target object, causing the target object to generate fluorescence. Through the imaging light path, the sensing device receives fluorescence generated from the target object to generate a fluorescence image. The image detection device is connected to the sensing device for receiving and analyzing fluorescence images to obtain fluorescence detection results.
本發明的一實施例提供一種基於雷射光源之光學檢測系統,其包括物鏡、雷射光源裝置、光源濾鏡模組、線掃描攝影機、感測裝置濾鏡模組以及影像檢測裝置。物鏡經由成像光路對目標物成像。經由照明光路,雷射光源裝置透過物鏡提供雷射光至目標物上,使目標物產生螢光。經由該照明光路,光源濾鏡模組使雷射光的激發光波長成分通過至目標物上。經由該成像光路,線掃描攝影機透過物鏡接收自目標物上的螢光,以獲得螢光影像。經由成像光路,感測裝置濾鏡模組使螢光的波長成分通過,藉以產生螢光影像。影像檢測裝置連接至線掃描攝影機,接收並分析該螢光影像,以獲得螢光檢測結果。An embodiment of the present invention provides an optical detection system based on a laser light source, which includes an objective lens, a laser light source device, a light source filter module, a line scan camera, a sensing device filter module, and an image detection device. The objective lens images the target object through the imaging optical path. Through the illumination light path, the laser light source device provides laser light to the target object through the objective lens, causing the target object to produce fluorescence. Through the illumination light path, the light source filter module allows the excitation light wavelength component of the laser light to pass to the target object. Through the imaging optical path, the line scan camera receives fluorescence from the target object through the objective lens to obtain a fluorescence image. Through the imaging light path, the filter module of the sensing device passes the wavelength components of the fluorescence, thereby generating a fluorescence image. The image detection device is connected to the line scan camera, receives and analyzes the fluorescence image to obtain the fluorescence detection result.
本發明的一實施例提供一種雷射光學系統,包括發光單元、勻化光纖以及高頻振盪器。經由照明光路,發光單元提供雷射光至目標物上,使雷射光於感測裝置上產生目標物影像。經由照明光路,勻化光纖接收並傳輸雷射光。高頻振盪器設置在勻化光纖的入光端,並振動勻化光纖,藉以降低目標物影像上的光斑。An embodiment of the present invention provides a laser optical system, including a light-emitting unit, a homogenizing optical fiber and a high-frequency oscillator. Through the illumination light path, the light-emitting unit provides laser light to the target object, so that the laser light generates an image of the target object on the sensing device. Through the illumination optical path, the homogenizing optical fiber receives and transmits the laser light. The high-frequency oscillator is installed at the light input end of the homogenizing fiber and vibrates the homogenizing fiber to reduce the spot on the target image.
基於上述,在本發明的一實施例的光學檢測系統及雷射光學系統中,除了利用勻化光纖將雷射光進行勻化,還利用高頻振盪器使雷射光在勻化光纖內的傳遞路徑不固定,以抑制雷射光的干涉效應,進一步抑制了目標物影像上的光斑,使檢測結果的可靠度提高。Based on the above, in the optical detection system and the laser optical system according to one embodiment of the present invention, in addition to using the homogenizing fiber to homogenize the laser light, a high-frequency oscillator is also used to adjust the transmission path of the laser light in the homogenizing fiber. It is not fixed to suppress the interference effect of laser light, further suppressing the light spots on the target image and improving the reliability of the detection results.
圖1是根據本發明第一實施例的光學檢測系統的示意圖。請參考圖1,本發明的一實施例提供一種基於雷射光源之光學檢測系統10(或一種雷射光學系統),其包括至少一雷射光源裝置110、至少一感測裝置200以及影像檢測裝置300。Figure 1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention. Please refer to Figure 1. An embodiment of the present invention provides an optical detection system 10 (or a laser optical system) based on a laser light source, which includes at least one laser
圖2是圖1中的雷射光源裝置的示意圖。請參考圖1與圖2,在本實施例中,雷射光源裝置110包括發光單元114、勻化光纖120以及高頻振盪器130。發光單元114包括高斯分布的雷射光源。經由照明光路EO,發光單元114用以提供雷射光L至目標物W上,使雷射光L於感測裝置200上產生目標物影像。其中,雷射光L可為紅光、綠光、藍光、UV光、IR光或其他色光。目標物W包含但不限於,例如包括半導體裝置、半導體晶圓、半導體晶片、電路板或顯示面板。FIG. 2 is a schematic diagram of the laser light source device in FIG. 1 . Please refer to FIGS. 1 and 2 . In this embodiment, the laser
在本實施例中,勻化光纖120連接至發光單元114。經由照明光路EO,勻化光纖120自發光單元114接收並傳輸雷射光L。高頻振盪器130設置在勻化光纖120的入光端120S1,並振動勻化光纖120,藉以降低目標物影像上的光斑。其中,勻化光纖120可為多模光纖(Multi-mode Fiber)、或在入光端120S1或出光端120S2施加粗化處理的光纖、或由不同直徑的子光纖接合起來的光纖。高頻振盪器130可為由壓電材料(piezoelectric material)製成的振盪器,但本發明不以此為限。In this embodiment, the homogenizing
請參考圖1,在本實施例中,經由成像光路IO,感測裝置200接收自目標物W反射的雷射光R,以產生目標物影像。其中,感測裝置200的類型可包括線掃描攝影機(Line Scan Camera)及/或面掃描攝影機(Area Scan Camera)。在一實施例中,可通過線掃描攝影機進行高精確度的檢測,再通過面掃描攝影機進行複檢程序,藉此於同一系統上實現影像檢測及影像複檢的功能。Please refer to FIG. 1. In this embodiment, through the imaging optical path IO, the
在本實施例中,影像檢測裝置300連接至感測裝置200,且用以接收並分析目標物影像,以獲得影像檢測結果。其中,影像檢測裝置300例如是中央處理單元(central processing unit,CPU)、微處理器(microprocessor)、數位訊號處理器(digital signal processor,DSP)、可程式化處理裝置、可程式化邏輯裝置(programmable logic device,PLD)或其他類似裝置或這些裝置的組合,本發明並不加以限制。此外,在一實施例中,影像檢測裝置300的各功能可被實作為多個程式碼。這些程式碼會被儲存在一個記憶體中,由影像檢測裝置300來執行這些程式碼。或者,在一實施例中,影像檢測裝置300的各功能可被實作為一或多個電路。本發明並不限制用軟體或硬體的方式來實作影像檢測裝置300的各功能。In this embodiment, the
在一實施例中,上述的反射的雷射光R可為螢光(如圖3A所示的螢光F)。也就是說,雷射光L照射至目標物W上,使目標物W產生螢光,且感測裝置200接收自目標物W產生的螢光,以產生螢光影像。影像檢測裝置300連接至感測裝置200,用以接收並分析螢光影像,以獲得螢光檢測結果。其中,目標物W還可包含但不限於,例如包括半導體裝置、半導體晶圓、半導體晶片、電路板、顯示面板或其他含有有機物的物體。舉例來說,雷射光L可為紫外光或藍光,並且目標物W可將紫外光(雷射光L)轉換為藍光(螢光F)或可將藍光(雷射光L)轉換為綠光(螢光F),但本發明不以此為限。In one embodiment, the above-mentioned reflected laser light R may be fluorescent light (fluorescent light F as shown in FIG. 3A ). That is to say, the laser light L is irradiated onto the target object W, causing the target object W to generate fluorescence, and the
在本實施例中,光學檢測系統10更包括分光鏡140。經由照明光路EO,分光鏡140自雷射光源裝置110引導雷射光L至目標物W上,並經由成像光路IO,自目標物W引導反射的雷射光R(或螢光)至感測裝置200。In this embodiment, the
基於上述,在本發明的一實施例的光學檢測系統10中,除了利用勻化光纖120將雷射光L進行勻化,還利用高頻振盪器130使雷射光L在勻化光纖120內的傳遞路徑不固定,以抑制雷射光L的干涉效應,進一步抑制了目標物影像上的光斑。而在一實施例中,雷射光源裝置110包括高斯分布的雷射光源112,因此,雷射光L通過勻化光纖120後形成能量均勻的平頂光型,除了降低光斑的影響,且能量損耗可低於10%。Based on the above, in the
圖3A是根據本發明第二實施例的光學檢測系統的示意圖。請參考圖3A,本實施例基於雷射光源之光學檢測系統20與圖1的光學檢測系統10相似,其差異如下。在本實施例中,光學檢測系統20更包含光源濾鏡模組150以及感測裝置濾鏡模組210。光源濾鏡模組150設置在雷射光源裝置110與分光鏡140之間。經由照明光路IO,光源濾鏡模組150使雷射光L的激發光波長成分通過至目標物W上。感測裝置濾鏡模組210設置在感測裝置200與分光鏡140之間。經由成像光路IO,感測裝置濾鏡模組210,使螢光F的波長成分通過,藉以產生螢光影像。Figure 3A is a schematic diagram of an optical detection system according to a second embodiment of the present invention. Please refer to FIG. 3A . The
圖3B是圖3A中的一種物鏡系統的示意圖。請參考圖3A與圖3B,在本實施例中,經由照明光路EO,感測裝置200透過物鏡系統或定焦鏡系統160接收自目標物W產生的螢光F,以產生螢光影像。物鏡系統或定焦鏡系統160在照明光路EO或成像光路IO上設置在分光鏡140與目標物W之間。以圖3B為例,物鏡系統可包括複數個物鏡162以及旋轉盤164。每一個物鏡162具有不同的物鏡孔徑。旋轉盤164承載物鏡162,藉以切換物鏡162中的任一個物鏡162移動至照明光路EO或成像光路IO上。Figure 3B is a schematic diagram of an objective lens system in Figure 3A. Please refer to FIG. 3A and FIG. 3B. In this embodiment, through the illumination light path EO, the
基於上述,本實施例的光學檢測系統20的優點大致相似於圖1的光學檢測系統10,在此不再贅述。Based on the above, the advantages of the
圖4是根據本發明第三實施例的光學檢測系統的示意圖。請參考圖4,光學檢測系統30與圖3A的光學檢測系統20相似,其主要差異在於:光學檢測系統30的雷射光源裝置110包括複數個側光源116,以不同的入射角度照射目標物W,使目標物W產生螢光F。由於光學檢測系統30中的側光源116以不同的入射角度照射W目標物,因此雷射光L照射在目標物W上的光型較為均勻。而且,設置多個光源的方式有助於提高照明能量,因而使螢光影像的訊噪比提高,進而提高檢測速度。而光學檢測系統30的其餘優點相似於圖3A的光學檢測系統20,在此不再贅述。Figure 4 is a schematic diagram of an optical detection system according to a third embodiment of the present invention. Please refer to FIG. 4 . The
圖5是根據本發明第四實施例的光學檢測系統的示意圖。請參考圖5,光學檢測系統40與圖3A的光學檢測系統20相似,其主要差異在於:基於雷射光源之光學檢測系統40包括物鏡162、雷射光源裝置110、光源濾鏡模組150、線掃描攝影機200’’’、感測裝置濾鏡模組210以及影像檢測裝置300。在本實施例中,經由成像光路IO,物鏡162對目標物W成像。經由照明光路EO,雷射光源裝置110透過物鏡162提供雷射光L至目標物W上,使目標物W產生螢光F。經由成像光路IO,線掃描攝影機200’’’透過物鏡162接收自目標物W上的螢光F,以獲得螢光影像。影像檢測裝置300連接至線掃描攝影機200’’’,接收並分析螢光影像,以獲得螢光檢測結果。Figure 5 is a schematic diagram of an optical detection system according to a fourth embodiment of the present invention. Please refer to Figure 5. The
在本實施例中,光學檢測系統40更包含分光鏡140。分光鏡140設置於照明光路EO與成像光路IO之間,自雷射光源裝置110引導雷射光L至目標物W上,並經由成像光路IO,自目標物W引導螢光F至線掃描攝影機200’’’。In this embodiment, the
基於上述,本實施例的光學檢測系統40的其餘優點相似於圖3A的光學檢測系統20,在此不再贅述。Based on the above, the remaining advantages of the
綜上所述,在本發明的一實施例的光學檢測系統及雷射光學系統中,除了利用勻化光纖將雷射光進行勻化,還利用高頻振盪器使雷射光在勻化光纖內的傳遞路徑不固定,以抑制雷射光的干涉效應,進一步抑制了目標物影像上的光斑。而在一實施例中,雷射光源裝置包括高斯分布的雷射光源,因此,雷射光通過勻化光纖後形成能量均勻的平頂光型,除了降低光斑的影響,且能量損耗可低於10%。To sum up, in the optical detection system and the laser optical system according to one embodiment of the present invention, in addition to using the homogenizing fiber to homogenize the laser light, a high-frequency oscillator is also used to make the laser light in the homogenizing fiber. The transmission path is not fixed to suppress the interference effect of laser light, further suppressing the light spots on the target image. In one embodiment, the laser light source device includes a Gaussian distributed laser light source. Therefore, the laser light forms a flat-top light pattern with uniform energy after passing through the homogenized optical fiber. In addition to reducing the impact of light spots, the energy loss can be less than 10 %.
10、20、30、40:光學檢測系統 110:雷射光源裝置 114:發光單元 116:側光源 120:勻化光纖 120S1:入光端 120S2:出光端 130:高頻振盪器 140:分光鏡 150:光源濾鏡模組 160:物鏡系統或定焦鏡系統 162:物鏡 164:旋轉盤 200:感測裝置 200’’’:線掃描攝影機 210:感測裝置濾鏡模組 300:影像檢測裝置 F:螢光 L、R:雷射光 W:目標物 EO:照明光路 IO:成像光路 10, 20, 30, 40: Optical detection system 110:Laser light source device 114:Light-emitting unit 116: Side light source 120: Homogenized optical fiber 120S1: light input end 120S2: light output end 130: High frequency oscillator 140: Beam splitter 150:Light source filter module 160: Objective lens system or fixed focus lens system 162:Objective lens 164: Rotating disk 200: Sensing device 200''': Line scan camera 210: Sensing device filter module 300:Image detection device F: Fluorescence L, R: laser light W: target EO: lighting path IO: imaging optical path
圖1是根據本發明第一實施例的光學檢測系統的示意圖。 圖2是圖1中的雷射光源裝置的示意圖。 圖3A是根據本發明第二實施例的光學檢測系統的示意圖。 圖3B是圖3A中的一種物鏡系統的示意圖。 圖4是根據本發明第三實施例的光學檢測系統的示意圖。 圖5是根據本發明第四實施例的光學檢測系統的示意圖。 Figure 1 is a schematic diagram of an optical detection system according to a first embodiment of the present invention. FIG. 2 is a schematic diagram of the laser light source device in FIG. 1 . Figure 3A is a schematic diagram of an optical detection system according to a second embodiment of the present invention. Figure 3B is a schematic diagram of an objective lens system in Figure 3A. Figure 4 is a schematic diagram of an optical detection system according to a third embodiment of the present invention. Figure 5 is a schematic diagram of an optical detection system according to a fourth embodiment of the present invention.
10:光學檢測系統 10: Optical detection system
110:雷射光源裝置 110:Laser light source device
140:分光鏡 140: Beam splitter
200:感測裝置 200: Sensing device
300:影像檢測裝置 300:Image detection device
L、R:雷射光 L, R: laser light
W:目標物 W: target
EO:照明光路 EO: lighting path
IO:成像光路 IO: imaging optical path
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TW201331568A (en) * | 2012-01-17 | 2013-08-01 | Univ Nat Taiwan Science Tech | Photoluminescence measuring system and measuring method thereof |
TW201710785A (en) * | 2015-08-19 | 2017-03-16 | 富士軟片股份有限公司 | Dye composition, fluorescence sensor, and production method for fluorescence sensor |
TW202009473A (en) * | 2018-08-20 | 2020-03-01 | 友達晶材股份有限公司 | Defect detecting equipment and defect detecting method |
CN212514276U (en) * | 2020-05-27 | 2021-02-09 | 苏州影睿光学科技有限公司 | Wide-spectrum fluorescence multi-channel real-time imaging system |
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TW201331568A (en) * | 2012-01-17 | 2013-08-01 | Univ Nat Taiwan Science Tech | Photoluminescence measuring system and measuring method thereof |
TW201710785A (en) * | 2015-08-19 | 2017-03-16 | 富士軟片股份有限公司 | Dye composition, fluorescence sensor, and production method for fluorescence sensor |
TW202009473A (en) * | 2018-08-20 | 2020-03-01 | 友達晶材股份有限公司 | Defect detecting equipment and defect detecting method |
CN212514276U (en) * | 2020-05-27 | 2021-02-09 | 苏州影睿光学科技有限公司 | Wide-spectrum fluorescence multi-channel real-time imaging system |
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