TWI801052B - 有機膜形成材料、以及圖案形成方法及聚合物 - Google Patents

有機膜形成材料、以及圖案形成方法及聚合物 Download PDF

Info

Publication number
TWI801052B
TWI801052B TW110148118A TW110148118A TWI801052B TW I801052 B TWI801052 B TW I801052B TW 110148118 A TW110148118 A TW 110148118A TW 110148118 A TW110148118 A TW 110148118A TW I801052 B TWI801052 B TW I801052B
Authority
TW
Taiwan
Prior art keywords
polymer
organic film
patterning process
forming organic
forming
Prior art date
Application number
TW110148118A
Other languages
English (en)
Other versions
TW202235477A (zh
Inventor
郡大佑
橘誠一郎
野中汐里
荻原勤
Original Assignee
日商信越化學工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商信越化學工業股份有限公司 filed Critical 日商信越化學工業股份有限公司
Publication of TW202235477A publication Critical patent/TW202235477A/zh
Application granted granted Critical
Publication of TWI801052B publication Critical patent/TWI801052B/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/11Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/094Multilayer resist systems, e.g. planarising layers
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F38/00Homopolymers and copolymers of compounds having one or more carbon-to-carbon triple bonds
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G61/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G61/02Macromolecular compounds containing only carbon atoms in the main chain of the macromolecule, e.g. polyxylylenes
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G61/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G61/12Macromolecular compounds containing atoms other than carbon in the main chain of the macromolecule
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G65/00Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule
    • C08G65/34Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from hydroxy compounds or their metallic derivatives
    • C08G65/38Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from hydroxy compounds or their metallic derivatives derived from phenols
    • C08G65/40Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from hydroxy compounds or their metallic derivatives derived from phenols from phenols (I) and other compounds (II), e.g. OH-Ar-OH + X-Ar-X, where X is halogen atom, i.e. leaving group
    • C08G65/4081Macromolecular compounds obtained by reactions forming an ether link in the main chain of the macromolecule from hydroxy compounds or their metallic derivatives derived from phenols from phenols (I) and other compounds (II), e.g. OH-Ar-OH + X-Ar-X, where X is halogen atom, i.e. leaving group forming cyclic polymers or oligomers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0045Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0384Macromolecular compounds which are rendered insoluble or differentially wettable with ethylenic or acetylenic bands in the main chain of the photopolymer
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/32Liquid compositions therefor, e.g. developers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/033Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
    • H01L21/0334Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
    • H01L21/0337Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/10Definition of the polymer structure
    • C08G2261/12Copolymers
    • C08G2261/124Copolymers alternating
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/10Definition of the polymer structure
    • C08G2261/14Side-groups
    • C08G2261/142Side-chains containing oxygen
    • C08G2261/1424Side-chains containing oxygen containing ether groups, including alkoxy
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/10Definition of the polymer structure
    • C08G2261/18Definition of the polymer structure conjugated
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/31Monomer units or repeat units incorporating structural elements in the main chain incorporating aromatic structural elements in the main chain
    • C08G2261/314Condensed aromatic systems, e.g. perylene, anthracene or pyrene
    • C08G2261/3142Condensed aromatic systems, e.g. perylene, anthracene or pyrene fluorene-based, e.g. fluorene, indenofluorene, or spirobifluorene
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08GMACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G2261/00Macromolecular compounds obtained by reactions forming a carbon-to-carbon link in the main chain of the macromolecule
    • C08G2261/30Monomer units or repeat units incorporating structural elements in the main chain
    • C08G2261/32Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain
    • C08G2261/324Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed
    • C08G2261/3242Monomer units or repeat units incorporating structural elements in the main chain incorporating heteroaromatic structural elements in the main chain condensed containing one or more oxygen atoms as the only heteroatom, e.g. benzofuran

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Structural Engineering (AREA)
  • Architecture (AREA)
  • Medicinal Chemistry (AREA)
  • Organic Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Inorganic Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Materials For Photolithography (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
TW110148118A 2020-12-25 2021-12-22 有機膜形成材料、以及圖案形成方法及聚合物 TWI801052B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020-217018 2020-12-25
JP2020217018A JP7401424B2 (ja) 2020-12-25 2020-12-25 有機膜形成材料、ならびにパターン形成方法および重合体

Publications (2)

Publication Number Publication Date
TW202235477A TW202235477A (zh) 2022-09-16
TWI801052B true TWI801052B (zh) 2023-05-01

Family

ID=79024346

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110148118A TWI801052B (zh) 2020-12-25 2021-12-22 有機膜形成材料、以及圖案形成方法及聚合物

Country Status (6)

Country Link
US (1) US20220214618A1 (zh)
EP (1) EP4020083A1 (zh)
JP (1) JP7401424B2 (zh)
KR (1) KR102678940B1 (zh)
CN (1) CN114690555A (zh)
TW (1) TWI801052B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7161451B2 (ja) * 2019-07-05 2022-10-26 信越化学工業株式会社 有機膜形成用組成物、半導体装置製造用基板、有機膜の形成方法、及びパターン形成方法
WO2024070728A1 (ja) * 2022-09-30 2024-04-04 Jsr株式会社 半導体基板の製造方法、組成物及び重合体

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201726642A (zh) * 2015-10-07 2017-08-01 Lg化學股份有限公司 新穎的化合物及含有其的有機發光元件
TW201942099A (zh) * 2018-03-28 2019-11-01 日商信越化學工業股份有限公司 化合物、有機膜形成用組成物、半導體裝置製造用基板、有機膜之形成方法及圖案形成方法
CN111913352A (zh) * 2019-05-08 2020-11-10 信越化学工业株式会社 有机膜形成用组成物、图案形成方法、以及聚合物

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2657740B2 (ja) 1992-10-08 1997-09-24 日本電信電話株式会社 ポジ型レジスト材料
JP3774668B2 (ja) 2001-02-07 2006-05-17 東京エレクトロン株式会社 シリコン窒化膜形成装置の洗浄前処理方法
JP3981825B2 (ja) 2002-12-24 2007-09-26 信越化学工業株式会社 パターン形成方法及び下層膜形成材料
US7094708B2 (en) 2003-01-24 2006-08-22 Tokyo Electron Limited Method of CVD for forming silicon nitride film on substrate
GB2424895B (en) * 2003-10-01 2008-07-09 Sumitomo Chemical Co Polymer light-emitting material and polymer light-emitting device
JP4355943B2 (ja) 2003-10-03 2009-11-04 信越化学工業株式会社 フォトレジスト下層膜形成材料及びパターン形成方法
JP4388429B2 (ja) 2004-02-04 2009-12-24 信越化学工業株式会社 レジスト下層膜材料ならびにパターン形成方法
JP4496432B2 (ja) 2005-02-18 2010-07-07 信越化学工業株式会社 フォトレジスト下層膜形成材料及びパターン形成方法
JP4662052B2 (ja) 2005-03-11 2011-03-30 信越化学工業株式会社 フォトレジスト下層膜形成材料及びパターン形成方法
JP4575214B2 (ja) 2005-04-04 2010-11-04 信越化学工業株式会社 レジスト下層膜材料およびパターン形成方法
JP4659678B2 (ja) 2005-12-27 2011-03-30 信越化学工業株式会社 フォトレジスト下層膜形成材料及びパターン形成方法
JP2008158002A (ja) 2006-12-20 2008-07-10 Jsr Corp レジスト下層膜用組成物及びその製造方法
JP4569786B2 (ja) 2008-05-01 2010-10-27 信越化学工業株式会社 新規光酸発生剤並びにこれを用いたレジスト材料及びパターン形成方法
JP5336306B2 (ja) 2008-10-20 2013-11-06 信越化学工業株式会社 レジスト下層膜形成方法、これを用いたパターン形成方法、及びレジスト下層膜材料
US8518305B2 (en) 2009-10-28 2013-08-27 Transitions Optical, Inc. Photochromic materials
WO2013047106A1 (ja) 2011-09-30 2013-04-04 三菱瓦斯化学株式会社 フルオレン構造を有する樹脂及びリソグラフィー用下層膜形成材料
JP5925721B2 (ja) 2012-05-08 2016-05-25 信越化学工業株式会社 有機膜材料、これを用いた有機膜形成方法及びパターン形成方法
JP7041358B2 (ja) 2016-06-03 2022-03-24 Jsr株式会社 膜形成用組成物、膜、レジスト下層膜の形成方法、パターニングされた基板の製造方法及び化合物
JP6726142B2 (ja) * 2017-08-28 2020-07-22 信越化学工業株式会社 有機膜形成用組成物、半導体装置製造用基板、有機膜の形成方法、パターン形成方法、及び重合体
JP7209588B2 (ja) * 2019-06-04 2023-01-20 信越化学工業株式会社 有機膜形成用組成物、パターン形成方法及び重合体
JP7472011B2 (ja) * 2020-12-25 2024-04-22 信越化学工業株式会社 有機膜形成材料、パターン形成方法ならびに化合物及び重合体

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201726642A (zh) * 2015-10-07 2017-08-01 Lg化學股份有限公司 新穎的化合物及含有其的有機發光元件
TW201942099A (zh) * 2018-03-28 2019-11-01 日商信越化學工業股份有限公司 化合物、有機膜形成用組成物、半導體裝置製造用基板、有機膜之形成方法及圖案形成方法
CN111913352A (zh) * 2019-05-08 2020-11-10 信越化学工业株式会社 有机膜形成用组成物、图案形成方法、以及聚合物

Also Published As

Publication number Publication date
CN114690555A (zh) 2022-07-01
KR102678940B1 (ko) 2024-06-26
JP7401424B2 (ja) 2023-12-19
JP2022102339A (ja) 2022-07-07
EP4020083A1 (en) 2022-06-29
KR20220092803A (ko) 2022-07-04
TW202235477A (zh) 2022-09-16
US20220214618A1 (en) 2022-07-07

Similar Documents

Publication Publication Date Title
TWI801052B (zh) 有機膜形成材料、以及圖案形成方法及聚合物
EP3973055A4 (en) COMPOSITE MATERIAL AND METHOD OF MANUFACTURE THEREOF
EP4155298A4 (en) ORGANIC ELECTROLUMINESCENT MATERIAL, ELECTRONIC ELEMENT AND ELECTRONIC DEVICE
WO2011094204A3 (en) Methods of fabricating large-area, semiconducting nanoperforated graphene materials
EP3812147A4 (en) LIQUID-REPELLENT STRUCTURE, MANUFACTURING PROCESS FOR IT, PACKAGING MATERIAL AND RELEASE FILM
EP3521327A4 (en) MODIFIED VINYL ALCOHOL POLYMER POWDER WITH REDUCED METHANOL CONTENT AND PRODUCTION METHOD FOR IT AND WATER-SOLUBLE FILM AND PACKING MATERIAL
EP4095091A4 (en) BLACK MATERIAL AND METHOD FOR PRODUCING THEREOF, BLACK LIGHT-SENSITIVE COMPOSITION AND METHOD FOR PRODUCING THEREOF, BLACK PATTERNING FILM AND METHOD FOR PRODUCING THEREOF
EP3745484A4 (en) ORGANIC SEMICONDUCTOR ELEMENT, ORGANIC SEMICONDUCTOR COMPOSITION, ORGANIC SEMICONDUCTOR FILM, METHOD FOR PRODUCING AN ORGANIC SEMICONDUCTOR FILM, AND POLYMER USED THEREFORE
EP3950326A4 (en) TRANSPARENT RESIN FILM, DECORATIVE MATERIAL AND METHOD FOR PRODUCTION OF DECORATIVE MATERIAL
EP4013255A4 (en) METHOD, SYSTEMS AND ARTICLES FOR PRODUCING A FILM PATTERN ON A SUBSTRATE MATERIAL
EP3995491A4 (en) COMPOUND, POLYMER, ORGANIC MATERIAL, AND OPTICAL DEVICE, OPTICAL COMPONENT AND IMAGE DISPLAY DEVICE ALL INCLUDING SUCH ORGANIC MATERIAL
EP3712201A4 (en) FILM, SHAPE TRANSFER FILM MADE FROM IT, FILM ROLL AND METHOD FOR MANUFACTURING THE FILM
EP4279166A4 (en) ORGANIC LIQUID MATERIAL DEHYDRATION PROCESS
EP3750698A4 (en) REPAIR PLASTER, REPAIR PLASTER MOLDING PROCEDURE AND REPAIR PROCEDURE FOR COMPOSITE MATERIAL
EP4083669A4 (en) OPTICAL POLYMER MATERIAL, OPTICAL FILM, DISPLAY DEVICE, PRODUCTION PROCESS FOR OPTICAL POLYMER MATERIAL AND PRODUCTION PROCESS FOR OPTICAL FILM
EP3744769A3 (en) Film and production method
EP3901183A4 (en) POLYMER, POLYMER PRODUCTION METHOD AND FILM PRODUCTION METHOD
EP3919532A4 (en) MODIFIED CONJUGATED DIEN-BASED POLYMER, METHOD OF MANUFACTURE THEREOF AND RUBBER COMPOSITION THEREOF
EP3851465A4 (en) SERVICE-BASED MODIFIED CONJUGATED POLYMER, METHOD OF MANUFACTURING THEREOF, AND RUBBER COMPOSITION THEREOF
EP3408876A4 (en) TRANSISTOR WITH ORGANIC THIN LAYER AND MANUFACTURING METHOD THEREFOR
EP3498764A4 (en) TREATMENT PROCESS FOR SHEET OF BASE MATERIAL, PRODUCTION PROCESS FOR SHEET OF MODIFIED BASE MATERIAL, BASE MATERIAL INCLUDING GRAFT POLYMER CHAIN AND ION EXCHANGE MEMBRANE
EP3693793A4 (en) RESIN MATERIAL FOR FORMING AN UNDERLAYER FILM, RESERVE UNDERLAYMENT FILM, PROCESS FOR THE PRODUCTION OF RESERVE UNDERLAYMENT FILM AND LAYER PRODUCT
EP4223499A4 (en) CONDUCTIVE FOIL TRANSFER FILM, PRODUCTION PROCESS FOR CONDUCTIVE FOIL TRANSFER FILM, CONDUCTIVE ARTICLE, PRODUCTION PROCESS FOR CONDUCTIVE ARTICLE AND CONDUCTIVE FILM
EP4112596A4 (en) FLUORENE DERIVATIVE AND METHOD FOR PRODUCTION AND USE THEREOF
EP4181214A4 (en) THIN FILM TRANSISTOR, THIN FILM TRANSISTOR ARRANGEMENT AND THIN FILM TRANSISTOR MANUFACTURING METHOD