TWI727902B - Gas-liquid separation and stratification independent recovery device - Google Patents

Gas-liquid separation and stratification independent recovery device Download PDF

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TWI727902B
TWI727902B TW109136292A TW109136292A TWI727902B TW I727902 B TWI727902 B TW I727902B TW 109136292 A TW109136292 A TW 109136292A TW 109136292 A TW109136292 A TW 109136292A TW I727902 B TWI727902 B TW I727902B
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ring wall
liquid
main ring
gas
layer
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TW202216271A (en
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徐慶吉
姜建國
唐肇蔚
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凱爾迪科技股份有限公司
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本創作係氣液分離分層獨立回收裝置,其包含一固定內層、複數夾層、一移動外層、及一升降機構。固定內層、夾層、移動外層依序套設且藉由能升降機構相對於彼此上下移動。各層之間形成有獨立的氣體空間與盛液環槽,當每層相對於前一層向上移動時開啟對應的氣體空間與盛液環槽,並以獨立的液體管路與氣體管路分別連接盛液環槽與氣體空間。藉此,本創作可以透過升降機構升降各層,來分別進行不同液體藥劑的蝕刻反應且分別回收該液體藥劑以及反應後的化學氣體與化學液體,因此能有效降低後續處理的負擔,也能避免產生有毒物質或者進一步造成汙染。This creation is a gas-liquid separation layered independent recovery device, which includes a fixed inner layer, a plurality of interlayers, a moving outer layer, and a lifting mechanism. The fixed inner layer, the interlayer, and the movable outer layer are sequentially nested and moved up and down relative to each other by the lifting mechanism. An independent gas space and liquid-containing ring groove are formed between each layer. When each layer moves upward relative to the previous layer, the corresponding gas space and liquid-containing ring groove are opened, and independent liquid pipes and gas pipes are connected to the grooves. Liquid ring groove and gas space. In this way, the invention can lift each layer through the lifting mechanism to perform the etching reaction of different liquid medicines and separately recover the liquid medicine and the reacted chemical gases and chemical liquids. Therefore, the burden of subsequent processing can be effectively reduced, and the production can also be avoided. Toxic substances or further pollution.

Description

氣液分離分層獨立回收裝置Gas-liquid separation and stratification independent recovery device

本創作係涉及一種半導體加工設備,尤指一種用於回收加工時已使用過的各種液體以及因加工所產生的各種氣體的裝置。This creation relates to a semiconductor processing equipment, especially a device used to recover various liquids that have been used in processing and various gases produced by processing.

半導體製程中常以液體藥劑對晶圓基板進行蝕刻。當液體藥劑接觸到晶圓基板時,液體藥劑會與晶圓基板表面的材質進行化學反應,藉以製成所需之半成品;反應後,經過反應的液體藥劑以及反應過程中產生的化學氣體與化學液體會經由管路回收處理。並且,一片晶圓基板有時需要以多種不同的液體藥劑進行蝕刻。In the semiconductor manufacturing process, liquid agents are often used to etch wafer substrates. When the liquid medicine contacts the wafer substrate, the liquid medicine chemically reacts with the material on the surface of the wafer substrate to produce the required semi-finished products; after the reaction, the reacted liquid medicine and the chemical gases and chemistry generated during the reaction The liquid will be recycled through the pipeline. In addition, a wafer substrate sometimes needs to be etched with a variety of different liquid agents.

然而,在現有技術中,用以回收經過反應的液體藥劑以及反應過程中產生的化學氣體與化學液體的管路僅有一條,也就是說所有不同的液體藥劑在蝕刻後皆係以同一管路進行回收處理。這樣一來,所有化學氣體與化學液體一併回收不僅會造成後續處理的負擔,也可能在回收的過程中導致不同種類的化學液體或化學氣體混合,進而產生有毒物質或者進一步造成汙染。However, in the prior art, there is only one pipeline for recovering the reacted liquid medicine and the chemical gas and chemical liquid generated during the reaction, that is to say, all different liquid medicines are etched in the same pipeline. For recycling. In this way, the recovery of all chemical gases and chemical liquids will not only cause the burden of subsequent processing, but also may cause different types of chemical liquids or chemical gases to mix during the recovery process, thereby producing toxic substances or further pollution.

因此,現有技術中回收反應後的液體及氣體的方式確實有待改良。Therefore, the method of recovering the reacted liquid and gas in the prior art really needs to be improved.

有鑑於前述之現有技術的缺點及不足,本創作提供一種氣液分離分層獨立回收裝置,其能分別回收不同的化學液體,且能將氣體與液體分別回收,因此能有效降低後續處理的負擔,也能避免產生有毒物質或者進一步造成汙染。In view of the aforementioned shortcomings and deficiencies of the prior art, this invention provides a gas-liquid separation and stratified independent recovery device, which can recover different chemical liquids, and can recover gas and liquid separately, so it can effectively reduce the burden of subsequent processing , It can also avoid the production of toxic substances or further pollution.

為達到上述的創作目的,本創作所採用的技術手段為設計一種氣液分離分層獨立回收裝置,其中包含: 一基板; 一固定內層,其包含 一內層主環壁,其底緣固設於該基板; 一內層盛液環壁,其位於該內層主環壁的徑向外側,並與該內層主環壁之間形成一第一盛液環槽; 一內層液體管路,其貫穿該基板且連通於該內層主環壁內側; 一內層氣體管路,其貫穿該基板且連通於該內層主環壁內側,且該內層氣體管路的頂端開口高於該內層液體管路的頂端開口; 一第一夾層,其包含 一第一主環壁,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側;該第一主環壁與該內層主環壁之間形成一第一氣體空間,且該第一主環壁的頂緣選擇性的密合於該內層主環壁的頂緣,藉此封閉該第一氣體空間; 一第一環擋板,其形成於該第一主環壁的內側面,且朝向該第一主環壁的徑向內側向下傾斜延伸至該第一環擋板的內緣位於該第一盛液環槽上方; 一第一盛液環壁,其位於該第一主環壁的徑向外側,並與該第一主環壁之間形成一第二盛液環槽; 一第一液體管路,其貫穿該基板且連通於該第一盛液環槽的底部; 一第二夾層,其包含 一第二主環壁,其能相對於該第一夾層上下移動地設於該第一盛液環壁的徑向外側;該第二主環壁與該第一主環壁之間形成一第二氣體空間,且該第二主環壁的頂緣選擇性的密合於該第一主環壁的頂緣,藉此封閉該第二氣體空間; 一第二環擋板,其形成於該第二主環壁的內側面,且朝向該第二主環壁的徑向內側向下傾斜延伸至該第二環擋板的內緣位於該第二盛液環槽上方; 一第二盛液環壁,其位於該第二主環壁的徑向外側,並與該第二主環壁之間形成一外層盛液環槽; 一第二液體管路,其能移動地貫穿該基板且連通於該第二盛液環槽的底部; 一移動外層,其包含 一外層主環壁,其能相對於該第二夾層上下移動地設於該第二盛液環壁的徑向外側;該外層主環壁與該第二主環壁之間形成一外層氣體空間,且該外層主環壁的頂緣選擇性的密合於該第二主環壁的頂緣,藉此封閉該外層氣體空間; 一外層環擋板,其形成於該外層主環壁的內側面,且朝向該外層主環壁的徑向內側向下傾斜延伸至該外層環擋板的內緣位於該外層盛液環槽上方; 一外層液體管路,其能移動地貫穿該基板且連通於該外層盛液環槽的底部; 一氣體環壁,其底緣固設於該基板,且頂緣能相對滑動地密合於該外層主環壁的外側面;該氣體環壁與該內層主環壁之間形成一共同氣體空間,該第一夾層、該第二夾層、及該移動外層能移動地設於該共同氣體空間內,且該第一氣體空間、該第二氣體空間、及該外層氣體空間連通該共同氣體空間; 一共同氣體管路,其連通於該共同氣體空間; 一抽氣泵浦,其連通於該內層氣體管路及該共同氣體管路; 一升降機構,其連接於該第一夾層、該第二夾層、及該移動外層,且能分別控制該第一夾層、該第二夾層、及該移動外層上下移動。 In order to achieve the above creative goals, the technical means used in this creation is to design a gas-liquid separation layered independent recovery device, which includes: A substrate; A fixed inner layer, which contains An inner main ring wall, the bottom edge of which is fixed on the base plate; An inner liquid-containing ring wall, which is located on the radially outer side of the inner main ring wall and forms a first liquid-containing ring groove with the inner main ring wall; An inner liquid pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall; An inner gas pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall, and the top opening of the inner gas pipeline is higher than the top opening of the inner liquid pipeline; A first interlayer, which contains A first main ring wall, which can move up and down relative to the fixed inner layer and is arranged on the radially outer side of the inner liquid-containing ring wall; a first main ring wall and the inner main ring wall form a A gas space, and the top edge of the first main ring wall is selectively close to the top edge of the inner main ring wall, thereby closing the first gas space; A first ring baffle formed on the inner side surface of the first main ring wall, and extending obliquely downward toward the radial inner side of the first main ring wall until the inner edge of the first ring baffle is located at the first Above the liquid ring groove; A first liquid-containing ring wall, which is located on the radially outer side of the first main ring wall and forms a second liquid-containing ring groove with the first main ring wall; A first liquid pipeline that penetrates the substrate and communicates with the bottom of the first liquid-containing ring groove; A second interlayer, which contains A second main ring wall, which can move up and down relative to the first interlayer and is disposed on the radially outer side of the first liquid-containing ring wall; a second main ring wall is formed between the second main ring wall and the first main ring wall. Two gas spaces, and the top edge of the second main ring wall is selectively tightly attached to the top edge of the first main ring wall, thereby closing the second gas space; A second ring baffle is formed on the inner side of the second main ring wall and extends downwardly and obliquely toward the radial inner side of the second main ring wall until the inner edge of the second ring baffle is located at the second Above the liquid ring groove; A second liquid-containing ring wall, which is located on the radially outer side of the second main ring wall and forms an outer liquid-containing ring groove with the second main ring wall; A second liquid pipeline which movably penetrates the substrate and communicates with the bottom of the second liquid-containing ring groove; A mobile outer layer, which contains An outer main ring wall, which is arranged on the radially outer side of the second liquid-containing ring wall so as to move up and down relative to the second interlayer; an outer gas space is formed between the outer main ring wall and the second main ring wall , And the top edge of the outer main ring wall is selectively tightly attached to the top edge of the second main ring wall, thereby closing the outer gas space; An outer layer ring baffle formed on the inner side of the outer layer main ring wall and extending obliquely downward toward the radial inner side of the outer layer main ring wall until the inner edge of the outer layer ring baffle is located above the outer layer liquid ring groove ; An outer layer liquid pipeline that movably penetrates the substrate and is connected to the bottom of the outer layer liquid-containing ring groove; A gas ring wall, the bottom edge of which is fixed on the substrate, and the top edge is relatively slidably close to the outer surface of the outer main ring wall; a common gas is formed between the gas ring wall and the inner main ring wall The first interlayer, the second interlayer, and the mobile outer layer are movably arranged in the common gas space, and the first gas space, the second gas space, and the outer gas space are connected to the common gas space ; A common gas pipeline connected to the common gas space; An air pump, which is connected to the inner gas pipeline and the common gas pipeline; A lifting mechanism is connected to the first interlayer, the second interlayer, and the mobile outer layer, and can respectively control the first interlayer, the second interlayer, and the mobile outer layer to move up and down.

為達到上述的創作目的,本創作所採用的技術手段為設計一種氣液分離分層獨立回收裝置,其中包含: 一基板; 一固定內層,其包含 一內層主環壁,其底緣固設於該基板; 一內層盛液環壁,其底緣固設於該基板,且位於該內層主環壁的徑向外側,並與該內層主環壁之間形成一外層盛液環槽; 一內層液體管路,其貫穿該基板且連通於該內層主環壁內側; 一內層氣體管路,其貫穿該基板且連通於該內層主環壁內側,且該內層氣體管路的頂端開口高於該內層液體管路的頂端開口; 一移動外層,其包含 一外層主環壁,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側;該外層主環壁與該內層主環壁之間形成一外層氣體空間,且該外層主環壁的頂緣選擇性的密合於該內層主環壁的頂緣,藉此封閉該外層氣體空間; 一外層環擋板,其形成於該外層主環壁的內側面,且朝向該外層主環壁的徑內側向下傾斜延伸至該外層環擋板的內緣位於該外層盛液環槽上方; 一外層液體管路,其貫穿該基板且連通於該外層盛液環槽的底部; 一氣體環壁,其底緣固設於該基板,且頂緣能相對滑動地密合於該外層主環壁的外側面;該氣體環壁與該內層主環壁之間形成一共同氣體空間,該移動外層能移動地設於該共同氣體空間內,且該外層氣體空間連通該共同氣體空間; 一共同氣體管路,其連通於該共同氣體空間; 一抽氣泵浦,其連通於該內層氣體管路及該共同氣體管路; 一升降機構,其連接於該移動外層,且能控制該移動外層上下移動。 In order to achieve the above creative goals, the technical means used in this creation is to design a gas-liquid separation layered independent recovery device, which includes: A substrate; A fixed inner layer, which contains An inner main ring wall, the bottom edge of which is fixed on the base plate; An inner liquid-containing ring wall, the bottom edge of which is fixed on the substrate and located at the radially outer side of the inner main ring wall, and an outer liquid-containing ring groove is formed between the inner main ring wall and the inner main ring wall; An inner liquid pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall; An inner gas pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall, and the top opening of the inner gas pipeline is higher than the top opening of the inner liquid pipeline; A mobile outer layer, which contains An outer main ring wall, which can move up and down with respect to the fixed inner layer and is disposed on the radially outer side of the inner liquid-containing ring wall; an outer gas space is formed between the outer main ring wall and the inner main ring wall , And the top edge of the outer main ring wall selectively adheres to the top edge of the inner main ring wall, thereby closing the outer gas space; An outer layer ring baffle formed on the inner side of the outer layer main ring wall and extending obliquely downward toward the radial inner side of the outer layer main ring wall until the inner edge of the outer layer ring baffle is located above the outer layer liquid ring groove; An outer layer liquid pipeline which penetrates the substrate and communicates with the bottom of the outer layer liquid-containing ring groove; A gas ring wall, the bottom edge of which is fixed on the substrate, and the top edge is relatively slidably close to the outer surface of the outer main ring wall; a common gas is formed between the gas ring wall and the inner main ring wall Space, the mobile outer layer is movably arranged in the common gas space, and the outer gas space is connected to the common gas space; A common gas pipeline connected to the common gas space; An air pump, which is connected to the inner gas pipeline and the common gas pipeline; A lifting mechanism is connected to the moving outer layer and can control the moving outer layer to move up and down.

本創作的優點在於,藉由內層液體管路與內層氣體管路貫穿基板且連通於內層主環壁內側,並且內層氣體管路的頂端開口高於內層液體管路的頂端開口,於是當晶圓基板位於內層主環壁內側進行蝕刻時,反應過後的化學液體可以經由內層液體管路流向處理系統,而反應過後的化學氣體可以經由內層氣體管路被抽走,且因為內層氣體管路的開口較高故反應過後的化學液體不會流入內層氣體管路。The advantage of this creation is that the inner liquid pipeline and the inner gas pipeline penetrate the substrate and communicate with the inner side of the inner main ring wall, and the top opening of the inner gas pipeline is higher than the top opening of the inner liquid pipeline , So when the wafer substrate is located inside the inner main ring wall for etching, the reacted chemical liquid can flow to the processing system through the inner liquid pipeline, and the reacted chemical gas can be pumped away through the inner gas pipeline. And because the inner gas pipeline has a higher opening, the reacted chemical liquid will not flow into the inner gas pipeline.

並且,藉由外層主環壁能移動地設於內層主環壁的徑向外側、外層環擋板形成於外層主環壁的內側面且向內向下延伸至外層環擋板的內緣位於外層盛液環槽上方、以及外層液體管路貫穿基板且連通於外層盛液環槽的底部,於是當外層主環壁相對於內層主環壁向上移動,且晶圓基板位於外層主環壁的頂緣以及內層主環壁的頂緣之間進行蝕刻時,反應過後的化學液體會被甩至外層氣體空間內,且沿著內層主環壁的外側面流至外層盛液環槽內,或者沿著外層主環壁的內側面流至外層環擋板並由外層環擋板的內緣滴入外層盛液環槽內,再被外層液體管路回收,因此不會流至內層液體管路內與其他化學液體混合回收;而反應過後的化學氣體能夠經由外層氣體空間繞過外層環擋板與內層盛液環壁的頂緣流動至共同氣體空間內,最後被抽氣泵浦經由共同氣體管路抽走回收。In addition, the outer main ring wall is movably arranged on the radially outer side of the inner main ring wall, and the outer ring baffle is formed on the inner side of the outer main ring wall and extends inward and downward until the inner edge of the outer ring baffle is located at Above the outer liquid ring groove and the outer liquid pipeline pass through the substrate and communicate with the bottom of the outer liquid ring groove, so when the outer main ring wall moves upward relative to the inner main ring wall, and the wafer substrate is located on the outer main ring wall When etching is performed between the top edge of the inner main ring wall and the top edge of the inner main ring wall, the reacted chemical liquid will be thrown into the outer gas space and flow along the outer side of the inner main ring wall to the outer liquid-containing ring groove Or flow along the inner side of the outer main ring wall to the outer ring baffle and drip from the inner edge of the outer ring baffle into the outer liquid-containing ring groove, and then be recovered by the outer liquid pipeline, so it will not flow to the inner The liquid pipeline in the layer is mixed with other chemical liquids for recovery; and the reacted chemical gas can flow through the outer gas space to bypass the outer ring baffle and the top edge of the inner liquid-containing ring wall to flow into the common gas space, and finally be evacuated The pump is pumped and recovered through the common gas pipeline.

藉此,本創作可以透過升降機構升降移動外層以及調整晶圓基板進行蝕刻的位置,來分別進行不同液體藥劑的蝕刻反應且同時分別回收該液體藥劑以及反應後的化學氣體與化學液體,因此能有效降低後續處理的負擔,也能避免產生有毒物質或者進一步造成汙染。In this way, this creation can move the outer layer up and down through the lifting mechanism and adjust the etching position of the wafer substrate to perform the etching reaction of different liquid medicines and at the same time to recover the liquid medicine and the reacted chemical gas and chemical liquid respectively, so it can It can effectively reduce the burden of subsequent processing, and can also avoid the production of toxic substances or further pollution.

並且,透過在固定內層與移動外層之間增設一個或多個夾層,且使各夾層以與前述固定內層與移動外層相同的配合方式設置,即層層依序能移動地套設且每一層的環擋板與液體管路對應於形成於前一層上的盛液環槽,並連接至升降機構以分別控制升降,如此一來便能進一步增加本創作所能回收的不同液體藥劑的數量,以符合實際使用需求。Moreover, by adding one or more interlayers between the fixed inner layer and the mobile outer layer, and each interlayer is arranged in the same manner as the aforementioned fixed inner layer and the mobile outer layer, that is, the layers are sequentially movable and nested. The ring baffle and liquid pipeline on the first floor correspond to the liquid-containing ring groove formed on the previous floor, and are connected to the lifting mechanism to control the lifting respectively, so that the number of different liquid medicines that can be recovered by this creation can be further increased , In order to meet the actual use requirements.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該固定內層的該內層主環壁包含一內層本體段,其底緣固設於該基板;一內層傾斜段,其形成於該內層本體段的頂緣,且朝向該內層主環壁的徑向內側向上傾斜延伸;該第一夾層的該第一主環壁包含一第一本體段,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側;一第一傾斜段,其形成於該第一主環壁的頂緣,且朝向該第一主環壁的徑向內側向上傾斜延伸;該第一傾斜段的末端藉由該第一本體段的上下移動而選擇性地密合於該內層傾斜段的末端,藉此封閉該第一氣體空間。Further, in the gas-liquid separation layered independent recovery device, wherein the inner main ring wall of the fixed inner layer includes an inner body section, the bottom edge of which is fixed on the substrate; and an inner inclined section , Which is formed on the top edge of the inner body section and extends upward obliquely toward the radially inner side of the inner main ring wall; the first main ring wall of the first interlayer includes a first body section that can be opposed to The fixed inner layer is arranged on the radially outer side of the inner liquid-containing ring wall to move up and down; a first inclined section is formed on the top edge of the first main ring wall and faces the first main ring wall The radially inner side extends obliquely upward; the end of the first oblique section is selectively tightly attached to the end of the inner oblique section by the up and down movement of the first body section, thereby closing the first gas space.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該第一夾層的該第一主環壁進一步包含一第一密封段,其形成於該第一傾斜段的末端,且向下延伸;該第一密封段藉由該第一本體段的上下移動而選擇性地以該第一密封段的徑向外側面抵靠密合於該內層傾斜段的末端,藉此封閉該第一氣體空間。Further, in the gas-liquid separation layered independent recovery device, wherein the first main ring wall of the first interlayer further includes a first sealing section formed at the end of the first inclined section and facing Extend downward; the first sealing section is selectively pressed against the end of the inner inclined section with the radially outer side surface of the first sealing section by the up and down movement of the first body section, thereby closing the The first gas space.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該固定內層進一步包含一內層底板,其傾斜設於該內層主環壁的徑向內側;該內層底板的底端形成有一液體穿孔;該內層液體管路的頂端抵靠於該內層底板的底面,且該內層液體管路的頂端開口連通於該液體穿孔;該內層氣體管路貫穿該內層底板,且該內層氣體管路的頂端開口突出於該內層底板的頂面。Furthermore, in the gas-liquid separation layered independent recovery device, the fixed inner layer further comprises an inner bottom plate, which is obliquely arranged on the radially inner side of the inner main ring wall; the bottom of the inner bottom plate A liquid perforation is formed at the end; the top end of the inner liquid pipeline abuts against the bottom surface of the inner bottom plate, and the top opening of the inner liquid pipeline communicates with the liquid perforation; the inner gas pipeline penetrates the inner layer The bottom plate, and the top opening of the inner layer gas pipeline protrudes from the top surface of the inner layer bottom plate.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該固定內層進一步包含一內層環擋板,其形成於該內層主環壁的內側面,且朝向該內層主環壁的徑向內側向下傾斜延伸;在該內層主環壁的徑向方向上,該內層環擋板的內緣位於該內層氣體管路的頂端開口的內側。Furthermore, in the gas-liquid separation layered independent recovery device, the fixed inner layer further includes an inner ring baffle formed on the inner side of the inner main ring wall and facing the inner main ring The radial inner side of the ring wall extends obliquely downward; in the radial direction of the inner main ring wall, the inner edge of the inner ring baffle is located inside the top opening of the inner gas pipeline.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該固定內層進一步包含一內層延伸環板,其形成於該內層環擋板的內緣,且向下延伸;該內層延伸環板的底緣的高度位置低於該內層氣體管路的頂端開口的高度位置。Furthermore, in the gas-liquid separation layered independent recovery device, wherein the fixed inner layer further includes an inner layer extending ring plate formed on the inner edge of the inner layer ring baffle plate and extending downward; the The height position of the bottom edge of the inner layer extension ring plate is lower than the height position of the top opening of the inner layer gas pipeline.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該第一夾層進一步包含一第一延伸環板,其形成於該第一環擋板的內緣且向下延伸,該第一延伸環板的底緣的高度位置低於該內層盛液環壁的頂緣的高度位置。Furthermore, in the gas-liquid separation and stratified independent recovery device, the first interlayer further includes a first extending ring plate formed on the inner edge of the first ring baffle plate and extending downwards. The height position of the bottom edge of an extended ring plate is lower than the height position of the top edge of the inner liquid-containing ring wall.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該升降機構包含一第一頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該第一主環壁的底緣;一第二頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該第二主環壁的底緣;一外層頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該外層主環壁的底緣;一頂昇滑座,其能移動地設於該第一頂昇滑桿、該第二頂昇滑桿、及該外層頂昇滑桿的下方;一橫向驅動裝置,其能橫向移動該頂昇滑座,藉此選擇性地使該頂昇滑座抵靠於該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿的底端;一升降驅動裝置,其能向上推頂該頂昇滑座,藉此使該頂昇滑座向上推頂該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿,並藉由該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿向上推頂該第一主環壁、該第二主環壁、或該外層主環壁。Furthermore, in the gas-liquid separation and stratified independent recovery device, wherein the lifting mechanism includes a first lifting slide bar, which can move up and down through the substrate and abuts against the first main ring wall Bottom edge; a second lifting slide bar, which can move up and down through the base plate, and abuts against the bottom edge of the second main ring wall; an outer layer lifting slide bar, which can move up and down through the base plate, And abuts against the bottom edge of the outer main ring wall; a jacking slide seat, which is movably arranged under the first jacking slide bar, the second jacking slide bar, and the outer jacking slide bar A lateral drive device, which can move the jacking slide laterally, thereby selectively making the jacking slide abut the first jacking slide bar, the second jacking slide bar, or the outer top The bottom end of the lifting slide bar; a lifting drive device that can push the jacking slide upwards, thereby causing the jacking slide to push upwards the first jacking slide bar, the second jacking slide bar, Or the outer layer jacking slide bar, and the first main ring wall and the second main ring wall are pushed upward by the first jacking slide bar, the second jacking slide bar, or the outer jacking slide bar , Or the outer main ring wall.

進一步而言,所述之氣液分離分層獨立回收裝置,其中,該第一夾層的該第一盛液環壁的底緣固設於該第一主環壁的底緣,且該第一盛液環壁隨著該第一主環壁移動。Furthermore, in the gas-liquid separation and stratified independent recovery device, wherein the bottom edge of the first liquid-containing ring wall of the first interlayer is fixed to the bottom edge of the first main ring wall, and the first The liquid-containing ring wall moves with the first main ring wall.

以下配合圖式及本創作之較佳實施例,進一步闡述本創作為達成預定創作目的所採取的技術手段。In the following, in conjunction with the drawings and preferred embodiments of this creation, the technical means adopted by this creation to achieve the predetermined creation purpose are further explained.

請參考圖1、圖2、及圖7,本創作之氣液分離分層獨立回收裝置在本實施例中包含一基板10、一固定內層20、一第一夾層30、一第二夾層40、一移動外層50、一氣體環壁61、一共同氣體管路62、一抽氣泵浦(圖中未示)、及一升降機構70。Please refer to Figure 1, Figure 2, and Figure 7. The gas-liquid separation layered independent recovery device of this invention includes a substrate 10, a fixed inner layer 20, a first interlayer 30, and a second interlayer 40 in this embodiment. , A moving outer layer 50, a gas ring wall 61, a common gas pipeline 62, a suction pump (not shown in the figure), and a lifting mechanism 70.

請進一步參考圖4、圖5、及圖6,固定內層20包含一內層主環壁21、一內層底板22、一內層液體管路23、一內層氣體管路24、一內層環擋板25、一內層延伸環板26、及一內層盛液環壁27。4, 5, and 6, the fixed inner layer 20 includes an inner main ring wall 21, an inner bottom plate 22, an inner liquid pipeline 23, an inner gas pipeline 24, and an inner The layer ring baffle 25, an inner layer extension ring plate 26, and an inner layer liquid-containing ring wall 27.

內層主環壁21底緣固設於基板10。具體來說,內層主環壁21在本實施例中包含一內層本體段211及一內層傾斜段212。內層本體段211底緣固設於基板10,且可以是垂直於基板10直立向上延伸。內層傾斜段212形成於內層本體段211的頂緣,且朝向內層主環壁21的徑向內側向上傾斜延伸。內層傾斜段212能使內層主環壁21更接近加工中的晶圓基板10,更便於承接液體且能便於液體流動,但在其他實施例中不一定要有內層傾斜段212。The bottom edge of the inner main ring wall 21 is fixed to the substrate 10. Specifically, the inner main ring wall 21 includes an inner body section 211 and an inner inclined section 212 in this embodiment. The bottom edge of the inner body section 211 is fixed to the substrate 10 and may extend upright perpendicular to the substrate 10. The inner inclined section 212 is formed at the top edge of the inner main body section 211 and extends upward and inclined toward the radial inner side of the inner main ring wall 21. The inner inclined section 212 enables the inner main ring wall 21 to be closer to the wafer substrate 10 being processed, which is more convenient for receiving liquid and facilitating liquid flow. However, in other embodiments, the inner inclined section 212 is not necessary.

內層底板22傾斜設於內層主環壁21的徑向內側,且內層底板22的底端(即傾斜的最低處)形成有一液體穿孔221。內層液體管路23貫穿基板10且連通於內層主環壁21內側。具體來說,在本實施例中內層液體管路23的頂端抵靠於內層底板22的底面,且內層液體管路23的頂端開口連通於液體穿孔221。內層氣體管路24貫穿基板10且連通於內層主環壁21內側。具體來說,在本實施例中內層氣體管路24貫穿內層底板22,且內層氣體管路24的頂端開口突出於內層底板22的頂面,也就是說內層氣體管路24貫穿內層底板22後其頂端持續向上延伸有一距離,使得位於頂端的開口不會鄰接於內層底板22,藉此當液體沿著內層底板22由高處往低處流動時,液體不會流入內層氣體管路24內。The inner bottom plate 22 is obliquely arranged on the radial inner side of the inner main ring wall 21, and a liquid perforation 221 is formed at the bottom end (ie, the lowest part of the slope) of the inner bottom plate 22. The inner liquid pipeline 23 penetrates the substrate 10 and communicates with the inner side of the inner main ring wall 21. Specifically, in this embodiment, the top end of the inner liquid pipe 23 abuts against the bottom surface of the inner bottom plate 22, and the top opening of the inner liquid pipe 23 is connected to the liquid perforation 221. The inner gas pipeline 24 penetrates the substrate 10 and communicates with the inner side of the inner main ring wall 21. Specifically, in this embodiment, the inner layer gas pipeline 24 penetrates the inner layer bottom plate 22, and the top opening of the inner layer gas pipeline 24 protrudes from the top surface of the inner layer bottom plate 22, that is to say, the inner layer gas pipeline 24 After passing through the inner bottom plate 22, the top end of the inner bottom plate 22 continues to extend upward for a distance, so that the opening at the top does not adjoin the inner bottom plate 22, so that when the liquid flows along the inner bottom plate 22 from high to low, the liquid will It flows into the inner gas pipeline 24.

上述內層底板22與內層液體管路23及內層氣體管路24相關的相對配合關係能夠有利於液體流動並便於回收液體,且能避免液體沿著內層底板22流入內層氣體管路24中,但在其他實施例中則不一定需要有內層底板22,只需要內層液體管路23及內層氣體管路24貫穿基板10且連通於內層主環壁21內側,且內層氣體管路24的頂端開口高於內層液體管路23的頂端開口即可。The above-mentioned relative matching relationship between the inner bottom plate 22 and the inner liquid pipeline 23 and the inner gas pipeline 24 can facilitate the flow of liquid and facilitate the recovery of liquid, and can prevent the liquid from flowing into the inner gas pipeline along the inner bottom plate 22 24, but in other embodiments, the inner bottom plate 22 is not necessarily required, only the inner liquid pipeline 23 and the inner gas pipeline 24 pass through the substrate 10 and are connected to the inner side of the inner main ring wall 21, and the inner The top opening of the layer gas pipeline 24 may be higher than the top opening of the inner layer liquid pipeline 23.

內層環擋板25形成於內層主環壁21的內側面,且朝向內層主環壁21的徑向內側向下傾斜延伸。在內層主環壁21的徑向方向上,內層環擋板25的內緣位於內層氣體管路24的頂端開口的內側。藉此當晶圓基板10位於內層環擋板25上進行蝕刻時,液體可以被甩至內層主環壁21的內側面且沿著內層環擋板25流動至由內層環擋板25的內緣向下低落至內層底板22上,換言之內層環擋板25可以遮擋內層氣體管路24的頂端開口,藉以避免液體由晶圓基板10被直接甩入內層氣體管路24的頂端開口。The inner ring baffle 25 is formed on the inner side surface of the inner main ring wall 21 and extends obliquely downward toward the radial inner side of the inner main ring wall 21. In the radial direction of the inner main ring wall 21, the inner edge of the inner ring baffle 25 is located inside the top opening of the inner gas pipeline 24. Therefore, when the wafer substrate 10 is positioned on the inner ring baffle 25 for etching, the liquid can be thrown to the inner side of the inner main ring wall 21 and flow along the inner ring baffle 25 to the inner ring baffle 25. The inner edge of 25 lowers down to the inner bottom plate 22. In other words, the inner ring baffle 25 can block the top opening of the inner gas pipeline 24, so as to prevent the liquid from being thrown directly into the inner gas pipeline from the wafer substrate 10 The top of 24 is open.

內層延伸環板26形成於內層環擋板25的內緣,且向下延伸。內層延伸環板26的底緣的高度位置低於內層氣體管路24的頂端開口的高度位置,如此一來沿著內層環擋板25流至內層延伸環板26的液體可以沿著內層延伸環板26向下低落至內層底板22上,藉此可以避免液體沿著內層環擋板25的底面流動而滴入內層氣體管路24的頂端開口內。The inner extending ring plate 26 is formed on the inner edge of the inner ring baffle 25 and extends downward. The height position of the bottom edge of the inner extension ring plate 26 is lower than the height of the top opening of the inner layer gas pipeline 24, so that the liquid flowing along the inner layer ring baffle 25 to the inner layer extension ring plate 26 can follow The inner extending ring plate 26 is lowered down onto the inner bottom plate 22, thereby preventing liquid from flowing along the bottom surface of the inner ring baffle 25 and dripping into the top opening of the inner gas pipeline 24.

上述內層環擋板25及內層延伸環板26與內層氣體管路24相關的相對配合關係皆能夠更進一步的確保液體不會流入內層氣體管路24內,但在其他實施例中也可以沒有內層環擋板25或內層延伸環板26,或者兩者皆無。The above-mentioned inner layer ring baffle 25 and inner layer extension ring plate 26 and the inner layer gas pipeline 24 can further ensure that the liquid will not flow into the inner layer gas pipeline 24, but in other embodiments There may also be no inner layer ring baffle 25 or inner layer extension ring plate 26, or neither.

內層盛液環壁27位於內層主環壁21的徑向外側,並與內層主環壁21之間形成一第一盛液環槽81。具體來說,內層盛液環壁27、基板10、及內層主環壁21連接形成一截面為U字形的環槽,僅有上方的開口而能匯集液體於槽底。The inner liquid-containing ring wall 27 is located at the radially outer side of the inner main ring wall 21, and a first liquid-containing ring groove 81 is formed between the inner main ring wall 21 and the inner main ring wall 21. Specifically, the inner liquid-containing ring wall 27, the substrate 10, and the inner main ring wall 21 are connected to form a U-shaped ring groove with only an upper opening to collect liquid at the bottom of the groove.

請進一步參考圖7及圖8,第一夾層30包含一第一主環壁31、一第一液體管路32、一第一環擋板33、一第一延伸環板34、及一第一盛液環壁35。Please further refer to Figures 7 and 8, the first interlayer 30 includes a first main ring wall 31, a first liquid pipeline 32, a first ring baffle 33, a first extension ring plate 34, and a first盛液环wall 35.

第一主環壁31能相對於固定內層20上下移動地設於內層盛液環壁27的徑向外側,且第一主環壁31與內層主環壁21之間形成一第一氣體空間82。具體來說,在本實施例中第一主環壁31包含一第一本體段311、一第一傾斜段312、及一第一密封段313。The first main ring wall 31 can move up and down relative to the fixed inner layer 20 and is disposed on the radially outer side of the inner liquid-containing ring wall 27, and a first main ring wall 31 and the inner main ring wall 21 form a first Gas space 82. Specifically, in this embodiment, the first main ring wall 31 includes a first body section 311, a first inclined section 312, and a first sealing section 313.

第一本體段311能相對於固定內層20上下移動地設於內層盛液環壁27的徑向外側,且垂直於基板10並能朝遠離基板10的方向(向上)移動。第一傾斜段312形成於第一主環壁31的頂緣,且朝向第一主環壁31的徑向內側向上傾斜延伸。第一密封段313形成於第一傾斜段312的末端,且向下鉛直延伸成一環壁狀。第一密封段313藉由第一本體段311的上下移動而選擇性地以第一密封段313的徑向外側面抵靠密合於內層傾斜段212的末端,藉此封閉第一氣體空間82。The first body section 311 is disposed on the radially outer side of the inner liquid-containing ring wall 27 to move up and down relative to the fixed inner layer 20, and is perpendicular to the substrate 10 and can move in a direction away from the substrate 10 (upward). The first inclined section 312 is formed on the top edge of the first main ring wall 31 and extends upwardly and inclined toward the radial inner side of the first main ring wall 31. The first sealing section 313 is formed at the end of the first inclined section 312 and extends vertically downward into a ring wall shape. By moving up and down of the first body section 311, the first sealing section 313 selectively abuts against the end of the inner inclined section 212 with the radially outer side of the first sealing section 313, thereby closing the first gas space 82.

但第一主環壁31的具體結構在其他實施例中不以上述為限,例如可以沒有第一密封段313,如此則可以是第一傾斜段312的末端藉由第一本體段311的上下移動而選擇性地密合於內層傾斜段212的末端;或者也可以沒有第一傾斜段312而是第一主環壁31的頂緣(第一本體段311的頂緣)選擇性的密合於內層主環壁21的頂緣(內層本體段211的頂緣),藉此同樣也能封閉第一氣體空間82。However, the specific structure of the first main ring wall 31 is not limited to the above in other embodiments. For example, there may be no first sealing section 313. In this case, the end of the first inclined section 312 may be formed by the upper and lower sides of the first body section 311. Move and selectively close to the end of the inner inclined section 212; or there may be no first inclined section 312 but the top edge of the first main ring wall 31 (the top edge of the first body section 311) to be selectively dense It fits at the top edge of the inner main ring wall 21 (the top edge of the inner body section 211), so that the first gas space 82 can also be closed.

第一液體管路32貫穿基板10且連通於第一盛液環槽81的底部。具體來說,第一液體管路32於第一盛液環槽81的底部的底部上形成有一通孔,藉此本應匯集於U字形的第一盛液環槽81的底部的液體便會由位於底部的通孔流入第一液體管路32內。The first liquid pipeline 32 penetrates the substrate 10 and communicates with the bottom of the first liquid-containing ring groove 81. Specifically, the first liquid pipe 32 is formed with a through hole at the bottom of the bottom of the first liquid receiving ring groove 81, whereby the liquid that should be collected at the bottom of the U-shaped first liquid receiving ring groove 81 will be It flows into the first liquid pipeline 32 from the through hole at the bottom.

第一環擋板33形成於第一主環壁31的內側面,且朝向第一主環壁31的徑向內側向下傾斜延伸至第一環擋板33的內緣位於第一盛液環槽81上方。換言之,在第一主環壁31的徑向方向上第一環擋板33的內緣相較於內層盛液環壁27位於內側,藉此液體便能確實的經由第一環擋板33的內緣滴落至第一盛液環槽81內而不會滴出第一盛液環槽81。The first ring baffle 33 is formed on the inner surface of the first main ring wall 31, and extends downwardly and obliquely toward the radial inner side of the first main ring wall 31 until the inner edge of the first ring baffle 33 is located in the first liquid receiving ring Above the slot 81. In other words, in the radial direction of the first main ring wall 31, the inner edge of the first ring baffle 33 is located on the inner side compared to the inner liquid-containing ring wall 27, so that the liquid can pass through the first ring baffle 33 reliably. The inner edge of φ drops into the first liquid-containing ring groove 81 without dripping out of the first liquid-containing ring groove 81.

第一延伸環板34形成於第一環擋板33的內緣且向下延伸,第一延伸環板34的底緣的高度位置低於內層盛液環壁27的頂緣的高度位置。也就是說,第一延伸環板34的底緣向下延伸至位於第一盛液環槽81內,並且在第一主環壁31相對於內層盛液環壁27向上移動至頂點時仍為如此,藉此可以避免液體由第一環擋板33的內緣沿著第一環擋板33的底面流動而滴落至第一盛液環槽81外。The first extension ring plate 34 is formed on the inner edge of the first ring baffle 33 and extends downward. The height of the bottom edge of the first extension ring plate 34 is lower than the height of the top edge of the inner liquid-containing ring wall 27. That is to say, the bottom edge of the first extension ring plate 34 extends downward to be located in the first liquid-containing ring groove 81, and remains when the first main ring wall 31 moves upward relative to the inner liquid-containing ring wall 27 to the apex. In this way, it is possible to prevent the liquid from flowing from the inner edge of the first ring baffle 33 along the bottom surface of the first ring baffle 33 and dripping out of the first liquid receiving ring groove 81.

藉由第一延伸環板34可以確保液體確實經由第一盛液環槽81與第一液體管路32回收而不外漏,但在其他實施例中也可以沒有第一延伸環板34而僅以「第一環擋板33的內緣位於第一盛液環槽81上方」來達到此目的。The first extension ring plate 34 can ensure that the liquid is indeed recovered through the first liquid-containing ring groove 81 and the first liquid pipe 32 without leakage. However, in other embodiments, the first extension ring plate 34 may be omitted and only To achieve this goal, "the inner edge of the first ring baffle 33 is located above the first liquid-containing ring groove 81".

第一盛液環壁35位於第一主環壁31的徑向外側,並與第一主環壁31之間形成一第二盛液環槽83。具體來說,在本實施例中第一盛液環壁35的底緣經由一環型板連接固設於第一主環壁31的底緣,且第一盛液環壁35隨著第一主環壁31移動。也就是說,第一盛液環壁35、該環型板、及第一主環壁31連接形成一U字形環槽。The first liquid-containing ring wall 35 is located at the radially outer side of the first main ring wall 31, and a second liquid-containing ring groove 83 is formed between the first main ring wall 31 and the first main ring wall 31. Specifically, in this embodiment, the bottom edge of the first liquid-containing ring wall 35 is connected to the bottom edge of the first main ring wall 31 via an annular plate, and the first liquid-containing ring wall 35 follows the first main ring wall. The ring wall 31 moves. In other words, the first liquid-containing ring wall 35, the annular plate, and the first main ring wall 31 are connected to form a U-shaped ring groove.

請進一步參考圖9及圖10,第二夾層40包含一第二主環壁41、一第二環擋板42、一第二盛液環壁43、及一第二液體管路44。Please further refer to FIGS. 9 and 10, the second interlayer 40 includes a second main ring wall 41, a second ring baffle 42, a second liquid containing ring wall 43, and a second liquid pipeline 44.

第二主環壁41能相對於第一夾層30上下移動地設於第一盛液環壁35的徑向外側。第二主環壁41與第一主環壁31之間形成一第二氣體空間84,且第二主環壁41的頂緣選擇性的密合於第一主環壁31的頂緣,藉此封閉第二氣體空間84。第二環擋板42形成於第二主環壁41的內側面,且朝向第二主環壁41的徑向內側向下傾斜延伸至第二環擋板42的內緣位於第二盛液環槽83上方。第二盛液環壁43位於第二主環壁41的徑向外側,並與第二主環壁41之間形成一外層盛液環槽85。第二液體管路44能移動地貫穿基板10且連通於第二盛液環槽83的底部。具體來說,第二液體管路44是移動地貫穿基板10後再穿設固定於連接第一主環壁31與第一盛液環壁35的該環形板上,且於該環型板上形成一通孔,也就是說第二液體管路44實際上會隨著第一主環壁31相對於基板10上下移動。此外,第二夾層40的其餘細部結構與第一夾層30完全相同,差別僅在於第一夾層30在徑向方向上是向內對應於固定內層20而向外對應於第二夾層40,而第二夾層40在徑向方向上是向內對應於第一夾層30而向外對應於移動外層50。The second main ring wall 41 is disposed on the radially outer side of the first liquid-containing ring wall 35 so as to be movable up and down relative to the first interlayer 30. A second gas space 84 is formed between the second main ring wall 41 and the first main ring wall 31, and the top edge of the second main ring wall 41 is selectively tightly attached to the top edge of the first main ring wall 31, by This closes the second gas space 84. The second ring baffle 42 is formed on the inner surface of the second main ring wall 41, and extends downwardly and obliquely toward the radial inner side of the second main ring wall 41 until the inner edge of the second ring baffle 42 is located in the second liquid-containing ring Above the groove 83. The second liquid-containing ring wall 43 is located on the radially outer side of the second main ring wall 41, and an outer liquid-containing ring groove 85 is formed between the second main ring wall 41 and the second main ring wall 41. The second liquid pipeline 44 movably penetrates the substrate 10 and communicates with the bottom of the second liquid-containing ring groove 83. Specifically, the second liquid pipe 44 movably penetrates the base plate 10 and then passes through and is fixed on the annular plate connecting the first main ring wall 31 and the first liquid-containing ring wall 35, and is mounted on the annular plate A through hole is formed, that is to say, the second liquid pipeline 44 will actually move up and down with the first main ring wall 31 relative to the substrate 10. In addition, the remaining detailed structure of the second interlayer 40 is exactly the same as that of the first interlayer 30. The only difference is that the first interlayer 30 corresponds to the fixed inner layer 20 inward and corresponds to the second interlayer 40 outward in the radial direction. The second interlayer 40 corresponds to the first interlayer 30 inwardly and corresponds to the moving outer layer 50 outwardly in the radial direction.

請進一步參考圖11及圖12,移動外層50包含一外層主環壁51、一外層環擋板52、及一外層液體管路53。Please further refer to FIGS. 11 and 12, the moving outer layer 50 includes an outer main ring wall 51, an outer ring baffle 52, and an outer liquid pipeline 53.

外層主環壁51能相對於第二夾層40上下移動地設於第二盛液環壁43的徑向外側。外層主環壁51與第二主環壁41之間形成一外層氣體空間86,且外層主環壁51的頂緣選擇性的密合於第二主環壁41的頂緣,藉此封閉外層氣體空間86。外層環擋板52形成於外層主環壁51的內側面,且朝向外層主環壁51的徑向內側向下傾斜延伸至外層環擋板52的內緣位於外層盛液環槽85上方。外層液體管路53能移動地貫穿基板10且連通於外層盛液環槽85的底部。移動外層50的其餘細部結構與第二夾層40完全相同,差別僅在於移動外層50不具有盛液環壁(因不再需要向外形成盛液環槽),且第二夾層40在徑向方向上是向內對應於第一夾層30而向外對應於移動外層50,而移動外層50在徑向方向上是向內對應於第二夾層40而向外以外層主環壁51的外側面密合於氣體環壁61。The outer main ring wall 51 is disposed on the radially outer side of the second liquid-containing ring wall 43 so as to be movable up and down relative to the second interlayer 40. An outer gas space 86 is formed between the outer main ring wall 51 and the second main ring wall 41, and the top edge of the outer main ring wall 51 is selectively attached to the top edge of the second main ring wall 41, thereby sealing the outer layer气空间86。 Gas space 86. The outer ring baffle 52 is formed on the inner surface of the outer main ring wall 51, and extends obliquely downward toward the radial inner side of the outer main ring wall 51 until the inner edge of the outer ring baffle 52 is located above the outer liquid ring groove 85. The outer liquid pipeline 53 movably penetrates the substrate 10 and communicates with the bottom of the outer liquid receiving ring groove 85. The remaining detailed structure of the mobile outer layer 50 is exactly the same as that of the second interlayer 40. The only difference is that the mobile outer layer 50 does not have a liquid-containing ring wall (because it is no longer necessary to form a liquid-containing ring groove outward), and the second interlayer 40 is in the radial direction. The top is inward corresponding to the first interlayer 30 and outward corresponding to the mobile outer layer 50, and the mobile outer layer 50 in the radial direction corresponds to the second interlayer 40 inward and outward to the outer surface of the main ring wall 51 of the outer layer.合于gas ring wall 61.

請進一步參考圖4及圖8,氣體環壁61底緣固設於基板10,且頂緣能相對滑動地密合於外層主環壁51的外側面。氣體環壁61與內層主環壁21之間形成一共同氣體空間611,第一夾層30、第二夾層40、及移動外層50能移動地設於共同氣體空間611內,且第一氣體空間82、第二氣體空間84、及外層氣體空間86連通共同氣體空間611。共同氣體管路62連通於共同氣體空間611。抽氣泵浦連通於內層氣體管路24及共同氣體管路62。Please further refer to FIGS. 4 and 8, the bottom edge of the gas ring wall 61 is fixed to the substrate 10, and the top edge is relatively slidably attached to the outer surface of the outer main ring wall 51. A common gas space 611 is formed between the gas ring wall 61 and the inner main ring wall 21. The first interlayer 30, the second interlayer 40, and the mobile outer layer 50 are movably arranged in the common gas space 611, and the first gas space 82. The second gas space 84 and the outer gas space 86 are connected to the common gas space 611. The common gas pipeline 62 communicates with the common gas space 611. The suction pump is connected to the inner gas pipeline 24 and the common gas pipeline 62.

請進一步參考圖3、圖7、圖9、及圖10。升降機構70連接於第一夾層30、第二夾層40、及移動外層50,且能分別控制第一夾層30、第二夾層40、及移動外層50上下移動。升降機構70包含一第一頂昇滑桿71、一第二頂昇滑桿72、一外層頂昇滑桿73、一頂昇滑座74、一橫向驅動裝置75、及一升降驅動裝置76。Please further refer to Figure 3, Figure 7, Figure 9, and Figure 10. The lifting mechanism 70 is connected to the first interlayer 30, the second interlayer 40, and the mobile outer layer 50, and can respectively control the first interlayer 30, the second interlayer 40, and the mobile outer layer 50 to move up and down. The lifting mechanism 70 includes a first lifting sliding rod 71, a second lifting sliding rod 72, an outer lifting sliding rod 73, a lifting sliding seat 74, a lateral driving device 75, and a lifting driving device 76.

第一頂昇滑桿71能上下移動的貫穿基板10,且抵靠於第一主環壁31的底緣。第二頂昇滑桿72能上下移動的貫穿基板10,且抵靠於第二主環壁41的底緣。外層頂昇滑桿73能上下移動的貫穿基板10,且抵靠於外層主環壁的底緣。頂昇滑座74能移動地設於第一頂昇滑桿71、第二頂昇滑桿72、及外層頂昇滑桿73的下方。橫向驅動裝置75能橫向移動頂昇滑座74,藉此選擇性地使頂昇滑座74抵靠於第一頂昇滑桿71、第二頂昇滑桿72、或外層頂昇滑桿73的底端。升降驅動裝置76能向上推頂頂昇滑座74,藉此使頂昇滑座74向上推頂第一頂昇滑桿71、第二頂昇滑桿72、或外層頂昇滑桿73,並藉由第一頂昇滑桿71、第二頂昇滑桿72、或外層頂昇滑桿73向上推頂第一主環壁31、第二主環壁41、或外層主環壁51。The first lifting sliding rod 71 penetrates the base plate 10 so as to move up and down, and abuts against the bottom edge of the first main ring wall 31. The second lifting sliding rod 72 penetrates the base plate 10 so as to move up and down, and abuts against the bottom edge of the second main ring wall 41. The outer jacking slide rod 73 can move up and down through the substrate 10 and abuts against the bottom edge of the outer main ring wall. The jacking slide 74 is movably disposed under the first jacking slide bar 71, the second jacking slide bar 72, and the outer jacking slide bar 73. The lateral driving device 75 can move the jacking slide 74 laterally, thereby selectively making the jacking slide 74 abut against the first jacking slide 71, the second jacking slide 72, or the outer jacking slide 73 The bottom end. The lifting driving device 76 can push up the jacking slide 74, thereby causing the jacking slide 74 to push up the first jacking slide bar 71, the second jacking slide bar 72, or the outer jacking slide bar 73, and The first main ring wall 31, the second main ring wall 41, or the outer main ring wall 51 are pushed upward by the first lifting slide bar 71, the second lifting slide bar 72, or the outer lifting slide bar 73.

藉由上述元件相配合,若橫向驅動裝置75使頂昇滑座74抵靠於外層頂昇滑桿73而不抵靠於第二頂昇滑桿72及第一頂昇滑桿71,則當升降驅動裝置76向上推頂頂昇滑座74時,頂昇滑座74向上推頂外層頂昇滑桿73並以外層頂昇滑桿73向上推頂外層主環壁51,藉此使外層主環壁51相對於第二夾層40、第一夾層30、及固定內層20向上升起;第二夾層40與第一夾層30的升降方式亦同。With the cooperation of the above components, if the lateral drive device 75 makes the jacking slide 74 abut the outer jacking slide 73 and not the second jacking slide 72 and the first jacking slide 71, then When the lifting driving device 76 pushes the jacking slide 74 upwards, the jacking slide 74 pushes the outer jacking slide rod 73 upwards and the outer jacking slide rod 73 pushes the outer main ring wall 51 upwards, thereby making the outer main ring wall 51 The ring wall 51 rises upward relative to the second interlayer 40, the first interlayer 30, and the fixed inner layer 20; the lifting method of the second interlayer 40 and the first interlayer 30 is also the same.

此外,橫向驅動裝置75與升降驅動裝置76在本實施例中為氣壓缸,但在其他實施例中也可以是伺服馬達或其他同樣功能之裝置。再者,在本實施例中具有兩組完全相同的升降裝置,其相對於各環壁的軸心設置,且兩橫向驅動裝置75同步開合,且兩升降驅動裝置76同步上頂。In addition, the lateral driving device 75 and the lifting driving device 76 are pneumatic cylinders in this embodiment, but in other embodiments, they may also be servo motors or other devices with the same function. Furthermore, in this embodiment, there are two sets of identical lifting devices, which are arranged relative to the axis of each ring wall, and the two lateral driving devices 75 are opened and closed synchronously, and the two lifting driving devices 76 are lifted synchronously.

本創作能夠視需求調整夾層的數量,也就是說可以有額外的第三夾層與第四夾層設於第二夾層40與移動外層50之間,且徑向上內外的連接配合關係同第一夾層30與第二夾層40,藉此本創作共可以分別對應回收五種不同液體與氣體;或者是也可以沒有第一夾層30與第二夾層40而僅有固定內層20與移動外層50,如此則本創作能夠分別對應回收兩種不同的液體與氣體。This creation can adjust the number of interlayers as required, that is to say, there may be additional third interlayer and fourth interlayer between the second interlayer 40 and the mobile outer layer 50, and the connection and cooperation relationship between the inner and outer layers in the radial direction is the same as that of the first interlayer 30 With the second interlayer 40, this creation can respectively correspondingly recover five different liquids and gases; or there may be no first interlayer 30 and second interlayer 40 but only a fixed inner layer 20 and a moving outer layer 50, so that This creation can respectively correspondingly recover two different liquids and gases.

請參考圖5及圖6,當升降機構70不啟動且晶圓基板10位於固定內環內蝕刻時,反應後的化學液體會依序沿著內層主環壁21、內層環擋板25、及內層延伸環板26流動,並滴落至內層底板22上,再沿著內層底板22流動至低處的液體穿孔221內被內層液體管路23回收,如圖5所示;而反應後的氣體會繞過內層環擋板25及內層延伸環板26而經由內層氣體管路24被抽氣泵浦回收,如圖6所示。5 and 6, when the lifting mechanism 70 is not activated and the wafer substrate 10 is located in the fixed inner ring for etching, the reacted chemical liquid will sequentially follow the inner main ring wall 21 and the inner ring baffle 25 , And the inner extending ring plate 26 flow and drip onto the inner bottom plate 22, and then flow along the inner bottom plate 22 to the lower liquid perforation 221 and be recovered by the inner liquid pipe 23, as shown in FIG. 5 The reacted gas will bypass the inner layer ring baffle 25 and the inner layer extension ring plate 26 and be recovered by the pumping pump through the inner layer gas pipeline 24, as shown in FIG. 6.

請參考圖7及圖8,當升降機構70的頂昇滑座74抵靠於第一頂昇滑桿71、第二頂昇滑桿72、及外層頂昇滑桿73的底端時,升降驅動裝置76向上推頂頂昇滑座74後,頂昇滑座74便會經由第一頂昇滑桿71、第二頂昇滑桿72、及外層頂昇滑桿73向上推頂移動第一主環壁31、第二主環壁41、及外層主環壁51,使三者一同向上移動並與固定內層20分離。7 and 8, when the lifting slide 74 of the lifting mechanism 70 abuts against the bottom end of the first lifting slide 71, the second lifting slide 72, and the outer lifting slide 73, the lift After the driving device 76 pushes up the jacking slide 74, the jacking slide 74 will push up and move the first jacking slide 74 through the first jacking slide 71, the second jacking slide 72, and the outer jacking slide 73. The main ring wall 31, the second main ring wall 41, and the outer main ring wall 51 make the three move upward together and separate from the fixed inner layer 20.

此時,第一主環壁31的頂緣與內層主環壁21的頂緣相互分離並開啟第一氣體空間82,且第一氣體空間82經由第一盛液環槽81連通於共同氣體空間611,藉此抽氣泵浦能抽取回收第一氣體空間82中反應後的化學氣體,也就是說化學氣體會依序繞過第一延伸環板34與內層盛液環壁27而流動至共同氣體空間611中被抽取。At this time, the top edge of the first main ring wall 31 and the top edge of the inner main ring wall 21 are separated from each other and open the first gas space 82, and the first gas space 82 is connected to the common gas via the first liquid-containing ring groove 81 Space 611, by which the pumping pump can extract and recover the chemical gas after the reaction in the first gas space 82, that is, the chemical gas will flow around the first extending ring plate 34 and the inner liquid-containing ring wall 27 in sequence To the common gas space 611 to be extracted.

並且,若此時將晶圓基板10移動至周緣對應位於第一主環壁31的頂緣與內層主環壁21的頂緣之間,則旋轉晶圓基板10時能夠將反應後的化學液體甩至第一氣體空間82中,如此該化學液體會依序沿著內層主環壁21的內層傾斜段212與內層本體段211,或者是依序沿著第一主環壁31的內側面、第一環擋板33的頂面、及第一延伸環板34的內側面流動滴落至第一盛液環槽81內,進而能被第一液體管路32回收。Moreover, if the wafer substrate 10 is moved to the periphery corresponding to the top edge of the first main ring wall 31 and the top edge of the inner main ring wall 21, the reacted chemical can be removed when the wafer substrate 10 is rotated. The liquid is thrown into the first gas space 82, so that the chemical liquid will follow the inner inclined section 212 and the inner body section 211 of the inner main ring wall 21 in sequence, or along the first main ring wall 31 in sequence. The inner surface of the first ring baffle 33, the top surface of the first ring baffle 33, and the inner surface of the first extension ring plate 34 flow and drip into the first liquid-containing ring groove 81, and then can be recovered by the first liquid pipeline 32.

請參考圖9及圖10,當升降機構70的橫向驅動裝置75移動頂昇滑座74使其抵靠於第二頂昇滑桿72及外層頂昇滑桿73的底端,但不抵靠於第一頂昇滑桿71時,升降驅動裝置76向上推頂頂昇滑座74後,頂昇滑座74便會經由第二頂昇滑桿72及外層頂昇滑桿73向上推頂移動第二主環壁41及外層主環壁51,使兩者一同向上移動並與第一夾層30及固定內層20分離;而此時由於第一頂昇滑桿71沒有被推頂,故第一主環壁31會維持不動。9 and 10, when the lateral driving device 75 of the lifting mechanism 70 moves the lifting slide 74 to abut against the bottom end of the second lifting slide 72 and the outer lifting slide 73, but does not abut When the first jacking slide bar 71 is used, after the lifting drive device 76 pushes up the jacking slide 74, the jacking slide 74 will be pushed up and moved through the second jacking slide 72 and the outer jacking slide 73 The second main ring wall 41 and the outer main ring wall 51 move both upwards together and separate from the first interlayer 30 and the fixed inner layer 20; at this time, since the first jacking slide 71 is not pushed, the first A main ring wall 31 will remain stationary.

此時,第二主環壁41的頂緣與第一主環壁31的頂緣相互分離並開啟第二氣體空間84,且第二氣體空間84經由第二盛液環槽83連通於共同氣體空間611,藉此抽氣泵浦能抽取回收第二氣體空間84中反應後的化學氣體,也就是說化學氣體會依序繞過第二延伸環板與第一盛液環壁35而流動至共同氣體空間611中被抽取。At this time, the top edge of the second main ring wall 41 and the top edge of the first main ring wall 31 are separated from each other and open the second gas space 84, and the second gas space 84 is connected to the common gas through the second liquid-containing ring groove 83 Space 611, by which the pumping pump can extract and recover the chemical gas after the reaction in the second gas space 84, that is to say, the chemical gas will bypass the second extension ring plate and the first liquid ring wall 35 and flow to The common gas space 611 is extracted.

並且,若此時將晶圓基板10移動至周緣對應位於第二主環壁41的頂緣與第一主環壁31的頂緣之間,則旋轉晶圓基板10時能夠將反應後的化學液體甩至第二氣體空間84中,如此該化學液體會依序沿著第一主環壁31的第一傾斜段312與第一本體段311,或者是依序沿著第二主環壁41的內側面、第二環擋板42的頂面、及第二延伸環板的內側面流動滴落至第二盛液環槽83內,進而能被第二液體管路44回收。In addition, if the wafer substrate 10 is moved to the periphery corresponding to the top edge of the second main ring wall 41 and the top edge of the first main ring wall 31, the reacted chemical can be removed when the wafer substrate 10 is rotated. The liquid is thrown into the second gas space 84, so that the chemical liquid will follow the first inclined section 312 and the first body section 311 of the first main ring wall 31 in sequence, or along the second main ring wall 41 in sequence The inner surface of the second ring baffle 42, the top surface of the second ring baffle 42, and the inner surface of the second extension ring plate flow and drip into the second liquid-containing ring groove 83, and then can be recovered by the second liquid pipeline 44.

請參考圖11及圖12,當升降機構70的橫向驅動裝置75移動頂昇滑座74使其抵靠於外層頂昇滑桿73的底端,但不抵靠於第二頂昇滑桿72及第一頂昇滑桿71時,升降驅動裝置76向上推頂頂昇滑座74後,頂昇滑座74便會經由外層頂昇滑桿73向上推頂移動外層50主環壁,使其向上移動並與第二夾層40、第一夾層30、及固定內層20分離;而此時由於第二頂昇滑桿72及第一頂昇滑桿71沒有被推頂,故第二主環壁41及第一主環壁31會維持不動。Please refer to FIGS. 11 and 12, when the lateral driving device 75 of the lifting mechanism 70 moves the lifting slide 74 to abut against the bottom end of the outer lifting slide 73, but not against the second lifting slide 72 And the first jacking slide bar 71, after the lifting drive device 76 pushes the jacking slide 74 upwards, the jacking slide 74 will push up and move the main ring wall of the outer layer 50 through the outer jacking slide bar 73 to make it Move upward and separate from the second interlayer 40, the first interlayer 30, and the fixed inner layer 20; at this time, because the second jacking slide 72 and the first jacking slide 71 are not pushed, the second main ring The wall 41 and the first main ring wall 31 will remain stationary.

此時,外層主環壁51的頂緣與第二主環壁41的頂緣相互分離並開啟外層氣體空間86,且外層氣體空間86經由外層盛液環槽85連通於共同氣體空間611,藉此抽氣泵浦能抽取回收外層氣體空間86中反應後的化學氣體,也就是說化學氣體會依序繞過外層延伸環板與第二盛液環壁43而流動至共同氣體空間611中被抽取。At this time, the top edge of the outer main ring wall 51 and the top edge of the second main ring wall 41 are separated from each other and open the outer gas space 86, and the outer gas space 86 is connected to the common gas space 611 via the outer liquid ring groove 85, by The gas pump can extract and recover the chemical gas after the reaction in the outer gas space 86, which means that the chemical gas will bypass the outer extension ring plate and the second liquid ring wall 43 in order to flow into the common gas space 611. Extract.

並且,若此時將晶圓基板10移動至周緣對應位於外層主環壁51的頂緣與第二主環壁41的頂緣之間,則旋轉晶圓基板10時能夠將反應後的化學液體甩至外層氣體空間86中,如此該化學液體會依序沿著第二主環壁41的第二傾斜段與第二本體段,或者是依序沿著外層主環壁51的內側面、外層環擋板52的頂面、及外層延伸環板的內側面流動滴落至外層盛液環槽85內,進而能被外層液體管路53回收。Moreover, if the wafer substrate 10 is moved to the periphery corresponding to the top edge of the outer main ring wall 51 and the top edge of the second main ring wall 41, the reacted chemical liquid can be removed when the wafer substrate 10 is rotated. Throw into the outer gas space 86, so that the chemical liquid will follow the second inclined section and the second body section of the second main ring wall 41 in sequence, or along the inner surface and outer layer of the outer main ring wall 51 in sequence. The top surface of the ring baffle 52 and the inner surface of the outer extending ring plate flow and drip into the outer liquid-containing ring groove 85, and then can be recovered by the outer liquid pipeline 53.

本創作的優點在於,藉由內層液體管路23與內層氣體管路24貫穿基板10且連通於內層主環壁21內側,並且內層氣體管路24的頂端開口高於內層液體管路23的頂端開口,於是當晶圓基板10位於內層主環壁21內側進行蝕刻時,反應過後的化學液體可以經由內層液體管路23流向處理系統,而反應過後的化學氣體可以經由內層氣體管路24被抽走,且因為內層氣體管路24的開口較高故反應過後的化學液體不會流入內層氣體管路24。The advantage of this creation is that the inner layer liquid pipeline 23 and the inner layer gas pipeline 24 penetrate the substrate 10 and communicate with the inner side of the inner main ring wall 21, and the top opening of the inner layer gas pipeline 24 is higher than that of the inner layer liquid The top of the pipe 23 is open, so when the wafer substrate 10 is located inside the inner main ring wall 21 for etching, the reacted chemical liquid can flow to the processing system through the inner liquid pipe 23, and the reacted chemical gas can pass through The inner gas pipeline 24 is drawn away, and because the opening of the inner gas pipeline 24 is relatively high, the reacted chemical liquid will not flow into the inner gas pipeline 24.

並且,藉由外層主環壁51能移動地設於內層主環壁21的徑向外側、外層環擋板52形成於外層主環壁51的內側面且向內向下延伸至外層環擋板52的內緣位於外層盛液環槽85上方、以及外層液體管路53貫穿基板10且連通於外層盛液環槽85的底部,於是當外層主環壁51相對於內層主環壁21向上移動,且晶圓基板10位於外層主環壁51的頂緣以及內層主環壁21的頂緣之間進行蝕刻時,反應過後的化學液體會被甩至外層氣體空間86內,且沿著內層主環壁21的外側面流至外層盛液環槽85內,或者沿著外層主環壁51的內側面流至外層環擋板52並由外層環擋板52的內緣滴入外層盛液環槽85內,再被外層液體管路53回收,因此不會流至內層液體管路23內與其他化學液體混合回收。而反應過後的化學氣體能夠經由外層氣體空間86繞過外層環擋板52與內層盛液環壁27的頂緣流動至共同氣體空間611內,最後被抽氣泵浦經由共同氣體管路62抽走回收。In addition, the outer main ring wall 51 is movably provided on the radially outer side of the inner main ring wall 21, and the outer ring baffle 52 is formed on the inner side of the outer main ring wall 51 and extends inward and downward to the outer ring baffle. The inner edge of 52 is located above the outer liquid ring groove 85, and the outer liquid pipe 53 penetrates the substrate 10 and is connected to the bottom of the outer liquid ring groove 85, so when the outer main ring wall 51 is upward relative to the inner main ring wall 21 When the wafer substrate 10 is moved between the top edge of the outer main ring wall 51 and the top edge of the inner main ring wall 21 for etching, the reacted chemical liquid will be thrown into the outer gas space 86 and move along The outer surface of the inner main ring wall 21 flows into the outer liquid-containing ring groove 85, or flows along the inner surface of the outer main ring wall 51 to the outer ring baffle 52 and drips into the outer layer from the inner edge of the outer ring baffle 52 The liquid-containing ring groove 85 is then recovered by the outer liquid pipeline 53, so it will not flow into the inner liquid pipeline 23 to mix with other chemical liquids for recovery. The reacted chemical gas can flow into the common gas space 611 through the outer gas space 86, bypassing the top edge of the outer ring baffle 52 and the inner liquid ring wall 27, and is finally pumped through the common gas pipeline 62. Take away and recycle.

藉此,本創作可以透過升降機構70升降移動外層50以及調整晶圓基板10進行蝕刻的位置,來分別進行不同液體藥劑的蝕刻反應且同時分別回收液體藥劑以及反應後的化學氣體與化學液體,因此能有效降低後續處理的負擔,也能避免產生有毒物質或者進一步造成汙染。In this way, the present creation can move the outer layer 50 up and down through the lifting mechanism 70 and adjust the etching position of the wafer substrate 10 to perform the etching reactions of different liquid medicines and simultaneously recover the liquid medicines and the reacted chemical gases and chemical liquids. Therefore, the burden of subsequent processing can be effectively reduced, and the production of toxic substances or further pollution can be avoided.

並且,透過在固定內層20與移動外層50之間增設一個或多個夾層,且使各夾層以與前述固定內層20與移動外層50相同的配合方式設置,即層層依序能移動地套設且每一層的環擋板與液體管路對應於形成於前一層上的盛液環槽,並連接至升降機構70以分別控制升降,如此一來便能進一步增加本創作所能回收的不同液體藥劑的數量,以符合實際使用需求。Moreover, by adding one or more interlayers between the fixed inner layer 20 and the mobile outer layer 50, and each interlayer is arranged in the same manner as the aforementioned fixed inner layer 20 and the mobile outer layer 50, that is, the layers can be moved sequentially. The ring baffles and liquid pipelines of each layer correspond to the liquid-containing ring grooves formed on the previous layer, and are connected to the lifting mechanism 70 to control the lifting respectively. In this way, it can further increase the recovery of this creation. The quantity of different liquid medicaments can meet the actual needs of use.

以上所述僅是本創作的較佳實施例而已,並非對本創作做任何形式上的限制,雖然本創作已以較佳實施例揭露如上,然而並非用以限定本創作,任何所屬技術領域中具有通常知識者,在不脫離本創作技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本創作技術方案的內容,依據本創作的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本創作技術方案的範圍內。The above description is only the preferred embodiment of the creation, and does not limit the creation in any form. Although the creation has been disclosed in the preferred embodiment as above, it is not intended to limit the creation. Any technical field has Generally knowledgeable persons, without departing from the scope of this creative technical solution, can use the technical content disclosed above to make slight changes or modifications to equivalent embodiments with equivalent changes. However, any content that does not deviate from this creative technical solution is based on this Any simple modifications, equivalent changes and modifications made to the above embodiments by the technical essence of the creation still fall within the scope of the technical solution for creation.

10:基板 20:固定內層 21:內層主環壁 211:內層本體段 212:內層傾斜段 22:內層底板 221:液體穿孔 23:內層液體管路 24:內層氣體管路 25:內層環擋板 26:內層延伸環板 27:內層盛液環壁 30:第一夾層 31:第一主環壁 311:第一本體段 312:第一傾斜段 313:第一密封段 32:第一液體管路 33:第一環擋板 34:第一延伸環板 35:第一盛液環壁 40:第二夾層 41:第二主環壁 42:第二環擋板 43:第二盛液環壁 44:第二液體管路 50:移動外層 51:外層主環壁 52:外層環擋板 53:外層液體管路 61:氣體環壁 611:共同氣體空間 62:共同氣體管路 70:升降機構 71:第一頂昇滑桿 72:第二頂昇滑桿 73:外層頂昇滑桿 74:頂昇滑座 75:橫向驅動裝置 76:升降驅動裝置 81:第一盛液環槽 82:第一氣體空間 83:第二盛液環槽 84:第二氣體空間 85:外層盛液環槽 86:外層氣體空間10: substrate 20: fixed inner layer 21: Inner main ring wall 211: Inner body segment 212: Inner Inclined Section 22: inner bottom plate 221: Liquid Piercing 23: Inner liquid pipeline 24: Inner gas pipeline 25: inner ring baffle 26: inner extension ring plate 27: inner liquid ring wall 30: first mezzanine 31: The first main ring wall 311: The first body segment 312: The first inclined section 313: The first sealing section 32: The first liquid line 33: The first ring baffle 34: The first extension ring plate 35: The first liquid ring wall 40: second mezzanine 41: The second main ring wall 42: The second ring baffle 43: The second liquid ring wall 44: second liquid line 50: Move the outer layer 51: Outer main ring wall 52: Outer ring baffle 53: Outer liquid line 61: Gas ring wall 611: Common Gas Space 62: Common gas pipeline 70: Lifting mechanism 71: The first jacking slider 72: The second jacking slider 73: Outer layer jacking slider 74: Lifting slide 75: Lateral drive 76: Lifting drive device 81: The first liquid ring groove 82: The first gas space 83: The second liquid ring groove 84: second gas space 85: Outer liquid ring groove 86: Outer Gas Space

圖1係本創作的立體外觀圖。 圖2係本創作的側視圖。 圖3係本創作的升降機構的局部放大。 圖4係本創作的各管路於基板上的位置的局部放大圖。 圖5係本創作以固定內層回收液體的流向示意圖。 圖6係本創作以固定內層回收氣體的流向示意圖。 圖7係本創作的第一夾層、第二夾層、及移動外層向上移動後的側視剖面圖。 圖8係本創作以第一夾層回收氣體與氣體的流向示意圖。 圖9係本創作的第二夾層及移動外層向上移動後的側視剖面圖。 圖10係本創作以第二夾層回收氣體與氣體的流向示意圖。 圖11係本創作的移動外層向上移動後的側視剖面圖。 圖12係本創作的以移動外層回收氣體與氣體的流向示意圖。 Figure 1 is the three-dimensional appearance of this creation. Figure 2 is a side view of this creation. Figure 3 is a partial enlargement of the lifting mechanism of this creation. Figure 4 is a partial enlarged view of the positions of the pipelines on the substrate of this creation. Figure 5 is a schematic diagram of the flow of the liquid recovered in this creation to fix the inner layer. Figure 6 is a schematic diagram of the flow of gas recovered in the fixed inner layer in this creation. Figure 7 is a side cross-sectional view of the first interlayer, the second interlayer, and the moving outer layer of this creation after moving upward. Figure 8 is a schematic diagram of the flow of gas and gas recovered in the first interlayer in this creation. Figure 9 is a side cross-sectional view of the second mezzanine layer and the moving outer layer of this creation after moving upward. Figure 10 is a schematic diagram of the flow of gas and gas recovered in the second interlayer in this creation. Figure 11 is a cross-sectional side view of the moving outer layer of this creation after it has moved upward. Figure 12 is a schematic diagram of the flow of gas and gas recovered by moving the outer layer.

20:固定內層 20: fixed inner layer

21:內層主環壁 21: Inner main ring wall

211:內層本體段 211: Inner body segment

212:內層傾斜段 212: Inner Inclined Section

22:內層底板 22: inner bottom plate

221:液體穿孔 221: Liquid Piercing

23:內層液體管路 23: Inner liquid pipeline

25:內層環擋板 25: inner ring baffle

26:內層延伸環板 26: inner extension ring plate

27:內層盛液環壁 27: inner liquid ring wall

Claims (10)

一種氣液分離分層獨立回收裝置,其中包含 一基板; 一固定內層,其包含 一內層主環壁,其底緣固設於該基板; 一內層盛液環壁,其位於該內層主環壁的徑向外側,並與該內層主環壁之間形成一第一盛液環槽; 一內層液體管路,其貫穿該基板且連通於該內層主環壁內側; 一內層氣體管路,其貫穿該基板且連通於該內層主環壁內側,且該內層氣體管路的頂端開口高於該內層液體管路的頂端開口; 一第一夾層,其包含 一第一主環壁,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側;該第一主環壁與該內層主環壁之間形成一第一氣體空間,且該第一主環壁的頂緣選擇性的密合於該內層主環壁的頂緣,藉此封閉該第一氣體空間; 一第一環擋板,其形成於該第一主環壁的內側面,且朝向該第一主環壁的徑向內側向下傾斜延伸至該第一環擋板的內緣位於該第一盛液環槽上方; 一第一盛液環壁,其位於該第一主環壁的徑向外側,並與該第一主環壁之間形成一第二盛液環槽; 一第一液體管路,其貫穿該基板且連通於該第一盛液環槽的底部; 一第二夾層,其包含 一第二主環壁,其能相對於該第一夾層上下移動地設於該第一盛液環壁的徑向外側;該第二主環壁與該第一主環壁之間形成一第二氣體空間,且該第二主環壁的頂緣選擇性的密合於該第一主環壁的頂緣,藉此封閉該第二氣體空間; 一第二環擋板,其形成於該第二主環壁的內側面,且朝向該第二主環壁的徑向內側向下傾斜延伸至該第二環擋板的內緣位於該第二盛液環槽上方; 一第二盛液環壁,其位於該第二主環壁的徑向外側,並與該第二主環壁之間形成一外層盛液環槽; 一第二液體管路,其能移動地貫穿該基板且連通於該第二盛液環槽的底部; 一移動外層,其包含 一外層主環壁,其能相對於該第二夾層上下移動地設於該第二盛液環壁的徑向外側;該外層主環壁與該第二主環壁之間形成一外層氣體空間,且該外層主環壁的頂緣選擇性的密合於該第二主環壁的頂緣,藉此封閉該外層氣體空間; 一外層環擋板,其形成於該外層主環壁的內側面,且朝向該外層主環壁的徑向內側向下傾斜延伸至該外層環擋板的內緣位於該外層盛液環槽上方; 一外層液體管路,其能移動地貫穿該基板且連通於該外層盛液環槽的底部; 一氣體環壁,其底緣固設於該基板,且頂緣能相對滑動地密合於該外層主環壁的外側面;該氣體環壁與該內層主環壁之間形成一共同氣體空間,該第一夾層、該第二夾層、及該移動外層能移動地設於該共同氣體空間內,且該第一氣體空間、該第二氣體空間、及該外層氣體空間連通該共同氣體空間; 一共同氣體管路,其連通於該共同氣體空間; 一抽氣泵浦,其連通於該內層氣體管路及該共同氣體管路; 一升降機構,其連接於該第一夾層、該第二夾層、及該移動外層,且能分別控制該第一夾層、該第二夾層、及該移動外層上下移動。 A gas-liquid separation and stratification independent recovery device, which contains A substrate; A fixed inner layer, which contains An inner main ring wall, the bottom edge of which is fixed on the base plate; An inner liquid-containing ring wall, which is located on the radially outer side of the inner main ring wall and forms a first liquid-containing ring groove with the inner main ring wall; An inner liquid pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall; An inner gas pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall, and the top opening of the inner gas pipeline is higher than the top opening of the inner liquid pipeline; A first interlayer, which contains A first main ring wall, which can move up and down relative to the fixed inner layer and is arranged on the radially outer side of the inner liquid-containing ring wall; a first main ring wall and the inner main ring wall form a A gas space, and the top edge of the first main ring wall is selectively close to the top edge of the inner main ring wall, thereby closing the first gas space; A first ring baffle formed on the inner side surface of the first main ring wall, and extending obliquely downward toward the radial inner side of the first main ring wall until the inner edge of the first ring baffle is located at the first Above the liquid ring groove; A first liquid-containing ring wall, which is located on the radially outer side of the first main ring wall and forms a second liquid-containing ring groove with the first main ring wall; A first liquid pipeline that penetrates the substrate and communicates with the bottom of the first liquid-containing ring groove; A second interlayer, which contains A second main ring wall, which can move up and down relative to the first interlayer and is disposed on the radially outer side of the first liquid-containing ring wall; a second main ring wall is formed between the second main ring wall and the first main ring wall. Two gas spaces, and the top edge of the second main ring wall is selectively tightly attached to the top edge of the first main ring wall, thereby closing the second gas space; A second ring baffle is formed on the inner side of the second main ring wall and extends downwardly and obliquely toward the radial inner side of the second main ring wall until the inner edge of the second ring baffle is located at the second Above the liquid ring groove; A second liquid-containing ring wall, which is located on the radially outer side of the second main ring wall and forms an outer liquid-containing ring groove with the second main ring wall; A second liquid pipeline which movably penetrates the substrate and communicates with the bottom of the second liquid-containing ring groove; A mobile outer layer, which contains An outer main ring wall, which is arranged on the radially outer side of the second liquid-containing ring wall so as to move up and down relative to the second interlayer; an outer gas space is formed between the outer main ring wall and the second main ring wall , And the top edge of the outer main ring wall is selectively tightly attached to the top edge of the second main ring wall, thereby closing the outer gas space; An outer layer ring baffle formed on the inner side of the outer layer main ring wall and extending obliquely downward toward the radial inner side of the outer layer main ring wall until the inner edge of the outer layer ring baffle is located above the outer layer liquid ring groove ; An outer layer liquid pipeline that movably penetrates the substrate and is connected to the bottom of the outer layer liquid-containing ring groove; A gas ring wall, the bottom edge of which is fixed on the substrate, and the top edge is relatively slidably close to the outer surface of the outer main ring wall; a common gas is formed between the gas ring wall and the inner main ring wall The first interlayer, the second interlayer, and the mobile outer layer are movably arranged in the common gas space, and the first gas space, the second gas space, and the outer gas space are connected to the common gas space ; A common gas pipeline connected to the common gas space; An air pump, which is connected to the inner gas pipeline and the common gas pipeline; A lifting mechanism is connected to the first interlayer, the second interlayer, and the mobile outer layer, and can respectively control the first interlayer, the second interlayer, and the mobile outer layer to move up and down. 如請求項1所述之氣液分離分層獨立回收裝置,其中, 該固定內層的該內層主環壁包含 一內層本體段,其底緣固設於該基板; 一內層傾斜段,其形成於該內層本體段的頂緣,且朝向該內層主環壁的徑向內側向上傾斜延伸; 該第一夾層的該第一主環壁包含 一第一本體段,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側; 一第一傾斜段,其形成於該第一主環壁的頂緣,且朝向該第一主環壁的徑向內側向上傾斜延伸;該第一傾斜段的末端藉由該第一本體段的上下移動而選擇性地密合於該內層傾斜段的末端,藉此封閉該第一氣體空間。 The gas-liquid separation and stratification independent recovery device as described in claim 1, wherein: The inner main ring wall of the fixed inner layer includes An inner body section, the bottom edge of which is fixed to the base plate; An inner layer inclined section formed on the top edge of the inner layer body section and extending obliquely upward toward the radial inner side of the inner layer main ring wall; The first main ring wall of the first interlayer includes A first body section, which is arranged on the radially outer side of the inner liquid-containing ring wall so as to be movable up and down relative to the fixed inner layer; A first inclined section is formed on the top edge of the first main ring wall and extends upward obliquely toward the radially inner side of the first main ring wall; the end of the first inclined section is supported by the first body section Move up and down to selectively close to the end of the inclined section of the inner layer, thereby closing the first gas space. 如請求項2所述之氣液分離分層獨立回收裝置,其中,該第一夾層的該第一主環壁進一步包含 一第一密封段,其形成於該第一傾斜段的末端,且向下延伸;該第一密封段藉由該第一本體段的上下移動而選擇性地以該第一密封段的徑向外側面抵靠密合於該內層傾斜段的末端,藉此封閉該第一氣體空間。 The gas-liquid separation layered independent recovery device according to claim 2, wherein the first main ring wall of the first interlayer further comprises A first sealing section formed at the end of the first inclined section and extending downward; the first sealing section is selectively moved in the radial direction of the first sealing section by the up and down movement of the first body section The outer side abuts against the end of the inclined section of the inner layer, thereby sealing the first gas space. 如請求項1至3中任一項所述之氣液分離分層獨立回收裝置,其中, 該固定內層進一步包含 一內層底板,其傾斜設於該內層主環壁的徑向內側;該內層底板的底端形成有一液體穿孔; 該內層液體管路的頂端抵靠於該內層底板的底面,且該內層液體管路的頂端開口連通於該液體穿孔; 該內層氣體管路貫穿該內層底板,且該內層氣體管路的頂端開口突出於該內層底板的頂面。 The gas-liquid separation and stratification independent recovery device according to any one of claims 1 to 3, wherein: The fixed inner layer further comprises An inner bottom plate, which is obliquely arranged on the radially inner side of the inner main ring wall; a liquid perforation is formed at the bottom end of the inner bottom plate; The top end of the inner layer liquid pipeline abuts against the bottom surface of the inner layer bottom plate, and the top end opening of the inner layer liquid pipeline communicates with the liquid perforation; The inner layer gas pipeline penetrates the inner layer bottom plate, and the top opening of the inner layer gas pipeline protrudes from the top surface of the inner layer bottom plate. 如請求項1至3中任一項所述之氣液分離分層獨立回收裝置,其中,該固定內層進一步包含 一內層環擋板,其形成於該內層主環壁的內側面,且朝向該內層主環壁的徑向內側向下傾斜延伸;在該內層主環壁的徑向方向上,該內層環擋板的內緣位於該內層氣體管路的頂端開口的內側。 The gas-liquid separation layered independent recovery device according to any one of claims 1 to 3, wherein the fixed inner layer further comprises An inner ring baffle formed on the inner side of the inner main ring wall and extending obliquely downward toward the radial inner side of the inner main ring wall; in the radial direction of the inner main ring wall, The inner edge of the inner layer ring baffle is located inside the top opening of the inner layer gas pipeline. 如請求項5所述之氣液分離分層獨立回收裝置,其中,該固定內層進一步包含 一內層延伸環板,其形成於該內層環擋板的內緣,且向下延伸;該內層延伸環板的底緣的高度位置低於該內層氣體管路的頂端開口的高度位置。 The gas-liquid separation layered independent recovery device according to claim 5, wherein the fixed inner layer further comprises An inner layer extension ring plate formed on the inner edge of the inner layer ring baffle plate and extending downward; the height of the bottom edge of the inner layer extension ring plate is lower than the height of the top opening of the inner layer gas pipeline position. 如請求項1至3中任一項所述之氣液分離分層獨立回收裝置,其中,該第一夾層進一步包含 一第一延伸環板,其形成於該第一環擋板的內緣且向下延伸,該第一延伸環板的底緣的高度位置低於該內層盛液環壁的頂緣的高度位置。 The gas-liquid separation and stratification independent recovery device according to any one of claims 1 to 3, wherein the first interlayer further comprises A first extension ring plate formed on the inner edge of the first ring baffle plate and extending downward, the height of the bottom edge of the first extension ring plate is lower than the height of the top edge of the inner liquid-containing ring wall position. 如請求項1至3中任一項所述之氣液分離分層獨立回收裝置,其中,該升降機構包含 一第一頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該第一主環壁的底緣; 一第二頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該第二主環壁的底緣; 一外層頂昇滑桿,其能上下移動的貫穿該基板,且抵靠於該外層主環壁的底緣; 一頂昇滑座,其能移動地設於該第一頂昇滑桿、該第二頂昇滑桿、及該外層頂昇滑桿的下方; 一橫向驅動裝置,其能橫向移動該頂昇滑座,藉此選擇性地使該頂昇滑座抵靠於該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿的底端; 一升降驅動裝置,其能向上推頂該頂昇滑座,藉此使該頂昇滑座向上推頂該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿,並藉由該第一頂昇滑桿、該第二頂昇滑桿、或該外層頂昇滑桿向上推頂該第一主環壁、該第二主環壁、或該外層主環壁。 The gas-liquid separation and stratification independent recovery device according to any one of claims 1 to 3, wherein the lifting mechanism includes A first lifting slide bar, which can move up and down through the base plate and abuts against the bottom edge of the first main ring wall; A second lifting slide bar, which can move up and down through the base plate and abuts against the bottom edge of the second main ring wall; An outer jacking slide bar, which can move up and down through the base plate and abuts against the bottom edge of the outer main ring wall; A jacking slide seat, which is movably arranged under the first jacking slide bar, the second jacking slide bar, and the outer layer jacking slide bar; A lateral drive device capable of moving the jacking slide laterally, thereby selectively making the jacking slide abut against the first jacking slide bar, the second jacking slide bar, or the outer jacking The bottom end of the slider; A lifting drive device capable of pushing up the jacking slide, thereby causing the jacking slide to push up the first jacking slide bar, the second jacking slide bar, or the outer jacking slide bar , And push up the first main ring wall, the second main ring wall, or the outer main ring wall by the first jacking slide bar, the second jacking slide bar, or the outer jacking slide bar . 如請求項1至3中任一項所述之氣液分離分層獨立回收裝置,其中,該第一夾層的該第一盛液環壁的底緣固設於該第一主環壁的底緣,且該第一盛液環壁隨著該第一主環壁移動。The gas-liquid separation and stratification independent recovery device according to any one of claims 1 to 3, wherein the bottom edge of the first liquid-containing ring wall of the first interlayer is fixed on the bottom of the first main ring wall And the first liquid-containing ring wall moves with the first main ring wall. 一種氣液分離分層獨立回收裝置,其中包含 一基板; 一固定內層,其包含 一內層主環壁,其底緣固設於該基板; 一內層盛液環壁,其底緣固設於該基板,且位於該內層主環壁的徑向外側,並與該內層主環壁之間形成一外層盛液環槽; 一內層液體管路,其貫穿該基板且連通於該內層主環壁內側; 一內層氣體管路,其貫穿該基板且連通於該內層主環壁內側,且該內層氣體管路的頂端開口高於該內層液體管路的頂端開口; 一移動外層,其包含 一外層主環壁,其能相對於該固定內層上下移動地設於該內層盛液環壁的徑向外側;該外層主環壁與該內層主環壁之間形成一外層氣體空間,且該外層主環壁的頂緣選擇性的密合於該內層主環壁的頂緣,藉此封閉該外層氣體空間; 一外層環擋板,其形成於該外層主環壁的內側面,且朝向該外層主環壁的徑內側向下傾斜延伸至該外層環擋板的內緣位於該外層盛液環槽上方; 一外層液體管路,其貫穿該基板且連通於該外層盛液環槽的底部; 一氣體環壁,其底緣固設於該基板,且頂緣能相對滑動地密合於該外層主環壁的外側面;該氣體環壁與該內層主環壁之間形成一共同氣體空間,該移動外層能移動地設於該共同氣體空間內,且該外層氣體空間連通該共同氣體空間; 一共同氣體管路,其連通於該共同氣體空間; 一抽氣泵浦,其連通於該內層氣體管路及該共同氣體管路; 一升降機構,其連接於該移動外層,且能控制該移動外層上下移動。 A gas-liquid separation and stratification independent recovery device, which contains A substrate; A fixed inner layer, which contains An inner main ring wall, the bottom edge of which is fixed on the base plate; An inner liquid-containing ring wall, the bottom edge of which is fixed on the substrate and located at the radially outer side of the inner main ring wall, and an outer liquid-containing ring groove is formed between the inner main ring wall and the inner main ring wall; An inner liquid pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall; An inner gas pipeline that penetrates the substrate and communicates with the inner side of the inner main ring wall, and the top opening of the inner gas pipeline is higher than the top opening of the inner liquid pipeline; A mobile outer layer, which contains An outer main ring wall, which can move up and down with respect to the fixed inner layer and is disposed on the radially outer side of the inner liquid-containing ring wall; an outer gas space is formed between the outer main ring wall and the inner main ring wall , And the top edge of the outer main ring wall selectively adheres to the top edge of the inner main ring wall, thereby closing the outer gas space; An outer layer ring baffle formed on the inner side of the outer layer main ring wall and extending obliquely downward toward the radial inner side of the outer layer main ring wall until the inner edge of the outer layer ring baffle is located above the outer layer liquid ring groove; An outer layer liquid pipeline which penetrates the substrate and communicates with the bottom of the outer layer liquid-containing ring groove; A gas ring wall, the bottom edge of which is fixed on the substrate, and the top edge is relatively slidably close to the outer surface of the outer main ring wall; a common gas is formed between the gas ring wall and the inner main ring wall Space, the mobile outer layer is movably arranged in the common gas space, and the outer gas space is connected to the common gas space; A common gas pipeline connected to the common gas space; An air pump, which is connected to the inner gas pipeline and the common gas pipeline; A lifting mechanism is connected to the moving outer layer and can control the moving outer layer to move up and down.
TW109136292A 2020-10-20 2020-10-20 Gas-liquid separation and stratification independent recovery device TWI727902B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101439235A (en) * 2007-11-22 2009-05-27 东京毅力科创株式会社 Gas-liquid separating device
TW201221482A (en) * 2010-11-26 2012-06-01 Taiwan Water Recycle Technology Co Ltd Recycle and treatment method for waste produced by sawing and grinding silicon wafer and equipment thereof
US20170294324A1 (en) * 2013-08-12 2017-10-12 Veeco Precision Surface Processing Llc Collection chamber apparatus to separate multiple fluids during the semiconductor wafer processing cycle
CN210096998U (en) * 2019-05-21 2020-02-21 浙江展邦电子科技有限公司 Multistage staggered floor compensation extraction device of etching solution

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101439235A (en) * 2007-11-22 2009-05-27 东京毅力科创株式会社 Gas-liquid separating device
TW201221482A (en) * 2010-11-26 2012-06-01 Taiwan Water Recycle Technology Co Ltd Recycle and treatment method for waste produced by sawing and grinding silicon wafer and equipment thereof
US20170294324A1 (en) * 2013-08-12 2017-10-12 Veeco Precision Surface Processing Llc Collection chamber apparatus to separate multiple fluids during the semiconductor wafer processing cycle
CN210096998U (en) * 2019-05-21 2020-02-21 浙江展邦电子科技有限公司 Multistage staggered floor compensation extraction device of etching solution

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