TWI719742B - Detection Systems - Google Patents

Detection Systems Download PDF

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TWI719742B
TWI719742B TW108144508A TW108144508A TWI719742B TW I719742 B TWI719742 B TW I719742B TW 108144508 A TW108144508 A TW 108144508A TW 108144508 A TW108144508 A TW 108144508A TW I719742 B TWI719742 B TW I719742B
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detection
control
light
light source
emitting
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TW108144508A
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TW202122750A (en
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徐榮祥
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駿曦股份有限公司
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本發明為一種檢測系統,包括一燈源裝置環設於一檢測裝置,以照明檢測裝置,其中燈源裝置包括有一燈座內設有至少一基板,基板上排列設有複數排發光元件,燈座上更設有一擴散板,以覆蓋基板以及複數發光元件。一控制裝置連接檢測裝置以及基板,以控制檢測裝置以及所有發光元件發光,或控制複數排發光元件間隔發光,令複數發光元件發射的光源呈現條紋狀光源。本發明可提供全方位的光源,且光源可以條紋狀的方式呈現,能避免待測物過度反光,可提升的檢測的準確率。The present invention is a detection system, which includes a light source device arranged around a detection device to illuminate the detection device, wherein the light source device includes a lamp holder provided with at least one substrate, and a plurality of rows of light-emitting elements are arranged on the substrate. A diffuser plate is further provided on the seat to cover the substrate and a plurality of light-emitting elements. A control device is connected to the detection device and the substrate to control the detection device and all the light-emitting elements to emit light, or to control a plurality of rows of light-emitting elements to emit light at intervals, so that the light source emitted by the plurality of light-emitting elements presents a striped light source. The invention can provide an omnidirectional light source, and the light source can be presented in a striped manner, can avoid excessive reflection of the object to be measured, and can improve the accuracy of detection.

Description

檢測系統Detection Systems
本發明係有關一種檢測技術,特別是指一種可提供良好照明之檢測系統。The present invention relates to a detection technology, in particular to a detection system that can provide good lighting.
過去傳統製造商在檢驗出廠的產品是否具有缺陷時,僅能以人工的方式,逐一挑選檢查產品,但這樣的檢驗方式不但耗時,更耗費許多人力。隨著科技日新月異,科技不斷的進步,目前已開始發展出利用光學進行產品檢驗的技術,該技術係透過攝影機拍攝產品的影像後,利用後端儀器或管理者對影像直接進行檢測,能有效減少檢驗的時間。In the past, traditional manufacturers could only manually select and inspect the products one by one when inspecting whether the products shipped from the factory are defective. However, this inspection method is not only time-consuming, but also a lot of manpower. With the rapid development of science and technology and the continuous advancement of science and technology, the use of optics for product inspection technology has begun to be developed. This technology is to use back-end equipment or managers to directly inspect the image after the image of the product is captured by a camera, which can effectively reduce Time of inspection.
一般在利用影像檢測待測物之裝置結構包括有一檢視座,檢視座的上方設有固定式的發光裝置以及攝影機。檢測時管理者將待測物放置在檢視座上,並操作發光裝置照明待測物後,操作攝影機拍攝待測物之影像,以產生檢測影像提供給管理者判斷待測物的情況。其缺點在於,發光裝置僅設置在一固定位置,使光源的照射面較不完整,且攝影機以及檢視座皆採固定式,在檢測待測物時,無法任意轉動攝影機或待測物,使得檢測時容易出現檢測死角,檢測效果不佳。Generally, a device structure that uses images to detect an object to be tested includes a viewing base, and a fixed light-emitting device and a camera are arranged above the viewing base. During the inspection, the manager places the test object on the viewing stand, and operates the light-emitting device to illuminate the test object, and then operates the camera to shoot the image of the test object to generate the test image for the manager to judge the status of the test object. The disadvantage is that the light-emitting device is only set at a fixed position, so that the irradiation surface of the light source is relatively incomplete, and the camera and the viewing stand are both fixed. When detecting the object to be tested, the camera or the object to be tested cannot be arbitrarily rotated, making the detection It is easy to detect dead corners, and the detection effect is not good.
再者,若待測物的表面為高反射的金屬表面時,在一般發光裝置的光線在照射下,待測物的表面即使具有不正常的凹陷,也會反射回高亮度的光線,造成管理者無法觀察到表面不正常的凹陷,因而遺漏掉產品的缺陷。Furthermore, if the surface of the object to be measured is a highly reflective metal surface, under the light of a general light-emitting device, even if the surface of the object to be measured has abnormal depressions, it will reflect back high-brightness light, causing management The person cannot observe the abnormal dents on the surface, and thus misses the defects of the product.
有鑑於此,本發明遂針對上述習知技術之缺失,提出一種檢測系統,以有效克服上述之該等問題。In view of this, the present invention addresses the shortcomings of the above-mentioned conventional technologies and proposes a detection system to effectively overcome the above-mentioned problems.
本發明之主要目的在提供一種檢測系統,其可在待測物周圍環設光源,以提供全方位的光源,且光源以條紋狀呈現,能避免光線不當地被待測物反射,可提升的檢測的準確率。The main purpose of the present invention is to provide a detection system, which can surround the object to be tested with a light source to provide a omni-directional light source, and the light source is presented in stripes, which can prevent the light from being improperly reflected by the object to be tested, and can improve The accuracy of detection.
本發明之另一目的在提供一種檢測系統,可有效檢測待測物的各種角度,避免出現死角。Another object of the present invention is to provide a detection system that can effectively detect various angles of the object to be tested and avoid blind spots.
為達上述之目的,本發明提供一種檢測系統包括,一檢測裝置以及一燈源裝置連接一控制裝置,其中燈源裝置環設檢測裝置,以照明檢測裝置。燈源裝置之結構包括一燈座,燈座內設有至少一基板,且基板上排列設有複數排發光元件,以及一擴散板設置在燈座上,以覆蓋基板及複數發光元件;控制裝置則用以控制檢測裝置作動,以及所有發光元件發光,或者控制複數排發光元件間隔發光,令複數發光元件發射之光源呈現條紋狀光源。To achieve the above objective, the present invention provides a detection system including a detection device and a light source device connected to a control device, wherein the light source device is surrounded by the detection device to illuminate the detection device. The structure of the lamp source device includes a lamp holder, at least one substrate is arranged in the lamp holder, and a plurality of rows of light-emitting elements are arranged on the substrate, and a diffuser plate is arranged on the lamp holder to cover the substrate and the plurality of light-emitting elements; control device It is used to control the operation of the detection device and all the light-emitting elements to emit light, or to control a plurality of rows of light-emitting elements to emit light at intervals, so that the light source emitted by the plurality of light-emitting elements presents a striped light source.
其中燈源裝置為半圓形燈源裝置,以環繞於檢測裝置。The light source device is a semicircular light source device to surround the detection device.
檢測系統更包括一側光源裝置,相對設置於燈源裝置另一端,且連接控制裝置,以接收控制裝置之控制發光。The detection system further includes a light source device on one side, which is opposite to the other end of the light source device, and is connected to the control device to receive control light emission from the control device.
其中檢測裝置更包括一移動裝置連接控制裝置,移動裝置可供夾持一待測物,並根據控制裝置之控制轉動待測物;一攝影裝置連接控制裝置,且接收控制裝置之控制拍攝不同角度之待測物的至少一檢測影像,並將檢測影像傳遞至控制裝置;一照明裝置設置於攝影裝置之鏡頭一側,且連接控制裝置,並接收控制裝置之控制以提供光源。The detection device further includes a mobile device connected to the control device. The mobile device can hold an object to be tested and rotate the object to be tested according to the control of the control device; a photographing device is connected to the control device and receives the control of the control device to shoot different angles At least one detection image of the object to be tested, and the detection image is transmitted to the control device; an illumination device is arranged on the lens side of the photographing device, connected to the control device, and receives the control of the control device to provide a light source.
其中檢測裝置更包括一固定架以供設置一待測物;一移動裝置連接控制裝置,移動裝置可供夾持一攝影裝置,並根據控制裝置之控制,移動攝影裝置沿著待測物邊緣,以拍攝至少一檢測影像,攝影裝置亦連接控制裝置,令攝影裝置可將檢測影像傳遞至控制裝置;一照明裝置設置於攝影裝置之鏡頭一側,且連接控制裝置,並接收控制裝置之控制以提供光源。The detection device further includes a fixed frame for setting an object to be measured; a moving device is connected to the control device, and the moving device can hold a photographing device. According to the control of the control device, the moving photographing device is along the edge of the object to be measured. To shoot at least one detection image, the photography device is also connected to the control device, so that the photography device can transmit the detection image to the control device; an illumination device is arranged on the lens side of the photography device, and is connected to the control device, and receives the control of the control device. Provide light source.
底下藉由具體實施例詳加說明,當更容易瞭解本發明之目的、技術內容、特點及其所達成之功效。Detailed descriptions are given below by specific embodiments, so that it will be easier to understand the purpose, technical content, features, and effects of the present invention.
本發明提供一種檢測系統,其可提供全方位的光源,且光源能以條紋狀的方式呈現,可避免待測物過度反光,以提升的檢測的準確率,且能檢測待測物的各種角度,避免出現檢測死角。The present invention provides a detection system, which can provide omnidirectional light sources, and the light sources can be presented in a striped manner, which can avoid excessive reflection of the object to be tested, so as to improve the detection accuracy, and can detect various angles of the object to be tested , To avoid detecting blind spots.
請參照第一圖至第三圖,以詳細說明本發明之檢測系統1結構如何達到上述之功效,檢測系統1包括一檢測裝置10、一燈源裝置20、一側光源裝置29以及一控制裝置30,控制裝置30可為電腦裝置,電性連接並控制檢測裝置10、燈源裝置20以及側光源裝置29。檢測裝置10為提供拍攝待測物影像的設備,檢測裝置10所拍攝的影像可提供給控制裝置30,以進行待測物的檢測。燈源裝置20安裝在一架體21上,燈源裝置20可提供環繞等距光源,其中較佳的燈源裝置20可為半圓形燈源裝置環設檢測裝置10,藉此達到無死角照明檢測裝置10之中,待測物的目的,以提供光源進行檢測。側光源裝置29則設置在架體21上,且相對燈源裝置20的另一端,用以輔助燈源裝置20提供額外的光源。Please refer to the first to third figures to explain in detail how the structure of the detection system 1 of the present invention achieves the above-mentioned effects. The detection system 1 includes a detection device 10, a light source device 20, a side light source device 29, and a control device 30. The control device 30 may be a computer device, which is electrically connected to and controls the detection device 10, the light source device 20, and the side light source device 29. The detection device 10 is a device that provides images of the object to be measured, and the image taken by the detection device 10 can be provided to the control device 30 to perform detection of the object to be measured. The light source device 20 is mounted on a frame 21. The light source device 20 can provide surrounding equidistant light sources. The preferred light source device 20 can be a semicircular light source device with a detection device 10 around it, thereby achieving no dead spots. In the illumination detection device 10, the purpose of the object to be tested is to provide a light source for detection. The side light source device 29 is arranged on the frame 21 and opposite to the other end of the light source device 20 to assist the light source device 20 to provide additional light sources.
請配合參照第三圖,燈源裝置20包括有一燈座22,燈座22內設有至少一基板24可為電路板,且基板24上排列設有複數排發光元件26,發光元件26可為發光二極體,如白光發光二極體,燈座22上更設有一擴散板28,以覆蓋基板24以及複數發光元件26;燈座22內的基板24係電性連接控制裝置30,令控制裝置30可控制基板24上所有發光元件26發光,或者僅控制複數排發光元件26間隔發光,令複數發光元件26發射之光源呈現條紋狀光源,藉此降低亮度。Please refer to the third figure. The light source device 20 includes a lamp holder 22. The lamp holder 22 is provided with at least one substrate 24 which can be a circuit board, and a plurality of rows of light-emitting elements 26 are arranged on the substrate 24. The light-emitting elements 26 can be For light-emitting diodes, such as white light-emitting diodes, the lamp holder 22 is further provided with a diffuser 28 to cover the substrate 24 and the plurality of light-emitting elements 26; the substrate 24 in the lamp holder 22 is electrically connected to the control device 30 to control The device 30 can control all the light-emitting elements 26 on the substrate 24 to emit light, or only control a plurality of rows of light-emitting elements 26 to emit light at intervals, so that the light source emitted by the plurality of light-emitting elements 26 appears as a striped light source, thereby reducing brightness.
接著請參照第一圖以及第二圖,以說明檢測裝置10之結構,檢測裝置10包括有一移動裝置12以及一攝影裝置14,移動裝置12及攝影裝置14皆電性連接控制裝置30,並接收控制裝置30的控制,本實施例之移動裝置12為機器手臂可供夾持一待測物40,控制裝置30可控制移動裝置12移動並轉動待測物40的角度;移動裝置12上更設有一投光器122,其電性連接並接收控制裝置30之控制開關,投光器122開啟後可對準待測物40照明,並隨著待側物40移動。攝影裝置14則用以拍攝待測物40的影像,且攝影裝置14之鏡頭一側更設有一照明裝置142,照明裝置142連接並接收控制裝置30之控制,照明裝置142可提供光源給攝影裝置14進行影像的拍攝。在進行檢測時控制裝置30控制移動裝置12轉動待測物40,同時控制裝置30會控制攝影裝置14拍攝多張不同視角之待測物40的檢測影像後,再將檢測影像傳遞至控制裝置30中,令控制裝置30自動判斷檢測影像中的待測物40是否具有缺陷,以及符合產品出廠標準,或者控制裝置30將檢測影像提供給管理者,令管理者針對檢測影像進行人工判斷。Next, please refer to the first and second figures to illustrate the structure of the detection device 10. The detection device 10 includes a mobile device 12 and a photographing device 14. Both the mobile device 12 and the photographing device 14 are electrically connected to the control device 30 and receive The control device 30 is controlled. The mobile device 12 of this embodiment is a robotic arm for holding a test object 40. The control device 30 can control the mobile device 12 to move and rotate the angle of the test object 40; the mobile device 12 is equipped with There is a light projector 122 which is electrically connected to and receives the control switch of the control device 30. After the light projector 122 is turned on, the light projector 122 can aim at the object 40 to be measured and move along with the object 40 to be measured. The photographing device 14 is used to photograph the image of the object 40, and the lens side of the photographing device 14 is further provided with an illuminating device 142, which is connected to and receives the control of the control device 30, and the illuminating device 142 can provide a light source to the photographing device 14Carry out image shooting. During the detection, the control device 30 controls the mobile device 12 to rotate the test object 40, and at the same time, the control device 30 controls the photographing device 14 to take multiple detection images of the test object 40 with different viewing angles, and then transmits the detection images to the control device 30 , The control device 30 is allowed to automatically determine whether the test object 40 in the inspection image has a defect and meets the product factory standard, or the control device 30 provides the inspection image to the manager, and the manager makes a manual judgment on the inspection image.
接下來請配合參照第二圖、第四A圖、第四B圖、第五A圖以及第五B圖,以說明燈源裝置20的燈光狀態對於檢測影像的影響。本實施例係舉例待測物40為具高反射率材料特性,如具光滑金屬表面的物件,首先在第四A圖中,當控制裝置30控制燈源裝置20中的所有發光元件26開啟,此時燈源裝置20投射的亮度過大,如第四B圖所示,待測物40的凹陷處仍會反射高亮度的光線,最終導致檢測影像所呈現的凹陷處不明顯,因此該檢測影像無論是經由控制裝置30自動判斷,或是人工判斷皆會產生失誤。Next, please refer to the second figure, the fourth figure A, the fourth figure B, the fifth figure A and the fifth figure B to illustrate the influence of the light state of the light source device 20 on the detected image. This embodiment exemplifies that the test object 40 is a material with high reflectivity, such as an object with a smooth metal surface. First, in Figure 4A, when the control device 30 controls all the light-emitting elements 26 in the light source device 20 to turn on, At this time, the brightness projected by the light source device 20 is too large. As shown in Figure 4B, the recess of the object 40 will still reflect high-brightness light, which will eventually result in the recession presented by the detection image being inconspicuous. Therefore, the detection image Either the automatic judgment by the control device 30 or the manual judgment will cause errors.
對此,當待測物40為高反射表面的物體時,請參照第五A圖,本發明檢測系統1的控制裝置30可控制燈源裝置20之基板24上的複數排發光元件26間隔發光,以降低光源亮度,此時拍攝出來的檢測影像如第五B圖所示,光線投射在待測物40的凹陷處呈現出清晰的條紋狀,從而有效地提升待測物40表面形狀的精確度。In this regard, when the test object 40 is an object with a highly reflective surface, please refer to Figure 5A. The control device 30 of the detection system 1 of the present invention can control the plurality of rows of light-emitting elements 26 on the substrate 24 of the light source device 20 to emit light at intervals. , In order to reduce the brightness of the light source, the detected image taken at this time is shown in Figure 5B. The light projected on the depression of the object 40 presents a clear stripe shape, thereby effectively improving the accuracy of the surface shape of the object 40 degree.
除上述實施例之外,本發明更提供第二實施例,請參照第六圖與第七圖,本實施例之檢測系統2包括有一檢測裝置50、一燈源裝置20以及一控制裝置30。檢測裝置50為提供拍攝待測物影像的設備,所拍攝的影像可提供給控制裝置30,以對待測物40進行檢測。燈源裝置20係環設檢測裝置50,以提供環繞等距光源,較佳的燈源裝置20可為半圓形燈源裝置,藉此無死角照明檢測裝置10中的待測物。其中,燈源裝置20以及控制裝置30之結構、連接關係,以及燈源裝置20所產生的功效,皆與上述實施例相同,這裡不再贅述。In addition to the above-mentioned embodiments, the present invention further provides a second embodiment. Please refer to FIG. 6 and FIG. 7. The detection system 2 of this embodiment includes a detection device 50, a light source device 20, and a control device 30. The detection device 50 is a device for capturing images of the object under test, and the captured images can be provided to the control device 30 to detect the object under test 40. The light source device 20 is surrounded by a detection device 50 to provide surrounding equidistant light sources. The preferred light source device 20 may be a semicircular light source device, thereby illuminating the object under test in the detection device 10 without blind spots. Among them, the structure and connection relationship of the light source device 20 and the control device 30, and the effects produced by the light source device 20 are the same as those of the above-mentioned embodiment, and will not be repeated here.
本實施例與前一實施例的差異在於,如第六圖與第七圖所示,檢測裝置50之結構尚包括一固定架52以供設置待測物40,移動裝置54可為機械手臂電性連接控制裝置30,且夾持有攝影裝置56,攝影裝置56之鏡頭一側設有照明裝置562,其電性連接並接收控制裝置30之控制,以提供光源。通過控制裝置30之控制,移動裝置54操作攝影裝置56沿著待測物40邊緣拍攝至少一檢測影像,其中攝影裝置56亦電性連接並接收控制裝置30之控制,因此攝影裝置56可對待測物40拍攝多張不同視角的檢測影像,並將檢測影像傳遞至控制裝置30中,令控制裝置30自動判斷檢測影像中的待測物40是否具有缺陷,是否符合產品出廠標準,或者將檢測影像提供給管理者,令管理者進行人工判斷。The difference between this embodiment and the previous embodiment is that, as shown in the sixth and seventh figures, the structure of the detection device 50 further includes a fixed frame 52 for setting the object under test 40, and the mobile device 54 can be a mechanical arm electric The control device 30 is sexually connected, and a photographing device 56 is clamped. The lens side of the photographing device 56 is provided with an illuminating device 562 which is electrically connected to and receives the control of the control device 30 to provide a light source. Through the control of the control device 30, the mobile device 54 operates the photographing device 56 to shoot at least one detected image along the edge of the object 40. The photographing device 56 is also electrically connected and controlled by the control device 30, so the photographing device 56 can be tested The object 40 shoots multiple inspection images with different viewing angles, and transmits the inspection images to the control device 30, so that the control device 30 automatically determines whether the object 40 in the inspection image is defective, whether it meets the product factory standard, or the inspection image Provided to managers, allowing managers to make manual judgments.
綜上所述,本發明可在待測物周圍環設光源,以提供全方位的光源,且光源可條紋狀的方式呈現,能避免光線過度反光,提升的檢測的準確率,檢測裝置更可檢測待測物的各種角度,避免檢驗出現死角。In summary, the present invention can surround the object to be tested with a light source to provide a omni-directional light source, and the light source can be presented in a striped manner, which can avoid excessive reflection of light, improve the detection accuracy, and the detection device is more effective. Detect various angles of the object to be tested to avoid blind spots in the test.
唯以上所述者,僅為本發明之較佳實施例而已,並非用來限定本發明實施之範圍。故即凡依本發明申請範圍所述之特徵及精神所為之均等變化或修飾,均應包括於本發明之申請專利範圍內。Only the above are only preferred embodiments of the present invention, and are not used to limit the scope of implementation of the present invention. Therefore, all equivalent changes or modifications made in accordance with the characteristics and spirit of the application scope of the present invention shall be included in the patent application scope of the present invention.
1:檢測系統 10:檢測裝置 12:移動裝置 122:投光器 14:攝影裝置 142:照明裝置 20:燈源裝置 21:架體 22:燈座 24:基板 26:發光元件 28:擴散板 29:側光源裝置 30:控制裝置 40:待測物 2:檢測系統 50:檢測裝置 52:固定架 54:移動裝置 56:攝影裝置 562:照明裝置1: Detection system 10: Detection device 12: mobile device 122: Projector 14: Photography installation 142: Lighting Device 20: Light source device 21: Frame 22: Lamp holder 24: substrate 26: Light-emitting element 28: diffuser 29: Side light source device 30: control device 40: DUT 2: Detection system 50: detection device 52: fixed frame 54: mobile device 56: Photography installation 562: Lighting Device
第一圖係為本發明之立體圖。 第二圖係為本發明之系統方塊圖。 第三圖係為本發明之燈源裝置透視圖。 第四A圖係為本發明之燈源裝置所有發光元件發光示意圖。 第四B圖係為本發明之燈源裝置所有發光元件發光照射至待測物的檢測影像示意圖。 第五A圖係為本發明之燈源裝置間隔排發光元件發光示意圖。 第五B圖係為本發明之燈源裝置間隔排發光元件發光照射至待測物的檢測影像示意圖。 第六圖係為本發明之另一實施例立體圖。 第七圖係為本發明之另一實施例系統方塊圖。 The first figure is a three-dimensional view of the present invention. The second figure is a block diagram of the system of the present invention. The third figure is a perspective view of the light source device of the present invention. Fig. 4A is a schematic diagram of all the light-emitting elements of the light source device of the present invention. The fourth figure B is a schematic diagram of the detection image of all the light-emitting elements of the light source device of the present invention illuminating the object under test. Fig. 5A is a schematic diagram showing the light emission of the light-emitting elements of the light source device of the present invention. Fig. 5B is a schematic diagram of the detection image of the light-emitting element of the light source device of the present invention illuminating the object under test. The sixth figure is a perspective view of another embodiment of the present invention. The seventh figure is a system block diagram of another embodiment of the present invention.
1:檢測系統 1: Detection system
10:檢測裝置 10: Detection device
12:移動裝置 12: mobile device
122:投光器 122: Projector
14:攝影裝置 14: Photography installation
142:照明裝置 142: Lighting Device
20:燈源裝置 20: Light source device
21:架體 21: Frame
22:燈座 22: Lamp holder
28:擴散板 28: diffuser
29:側光源裝置 29: Side light source device
40:待測物 40: DUT

Claims (12)

  1. 一種檢測系統,包括: 一檢測裝置; 一燈源裝置,環設該檢測裝置,以照明該檢測裝置,該燈源裝置包括: 一燈座,其內設有至少一基板,該基板上排列設有複數排發光元件;及 一擴散板,設置於該燈座上,以覆蓋該基板以及該等發光元件;以及 一控制裝置,連接該檢測裝置以及該基板,以控制該檢測裝置以及所有該等發光元件發光,或該控制裝置可控制該等排發光元件間隔發光,令該等發光元件發射之光源呈現條紋狀光源。 A detection system includes: A detection device; A light source device surrounding the detection device to illuminate the detection device, and the light source device includes: A lamp holder in which at least one substrate is arranged, and a plurality of rows of light-emitting elements are arranged on the substrate; and A diffuser plate arranged on the lamp holder to cover the substrate and the light-emitting elements; and A control device is connected to the detection device and the substrate to control the detection device and all the light-emitting elements to emit light, or the control device can control the rows of light-emitting elements to emit light at intervals, so that the light source emitted by the light-emitting elements is striped light source.
  2. 如請求項1所述之檢測系統,其中該燈源裝置為半圓形燈源裝置,以環繞於該檢測裝置。The detection system according to claim 1, wherein the light source device is a semicircular light source device to surround the detection device.
  3. 如請求項1所述之檢測系統,其中該等發光元件為發光二極體。The detection system according to claim 1, wherein the light-emitting elements are light-emitting diodes.
  4. 如請求項1所述之檢測系統,更包括一側光源裝置,相對設置於該燈源裝置另一端,且連接該控制裝置,以接收該控制裝置之控制發光。The detection system according to claim 1, further comprising a light source device on one side, which is arranged at the other end of the light source device opposite to the other end of the light source device, and is connected to the control device to receive the control light emission of the control device.
  5. 如請求項1所述之檢測系統,其中該基板為電路板。The inspection system according to claim 1, wherein the substrate is a circuit board.
  6. 如請求項1所述之檢測系統,其中該檢測裝置更包括: 一移動裝置,連接該控制裝置,該移動裝置可供夾持一待測物,並根據該控制裝置之控制轉動該待測物;及 一攝影裝置,連接該控制裝置,接收該控制裝置之控制拍攝不同角度之該待測物的至少一檢測影像,並將該檢測影像傳遞至該控制裝置。 The detection system according to claim 1, wherein the detection device further includes: A moving device connected to the control device, the moving device can hold an object under test, and rotate the object under test according to the control of the control device; and A photographing device is connected to the control device, receives at least one detection image of the object under test from different angles controlled by the control device, and transmits the detection image to the control device.
  7. 如請求項6所述之檢測系統,其中攝影裝置之鏡頭一側更設有一照明裝置,連接該控制裝置,並接收該控制裝置之控制以提供光源。The detection system according to claim 6, wherein an illumination device is further provided on the lens side of the photographing device, connected to the control device, and controlled by the control device to provide a light source.
  8. 如請求項6所述之檢測系統,其中該移動裝置為機器手臂。The detection system according to claim 6, wherein the mobile device is a robotic arm.
  9. 如請求項6所述之檢測系統,其中該移動裝置上更設有一投光器,電性連接控制裝置,該投光器可對準該待測物照明。The detection system according to claim 6, wherein the mobile device is further provided with a light projector, which is electrically connected to the control device, and the light projector can be aimed at the object to be tested for illumination.
  10. 如請求項1所述之檢測系統,其中該檢測裝置更包括: 一固定架,以供設置一待測物; 一攝影裝置,連接該控制裝置,以拍攝該待測物產生至少一檢測影像,並將該檢測影像傳遞至該控制裝置;及 一移動裝置,連接該控制裝置,該移動裝置可供夾持該攝影裝置,該移動裝置根據該控制裝置之控制,移動該攝影裝置沿著該待測物邊緣,以拍攝該檢測影像。 The detection system according to claim 1, wherein the detection device further includes: A fixed frame for setting an object to be tested; A photographing device connected to the control device to photograph the object to be tested to generate at least one detection image, and transmit the detection image to the control device; and A moving device is connected to the control device. The moving device can clamp the photographing device. The moving device moves the photographing device along the edge of the object to be measured according to the control of the control device to shoot the detection image.
  11. 如請求項10所述之檢測系統,其中攝影裝置之鏡頭一側更設有一照明裝置,連接該控制裝置,並接收該控制裝置之控制以提供光源。The detection system according to claim 10, wherein a lighting device is further provided on the lens side of the photographing device, which is connected to the control device, and receives the control of the control device to provide a light source.
  12. 如請求項10所述之檢測系統,其中該移動裝置為機器手臂。The detection system according to claim 10, wherein the mobile device is a robotic arm.
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TW200644268A (en) * 2005-06-02 2006-12-16 Univ Nat Pingtung Sci & Tech An optical examining mechanism with a movable light source
TW200718924A (en) * 2005-11-10 2007-05-16 Univ Nat Pingtung Sci & Tech An optical examining apparatus having a composite light source
TW201435335A (en) * 2013-03-04 2014-09-16 Advanced Semiconductor Eng Inspection device and method
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