TWI503481B - A vacuum venting device and a vacuum venting method, and a substrate processing device - Google Patents

A vacuum venting device and a vacuum venting method, and a substrate processing device Download PDF

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TWI503481B
TWI503481B TW099142146A TW99142146A TWI503481B TW I503481 B TWI503481 B TW I503481B TW 099142146 A TW099142146 A TW 099142146A TW 99142146 A TW99142146 A TW 99142146A TW I503481 B TWI503481 B TW I503481B
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vacuum
vacuum pump
exhaust
processing chamber
pump
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TW099142146A
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TW201139851A (en
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Toshiya Inoue
Kenji Hashimoto
Masahiro Yamamoto
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Ulvac Inc
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04BPOSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
    • F04B37/00Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00
    • F04B37/10Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use
    • F04B37/14Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use to obtain high vacuum
    • F04B37/16Means for nullifying unswept space
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04BPOSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS
    • F04B37/00Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00
    • F04B37/10Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use
    • F04B37/14Pumps having pertinent characteristics not provided for in, or of interest apart from, groups F04B25/00 - F04B35/00 for special use to obtain high vacuum
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C23/00Combinations of two or more pumps, each being of rotary-piston or oscillating-piston type, specially adapted for elastic fluids; Pumping installations specially adapted for elastic fluids; Multi-stage pumps specially adapted for elastic fluids
    • F04C23/001Combinations of two or more pumps, each being of rotary-piston or oscillating-piston type, specially adapted for elastic fluids; Pumping installations specially adapted for elastic fluids; Multi-stage pumps specially adapted for elastic fluids of similar working principle
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C25/00Adaptations of pumps for special use of pumps for elastic fluids
    • F04C25/02Adaptations of pumps for special use of pumps for elastic fluids for producing high vacuum
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C28/00Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids
    • F04C28/02Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids specially adapted for several pumps connected in series or in parallel
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C28/00Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids
    • F04C28/06Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids specially adapted for stopping, starting, idling or no-load operation
    • F04C28/065Capacity control using a multiplicity of units or pumping capacities, e.g. multiple chambers, individually switchable or controllable
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C28/00Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids
    • F04C28/08Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids characterised by varying the rotational speed
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C28/00Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids
    • F04C28/24Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids characterised by using valves controlling pressure or flow rate, e.g. discharge valves or unloading valves
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C28/00Control of, monitoring of, or safety arrangements for, pumps or pumping installations specially adapted for elastic fluids
    • F04C28/28Safety arrangements; Monitoring
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C2220/00Application
    • F04C2220/10Vacuum
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C2220/00Application
    • F04C2220/30Use in a chemical vapor deposition [CVD] process or in a similar process
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C2240/00Components
    • F04C2240/70Use of multiplicity of similar components; Modular construction
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F04POSITIVE - DISPLACEMENT MACHINES FOR LIQUIDS; PUMPS FOR LIQUIDS OR ELASTIC FLUIDS
    • F04CROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT MACHINES FOR LIQUIDS; ROTARY-PISTON, OR OSCILLATING-PISTON, POSITIVE-DISPLACEMENT PUMPS
    • F04C2270/00Control; Monitoring or safety arrangements
    • F04C2270/56Number of pump/machine units in operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Compressors, Vaccum Pumps And Other Relevant Systems (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Applications Or Details Of Rotary Compressors (AREA)

Description

真空排氣裝置及真空排氣方法以及基板處理裝置Vacuum exhaust device and vacuum exhaust method and substrate processing device

本發明,係有關於將處理室排氣為真空狀態之真空排氣裝置以及真空排氣方法。The present invention relates to a vacuum exhausting device that evacuates a processing chamber to a vacuum state and a vacuum exhausting method.

又,本發明,係有關於被連接有真空排氣裝置之基板處理裝置。Further, the present invention relates to a substrate processing apparatus to which a vacuum exhausting device is connected.

在進行配線用金屬膜之成膜處理的處理裝置中,係具備有用以進行特定之製程的基板處理室(處理室)。基板處理室,係藉由真空幫浦而被作排氣,並作出與處理相對應的真空環境。在成膜處理中,由於係多所使用有反應性為強之氣體,因此,作為真空幫浦,係使用有在吸入室中並不存在有油而由大氣壓來得到真空的乾真空幫浦。In the processing apparatus for performing the film formation process of the wiring metal film, a substrate processing chamber (processing chamber) for performing a specific process is provided. The substrate processing chamber is evacuated by a vacuum pump and a vacuum environment corresponding to the treatment is made. In the film forming process, since a gas having a high reactivity is used, a vacuum vacuum pump is used as a vacuum pump in which no oil is present in the suction chamber and a vacuum is obtained from atmospheric pressure.

伴隨著半導體之製造製程的複合化,在使複數之處理室相互獨立了的狀態下而將全部的處理室作真空排氣之基板處理裝置,係逐漸成為此種設備之主流。因此,係成為使用有將複數台之真空幫浦作了並聯連接的真空排氣裝置。為了得到特定之真空環境,係使複數台之真空幫浦動作,以得到基板處理室之真空狀態,但是,因應於處理,會成為反覆進行有用以得到特定之真空狀態的額定運轉和將已得到了的真空狀態作維持的運轉(待機運轉)。With the compositing of the manufacturing process of the semiconductor, the substrate processing apparatus that evacuates all the processing chambers in a state in which the plurality of processing chambers are independent of each other is gradually becoming the mainstream of such equipment. Therefore, it has been used as a vacuum exhausting device in which a plurality of vacuum pumps are connected in parallel. In order to obtain a specific vacuum environment, a plurality of vacuum pumps are operated to obtain a vacuum state of the substrate processing chamber, but, in response to the processing, it will become a rated operation which is useful for obtaining a specific vacuum state and will be obtained. The vacuum state is maintained (standby operation).

在真空排氣裝置中所被作使用的真空幫浦,一般係為容積移送型之真空幫浦,在運轉中,最終段之容積部,係在排氣時而反覆被暴露在大氣之中。在待機運轉時,由於係並不進行氣體之移送,因此,真空幫浦之工作,理論上係為0,但是,係成為需要將最終段之容積部設為真空狀態(作減壓)的動力。因此,於先前技術中,係進行有:設置進行最終段之容積部的排氣之輔助幫浦,並藉由輔助幫浦來保持最終段之容積部的真空狀態,而藉由此來減少在待機運轉時之真空幫浦的工作量,並抑制消耗電力(例如,參考專利文獻1、專利文獻2)。The vacuum pump used in the vacuum exhaust system is generally a volume transfer type vacuum pump. During operation, the volume portion of the final stage is repeatedly exposed to the atmosphere during exhaust. In the standby operation, since the gas is not transferred, the operation of the vacuum pump is theoretically 0, but it is necessary to set the volume of the final section to a vacuum state (for decompression). . Therefore, in the prior art, an auxiliary pump for performing the exhaust of the volume portion of the final stage is provided, and the vacuum state of the volume portion of the final stage is maintained by the auxiliary pump, thereby reducing the The workload of the vacuum pump during standby operation is suppressed, and power consumption is suppressed (for example, refer to Patent Document 1 and Patent Document 2).

近年來,係成為進行有對於像是平面面板顯示器一般之大型玻璃基板所進行之配線用金屬的成膜等。因此,處理室之容積係逐漸大型化。由於就算是基板變大,若是處理時間變長,則生產性仍會降低,因此,在具備有對應於大型之基板的處理室之基板處理裝置處的真空排氣裝置中,係成為將真空幫浦之台數增多以便就算是對於大型之處理室亦能夠在短時間內而得到真空狀態。就算是在具備有複數台之真空幫浦的真空排氣裝置中,亦能夠使用輔助幫浦來對於待機運轉時之消耗電力作抑制。In recent years, it has been formed into a film for wiring metal for a large-sized glass substrate such as a flat panel display. Therefore, the volume of the processing chamber is gradually increased. Even if the substrate becomes large, if the processing time becomes long, the productivity is still lowered. Therefore, in the vacuum evacuation device provided in the substrate processing apparatus having the processing chamber corresponding to the large substrate, the vacuum is applied. The number of Pu's stations has increased so that even for large processing rooms, vacuum conditions can be obtained in a short period of time. Even in a vacuum exhaust apparatus having a vacuum pump having a plurality of stages, an auxiliary pump can be used to suppress power consumption during standby operation.

然而,當對於複數台之真空幫浦而分別設置了輔助幫浦的情況時,由於輔助幫浦之台數係變多,並會有雖然抑制了消耗電力但是卻反而使設備成本變得更高之虞,因此,實際上,係難以適用在具備有複數台之真空幫浦的真空排氣裝置中。又,在對於複數台之真空幫浦而將1個的輔助幫浦作連接的情況時,除了輔助幫浦本身的設備成本以外,也會有使得像是相對於多數之真空幫浦所設置的配管等之設備成本大幅增加之虞,而同樣的在實際上為難以適用在具備有複數台之真空幫浦的真空排氣裝置中。However, when the auxiliary pump is separately provided for the vacuum pump of the plurality of stages, the number of auxiliary pumps is increased, and although the power consumption is suppressed, the equipment cost is increased. Therefore, in practice, it is difficult to apply to a vacuum exhaust apparatus having a vacuum pump having a plurality of stages. In addition, when one auxiliary pump is connected to a plurality of vacuum pumps, in addition to the equipment cost of the auxiliary pump itself, there is also a setting such as a vacuum pump for a plurality of vacuum pumps. The equipment cost of piping and the like is greatly increased, and the same is practically difficult to apply to a vacuum exhaust apparatus having a plurality of vacuum pumps.

[先前技術文獻][Previous Technical Literature]

[專利文獻][Patent Literature]

[專利文獻1]日本特開2003-155988號公報[Patent Document 1] Japanese Patent Laid-Open Publication No. 2003-155988

[專利文獻2]日本特開2003-139054號公報[Patent Document 2] Japanese Patent Laid-Open Publication No. 2003-139054

本發明,係為有鑑於上述狀況而進行者,其目的,係在於提供一種:並不使用輔助幫浦便能夠對於複數台之真空幫浦的消耗電力作抑制之真空排氣裝置以及真空排氣方法。The present invention has been made in view of the above circumstances, and an object thereof is to provide a vacuum exhausting device and a vacuum exhausting device capable of suppressing power consumption of a plurality of vacuum pumps without using an auxiliary pump. method.

又,本發明,係為有鑑於上述狀況而進行者,其目的,係在於提供一種:具備有並不使用輔助幫浦便能夠對於複數台之真空幫浦的消耗電力作抑制之真空排氣裝置的基板處理裝置。Further, the present invention has been made in view of the above circumstances, and an object thereof is to provide a vacuum exhaust apparatus capable of suppressing power consumption of a plurality of vacuum pumps without using an auxiliary pump. Substrate processing device.

為了達成上述目的,申請項1之本發明之真空排氣裝置,其特徵為,具備有:複數之真空幫浦,係相對於處理室而被作並聯連接,並將前述處理室設為特定之真空狀態;和排氣集合管,係被與前述真空幫浦之排氣側相通連;和輔助配管,係將至少1個的前述真空幫浦之吸氣側與前述排氣集合管作連接;和切換手段,係在前述處理室側或者是前述輔助配管側處而將前述至少1個的前述真空幫浦之吸氣側的流路作切換。In order to achieve the above object, the vacuum exhausting apparatus of the present invention according to claim 1 is characterized in that: a plurality of vacuum pumps are provided in parallel with respect to the processing chamber, and the processing chamber is made specific. a vacuum state; and an exhaust manifold connected to the exhaust side of the vacuum pump; and an auxiliary pipe connecting at least one of the suction side of the vacuum pump to the exhaust manifold; And the switching means switches the flow path on the intake side of the at least one of the vacuum pumps on the processing chamber side or the auxiliary piping side.

在申請項1所記載之本發明中,在進行將既存之真空壓狀態作維持之運轉的情況時,係藉由切換手段而將至少1個的前述真空幫浦之吸氣側的通路與排氣集合管側相通連,並藉由至少1個的真空幫浦來進行其他的真空幫浦之最終段的容積部之排氣,而使其他的真空幫浦處之由於氣體之移送所導致的負載近似於0。其結果,藉由切換手段之動作,係成為能夠並不使用輔助幫浦便對於複數台之真空幫浦的消耗電力作抑制。In the present invention described in the first aspect of the invention, when the operation of maintaining the existing vacuum pressure state is performed, the passage and the row on the intake side of the vacuum pump are provided by the switching means. The side of the gas collecting pipe is connected, and at least one vacuum pump is used to exhaust the volume of the final section of the other vacuum pump, so that the other vacuum pumps are caused by the gas transfer. The load is approximately zero. As a result, by the operation of the switching means, it is possible to suppress the power consumption of the vacuum pumps of the plurality of stages without using the auxiliary pump.

對於像是對平面面板顯示器一般之大型玻璃基板進行處理的處理室,係成為將數台乃至十數台之真空幫浦作並聯設置,但是,就算是在此種情況下,當進行將既存之真空壓狀態作維持的運轉時,藉由以1個的真空幫浦來進行其他的真空幫浦之最終段的容積部之排氣,係能夠將其他的真空幫浦之消耗電力大幅度地作抑制。亦即是,係能夠與對於各真空幫浦而各別地使用有輔助幫浦時相同的而對於消耗電力作抑制。For a processing chamber that processes a large glass substrate such as a flat panel display, several or even a dozen vacuum pumps are arranged in parallel, but even in this case, when it is performed, When the vacuum pressure state is maintained, the exhaust of the volume of the final stage of the other vacuum pump is performed by one vacuum pump, and the power consumption of the other vacuum pumps can be greatly improved. inhibition. That is, it is possible to suppress the power consumption similarly to the case where the auxiliary pump is used separately for each vacuum pump.

例如,在將本案發明適用在將10台之真空幫浦作了並聯連接之真空排氣裝置中的情況時,係能夠將耗費數十萬元之設備成本的輔助幫浦作10台的省略,亦即是,係在削減了數百萬元之設備成本的狀態下,而成為能夠達成與使用有輔助幫浦時相同程度的消耗電力之抑制。亦即是,在維持既存之真空壓狀態時而伴隨著用以將最終段之容積部作減壓的運轉之真空幫浦的情況時,例如係需要7.5Kw之消耗電力,但是,當實施有最終段的容積部之排氣的情況時,消耗電力係成為例如2.5Kw。故而,在削減了數百萬元之設備成本,並實施將既存之真空壓狀態作維持的運轉時,對於1台的真空幫浦係成為能夠抑制例如5Kw之電力。For example, when the invention of the present invention is applied to a vacuum exhaust device in which 10 vacuum pumps are connected in parallel, it is possible to omit an auxiliary pump that consumes hundreds of thousands of dollars of equipment costs. In other words, in the state where the equipment cost of several million yuan is reduced, it is possible to achieve the same degree of power consumption suppression as when the auxiliary pump is used. In other words, when the vacuum pump is used to maintain the existing vacuum pressure state, the vacuum pump is used to reduce the volume of the final section, for example, 7.5 Kw of power consumption is required, but when implemented, In the case of the exhaust of the volume portion of the final stage, the power consumption is, for example, 2.5 Kw. Therefore, when the equipment cost of several million yuan is reduced and the operation of maintaining the existing vacuum pressure state is performed, it is possible to suppress power of, for example, 5 Kw for one vacuum pump system.

而,申請項2之本發明之真空排氣裝置,係在申請項1所記載之真空排氣裝置中,具備有下述特徵:亦即是,前述至少1個的前述真空幫浦,係藉由吸氣管而被與前述處理室作連接,前述切換手段,係在前述吸氣管處具備有將前述吸氣管之流路作開閉的排氣調整閥,在前述排氣調整閥之下流側的前述吸氣管處,係被連接有前述輔助配管,在前述輔助配管處,係具備有將前述輔助配管之流路因應於前述排氣調整閥之開閉而作閉開的輔助排氣閥。The vacuum exhausting apparatus of the present invention according to claim 2 is characterized in that the vacuum pump according to claim 1 is characterized in that the at least one of the vacuum pumps is borrowed The intake pipe is connected to the processing chamber, and the switching means includes an exhaust gas regulating valve that opens and closes a flow path of the intake pipe, and flows under the exhaust gas regulating valve. The auxiliary pipe is connected to the intake pipe, and the auxiliary pipe is provided with an auxiliary exhaust valve that closes the flow path of the auxiliary pipe in response to opening and closing of the exhaust gas regulating valve. .

在申請項2之本發明中,係藉由對於排氣調整閥以及輔助排氣閥之開閉作控制,而能夠藉由至少1個的真空幫浦來進行其他的真空幫浦之最終段的容積部之排氣。因此,係能夠藉由簡單的操作來對於複數之真空幫浦的消耗電力作抑制。In the invention of the second aspect of the invention, the opening and closing of the exhaust gas regulating valve and the auxiliary exhaust valve are controlled, and the volume of the final stage of the other vacuum pump can be performed by at least one vacuum pump. The exhaust of the department. Therefore, it is possible to suppress the power consumption of the plurality of vacuum pumps by a simple operation.

又,申請項3之本發明之真空排氣裝置,係在申請項1或申請項2所記載之真空排氣裝置中,具備有下述特徵:亦即是,前述至少1個的真空幫浦以外之前述真空幫浦的排氣側,係藉由排氣管而被與前述排氣集合管作連接,在前述排氣管處,係具備有與前述輔助排氣閥之開閉作連動而進行開閉之真空維持閥。Further, in the vacuum exhausting apparatus of the invention of claim 3, the vacuum exhausting apparatus of the invention of claim 3, characterized in that the vacuum pump is at least one of the vacuum pumps The exhaust side of the vacuum pump other than the vacuum pump is connected to the exhaust manifold by an exhaust pipe, and the exhaust pipe is provided in conjunction with opening and closing of the auxiliary exhaust valve. Open and close vacuum maintenance valve.

在申請項3之本發明中,係在藉由至少1個的真空幫浦來進行了其他的真空幫浦之最終段的容積部之排氣後,以真空維持閥來將排氣管關閉,藉由此來將其他的真空幫浦之最終段的容積部之排氣側的流路維持為真空狀態,而能夠將接下來進行最終段之容積部的排氣時之負載抑制在最小限度。In the invention of claim 3, after the evacuation of the volume portion of the final stage of the other vacuum pump is performed by at least one vacuum pump, the exhaust pipe is closed by the vacuum maintenance valve. By this, the flow path on the exhaust side of the volume portion of the final stage of the other vacuum pump is maintained in a vacuum state, and the load at the time of exhausting the volume portion of the final stage can be minimized.

又,申請項4之本發明之真空排氣裝置,係在申請項1~申請項3中之任一項所記載之真空排氣裝置中,具備有下述特徵:亦即是,係具備有將前述至少1個的真空幫浦之排氣側作減壓的減壓手段。The vacuum exhausting apparatus according to any one of the preceding claims, wherein the vacuum exhausting apparatus according to any one of the first to third aspects of the present invention, characterized in that The decompressing means for decompressing the exhaust side of at least one of the vacuum pumps is used.

在申請項4之本發明中,係能夠藉由減壓手段,來進行至少1個的真空幫浦之最終段的容積部之排氣,而能夠將至少1個的真空幫浦之消耗電力作抑制。In the invention of the fourth aspect of the invention, the exhaust of the volume of the final stage of the vacuum pump can be performed by the decompression means, and the power consumption of the vacuum pump can be made at least one. inhibition.

又,申請項5之本發明之真空排氣裝置,係在申請項1~申請項4中之任一項所記載之真空排氣裝置中,具備有下述特徵:亦即是,係具備有將前述處理室側的壓力狀態檢測出來之壓力檢測手段,前述切換手段,係根據前述壓力檢測手段之檢測資訊而動作。The vacuum exhausting apparatus according to any one of the preceding claims, wherein the vacuum exhausting apparatus according to any one of the preceding claims, wherein the vacuum exhausting apparatus according to any one of claims 1 to 4 is characterized in that The pressure detecting means for detecting the pressure state on the processing chamber side, the switching means operates based on the detection information of the pressure detecting means.

在申請項5之本發明中,係能夠因應於處理室側之壓力狀態,來使切換手段動作,而能夠因應於實際之壓力狀態來對於真空幫浦之運轉作控制。處理室側之壓力狀態,係能夠將處理室內之壓力檢測出來,亦能夠將複數之真空幫浦的吸氣側之集合管內的壓力檢測出來。In the invention of the fifth aspect of the invention, the switching means can be operated in response to the pressure state on the processing chamber side, and the operation of the vacuum pump can be controlled in accordance with the actual pressure state. The pressure state on the processing chamber side can detect the pressure in the processing chamber, and can also detect the pressure in the collecting tube on the suction side of the plurality of vacuum pumps.

為了達成上述目的,申請項6之本發明之真空排氣方法,其特徵為:在藉由被並聯地作了配置的複數之真空幫浦而將處理室設為特定之真空狀態時,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,係藉由至少1個的前述真空幫浦來進行其他之前述真空幫浦的排氣側之大氣開放容積部的排氣。In order to achieve the above object, the vacuum evacuation method of the present invention according to claim 6 is characterized in that, when the processing chamber is set to a specific vacuum state by a plurality of vacuum pumps arranged in parallel, When the operation of the vacuum pump is performed while maintaining the vacuum pressure of the processing chamber, exhaust of the atmospheric open volume portion on the exhaust side of the other vacuum pump is performed by at least one of the vacuum pumps.

在申請項6之本發明中,在進行維持真空壓狀態之運轉時,係藉由以至少1個的前述真空幫浦來進行其他的前述真空幫浦之排氣側的大氣開放容積部之排氣,而能夠並不使用輔助幫浦便對於複數台之真空幫浦的消耗電力作抑制。In the invention according to the sixth aspect of the invention, in the operation of maintaining the vacuum pressure state, the row of the atmospheric open volume portion on the exhaust side of the other vacuum pump is performed by at least one of the vacuum pumps. It is possible to suppress the power consumption of the vacuum pump of a plurality of stages without using the auxiliary pump.

又,申請項7之本發明之真空排氣方法,係在申請項6所記載之真空排氣方法中,具備有下述特徵:亦即是,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,係以較在將前述處理室設為特定之真空狀態的運轉時之旋轉數而更低之旋轉數,來使其他之前述真空幫浦運轉。Further, in the vacuum evacuation method according to the sixth aspect of the invention, the vacuum evacuation method of the invention of claim 7 is characterized in that, in order to maintain the vacuum pressure of the processing chamber, In the operation of the vacuum pump, the other vacuum pumps are operated at a lower number of revolutions than the number of revolutions during the operation in which the processing chamber is in a specific vacuum state.

在申請項7之本發明中,由於身為待機狀態之其他的前述真空幫浦,係被控制在較將處理室設為特定之真空狀態的運轉時之旋轉數更低之旋轉數,因此,係能夠將真空幫浦之消耗電力作抑制。According to the invention of the seventh aspect of the invention, the other vacuum pump that is in the standby state is controlled to have a lower number of rotations than when the processing chamber is in a specific vacuum state. It is possible to suppress the power consumption of the vacuum pump.

又,申請項8之本發明之真空排氣方法,係在申請項7所記載之真空排氣方法中,具備有下述特徵:亦即是,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,其他之前述真空幫浦的旋轉數,係為能夠在特定之恢復時間內而將前述處理室設為特定之真空狀態的旋轉數。Further, in the vacuum evacuation method according to the seventh aspect of the invention, the vacuum evacuation method according to the seventh aspect of the invention is characterized in that, in order to maintain the vacuum pressure of the processing chamber, In the operation of the vacuum pump, the number of rotations of the other vacuum pump is a number of rotations in which the processing chamber can be set to a specific vacuum state within a specific recovery time.

在申請項8之本發明中,藉由將身為待機狀態之其他的前述真空幫浦,控制為能夠於特定之恢復時間內來將處理室設為真空狀態的待機狀態之旋轉數,係能夠以最小之旋轉數來使真空幫浦作旋轉,而能夠對消耗電力作抑制。According to the invention of claim 8, the number of rotations in the standby state in which the processing chamber is in a vacuum state can be controlled by the other vacuum pump in the standby state. The vacuum pump is rotated with a minimum number of rotations, and power consumption can be suppressed.

為了達成上述目的的申請項9之本發明之基板處理裝置,其特徵為:係具備有使基板被作搬入並被進行特定之處理的基板處理室,並將如申請項1~申請項5中之任一項所記載之真空排氣裝置的前述複數之真空幫浦,並聯地連接於前述基板處理室處。The substrate processing apparatus of the present invention according to the application item 9 of the present invention is characterized in that the substrate processing chamber is provided with a substrate for being carried in and subjected to a specific treatment, and is applied in the application items 1 to 5 The plurality of vacuum pumps of the vacuum exhaust apparatus described in any one of the above are connected in parallel to the substrate processing chamber.

在申請項9之本發明中,係成為一種具備有能夠藉由切換手段之動作而成為並不使用輔助幫浦便對於複數台之真空幫浦的消耗電力作抑制的真空排氣裝置之基板處理裝置。According to the invention of the ninth aspect of the invention, there is provided a substrate processing of a vacuum exhaust apparatus capable of suppressing power consumption of a plurality of vacuum pumps without using an auxiliary pump by the operation of the switching means Device.

又,申請項10之本發明之基板處理裝置,係在申請項9所記載之基板處理裝置中,具備有下述特徵:亦即是,係具備有:將從前述基板處理裝置而來之基板作搬入並進行特定之處理之第2基板處理室,在前述第2基板處理室處,連結第2真空幫浦,將前述真空幫浦之其中1個與前述第2真空幫浦之吸氣側作並聯連接,在前述真空幫浦之其中1個與前述第2真空幫浦之連接部處,具備有流路選擇手段。Further, in the substrate processing apparatus of the invention of claim 9, the substrate processing apparatus according to the invention of the present invention, characterized in that the substrate processing apparatus of the present invention is provided with a substrate from the substrate processing apparatus In the second substrate processing chamber that is carried in and subjected to specific processing, the second vacuum pump is connected to the second substrate processing chamber, and one of the vacuum pumps and the suction side of the second vacuum pump are connected In parallel connection, a flow path selecting means is provided at a connection portion between one of the vacuum pumps and the second vacuum pump.

在申請項10之本發明中,就算是當在將第2基板處理室設為真空狀態之第2真空幫浦處產生有問題的情況時,亦可藉由以流路選擇手段來將真空幫浦的其中1個連接於第2基板處理室處,來將真空幫浦的其中1個適用於第2基板處理室之真空維持用的用途。In the invention of claim 10, even when there is a problem in the second vacuum pump in which the second substrate processing chamber is in a vacuum state, the vacuum cleaning can be performed by the flow path selecting means. One of the pumps is connected to the second substrate processing chamber, and one of the vacuum pumps is applied to the vacuum maintenance of the second substrate processing chamber.

又,申請項11之本發明之基板處理裝置,係在申請項10所記載之基板處理裝置中,具備有下述特徵:亦即是,在前述排氣集合管處,係通連有前述第2真空幫浦之排氣側,藉由至少1個的前述真空幫浦,來經由前述排氣集合管而將前述第2真空幫浦之排氣側的流體排出。Further, in the substrate processing apparatus of the invention of claim 11, the substrate processing apparatus according to the invention of claim 10 is characterized in that the exhaust gas collection tube is connected to the first (2) The exhaust side of the vacuum pump discharges the fluid on the exhaust side of the second vacuum pump through the exhaust manifold through at least one of the vacuum pumps.

在申請項11之本發明中,當在第2真空幫浦之待機運轉時等而進行維持真空壓狀態之運轉時,係能夠藉由真空幫浦來進行第2真空幫浦之排氣側的容積部之排氣,而能夠對於用以進行第2真空幫浦之排氣的消耗電力作抑制。In the invention according to the eleventh aspect of the invention, when the operation of maintaining the vacuum pressure state is performed during the standby operation of the second vacuum pump or the like, the exhaust side of the second vacuum pump can be performed by the vacuum pump. The exhaust of the volume portion can suppress the power consumption of the exhaust gas for performing the second vacuum pump.

本發明之真空排氣裝置以及真空排氣方法,係能夠並不使用輔助幫浦便對於複數台之真空幫浦的消耗電力作抑制。The vacuum exhausting apparatus and the vacuum exhausting method of the present invention can suppress the power consumption of a plurality of vacuum pumps without using an auxiliary pump.

又,本發明之基板處理裝置,係成為具備有能夠並不使用輔助幫浦便對於複數台之真空幫浦的消耗電力作抑制之真空排氣裝置的基板處理裝置。Moreover, the substrate processing apparatus of the present invention is a substrate processing apparatus including a vacuum exhaust apparatus capable of suppressing power consumption of a plurality of vacuum pumps without using an auxiliary pump.

以下所展示之實施形態例,係作為基板處理裝置,而以對於大型之玻璃基板施加處理,並將加熱裝置、電漿CVD裝置、濺鍍裝置、乾蝕刻裝置等之處理室作了串聯並排,而從其中一方之端部的處理室(裝載鎖定室:基板處理室)來將基板作搬入、搬出的線內(in-line)式之縱型處理裝置為例來作說明。而,在裝載鎖定室處,係被並聯連接有複數之真空幫浦,並藉由真空幫浦之驅動來將包含裝載鎖定室之複數的處理室之內部設為特定之真空狀態。In the embodiment shown below, as a substrate processing apparatus, a processing is applied to a large-sized glass substrate, and processing chambers such as a heating device, a plasma CVD device, a sputtering device, and a dry etching device are arranged in series. An in-line type vertical processing apparatus that carries and transports a substrate from a processing chamber (load lock chamber: substrate processing chamber) at one end of one of the sections will be described as an example. Further, at the load lock chamber, a plurality of vacuum pumps are connected in parallel, and the inside of the processing chamber including the load lock chamber is set to a specific vacuum state by driving of the vacuum pump.

作為將本發明作適用之基板處理裝置,係並不被限定於在實施形態例中所示之線內式的縱型處理裝置,亦可適用在於中央部具備有基板搬送共通室並在基板供給室之週邊具備有複數之基板處理室的基板處理裝置中、或者是適用在藉由1個處理室來進行批次處理之批次式的基板處理裝置中。The substrate processing apparatus to which the present invention is applied is not limited to the in-line type vertical processing apparatus shown in the embodiment, and may be applied to a central portion including a substrate transfer common chamber and supplied to the substrate. The periphery of the chamber is provided with a substrate processing apparatus having a plurality of substrate processing chambers, or a batch type substrate processing apparatus which is applied to batch processing by one processing chamber.

根據圖1~圖11,針對本發明之實施形態例作說明。An embodiment of the present invention will be described with reference to Figs. 1 to 11 .

於圖1中,對於本發明之第1實施形態例的基板處理裝置之概略系統作展示,於圖2中,對於本發明之第2實施形態例的基板處理裝置之概略系統作展示,於圖3中,對於本發明之第3實施形態例的基板處理裝置之概略系統作展示,於圖4中,對於本發明之第4實施形態例的基板處理裝置之概略系統作展示,於圖5中,對於本發明之第5實施形態例的基板處理裝置之概略系統作展示,於圖6中,對於本發明之第6實施形態例的基板處理裝置之概略系統作展示,於圖7中,對於本發明之第7實施形態例的基板處理裝置之概略系統作展示,於圖8中,對於本發明之第8實施形態例的基板處理裝置之概略系統作展示。1 is a schematic system diagram of a substrate processing apparatus according to a first embodiment of the present invention, and FIG. 2 is a schematic system diagram of a substrate processing apparatus according to a second embodiment of the present invention. 3 is a schematic system diagram of a substrate processing apparatus according to a third embodiment of the present invention, and FIG. 4 is a schematic system diagram of a substrate processing apparatus according to a fourth embodiment of the present invention, and is shown in FIG. A schematic system of a substrate processing apparatus according to a fifth embodiment of the present invention is shown in FIG. 6, and a schematic system of a substrate processing apparatus according to a sixth embodiment of the present invention is shown. In FIG. 7, A schematic system of a substrate processing apparatus according to a seventh embodiment of the present invention is shown in Fig. 8, and a schematic system of a substrate processing apparatus according to an eighth embodiment of the present invention is shown.

又,於圖9中,係對於本發明之第9實施形態例的基板處理裝置之概略系統作展示,於圖10中,係對於代表相對於真空幫浦之旋轉數的消耗電力與恢復時間之間之關係的圖表作展示,於圖11中,係對於代表消耗電力之變化的圖表作展示。Further, Fig. 9 shows a schematic system of a substrate processing apparatus according to a ninth embodiment of the present invention, and Fig. 10 shows power consumption and recovery time for the number of revolutions with respect to the vacuum pump. A graphical representation of the relationship between the two is shown in Figure 11 for a graph representing changes in power consumption.

另外,關於第1實施形態例~第9實施形態例之構件,對於相同之構件,係附加相同之符號,並省略重複之說明。In the first embodiment to the ninth embodiment, the same members are denoted by the same reference numerals, and the description thereof will not be repeated.

根據圖1,針對第1實施形態例作說明。A first embodiment will be described with reference to Fig. 1 .

圖示之基板處理裝置1,係為對於被略垂直地作保持之大型玻璃基板(基板:例如,平面面板顯示器)而進行處理的縱型處理裝置,並為將裝載鎖定室2、加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7依序作連接所構成的線內式之裝置。在基板處理裝置1之內部,係從裝載鎖定室2起直到第4處理室7為止而設置有用以將基板作搬送之往路以及返路。The substrate processing apparatus 1 shown in the drawing is a vertical processing apparatus that processes a large glass substrate (substrate: for example, a flat panel display) that is held slightly vertically, and is a load lock chamber 2 and a heating chamber 3 The first processing chamber 4, the second processing chamber 5, the third processing chamber 6, and the fourth processing chamber 7 are sequentially connected to each other. Inside the substrate processing apparatus 1, a forward path and a return path for transporting the substrate are provided from the load lock chamber 2 to the fourth processing chamber 7.

被搬入至裝載鎖定室2中之基板,係在裝載鎖定室2中而被保持於真空狀態,之後,在加熱室3中被作加熱,並依序被搬送至第1處理室4乃至第4處理室7中,再使經過路徑作反轉,而通過第4處理室7~第1處理室4、加熱室3並回到裝載鎖定室2中,再被搬出。The substrate carried into the load lock chamber 2 is held in a vacuum state in the load lock chamber 2, and then heated in the heating chamber 3, and sequentially transported to the first processing chamber 4 to the fourth In the processing chamber 7, the passage path is reversed, and passes through the fourth processing chamber 7 to the first processing chamber 4 and the heating chamber 3, and returns to the load lock chamber 2, and is carried out again.

在裝載鎖定室2處,係被連接有真空排氣裝置11,藉由真空排氣裝置11,包含裝載鎖定室2的複數之處理室的內部,係被設為特定之真空狀態。各處理室,係被設為與大型基板相對應之大容量的處理室,為了將排氣速度保持在特定之速度,在真空排氣裝置11處,係並聯地具備有複數台(於圖示例中,係為10台)之真空幫浦12。At the load lock chamber 2, a vacuum exhaust unit 11 is connected, and the inside of the processing chamber including the plurality of load lock chambers 2 is provided in a specific vacuum state by the vacuum exhaust unit 11. Each of the processing chambers is a large-capacity processing chamber corresponding to a large-sized substrate, and in order to maintain the exhaust speed at a specific speed, the vacuum exhausting device 11 is provided in parallel with a plurality of units (in the drawing) In the example, it is a vacuum pump 12 of 10 units.

針對真空排氣裝置11作說明。The vacuum exhaust device 11 will be described.

在裝載鎖定室2處,係被連接有真空配管13之其中一端,真空配管13之另外一端,係被與吸氣集合管14作連接。在10台的真空幫浦12之吸氣側處,係分別被連接有吸氣管15,吸氣管15,係被與吸氣集合管14相連接。亦即是,10台的真空幫浦12,係藉由各自之吸氣管15、1個的吸氣集合管14以及真空配管13,而相對於基板處理裝置1來並聯地作連接。At the load lock chamber 2, one end of the vacuum pipe 13 is connected, and the other end of the vacuum pipe 13 is connected to the suction manifold 14. At the suction side of the 10 vacuum pumps 12, an intake pipe 15 is connected, and the intake pipe 15 is connected to the suction manifold 14. In other words, the ten vacuum pumps 12 are connected in parallel to the substrate processing apparatus 1 by the respective intake pipes 15, the intake manifold 14 and the vacuum piping 13.

10台的真空幫浦12,例如,係為容積移送型之乾式幫浦,在最終段之容積部(容積室)處,係被連接有具備消音器16之排氣系17。藉由將10台的真空幫浦12一齊作驅動,在各真空幫浦12處,從吸氣側而來之流體係依序被移送至容積室處並被移送至排氣側處,再從最終段之容積室而被排氣至排氣系17處。藉由此,係能夠得到所期望之真空狀態。The ten vacuum pumps 12 are, for example, a dry transfer type of a volume transfer type, and an exhaust system 17 having a muffler 16 is connected to a volume portion (volume chamber) of the final stage. By driving 10 vacuum pumps 12 together, at each vacuum pump 12, the flow system from the suction side is sequentially transferred to the volume chamber and transferred to the exhaust side, and then The volume chamber of the final stage is exhausted to the exhaust system 17. Thereby, the desired vacuum state can be obtained.

在上述之真空排氣裝置11中,在進行將既存之真空狀態作維持之運轉(待機運轉)的情況時,係藉由1個的真空幫浦12a(圖中之從右邊起第5個)來進行其他的真空幫浦12之最終段的容積室之排氣,並維持其他的真空幫浦12之最終段的真空。藉由此,在待機運轉時之其他的真空幫浦12之動力,理論上,由於並沒有流體之移送,因此係成為僅有機械性損失,而能夠並不使用輔助幫浦等便將真空幫浦12之消耗電力大幅度地作削減。In the vacuum evacuation device 11 described above, when the operation for maintaining the existing vacuum state is performed (standby operation), one vacuum pump 12a (the fifth from the right in the figure) is used. The exhaust of the volume chamber of the final section of the other vacuum pump 12 is performed, and the vacuum of the final section of the other vacuum pump 12 is maintained. Therefore, in the standby operation, the power of the other vacuum pump 12 is theoretically, since there is no fluid transfer, it is only mechanical loss, and the vacuum can be used without using an auxiliary pump or the like. The power consumption of Pu 12 is greatly reduced.

另外,作為用以維持其他的真空幫浦12之最終段的真空之幫浦,係亦可將其他的真空幫浦12與真空幫浦12a一同作併用。Further, as the pump for maintaining the vacuum of the final stage of the other vacuum pump 12, the other vacuum pump 12 may be used together with the vacuum pump 12a.

對於用以藉由1個的真空幫浦12a來維持其他的真空幫浦12之最終段的真空之構成作說明。The configuration of the vacuum for maintaining the final stage of the other vacuum pump 12 by one vacuum pump 12a will be described.

在(除了真空幫浦12a以外的)真空幫浦12之最終段的容積室(排氣側)處,係分別被連接有排氣管18之其中一端,另外,係具備有與排氣管18之另外一端作連接的排氣集合管19。另一方面,在真空幫浦12(包含真空幫浦12a)之吸氣管15處,係分別被設置有開閉閥21,真空幫浦12a之開閉閥,係成為排氣調整閥21a。涵蓋排氣調整閥21a之真空幫浦12a側與排氣集合管19地,而設置有輔助配管22,在輔助配管22處,係被設置有輔助排氣閥23(切換手段)。At the volume chamber (exhaust side) of the final stage of the vacuum pump 12 (other than the vacuum pump 12a), one end of the exhaust pipe 18 is connected, and the exhaust pipe 18 is provided. The other end is connected to the exhaust manifold 19 . On the other hand, the intake pipe 15 of the vacuum pump 12 (including the vacuum pump 12a) is provided with an opening and closing valve 21, and the opening and closing valve of the vacuum pump 12a is an exhaust gas regulating valve 21a. An auxiliary pipe 22 is provided to cover the vacuum pump 12a side of the exhaust gas regulating valve 21a and the exhaust manifold 19, and an auxiliary exhaust valve 23 (switching means) is provided at the auxiliary pipe 22.

與排氣調整閥21a(開閉閥21)作開閉之動作相連動,輔助排氣閥23係進行開閉動作。亦即是,當排氣調整閥21a(開閉閥21)開啟的情況時,輔助排氣閥23係被關閉,藉由全部的真空幫浦12之驅動,基板處理裝置1係被設為特定之真空狀態。又,在待機運轉時,排氣調整閥21a(開閉閥21)係被關閉,並且,輔助排氣閥23係被開啟,其他的真空幫浦12之最終段的容積室之流體,係經由排氣管18、排氣集合管19以及輔助配管22而藉由1個的真空幫浦12a來作排氣,並維持為真空狀態。The operation of opening and closing the exhaust gas adjustment valve 21a (opening/closing valve 21) is started, and the auxiliary exhaust valve 23 is opened and closed. That is, when the exhaust gas adjustment valve 21a (opening/closing valve 21) is opened, the auxiliary exhaust valve 23 is closed, and the substrate processing apparatus 1 is set to be specific by the driving of all the vacuum pumps 12. Vacuum state. Further, during the standby operation, the exhaust gas adjustment valve 21a (opening and closing valve 21) is closed, and the auxiliary exhaust valve 23 is opened, and the fluid of the volume chamber of the final stage of the other vacuum pump 12 is discharged. The gas pipe 18, the exhaust manifold 19, and the auxiliary pipe 22 are exhausted by one vacuum pump 12a, and are maintained in a vacuum state.

又,在吸氣集合管14處,係被設置有壓力檢測手段(壓力感測器)24,根據壓力檢測手段24之檢測資訊,排氣調整閥21a(開閉閥21)之開閉動作以及輔助排氣閥23之閉開動作係被作控制。亦即是,係根據吸氣集合管14之實際的壓力(真空程度:基板處理裝置1之真空度),來控制減壓動作。Further, a pressure detecting means (pressure sensor) 24 is provided at the intake manifold 14, and the opening and closing operation of the exhaust gas adjusting valve 21a (opening and closing valve 21) and the auxiliary row are performed based on the detection information of the pressure detecting means 24. The closing action of the gas valve 23 is controlled. That is, the decompression operation is controlled based on the actual pressure of the intake manifold 14 (degree of vacuum: degree of vacuum of the substrate processing apparatus 1).

另外,亦可在基板處理裝置1之適當的場所,設置壓力檢測手段,並直接檢測出基板處理裝置1側之真空度,而對於真空排氣裝置11之運轉作控制。Further, a pressure detecting means may be provided in an appropriate place of the substrate processing apparatus 1, and the degree of vacuum on the substrate processing apparatus 1 side may be directly detected, and the operation of the vacuum exhaust apparatus 11 may be controlled.

針對具備有上述之真空排氣裝置11的基板處理裝置1之作用作說明。The operation of the substrate processing apparatus 1 including the above-described vacuum evacuation device 11 will be described.

被搬入至裝載鎖定室2中之平面面板顯示器等之基板,係在裝載鎖定室2中而被保持於真空狀態,之後,在加熱室3中被作加熱,並依序被搬送至第1處理室4乃至第4處理室7中,再使經過路徑作反轉,而通過第4處理室7~第1處理室4、加熱室3並回到裝載鎖定室2中,再被搬出。於此期間中,在真空處理室內係被施加有必要之處理。The substrate, which is carried into the flat panel display or the like in the load lock chamber 2, is held in a vacuum state in the load lock chamber 2, and then heated in the heating chamber 3, and sequentially transported to the first process. In the chamber 4 and the fourth processing chamber 7, the passage path is reversed, and the fourth processing chamber 7 to the first processing chamber 4 and the heating chamber 3 are returned to the load lock chamber 2 and then carried out. During this period, necessary treatment is applied to the vacuum processing chamber.

基板處理裝置1,係藉由真空排氣裝置11而將處理室內設為特定之真空狀態。當進行用以得到在處理中所需要的真空狀態之運轉的情況時,排氣調整閥21a(開閉閥21)係被開啟,並且輔助排氣閥23係被關閉,藉由10台的真空幫浦12之驅動,基板處理裝置1係被設為特定之真空狀態(與處理相對應之真空狀態)。In the substrate processing apparatus 1, the vacuum chamber 11 is used to set the processing chamber to a specific vacuum state. When the operation for obtaining the vacuum state required in the process is performed, the exhaust gas adjusting valve 21a (opening and closing valve 21) is opened, and the auxiliary exhaust valve 23 is closed, with 10 vacuum pumps. In the driving of the pump 12, the substrate processing apparatus 1 is set to a specific vacuum state (a vacuum state corresponding to the processing).

在基板的搬送行程等之進行將既存的真空狀態作維持之運轉(待機運轉)的情況時,排氣調整閥21a(開閉閥21)係被關閉,並且,輔助排氣閥23係被開啟,除了1個的真空幫浦12a以外之其他的真空幫浦12之最終段的容積室之流體,係經由排氣管18、排氣集合管19以及輔助配管22而藉由真空幫浦12a來作排氣,並維持為真空狀態。When the operation of maintaining the existing vacuum state (standby operation) is performed in the conveyance path of the substrate or the like, the exhaust gas adjustment valve 21a (opening and closing valve 21) is closed, and the auxiliary exhaust valve 23 is opened. The fluid in the volume chamber of the final stage of the vacuum pump 12 other than the vacuum pump 12a is made by the vacuum pump 12a via the exhaust pipe 18, the exhaust manifold 19, and the auxiliary pipe 22. Exhaust and maintain a vacuum.

藉由此,在待機運轉時,其他的真空幫浦12之最終段的處理室,係並不會被開放於大氣中,其他的真空幫浦12,係成為不需要用以將最終段之處理室從大氣而減壓至真空時所需要的動力。因此,真空幫浦12之動力,理論上,由於並沒有流體之移送,因此係成為僅有機械性損失,而能夠並不使用輔助幫浦等便將真空幫浦12之消耗電力大幅度地作削減。Therefore, during the standby operation, the processing chambers of the other sections of the other vacuum pumps 12 are not opened to the atmosphere, and the other vacuum pumps 12 are not required to be used for the final stage treatment. The power required to depressurize the chamber from the atmosphere to a vacuum. Therefore, the power of the vacuum pump 12 is theoretically, since there is no fluid transfer, it is only a mechanical loss, and the power consumption of the vacuum pump 12 can be greatly reduced without using an auxiliary pump or the like. reduce.

在對於像是平面面板顯示器一般之大型玻璃基板進行處理的基板處理裝置1中,係成為將例如10台之真空幫浦12作並聯設置,但是,就算是在此種情況下,在待機運轉時,藉由以1個的真空幫浦12a來進行其他的真空幫浦12之最終段的容積部之排氣,係能夠將其他的真空幫浦12之消耗電力大幅度地作抑制。In the substrate processing apparatus 1 for processing a large-sized glass substrate such as a flat panel display, for example, 10 vacuum pumps 12 are arranged in parallel, but even in this case, during standby operation. By exhausting the volume of the final stage of the other vacuum pump 12 by one vacuum pump 12a, the power consumption of the other vacuum pump 12 can be greatly suppressed.

亦即是,係能夠與對於各真空幫浦12而各別地使用有輔助幫浦時相同的而對於消耗電力作抑制。而且,係能夠藉由僅對於排氣調整閥21a以及輔助排氣閥23之開閉作控制一般的簡單操作,來對於複數之真空幫浦12的消耗電力作抑制。In other words, it is possible to suppress the power consumption similarly to the case where the auxiliary pump is used separately for each vacuum pump 12. Further, it is possible to suppress the power consumption of the plurality of vacuum pumps 12 by simply controlling the opening and closing of the exhaust gas regulating valve 21a and the auxiliary exhaust valve 23 as a general simple operation.

根據圖2,針對第2實施形態例作說明。A second embodiment will be described with reference to Fig. 2 .

第2實施形態例之真空排氣裝置31,係成為在圖1中所示之真空排氣裝置11的排氣管18處而具備有真空維持閥27之構成。真空維持閥27,係與輔助排氣閥23相連動地作開閉。The vacuum exhaust unit 31 of the second embodiment is configured to include a vacuum maintenance valve 27 at the exhaust pipe 18 of the vacuum exhaust unit 11 shown in Fig. 1 . The vacuum maintenance valve 27 is opened and closed in conjunction with the auxiliary exhaust valve 23.

亦即是,當輔助排氣閥23被開啟時,真空維持閥27係被開啟,藉由1個的真空幫浦12a,其他的真空幫浦12之最終段的容積室之排氣係被進行,在輔助排氣閥23被關閉時,真空維持閥27係被關閉,在由全部的真空幫浦12所進行的運轉時,最終段之容積室的真空狀態係被作維持。That is, when the auxiliary exhaust valve 23 is opened, the vacuum maintenance valve 27 is opened, and the exhaust system of the final chamber of the other vacuum pump 12 is performed by one vacuum pump 12a. When the auxiliary exhaust valve 23 is closed, the vacuum maintenance valve 27 is closed, and during the operation by all the vacuum pumps 12, the vacuum state of the final chamber is maintained.

因此,係在藉由至少1個的真空幫浦12a來進行了其他的真空幫浦12之最終段的容積部之排氣後,以真空維持閥27來將排氣管18關閉,而藉由此來將從輔助排氣閥23起直到真空維持閥27為止之間的包含有輔助配管22之流路維持在真空狀態下,而能夠將接下來進行最終段之容積部的排氣時之負載抑制在最小限度,並以良好的回應性來實施容積室之排氣運轉。Therefore, after the evacuation of the volume portion of the final stage of the other vacuum pump 12 is performed by at least one vacuum pump 12a, the evacuation tube 18 is closed by the vacuum maintenance valve 27, by In this case, the flow path including the auxiliary pipe 22 from the auxiliary exhaust valve 23 to the vacuum maintenance valve 27 is maintained in a vacuum state, and the load at the time of exhausting the volume of the final stage can be performed next. The suppression is minimized, and the exhaust operation of the volume chamber is performed with good responsiveness.

根據圖3,針對第3實施形態例作說明。A third embodiment will be described with reference to Fig. 3 .

第3實施形態例之真空排氣裝置32,係成為在圖1中所示之真空排氣裝置11之1個的真空排氣裝置12a之排氣側處而具備有減壓手段29之構成。亦即是,係藉由減壓手段29而將1個的真空幫浦12a之最終段的容積室作減壓,在真空幫浦12a處之用以將最終段之處理室從大氣而減壓至真空所需要的動力,係成為不需要。The vacuum exhaust unit 32 of the third embodiment is configured to include a decompression means 29 at the exhaust side of the vacuum exhaust unit 12a of one of the vacuum exhaust units 11 shown in FIG. That is, the volume chamber of the final stage of one vacuum pump 12a is decompressed by the decompression means 29, and the vacuum chamber 12a is used to decompress the final stage processing chamber from the atmosphere. The power required to reach the vacuum is not required.

因此,1個的真空幫浦12a之動力,理論上,由於並沒有流體之移送,因此係成為僅有機械性損失,而能夠將全部的真空幫浦12之消耗電力大幅度地作抑制。Therefore, the power of the vacuum pump 12a is theoretically such that there is no mechanical transfer, so that only the mechanical loss is obtained, and the power consumption of all the vacuum pumps 12 can be greatly suppressed.

根據圖4,針對第4實施形態例作說明。A fourth embodiment will be described with reference to Fig. 4 .

第4實施形態例之真空排氣裝置33,係成為具備有圖2中所示之真空維持閥27和圖3中所示之減壓手段29之構成。因此,由1個的真空幫浦12a所得到之最終段的容積室之排氣運轉開始時的真空狀態,係被作維持,並且,係能夠將全部的真空幫浦12之消耗電力大幅度地作削減。The vacuum exhaust unit 33 of the fourth embodiment is configured to include the vacuum maintenance valve 27 shown in Fig. 2 and the pressure reducing means 29 shown in Fig. 3. Therefore, the vacuum state at the start of the exhaust operation of the volume chamber of the final stage obtained by the one vacuum pump 12a is maintained, and the power consumption of all the vacuum pumps 12 can be greatly increased. Make a cut.

根據圖5,針對第5實施形態例作說明。A fifth embodiment will be described with reference to Fig. 5 .

第5實施形態例之真空排氣裝置34,係成為在圖1中所示之真空排氣裝置11的與真空幫浦12a相鄰接之真空幫浦12b的吸氣管15處,連接輔助配管22之分歧管22b,並在排氣管18b處而具備有開閉閥28之構成。亦即是,係成為:作為真空幫浦12a之後備,而將相鄰接之真空幫浦12b設為用以進行其他的真空幫浦12之最終段的容積室之排氣的幫浦之構成。The vacuum exhaust device 34 of the fifth embodiment is connected to the intake pipe 15 of the vacuum pump 12b adjacent to the vacuum pump 12a of the vacuum exhaust device 11 shown in Fig. 1, and is connected to the auxiliary pipe. The branch pipe 22b of 22 is provided with an opening and closing valve 28 at the exhaust pipe 18b. That is, as a vacuum pump 12a, the adjacent vacuum pump 12b is configured as a pump for exhausting the volume chamber of the final stage of the other vacuum pump 12. .

當在真空幫浦12a處產生有問題的情況時,係藉由將輔助排氣閥23關閉,並將分歧管22b之輔助排氣閥23b開啟,且將開閉閥28關閉,而藉由相鄰接之真空幫浦12b來進行其他的真空幫浦12之最終段的容積室之排氣。因此,就算是在真空幫浦12a處產生有問題,亦能夠確實地進行真空幫浦12之消耗電力的抑制。When a problem occurs in the vacuum pump 12a, the auxiliary exhaust valve 23 is closed, and the auxiliary exhaust valve 23b of the branch pipe 22b is opened, and the opening and closing valve 28 is closed by the adjacent The vacuum pump 12b is connected to exhaust the volume chamber of the final section of the other vacuum pump 12. Therefore, even if a problem occurs in the vacuum pump 12a, the power consumption of the vacuum pump 12 can be surely suppressed.

根據圖6,針對第6實施形態例作說明。A sixth embodiment will be described with reference to Fig. 6 .

第6實施形態例之真空排氣裝置35,係成為將圖2中所示之真空維持閥27和圖5中所示之作為後備而使用了相鄰接之真空幫浦12b者作了組合的構成。The vacuum exhaust unit 35 of the sixth embodiment is a combination of the vacuum maintenance valve 27 shown in Fig. 2 and the adjacent vacuum pump 12b as a backup shown in Fig. 5. Composition.

因此,係能夠將接下來進行最終段之容積部的排氣時之負載抑制在最小限度,並以良好的回應性來實施容積室之排氣運轉,同時,就算是在真空幫浦12a處產生有問題,亦能夠確實地進行真空幫浦12之消耗電力的抑制。Therefore, it is possible to minimize the load when the exhaust of the volume portion of the final stage is performed next, and to perform the exhaust operation of the volume chamber with good responsiveness, and at the same time, even at the vacuum pump 12a. If there is a problem, it is possible to surely suppress the power consumption of the vacuum pump 12.

根據圖7,針對第7實施形態例作說明。A seventh embodiment will be described with reference to Fig. 7 .

第7實施形態例之真空排氣裝置36,係成為在將圖3中所示之減壓手段29和圖5中所示之作為後備而使用了相鄰接之真空幫浦12b者作了組合的構成中,更進而具備有用以進行相鄰接之真空幫浦12b的最終段之容積室的排氣之輔助減壓手段30的構成。The vacuum exhaust unit 36 of the seventh embodiment is combined with the decompression means 29 shown in Fig. 3 and the adjacent vacuum pump 12b as a backup as shown in Fig. 5. Further, the configuration further includes a configuration of the auxiliary decompression means 30 for exhausting the volume chamber of the final stage of the adjacent vacuum pump 12b.

因此,就算是在真空幫浦12a處產生有問題,亦能夠確實地進行真空幫浦12之消耗電力的抑制,並且,係能夠進行亦包含有真空幫浦12a以及真空幫浦12b的全部之真空幫浦12的消耗電力之抑制。Therefore, even if there is a problem in the vacuum pump 12a, the power consumption of the vacuum pump 12 can be surely suppressed, and the vacuum including the vacuum pump 12a and the vacuum pump 12b can be performed. The suppression of power consumption of the pump 12.

根據圖8,針對第8實施形態例作說明。An eighth embodiment will be described with reference to Fig. 8 .

第8實施形態例之真空排氣裝置37,係成為將圖2中所示之真空維持閥27和圖7中所示之減壓手段29、作為後備而使用了相鄰接之真空幫浦12b一事、以及輔助減壓手段30,作了組合的構成。In the vacuum exhausting device 37 of the eighth embodiment, the vacuum maintenance valve 27 shown in Fig. 2 and the decompression means 29 shown in Fig. 7 are used as backups, and adjacent vacuum pumps 12b are used. The combination and the auxiliary decompression means 30 are combined.

因此,係能夠將接下來進行最終段之容積部的排氣時之負載抑制在最小限度,並以良好的回應性來實施容積室之排氣運轉,,並且,就算是在真空幫浦12a處產生有問題,亦能夠確實地進行真空幫浦12之消耗電力的抑制,進而,係能夠進行亦包含有真空幫浦12a以及真空幫浦12b的全部之真空幫浦12的消耗電力之抑制。Therefore, it is possible to minimize the load when the exhaust of the volume portion of the final stage is performed next, and to perform the exhaust operation of the volume chamber with good responsiveness, and even at the vacuum pump 12a. When there is a problem, the power consumption of the vacuum pump 12 can be reliably suppressed, and further, the power consumption of the vacuum pump 12 including the vacuum pump 12a and the vacuum pump 12b can be suppressed.

根據圖9~圖11,針對第9實施形態例作說明。The ninth embodiment will be described with reference to Figs. 9 to 11 .

第9實施形態例之真空排氣裝置38,係成為將圖8中所示之真空排氣裝置37的輔助減壓手段30作了省略之構成。而,在作為第2基板處理室之加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7處,係經由真空配管40而被連接有1個的第2真空幫浦41。The vacuum exhaust unit 38 of the ninth embodiment is configured such that the auxiliary pressure reducing means 30 of the vacuum exhaust unit 37 shown in Fig. 8 is omitted. In the heating chamber 3, the first processing chamber 4, the second processing chamber 5, the third processing chamber 6, and the fourth processing chamber 7 as the second substrate processing chamber, one is connected via the vacuum piping 40. The second vacuum pump 41.

在第2真空幫浦41之吸氣側的真空配管40處,係具備有開閉閥42,藉由將開閉閥42開啟並驅動1個的第2真空幫浦41,加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7之內部係被設為真空狀態,並被設為在工程處理中所需要之真空氛圍。In the vacuum piping 40 on the intake side of the second vacuum pump 41, the opening and closing valve 42 is provided, and the first vacuum pump 41 is driven by the opening and closing valve 42 to drive the heating chamber 3 and the first processing. The interiors of the chamber 4, the second processing chamber 5, the third processing chamber 6, and the fourth processing chamber 7 are in a vacuum state, and are set to a vacuum atmosphere required for engineering processing.

在開閉閥42之上流側處的真空配管40,係被與將裝載鎖定室2維持在特定之真空狀態的吸氣集合管14(真空幫浦12的其中1個)作連接,在連接部處,係被設置有對於流路作切換之流路選擇手段43。又,係被連接於真空幫浦12之其中一個(真空幫浦12s)之吸氣管處,在連接部處,係具備有流路選擇手段43。第2真空幫浦41之最終段的容積室(排氣側),係藉由排氣管18來透過真空維持閥27而被與排氣集合管19作連接。The vacuum piping 40 at the upstream side of the opening and closing valve 42 is connected to the suction collecting pipe 14 (one of the vacuum pumps 12) that maintains the load lock chamber 2 in a specific vacuum state at the joint portion. The flow path selecting means 43 for switching the flow path is provided. Further, it is connected to an intake pipe of one of the vacuum pumps 12 (vacuum pump 12s), and a flow path selecting means 43 is provided at the connection portion. The volume chamber (exhaust side) of the final stage of the second vacuum pump 41 is connected to the exhaust manifold 19 through the evacuation pipe 18 through the vacuum maintenance valve 27.

當在第2真空幫浦41處產生了問題的情況時,藉由以流路選擇手段43來將流路切換至真空幫浦12s側處,能夠藉由真空幫浦12s來將加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7之內部設為真空狀態。故而,就算是在萬一發生問題的情況時,亦能夠將在工程處理中所需要的真空氛圍作維持,並成為能夠繼續進行在加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7處之處理。When a problem occurs in the second vacuum pump 41, the flow path is switched to the vacuum pump 12s side by the flow path selecting means 43, and the heating chamber 3 can be replaced by the vacuum pump 12s. The inside of the first processing chamber 4, the second processing chamber 5, the third processing chamber 6, and the fourth processing chamber 7 is in a vacuum state. Therefore, even in the event of a problem, the vacuum atmosphere required for the engineering process can be maintained, and the heating chamber 3, the first processing chamber 4, and the second processing chamber 5 can be continued. Processing in the third processing chamber 6 and the fourth processing chamber 7.

而,第2真空幫浦41之最終段的容積室(排氣側),由於係藉由排氣集合管19以及輔助配管22而被與真空幫浦12a作連接,因此,係能夠藉由真空幫浦12a來進行第2真空幫浦41之最終段的容積室之排氣。藉由此,在待機運轉時之第2真空幫浦41之動力,理論上,由於並沒有流體之移送,因此係成為僅有機械性損失,而能夠將消耗電力大幅度地作削減。The volume chamber (exhaust side) of the final stage of the second vacuum pump 41 is connected to the vacuum pump 12a by the exhaust manifold 19 and the auxiliary piping 22, so that it can be vacuumed. The pump 12a performs the exhaust of the volume chamber of the final stage of the second vacuum pump 41. As a result, the power of the second vacuum pump 41 during the standby operation is theoretically such that there is no transfer of the fluid, so that only mechanical loss is obtained, and the power consumption can be greatly reduced.

根據圖10,針對真空幫浦12之旋轉控制作說明。The rotation control of the vacuum pump 12 will be described with reference to FIG.

當藉由基板處理裝置1而進行工程處理的情況時,係藉由第2真空幫浦41之驅動,來將裝載鎖定室2、加熱室3、第1處理室4、第2處理室5、第3處理室6以及第4處理室7設為特定之真空狀態。When the engineering processing is performed by the substrate processing apparatus 1, the load lock chamber 2, the heating chamber 3, the first processing chamber 4, and the second processing chamber 5 are driven by the driving of the second vacuum pump 41. The third processing chamber 6 and the fourth processing chamber 7 are in a specific vacuum state.

在進行將既存之真空狀態作維持之運轉(待機運轉)的情況時,係藉由1個的真空幫浦12a來進行其他的真空幫浦12之最終段的容積室之排氣,並維持其他的真空幫浦12之最終段的真空。於此情況,其他的真空幫浦12之旋轉,係被控制為較進行將裝載鎖定室2設為特定之真空狀態之運轉的情況時之旋轉數而更低的旋轉數。亦即是,在為了維持裝載鎖定室2之真空壓所進行的真空幫浦12之運轉時的旋轉數,係被設定為能夠在特定之恢復時間內而將裝載鎖定室2設為特定之真空狀態的最小之旋轉數。When the operation of maintaining the existing vacuum state (standby operation) is performed, the vacuum chamber 12a of one vacuum pump 12 is used to exhaust the volume chamber of the final stage of the other vacuum pump 12, and the other is maintained. Vacuum of the final section of the vacuum pump 12. In this case, the rotation of the other vacuum pump 12 is controlled to be lower than the number of rotations when the load lock chamber 2 is operated in a specific vacuum state. That is, the number of rotations during the operation of the vacuum pump 12 for maintaining the vacuum pressure of the load lock chamber 2 is set so that the load lock chamber 2 can be set to a specific vacuum within a specific recovery time. The minimum number of rotations of the state.

如圖10中所示一般,當真空幫浦12之旋轉數為高的情況時,為了將裝載鎖定室2之真空壓作維持所需要的恢復時間,係為0秒。又,當真空幫浦12之旋轉數為落在特定之範圍內時(圖中的T1rpm~T3rpm之間),恢復至將裝載鎖定室2之真空壓作維持的狀態之恢復時間,係不會有大幅的變化。而,當真空幫浦12之旋轉數為低的情況時,恢復至將裝載鎖定室2之真空壓作維持的狀態之恢復時間,係會變長(超過了圖中之點線)。As shown in Fig. 10, in general, when the number of rotations of the vacuum pump 12 is high, the recovery time required for maintaining the vacuum of the load lock chamber 2 is 0 seconds. Further, when the number of rotations of the vacuum pump 12 falls within a specific range (between T1 rpm and T3 rpm in the figure), the recovery time to the state in which the vacuum of the load lock chamber 2 is maintained is maintained. There have been big changes. On the other hand, when the number of rotations of the vacuum pump 12 is low, the recovery time to return to the state in which the vacuum of the load lock chamber 2 is maintained is longer (exceeding the dotted line in the drawing).

用以恢復至將裝載鎖定室2之真空壓作維持的狀態所需之恢復時間,係以越快為越理想,但是,由於在基板處理裝置1中,係有多數的機器在作動,因此,係並不需要使恢復時間成為0秒,只要是在特定之恢復時間內,則不會對於基板處理造成影響。故而,係在恢復時間大略不會作改變的範圍之旋轉數(圖中之T1rpm~T3rpm之間)中,將在最短的恢復時間處之真空幫浦12的旋轉數(圖中之T2rpm近旁),設為真空幫浦12之旋轉數,並使其運轉。The recovery time required to return to the state in which the vacuum of the load lock chamber 2 is maintained is preferably as fast as possible. However, since a large number of machines are operated in the substrate processing apparatus 1, It is not necessary to make the recovery time 0 seconds, as long as it is within a specific recovery time, it will not affect the substrate processing. Therefore, in the number of rotations (between T1 rpm and T3 rpm in the figure) where the recovery time is not substantially changed, the number of rotations of the vacuum pump 12 at the shortest recovery time (near the T2 rpm in the figure) Set the number of rotations of the vacuum pump 12 and operate it.

因此,在進行待機運轉的情況時,係能夠以最小的旋轉數來使真空幫浦12作旋轉,而能夠對於消耗電力作抑制。Therefore, when the standby operation is performed, the vacuum pump 12 can be rotated with a minimum number of rotations, and power consumption can be suppressed.

根據圖11,針對在以特定之恢復時間而對於真空幫浦12之旋轉作了控制的情況時之消耗電力的狀況作說明。According to Fig. 11, a description will be given of a state of power consumption in the case where the rotation of the vacuum pump 12 is controlled with a specific recovery time.

如同在圖中以實線所示一般,若是在時刻t1處而成為待機運轉,則真空幫浦12之旋轉數係一直降低至在最短的恢復時間處之旋轉數,而消耗電力係一直降低至了P1。又,如同圖中以點線所示一般,當將真空幫浦12之旋轉數,控制為在進行將裝載鎖定室2設為特定之真空狀態的運轉時之旋轉數的情況時,消耗電力係只會降低至較P1而更高的P2處。As shown by the solid line in the figure, if the standby operation is performed at time t1, the number of revolutions of the vacuum pump 12 is always reduced to the number of revolutions at the shortest recovery time, and the power consumption is always reduced to P1. Further, as shown by the dotted line in the figure, when the number of rotations of the vacuum pump 12 is controlled to be the number of rotations during the operation in which the load lock chamber 2 is in a specific vacuum state, the power consumption system is controlled. It will only be lowered to P2 which is higher than P1.

又,當使真空幫浦12從待機運轉而恢復至用以設為特定之真空狀態的運轉時之旋轉數的情況時,由於係成為從低旋轉數所進行之恢復,因此,不會有旋轉數變得過高的情況,如同在圖中時刻t2處而以點線所展示一般,能夠對於消耗電力暫時性地變高一事作抑制。In addition, when the vacuum pump 12 is returned from the standby operation to the number of rotations during the operation in a specific vacuum state, since the recovery is performed from the low rotation number, there is no rotation. When the number becomes too high, as shown by the dotted line at the time t2 in the figure, it is possible to suppress the power consumption temporarily becoming higher.

故而,係能夠將從時刻t1起直到時刻t2為止的一次之待機期間(直到恢復為止的期間)中之消耗電力大幅度的作削減,而成為能夠對於能源之有效消耗有所助益。Therefore, the power consumption in the standby period (the period until the recovery) from the time t1 to the time t2 can be greatly reduced, and it is possible to contribute to the effective consumption of energy.

另外,上述之真空幫浦12的旋轉數之控制,雖係列舉出適用在第9實施形態例之真空排氣裝置38中的例子而作了說明,但是,亦能夠適用在第1實施形態例~第8實施形態例之真空排氣裝置處的真空幫浦12之旋轉數的控制中。In addition, although the control of the number of rotations of the above-described vacuum pump 12 is described in the vacuum evacuation device 38 of the ninth embodiment, the first embodiment can be applied. In the control of the number of revolutions of the vacuum pump 12 at the vacuum exhaust device of the eighth embodiment.

上述之真空排氣裝置,係能夠並不使用輔助幫浦便對於複數台之真空幫浦12的消耗電力作抑制。The vacuum evacuation device described above can suppress the power consumption of the plurality of vacuum pumps 12 without using the auxiliary pump.

又,上述之基板處理裝置,係成為具備有能夠並不使用輔助幫浦便對於複數台之真空幫浦12的消耗電力作抑制之真空排氣裝置的基板處理裝置。Moreover, the substrate processing apparatus described above is a substrate processing apparatus including a vacuum exhaust apparatus capable of suppressing power consumption of the plurality of vacuum pumps 12 without using an auxiliary pump.

[產業上之利用可能性][Industry use possibility]

本發明,係能夠在將處理室排氣為真空狀態之真空排氣裝置以及真空排氣方法的產業領域中作利用。The present invention can be utilized in the industrial field of a vacuum exhausting device and a vacuum exhausting method in which a processing chamber is evacuated to a vacuum state.

又,本發明,係能夠在被連接有真空排氣裝置之基板處理裝置的產業領域中作利用。Moreover, the present invention can be utilized in the industrial field of a substrate processing apparatus to which a vacuum exhaust apparatus is connected.

1...基板處理裝置1. . . Substrate processing device

2...裝載鎖定室2. . . Load lock chamber

3...加熱室3. . . Heating chamber

4...第1處理室4. . . First processing room

5...第2處理室5. . . Second processing room

6...第3處理室6. . . Third processing room

7...第4處理室7. . . Fourth processing room

11、31、32、33、34、35、36、37、38...真空排氣裝置11, 31, 32, 33, 34, 35, 36, 37, 38. . . Vacuum exhaust

12、12a、12b...真空幫浦12, 12a, 12b. . . Vacuum pump

13、40...真空配管13, 40. . . Vacuum piping

14...吸氣集合管14. . . Suction manifold

15...吸氣管15. . . Suction pipe

16...消音器16. . . silencer

17...排氣系17. . . Exhaust system

18、18b...排氣管18, 18b. . . exhaust pipe

19...排氣集合管19. . . Exhaust manifold

21...開閉閥twenty one. . . Open and close valve

21a...排氣調整閥21a. . . Exhaust adjustment valve

22...輔助配管twenty two. . . Auxiliary piping

23...輔助排氣閥twenty three. . . Auxiliary exhaust valve

24...壓力檢測手段twenty four. . . Pressure detection means

27...真空維持閥27. . . Vacuum maintenance valve

28、42...開閉閥28, 42. . . Open and close valve

29...減壓手段29. . . Decompression

30...輔助減壓手段30. . . Auxiliary decompression

41...第2真空幫浦41. . . Second vacuum pump

[圖1]本發明之第1實施形態例的基板處理裝置之概略系統圖。Fig. 1 is a schematic system diagram of a substrate processing apparatus according to a first embodiment of the present invention.

[圖2]本發明之第2實施形態例的基板處理裝置之概略系統圖。Fig. 2 is a schematic system diagram of a substrate processing apparatus according to a second embodiment of the present invention.

[圖3]本發明之第3實施形態例的基板處理裝置之概略系統圖。Fig. 3 is a schematic system diagram of a substrate processing apparatus according to a third embodiment of the present invention.

[圖4]本發明之第4實施形態例的基板處理裝置之概略系統圖。Fig. 4 is a schematic system diagram of a substrate processing apparatus according to a fourth embodiment of the present invention.

[圖5]本發明之第5實施形態例的基板處理裝置之概略系統圖。Fig. 5 is a schematic system diagram of a substrate processing apparatus according to a fifth embodiment of the present invention.

[圖6]本發明之第6實施形態例的基板處理裝置之概略系統圖。Fig. 6 is a schematic system diagram of a substrate processing apparatus according to a sixth embodiment of the present invention.

[圖7]本發明之第7實施形態例的基板處理裝置之概略系統圖。Fig. 7 is a schematic system diagram of a substrate processing apparatus according to a seventh embodiment of the present invention.

[圖8]本發明之第8實施形態例的基板處理裝置之概略系統圖。Fig. 8 is a schematic system diagram of a substrate processing apparatus according to an eighth embodiment of the present invention.

[圖9]本發明之第9實施形態例的基板處理裝置之概略系統圖。Fig. 9 is a schematic system diagram of a substrate processing apparatus according to a ninth embodiment of the present invention.

[圖10]幫浦旋轉數之狀況的圖表。[Fig. 10] A graph of the state of the number of revolutions of the pump.

[圖11]消耗電力之圖表。[Fig. 11] A graph of power consumption.

1...基板處理裝置1. . . Substrate processing device

2...裝載鎖定室2. . . Load lock chamber

3...加熱室3. . . Heating chamber

4...第1處理室4. . . First processing room

5...第2處理室5. . . Second processing room

6...第3處理室6. . . Third processing room

7...第4處理室7. . . Fourth processing room

11...真空排氣裝置11. . . Vacuum exhaust

12、12a...真空幫浦12, 12a. . . Vacuum pump

13...真空配管13. . . Vacuum piping

14...吸氣集合管14. . . Suction manifold

15...吸氣管15. . . Suction pipe

16...消音器16. . . silencer

17...排氣系17. . . Exhaust system

18...排氣管18. . . exhaust pipe

19...排氣集合管19. . . Exhaust manifold

21...開閉閥twenty one. . . Open and close valve

21a...排氣調整閥21a. . . Exhaust adjustment valve

22...輔助配管twenty two. . . Auxiliary piping

23...輔助排氣閥twenty three. . . Auxiliary exhaust valve

24...壓力檢測手段twenty four. . . Pressure detection means

Claims (11)

一種真空排氣裝置,其特徵為,具備有:複數之真空幫浦,係相對於處理室而被作並聯連接,並將前述處理室設為特定之真空狀態;和排氣集合管,係被與前述真空幫浦之排氣側相通連;和輔助配管,係將至少1個的前述真空幫浦之吸氣側與前述排氣集合管作連接;和切換手段,係在前述處理室側或者是前述輔助配管側處而將前述至少1個的前述真空幫浦之吸氣側的流路作切換。 A vacuum exhausting device characterized by comprising: a plurality of vacuum pumps connected in parallel with respect to a processing chamber, and the processing chamber is set to a specific vacuum state; and an exhaust manifold Connected to the exhaust side of the vacuum pump; and an auxiliary pipe connecting at least one of the suction side of the vacuum pump to the exhaust manifold; and switching means on the side of the processing chamber or It is the side of the auxiliary pipe, and the flow path of the suction side of the at least one of the aforementioned vacuum pumps is switched. 如申請專利範圍第1項所記載之真空排氣裝置,其中,前述至少1個的前述真空幫浦,係藉由吸氣管而被與前述處理室作連接,前述切換手段,係在前述吸氣管處具備有將前述吸氣管之流路作開閉的排氣調整閥,在前述排氣調整閥之下流側的前述吸氣管處,係被連接有前述輔助配管,在前述輔助配管處,係具備有將前述輔助配管之流路因應於前述排氣調整閥之開閉而作閉開的輔助排氣閥。 The vacuum evacuation device according to claim 1, wherein the at least one vacuum pump is connected to the processing chamber by an intake pipe, and the switching means is suctioned. The air pipe is provided with an exhaust gas regulating valve that opens and closes the flow path of the intake pipe, and the auxiliary pipe is connected to the intake pipe on the flow side of the exhaust gas regulating valve, and the auxiliary pipe is connected to the auxiliary pipe. The auxiliary exhaust valve that closes the flow path of the auxiliary pipe in response to opening and closing of the exhaust gas regulating valve is provided. 如申請專利範圍第1項或第2項所記載之真空排氣裝置,其中,前述至少1個的真空幫浦以外之前述真空幫浦的排氣 側,係藉由排氣管而被與前述排氣集合管作連接,在前述排氣管處,係具備有與前述輔助排氣閥之開閉作連動而進行開閉之真空維持閥。 The vacuum exhaust apparatus according to the first or second aspect of the invention, wherein the vacuum pump of the vacuum pump other than the vacuum pump is exhausted The side is connected to the exhaust manifold by an exhaust pipe, and the exhaust pipe is provided with a vacuum maintenance valve that opens and closes in conjunction with opening and closing of the auxiliary exhaust valve. 如申請專利範圍第1項或第2項所記載之真空排氣裝置,其中,係具備有將前述至少1個的真空幫浦之排氣側作減壓的減壓手段。 The vacuum exhausting apparatus according to the first or second aspect of the invention, wherein the vacuum exhausting means for decompressing the exhaust side of the at least one vacuum pump is provided. 如申請專利範圍第1項或第2項所記載之真空排氣裝置,其中,係具備有將前述處理室側的壓力狀態檢測出來之壓力檢測手段,前述切換手段,係根據前述壓力檢測手段之檢測資訊而動作。 The vacuum exhausting apparatus according to the first or second aspect of the invention, wherein the pressure detecting means for detecting a pressure state on the processing chamber side is provided, and the switching means is based on the pressure detecting means. Detecting information and acting. 一種真空排氣方法,其特徵為:在藉由被並聯地作了配置的複數之真空幫浦而將處理室設為特定之真空狀態時,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,係藉由至少1個的前述真空幫浦來進行其他之前述真空幫浦的排氣側之大氣開放容積部的排氣。 A vacuum evacuation method characterized in that, in order to maintain the vacuum pressure of the processing chamber, when the processing chamber is set to a specific vacuum state by a plurality of vacuum pumps arranged in parallel In the operation of the vacuum pump, the evacuation of the atmospheric open volume portion on the exhaust side of the other vacuum pump is performed by at least one of the vacuum pumps. 如申請專利範圍第6項所記載之真空排氣方法,其中,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,係以較在將前述處理室設為特定之真空狀態的運轉時之旋轉數而更低之旋轉數,來使其他之前述真空幫浦運轉。 The vacuum evacuation method according to claim 6, wherein the vacuum chamber is operated to maintain the vacuum pressure of the processing chamber, and the processing chamber is set to a specific vacuum. In the state of operation, the number of rotations and the number of rotations are lower, so that the other vacuum pumps are operated. 如申請專利範圍第7項所記載之真空排氣方法,其中,在為了維持前述處理室之真空壓所進行的前述真空幫浦之運轉時,其他之前述真空幫浦的旋轉數,係為能夠在特定之恢復時間內而將前述處理室設為特定之真空狀態的旋轉數。 The vacuum evacuation method according to claim 7, wherein the number of rotations of the other vacuum pump is capable of operating the vacuum pump in order to maintain the vacuum pressure of the processing chamber The number of revolutions of the aforementioned processing chamber is set to a specific vacuum state within a specific recovery time. 一種基板處理裝置,其特徵為:係具備有使基板被作搬入並被進行特定之處理的基板處理室,並將如申請專利範圍第1~5項中之任一項所記載之真空排氣裝置的前述複數之真空幫浦,並聯地連接於前述基板處理室處。 A substrate processing apparatus comprising: a substrate processing chamber in which a substrate is carried in and subjected to a specific processing, and vacuum evacuation as described in any one of claims 1 to 5. The aforementioned plurality of vacuum pumps of the apparatus are connected in parallel to the substrate processing chamber. 如申請專利範圍第9項所記載之基板處理裝置,其中,係具備有:將從前述基板處理裝置而來之基板作搬入並進行特定之處理之第2基板處理室,在前述第2基板處理室處,連結第2真空幫浦,將前述真空幫浦之其中1個與前述第2真空幫浦之吸氣側作並聯連接,在前述真空幫浦之其中1個與前述第2真空幫浦之連接部處,具備有流路選擇手段。 The substrate processing apparatus according to the ninth aspect of the invention, further comprising: a second substrate processing chamber for carrying in a specific processing from the substrate processing apparatus, and processing the second substrate a second vacuum pump is connected to the chamber, and one of the vacuum pumps is connected in parallel with the suction side of the second vacuum pump, and one of the vacuum pumps and the second vacuum pump are The connection portion is provided with a flow path selection means. 如申請專利範圍第10項所記載之基板處理裝置,其中,在前述排氣集合管處,係通連有前述第2真空幫浦之排氣側, 藉由至少1個的前述真空幫浦,來經由前述排氣集合管而將前述第2真空幫浦之排氣側的流體排出。The substrate processing apparatus according to claim 10, wherein the exhaust manifold of the second vacuum pump is connected to the exhaust manifold. The fluid on the exhaust side of the second vacuum pump is discharged through the exhaust manifold by at least one of the vacuum pumps.
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