TWI487908B - Non - crystalline thin strip ductility automatic test device - Google Patents
Non - crystalline thin strip ductility automatic test device Download PDFInfo
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- TWI487908B TWI487908B TW102114948A TW102114948A TWI487908B TW I487908 B TWI487908 B TW I487908B TW 102114948 A TW102114948 A TW 102114948A TW 102114948 A TW102114948 A TW 102114948A TW I487908 B TWI487908 B TW I487908B
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Description
本發明係關於一種延性測試裝置,特別係關於一種非晶質薄帶延性自動測試裝置。The invention relates to a ductility testing device, in particular to an amorphous ribbon strip ductility automatic testing device.
習知非晶質薄帶之延性測試主要是依據ASTM A901規範之標準,即1公尺長以上之薄帶連續以180°繞過直徑3毫米之拋光棒材而不斷裂為標準。然而,上述標準並未規範實質操作方法,以致隨意以一直徑3毫米之棒材搭配手動方式拉扯薄帶之測試手法,仍能符合上述標準規範,如此一來,將很容易因測試手法不同而造成測試誤差。The ductility test of the conventional amorphous ribbon is mainly based on the standard of ASTM A901, that is, a strip of 1 meter or more continuously passes the polished rod of 3 mm in diameter at 180° without breaking. However, the above standards do not standardize the actual operation method, so that the test method of pulling the thin strip with a bar of 3 mm in diameter and manually can still meet the above standard specifications, so that it is easy to test different methods. Causes test errors.
因此,有必要提供一創新且具進步性之非晶質薄帶延性自動測試裝置,以解決上述問題。Therefore, it is necessary to provide an innovative and progressive amorphous thin strip ductility automatic test device to solve the above problems.
本發明提供一種非晶質薄帶延性自動測試裝置,包括:一本體,具有一槽,該槽包括一前槽部、一中間槽部及一後槽部,該中間槽部係位於該前槽部與該後槽部之間;一捲放軸,設置於該前槽部,用以捲繞一非晶質薄帶;一捲收軸,設置於該中間槽部,用以捲收該非晶質薄帶;及一延性測試棒,設置於該後槽部,用以對該非晶質薄帶進行延性測試。The invention provides an amorphous thin strip ductility automatic testing device, comprising: a body having a slot, the slot comprising a front slot portion, an intermediate slot portion and a rear slot portion, wherein the intermediate slot portion is located in the front slot Between the portion and the rear groove portion; a winding shaft disposed in the front groove portion for winding an amorphous ribbon; a winding shaft disposed in the intermediate groove portion for winding the amorphous portion a thin strip; and a ductile test rod disposed in the rear groove portion for ductility testing of the amorphous ribbon.
本發明係可使非晶質薄帶之延性測試自動化及標準化,進而減少人為量測所造成之誤差。The invention can automate and standardize the ductility test of the amorphous ribbon, thereby reducing the error caused by the artificial measurement.
為了能夠更清楚瞭解本發明的技術手段,而可依照說明書的內 容予以實施,並且為了讓本發明所述目的、特徵和優點能夠更明顯易懂,以下特舉較佳實施例,並配合附圖,詳細說明如下。In order to be able to understand the technical means of the present invention more clearly, it can be in accordance with the specification. The objects, features, and advantages of the invention will be apparent from the description and appended claims appended claims
10‧‧‧非晶質薄帶延性自動測試裝置10‧‧‧Amorphous thin strip ductility automatic test device
11‧‧‧本體11‧‧‧Ontology
111‧‧‧第一側板111‧‧‧First side panel
111a‧‧‧第一滑槽111a‧‧‧First chute
112‧‧‧第二側板112‧‧‧ second side panel
112a‧‧‧第二滑槽112a‧‧‧Second chute
113‧‧‧底板113‧‧‧floor
114‧‧‧槽114‧‧‧ slots
115‧‧‧前槽部115‧‧‧Front groove
116‧‧‧中間槽部116‧‧‧Intermediate groove
117‧‧‧後槽部117‧‧‧ rear groove
12‧‧‧捲放軸12‧‧‧Reel shaft
13‧‧‧捲收軸13‧‧‧Retraction shaft
14‧‧‧延性測試棒14‧‧‧Expansion test stick
15‧‧‧光檢測單元15‧‧‧Light detection unit
151‧‧‧上檢測器151‧‧‧Upper detector
152‧‧‧下檢測器152‧‧‧ lower detector
16‧‧‧張力保持柱16‧‧‧ Tension retaining column
17‧‧‧上調整棒17‧‧‧Upper adjustment rod
18‧‧‧下調整棒18‧‧‧Under the adjustment rod
19‧‧‧固定柱19‧‧‧Fixed column
20‧‧‧非晶質薄帶20‧‧‧Amorphous ribbon
D‧‧‧延性測試棒之直徑D‧‧‧diameter of the ductility test rod
D1‧‧‧水平距離D1‧‧‧ horizontal distance
D2‧‧‧垂直距離D2‧‧‧ vertical distance
圖1顯示本發明非晶質薄帶延性自動測試裝置之立體示意圖;圖2顯示本發明非晶質薄帶延性自動測試裝置之側視圖;及圖3顯示本發明非晶質薄帶延性自動測試裝置之測試示意圖。1 is a schematic perspective view of an amorphous thin strip ductility automatic testing device of the present invention; FIG. 2 is a side view showing the amorphous ribbon strip ductility automatic testing device of the present invention; and FIG. 3 is a view showing the amorphous ribbon strip ductility automatic test of the present invention. Test schematic of the device.
圖1顯示本發明非晶質薄帶延性自動測試裝置之立體示意圖。圖2顯示本發明非晶質薄帶延性自動測試裝置之側視圖。圖3顯示本發明非晶質薄帶延性自動測試裝置之測試示意圖。配合參閱圖1、圖2及圖3,本發明非晶質薄帶延性自動測試裝置10包括一本體11、一捲放軸12、一捲收軸13、一延性測試棒14、一光檢測單元15、一張力保持柱16、一上調整棒17、一下調整棒18及二固定柱19。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a perspective view showing the amorphous ribbon strip ductility automatic test apparatus of the present invention. Figure 2 is a side elevational view of the amorphous ribbon strip ductility test apparatus of the present invention. Fig. 3 is a view showing the test of the amorphous ribbon elongation test apparatus of the present invention. Referring to FIG. 1 , FIG. 2 and FIG. 3 , the amorphous thin strip ductility automatic testing device 10 of the present invention comprises a body 11 , a winding shaft 12 , a winding shaft 13 , a ductile test rod 14 , and a light detecting unit . 15. A force holding column 16, an upper adjustment rod 17, a lower adjustment rod 18 and two fixed columns 19.
該本體11包括一第一側板111、一第二側板112、一底板113及一槽114。該第二側板112與該第一側板111呈相對設置,且該第一側板111及該第二側板112分別具有一第一滑槽111a及一第二滑槽112a。該底板113之兩端分別連接該第一側板111之一端及該第二側板112之一端,在本實施例中,該第一側板111、該第二側板112及該底板113連接後呈ㄩ字形狀。該槽114係位於該第一側板111與該第二側板112之間,且該槽114包括一前槽部115、一中間槽部116及一後槽部117,該中間槽部116係位於該前槽部115與該後槽部117之間。The body 11 includes a first side plate 111 , a second side plate 112 , a bottom plate 113 , and a slot 114 . The second side plate 112 and the first side plate 111 are opposite to each other, and the first side plate 111 and the second side plate 112 respectively have a first sliding slot 111a and a second sliding slot 112a. The two ends of the first side plate 111 and the one end of the second side plate 112 are connected to each other. In this embodiment, the first side plate 111, the second side plate 112 and the bottom plate 113 are connected to each other. shape. The slot 114 is located between the first side plate 111 and the second side plate 112, and the slot 114 includes a front slot portion 115, an intermediate slot portion 116 and a rear slot portion 117. The intermediate slot portion 116 is located therein. The front groove portion 115 is spaced between the rear groove portion 117.
該捲放軸12設置於該前槽部115,用以捲繞一非晶質薄帶20。在本實施例中,該捲放軸12之兩端分別樞設於該第一側板111及該第二側板112。The take-up reel 12 is disposed in the front groove portion 115 for winding an amorphous ribbon 20. In this embodiment, the two ends of the winding shaft 12 are respectively pivoted on the first side plate 111 and the second side plate 112.
該捲收軸13設置於該中間槽部116,用以捲收該非晶質薄帶20。在本實施例中,該捲收軸13之兩端分別樞設於該第一側板111及該第 二側板112,且該捲收軸13係與該捲放軸12同步轉動。The take-up reel 13 is disposed in the intermediate groove portion 116 for winding the amorphous ribbon 20. In this embodiment, the two ends of the retracting shaft 13 are respectively pivoted on the first side plate 111 and the first The two side plates 112 are rotated in synchronization with the take-up reel 12.
該延性測試棒14設置於該後槽部117,用以對該非晶質薄帶20進行延性測試。在本實施例中,該延性測試棒14之兩端分別樞設於該第一側板111及該第二側板112。The ductile test bar 14 is disposed in the rear groove portion 117 for performing ductility testing on the amorphous ribbon 20. In this embodiment, the two ends of the ductility test bar 14 are respectively pivoted on the first side plate 111 and the second side plate 112.
該光檢測單元15設置於該捲收軸13與該延性測試棒14之間,用以檢測該非晶質薄帶20是否具有裂痕缺陷。該光檢測單元15包括一上檢測器151及一下檢測器152,該上檢測器151及該下檢測器152係對準該非晶質薄帶20,以檢測該非晶質薄帶20是否具有裂痕缺陷。在本實施例中,該光檢測單元15在檢知該非晶質薄帶20具有裂痕缺陷時,係會輸出一制動訊號,該制動訊號係使該捲收軸13及該捲放軸12停止轉動,以便對缺陷處進行噴墨標示及記錄於電腦中。The light detecting unit 15 is disposed between the winding shaft 13 and the ductility test rod 14 for detecting whether the amorphous ribbon 20 has a crack defect. The photodetecting unit 15 includes an upper detector 151 and a lower detector 152. The upper detector 151 and the lower detector 152 are aligned with the amorphous ribbon 20 to detect whether the amorphous ribbon 20 has a crack defect. . In the embodiment, the light detecting unit 15 outputs a braking signal when detecting that the amorphous ribbon 20 has a crack defect, and the braking signal stops the winding shaft 13 and the winding shaft 12 from rotating. In order to ink mark and record in the computer.
該張力保持柱16設置於該中間槽部116,且壓設於該非晶質薄帶20。在本實施例中,該張力保持柱16之兩端分別設置於該第一側板111之第一滑槽111a及該第二側板112之第二滑槽112a,以使該張力保持柱16可上下移動。The tension holding column 16 is disposed on the intermediate groove portion 116 and is pressed against the amorphous ribbon 20 . In this embodiment, the two ends of the tension holding column 16 are respectively disposed on the first sliding groove 111a of the first side plate 111 and the second sliding groove 112a of the second side plate 112, so that the tension holding column 16 can be up and down. mobile.
該上調整棒17及該下調整棒18係設置於該中間槽部116,且位於該捲收軸13與該延性測試棒14之間。在本實施例中,該上調整棒17與該下調整棒18之間係具有一水平距離D1及一垂直距離D2,該垂直距離D2係等於該延性測試棒14之直徑D。較佳地,該延性測試棒14之直徑D係為3毫米。The upper adjustment rod 17 and the lower adjustment rod 18 are disposed in the intermediate groove portion 116 and are located between the take-up shaft 13 and the ductility test rod 14. In the present embodiment, the upper adjustment rod 17 and the lower adjustment rod 18 have a horizontal distance D1 and a vertical distance D2, which is equal to the diameter D of the ductility test rod 14. Preferably, the ductility test rod 14 has a diameter D of 3 mm.
該等固定柱19分別設置於該前槽部115及該後槽部117,且各該固定柱19之兩端分別固定於該第一側板111及該第二側板112。The fixing posts 19 are respectively disposed on the front groove portion 115 and the rear groove portion 117 , and the two ends of each of the fixing posts 19 are respectively fixed to the first side plate 111 and the second side plate 112 .
配合參閱圖1及圖3,該非晶質薄帶20之延性自動測試流程包括:將該非晶質薄帶20捲繞於該捲放軸12上;將該非晶質薄帶20捲出,使其依序繞過該張力保持柱16之下方、該下調整棒18之上方及該上調整棒17之下方,在此步驟中,該張力保持柱16係會下壓該非晶質 薄帶20,以提供該非晶質薄帶20測試所需之張力;使該非晶質薄帶20以180°彎繞過直徑3毫米之該延性測試棒14,再使其依序繞過該上調整棒17之下方及該下調整棒18之上方:將該非晶質薄帶20捲繞於該捲收軸13上;及同步轉動該捲放軸12及該捲收軸13,以對該非晶質薄帶20進行延性自動測試。Referring to FIG. 1 and FIG. 3, the ductility automatic testing process of the amorphous ribbon 20 includes: winding the amorphous ribbon 20 on the winding shaft 12; and rolling the amorphous ribbon 20 to make it The tension holding column 16 is sequentially bypassed, above the lower adjusting rod 18 and below the upper adjusting rod 17, in this step, the tension holding column 16 is pressed down to the amorphous Thin strip 20 to provide the tension required for testing the amorphous ribbon 20; the amorphous ribbon 20 is bent at 180° through the ductile test rod 14 having a diameter of 3 mm, and then sequentially passed over the upper Below the adjustment rod 17 and above the lower adjustment rod 18: the amorphous ribbon 20 is wound around the take-up shaft 13; and the take-up shaft 12 and the take-up shaft 13 are synchronously rotated to The thin strip 20 is subjected to an automatic ductility test.
本發明之該非晶質薄帶延性自動測試裝置10係可使該非晶質薄帶20之延性測試自動化及標準化,進而減少人為量測所造成之誤差。The amorphous ribbon elongation test apparatus 10 of the present invention can automate and standardize the ductility test of the amorphous ribbon 20, thereby reducing the error caused by the artificial measurement.
上述實施例僅為說明本發明之原理及其功效,並非限制本發明,因此習於此技術之人士對上述實施例進行修改及變化仍不脫本發明之精神。本發明之權利範圍應如後述之申請專利範圍所列。The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the scope of the present invention. The scope of the invention should be as set forth in the appended claims.
10‧‧‧非晶質薄帶延性自動測試裝置10‧‧‧Amorphous thin strip ductility automatic test device
11‧‧‧本體11‧‧‧Ontology
111‧‧‧第一側板111‧‧‧First side panel
111a‧‧‧第一滑槽111a‧‧‧First chute
112‧‧‧第二側板112‧‧‧ second side panel
112a‧‧‧第二滑槽112a‧‧‧Second chute
113‧‧‧底板113‧‧‧floor
114‧‧‧槽114‧‧‧ slots
115‧‧‧前槽部115‧‧‧Front groove
116‧‧‧中間槽部116‧‧‧Intermediate groove
117‧‧‧後槽部117‧‧‧ rear groove
12‧‧‧捲放軸12‧‧‧Reel shaft
13‧‧‧捲收軸13‧‧‧Retraction shaft
14‧‧‧延性測試棒14‧‧‧Expansion test stick
15‧‧‧光檢測單元15‧‧‧Light detection unit
151‧‧‧上檢測器151‧‧‧Upper detector
152‧‧‧下檢測器152‧‧‧ lower detector
16‧‧‧張力保持柱16‧‧‧ Tension retaining column
17‧‧‧上調整棒17‧‧‧Upper adjustment rod
18‧‧‧下調整棒18‧‧‧Under the adjustment rod
19‧‧‧固定柱19‧‧‧Fixed column
Claims (17)
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TW102114948A TWI487908B (en) | 2013-04-26 | 2013-04-26 | Non - crystalline thin strip ductility automatic test device |
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TWI487908B true TWI487908B (en) | 2015-06-11 |
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1359828A (en) * | 2000-12-22 | 2002-07-24 | 富士胶片株式会社 | Device and method for winding roll film |
TW200631681A (en) * | 2005-02-25 | 2006-09-16 | Mitsui Mining & Smelting Co | Cleaning apparatus and cleaning method for tape material |
CN102812134A (en) * | 2009-11-19 | 2012-12-05 | 魁北克水电公司 | System And Method For Treating An Amorphous Alloy Ribbon |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1359828A (en) * | 2000-12-22 | 2002-07-24 | 富士胶片株式会社 | Device and method for winding roll film |
TW200631681A (en) * | 2005-02-25 | 2006-09-16 | Mitsui Mining & Smelting Co | Cleaning apparatus and cleaning method for tape material |
CN102812134A (en) * | 2009-11-19 | 2012-12-05 | 魁北克水电公司 | System And Method For Treating An Amorphous Alloy Ribbon |
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