TWI475204B - - Google Patents

Info

Publication number
TWI475204B
TWI475204B TW100149708A TW100149708A TWI475204B TW I475204 B TWI475204 B TW I475204B TW 100149708 A TW100149708 A TW 100149708A TW 100149708 A TW100149708 A TW 100149708A TW I475204 B TWI475204 B TW I475204B
Authority
TW
Taiwan
Application number
TW100149708A
Other languages
Chinese (zh)
Other versions
TW201326778A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW100149708A priority Critical patent/TW201326778A/en
Priority to CN2012102988350A priority patent/CN103185664A/en
Publication of TW201326778A publication Critical patent/TW201326778A/en
Application granted granted Critical
Publication of TWI475204B publication Critical patent/TWI475204B/zh

Links

TW100149708A 2011-12-30 2011-12-30 Optical measurement aid with elliptical curved surface structure and optical measurement system TW201326778A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW100149708A TW201326778A (en) 2011-12-30 2011-12-30 Optical measurement aid with elliptical curved surface structure and optical measurement system
CN2012102988350A CN103185664A (en) 2011-12-30 2012-08-21 Optical measurement assistor with elliptic curved surface structure and optical measurement system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100149708A TW201326778A (en) 2011-12-30 2011-12-30 Optical measurement aid with elliptical curved surface structure and optical measurement system

Publications (2)

Publication Number Publication Date
TW201326778A TW201326778A (en) 2013-07-01
TWI475204B true TWI475204B (en) 2015-03-01

Family

ID=48676953

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100149708A TW201326778A (en) 2011-12-30 2011-12-30 Optical measurement aid with elliptical curved surface structure and optical measurement system

Country Status (2)

Country Link
CN (1) CN103185664A (en)
TW (1) TW201326778A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI634309B (en) * 2017-05-12 2018-09-01 翊鼎光電股份有限公司 Optical inspection apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101189472A (en) * 2005-06-30 2008-05-28 微阳有限公司 Dual paraboloid reflector and dual ellipsoid reflector systems with optimized magnification
US20110181191A1 (en) * 2006-03-31 2011-07-28 Energetiq Technology, Inc. Laser-Driven Light Source

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3946239A (en) * 1975-01-24 1976-03-23 The United States Of America As Represented By The United Energy Research And Development Administration Ellipsoidal cell flow system
US4360275A (en) * 1980-08-11 1982-11-23 Litton Systems Inc. Device for measurement of optical scattering
US5479009A (en) * 1992-09-25 1995-12-26 Labsphere, Inc. Highly efficient collection optical systems for providing light detectors such as photodetectors and the like with hemispherical fields of view
WO1999026054A1 (en) * 1997-11-19 1999-05-27 Otsuka Electronics Co., Ltd. Apparatus for measuring characteristics of optical angle
FR2869686B1 (en) * 2003-12-11 2009-06-05 Flowgene Sa ELLIPTICAL BED LIGHT DETECTOR
JP4226466B2 (en) * 2003-12-26 2009-02-18 株式会社ユニテック Reflective optical system, reflection optical system of diffused light source measuring apparatus, diffused light source measuring apparatus and measuring method thereof
CN1983643A (en) * 2005-12-16 2007-06-20 联杰光电股份有限公司 Optical device and measuring method
US7777887B2 (en) * 2007-04-13 2010-08-17 Ion Optics, Inc. Absorption spectroscopy apparatus and method

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101189472A (en) * 2005-06-30 2008-05-28 微阳有限公司 Dual paraboloid reflector and dual ellipsoid reflector systems with optimized magnification
US20110181191A1 (en) * 2006-03-31 2011-07-28 Energetiq Technology, Inc. Laser-Driven Light Source

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
謝志欣、林啟湟,雙橢球反射光學特性量測法,國立中山大學物理學系研究所碩博士論文,2011年7月 *

Also Published As

Publication number Publication date
CN103185664A (en) 2013-07-03
TW201326778A (en) 2013-07-01

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