TWI468651B - Optical measurement system, carrying structure for configuring the same, and optical measurement method - Google Patents

Optical measurement system, carrying structure for configuring the same, and optical measurement method Download PDF

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Publication number
TWI468651B
TWI468651B TW101110220A TW101110220A TWI468651B TW I468651 B TWI468651 B TW I468651B TW 101110220 A TW101110220 A TW 101110220A TW 101110220 A TW101110220 A TW 101110220A TW I468651 B TWI468651 B TW I468651B
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Taiwan
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light
positions
detecting
optical
emitting
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TW101110220A
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Chinese (zh)
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TW201339550A (en
Inventor
Chien Hsiang Hung
Jan Liang Yeh
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Oto Photonics Inc
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Description

Optical measuring system, bearing structure for erecting the same, and optical measuring method

The invention relates to a measuring system, a measuring method and a bearing structure, and in particular to an optical measuring system, a bearing structure for erecting the same and an optical measuring method.

With the advancement of modern semiconductor technology, light emitting diodes (LEDs) have been widely used to provide light sources for electronic devices such as traffic signs, large billboards, scanners, and liquid crystal displays.

Before the illumination source is manufactured, it is usually necessary to use a measuring device to measure the light intensity of the light emitted by the illumination source to determine whether the illumination source can operate normally. An LED light bar or a light emitting diode array light source typically has a plurality of light emitting diodes. When the light-emitting diode strip or the array light source is measured at a single position by a conventional measuring device, the light intensity contributed to the single position by the light-emitting diodes located at different positions, such as irradiance, is not the same. Therefore, it is generally impossible to determine how many light-emitting diodes are not functioning properly by the measured single light intensity value, or to determine how much luminous flux or radiant flux the light-emitting diode strip or array light source has. (radiant flux) loss.

In addition, even if the conventional fluorescent tube or the planar light source is measured, since the different light-emitting areas of the fluorescent tube or the planar light source contribute different light intensities to the single measurement position, the conventional measuring device is used to measure the conventional fluorescent tube or In the case of a planar light source, it is still impossible to discriminate the loss of luminous flux or radiant flux of the light-emitting diode strip or the array light source.

If an integrating sphere is used to measure the illumination source, The longer the length of the light source, the larger the volume of the integrating sphere to be used. When the integrating sphere is used to measure the tube, its diameter usually needs to be three times the length of the tube. Although the integrating sphere can measure the exact luminous flux or radiation flux, the bulky integrating sphere is expensive and difficult to maintain, which increases the cost of the measuring equipment. In addition, the large size of the integrating sphere will take up too much space, making the planning of the production line more difficult.

The present invention provides an optical measurement system that measures an overall light intensity evaluation value obtained by homogenizing the overall light intensity weight distribution generated by the illumination condition and the light detection condition.

The present invention provides an optical measurement method capable of measuring an overall light intensity evaluation value obtained by homogenizing an overall light intensity weight distribution generated by a light-emitting condition and a light detection condition.

An embodiment of the present invention provides an optical measurement system including a light detection module and a signal integration unit. The light detecting module detects the light intensity of at least some of the light emitting regions at a plurality of different detecting positions for the plurality of light emitting regions to obtain a plurality of light intensity signals respectively corresponding to the detected positions. The signal integration unit integrates these light intensity signals to obtain an overall light intensity assessment associated with these illumination zones.

An embodiment of the invention provides an optical metrology method comprising the following steps. For a plurality of illuminating regions, the light intensities of at least some of the illuminating regions are respectively detected at a plurality of different detecting positions to obtain a plurality of light intensity signals respectively corresponding to the detected positions. These light intensity signals are integrated to obtain an overall light intensity estimate associated with these illumination zones.

One embodiment of the present invention provides a load bearing structure for erecting an optical measurement system, including a support frame and at least one mounting member. Mounting parts will be optical measuring system to The less than one photodetector is movably or non-movably mounted on the support frame to provide a plurality of different detection positions for the photodetector to detect at the detection positions to obtain a plurality of light intensity signals respectively. A signal integration unit of the optical measurement system integrates the light intensity signals.

An embodiment of the invention provides an optical metrology system for measuring a lighting device. The optical measurement system includes a light detection module and a signal integration unit. The light detecting module detects the light intensity of at least a portion of the light emitting devices at a plurality of different detecting positions for the light emitting device to obtain a plurality of light intensity signals respectively corresponding to the detected positions. The signal integration unit integrates these light intensity signals to obtain an overall light intensity evaluation value associated with the illumination device.

Based on the above, in the optical measuring system and the optical measuring method according to the embodiment of the present invention, the light intensity of the light emitting regions or the light emitting devices are respectively detected at a plurality of different detecting positions, and the obtained light is integrated. The intensity signal is used to obtain an overall light intensity evaluation value. Therefore, the overall light intensity evaluation value is measured in the case where the positions of the light-emitting areas or the light-emitting devices, the detection positions, and other possible light-emitting or detecting light conditions are uniform in the overall light intensity weight distribution. of. In this way, the overall light intensity evaluation value helps to determine how many units of light loss in the light-emitting device or the light-emitting areas, or to determine how many light-emitting areas are not functioning properly. In addition, in the load-bearing structure of the embodiment of the present invention, the photodetector is movably or non-movably mounted on the support frame by using the mounting member, which is advantageous for the optical measurement system to achieve highly accurate measurement.

The above described features and advantages of the present invention will be more apparent from the following description.

1A is a side elevational view of an optical measurement system and a load-bearing structure according to an embodiment of the present invention, and FIG. 1B illustrates each optical detector when the optical measurement system of FIG. 1A measures a normally operating illumination device. The light intensity distribution function and the total light intensity distribution function of all photodetectors. FIG. 1C illustrates boundary conditions of a photodetector in the optical metrology system of FIG. 1A. Referring to FIG. 1A , the optical measurement system 100 of the present embodiment is configured to measure a plurality of light-emitting regions 52 , for example, a plurality of light-emitting regions 52 of a light-emitting device 50 . However, in other embodiments, the illuminating regions 52 may also be independent of each other and belong to different illuminating devices. In this embodiment, the optical measurement system 100 includes a light detection module 110 and a signal integration unit 120. The light detecting module 110 detects the light intensity of at least a portion of the light emitting regions 52 (or at least portions of the light emitting devices 50) at the plurality of different detecting positions P for the light emitting regions 52 (or for example, for the entire light emitting device 50). A plurality of light intensity signals G respectively corresponding to the detected positions P are obtained. In this embodiment, the light detecting module 110 detects the light intensity of all the light emitting regions 52 at each detecting position P.

In this embodiment, each of the light-emitting regions 52 is contributed by a light-emitting element 54, wherein the light-emitting elements 54 are, for example, light-emitting diodes, and the light-emitting diodes are disposed on the strip-shaped carrier 56 to form a light-emitting diode. Polar body lamp. However, in other embodiments, the light-emitting element 54 can also be other suitable light-emitting elements. In the present embodiment, the light-emitting device 50 is, for example, an LED light bar, that is, the light-emitting elements 54 are arranged along a straight line. However, in other embodiments, the light-emitting elements 54 may also be arranged along two or more parallel lines or arranged in a two-dimensional array. However, in other embodiments, the illuminating regions 52 may be continuously joined into a continuous illuminating line or illuminating surface, that is, the illuminating regions 52 form a continuous line source or surface source.

In this embodiment, the photodetection module 110 includes a plurality of photodetectors 112 respectively disposed at the detection positions P. In addition, in the embodiment, the photodetectors 112 are each a spectrometer, and the measured light intensity is, for example, the light intensity in the spectrum, and the light intensities of different wavelengths can be measured. However, in other embodiments, the photodetectors 112 can also be a light intensity meter, such as an irradiance meter, and the measured light intensity is, for example, irradiance. Alternatively, in other embodiments, the light intensity measured by the photodetector 112 may be other types of light intensities, such as illuminance, radiance, luminance, and radiation. Radiant intensity, luminous intensity, and the like. Moreover, the signal integration unit 120 integrates the light intensity signals G to obtain an overall light intensity evaluation value associated with the light-emitting regions 52 (or associated with the light-emitting device 50). In this embodiment, the light entrance of each photodetector 112 is provided with a diffuser 113, such as a cosine corrector, which can guide the light incident in all directions to the photodetector 112. Inside. In another embodiment, the cosine corrector or other diffuser may not be used, and the photodetector 112 may have a limited range of light collection angles.

Referring again to FIGS. 1A and 1B, the horizontal axis in FIG. 1B is a position in which the center point of the light-emitting device 50 is at a position of 0, and the vertical axis is a photosensitive intensity. In the present embodiment, the photographic intensity is, for example, irradiance. When the light detecting module 110 detects a normally operating light emitting device 50 (having a plurality of normally operating light emitting regions 52) at a detecting position P, the different light emitting regions 52 of the normally operating light emitting device 50 (or The plurality of different locations on the normally functioning illumination device 50 contributes a sensitivity to the position of the photodetection module 110 relative to the locations of the different illumination zones 52 (or relative to the different locations on the illumination device 50). Intensity distribution function (such as curves C1, C2 C3 and C4). In addition, these photosensitivity distribution functions (ie, curves C1, C2, C3, and C4) of these detected positions P are summed to become a total photosensitive intensity distribution function (ie, curve CT).

In the present embodiment, the light-emitting regions 52 are arranged on a reference line R. However, in another embodiment, the light-emitting regions 52 may also be arranged on a reference surface, wherein the reference surface is, for example, a plane containing the reference line R and substantially perpendicular to the plane of FIG. 1A. When the length L of the light-emitting device 50 in FIG. 1A is 120 cm, the vertical distance H of the photodetector 112 to the reference line R (or the reference surface) is 30 cm, and the pitch of the photodetector 112 is T. At 30 cm, these curves C1, C2, C3, and C4 are obtained through simulation calculations. These curves C1, C2, C3, and C4 (i.e., representative photosensitivity distribution functions) are calculated in consideration of the radiation angle distribution of the light-emitting region 52 and the sensitivity angular distribution of the photodetector 112. In addition, the physical meaning of the photo-intensity distribution function is the distribution of the intensity intensity weights contributed to the corresponding photodetectors 112 at different locations on the illumination device 50. In other words, the weights of the photosensitivity of a particular photodetector 112 contributed by different locations on at least a portion of the illumination device 50 are not the same.

If only one photodetector 112 detects the light intensity provided by the illuminating device 50 at a detecting position P, the brightness of the illuminating region 52 directly under the photodetector 112 is attenuated or the illuminating region 52 is damaged. When the light cannot be illuminated, the intensity of the light intensity actually measured by the light detector 112 is greater, because the light intensity of the light-emitting area 52 directly under the light detector 112 is relatively heavy to the light detector 112. . On the contrary, when the brightness of the light-emitting area 52 obliquely below the light detector 112 is attenuated or the light-emitting area 52 is damaged and cannot be illuminated, the intensity of the light intensity actually measured by the photodetector 112 is small, which is Because the light-emitting area 52 obliquely below the light detector 112 contributes light intensity to the photodetector 112 is lighter. In other words, a smaller number directly below the photodetector 112 The illuminating area 52 is damaged or the light intensity attenuation of the illuminating area 52 is less effective in attenuating the light intensity measured by the photodetector 112 than the slanting lower portion of the photodetector 112. The illuminating region 52 is damaged or the illuminating region 52 is more effective in attenuating the light intensity. As a result, the degree of attenuation of the light intensity measured by the photodetector 112 alone cannot determine how much of the illuminating region 52 in the illuminating device 50 is damaged, or how many units of radiant flux (or luminous flux) are attenuated. .

However, in this embodiment, the signal integration unit 120 integrates the light intensity signals G from the photodetectors 112 of the photodetection module 110 to obtain an overall light intensity evaluation value, thereby affecting the overall light intensity evaluation. The value is the total photosensitive intensity distribution function obtained by adding the photosensitive intensity distribution functions represented by the curves C1, C2, C3, and C4 (the curves are as shown by the curve CT). As can be seen from FIG. 1B, the uniformity of the total photosensitive intensity distribution function (ie, the curve CT) is much larger than the uniformity of the photosensitive intensity distribution functions of the respective curves C1, C2, C3, and C4. As a result, the positions of the different light-emitting regions 52 on the light-emitting device 50 will be more consistent with the weights of the overall light intensity evaluation values measured by all of the light detectors 112. Therefore, it is easier to judge or estimate the number of light-emitting regions 52 of the light-emitting device 50 as a whole by the attenuation degree of the overall light intensity evaluation value, or it is easier to judge or estimate the light-emitting regions 52 of the light-emitting device 50 as a whole. It is the attenuation of the number of units of radiant flux (or luminous flux). In this embodiment, each light intensity signal G is an electrical signal, and the signal integration unit 120 is an arithmetic unit. The arithmetic unit performs arithmetic processing on these light intensity signals G to obtain an overall light intensity evaluation value. Specifically, in the present embodiment, the arithmetic unit adds up the light intensity signals G to obtain an overall light intensity evaluation value. In other words, in the present embodiment, the physical meaning of the overall light intensity evaluation value is the sum of the light intensities measured at all of the detected positions.

In the present embodiment, these detection positions P are located on the same side of the light-emitting device 50. For example, as can be seen from FIG. 1A, these detection positions P are also located above the illumination device 50. The signal integration unit 120 adds the effects of the light intensity signals measured by the light detectors 112 of the light detecting module 110 to the integration effect of the integrating sphere. Therefore, the optical measuring system 100 of the embodiment implements Similar to the effect of one-sided integration, the volume of the optical metrology system 100 of the present embodiment can be smaller than the volume of an integrating sphere that is conventionally used to measure a tube or a light strip. Therefore, the use of the optical measurement system of the present embodiment will contribute to the planning of the production line. Furthermore, since the volume of the conventional integrating sphere is large, the reflectance of the inner surface of the integrating sphere is high, and in order to maintain the high reflectance of the inner surface of the integrating sphere, the manufacturing cost and maintenance cost of the integrating sphere are high. In contrast, since the optical measuring system 100 of the present embodiment has a small volume, the optical measuring system 100 can not use a reflecting surface having a large area and a high reflectance, and can maintain the high reflectance of the reflecting surface. Therefore, the manufacturing cost and maintenance cost of the optical measuring system 100 of the present embodiment can be reduced.

In addition, in the present embodiment, a spectrometer is used as the photodetector 112, and the spectrometer can measure the light intensity of light of different frequencies. Therefore, when the illuminating region 52 has a plurality of different colors, the signal integrating unit 120 can respectively integrate the light intensities corresponding to the plurality of different frequency ranges measured by the spectrometer. Specifically, when the light-emitting region 52 can emit red light, green light, and blue light, the signal integration unit 120 can integrate the light intensity of the red light range measured by all the spectrometers to obtain an overall light intensity corresponding to the red light. Evaluating the values and integrating the light intensities of the green light range measured by all the spectrometers to obtain an overall light intensity evaluation value corresponding to the green light, and integrating the light intensity of the blue light range measured by all the spectrometers to obtain An overall light intensity evaluation value corresponding to blue light. In this way, the optical measurement system 100 can determine which color of the light-emitting area The light intensity of 52 is attenuated and attenuated by a number of units, or it is judged which color of the light-emitting area 52 is damaged or damaged.

Furthermore, when the illuminating device 50 measured by the optical measuring system 100 of the present embodiment is a light-emitting diode lamp, since the illuminating diode has high directivity, it is usually one-sided illuminating, so optical measurement The one-sided integration effect of system 100 is suitable for measuring light-emitting diode lamps. In addition, since each of the light-emitting regions 52 of the light-emitting diode lamp is provided by, for example, one light-emitting diode, and the optical parameters of the light-emitting regions 52 are generally not significantly different, the optical measuring system 100 of the present embodiment is used. When measuring, it is easy to determine how many LEDs are damaged.

In this embodiment, the optical measurement system 100 can be erected by using a load-bearing structure 200. The load-bearing structure 200 includes a support frame 220 and at least one mounting member 230 (the plurality of mounting members 230 are exemplified in FIG. 1A). The mounting member 230 mounts the photodetector 112 movably or immovably on the support frame 220 to provide the detection positions P for the photodetector 112 to detect at the detection positions P. In this embodiment, the mounting member 230 is, for example, a fixing member that non-movably fixes the photodetectors 112 to the support frame 220 and is fixed to the detecting positions P. Mounting member 230 is, for example, a clamp, a locking member, or other suitable fastener. In addition, the mounting members 230 may be integrally formed with the support frame 220 or formed separately. In this embodiment, the load bearing structure 200 further includes a carrier 210 that carries the light emitting device 50. In this embodiment, the carrier 210 is, for example, a carrier or a carrier, and the support frame 220 can be fixed to the carrier 210, but this is only an alternative embodiment. In other embodiments, the carrier 210 is, for example, a conveyor belt or other transport device that can deliver different illumination devices 50 to the light detection module 110 for measurement at different times. In this way, the optical measurement system 100 of the present embodiment can be placed on the production line to achieve a large amount of measurement. In addition, The support frame 220 can also be disposed separately from the carrier 210.

In addition, referring to FIG. 1A, FIG. 1B and FIG. 1C, in the embodiment, when the light detecting module 110 detects one of the plurality of detecting positions P1 located at the edge among the detecting positions P, In the normally operating illuminating device 50, the illuminating intensity of the different illuminating regions 52 on the normally operating illuminating device 50 to the photodetecting module 110 has an edge illuminance intensity distribution function relative to the positions of the different illuminating regions 52 ( That is, the curve C1 and the curve C4 are shown in FIG. 1B, and the curve C1 is taken as an example in FIG. 1C. The detection positions P1 cause the light-emitting regions 52 to fall within a plurality of boundary positions S1 corresponding to one-half of the maximum values of the edge photosensitive intensity distribution functions (ie, the curves C1 and C2) of the detection positions P1. For example, the maximum value of the edge photosensitive intensity distribution function represented by the curve C1 is the light intensity of the peak K of the curve C1, and one half of the maximum value is, for example, the light intensity of the point N1 on the curve C1. Wherein, each boundary position S1 is a plurality of positions corresponding to one-half of the maximum value of the edge photosensitive intensity distribution function (such as the light intensity of points N1 and N2 on the curve C1) (including the positions indicated by S1 and S2 in FIG. 1C). The farthest from the center of these illuminating regions 52 (i.e., the position indicated by S1 in Fig. 1C). In other words, the distance between the boundary position S1 and the position S2 is the full width at half maximum (FWHM) of the curve C1. When the light-emitting regions 52 are arranged in a two-dimensional array, the position corresponding to one of the maximum values of one of the edge photosensitive intensity distribution functions is not only the two positions indicated by S1 and S2 in FIG. 1C, but the maximum values. Half of the corresponding positions will have innumerable numbers in a two-dimensional space and form a curve. It can still be found on this curve that at least one point (i.e., at least one position) is farthest from the center of the entire illumination area 52, and this point (i.e., this position) is the boundary position S1 and is arranged in a two-dimensional array. These illuminating regions are located at the boundary of all edge illuminance intensity distribution functions. Within location S1.

In this embodiment, when the light-emitting regions 52 of the light-emitting device 50 are located within the two boundary positions S1 of the curve C1 and the curve C4, or at another angle, when the positions of the detection positions P are configured to make the boundary position When S1 is located outside of all of these illuminating regions 52, the uniformity of the total photographic intensity distribution function (i.e., curve CT) is ideal, and the effect of more unilateral integration can be achieved. In addition, when the diffusing lamp cover is disposed above the light-emitting area 52, that is, when the diffusing lamp cover is disposed between the light-emitting area 52 and the detecting position P, the optical measuring system 100 of the embodiment can also measure the whole of the light-emitting device 50. Light intensity evaluation value. This is because the diffusion lampshade diffuses the light emitted by the illuminating region 52 more uniformly, and still achieves a uniform total photographic intensity distribution function, and even improves the uniformity of the total photographic intensity distribution function.

In this embodiment, the detection positions P can be made to have a uniformity in which the total photosensitive intensity distribution function (ie, the curve CT) is greater than any of the photosensitive intensity distribution functions (ie, the curves C1, C2, C3, and C4). Where uniformity is defined as the ratio obtained by dividing the minimum value in a total photosensitive intensity distribution function (or a photosensitive intensity distribution function) by the maximum value. In the present embodiment, in order to achieve a good effect of approximating the one-sided integration, these detection positions P can be made to fall at a position where the uniformity of the total photosensitive intensity distribution function (i.e., the curve CT) is 80% or more. Or, from another point of view, in the present embodiment, the sum of the light intensities contributed to all of the detected positions P by each of the light-emitting regions 52 is a total value, and the total combined values of the light-emitting regions 52 are mutually Essentially the same. For example, one of the light-emitting regions 52 can be illuminated, but the other light-emitting regions 52 are not illuminated. At this time, the light intensity measured by all the detected positions P is added, that is, the lighted light is emitted. The total value of zone 52. Then, the other light-emitting area 52 can be illuminated, and the other light-emitting areas 52 are not lit, so that the other lighted light can be obtained. The total value of the light zone. When all of the light-emitting regions 52 are individually illuminated and detected, it is found in the present embodiment that these summed values of the light-emitting regions 52 are substantially identical to each other.

In the present embodiment, the detection positions P provided by the mounting member 230 fall at positions where the total values of the light-emitting regions 52 are substantially identical to each other. When the total values of the light-emitting regions 52 are substantially the same as each other, the light intensity contributed by each of the light-emitting regions 52 to the entire light detecting module 110 does not substantially change depending on the position of the light-emitting region 52. . As a result, when the overall light intensity evaluation value is decreased, it is advantageous to estimate how many light-emitting regions 52 are damaged by the light-emitting device 50 as a whole, or to estimate how many units of radiant flux the light-emitting device 50 has ( Or the attenuation of the luminous flux). The fact that these aggregate values are substantially identical to each other herein does not mean that the total values are to be completely equal, but rather that the tolerance of the maximum difference of these total values is still able to assess how much the illuminating device 50 as a whole is. The illuminating region 52 is damaged or has a range of attenuation of the radiant flux (or luminous flux). For example, the largest difference in these aggregate values is within 20% of the maximum of these aggregate values.

In the present embodiment, the optical characteristics of these light-emitting regions 52 are substantially identical to each other. For example, the light-emitting areas of the light-emitting regions 52 are substantially identical to each other, and the light-emitting intensity, the light flux, and the light-shaped distribution of the light-emitting regions 52 are substantially identical to each other. In addition, in this embodiment, the distance from each of the light-emitting regions 52 to the different detection positions P is at least partially different.

In the present embodiment, the optical measurement system 100 includes a power supply 140 electrically connected to the illumination device 50 to drive the illumination region 52 of the illumination device 50 to emit light. The optical measurement system 100 of the present embodiment can also be used to measure the degree of thermal attenuation of the illumination device 50. For example, the power supply 140 can be placed immediately after the lighting device 50 is turned on. The overall light intensity evaluation value of the light-emitting device 50 is measured. Then, after the illumination device 50 is illuminated for a period of time (for example, after 72 hours of illumination), its overall light intensity evaluation value is measured. After the two overall light intensity evaluation values are subtracted, the degree of thermal attenuation of the light-emitting device 50 can be known. In order to make the measurement of the degree of thermal attenuation more accurate, in the two measurements, except for the time when the illuminating device 50 has been illuminated, other conditions should be as uniform as possible, for example, the position of the illuminating device 50 should be consistent. Since the thermal attenuation of the light emitted by the light-emitting diode is relatively obvious, when the light-emitting device 50 includes the light-emitting diode, the optical measurement system 100 can measure the thermal attenuation of the light-emitting diode.

In addition, when the normal illumination device 50 is originally designed to be symmetrical with respect to the illumination regions 52, and the light shape is also symmetrical, the detection positions P may also be symmetrically arranged. In this way, the normal illumination device 50 also substantially equalizes the intensity of the light measured by any two mutually symmetric detection positions P. Therefore, when the light intensity measured by the two symmetric detection positions P is different, it can be determined that some of the light-emitting areas 52 in the light-emitting device 50 cannot operate normally. Alternatively, when the light intensity detected by one or some of the detection positions P drops abnormally, it can be inferred that the detection position P or the light-emitting area 52 near the detection positions P cannot operate normally.

The above embodiment achieves the effect of making the uniformity of the total photosensitive intensity distribution function ideal by using the method in which the light-emitting region 52 is located at the boundary position S1, but this is only an alternative embodiment. The implementation tree or other embodiments described below may also homogenize the total photosensitivity distribution function or cause the above-mentioned aggregate values to be substantially identical to each other. In other embodiments, any other design method that can make the uniformity of the total photosensitive intensity distribution function equal to or greater than 80% or any design that can make the above-mentioned total values substantially identical to each other can be used. The scope of protection of the present invention.

2A is an optical measuring system and a load bearing structure according to another embodiment of the present invention; FIG. 2B is a schematic diagram showing the photosensitive intensity distribution function of each photodetector and the total photointensity distribution function of all photodetectors when the optical measuring system of FIG. 2A measures a normally operating illumination device. Referring to FIGS. 2A and 2B, the optical measurement system 100a of the present embodiment is similar to the optical measurement system 100 of FIG. 1A, and the differences between the two are as follows. The optical measuring system 100a of the present embodiment further includes at least one reflector 130 (for example, two reflectors 130 in FIG. 2A), which are disposed around the entire periphery of the light-emitting regions 52, and are configured, for example, for these detections. The perimeter of the location P as a whole. In this embodiment, all of the detection positions P are located between the two reflectors 130. In addition, all of these illuminating regions 52 are located between the two reflectors 130. In this embodiment, the two reflectors 130 are, for example, specular reflectors, that is, mirrors, so that the two reflectors 130 can form a virtual image of an infinite number of light-emitting regions 52 in the direction in which the light-emitting regions 52 are arranged. The detection module 100a detects an equivalent infinitely extending illumination device 50, and the illumination region 52 on the illumination device 50 has an infinite number of rows arranged in the direction in which the illumination device 50 extends. As a result, the uniformity of the total light intensity distribution function of the light detecting module 100a can be improved. This is because, for an infinitely extending illumination device 50, regardless of which of the plurality of detection positions P arranged in parallel with the direction in which the illumination device 50 extends, all of the entire illumination device 50 The illuminating region 52 has almost no difference in the light intensity contribution of the photodetector 112. That is, the light intensity of the photodetector 112 at the central detection position P and the detection position P at the edge is almost the same. In other words, in the present embodiment, these total values of these light-emitting regions 52 are almost the same as each other. As can be seen from FIG. 2B, the uniformity of the total light intensity distribution function (ie, the curve CTa) obtained by summing these light intensity distribution functions (ie, the curves C1a, C2a, C3a, and C4a) corresponding to the detected positions P, respectively. 97%, which is the length of the illuminating device 50 L is 120 cm, the vertical distance H of the photodetector 112 to the light-emitting device 50 is 30 cm, and the result of the simulation when the pitch T of the photodetector 112 is 30 cm. It can be seen from this that the configuration of the reflector 130 can substantially increase the uniformity of the total photosensitive intensity distribution function.

In other embodiments, the reflector 130 can also be a diffused reflector, that is, the light emitted by the light-emitting region 52 is diffused by the diffused reflector after being incident on the diffused reflector. The diffused reflector still achieves the effect of increasing the uniformity of the total photointensity distribution function.

In the present embodiment, the load-bearing structure 200a is similar to the load-bearing structure 200 of FIG. 1A, and the difference between the two is that the support frame 220a of the load-bearing structure 200a of the present embodiment further fixes the reflector 130.

3A is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention, and FIG. 3B illustrates each light detection when the optical measurement system of FIG. 3A measures a normally operating illumination device. The light intensity distribution function of the device and the total light intensity distribution function of all photodetectors. Referring to FIGS. 3A and 3B, the optical measurement system 100b of the present embodiment is similar to the optical measurement system 100a of FIG. 2A, and the differences between the two are as follows. The optical metrology system 100b of the present embodiment includes at least one reflector 130 (such as the middle reflector 130 in FIG. 3A) interposed between the detection locations P. Specifically, in the plurality of reflectors 130 included in the optical measurement system 100b of the present embodiment, the partial reflectors 130 are disposed at the periphery of the entire of the light-emitting regions 52 (FIG. 3A is configured with two reflectors 130). The opposite sides of the entire light-emitting area 52 are exemplified, and another partial reflector 130 is interposed between the detection positions P (in FIG. 3A, one reflector 130 is disposed at two centrally located detection positions). For example, between P, and the reflector 130 is also located in all the detection positions P. Central). However, in other embodiments, the optical metrology system may also include a reflector 130 interposed between the detection locations P, but does not include a reflector 130 disposed at the periphery of the entirety of the illumination zones 52. The reflector 130 in the middle divides all of the light-emitting areas 52 into left and right portions, and the light emitted from the light-emitting area 52 of the left portion is reflected by the leftmost reflector 130 and the intermediate reflector 130. Therefore, for the two photodetectors 112 on the left side, the two photodetectors 112 are equivalent to detecting an infinitely extending illumination device. Similarly, the light emitted by the illuminated portion 52 of the right portion is reflected by the rightmost reflector 130 and the intermediate reflector 130. Therefore, for the two photodetectors 112 on the right side, the two photodetectors 112 are also equivalent to detecting an infinitely extending illumination device. In the optical metrology system 100a of FIG. 2A, each of the photodetectors 112 detects all of the illumination zones 52. However, in the optical measuring system 100b of the present embodiment, each of the photodetectors 112 detects a portion of the illuminating region 52 (in FIG. 3A, for example, a half of the illuminating region 52 is detected).

Since the two photodetectors 112 on the left side and the two photodetectors 112 on the right side are equivalent to detecting the infinitely extending illumination device, the light intensity distribution function of all the photodetectors 112 (ie, the curve C1b, the curve C2b, The uniformity of the total photosensitive intensity distribution function (ie, curve CTb) added by the curve C3b and the curve C4b) can also be as high as 97%. In this embodiment, since the reflector 130 located in the middle divides all the photodetectors 112 and the light-emitting region 52 into two halves, the left half of the total photo-intensity distribution function (ie, the curve CTb) is defined by the curve C1b. Contributed to curve C2b, and the right half is contributed by curve C3b and curve C4b.

The load bearing structure 200b of the present embodiment is similar to the load bearing structure 200a of FIG. 2A, and the differences between the two are as follows. In addition to the fixed photodetector 112 and the reflector 130 at the edge of the detection position P, the support frame 220b of the carrying structure 200b of this embodiment In addition, a reflector 130 (such as the reflector 130 in the middle of Fig. 3A) interposed between these detection positions P is also fixed.

The use of the reflector 130 to divide the illumination regions 52 and the detection locations P into a plurality of portions also helps to determine which portion of the illumination region 52 is not functioning properly. Since the detected position P of a certain portion only detects the light emitted by the corresponding portion of the light-emitting region 52, it is determined by which part of the detected position P the measured light intensity is decreased. It can be inferred which part of the illuminating area 52 is not functioning properly.

4A is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention, and FIG. 4B illustrates each light detection when the optical measurement system of FIG. 4A measures a normally operating illumination device. The light intensity distribution function of the device and the total light intensity distribution function of all photodetectors. 4A and 4B, the optical measuring system 100c of the present embodiment is similar to the optical measuring system 100b of FIG. 3A, and the difference between the two is as follows. In the optical measuring system 100c of the embodiment, a reflector 130 is disposed between any two adjacent photodetectors 112. In other words, a photodetector 112 is disposed between any two adjacent reflectors 130. Accordingly, these reflectors 130 divide all of the light-emitting regions 52 into a plurality of portions, and each of the photodetectors 112 each measures a portion of the corresponding light-emitting region 52. Due to the action of the reflector 130, for each photodetector 112, it is equivalent to measuring an infinitely extending illumination device, so that each portion of the illumination region 52 is separated by its corresponding photodetector. The intensity of the light contributed by 112 will be similar. Thus, the total photosensitive intensity distribution function CTc is added to the total intensity distribution function (ie, curves C1c, C2c, C3c, and C4c) of each photodetector 112. The uniformity can also be as high as 97%.

The load bearing structure 200c of the present embodiment is similar to the load bearing structure 200b of FIG. 3A, and the differences between the two are as follows. In the carrying structure 200c of the embodiment, the support frame 220c The reflector 130 at the edge of the detection position P is fixed, and the reflector 130 between each two adjacent detection positions P is also fixed.

In the embodiment of FIG. 1A, FIG. 2A, FIG. 3A and FIG. 4A, the detection positions P are arranged, for example, on a line parallel to the arrangement direction of the light-emitting areas 52, and any two adjacent detection positions P The pitches T between the two are, for example, substantially equal to each other.

5A is a side elevational view of an optical measurement system and a load-bearing structure according to another embodiment of the present invention, and FIG. 5B illustrates each light detection when the optical measurement system of FIG. 5A measures a normally operating illumination device. The light intensity distribution function of the device and the total light intensity distribution function of all photodetectors. 5A and 5B, the optical measurement system 100d of the present embodiment is similar to the optical measurement system 100 of FIG. 1A, and the differences between the two are as follows. In the optical measurement system 100d of the present embodiment, at least some of the detected positions Pd exhibit an unequal pitch distribution. When the detection positions Pd are distributed in unequal pitches, the detection positions Pd can be adjusted to positions where the uniformity of the total photosensitive intensity distribution function can be improved.

For example, in the pitch T′ between any two adjacent detection positions Pd of the detection positions Pd, the center pitch T1 of the whole of the light-emitting areas 52 near the light-emitting device 50 is greater than the distance from the light-emitting device. The central pitch T2 of the entirety of these illuminating regions 52 of 50. Such a pitch setting is such that, when the length L of the light-emitting device 50 is limited, the value of the total photosensitive intensity distribution function in the vicinity of the central position has a tendency to be larger than the value located near the edge position. Therefore, when the pitch T1 located at the center is pulled apart, the peak of the photosensitive intensity distribution function of the two central photodetectors 112 can be pulled apart, so that the total photosensitive intensity distribution function decreases in the value of the attachment at the central position. The value near the edge position rises. When the pitch T1 is 36 cm and the pitch T2 is 30 cm, the light intensity distribution function of the photodetectors 112 (ie, the curve C1d, The total photosensitive intensity distribution function (ie curve CTd) added by C2d, C3d and C4d) can be increased to 62%.

The support structure 200d of the present embodiment is similar to the load-bearing structure 200 of FIG. 1A, and the difference between the two is that the support frame 220d of the load-bearing structure 200d of the embodiment fixes the photodetectors 112 at the detection positions of the unequal pitches. Pd.

6A is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention, and FIG. 6B illustrates each light detection when the optical measurement system of FIG. 6A measures a normally operating illumination device. The light intensity distribution function of the device and the total light intensity distribution function of all photodetectors. Referring to FIGS. 6A and 6B, the optical measurement system 100e of the present embodiment is similar to the optical measurement system 100 of FIG. 1A, and the differences between the two are as follows. In the embodiment of FIG. 1A, the vertical distances H of all the detected positions P to the reference line R (or the reference plane) are substantially equal. However, in other embodiments, the vertical distances of at least some of the detection positions P to the reference line R (or the reference plane) may also be unequal. In the optical measurement system 100e of the present embodiment, among the detection positions P, the vertical distance H2e from the detection position P2e to the reference line R (or the reference surface) near the center of the entire illumination area 52 is larger than the distance The vertical distance H1e of the detection position P1e from the center of the entire illumination area 52 to the reference line R (or reference plane). Such vertical distances H1e and H2e are set such that, when the length L of the light-emitting device 50 is limited, the value of the total photosensitive intensity distribution function in the vicinity of the central position has a tendency to be larger than the value located near the edge position. Therefore, when the vertical distance H1e located on both sides is shortened, the photosensitive intensity distribution curve of the photodetector 112 located at the edge can be raised, and the total photosensitive intensity distribution function can be increased in the vicinity of the edge position. When the detection positions P1e and P2e are perpendicular to the arrangement direction of the light-emitting regions 52, the pitch T is 30 cm, and the vertical distance H1e is 25 cm, and the vertical distance is When the H2e is 30 cm, the uniformity of the total photosensitive intensity distribution function (ie, the curve CTe) corresponding to the photosensitive intensity distribution functions (ie, the curves C1e, C2e, C3e, and C4e) of the detected positions P1e and P2e is added. Can be increased to 57%.

The load-bearing structure 200e of the present embodiment is similar to the load-bearing structure 200 of FIG. 1A, and the difference between the two is that the support frame 220e of the load-bearing structure 200e of the present embodiment fixes the photodetectors 112 at a pitch H1e from the light-emitting device 50. H2e is not in the same position.

7A is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention, and FIG. 7B illustrates each light detection when the optical measurement system of FIG. 7A measures a normally operating illumination device. The light intensity distribution function of the device and the total light intensity distribution function of all photodetectors. Referring to FIGS. 7A and 7B, the optical measurement system 100f of the present embodiment is similar to the optical measurement system 100 of FIG. 1A, and the differences between the two are as follows. In the optical measurement system 100 of FIG. 1A, the detection directions of all of the detection positions P are the same (both as shown in FIG. 1A). However, in other embodiments, the detection directions of at least some of the detection positions P may be non-parallel to each other. In the optical measurement system 100f of the present embodiment, among the detection positions P1f and P2f, the detection direction of the detection position P1f farther from the center of the entire illumination area 52 is closer to the whole of the illumination areas 52. The direction of the center is inclined. As shown in FIG. 7A, the detection direction D1 of the detection position P1f on the left and right sides is inclined by an angle θ with respect to the vertical direction perpendicular to the light-emitting device 50. In addition, the detection direction D1 is the optical axis direction of the photodetector 112. In addition, in the embodiment, the detecting direction D1 of the detecting position P2f is substantially perpendicular to the light emitting device 50.

In this embodiment, when the detection direction D1 of the detection position P1f is inclined toward the center of the light-emitting device 50, the photosensitive intensity distribution corresponding to the detection position P1f is detected. The peaks of the function (ie, curve C1f and curve C4f) move down and move toward a position near zero. In this way, the uniformity of the total photosensitive intensity distribution function (ie, the curve CTf) added by the photosensitive intensity distribution functions of the detection positions P1f and P2f (ie, the curves C1f, C2f, C3f, and C4f) can be improved. When the θ angle is 20 degrees, the pitch T is 30 cm, and the vertical distance H is 30 cm, the total photosensitive intensity distribution function CTf can be increased to 63%.

The load-bearing structure 200f of the present embodiment is similar to the load-bearing structure 200 of FIG. 1A, and the difference between the two is that the support frame 220f of the load-bearing structure 200f of the present embodiment fixes the photodetectors 112 at the detection positions P1f and P2f.

In other embodiments, the detection direction D1 of the detection position P1f may also be designed to be inclined toward a direction away from the center of the light-emitting device 50, as the distribution of the detection position P1f in the horizontal direction is different.

The embodiment of FIG. 5A, FIG. 6A and FIG. 7A exemplifies a design manner of several detection positions. In other embodiments, the design manners of FIG. 5A and FIG. 6A can also be used simultaneously, and FIG. 6A and The design of FIG. 7A adopts the design of FIG. 5A and FIG. 7A simultaneously or the design of FIG. 5A, FIG. 6A and FIG. 7A. An embodiment in which the design of FIGS. 6A and 7A is simultaneously employed will be described below.

FIG. 8 is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention. Referring to FIG. 8, the design concept of the detection position of this embodiment combines the design concepts of FIG. 6A and FIG. 7A. In the optical measuring system 100g of the present embodiment, the detecting direction D1 of the detecting position P1g far from the center of the light emitting device 50 is inclined toward the center of the light emitting device 50. In addition, the vertical distance H1g from the detection position P1g of the central portion of the illumination device 50 to the detection device P2g near the center of the illumination device 50 is less than the vertical distance H2g of the illumination device 50. Combined two After the design concept, the uniformity of the total photosensitive intensity distribution function can be further improved by appropriate parameter design.

In addition, the support frame 220g of the carrying structure 200g of the embodiment fixes the photodetectors 112 at the detecting positions P1g and P2g.

9 is a side elevational view of an optical measurement system and a load bearing structure in accordance with another embodiment of the present invention. Referring to FIG. 9, the optical measuring system 100h of the present embodiment is similar to the optical measuring system 100a of FIG. 2A, and the difference between the two is as follows. In the optical measurement system 100h of the embodiment, the light detecting module 110h includes at least one light detector 112 (in FIG. 9 , an optical detector 112 is taken as an example), and the photodetector 112 is in multiple The time is moved to the detected positions P1h, P2h, P3h, and P4h to measure the light intensities of at least some of the light-emitting regions 52, respectively. In the present embodiment, the detection positions P1h, P2h, P3h, and P4h are, for example, the same as the detection positions P in FIG. 2A. In this embodiment, the photodetector 112 sequentially moves from the detection position P1h to the detection positions P2h, P3h, and P4h, and measures the light intensity at each of the detection positions P1h, P2h, P3h, and P4h. The light intensity signal G is generated, and the signal integration unit 120 integrates the light intensity signals G obtained at different detection positions P1h, P2h, P3h, and P4h to obtain an overall light intensity evaluation value. In this embodiment and the embodiment of FIG. 2A, the light intensity is measured at the same detection position P, but the photodetector 112 of the embodiment is scanned from the detection position P1h to the detection position P4h. To obtain the light intensities of the detected positions P1h, P2h, P3h, and P4h, the photosensitive intensity distribution functions of the detected positions P1h, P2h, P3h, and P4h in this embodiment and the total total photosensitive intensity distribution function It will be consistent with the one shown in Figure 2B.

In other embodiments, multiple photodetectors 112 may also be used to scan to shorten the scanning time. For example, two photodetectors 112 can be used simultaneously, and The two photodetectors 112 are disposed at the detection positions P1h and P3h. Then, the two photodetectors 112 are scanned from the detection positions P1h and P3h to the detection positions P2h and P4h, respectively, to measure the light intensity at the detection positions P1h, P2h, P3h and P4h. As a result, compared to the embodiment of FIG. 9, half of the scan time can be shortened. In other words, when scanning with N photodetectors, the scanning time can be shortened to 1/N when measured by a photodetector, where N is a positive integer greater than or equal to 2.

The load bearing structure 200h of the present embodiment is similar to the load bearing structure 200 of FIG. 1A, and the differences between the two are as follows. In the load-bearing structure 200h of the present embodiment, the mounting member 230h movably mounts the photodetector 112 on the support frame 220h. The mounting member 230h moves on a moving path A to move the photodetector 112 to the detecting positions P1h, P2h, P3h, and P4h at a plurality of times, and the light intensities of at least a portion of the light-emitting regions 52 are respectively measured. In the present embodiment, the support frame 220h includes a slide rail 224h, and the mounting member 230h slides on the slide rail 224h to move along the movement path A. For example, the load bearing structure 200h can have an actuator 240 that drives the mounting member 230h to move over the slide rail 224h. The actuator 240 moves the mounting member 230h on the moving path A to move the photodetector 112 to the detecting positions P1h, P2h, P3h, and P4h at a plurality of times, wherein the actuator 240 is, for example, a motor or the like. Actuator. Further, in the present embodiment, the support frame 220h also fixes the reflector 130.

In addition, the embodiment of FIG. 1A, FIG. 3A, FIG. 4A, FIG. 5A, FIG. 6A, FIG. 7A and FIG. 8 can also use the concept of the photodetector scanning of the embodiment, that is, scanning by the photodetector 112. Up to the detection position in these embodiments.

FIG. 10 is a side elevational view of an optical measurement system and a load bearing structure according to still another embodiment of the present invention. Referring to FIG. 10, the optical measurement system 100i of the present embodiment is similar to the optical measurement system 100 of FIG. 1A, and the differences between the two are as follows. In this embodiment In the optical measurement system 100i, each light intensity signal Gi is an optical signal, and the signal integration unit 120i is an optical signal integration unit to integrate the optical signals (ie, the light intensity signal Gi). In this embodiment, the signal integration unit 120i is an integrating sphere, and the optical detection module 110i includes a plurality of optical fibers 112i. Each of the optical fibers 112i has a first end E1 and a second end E2, and the optical fibers 112i The first ends E1 are respectively located at the detection positions P, and the second ends E2 of the optical fibers 112i are connected to the signal integration unit 120i (ie, the integrating sphere). The optical signals (ie, the light intensity signals Gi) are respectively transmitted to the signal integration unit 120i (ie, the integrating sphere) via the optical fibers 112i, and the signal integration unit 120i (ie, the integrating sphere) integrates the optical signals to obtain an overall light intensity evaluation value. . In other words, in this embodiment, the optical signal (ie, the light intensity signal Gi) is integrated optically, and the embodiment of FIG. 1A uses an electronic operation to integrate the electrical signal (ie, the light intensity signal G).

Specifically, in this embodiment, the signal integration unit 120i (ie, the integrating sphere) includes a reflective sphere 122i, an optical fiber 126i, and a photodetector 124i. The reflecting sphere 122i is a hollow sphere having a high reflectivity on the inner wall, and the inner wall can sufficiently reflect and mix the light intensity signal Gi (ie, the optical signal) from the optical fiber 112i, and the optical fiber 126i transmits the fully mixed optical signal. To the photodetector 124i, the photodetector 124i can detect the integrated light intensity signal.

The load-bearing structure 200i of the present embodiment is similar to the load-bearing structure 200 of FIG. 1A, and the difference between the two is that the support frame 220i of the load-bearing structure 200i of the present embodiment fixes the first end E1 of the optical fibers 112i at the detection positions. P on. For example, the first end E1 of the fibers 112i can be mounted on the support frame 220i by the mounting member 230i.

In this embodiment, since the reflective sphere 122i can accommodate these optical fibers 112i At the second end E2, a good integration effect can be achieved without having to accommodate the entire illumination device 50. Therefore, the reflective sphere 122i of the optical measurement system 100i of the present embodiment can be small (that is, the integrating sphere can be small), so that the cost can be effectively reduced, and the planning of the production line is facilitated. In addition, since the light-emitting device 50 can be placed in the integrating sphere each time the light-emitting device 50 is measured, the optical measuring system 100i of the present embodiment can improve the smoothness of the production process.

The concept of optical signal integration of FIG. 10 can also be applied to the embodiments of FIGS. 2A, 3A, 4A, 5A, 6A, 7A, and 8, that is, the first end E1 of the optical fiber 112i is disposed in these embodiments. The detection position.

11 is a side elevational view of an optical measuring system, a load bearing structure, and an optical measuring system measuring light emitting device according to still another embodiment of the present invention. Referring to FIG. 11, the optical measurement system 100 of the present embodiment is the same as the optical measurement system 100 of FIG. 1A. In the present embodiment, the optical measurement system 100 can also measure a plurality of illumination devices 50j. These illuminating devices 50j may be the same or different types of illuminating devices 50j and are independent of each other. In other words, the light-emitting regions 52j of the light-emitting device 50j may be the same or different. In addition, the power supply 140 is electrically connected to the light-emitting devices 50j to drive the light-emitting devices 50j to emit light. The optical measurement system 100 of the present embodiment can measure the overall light intensity evaluation values of all of the light-emitting devices 50j, and thus can be used to determine how many units of light loss are present in the entire light-emitting device 50j.

In addition, the light-emitting device 50 of the above embodiment is exemplified by a light-emitting strip, that is, the light-emitting area 52 is arranged on a straight line. When the illuminating device 50 is a light source, that is, when the illuminating regions 52 are arranged in a two-dimensional array or connected in a plane, the detecting positions of the above embodiments may be arranged in a two-dimensional array above the illuminating region 52, that is, The detection position is in addition to FIG. 1A, FIG. 2A, FIG. 3A, FIG. 4A, FIG. 5A, FIG. 6A, FIG. 7A and FIG. In addition to the arrangement, it is also arranged in a direction perpendicular to the plane of the drawing. In addition, the above optical measuring system can also be used to measure an illuminant of any shape (including a regularly shaped illuminant and an irregularly shaped illuminant), and the measured illuminant is not limited to only one-sided illuminating, It can also be multi-sided illumination. For example, the optical metrology system described above can be used to measure a light-emitting diode light bar that can emit 360 degrees in a direction perpendicular to the direction of extension. Although the optical measurement system is measured by means of one-sided integration, for such a light-emitting diode light bar, multiple different angle measurement methods can be used to achieve the multi-directional measurement effect. For example, it can measure once every 120 times with respect to the light-emitting diode light bar, measure three times in total, and then comprehensively compare the results obtained by the three times, and can also determine how many units of light of the light-emitting diode light bar loss. Figure 12 is a flow diagram of an optical metrology method in accordance with one embodiment of the present invention. The optical measurement method of the present embodiment can be performed by using the optical measurement system of the above embodiment or other embodiments. The following is exemplified by the optical measurement system 100 of FIG. 1A. Referring to FIG. 1A and FIG. 12, the optical measurement method of this embodiment includes the following steps. First, step S110 is performed to detect the light intensity of at least some of the light-emitting regions 52 at a plurality of different detection positions P for the light-emitting regions 52 to obtain a plurality of lights respectively corresponding to the detection positions P. Intensity signal G. As described in the embodiment of FIG. 1A, step S110 can be performed by using the light detecting module 110. Next, step S120 is performed to integrate the light intensity signals G to obtain an overall light intensity evaluation value associated with the light-emitting regions 52. As described in the embodiment of FIG. 1A, step S120 can be accomplished using signal integration unit 120.

In addition, when the optical measurement method is applied to the optical measuring device of the embodiment of FIGS. 1A, 2A, 3A, 4A, 5A, 6A, 7A, 8 and 11, it is adopted at least Some of these detection locations (eg at all detection locations) At the same time, the concept of the light intensity of at least part of the light-emitting area 52 is detected, that is, the light detectors 112 are respectively disposed at the detection positions, so that the simultaneous detection effect can be achieved. However, when the optical metrology method is applied to the embodiment of FIG. 9, at least one photodetector 112 is used to move to the detection locations for a plurality of times to measure the light intensity of at least a portion of the illumination regions 52. Further, when the optical metrology method is applied to the embodiment of FIGS. 2A, 3A, and 4A, the reflector 130 is used to reflect the lateral light emitted by the light-emitting region 52.

Other details of the optical measurement method have been described in detail in the above embodiments, so reference may be made to the description of the above embodiments, and will not be repeated here.

In summary, in the optical measuring system and the optical measuring method according to the embodiment of the present invention, the light intensities of the light emitting regions are respectively detected at a plurality of different detecting positions, and the obtained light intensities are integrated. Signal to get an overall light intensity evaluation value. Therefore, the overall light intensity evaluation value is measured in the case where the positions of the light-emitting regions, the detected positions, and other possible light-emitting or detecting light conditions are uniform in the overall light intensity weight distribution. In this way, the overall light intensity evaluation value helps to determine how many units of light loss in the light-emitting device or the light-emitting areas, or to determine how many light-emitting areas in the light-emitting device are not functioning properly. In addition, in the load-bearing structure of the embodiment of the present invention, the photodetector is movably or non-movably mounted on the support frame by using the mounting member, which is advantageous for the optical measurement system to achieve highly accurate measurement.

Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention, and any one of ordinary skill in the art can make some modifications and refinements without departing from the spirit and scope of the invention. The scope of the invention is defined by the scope of the appended claims.

50, 50j‧‧‧Lighting device

52, 52j‧‧‧Lighting area

54‧‧‧Lighting elements

100, 100a, 100b, 100c, 100d, 100e, 100f, 100g, 100h, 100i‧‧‧ optical measurement system

110, 110i‧‧‧Light detection module

112‧‧‧Photodetector

112i‧‧‧ fiber

113‧‧‧Diffuser

120, 120i‧‧‧ signal integration unit

122i‧‧‧Reflecting sphere

124i‧‧‧Photodetector

126i‧‧‧ fiber

130‧‧‧ reflector

200, 200a, 200b, 200c, 200d, 200e, 200f, 200g, 200h, 200i‧‧‧ bearing structure

210‧‧‧carrier

220, 220a, 220b, 220c, 220d, 220e, 220f, 220g, 220h, 220i‧‧‧ support frame

224h‧‧‧rails

230, 230h, 230i‧‧‧ mountings

240‧‧‧Actuator

A‧‧‧Moving path

C1, C1a, C1b, C1c, C1d, C1e, C1f, C2, C2a, C2b, C2c, C2d, C2e, C2f, C3, C3a, C3b, C3c, C3d, C3e, C3f, C4, C4a, C4b, C4c, C4d, C4e, C4f, CT, CTa, CTb, CTc, CTd, CTe, CTf‧‧‧ curves

D1‧‧‧Detection direction

E1‧‧‧ first end

E2‧‧‧ second end

G, Gi‧‧‧ light intensity signal

H, H1e, H1g, H2e, H2g‧‧‧ distance

K‧‧·Crest

L‧‧‧ length

N1, N2‧‧ points

P, P1, P1e, P1f, P1g, P1h, P2e, P2f, P2g, P2h, P3h, P4h, Pd‧‧‧ detection position

R‧‧‧ reference line

S1‧‧‧ boundary position

S110, S120‧‧‧ steps

S2‧‧‧ position

T, T', T1, T2‧‧ ‧ pitch

Θ‧‧‧ corner

1A is a side elevational view of an optical metrology system and a load bearing structure in accordance with an embodiment of the present invention.

FIG. 1B illustrates a photo-sensing intensity distribution function of each photodetector and a total photo-intensity distribution function of all photodetectors when the optical measuring system of FIG. 1A measures a normally operating illuminating device.

FIG. 1C illustrates boundary conditions of a photodetector in the optical metrology system of FIG. 1A.

2A is a side elevational view of an optical measurement system and a load bearing structure in accordance with another embodiment of the present invention.

FIG. 2B illustrates the photo-sensing intensity distribution function of each photodetector and the total photo-intensity distribution function of all photodetectors when the optical measuring system of FIG. 2A measures a normally operating illuminating device.

3A is a side elevational view of an optical measurement system and a load bearing structure in accordance with yet another embodiment of the present invention.

FIG. 3B illustrates the photo-sensing intensity distribution function of each photodetector and the total photo-intensity distribution function of all photodetectors when the optical measuring system of FIG. 3A measures a normally operating illuminating device.

4A is a side elevational view of an optical measurement system and a load bearing structure in accordance with still another embodiment of the present invention.

FIG. 4B is a diagram showing the light intensity distribution function of each photodetector and the total light intensity distribution function of all photodetectors when the optical measuring system of FIG. 4A measures a normally operating light emitting device.

5A is a side elevational view of an optical measurement system and a load bearing structure in accordance with another embodiment of the present invention.

FIG. 5B illustrates the photosensitive intensity distribution function of each photodetector and the total photointensity distribution function of all photodetectors when the optical metrology system of FIG. 5A measures a normally operating illumination device.

6A is a side elevational view of an optical measurement system and a load bearing structure in accordance with yet another embodiment of the present invention.

FIG. 6B is a diagram showing the light intensity distribution function of each photodetector and the total light intensity distribution function of all photodetectors when the optical measuring system of FIG. 6A measures a normally operating light emitting device.

7A is a side elevational view of an optical measurement system and a load bearing structure in accordance with yet another embodiment of the present invention.

FIG. 7B is a diagram showing the light intensity distribution function of each photodetector and the total light intensity distribution function of all photodetectors when the optical measuring system of FIG. 7A measures a normally operating light emitting device.

FIG. 8 is a side elevational view of an optical measurement system and a load-bearing structure according to still another embodiment of the present invention.

9 is a side elevational view of an optical measurement system and a load bearing structure in accordance with another embodiment of the present invention.

FIG. 10 is a side elevational view of an optical measurement system and a load bearing structure according to still another embodiment of the present invention.

11 is a side elevational view of an optical measuring system, a load bearing structure, and an optical measuring system measuring light emitting device according to still another embodiment of the present invention.

Figure 12 is a flow diagram of an optical metrology method in accordance with one embodiment of the present invention.

50‧‧‧Lighting device

52‧‧‧Lighting area

54‧‧‧Lighting elements

100‧‧‧Optical measurement system

110‧‧‧Light detection module

112‧‧‧Photodetector

120‧‧‧Signal Integration Unit

200‧‧‧bearing structure

210‧‧‧carrier

220‧‧‧Support frame

230‧‧‧Installation

G‧‧‧Light intensity signal

H‧‧‧Vertical distance

L‧‧‧ length

P, P1‧‧‧ detection location

R‧‧‧ reference line

T‧‧‧ pitch

Claims (40)

  1. An optical measuring system includes: a light detecting module that detects light intensity of at least a portion of the light emitting regions at a plurality of different detecting positions for a plurality of light emitting regions to obtain respectively corresponding to the plurality of detecting regions a plurality of light intensity signals at the measurement location; and a signal integration unit that integrates the light intensity signals to obtain an overall light intensity evaluation value associated with the light emitting regions, wherein the light detection module is in the When the position detection detects the normal operation of the light-emitting areas, the light-sensing areas of the light-emitting detection modules that are normally operated have a light-sensing intensity distribution function relative to the positions of the different light-emitting areas. The photosensitive intensity distribution functions of the detected positions are summed to become a total photosensitive intensity distribution function, and the detected positions fall such that the uniformity of the total photosensitive intensity distribution function is greater than the photosensitive intensity distribution functions. A uniformity position.
  2. The optical measuring system of claim 1, wherein each of the light-emitting areas contributes a sum of light intensities of all of the detected positions, and the total combined values of the light-emitting areas They are essentially identical to each other.
  3. The optical measuring system of claim 2, wherein the optical characteristics of the light emitting regions are substantially identical to each other.
  4. The optical measuring system of claim 2, wherein the distance from each of the light-emitting areas to the different detected positions is at least partially different.
  5. The optical measurement system of claim 1, wherein each of the light intensity signals is an electrical signal, and the signal integration unit is an operation unit, and the operation unit performs the operation on the light intensity signals to The overall light intensity evaluation value is obtained.
  6. The optical measuring system of claim 5, wherein the computing unit sums the light intensity signals to obtain the overall light intensity evaluation value.
  7. The optical measurement system of claim 1, wherein each of the light intensity signals is an optical signal, and the signal integration unit is an optical signal integration unit to integrate the optical signals.
  8. The optical measuring system of claim 7, wherein the signal integrating unit is an integrating sphere, the light detecting module comprises a plurality of optical fibers, each of the optical fibers having a first end and a second The first ends of the optical fibers are respectively located at the detecting positions, and the second ends of the optical fibers are connected to the integrating sphere, and the optical signals are respectively transmitted to the integrating sphere via the optical fibers. The integrating sphere integrates the optical signals to obtain the overall light intensity evaluation value.
  9. The optical measuring system of claim 1, wherein the light detecting module comprises a plurality of light detecting devices respectively disposed at the detecting positions.
  10. The optical measuring system of claim 9, wherein the photodetectors are arranged in a space.
  11. The optical measuring system of claim 9, wherein the photodetectors are each a spectrometer or a light intensity meter.
  12. The optical measuring system of claim 1, wherein the light detecting module comprises at least one light detector, wherein the light detector moves to the detecting positions for a plurality of times to separately measure At least some of the light intensity of the light-emitting regions is obtained.
  13. The optical measuring system of claim 12, wherein the photodetector is a spectrometer or a light intensity meter.
  14. The optical measuring system of claim 1, wherein each of the light emitting regions is contributed by a light emitting element.
  15. The optical measuring system of claim 14, wherein the light emitting element is a light emitting diode, and the light emitting diodes are disposed on a strip carrier to form a light emitting diode tube. .
  16. The optical measuring system of claim 1, wherein the illuminating regions are continuously joined to form a continuous illuminating line or illuminating surface.
  17. The optical measuring system of claim 1, wherein the light detecting module detects the normal operation of each of the plurality of detecting positions at the edge of the detecting positions In the illuminating zone, the illuminating intensity of the normal illuminating zone contributing to the photodetecting module has an edge illuminance intensity distribution function relative to the positions of the different illuminating zones, and the detecting positions enable the illuminating zones The illuminating regions are all within a plurality of boundary positions corresponding to one-half of the maximum values of the edge photosensitive intensity distribution functions of the detecting positions, wherein each of the boundary positions is a maximum value of the edge photosensitive intensity distribution function. The center of the plurality of positions corresponding to the half is farthest from the center of the illuminating device.
  18. The optical measuring system of claim 1, further comprising at least one reflector disposed at a periphery of the entirety of the light emitting regions.
  19. The optical measuring system of claim 1, further comprising at least one reflector interposed between the detecting positions.
  20. The optical measuring system of claim 1, wherein at least some of the detected positions exhibit an unequal pitch distribution.
  21. The optical measuring system of claim 20, wherein among the pitches between any two adjacent detecting positions of the detecting positions, a central section close to the whole of the light emitting areas The distance is greater than the pitch of the center away from the entirety of the light-emitting areas.
  22. The optical measuring system of claim 1, wherein the light emitting regions are arranged on a reference line or a reference surface, and at least a portion of the detected positions are perpendicular to the reference line or the reference surface. not equal.
  23. The optical measuring system of claim 22, wherein in the detecting positions, a vertical distance from a detecting position of the center of the whole of the light emitting areas to the reference line or the reference surface is greater than The vertical distance from the central detection position of the entire illumination area to the reference line or reference plane.
  24. The optical measuring system of claim 1, wherein the detecting directions of at least some of the detecting positions are not parallel to each other.
  25. The optical measuring system of claim 24, wherein in the detecting positions, the detecting direction of the detecting position of the center farther away from the whole of the light emitting areas is closer to the whole of the light emitting areas. The direction of the center is tilted.
  26. The optical measuring system of claim 1, wherein the detecting positions are located on the same side of the light emitting device.
  27. An optical measurement method includes: detecting, for a plurality of illumination regions, light intensities of at least a portion of the illumination regions at a plurality of different detection locations to obtain a plurality of light intensities respectively corresponding to the detection locations And integrating the light intensity signals to obtain an overall light intensity evaluation value associated with the light emitting regions, wherein when the light emitting regions that are normally operated are detected at the detecting position, the normal operation is performed The illuminating intensity of the illuminating area contributing to the detecting position has a sensible intensity distribution function with respect to the positions of the different illuminating areas, and the sensible intensity distribution functions of the detecting positions are summed to become a total illuminating intensity distribution. Function, and these The detection position falls at a position such that the uniformity of the total photosensitive intensity distribution function is greater than the uniformity of any of the photosensitive intensity distribution functions.
  28. The optical measuring method of claim 27, wherein the method for detecting the light intensity of at least a portion of the light emitting regions at a plurality of different detecting positions is configured by using a plurality of the detecting positions respectively. The upper photodetector detects the light intensity of at least some of the light emitting regions, and the photodetectors are arranged in a space.
  29. The optical measuring method of claim 27, wherein the method for detecting the light intensity of at least a portion of the light emitting regions at a plurality of different detecting positions is configured by using a plurality of the detecting positions respectively. The photodetector detects at least a portion of the light intensity of the light emitting regions, and each of the photodetectors is a spectrometer or a light intensity meter.
  30. A load-bearing structure for erecting an optical measurement system, comprising: a support frame; and at least one mounting member, the at least one photodetector of the optical measurement system being movably or non-movably mounted to the support frame The plurality of light intensity signals are respectively detected by the light detectors at the different detection positions by providing a plurality of different detection positions, wherein a signal integration unit of the optical measurement system integrates the The light intensity signals respectively detect the light intensity of at least some of the light emitting regions at the detecting positions, and the sum of the light intensities that each of the light emitting regions contribute to all of the detecting positions is a total value, and the detection positions provided by the mounting member are at positions where the total values of the light-emitting regions are substantially identical to each other.
  31. The load-bearing structure of claim 30, wherein the photodetector is a plurality of photodetectors, and the photodetectors are arranged in a space.
  32. The load-bearing structure of claim 30, wherein the photodetector is a plurality of photodetectors, and each of the photodetectors is a spectrometer or a light intensity meter.
  33. The load-bearing structure of claim 30, wherein the photodetector is a plurality of photodetectors, the mounts are non-movably fixed to the support frame and fixed to the photodetector These detection locations.
  34. The load bearing structure of claim 30, further comprising an actuator for moving the mounting member on a moving path to move the photodetector to the detecting positions for a plurality of times.
  35. The load bearing structure of claim 34, wherein the support frame includes a slide rail on which the mount member slides to move along the movement path.
  36. An optical measurement system for measuring a light-emitting device, the optical measurement system comprising: a light detection module, wherein the light-emitting device detects at least a portion of the light-emitting device at a plurality of different detection positions The light intensity is obtained to obtain a plurality of light intensity signals respectively corresponding to the detection positions; and a signal integration unit that integrates the light intensity signals to obtain an overall light intensity evaluation value associated with the light emitting device, wherein When the light detecting module detects the normally operating light emitting device at the detecting position, a plurality of different positions on the normally operating light emitting device contribute to the light detecting intensity of the light detecting module relative to the The different positions on the illumination device have a light intensity distribution function, and the light intensity distribution functions of the detection positions are summed to become a total light intensity distribution function, and the detection positions fall on the total The uniformity of the photosensitive intensity distribution function is greater than any of the photosensitive intensity distribution functions The position of the uniformity.
  37. The optical measuring system of claim 36, wherein the light detecting module comprises a plurality of light detecting devices respectively disposed at the detecting positions, and the light detecting devices are spaced apart arrangement.
  38. The optical measuring system of claim 36, wherein the light detecting module comprises a plurality of light detecting devices respectively disposed at the detecting positions, and the light detecting devices are respectively A spectrometer or a light intensity meter.
  39. The optical measuring system of claim 36, further comprising at least one reflector disposed at a periphery of the entirety of the light emitting regions.
  40. The optical measuring system of claim 36, further comprising at least one reflector interposed between the detecting positions.
TW101110220A 2012-03-23 2012-03-23 Optical measurement system, carrying structure for configuring the same, and optical measurement method TWI468651B (en)

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104697749B (en) * 2013-12-04 2018-04-13 林万炯 A kind of illumination test system of bar shape LED lamp
CN107817047A (en) * 2016-09-13 2018-03-20 南京理工大学 A kind of molten bath light intensity test device of more detector Subarea detectings

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001275042A (en) * 2000-03-24 2001-10-05 Olympus Optical Co Ltd Image pickup device
US6770865B2 (en) * 2002-06-20 2004-08-03 Engineered Support Systems, Inc. Systems, methods, and devices for detecting light and determining its source
TW200608053A (en) * 2004-07-12 2006-03-01 August Technology Corp Illuminator for dark field inspection
TW200707777A (en) * 2005-05-30 2007-02-16 Osram Opto Semiconductors Gmbh Detector arrangement and method to determine spectral components in a radiation incident on a detector arrangement
TW200846638A (en) * 2007-05-29 2008-12-01 Chroma Ate Inc A high-speed optical sensing device abling to sense luminous intensity and chromaticity and an optical measuring system with the high-speed optical sensing device
US20090214166A1 (en) * 2005-12-30 2009-08-27 Wei-Ping Huang Positioning optical fibers
CN101566500A (en) * 2008-04-23 2009-10-28 广州市光机电技术研究院 Device and method for testing LED light source intensity space distribution characteristic
TW201109635A (en) * 2009-09-10 2011-03-16 Fittech Co Ltd Optical characteristic measurement method for LED

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IES20000322A2 (en) * 2000-04-28 2001-11-14 Viveen Ltd Apparatus for testing a light source
DE102004037355A1 (en) * 2004-07-30 2006-03-23 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH Goniophotometers
JP2009150791A (en) * 2007-12-21 2009-07-09 Oputo System:Kk Photometric device of emitter
CN201477198U (en) * 2009-08-14 2010-05-19 上海半导体照明工程技术研究中心 Long-time synchronous online photoelectric detection device for large amount of LED lamps
CN201653546U (en) * 2010-01-06 2010-11-24 张弦 Navaid light intensity automation measuring device

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001275042A (en) * 2000-03-24 2001-10-05 Olympus Optical Co Ltd Image pickup device
US6770865B2 (en) * 2002-06-20 2004-08-03 Engineered Support Systems, Inc. Systems, methods, and devices for detecting light and determining its source
TW200608053A (en) * 2004-07-12 2006-03-01 August Technology Corp Illuminator for dark field inspection
TW200707777A (en) * 2005-05-30 2007-02-16 Osram Opto Semiconductors Gmbh Detector arrangement and method to determine spectral components in a radiation incident on a detector arrangement
US20090214166A1 (en) * 2005-12-30 2009-08-27 Wei-Ping Huang Positioning optical fibers
TW200846638A (en) * 2007-05-29 2008-12-01 Chroma Ate Inc A high-speed optical sensing device abling to sense luminous intensity and chromaticity and an optical measuring system with the high-speed optical sensing device
CN101566500A (en) * 2008-04-23 2009-10-28 广州市光机电技术研究院 Device and method for testing LED light source intensity space distribution characteristic
TW201109635A (en) * 2009-09-10 2011-03-16 Fittech Co Ltd Optical characteristic measurement method for LED

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TW201339550A (en) 2013-10-01
CN103323104A (en) 2013-09-25

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