TWI443781B - Chip bonding apparatus - Google Patents

Chip bonding apparatus Download PDF

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Publication number
TWI443781B
TWI443781B TW100105637A TW100105637A TWI443781B TW I443781 B TWI443781 B TW I443781B TW 100105637 A TW100105637 A TW 100105637A TW 100105637 A TW100105637 A TW 100105637A TW I443781 B TWI443781 B TW I443781B
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Taiwan
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embossing
needle
adsorption
magnet
bonding apparatus
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TW100105637A
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Chinese (zh)
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TW201131706A (en
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Hee-Dal Shin
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Protec Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/75Apparatus for connecting with bump connectors or layer connectors

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Die Bonding (AREA)

Description

晶片接合裝置Wafer bonding device

本發明是有關於一種晶片接合裝置,特別是涉及一種在引線框架上壓印粘合劑,將半導體晶片放置于被壓印的位置,從而連續地使半導體晶片接合於引線框架的晶片接合裝置。BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a wafer bonding apparatus, and more particularly to a wafer bonding apparatus for imprinting an adhesive on a lead frame to place a semiconductor wafer at an embossed position to continuously bond the semiconductor wafer to the lead frame.

如圖1所示,以往在引線框架上壓印粘合劑的壓印裝置具有壓印針(1)。壓印針(1)上蘸以粘合劑,使壓印針(1)接觸引線框架的要貼裝晶片的位置,以此方法執行壓印作業。As shown in Fig. 1, an imprint apparatus which has conventionally imprinted an adhesive on a lead frame has an imprint pin (1). The embossing needle (1) is coated with an adhesive so that the embossing needle (1) contacts the position of the lead frame to which the wafer is to be mounted, and the embossing operation is performed in this manner.

可是,這種壓印針是耗材。如果反復執行壓印作業,壓印針(1)則會磨損,壓印準確度下降,壓印作業也無法有效完成。因此,在壓印針(1)壽命用盡後,更換新壓印針(1)繼續進行壓印作業。However, this embossing needle is a consumable. If the imprinting operation is repeated, the embossing needle (1) is worn, the embossing accuracy is lowered, and the embossing operation cannot be performed efficiently. Therefore, after the life of the embossing needle (1) is exhausted, the new embossing needle (1) is replaced to continue the embossing operation.

以往的壓印針(1)以如圖1所示結構結合於晶片接合裝置。壓印針(1)以螺絲方式結合於針固定部(2),再用固定螺母(3)如圖1所示結合於針固定部(2),防止作業過程中壓印針(1)松脫。The conventional embossing needle (1) is bonded to the wafer bonding apparatus in a structure as shown in FIG. The embossing needle (1) is screwed to the needle fixing portion (2), and then the fixing nut (3) is coupled to the needle fixing portion (2) as shown in Fig. 1 to prevent the embossing needle (1) from loosening during operation. Take off.

但是,以這樣的螺絲結合方法安裝壓印針(1)時,更換作業時有許多不便之處。如果更換的壓印針(1)的高度發生變化,在壓印作業過程中可能會損壞引線框架,壓印針也會損壞或縮短使用壽命。However, when the embossing needle (1) is attached by such a screwing method, there are many inconveniences in replacement work. If the height of the replaced embossing pin (1) changes, the lead frame may be damaged during the embossing operation, and the embossing pin may be damaged or shortened.

因此,準確調整壓印針(1)高度後安裝於針固定部(2)是非常重要的。壓印針(1)高度調節方法是相對於針固定部(2)而旋轉壓印針(1)。可是,由於操作者是以試錯法調節壓印針的高度,多次緊固壓印針(1)或鬆開,這種作業方法不僅費時,而且存在難以準確作業的問題。而且,在調節壓印針(1)高度後,如果把上述固定螺母(3)相對於針固定部(2)緊固,壓印針(1)的高度可能會變化,因此,其高度調整作業更加困難。Therefore, it is very important to accurately adjust the height of the platen needle (1) and then attach it to the needle fixing portion (2). The embossing needle (1) height adjustment method is to rotate the embossing needle (1) with respect to the needle fixing portion (2). However, since the operator adjusts the height of the embossing needle by trial and error, the embossing needle (1) is loosened a plurality of times or loosened. This method of operation is not only time consuming, but also has a problem that it is difficult to accurately operate. Further, after adjusting the height of the embossing needle (1), if the fixing nut (3) is fastened with respect to the needle fixing portion (2), the height of the embossing needle (1) may vary, and therefore, the height adjustment operation is performed. more difficult.

本發明正是為了解決上述問題而提出的,目的在於提供一種晶片接合裝置,在結構上可以便利地進行壓印針的安裝與更換,可以容易地設置壓印針高度。SUMMARY OF THE INVENTION The present invention has been made to solve the above problems, and an object thereof is to provide a wafer bonding apparatus which can be conveniently mounted and replaced with a embossing needle, and the embossing needle height can be easily set.

這實現上述目的,針對在依次供應的引線框架上壓印粘合劑,在壓印了的位置貼裝晶片的晶片接合裝置,本發明特徵在於包括:壓印組件,壓印組件具有壓印針、針夾頭和壓印磁鐵,壓印針接觸上述引線框架,壓印上述粘合劑,針夾頭供上述壓印針結合,壓印磁鐵安裝於上述針夾頭與壓印針兩者之一上,通過向相對於另一者接近方法提供磁力來結合上述針夾頭與壓印針;壓印升降部,使上述壓印組件沿上下方法升降;以及壓印移送部,沿水平方向移送上述壓印組件。To achieve the above object, a wafer bonding apparatus for mounting a wafer at an embossed position for embossing an adhesive on a sequentially supplied lead frame, the present invention is characterized by comprising: an embossing assembly having an embossing pin a needle collet and an imprinting magnet, the embossing needle contacting the lead frame, embossing the adhesive, the needle collet is combined with the embossing needle, and the embossing magnet is mounted on the needle collet and the embossing needle One, combining the needle collet and the embossing needle by supplying a magnetic force to the approaching method with respect to the other; embossing the lifting portion to lift the embossing assembly up and down; and embossing the conveying portion to be transferred in the horizontal direction The above embossing assembly.

本發明的晶片接合裝置具有可以快速、容易地進行壓印針安裝與更換的效果。The wafer bonding apparatus of the present invention has an effect that the embossing needle can be mounted and replaced quickly and easily.

而且,本發明具有可以容易地設置壓印針高度的效果。Moreover, the present invention has an effect that the height of the embossing needle can be easily set.

為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合所附圖式,作詳細說明如下。The above and other objects, features and advantages of the present invention will become more <RTIgt;

下面參照附圖,詳細說明本發明的有利實施例。Advantageous embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

圖2是本發明一個實施例的晶片接合裝置的斜視圖。如圖1所示,本實施例的晶片接合裝置包括安裝於基座(100)上的壓印移送部(60)和壓印組件(10)、吸附移送部(70)、吸附組件(80)。Figure 2 is a perspective view of a wafer bonding apparatus in accordance with one embodiment of the present invention. As shown in FIG. 1, the wafer bonding apparatus of the present embodiment includes an imprint transfer portion (60) and an imprint assembly (10) mounted on a susceptor (100), an adsorption transfer portion (70), and an adsorption assembly (80). .

在基座(100)上,安裝著依次供應引線框架(102)並沿水平方向移送的引線框架移送部(103)。On the susceptor (100), a lead frame transfer portion (103) that sequentially supplies the lead frame (102) and transports it in the horizontal direction is mounted.

即,引線框架移送部(103)依次移送引線框架(102),壓印組件(10)及壓印移送部(60)向引線框架(102)的各個封裝處壓印粘合劑(R)。壓印了的引線框架(102)被引線框架移送部(103)傳送到吸附移送部(70)的位置,吸附移送部(70)與吸附組件(80)將晶片吸附移送至引線框架(102)壓印了粘合劑(R)的位置。That is, the lead frame transfer portion (103) sequentially transfers the lead frame (102), and the imprint assembly (10) and the imprint transfer portion (60) imprint the adhesive (R) to the respective packages of the lead frame (102). The embossed lead frame (102) is transported to the adsorption transfer portion (70) by the lead frame transfer portion (103), and the adsorption transfer portion (70) and the adsorption assembly (80) transfer the wafer adsorption to the lead frame (102). The position of the adhesive (R) is embossed.

壓印移送部(60)安裝於基座(100)上,沿水平方向移送壓印升降部(50)。壓印升降部(50)安裝于壓印移送部(60),使壓印組件(10)沿上下方向升降。The embossing transfer portion (60) is attached to the susceptor (100) and transports the embossed elevating portion (50) in the horizontal direction. The embossing lifting portion (50) is attached to the embossing transfer portion (60) to raise and lower the embossing unit (10) in the up and down direction.

如圖3和圖4所示,在本實施例中,壓印組件(10)有4個。主體部(30)結合于壓印移送部(60),該主體部(30)上安裝著4個壓印組件(10),被壓印移送部(60)沿水平方向移送。在主體部(30)上安裝著旋轉盤(20)並可旋轉。在旋轉盤(20)上分別安裝著4個壓印組件(10)並可升降。旋轉盤(20)具有4個與各壓印組件(10)對應的壓印彈簧(22),壓印彈簧(22)向上方彈性支撐各個壓印組件(10)。4個壓印組件(10)沿旋轉盤(20)的旋轉圓周方向按一定角度間隔排列。在本實施例中,各個壓印組件(10)間隔90°排列。As shown in Figures 3 and 4, in the present embodiment, there are four embossing assemblies (10). The main body portion (30) is coupled to the imprint transfer portion (60) on which four imprint assemblies (10) are mounted, and the imprint transfer portion (60) is transferred in the horizontal direction. A rotating disk (20) is mounted on the main body portion (30) and is rotatable. Four embossing assemblies (10) are mounted on the rotating disk (20) and can be raised and lowered. The rotating disk (20) has four embossing springs (22) corresponding to the respective embossing assemblies (10), and the embossing springs (22) elastically support the respective embossing assemblies (10) upward. The four embossing assemblies (10) are arranged at an angular interval along the circumferential direction of rotation of the rotating disk (20). In the present embodiment, each of the imprint assemblies (10) are arranged at intervals of 90°.

壓印升降部(50)安裝於主體部(30),使壓印組件(10)升降。壓印升降部(50)具有加壓構件(53)和加壓驅動器(51)。加壓構件(53)位於壓印組件(10)的上側,安裝於主體部(30)並可沿上下方向滑動。在主體部(30)上形成有沿上下方向延長的引導槽(31),在加壓構件(53)上形成有滑動凸起(56),滑動凸起(56)插入引導槽(31)並上下滑動。加壓驅動器(51)安裝於主體部(30)的上側,升降杆(52)結合於加壓構件(53)。加壓驅動器(51)按照使升降杆(52)前進或後退的方式進行動作,連接於升降杆(52)的加壓構件(53)隨著加壓驅動器(51)的動作而上升或下降The embossing lifting portion (50) is attached to the main body portion (30) to raise and lower the embossing assembly (10). The embossed lifting portion (50) has a pressing member (53) and a pressurizing driver (51). The pressing member (53) is located on the upper side of the embossing assembly (10), is mounted to the main body portion (30), and is slidable in the up and down direction. A guide groove (31) extending in the up and down direction is formed on the main body portion (30), and a sliding protrusion (56) is formed on the pressing member (53), and the sliding protrusion (56) is inserted into the guiding groove (31) and Slide up and down. The pressurizing actuator (51) is attached to the upper side of the main body portion (30), and the elevating rod (52) is coupled to the pressing member (53). The pressurizing actuator (51) operates to advance or retract the elevating rod (52), and the pressing member (53) connected to the elevating rod (52) rises or falls as the pressurizing actuator (51) operates.

加壓構件(53)上至少形成一個組件貫通孔(55)。當加壓驅動器(51)使加壓構件(53)下降時,至少一個壓印組件(10)不會在經過組件貫通孔(55)的同時下降,而其餘壓印組件(10)受加壓構件(53)的按壓而下降。在本實施例中,如圖4所示,使用了形成3個(即,比壓印組件(10)的個數少1個)組件貫通孔(55)的加壓構件(53)。At least one component through hole (55) is formed in the pressing member (53). When the pressurizing actuator (51) lowers the pressing member (53), at least one imprinting assembly (10) does not descend while passing through the component through hole (55), and the remaining imprinting assembly (10) is pressurized. The member (53) is lowered by pressing. In the present embodiment, as shown in Fig. 4, a pressing member (53) which forms three (i.e., one less than the number of the imprinting assemblies (10)) of the module through-holes (55) is used.

使旋轉盤(20)旋轉的旋轉單元(40)位於旋轉盤(20)與加壓構件(53)的上側。旋轉單元(40)具有馬達(41)和旋轉軸(42)。馬達(41)固定於主體部(30),旋轉軸(42)因馬達(41)而旋轉,穿過加壓構件(53)的貫通孔(54)插入結合於旋轉盤(20)的固定槽(21)。由於旋轉單元(40)的這種構成,旋轉盤(20)可以旋轉,根據旋轉盤(20)的旋轉角度,決定壓印組件(10)與組件貫通孔(55)之間的相對位置。A rotary unit (40) that rotates the rotary disk (20) is located on the upper side of the rotary disk (20) and the pressing member (53). The rotating unit (40) has a motor (41) and a rotating shaft (42). The motor (41) is fixed to the main body portion (30), and the rotating shaft (42) is rotated by the motor (41), and the through hole (54) passing through the pressing member (53) is inserted into the fixing groove coupled to the rotating plate (20). (twenty one). Due to such a configuration of the rotary unit (40), the rotary disk (20) can be rotated, and the relative position between the imprint assembly (10) and the component through hole (55) is determined according to the rotation angle of the rotary disk (20).

如圖5及圖6所示,壓印組件(10)包括壓印針(12)和針夾頭(11)、壓印磁鐵(13)。針夾頭(11)固定於旋轉盤(20)並可升降,壓印針(12)插入於針夾頭(11)。在壓印針(12)面對針夾頭(11)的面上具有磁鐵槽(1223)。壓印磁鐵(13)形成環(ring)狀,插入壓印針(12)的磁鐵槽(1223)並固定。壓印磁鐵(13)通過向拉緊針夾頭(11)的方向提供磁力,以結合針夾頭(11)與壓印針(12)。最好是磁鐵槽(1223)的深度大於壓印磁鐵(13)長度,使壓印磁鐵(13)不至於接觸針夾頭(11)。通過防止壓印磁鐵(13)與針夾頭(11)接觸,可以防止壓印磁鐵(13)因衝擊而破損。As shown in FIGS. 5 and 6, the embossing assembly (10) includes an embossing pin (12) and a needle nipple (11), and an embossing magnet (13). The needle holder (11) is fixed to the rotary disk (20) and can be lifted and lowered, and the embossing needle (12) is inserted into the needle holder (11). A magnet groove (1223) is provided on a surface of the platen needle (12) facing the needle chuck (11). The embossing magnet (13) is formed in a ring shape, inserted into the magnet groove (1223) of the embossing pin (12), and fixed. The embossing magnet (13) combines the needle holder (11) with the embossing needle (12) by providing a magnetic force in the direction of tensioning the needle holder (11). Preferably, the depth of the magnet slot (1223) is greater than the length of the stamping magnet (13) so that the stamping magnet (13) does not contact the needle collet (11). By preventing the imprint magnet (13) from coming into contact with the needle collet (11), it is possible to prevent the imprint magnet (13) from being damaged by the impact.

壓印針(12)包括針固定部(122)、針部(121)和針彈性部(123)。針固定部(122)是安裝壓印磁鐵(13)並插入針夾頭(11)的部分。針部(121)安裝於針固定部(122)並可沿上下方向滑動。針彈性部(123)安裝於針固定部(122)與針部(121)之間,且向針部(121)與針固定部(122)相互遠離方向提供彈力。在本實施例中,如圖6所示,彈簧被用作針彈性部(123)。針彈性部(123)在針部(121)接觸引線框架(102)並進行粘合劑(R)壓印的過程中起到緩衝器的作用,以緩衝對針部(121)施加的衝擊。The embossing needle (12) includes a needle fixing portion (122), a needle portion (121), and a needle elastic portion (123). The needle fixing portion (122) is a portion to which the impression magnet (13) is attached and inserted into the needle holder (11). The needle portion (121) is attached to the needle fixing portion (122) and is slidable in the up and down direction. The needle elastic portion (123) is attached between the needle fixing portion (122) and the needle portion (121), and provides an elastic force in a direction away from the needle portion (121) and the needle fixing portion (122). In the present embodiment, as shown in Fig. 6, a spring is used as the needle elastic portion (123). The needle elastic portion (123) functions as a damper in the process of the needle portion (121) contacting the lead frame (102) and performing the adhesive (R) imprinting to buffer the impact applied to the needle portion (121).

如圖5及圖6所示,針夾頭(11)上形成固定槽(111)。在壓印針(12)上凸出結合著無頭螺栓,形成固定凸起(1222)。壓印針(12)的固定凸起(1222)卡於針夾頭(11)的固定槽(111),防止壓印針(12)與針夾頭(11)之間相對旋轉。As shown in FIGS. 5 and 6, a fixing groove (111) is formed in the needle chuck (11). A stud bolt is protruded from the embossing needle (12) to form a fixing protrusion (1222). The fixing projection (1222) of the embossing needle (12) is caught in the fixing groove (111) of the needle holder (11) to prevent relative rotation between the embossing needle (12) and the needle holder (11).

另外,在針固定部(122)上形成沿上下方向延長的滑動槽(1221),在針部(121)以無頭螺栓的形態結合著插入於滑動槽(1221)的滑動凸起(1211)。滑動凸起(1211)與滑動槽(1221)允許相互上下方向相對移動,同時卻防止針部(121)與針固定部(122)之間的相對旋轉。Further, a sliding groove (1221) extending in the vertical direction is formed in the needle fixing portion (122), and a sliding projection (1211) inserted into the sliding groove (1221) is joined to the needle portion (121) in the form of a headless bolt. . The sliding projections (1211) and the sliding grooves (1221) allow relative movement in the up and down direction while preventing relative rotation between the needle portion (121) and the needle fixing portion (122).

吸附移送部(70)安裝於基座(100)上,沿上下方向與水平方向移送吸附組件(80)。而且,在吸附移送部(70)安裝著提供空氣壓力的裝置,以便能吸附和移送半導體晶片。該吸附組件(80)結合於吸附移送部(70),連通空氣壓力,使該吸附組件(80)可以吸附晶片。The adsorption transfer unit (70) is attached to the susceptor (100) and transports the adsorption unit (80) in the vertical direction and the horizontal direction. Further, means for supplying air pressure is attached to the adsorption transfer portion (70) so that the semiconductor wafer can be adsorbed and transferred. The adsorption assembly (80) is coupled to the adsorption transfer portion (70) to communicate air pressure so that the adsorption assembly (80) can adsorb the wafer.

該吸附組件(80)包括吸附管(82)、吸附管夾頭(81)和吸附磁鐵(83)。吸附管夾頭(81)結合於吸附移送部(70)。吸附管(82)插入吸附管夾頭(81),在吸附磁鐵(83)的作用下,吸附管夾頭(81)與吸附管(82)相互結合。在吸附管(82)上形成有磁鐵槽(84),吸附磁鐵(83)插入磁鐵槽(84)並固定。吸附磁鐵(83)向拉緊該吸附管夾頭(81)的方向提供磁力,使該吸附管夾頭(81)與吸附管(82)相互結合。吸附磁鐵(83)形成環(ring)狀,在構成上易於插入磁鐵槽(84)。最好是磁鐵槽(84)的深度深於吸附磁鐵(83)厚度,使吸附磁鐵(83)不與吸附管夾頭(81)相互接觸。通過這種構成,具有可以防止該吸附磁鐵(83)破損的效果The adsorption assembly (80) includes a adsorption tube (82), a adsorption tube holder (81), and an adsorption magnet (83). The adsorption tube chuck (81) is coupled to the adsorption transfer portion (70). The adsorption tube (82) is inserted into the adsorption tube holder (81), and the adsorption tube holder (81) and the adsorption tube (82) are combined with each other by the adsorption magnet (83). A magnet groove (84) is formed in the adsorption tube (82), and the adsorption magnet (83) is inserted into the magnet groove (84) and fixed. The adsorption magnet (83) supplies a magnetic force in a direction in which the adsorption tube holder (81) is pulled, and the adsorption tube holder (81) and the adsorption tube (82) are coupled to each other. The adsorption magnet (83) is formed in a ring shape, and is easily inserted into the magnet groove (84). Preferably, the depth of the magnet groove (84) is deeper than the thickness of the adsorption magnet (83) so that the adsorption magnet (83) does not contact the adsorption tube holder (81). With this configuration, there is an effect that the adsorption magnet (83) can be prevented from being damaged.

在該吸附管夾頭(81)與吸附管(82)內形成上下貫通的通道,空氣壓力通過該通道傳遞。在吸附管(82)內形成的真空壓力作用下,吸附管(82)可以吸附、移送晶片。A channel that penetrates vertically is formed in the adsorption tube collet (81) and the adsorption tube (82), and air pressure is transmitted through the passage. The adsorption tube (82) can adsorb and transfer the wafer under the vacuum pressure formed in the adsorption tube (82).

下面對如上構成的本實施例的晶片接合裝置的作用進行說明。Next, the operation of the wafer bonding apparatus of the present embodiment configured as above will be described.

如圖2所示,引線框架移送部(103)將引線框架(102)移送到壓印移送部(60)的附近。As shown in FIG. 2, the lead frame transfer portion (103) transfers the lead frame (102) to the vicinity of the imprint transfer portion (60).

壓印移送部(60)使以壓印組件(10)為主的壓印升降部(50)向安裝於基座(100)上的粘合劑容器(101)上側移動。如圖2及圖8所示,在粘合劑容器(101)中盛裝著粘合劑(R)。在這種狀態下啟動壓印升降部(50),降下壓印組件(10),使壓印組件(10)的針部(121)浸於粘合劑(R)中。下面進一步詳細說明降下該壓印組件(10)的動作。The embossing transfer unit (60) moves the embossed elevating portion (50) mainly including the embossing unit (10) toward the upper side of the adhesive container (101) attached to the susceptor (100). As shown in FIGS. 2 and 8, the adhesive container (101) contains an adhesive (R). In this state, the embossing lifter (50) is activated, and the embossing assembly (10) is lowered to immerse the needle portion (121) of the embossing assembly (10) in the adhesive (R). The action of lowering the embossing assembly (10) is described in further detail below.

首先,啟動該旋轉單元(40),使旋轉盤(20)旋轉至如圖7所示狀態。即,旋轉該旋轉盤(20),使間隔90°排列於旋轉盤(20)上的壓印組件(10)與加壓構件(53)的組件貫通孔(55)按約45°間隔相互交叉排列。在這種狀態下,如圖8所示,如果啟動加壓驅動器(51),加壓構件(53)則下降並對4個壓印組件(10)加壓,使壓印組件(10)下降。於是,壓印組件(10)的針部(121)浸入粘合劑(R),針部(121)沾上粘合液。First, the rotating unit (40) is activated to rotate the rotating disk (20) to the state shown in FIG. That is, the rotary disk (20) is rotated so that the imprint assembly (10) arranged at intervals of 90° on the rotary disk (20) and the component through-hole (55) of the pressing member (53) cross each other at intervals of about 45°. arrangement. In this state, as shown in Fig. 8, if the pressurizing actuator (51) is activated, the pressing member (53) is lowered and the four imprinting assemblies (10) are pressurized to lower the imprinting assembly (10). . Thus, the needle portion (121) of the embossing assembly (10) is immersed in the adhesive (R), and the needle portion (121) is immersed in the adhesive liquid.

再次啟動加壓驅動器,使加壓構件(53)上升,壓印彈簧(22)彈性復原,使壓印組件(10)相對於旋轉盤(20)上升。The pressurizing actuator is activated again to raise the pressing member (53), and the stamping spring (22) is elastically restored to raise the imprinting assembly (10) relative to the rotating disc (20).

在這種狀態下,啟動壓印移送部(60),使以壓印組件(10)為主的壓印升降部(50)向引線框架(102)上側移動。然後,啟動該旋轉單元(40),使旋轉盤(20)旋轉至如圖9所示狀態。即,除一個壓印組件(10)之外,其餘3個壓印組件(10)均位於與旋轉盤(20)的組件貫通孔(55)相同的位置。在這種狀態下,啟動加壓驅動器(51),如圖10所示,加壓構件(53)下降,對4個壓印組件(10)中的一個壓印組件(10)加壓。此時,其餘3個壓印組件(10)穿過加壓構件(53)的組件貫通孔(55),同時不受加壓,保持原來狀態。下降的壓印組件(10)的針部(121)接觸引線框架(102)的封裝處,將粘合劑(R)壓印于封裝處。In this state, the imprint transfer portion (60) is activated to move the imprint elevating portion (50) mainly composed of the imprint assembly (10) toward the upper side of the lead frame (102). Then, the rotating unit (40) is activated to rotate the rotating disk (20) to the state shown in FIG. That is, except for one imprint assembly (10), the remaining three imprint assemblies (10) are located at the same position as the component through holes (55) of the rotary disk (20). In this state, the pressurizing actuator (51) is activated, and as shown in Fig. 10, the pressing member (53) is lowered to pressurize one of the four imprinting assemblies (10). At this time, the remaining three embossing members (10) pass through the component through-holes (55) of the pressing member (53) while being unpressurized and maintained in the original state. The needle portion (121) of the lowered embossing assembly (10) contacts the package of the lead frame (102) and embosses the adhesive (R) at the package.

重新上升加壓構件(53),使旋轉盤(20)旋轉90°,下一壓印組件(10)處於可被加壓構件(53)降下的位置。壓印移送部(60)將壓印組件(10)移送至引線框架(102)的下個封裝位置,壓印組件(10)被加壓驅動器(51)降下,以壓印該粘合劑(R)。如果這種過程再重複2次,利用安裝於旋轉盤(20)的4個壓印組件(10),可以進行4次壓印。The pressing member (53) is raised again to rotate the rotary disk (20) by 90°, and the next imprint assembly (10) is at a position that can be lowered by the pressing member (53). The imprint transfer portion (60) transfers the imprint assembly (10) to the next package position of the lead frame (102), and the imprint assembly (10) is lowered by the pressurizing driver (51) to imprint the adhesive ( R). If this process is repeated two more times, four imprints can be performed using four imprint assemblies (10) mounted on the rotating disk (20).

即,壓印組件(10)蘸一次粘合劑(R)可以執行4次壓印作業,具有壓印作業速度非常快的優點。That is, the embossing assembly (10) 蘸 one time of the adhesive (R) can perform four embossing operations, and has the advantage that the embossing operation speed is very fast.

另一方面,如圖6所示,針部(121)可以相對於針固定部(122)滑動,在針部(121)與針固定部(122)之間是針彈性部(123),在壓印組件(10)下降進行壓印的過程中,即使針部(121)與引線框架(102)之間的衝擊較大,針彈性部(123)也會緩衝該衝擊,具有防止針部(121)破損的效果。On the other hand, as shown in Fig. 6, the needle portion (121) is slidable relative to the needle fixing portion (122), and between the needle portion (121) and the needle fixing portion (122) is a needle elastic portion (123). During the embossing of the embossing assembly (10), even if the impact between the needle portion (121) and the lead frame (102) is large, the needle elastic portion (123) cushions the impact and has the needle portion ( 121) The effect of damage.

在如上所述壓印針(12)重複多次壓印作業,針部(121)因磨損而需要更換。可是,本發明的晶片接合裝置的壓印針(12)是利用壓印磁鐵(13)結合於針夾頭(11),具有可以輕鬆迅速拆裝的優點。另外,不使用螺絲結合方式,而是使用磁鐵結合,針夾頭(11)與壓印針(12)之間相對變位始終保持一定,具有使用者無需另行調整針部(121)高度的優點。The embossing operation is repeated a plurality of times by the embossing needle (12) as described above, and the needle portion (121) needs to be replaced due to wear. However, the embossing needle (12) of the wafer bonding apparatus of the present invention is bonded to the needle holder (11) by means of an embossing magnet (13), and has the advantage that it can be easily and quickly disassembled. In addition, instead of using the screw combination method, the magnets are combined, and the relative displacement between the needle chuck (11) and the embossing needle (12) is always kept constant, and the user does not need to adjust the height of the needle portion (121) separately. .

另外,如上所述,壓印針(12)與針夾頭(11)在針夾頭(11)的固定槽與壓印針(12)的固定凸起的作用下而防止相對旋轉。因此優點在於,在引線框架(102)上壓印的針部(121)位置不變,始終保持一定。同樣,在滑動槽(1221)與滑動凸起(1211)的作用下,也防止了針固定部(122)與針部(121)之間的相對旋轉,可以使針部(121)壓印的位置保持一定。Further, as described above, the nip pin (12) and the needle chuck (11) are prevented from rotating relative to each other by the fixing groove of the needle chuck (11) and the fixing projection of the nip pin (12). Therefore, there is an advantage in that the position of the needle portion (121) embossed on the lead frame (102) does not change and is always kept constant. Similarly, under the action of the sliding groove (1221) and the sliding protrusion (1211), the relative rotation between the needle fixing portion (122) and the needle portion (121) is also prevented, and the needle portion (121) can be imprinted. The position remains certain.

完成了粘合劑(R)壓印作業的引線框架(102)被引線框架移送部(103)移送到吸附移送部(70)下方。吸附移送部(70)一個個地吸住半導體晶片,吸附移送部(70)沿水平方向與上下方向而移送吸附組件(80),在引線框架(102)壓印的各個位置放上晶片,使半導體晶片粘合於引線框架(102)。如圖11所示,吸附組件(80)的吸附管(82)與吸附管夾頭(81)也用吸附磁鐵(83)結合,可以非常容易地把吸附管(82)安裝于吸附管夾頭(81)的正確位置或拆除。The lead frame (102) on which the adhesive (R) imprinting operation is completed is transferred to the lower side of the adsorption transfer portion (70) by the lead frame transfer portion (103). The adsorption transfer unit (70) sucks the semiconductor wafer one by one, and the adsorption transfer unit (70) transfers the adsorption unit (80) in the horizontal direction and the vertical direction, and places the wafer at each position where the lead frame (102) is imprinted. The semiconductor wafer is bonded to the lead frame (102). As shown in Fig. 11, the adsorption tube (82) of the adsorption module (80) and the adsorption tube holder (81) are also combined by an adsorption magnet (83), and the adsorption tube (82) can be easily attached to the adsorption tube holder. (81) The correct position or removal.

以上列舉有利實施例,對本發明的晶片接合裝置進行了說明,但本發明的範圍並不限定於前述說明及附圖範圍。The wafer bonding apparatus of the present invention has been described above by taking advantage of the advantageous embodiments, but the scope of the present invention is not limited to the foregoing description and the scope of the drawings.

例如,前面提到,壓印磁鐵(13)安裝于壓印針(12)上,但是,也可以是壓印磁鐵不安裝于壓印針,而是安裝於針夾頭上,或使磁鐵安裝于壓印針與針夾頭兩側。另外,壓印磁鐵的形狀不限定於環狀,也可以其它多種形狀構成。例如,可在壓印針上安裝2個以上的壓印磁鐵。For example, as mentioned above, the embossing magnet (13) is mounted on the embossing pin (12), but it is also possible that the embossing magnet is not mounted on the embossing pin, but is mounted on the needle holder or the magnet is mounted on the ejector pin. Emboss the needle and the sides of the needle holder. Further, the shape of the imprint magnet is not limited to the ring shape, and may be formed in other various shapes. For example, two or more embossed magnets can be mounted on the embossing needle.

另外,前面提到,旋轉盤上安裝的壓印組件個數為4個,但是,壓印組件的個數可以在2個以上的範圍內作多種變化,壓印組件之間的角度間隔也可以多樣地變形。In addition, as mentioned above, the number of embossing components mounted on the rotating disk is four, but the number of embossing components can be varied in more than two ranges, and the angular interval between the embossing components can also be Variantly deformed.

另外,壓印移送部(60)、壓印加壓驅動器(51)、加壓構件(53)、旋轉單元(40)、吸附移送部(70)結構也可以不同於附圖顯示的結構,進行多種變形。Further, the structure of the imprint transfer portion (60), the imprint pressurizing driver (51), the pressing member (53), the rotating unit (40), and the adsorption transfer portion (70) may be different from the structure shown in the drawings. A variety of deformations.

雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。While the present invention has been described in its preferred embodiments, the present invention is not intended to limit the invention, and the present invention may be modified and modified without departing from the spirit and scope of the invention. The scope of protection is subject to the definition of the scope of the patent application.

1...壓印針1. . . Imprint pin

2...針固定部2. . . Needle fixation

3...固定螺母3. . . Fixing nut

10...壓印組件10. . . Imprinting assembly

11...針夾頭11. . . Needle chuck

12...壓印針12. . . Imprint pin

13...壓印磁鐵13. . . Imprinted magnet

20...旋轉盤20. . . Rotating disk

21...固定槽twenty one. . . Fixed slot

22...壓印彈簧twenty two. . . Imprinted spring

30...主體部30. . . Main body

31...引導槽31. . . Boot slot

40...旋轉單元40. . . Rotating unit

41...馬達41. . . motor

42...旋轉軸42. . . Rotary axis

50...壓印升降部50. . . Embossing lift

51...加壓驅動器51. . . Pressurized drive

52...升降杆52. . . Lifting rod

53...加壓構件53. . . Pressurized member

54...貫通孔54. . . Through hole

55...組件貫通孔55. . . Component through hole

56...滑動凸起56. . . Sliding bulge

60...壓印移送部60. . . Imprint transfer department

70...吸附移送部70. . . Adsorption transfer unit

80...吸附組件80. . . Adsorption assembly

81...吸附管夾頭81. . . Adsorption tube chuck

82...吸附管82. . . Adsorption tube

83...吸附磁鐵83. . . Adsorption magnet

84...磁鐵槽84. . . Magnet slot

100...基座100. . . Pedestal

101...粘合劑容器101. . . Adhesive container

102...引線框架102. . . Lead frame

103...引線框架移送部103. . . Lead frame transfer unit

111...固定槽111. . . Fixed slot

121...針部121. . . Needle

122...針固定部122. . . Needle fixation

123...針彈性部123. . . Needle elastic

1211...滑動凸起1211. . . Sliding bulge

1221...滑動槽1221. . . Sliding slot

1222...固定凸起1222. . . Fixed bulge

1223...磁鐵槽1223. . . Magnet slot

圖1是以往晶片接合裝置的局部截面圖。1 is a partial cross-sectional view showing a conventional wafer bonding apparatus.

圖2是本發明一個實施例的晶片接合裝置的斜視圖。Figure 2 is a perspective view of a wafer bonding apparatus in accordance with one embodiment of the present invention.

圖3是圖2所示晶片接合裝置局部放大的斜視圖。Figure 3 is a partially enlarged perspective view of the wafer bonding apparatus of Figure 2;

圖4是圖3所示晶片接合裝置的局部分離斜視圖。Figure 4 is a partially exploded perspective view of the wafer bonding apparatus of Figure 3.

圖5是圖2所示晶片接合裝置的壓印組件的分離斜視圖。Figure 5 is a perspective elevational view of the embossing assembly of the wafer bonding apparatus of Figure 2;

圖6是圖5所示晶片接合裝置的壓印組件的Ⅵ-Ⅵ線截面圖。Figure 6 is a cross-sectional view taken along line VI-VI of the stamping assembly of the wafer bonding apparatus shown in Figure 5.

圖7至圖10是用於說明圖2所示晶片接合裝置動作方法的附圖。7 to 10 are drawings for explaining the operation method of the wafer bonding apparatus shown in Fig. 2.

圖11是圖2所示晶片接合裝置的吸附組件的截面圖。Figure 11 is a cross-sectional view of the adsorption assembly of the wafer bonding apparatus of Figure 2.

30...主體部30. . . Main body

40...旋轉單元40. . . Rotating unit

50...壓印升降部50. . . Embossing lift

60...壓印移送部60. . . Imprint transfer unit

70...吸附移送部70. . . Adsorption transfer unit

80...吸附組件80. . . Adsorption assembly

100...基座100. . . Pedestal

101...粘合劑容器101. . . Adhesive container

102...引線框架102. . . Lead frame

103...引線框架移送部103. . . Lead frame transfer unit

Claims (7)

一種晶片接合裝置,在依次供應的引線框架上壓印粘合劑,在壓印了的位置貼裝晶片,其特徵在於包括:多個壓印組件,上述壓印組件具有壓印針、針夾頭和壓印磁鐵,上述壓印針接觸上述引線框架,壓印上述粘合劑,上述針夾頭供上述壓印針結合,壓印磁鐵安裝於上述針夾頭與上述壓印針兩者之一上,通過向相對於另一者接近的方法提供磁力來結合上述針夾頭與上述壓印針;壓印升降部,使上述壓印組件沿上下方法升降;壓印移送部,沿水平方向移送上述壓印組件;旋轉盤,具有多個壓印彈簧,向上方彈性支撐多個壓印組件,上述多個壓印組件分別安裝於上述旋轉盤上並可升降;主體部,結合于上述壓印移送部,上述旋轉盤以可旋轉的方式安裝於該主體部;以及旋轉單元,使上述旋轉盤相對於上述主體部旋轉;上述壓印升降部包括加壓構件和加壓驅動器,加壓構件位於上述多個壓印組件的上部並可升降,向下側對上述多個壓印組件中的至少一個加壓,並至少具有一個組件貫通孔,該組件貫通孔可供被加壓的壓印組件之外的其餘壓印組件貫通;加壓驅動器,加壓驅動器結合於上述加壓構件,使上述加壓構件相對於上述主體部升降。 A wafer bonding apparatus for embossing an adhesive on a lead frame sequentially supplied, and mounting the wafer at an embossed position, characterized by comprising: a plurality of embossing assemblies having embossing pins and needle holders a head and an imprinting magnet, the embossing needle contacting the lead frame, embossing the adhesive, the needle collet is coupled to the embossing needle, and the embossing magnet is mounted on the needle collet and the embossing needle Firstly, the needle collet and the embossing needle are combined by providing a magnetic force to a method of approaching the other; the embossing portion is embossed, and the embossing assembly is lifted up and down; the embossing portion is horizontally Transferring the above-mentioned imprinting assembly; the rotating disc has a plurality of embossing springs, and elastically supports a plurality of embossing assemblies upwardly, the plurality of embossing assemblies are respectively mounted on the rotating disc and movable up and down; the main body portion is coupled to the pressing portion a printing transfer unit, wherein the rotating disk is rotatably attached to the main body portion; and a rotating unit that rotates the rotating disk relative to the main body portion; the embossing lifting portion includes a pressing member and And a pressing member located at an upper portion of the plurality of embossing assemblies and movable up and down, pressurizing at least one of the plurality of embossing assemblies to a lower side, and having at least one component through hole, the component through hole being The remaining imprinting assembly other than the pressurized imprinting assembly penetrates; the pressurizing actuator is coupled to the pressing member to raise and lower the pressing member with respect to the main body portion. 如申請專利範圍第1項所述的晶片接合裝置,其中:上述壓印針包括針固定部、安裝於上述針固定部並可 上下方向滑動的針部、安裝於上述針固定部與上述針部之間且向上述針部與上述針固定部相互遠離的方向提供彈力的針彈性部。 The wafer bonding apparatus according to claim 1, wherein the embossing needle comprises a needle fixing portion, is attached to the needle fixing portion, and a needle portion that slides in the vertical direction, and a needle elastic portion that is attached between the needle fixing portion and the needle portion and that provides an elastic force in a direction away from the needle portion and the needle fixing portion. 如申請專利範圍第1或2項所述的晶片接合裝置,其中:上述壓印針在面對上述針夾頭面上具有磁鐵槽,上述壓印磁鐵形成環狀,插入于上述壓印針磁鐵槽並固定。 The wafer bonding apparatus according to claim 1 or 2, wherein the embossing needle has a magnet groove facing the needle chuck face, and the embossing magnet is formed in a ring shape and inserted into the embossing pin magnet. The slot is fixed. 如申請專利範圍第3項所述的晶片接合裝置,其中:在上述壓印針與上述針夾頭兩者之一上形成固定槽,在另一者上形成插入上述固定槽的固定凸起,以防止上述壓印針相對於上述針夾頭旋轉。 The wafer bonding apparatus according to claim 3, wherein: a fixing groove is formed on one of the nip roller and the needle nip, and a fixing protrusion inserted into the fixing groove is formed on the other, In order to prevent the above-mentioned embossing needle from rotating relative to the above-mentioned needle holder. 如申請專利範圍第1項所述的晶片接合裝置,其中:上述加壓構件的組件貫通孔個數較上述壓印組件的個數少一個。 The wafer bonding apparatus according to claim 1, wherein the number of the through holes of the pressing member is one less than the number of the imprinting assemblies. 如申請專利範圍第5項所述的晶片接合裝置,其中:上述多個壓印組件在上述旋轉盤上沿圓周方向按相同角度間隔排列。 The wafer bonding apparatus according to claim 5, wherein the plurality of imprinting assemblies are arranged at equal angular intervals in the circumferential direction on the rotating disk. 如申請專利範圍第3項所述的晶片接合裝置,其中:吸附組件具有:吸附管,吸附上述晶片,以便能把上述晶片貼裝于壓印了上述粘合劑的引線框架;吸附管夾頭,結合上述吸附管;吸附磁鐵,安裝于上述吸附管夾頭與吸附管兩者之一上,向相對於另一者接近方向提供磁力,結合上述吸附管夾頭與上述吸附管;以及 吸附移送部,沿上下方向和水平方向而移送上述吸附組件。The wafer bonding apparatus according to claim 3, wherein the adsorption module has: an adsorption tube that adsorbs the wafer so that the wafer can be attached to a lead frame on which the adhesive is embossed; the adsorption tube chuck And combining the adsorption tube; the adsorption magnet is mounted on one of the adsorption tube holder and the adsorption tube, and supplies a magnetic force in an approaching direction with respect to the other, in combination with the adsorption tube holder and the adsorption tube; The adsorption transfer unit transfers the adsorption unit in the vertical direction and the horizontal direction.
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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101122138B1 (en) * 2010-02-24 2012-03-20 주식회사 프로텍 Chip bonding apparatus
CN104084659B (en) * 2014-07-02 2016-04-20 佛山市施翔腾科技设备有限公司 Hot air welding method is adopted to prepare the production method of transistor
CN104148834B (en) * 2014-08-01 2017-02-15 广州明森科技股份有限公司 Equipment and method for efficiently welding chips of double-interface intelligent cards
KR101642659B1 (en) 2015-06-11 2016-07-26 주식회사 프로텍 Die Bonding Apparatus for Semiconductor Chip
CN106298551B (en) * 2016-08-25 2018-11-13 华东光电集成器件研究所 A kind of chip welding briquetting component
KR101949591B1 (en) * 2017-05-24 2019-02-19 주식회사 프로텍 Apparatus for Bonding Flexible Part Including Inclined Leads
CN110660691B (en) * 2019-10-28 2020-11-17 四川旭茂微科技有限公司 Lead frame glues core device
CN112366162B (en) * 2021-01-13 2021-04-09 四川晶辉半导体有限公司 Integrated packaging device for surface mount diodes
CN115831829B (en) * 2023-02-16 2023-04-25 山东睿芯半导体科技有限公司 Soft solder chip mounting machine for electronic chip
CN117123981B (en) * 2023-10-26 2024-03-15 江苏快克芯装备科技有限公司 Micro-pressure device of chip suction mechanism and chip welding machine

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02303200A (en) * 1989-05-18 1990-12-17 Hitachi Ltd Electronic-component mounting apparatus
JPH04247256A (en) * 1991-01-31 1992-09-03 Toyoda Gosei Co Ltd Coating jig
JPH06283559A (en) * 1993-03-30 1994-10-07 Hitachi Ltd Chip bonding device
KR200177299Y1 (en) * 1997-09-29 2000-04-15 김영환 Dispenser nozzle for die bonding equipment
KR100295670B1 (en) * 1998-12-10 2001-08-07 김영환 EPOXY NOZZLE Consolidation STRUCTURE FOR SEMICONDUCTOR DIE BONDER
US6250515B1 (en) * 1999-10-29 2001-06-26 Nordson Corporation Liquid dispenser having drip preventing valve
JP2002028568A (en) * 2000-07-17 2002-01-29 Koha Co Ltd Transfer pin, collet and die bonder using them
JP3498050B2 (en) * 2000-09-27 2004-02-16 エヌイーシーマシナリー株式会社 Die bonder
JP4088458B2 (en) * 2002-02-28 2008-05-21 松下電器産業株式会社 Component mounting head for component mounting equipment
US7302755B2 (en) * 2005-02-07 2007-12-04 Samsung Techwin Co., Ltd. Head assembly for a component mounter
JP4340276B2 (en) * 2005-09-29 2009-10-07 株式会社ニューマシン Suction head for semiconductor chip
CN101178467A (en) * 2006-11-08 2008-05-14 鸿富锦精密工业(深圳)有限公司 Glue dropping device
US7735715B2 (en) * 2007-12-07 2010-06-15 Asm Assembly Automation Ltd Dispensing solder for mounting semiconductor chips
KR101122138B1 (en) * 2010-02-24 2012-03-20 주식회사 프로텍 Chip bonding apparatus

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