TWI410652B - - Google Patents

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Publication number
TWI410652B
TWI410652B TW100103866A TW100103866A TWI410652B TW I410652 B TWI410652 B TW I410652B TW 100103866 A TW100103866 A TW 100103866A TW 100103866 A TW100103866 A TW 100103866A TW I410652 B TWI410652 B TW I410652B
Authority
TW
Taiwan
Prior art keywords
inspection
component
inspected
oscillation
photo
Prior art date
Application number
TW100103866A
Other languages
Chinese (zh)
Other versions
TW201234026A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW100103866A priority Critical patent/TW201234026A/en
Publication of TW201234026A publication Critical patent/TW201234026A/en
Application granted granted Critical
Publication of TWI410652B publication Critical patent/TWI410652B/zh

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Abstract

Disclosed are an inspection system of a photo-link light receiver and a method thereof, which are generally applicable to inspection of an electrical circuit of a photo-link light receiver after chip packaging. At the beginning of implementation, a component to be inspected is set under an unstable operation condition in advance just like an oscillation circuit. During the inspection, an internal circuit of the component to be inspected is driven to generate oscillation. At this time, a measurement module set up in the inspection system is operated to measure the oscillation of the component to be inspected and the oscillation waveform thereof. At this moment, comparison of the oscillation waveform for difference is carried out to determine if the component to be inspected is an acceptable product and if it has a defect of broken electrical circuit. Further, the present invention allows modification of the inspection process according to the difference of electrical configuration of the component to be inspected. As such, the present invention provides the component production side with fast inspection of defect of broken line of the photo-link light receiver after chip packaging in order to shorten the time required for inspection.
TW100103866A 2011-02-01 2011-02-01 Inspection system of photo-link light receiver and method thereof TW201234026A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW100103866A TW201234026A (en) 2011-02-01 2011-02-01 Inspection system of photo-link light receiver and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100103866A TW201234026A (en) 2011-02-01 2011-02-01 Inspection system of photo-link light receiver and method thereof

Publications (2)

Publication Number Publication Date
TW201234026A TW201234026A (en) 2012-08-16
TWI410652B true TWI410652B (en) 2013-10-01

Family

ID=47070047

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100103866A TW201234026A (en) 2011-02-01 2011-02-01 Inspection system of photo-link light receiver and method thereof

Country Status (1)

Country Link
TW (1) TW201234026A (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200717287A (en) * 2005-09-08 2007-05-01 Avago Tech Ecbu Ip Sg Pte Ltd Position detection system using laser speckle
TW200811632A (en) * 2006-05-26 2008-03-01 Semiconductor Components Ind Accurate timing generator and method therefor
TW200949970A (en) * 2008-02-27 2009-12-01 Scanimetrics Inc Method and apparatus for interrogating electronic components
TW201003091A (en) * 2008-06-02 2010-01-16 Advantest Corp Semiconductor wafer, semiconductor circuit, test substrate and test system
US7727723B2 (en) * 2006-04-18 2010-06-01 Advanced Liquid Logic, Inc. Droplet-based pyrosequencing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200717287A (en) * 2005-09-08 2007-05-01 Avago Tech Ecbu Ip Sg Pte Ltd Position detection system using laser speckle
US7727723B2 (en) * 2006-04-18 2010-06-01 Advanced Liquid Logic, Inc. Droplet-based pyrosequencing
TW200811632A (en) * 2006-05-26 2008-03-01 Semiconductor Components Ind Accurate timing generator and method therefor
TW200949970A (en) * 2008-02-27 2009-12-01 Scanimetrics Inc Method and apparatus for interrogating electronic components
TW201003091A (en) * 2008-06-02 2010-01-16 Advantest Corp Semiconductor wafer, semiconductor circuit, test substrate and test system

Also Published As

Publication number Publication date
TW201234026A (en) 2012-08-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees