TWI410652B - - Google Patents
Info
- Publication number
- TWI410652B TWI410652B TW100103866A TW100103866A TWI410652B TW I410652 B TWI410652 B TW I410652B TW 100103866 A TW100103866 A TW 100103866A TW 100103866 A TW100103866 A TW 100103866A TW I410652 B TWI410652 B TW I410652B
- Authority
- TW
- Taiwan
- Prior art keywords
- inspection
- component
- inspected
- oscillation
- photo
- Prior art date
Links
Abstract
Disclosed are an inspection system of a photo-link light receiver and a method thereof, which are generally applicable to inspection of an electrical circuit of a photo-link light receiver after chip packaging. At the beginning of implementation, a component to be inspected is set under an unstable operation condition in advance just like an oscillation circuit. During the inspection, an internal circuit of the component to be inspected is driven to generate oscillation. At this time, a measurement module set up in the inspection system is operated to measure the oscillation of the component to be inspected and the oscillation waveform thereof. At this moment, comparison of the oscillation waveform for difference is carried out to determine if the component to be inspected is an acceptable product and if it has a defect of broken electrical circuit. Further, the present invention allows modification of the inspection process according to the difference of electrical configuration of the component to be inspected. As such, the present invention provides the component production side with fast inspection of defect of broken line of the photo-link light receiver after chip packaging in order to shorten the time required for inspection.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100103866A TW201234026A (en) | 2011-02-01 | 2011-02-01 | Inspection system of photo-link light receiver and method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW100103866A TW201234026A (en) | 2011-02-01 | 2011-02-01 | Inspection system of photo-link light receiver and method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201234026A TW201234026A (en) | 2012-08-16 |
TWI410652B true TWI410652B (en) | 2013-10-01 |
Family
ID=47070047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW100103866A TW201234026A (en) | 2011-02-01 | 2011-02-01 | Inspection system of photo-link light receiver and method thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201234026A (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200717287A (en) * | 2005-09-08 | 2007-05-01 | Avago Tech Ecbu Ip Sg Pte Ltd | Position detection system using laser speckle |
TW200811632A (en) * | 2006-05-26 | 2008-03-01 | Semiconductor Components Ind | Accurate timing generator and method therefor |
TW200949970A (en) * | 2008-02-27 | 2009-12-01 | Scanimetrics Inc | Method and apparatus for interrogating electronic components |
TW201003091A (en) * | 2008-06-02 | 2010-01-16 | Advantest Corp | Semiconductor wafer, semiconductor circuit, test substrate and test system |
US7727723B2 (en) * | 2006-04-18 | 2010-06-01 | Advanced Liquid Logic, Inc. | Droplet-based pyrosequencing |
-
2011
- 2011-02-01 TW TW100103866A patent/TW201234026A/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200717287A (en) * | 2005-09-08 | 2007-05-01 | Avago Tech Ecbu Ip Sg Pte Ltd | Position detection system using laser speckle |
US7727723B2 (en) * | 2006-04-18 | 2010-06-01 | Advanced Liquid Logic, Inc. | Droplet-based pyrosequencing |
TW200811632A (en) * | 2006-05-26 | 2008-03-01 | Semiconductor Components Ind | Accurate timing generator and method therefor |
TW200949970A (en) * | 2008-02-27 | 2009-12-01 | Scanimetrics Inc | Method and apparatus for interrogating electronic components |
TW201003091A (en) * | 2008-06-02 | 2010-01-16 | Advantest Corp | Semiconductor wafer, semiconductor circuit, test substrate and test system |
Also Published As
Publication number | Publication date |
---|---|
TW201234026A (en) | 2012-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |