TWI389770B - Polygonal columnar members, abrasive devices for polygonal columnar members and grinding methods thereof - Google Patents

Polygonal columnar members, abrasive devices for polygonal columnar members and grinding methods thereof Download PDF

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TWI389770B
TWI389770B TW099123737A TW99123737A TWI389770B TW I389770 B TWI389770 B TW I389770B TW 099123737 A TW099123737 A TW 099123737A TW 99123737 A TW99123737 A TW 99123737A TW I389770 B TWI389770 B TW I389770B
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polishing
workpiece
grinding
polygonal columnar
columnar member
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TW099123737A
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TW201114549A (en
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Mikitoshi Hiraga
Shigeru Tanahashi
Saichiro Hatori
Hisashi Matumoto
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Sintokogio Ltd
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B29/00Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • B24B9/02Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
    • B24B9/06Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
    • B24B9/065Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of thin, brittle parts, e.g. semiconductors, wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B9/00Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
  • Polishing Bodies And Polishing Tools (AREA)

Description

多角柱狀構件、多角柱狀構件之研磨裝置及其研磨方法Multi-angle columnar member, multi-corner column-shaped grinding device and grinding method thereof

本發明,係關於研磨除去由硬脆材料構成之多角柱形狀之被研磨加工物之各平面(以下稱為「平面部」)與該兩平面所交會之稜角(以下稱為「稜角部」)之表層之研磨裝置。The present invention relates to an edge (hereinafter referred to as an "angular portion") in which each plane (hereinafter referred to as "planar portion") of a workpiece to be polished which is formed of a hard and brittle material and which is formed by a hard and brittle material intersects the two planes. A polishing device for the surface layer.

以往,作為本發明之研磨對象之硬脆材料之多角柱狀構件,例如有用以藉由線鋸進行切片加工而製得矽晶圓之材料即四角柱形狀之矽塊,該矽塊,係由素材為單結晶或由多結晶構成之矽晶棒透過帶鋸或線鋸切斷而形成四角柱形狀者,但當前述切斷後之外形尺寸之相關要求精度高時,係對其表層面進行研削處理。Conventionally, as a polygonal columnar member of a hard and brittle material to be polished according to the present invention, for example, a square column-shaped block which is obtained by slicing a wire saw to obtain a tantalum wafer is used. The material is a single crystal or a crystal rod composed of multiple crystals is cut by a band saw or a wire saw to form a quadrangular prism shape. However, when the accuracy of the shape dimension is high after the cutting, the surface layer is ground. deal with.

由單結晶構成之矽塊,係將藉由拉晶法製造而成形為圓柱形狀之矽晶棒之圓柱表層部於柱軸方向使用帶鋸或線鋸以其面彼此大致成為直角之方式切斷除去而形成四平面部,且於其兩平面部間由於殘留前述圓柱表層部之一部分而形成圓弧面(R面)之四稜角部後,視需要實施前述四平面部之平面研削或前述四稜角部之圓筒研削。A crucible block composed of a single crystal is formed by a cylindrical surface layer portion of a twin rod formed by a crystal pulling method and formed into a cylindrical shape by a band saw or a wire saw in a column axis direction so that the surfaces thereof are substantially at right angles to each other. After the four flat portions are formed, and the four corner portions of the circular arc surface (R surface) are formed between the two flat portions due to the remaining portion of the cylindrical surface portion, the planar grinding of the four planar portions or the fourth is performed as needed. The cylinder of the corner is ground.

又,由多結晶構成之矽塊,藉由帶鋸或線鋸切斷除去將熔融原料流入成形模而成形為立方體形狀之矽晶棒之六面之表層部後,進而切斷成四角柱形狀,形成由四面構成之平面部,對該兩平面所交會之四稜角部進行微幅去角(C面)。此外,當前述切斷面之外形尺寸之相關要求精度高時,係與前述同樣地進行研削處理。Further, the lumps composed of the polycrystals are cut by a band saw or a wire saw to remove the surface layer portions of the six sides of the crystal slab which are formed into a cubic shape by flowing the molten raw material into the molding die, and then cut into a quadrangular prism shape. A flat portion composed of four faces is formed, and the four corner portions intersecting the two planes are slightly chamfered (C-plane). Further, when the accuracy of the required size of the cut surface is high, the grinding process is performed in the same manner as described above.

如前所述切斷成形之單結晶矽晶棒及多結晶矽,係於次步驟中藉由線鋸切片加工以製造矽晶圓,但由於在前者之單結晶矽塊之四平面度及成圓弧面(R面)之四稜角部之表層部若存在有微裂痕或或微小凹凸,在切片加工時所製造之矽晶圓則容易產生裂痕、缺口,因此於專利文獻1中揭示有一種研磨方法,係使用混入有鑽石磨粒(#800)之尼龍樹脂刷作為研磨手段而從表面研磨除去50~100μm以上、200μm以下之表層部,除去存在於前述四平面部及四稜角部之微小凹凸(及微裂痕),將研磨前之表面粗度Ry10~20μm平坦化成3~4μm,以謀求矽晶圓之產品良率之提升。The single crystal twin rod and the polycrystalline tantalum which are formed by cutting as described above are processed by wire sawing in a sub-step to produce a tantalum wafer, but due to the flatness and formation of the single crystal block in the former. In the surface layer portion of the quadrangular corner portion of the arc surface (R surface), if there are micro-cracks or minute irregularities, the silicon wafer produced during the slicing process is likely to be cracked or notched. Therefore, Patent Document 1 discloses that In the polishing method, a surface layer portion of 50 to 100 μm or more and 200 μm or less is removed from the surface by using a nylon resin brush mixed with diamond abrasive grains (#800) as a polishing means to remove minute portions existing in the four plane portions and the square corner portion. The unevenness (and micro-cracks) flattened the surface roughness Ry10 to 20 μm before polishing to 3 to 4 μm in order to improve the yield of the wafer.

又,後者之稜角部為直角形狀且施以微小C去角之多結晶矽塊亦同樣地,由於在表層部若存在有微裂痕或微小凹凸,在切片加工時所製造之矽晶圓則容易產生裂痕、缺口,因此於專利文獻2中揭示有一種研磨方法,係設置粗研磨用與完工研磨用之旋轉刷作為研磨手段,其係使矽塊之兩平面部支撐於朝朝上方之V字狀支撐部,能從傾斜上方同時研磨移送來之前述矽塊之兩平面部,研磨除去存在於四平面部之微小凹凸而將之平坦化,以謀求矽晶圓產品之良率之提升。Further, in the case where the angular portion of the latter is a right-angled shape and a polycrystalline slab having a small C-angular angle is applied, similarly, if a micro-crack or minute irregularities are present in the surface layer portion, it is easy to manufacture a wafer at the time of slicing. In the case of cracks and notches, Patent Document 2 discloses a polishing method in which a rotary brush for rough polishing and finishing polishing is provided as a polishing means for supporting the two flat portions of the block to face upward. The support portion can simultaneously polish the two flat portions of the transferred block from the obliquely upper side, and polish and remove the fine irregularities existing in the four flat portions to planarize the film to improve the yield of the wafer product.

[專利文獻][Patent Literature]

[專利文獻1]日本專利第4133935號公報[Patent Document 1] Japanese Patent No. 4133935

[專利文獻2]日本專利第3405411號公報[Patent Document 2] Japanese Patent No. 3405411

如前所述所製造之矽塊,有時會於製程中在該平面部與稜角部之表層部產生並存在表面粗度:Ry10~20μm(JISB0601:1994)之凹凸、以及進而產生自表層面起深度為80~100μm之微裂痕。當以線鋸對此種狀態之矽塊進行切片加工時,如前所述,由於會製造出產生裂痕、缺口之不良矽晶圓,因此係被要求一種製造成本廉價之研磨裝置,其可在切片加工前,縮短研磨加工時間且具備(1)可研磨除去自前述矽塊之表層部起100μm前後之深度以除去微裂痕之高研磨能力、(2)可將表面粗度:Ry10~20μm研磨為數μm以下之微細研磨能力。The ruthenium block produced as described above sometimes has a surface roughness in the surface portion of the plane portion and the corner portion in the process: Ry10~20μm (JISB0601:1994), and then from the surface layer Microcracks with a depth of 80~100μm. When the wire saw is sliced in this state, as described above, since a defective wafer which generates cracks and notches is produced, a polishing apparatus which is inexpensive to manufacture is required. Before the slicing process, the polishing processing time is shortened and (1) the high polishing ability of the depth of 100 μm from the surface layer portion of the above-mentioned crucible block to remove microcracks can be removed, and (2) the surface roughness: Ry10 to 20 μm can be ground. It is a fine grinding ability of several μm or less.

本發明之目的在於可提供一種研磨裝置與其研磨方法,其能滿足前述要求事項,且能以一台之裝置進行被研磨加工物即多角柱狀之矽塊(硬脆材料)之平面部及稜角部之研磨加工。An object of the present invention is to provide a polishing apparatus and a polishing method thereof, which can satisfy the above-mentioned requirements, and can carry out planar portions and corners of a workpiece (a hard and brittle material) which is a workpiece, that is, a polygonal column, which is a workpiece. Grinding processing of the department.

為解決前述課題而完成之本發明之第1發明為,一種多角柱狀構件之研磨裝置,係研磨被研磨加工物(W)之形狀為多角柱狀之各平面部及各稜角部,其具備:基台(4),能將該被研磨加工物(W)之各平面部中之一平面部或各稜角部中之一稜角部之任一者作為研磨之加工面(P)載置成水平朝上;由挾持軸(12A),(12B)構成之挾持手段(5),將在研磨加工前述被研磨加工物(W)時挾持其兩端面、在研磨結束後解除前述挾持狀態之把持部(6A),(6B)安裝於前端,並前後動;研磨單元(1),在研磨加工前述被研磨加工物(W)時,係移送一邊使研磨手段(2)之前端接觸旋轉於前述加工面(P)、一邊進行研磨加工之研磨手段(2);以及高度位置檢測手段(3),係在研磨加工前檢測出前述被研磨加工物(W)之加 工面(P)之高度位置,並將該高度位置檢測訊號儲存於控制手段(13);前述控制手段(13)藉由前述高度位置檢測訊號運算處理研磨手段(2)之前端之切入量以進行研磨加工。此外,此處所謂「水平朝上」係指以加工面為基準面(下方向)。The first invention of the present invention, which is a multi-angle columnar member, is a polishing apparatus for polishing a workpiece (W) having a polygonal columnar shape and an angular portion. The base (4) is capable of placing one of the flat portions or one of the angular portions of each of the flat portions of the workpiece (W) as a processed surface (P) to be polished. The holding means (5) composed of the holding shafts (12A) and (12B) holds the both ends of the workpiece (W) while grinding, and releases the gripping state after the polishing is completed. The parts (6A) and (6B) are attached to the front end and move forward and backward. When the polishing unit (1) is polished, the polishing unit (W) is transferred while the front end of the polishing means (2) is rotated and rotated. The processing surface (P), the polishing means (2) for performing the polishing process, and the height position detecting means (3) detect the addition of the workpiece (W) before the polishing process a height position of the working surface (P), and storing the height position detecting signal in the control means (13); wherein the control means (13) performs the cutting amount of the front end of the grinding means (2) by the height position detecting signal operation Grinding processing. In addition, the term "horizontal upwards" as used herein refers to a machined surface as a reference surface (downward direction).

前述之「運算處理」,係指自動設定在研磨開始前由作業人員輸入控制手段(13)之「研磨手段(2)之磨材之粒度」、「前步驟中被研磨加工物(W)之切斷條件」、「被研磨加工物(W)之研磨加工部位(平面部或稜角部)」之研磨加工條件、以及基於前述高度位置檢測手段(3)之高度位置檢測訊號之「研磨手段(2)之前端對被研磨加工物(W)之加工面(P)之切入量」,又,係指藉由前述「被研磨加工物(W)之研磨加工部位(平面部或稜角部)」之輸入而自動設定「研磨單元(1)之移送速度」。The above-mentioned "computation processing" means automatically setting the "grain size of the abrasive material of the polishing means (2)" and "the workpiece to be polished in the previous step" by the operator input control means (13) before the start of the polishing. "Cutting conditions", "grinding processing conditions (planar portion or corner portion) of the workpiece (W)", and "grinding means" based on the height position detecting signal of the height position detecting means (3) 2) The amount of cutting of the machined surface (P) of the workpiece (W) at the front end, and the portion (the flat portion or the corner portion) of the workpiece to be polished (W) The "transfer speed of the polishing unit (1)" is automatically set by the input.

又,前述第1發明之記載中,其第2發明之多角柱狀構件之研磨裝置,具備:旋轉手段(14A),(14B),係選擇將兩端面被前述把持部(6A),(6B)挾持之被研磨加工物(W)以前述挾持軸(12A),(12B)之軸心為中心設定既定旋轉角度而旋轉成被研磨加工面(W)之加工面(P)朝上之節距旋轉、或設定旋轉速度而旋轉之連續旋轉之任一者後進行旋轉;以及使前述基台(4)升降之升降手段;在研磨加工前將欲研磨加工之被研磨加工物(W)之多角柱形狀之角數與該被研磨加工物(W)之前述稜角部之研磨加工條件即前述旋轉手段(14A),(14B)之節距旋轉或連續旋轉中所選擇之任一者設定於前述控制手段(13)。Further, in the above-described first aspect of the invention, the polishing apparatus for a polygonal columnar member according to the second aspect of the invention includes the rotating means (14A) and (14B), and the both end faces are selected by the gripping portions (6A), (6B). The workpiece to be polished (W) is set to have a predetermined rotation angle around the axis of the holding shafts (12A) and (12B) and is rotated to the upper surface of the machined surface (P) of the surface to be polished (W) Rotating or rotating any one of the continuous rotations of the rotation speed; and lifting and lowering the base (4); and grinding the workpiece (W) to be polished before the polishing process The number of corners of the polygonal column shape and the polishing processing conditions of the edge portion of the workpiece (W), that is, the pitch rotation or continuous rotation of the rotation means (14A), (14B), are selected. The aforementioned control means (13).

前述挾持軸(12A),(12B)之「節距旋轉」係指依各加工 面(P)研磨被研磨加工物(W)之各稜角部及各平面部時選擇設定之研磨形式,且係在研磨加工開始前將旋轉手段(14A),(14B)之挾持軸(12A),(12B)之研磨形式選擇設定於「節距旋轉」,並將被研磨加工物(W)之多角柱形狀之「角數」輸入至控制手段(13),藉此運算處理前述旋轉手段(14A),(14B)之旋轉角度,以在每次一加工面(P)之研磨結束時被研磨加工物(W)之次一加工面(P)朝上之方式使旋轉手段(14A),(14B)之挾持軸(12A),(12B)旋轉並停止之研磨形式,其係在研磨加工該被研磨加工物(W)之形狀為如多結晶所構成之矽塊般、多數個平面部與該兩平面部交會之稜角部之截面形狀為角形之多角柱狀構件之情形下所設定者。The "pitch rotation" of the aforementioned holding shafts (12A) and (12B) refers to each processing. When the surface (P) is polished to each of the corner portions and the flat portions of the workpiece (W), the polishing pattern is selected, and the rotation means (14A) and (14B) are held before the start of the polishing process (12A). The polishing pattern of (12B) is selected to be set to "pitch rotation", and the "number of corners" of the polygonal column shape of the workpiece (W) is input to the control means (13), whereby the rotation means is arithmetically processed ( 14A), the rotation angle of (14B) is such that the rotating means (14A) is made upward by the next processing surface (P) of the workpiece (W) at the end of the grinding of one processing surface (P), (14B) A grinding type in which the shaft (12A) and (12B) are rotated and stopped, and the shape of the workpiece (W) to be polished is a block composed of polycrystals, and a plurality of flat portions are formed. The case where the cross-sectional shape of the edge portion where the two flat portions meet is an angular polygonal columnar member.

又,前述挾持軸(12A),(12B)之「連續旋轉」,其係在被研磨加工物(W)之形狀為如單結晶所構成之矽塊般、為多面構成之平面部與該兩平面部交會之稜角部之截面形狀為圓弧狀而研磨加工該稜角部之情形下所選擇設定之研磨形式,在研磨加工開始前將旋轉手段(14A),(14B)之挾持軸(12A),(12B)之旋轉形式選擇設定於「連續旋轉」,並將其「旋轉速度」輸入至控制手段(13),藉此被研磨加工物(W)以挾持軸(12A),(12B)之軸心為中心連續旋轉而同時研磨加工該各稜角部。此外,該被研磨加工物(W)之各平面部之研磨加工係藉由前述研磨形式之「節距旋轉」進行。Further, the "continuous rotation" of the holding shafts (12A) and (12B) is a flat portion composed of a single crystal in the shape of a workpiece (W), and is a multi-faceted flat portion and the two The cross-sectional shape of the edge portion of the intersection of the flat portion is an arc shape, and the polishing pattern selected in the case where the corner portion is polished is processed, and the rotation means (14A) and (14B) are held before the start of the polishing process (12A) The rotation type of (12B) is set to "continuous rotation", and the "rotation speed" is input to the control means (13), whereby the workpiece (W) is held by the workpiece (12A), (12B) The shaft center continuously rotates while grinding the respective corner portions. Further, the polishing process of each of the flat portions of the workpiece (W) is performed by "pitch rotation" of the polishing method.

又,分別將第1或第2發明中包含下述者作為第3及第4發明,亦即研磨手段(2)係含有磨粒之毛材,該毛材係於該研磨手段底部環狀植設有複數根之研磨刷。Further, the first or second invention includes the following three or fourth inventions, that is, the polishing means (2) is a wool material containing abrasive grains which are ring-shaped at the bottom of the polishing means. A grinding brush with multiple roots.

又,分別將第1或第2發明中包含下述者作為第5及 第6發明,亦即研磨手段(2)係將含有磨粒之複數根毛材綑成之研磨具(10)基部複數根植設於旋轉板之研磨刷。In addition, the first or second invention includes the following as the fifth and According to a sixth aspect of the invention, the polishing means (2) is a polishing brush in which a plurality of bases of the polishing tool (10) in which a plurality of abrasive materials including abrasive grains are bundled and placed on a rotating plate.

又,分別將第1或第2發明中包含下述者作為第7及第8發明,亦即研磨手段(2)係將含有磨粒且彼此纏繞之纖維狀彈性體複數根植設於該研磨手段底部之研磨刷。In addition, the first or second invention includes the following seventh and eighth inventions, that is, the polishing means (2) is a plurality of fibrous elastic bodies containing abrasive grains and entangled with each other. Abrasive brush at the bottom.

又,將第3至第8發明中任一者中包含下述者作為第9發明,亦即將複數台研磨手段(2)連接成各研磨手段(2)之下端大致成水平、亦即配置成各研磨手段(2)之下端相對加工面成為大致平行。Further, the third to eighth inventions include the following as the ninth invention, that is, the plurality of polishing means (2) are connected so that the lower ends of the respective polishing means (2) are substantially horizontal, that is, arranged The lower end of each polishing means (2) is substantially parallel to the machined surface.

又,將第3至第8發明中任一者中包含下述者作為第10發明,亦即將研磨手段(2)配置於前述多角柱狀構件之至少2個以上之不同面。Further, any one of the third to eighth inventions is the tenth invention, that is, the polishing means (2) is disposed on at least two different surfaces of the polygonal columnar member.

又,將第3至第8發明中任一者中包含下述者作為第11發明,亦即將複數台研磨手段(2)於前述多角柱狀構件之至少2個以上之不同面分別配置成各研磨手段(2)之下端大致成水平、亦即配置成各研磨手段(2)之下端相對加工面成為大致平行。Further, in any one of the third to eighth inventions, as the eleventh invention, the plurality of polishing means (2) are disposed on each of at least two different surfaces of the polygonal columnar member. The lower end of the polishing means (2) is substantially horizontal, that is, the lower end of each polishing means (2) is substantially parallel with respect to the machined surface.

又,分別將第9或第11發明中包含下述者作為12及第13發明,亦即混合於毛材之磨粒粒度為F180~#2000(JIS R6001:1998),選擇兩種類以上其粒度不同之研磨手段(2),並將該研磨手段(2)連設成從粒度「粗」至「細」之順序進行研磨加工。Further, the ninth or eleventh invention includes the following 12 and the thirteenth invention, that is, the abrasive grain size of the mixed material of the wool material is F180 to #2000 (JIS R6001:1998), and the particle size of two or more types is selected. Different polishing means (2) are used, and the polishing means (2) are connected to be polished in the order of "thickness" to "fine".

又,分別將第9或第11發明中包含下述者作為14及第15發明,亦即混合於毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段,並連接該研磨手段。Further, the ninth or eleventh invention includes the following 14 and the 15th invention, that is, the abrasive grain size of the wool material is F180 to #2000, and the polishing means having substantially the same particle size is selected and connected thereto. Grinding means.

又,分別將前述第1、2、3、4、5、6、7、8、10、12、13、14、15中之任一發明中包含下述者作為16、17、18、19、20、21發明,亦即於基台(4)載置被研磨加工物(W)之承接構件(7),形成有在研磨前述被研磨加工物(W)之任一稜角部時為能將該一稜角部載置成水平朝上而其下側之平面部所接觸之缺口V(8)、以及於該缺口V(8)形成有在研磨前述被研磨加工物(W)之各平面部之任一平面部時為能將該一平面部載置成水平朝上而其下側之稜角部(9)能卡止之缺口L。Further, each of the first, second, third, fourth, fifth, sixth, seventh, eighth, tenth, thirteenth, thirteenth, fourteenth, and eightteenth aspects includes the following as 16, 17, 18, 19, In the 20th and 21st inventions, the receiving member (7) on which the workpiece (W) to be polished is placed on the base (4) is formed to be capable of polishing any of the corner portions of the workpiece (W). The one corner portion is placed horizontally upward, and the notch V (8) which is in contact with the flat portion on the lower side thereof, and the flat portion V (8) is formed on each of the flat portions on which the workpiece (W) is polished. In any of the flat portions, the one flat portion can be placed in a horizontal direction upward, and the notch L at which the lower corner portion (9) can be locked.

又,第22及第23發明為一種多角柱狀構件,係藉由前述第1至第8或第16發明中之任一發明之多角柱狀之研磨裝置,除去從被加工物表層起100μm以下存在之微裂痕,且研磨加工面之表面粗度Ry(JIS B0601:1994)設為3μm以下。In addition, in the polygonal columnar member of the invention according to any one of the first to eighth or sixteenth aspects of the present invention, the second and the thirteenth aspect of the present invention is characterized in that the surface of the workpiece is removed by 100 μm or less. The micro-cracks are present, and the surface roughness Ry (JIS B0601:1994) of the polished surface is set to 3 μm or less.

又,分別將第22或第23發明中包含下述者作為24及第25發明,亦即多角柱狀構件係矽塊或陶瓷。Further, each of the 22nd and 23rd inventions includes the following as the 24th and 25th inventions, that is, the polygonal columnar member is a block or a ceramic.

又,第26發明之多角柱狀構件之研磨方法,係於前述第1發明之多角柱狀構件之研磨裝置,在對載置於基台(4)之被研磨加工物(W)之複數個加工面中(P)各加工面(P)之研磨結束之時點,前述挾持手段(5)之挾持軸(12A),(12B)後退而解除把持部(6A),(6B)之挾持狀態之前述被研磨加工物(W),由作業人員手動反轉成其次一加工面(P)水平朝上後,使前述挾持手段(5)之挾持軸(12A),(12B)前進而使一把持部(6A)到達被研磨加工物(W)之基準端面位置並停止,使另一挾持軸(12B)進一步前進而使該把持部(12B)按壓挾持被研 磨加工物(W)之另一端面,藉以對依前述設定之次一加工面(P)進行研磨加工,研磨加工所有加工面(P)之程序,係以在結束各稜角部之研磨後對各平面部研磨加工之方式進行。Further, in the polishing apparatus for a polygonal columnar member according to the twenty-sixth aspect of the invention, the polishing apparatus for the polygonal columnar member according to the first aspect of the invention is a plurality of the workpieces (W) to be placed on the base (4). At the time when the polishing of each of the processing surfaces (P) in the processing surface is completed, the holding axes (12A) and (12B) of the holding means (5) are retracted to release the holding state of the gripping portions (6A) and (6B). The workpiece (W) to be polished is manually inverted by the operator so that the next processing surface (P) is horizontally upward, and the holding shaft (12A) and (12B) of the holding means (5) are advanced to each other. The portion (6A) reaches the reference end surface position of the workpiece (W) and stops, and the other grip shaft (12B) is further advanced to press the grip portion (12B). The other end surface of the workpiece (W) is subjected to grinding processing on the next processing surface (P) set as described above, and the processing of all the processing surfaces (P) is performed after finishing the grinding of the respective corner portions. Each flat portion is polished and processed.

又,第27發明之多角柱狀構件之研磨方法,係於前述第2發明之多角柱狀構件之研磨裝置中,藉由節距研磨或連續研磨之任一方法結束所有稜角部之研磨加工後,使設定有既定旋轉角度之前述旋轉手段(14A),(14B)旋轉而對每一平面部研磨加工,藉以進行所有平面部之研磨加工,該節距研磨係在以挾持手段(5)之把持部(6A),(6B)挾持載置於基台(4)之被研磨加工物(W)兩端面之狀態下使前述基台(4)下降而從被研磨加工物(W)離開,係使設定有既定旋轉角度之前述旋轉手段(14A),(14B)旋轉而對每一稜角部以研磨面(P)定位成朝上之方式進行研磨,藉此進行被研磨加工物(W)之各稜角部之研磨,該連續研磨係使設定有旋轉速度之前述旋轉手段(14A),(14B)連續旋轉而同時研磨各稜角部。Further, in the polishing apparatus for a polygonal columnar member according to the twenty-seventh aspect of the invention, in the polishing apparatus for the polygonal columnar member according to the second aspect of the invention, after the grinding of all the corner portions is completed by any one of pitch polishing or continuous polishing The rotation means (14A) and (14B), which are set to have a predetermined rotation angle, are rotated and polished for each plane portion, whereby all the flat portions are polished, and the pitch polishing is performed by the holding means (5). The gripping portions (6A) and (6B) are placed on both end faces of the workpiece (W) of the base (4), and the base (4) is lowered to be separated from the workpiece (W). The rotating means (14A) and (14B) which are set to have a predetermined rotation angle are rotated, and each of the corner portions is ground so that the polishing surface (P) is positioned upward, thereby polishing the workpiece (W). In the polishing of each of the corner portions, the continuous polishing system continuously rotates the rotation means (14A) and (14B) set with the rotation speed while polishing the respective corner portions.

又,第28及第29發明之多角柱狀構件之研磨方法,係於前述第9或第11發明之多角柱狀構件之研磨裝置,混合於毛材之磨粒粒度為F180~#2000,選擇兩種類以上其粒度不同之研磨手段(2),並將該研磨手段(2)連設成依其粒度「粗」至「細」之順序研磨加工。Further, in the polishing apparatus for a polygonal columnar member according to the ninth or eleventh aspect of the invention, the polishing apparatus of the polygonal columnar member according to the ninth or eleventh aspect of the invention is characterized in that the abrasive grain size of the wool material is F180 to #2000, and is selected. Two or more kinds of polishing means (2) having different particle sizes, and the polishing means (2) are connected to be polished in the order of "thickness" to "fineness".

又,第30及第31發明之多角柱狀構件之研磨方法,係於前述第9或第11發明之多角柱狀構件之研磨裝置,混合於前述毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段(2),並連接該研磨手段來進行研磨。Further, in the polishing apparatus for a polygonal columnar member according to the ninth or eleventh aspect of the present invention, the polishing apparatus of the above-described ninth or eleventh aspect of the present invention has a grinding grain size of F180 to #2000. The polishing means (2) having substantially the same particle size are selected, and the polishing means is connected to perform the polishing.

根據前述第1發明,a)在研磨開始前將「研磨加工完成 品之標準片(母工件)」載置於基台(4)上並設定開始研磨手段2之前端之研磨加工之高度位置後,b)卸除前述基台(4)之研磨加工完成品之標準片,將被研磨加工物(W)載置成其加工面(P)朝上,According to the first invention described above, a) "grinding is completed before the start of the grinding" The standard piece (female workpiece) of the product is placed on the base (4) and the height position of the grinding process at the front end of the polishing means 2 is set, and b) the finished product of the abutment (4) is removed. The standard piece is placed such that the workpiece (W) is placed with its processed surface (P) facing up.

c)在將「研磨手段(2)之磨材之粒度」、「被研磨加工物(W)在前步驟之切斷條件」、「被研磨加工物(W)之研磨加工部位(平面部或稜角部)」之研磨加工條件輸入於控制手段(13)後,開始研磨,由挾持手段(5)之把持部(6A),(6B)挾持被研磨加工物(W)之兩端面並固定於基台(4)上,例如即使在被研磨加工物(W)之前步驟中於切斷後之外形尺寸產生誤差而有不均時,亦可藉由前述高度位置檢測手段(3)之高度位置檢測訊號運算處理研磨手段(2)之前端對「被研磨加工物(W)之加工面(P)之切入量」,而在研磨加工前自動設定以能進行最佳之研磨加工。在該研磨加工結束後,由於即自動解除挾持該被研磨加工物(W)兩端面之前述挾持手段(5)之把持部(6A),(6B),因此可藉由作業人員手動將載置於基台(4)之被研磨加工物(W)反轉成次一加工面(P)朝上後,使挾持手段(5)之把持部(6A),(6B)作動以挾持固定被研磨加工物(W)之兩端面,而進行次一加工面(P)之研磨加工。c) the "grain size of the abrasive material of the polishing means (2)", the "cutting condition of the workpiece (W) in the previous step", and the "machined portion of the workpiece (W) (planar portion or After the grinding processing conditions of the edge portion are input to the control means (13), the polishing is started, and the gripping portions (6A) and (6B) of the holding means (5) hold both end faces of the workpiece (W) and are fixed thereto. In the base (4), for example, even if there is an error in the dimensional dimension after the cutting in the step before the workpiece (W), the height position detection by the height position detecting means (3) can be detected. The signal calculation processing means (2) the "cut amount of the processed surface (P) of the workpiece (W) before the polishing means (2), and is automatically set before the polishing processing to perform the optimum polishing processing. After the completion of the polishing process, the gripping portions (6A) and (6B) of the holding means (5) on both end faces of the workpiece (W) are automatically released, so that the worker can manually mount the gripping portions (6A) and (6B). After the workpiece (W) on the base (4) is reversed so that the second processed surface (P) faces upward, the gripping portions (6A) and (6B) of the holding means (5) are actuated to be fixed by the holding and being ground. The both ends of the workpiece (W) are subjected to a grinding process of the next processed surface (P).

前述一連串研磨步驟中之被研磨加工物(W)之加工面(P)之設定雖由作業人員手動進行,但研磨手段(2)之前端對被研磨加工物(W)之切入量、或以既定旋轉速度接觸旋轉於被研磨加工物(W)之加工面(P)而研磨加工之作動,由於係自動控制,因此能進行最佳之研磨加工,謀求生產性之提升。The setting of the processed surface (P) of the workpiece (W) in the series of polishing steps is manually performed by an operator, but the cutting amount of the workpiece (W) before the polishing means (2) is cut or Since the predetermined rotational speed is in contact with the machined surface (P) of the workpiece (W) and the grinding process is performed, the automatic control is performed, so that the optimum polishing process can be performed and the productivity can be improved.

根據第2發明,係在前述被研磨加工物(W)被挾持手段 (5)之把持部(6A),(6B)挾持之狀態下使基台(4)下降並從被研磨加工物(W)離開後,藉由前述旋轉手段(14A),(14B)使該被研磨加工物(W)以挾持軸(12A),(12B)為中心節距旋轉既定角度,設定成次一研磨之加工面(P)水平朝上。在該時點,係成為前述基台(4)上升而再次載置固定被研磨加工物(W)之狀態,而能一邊使研磨手段(2)之接觸旋轉一邊將之移送,藉以進行研磨加工。According to the second aspect of the invention, the workpiece (W) is held by the means for holding (5) After the gripping portions (6A) and (6B) are held down, the base (4) is lowered and separated from the workpiece (W), and then the rotating means (14A), (14B) are used to The workpiece (W) is rotated at a predetermined angle with the center axis of the holding shaft (12A) and (12B), and the processing surface (P) of the second grinding is set horizontally upward. At this time, the base (4) is raised and the workpiece (W) is placed and fixed again, and the polishing means (2) can be transferred while being rotated, thereby performing polishing processing.

前述一連串之研磨加工,不需由作業人員手動作業,係能以全自動依各加工面(P)依序進行被研磨加工物(W)之各稜角部與各平面部之研磨加工。In the above-described series of polishing processes, it is possible to perform the grinding process of each of the angular portions and the flat portions of the workpiece (W) in a sequence of automatic processing on each of the machined surfaces (P) without manual operation by the operator.

又,當被研磨加工物(W)即素材為單結晶所構成之矽塊之各稜角部之研磨加工,係如前所述使該加工面(P)朝上停止並依各面研磨之方法時,由於有時會有因稜角部與平面部之接合部位之截面形狀使研磨手段(2)前端之接觸不充分而未除去存在於該接合部位之微裂痕或表面粗度未成微細狀態,因此若係使前述旋轉手段(14A),(14B)連續旋轉而使被研磨加工物(W)即矽塊旋轉於柱軸中心進行研磨加工之方法,研磨手段(2)之前端即可充分接觸按壓於前述稜角部之圓弧面(R面)及該稜角部與平面部之接合部位,而能均一地研磨,進而可容易地除去存在於前述接合部位之微裂痕並使其表面粗度微細化。Further, when the workpiece (W), that is, the polishing process of each of the corner portions of the block formed of the single crystal, the processed surface (P) is stopped upward and polished according to each surface. In this case, the cross-sectional shape of the joint portion between the corner portion and the flat portion may cause insufficient contact between the tips of the polishing means (2), and the micro-cracks or the surface roughness existing in the joint portion may not be removed, so that the surface roughness is not fine. When the rotating means (14A) and (14B) are continuously rotated to rotate the workpiece (W), that is, the block is rotated at the center of the column axis, the front end of the polishing means (2) can be sufficiently contacted and pressed. The arc surface (R surface) of the edge portion and the joint portion between the corner portion and the flat portion can be uniformly polished, and the micro cracks existing in the joint portion can be easily removed and the surface roughness can be made fine. .

又,如前所述使被研磨加工物(W)連續旋轉並同時研磨加工各稜角部時,由於係以挾持手段(5)之挾持軸(12A),(12B)之軸心為中心旋轉,為了可均一地研磨各稜角部,從該被研磨加工物(W)之端面側觀看之挾持軸(12A),(12B)前 端之把持部(6A),(6B)之挾持位置,係需進行對芯調整。Further, when the workpiece (W) is continuously rotated and the respective corner portions are polished at the same time as described above, the shaft (12A) and the center of the shaft (12B) are rotated about the center of the holding means (5). In order to uniformly grind each of the corner portions, the holding shaft (12A), (12B) is viewed from the end surface side of the workpiece (W). The holding position of the grips (6A) and (6B) of the end is required to adjust the core.

關於將被研磨加工物(W)以其一稜角部朝上之方式載置於基台(4),使前述挾持手段(5)之挾持軸(12A),(12B)分別前進而把持部(6A),(6B)挾持被研磨加工物(W)兩端面時、從被研磨加工物(W)端面側觀看之挾持位置,其水平方向雖藉由設於基台(4)之承接構件(7)之缺口V(8)進行對芯調整,但在其上下方向,當前步驟中切斷矽晶棒而形成之被研磨加工物(W)即矽塊之外形尺寸產生誤差時,由於會產生相當於該誤差量之1/2之量之偏移,因此需進行對芯調整。The workpiece (W) is placed on the base (4) with its angular portion facing upward, and the holding shafts (12A) and (12B) of the holding means (5) are respectively advanced to the gripping portion ( 6A), (6B) the holding position viewed from the end face side of the workpiece (W) when the both ends of the workpiece (W) are held, and the horizontal direction is supported by the receiving member provided on the base (4) 7) The notch V(8) is adjusted to the core, but in the up-and-down direction, when the workpiece (W) formed by cutting the twin rod in the current step is an error in the shape outside the block, it is generated. It is equivalent to the offset of the amount of 1/2 of the error amount, so the core adjustment is required.

前述於上下方向進行對芯調整之方法,係在使前述高度位置檢測手段(3)作動而測定朝上載置於基台(4)之被研磨加工物(W)之稜角部之高度(H1)後,使前述基台(4)下降而從被研磨加工物(W)離開,使旋轉手段(14A),(14B)旋轉180度並使前述成為向下之被研磨加工物(W)之稜角部朝上以測定其高度(H2),將其測定結果儲存於控制手段(13),將相當於其差分之1/2(=(H1-H2)/2)之高度作為上下方向之對芯調整量進行運算處理。The method of adjusting the core in the vertical direction is performed by moving the height position detecting means (3) to measure the height (H1) of the edge portion of the workpiece (W) placed on the base (4). Thereafter, the base (4) is lowered to be separated from the workpiece (W), and the rotation means (14A) and (14B) are rotated by 180 degrees to make the edge of the workpiece (W) downward. The height is measured (H2), and the measurement result is stored in the control means (13), and the height corresponding to 1/2 (= (H1 - H2)/2) of the difference is used as the core of the up and down direction. The adjustment amount is processed.

其次,使基台(4)上升使被研磨加工物(W)之下面支撐於設在承接構件(7)之缺口V(8),並使前述挾持手段(5)之挾持軸(12A),(12B)後退而將前端之把持部(6A),(6B)所挾持之被研磨加工物(W)兩端面開放後,使前述基台(4)移動相當於經前述運算處理之上下方向之對芯調整量之量,使前述挾持手段(4)之挾持軸(12A),(12B)前進以使前端之把持部(6A),(6B)挾持被研磨加工物(W)之兩端面,即完成上下方向之對芯調整。Next, the base (4) is raised so that the lower surface of the workpiece (W) is supported by the notch V (8) provided in the receiving member (7), and the holding shaft (12A) of the holding means (5) is (12B), after the both ends of the workpiece (W) held by the grip portions (6A) and (6B) held by the distal end are retracted, the movement of the base station (4) is equivalent to the upper and lower directions of the arithmetic processing. The amount of the core adjustment amount is such that the holding shafts (12A) and (12B) of the holding means (4) are advanced so that the grip portions (6A) and (6B) of the front end hold the both ends of the workpiece (W). That is, the core adjustment in the up and down direction is completed.

根據第3及第4發明,由於與例如研磨石等之研磨方法相較,毛材具有柔軟性,因此能抑制因研磨而於被研磨加工物產生之損傷。毛材由於含有磨粒,因此研磨力能充分地確保。According to the third and fourth inventions, since the wool material has flexibility as compared with the polishing method such as grinding stone, it is possible to suppress damage to the workpiece to be polished by polishing. Since the wool material contains abrasive grains, the grinding force can be sufficiently ensured.

根據第5及第6發明,藉由任意設定植設有研磨具(10)之旋轉板之位置(上下方向),即能調整從研磨手段(2)底部露出之毛材之長度。亦即,藉由配合毛材之磨耗使旋轉板之位置往下方移動,而能將常時露出之毛材之長度保持於一定。According to the fifth and sixth inventions, the length of the hair material exposed from the bottom of the polishing means (2) can be adjusted by arbitrarily setting the position (up-and-down direction) of the rotating plate on which the polishing tool (10) is implanted. In other words, by keeping the position of the rotating plate downward in accordance with the abrasion of the wool material, the length of the raw material exposed at a constant time can be kept constant.

根據第7及第8發明,由於藉由使含有磨粒且彼此纏繞之彈性體彼此纏繞,於此等集合體內部即包含有空氣,當以植設有此等之研磨刷加工被加工物時,所包含之空氣層係發揮緩衝材之功能。因此,能減低被研磨加工物(W)因與該研磨刷接觸而造成之損傷。According to the seventh and eighth inventions, since the elastic bodies containing the abrasive grains and entangled with each other are entangled with each other, the inside of the aggregates contains air, and when the workpiece is processed by the abrasive brush having the plants, The air layer contained therein functions as a cushioning material. Therefore, the damage of the workpiece (W) due to contact with the polishing brush can be reduced.

根據第9發明,可視被研磨加工物(W)之種類或目的適當地選擇研磨手段(2)進行加工。According to the ninth invention, the polishing means (2) can be appropriately selected and processed depending on the type or purpose of the workpiece (W) to be polished.

根據第10發明,藉由將研磨手段(2)設置於被研磨加工物(W)之至少2個以上之不同面,而能同時進行兩面以上之加工。According to the tenth aspect of the invention, by providing the polishing means (2) on at least two or more different surfaces of the workpiece (W) to be processed, it is possible to simultaneously perform processing of two or more surfaces.

根據第11發明,可藉由依照被研磨加工物(W)之種類或目的,適當選擇設置於被研磨加工物(W)之至少兩個以上不同面之各研磨手段(2)來進行加工。According to the eleventh aspect of the invention, the polishing means (2) provided on at least two different surfaces of the workpiece (W) can be appropriately selected in accordance with the type or purpose of the workpiece (W) to be processed.

根據第12及第13發明,藉由磨粒之粒度為「粗」之研磨手段(2)提升研磨力而增加研磨量,藉以能容易地除去存在於被研磨加工物(W)表層部之微裂痕,藉由磨粒之粒度 為「細」之研磨手段(2),除去因在前述「粗」之研磨手段(2)之研磨加工而呈粗糙之表面之凹凸,使表面粗度微細化,而能消除在後製程中產生之裂痕或缺損、缺口。According to the twelfth and thirteenth aspects of the invention, the polishing means (2) having a coarse particle size of the abrasive grains is used to increase the polishing force, thereby increasing the amount of polishing, whereby the surface layer portion of the workpiece (W) can be easily removed. Crack, by grain size For the "fine" polishing means (2), the unevenness of the rough surface due to the grinding process of the "thick" polishing means (2) is removed, and the surface roughness is made fine, thereby eliminating the occurrence of the post-process. Cracks or defects, gaps.

根據第14及第15發明,在連接有複數台研磨手段(2)時,藉由使植設於各研磨手段(2)之毛材所包含之磨粒之粒度大致相同,而能縮短被研磨加工物(W)之研磨加工時間。According to the fourteenth and fifteenth aspects of the invention, when the plurality of polishing means (2) are connected, the size of the abrasive grains contained in the wool material implanted in each polishing means (2) is substantially the same, whereby the grinding can be shortened. Grinding time of the workpiece (W).

根據第16至第21發明,設於基台(4)之承接構件(7)之缺口V(8),(8)在研磨被研磨加工物(W)之稜角部之情形下,當將該被研磨加工物(W)之一稜角部載置成水平朝上時能確實地載置固定該被研磨加工物(W)下側之平面部,設於基台(4)之承接構件(7)之缺口L(9),(9)在研磨被研磨加工物(W)之平面部之情形下,當將該被研磨加工物(W)之一平面部載置成水平朝上時能確實地載置固定該被研磨加工物(W)下側之稜角部。According to the sixteenth to twenty-firstth invention, in the case where the notch V (8) and (8) of the receiving member (7) of the base (4) are polished, the edge portion of the workpiece (W) is polished. When the edge portion of the workpiece (W) is placed horizontally upward, the flat portion on the lower side of the workpiece (W) can be surely placed and placed on the base (4). In the case of grinding the flat portion of the workpiece (W), the notch L (9) and (9) can be surely placed when the flat portion of the workpiece (W) is placed horizontally upward. The corner portion on the lower side of the workpiece (W) is placed and fixed.

根據第22及第23發明,藉由使用第1至第8及第16發明中之任一者之研磨裝置,而能製得可除去自表層起之100μm之微裂痕,且表面粗度Ry為3μm以下之多角柱狀構件。According to the 22nd and 23rd invention, by using the polishing apparatus according to any one of the first to eighth and sixteenth aspects, microcracks of 100 μm from the surface layer can be obtained, and the surface roughness Ry is Multi-angle columnar member of 3 μm or less.

根據第24及第25發明,藉由使用第1至第8及第16發明中之任一者之研磨裝置,而製得之可除去自表層起之100μm之微裂痕,且表面粗度Ry為3μm以下之多角柱狀構件,係可非常合適地使用矽塊或陶瓷之類之硬脆材料。According to the twenty-fourth and twenty-fifthth inventions, the micro-cracks of 100 μm from the surface layer are obtained by using the polishing apparatus according to any one of the first to eighth and sixteenth inventions, and the surface roughness Ry is A polygonal columnar member of 3 μm or less is a very hard and brittle material such as a clam block or a ceramic.

根據第26發明,如同前述第1發明之效果亦有記載,被研磨加工物(W)之加工面(P)之設定雖由作業人員手動進行,但研磨手段(2)之切入量或其作動由於係自動控制,因 此即使作業人員交替亦可在不使加工精度與生產性降低之情形下研磨加工,其研磨加工之程序,係以在結束各稜角部之研磨後對各平面部研磨加工之方式進行,藉此能將各稜角部與平面部接合之連接部位研磨成「平滑形狀」,容易地進行存在於表層部之微裂痕與表面凹凸之除去。According to the twenty-sixth aspect of the invention, as described in the first aspect of the invention, the setting of the processed surface (P) of the workpiece (W) is manually performed by the operator, but the cutting amount of the polishing means (2) or the actuation thereof is performed. Due to automatic control, In this case, even if the worker alternates, the machining process can be performed without lowering the machining accuracy and the productivity. The polishing process is performed by polishing the respective flat portions after polishing the respective corner portions. The joint portion where the respective corner portions and the flat portion are joined can be polished into a "smooth shape", and the micro cracks and surface irregularities existing in the surface layer portion can be easily removed.

根據第27發明,係設置在將被研磨加工物(W)挾持於挾持手段(5)之挾持軸前端之把持部(6A),(6B)之狀態下,使該被研磨加工物(W)以前述挾持軸之軸心為中心旋轉之旋轉手段,藉以進行在前述第1發明中透過作業人員進行之被研磨加工物(W)之各加工面(P)之設定,而能省去作業人員之麻煩,藉由前述旋轉手段使被研磨加工物(W)連續旋轉而從上方使研磨手段(2)下降至該被研磨加工物(W)並使研磨具(10)前端一邊接觸旋轉一邊移送,而能將作為前述第5發明之作用效果之各稜角部與平面部接合之連接部位之形狀進一步研磨成「平滑形狀」,能更確實地進行微裂痕或凹凸之除去。According to the twenty-seventh aspect of the invention, the object to be polished (W) is placed in a state in which the workpiece (W) is held by the gripping portion (6A) (6B) at the tip end of the gripping means (5). By the rotation means centering on the axis of the holding shaft, the processing surface (P) of the workpiece (W) to be polished by the worker in the first invention is set, and the worker can be omitted. In the trouble, the workpiece (W) is continuously rotated by the above-described rotating means, and the polishing means (2) is lowered from above to the workpiece (W), and the tip end of the polishing tool (10) is transferred while being rotated. In addition, the shape of the joint portion where the respective corner portions and the flat portion joined together as the effects of the fifth aspect of the invention can be further polished into a "smooth shape", and the microcracks or the unevenness can be removed more reliably.

根據第28及第29發明,藉由將磨粒之粒度不同之「粗」之研磨手段(2)與「細」之研磨手段(2)連設兩種類以上,能以磨粒之粒度為「粗」之研磨手段(2)之高研磨能力確實地除去存在於被研磨加工物(W)表層部之微裂痕,並藉由磨粒之粒度為「細」之研磨手段(2)之微細研磨能力,將因前述研磨加工而呈粗糙之表層部之表面粗度研磨成微細,消除在後製程中產生之缺損、缺口。又,作為研磨手段(2)所採用之研磨刷,能從將含有磨粒之毛材複數根植設於研磨刷底部者、將複數根含有磨粒之毛材綑成之研磨具(10)植設複 數根於研磨刷之旋轉盤(11)者、將含有磨粒且彼此纏繞之纖維狀彈性體於研磨刷底部植設有複數根者中選擇。According to the 28th and 29th inventions, the "grinding" polishing means (2) having different particle sizes of abrasive grains and the "fine" polishing means (2) are connected to two or more types, and the particle size of the abrasive grains can be " The high grinding ability of the coarse grinding means (2) reliably removes the micro-cracks present in the surface layer portion of the workpiece (W) and is finely ground by the grinding means (2) of the "fine" grain size of the abrasive grains. The ability to grind the surface roughness of the rough surface portion due to the above-described grinding process to a fineness, thereby eliminating defects and notches which are generated in the post-process. Further, as the polishing brush used in the polishing means (2), it is possible to implant a plurality of abrasive materials including the abrasive grains on the bottom of the polishing brush and to bundle the plurality of abrasive materials containing the abrasive grains into the polishing tool (10). Set up A plurality of fibrous elastomers containing abrasive grains and entangled with each other are selected from the plurality of roots of the abrasive brush.

又,當將前述研磨具(10)複數根植設於前述旋轉盤(11)時,如後述之圖2之說明所記載,當由混合磨粒之毛材構成之研磨具(10)已消耗時,可使用僅將該研磨具(10)更換成新的研磨具(10)之研磨具(10)拆裝自如於旋轉盤(11)之型式、以及以將研磨具(10)與旋轉盤(11)一起更換之方式將研磨具(10)固定安裝於旋轉盤(11)之型式(未圖示)之任一者。Further, when the polishing tool (10) is implanted in the rotary disk (11) in multiples, as described in the description of Fig. 2 described later, when the polishing tool (10) composed of the mixed abrasive particles is consumed , the grinding tool (10) which only replaces the grinding tool (10) with the new grinding tool (10) can be disassembled and detached from the type of the rotating disk (11), and the grinding tool (10) and the rotating disk ( 11) The polishing tool (10) is fixedly attached to any one of the types (not shown) of the rotary disk (11).

根據第30及第31發明,藉由將磨粒之粒度大致相同之研磨手段(2)連接複數台,而能縮短被研磨加工物(W)之研磨加工時間。又,如前所述,採用於研磨手段(2)之研磨刷,係如後述之圖2之說明所記載,當由混合磨粒之毛材構成之研磨具(10)已消耗時,可係僅將該研磨具(10)交換成新的研磨具(10)之拆裝自如於旋轉盤(11)之型式、以及以連同未圖示旋轉盤一起更換之方式將研磨具固定安裝於旋轉盤之型式之任一者。According to the 30th and 31st inventions, the polishing processing time (W) of the workpiece (W) can be shortened by connecting a plurality of polishing means (2) having substantially the same particle size of the abrasive grains. Further, as described above, the polishing brush used in the polishing means (2) is as described in the description of FIG. 2 described later, and when the polishing tool (10) composed of the mixed abrasive particles is consumed, The abrasive tool (10) is exchanged only for the new abrasive tool (10) to be detachable from the rotary disk (11), and the abrasive device is fixedly mounted to the rotary disk in such a manner as to be replaced together with the rotating disk (not shown). Any of the types.

使用圖說明本發明之具備2連串以上(3連串)研磨粗度不同之研磨手段之多角柱狀構件之研磨裝置之構成內容與詳細。The constitution and details of the polishing apparatus of the polygonal columnar member having two or more series (three series) of polishing means having different polishing thicknesses according to the present invention will be described with reference to the drawings.

圖1係顯示研磨裝置之前視圖,其顯示停止於圖中右端之研磨開始前位置之研磨單元1,以及在載置於基台4上之以兩點鏈線所示之被研磨加工物W之圖中左右,藉由挾持手段5之汽缸驅動而滑動之基準側之挾持軸12A前端之 把持部6A與從動側之挾持軸12B前端之把持部6B分別後退而未挾持被研磨加工物W之開放狀態,在前述研磨單元1,自圖中右側往左側連設有由三種類「粗研磨用」、「中研磨用」、「完工研磨用」之磨粒粒度不同而選擇設定而成之研磨刷所構成之各研磨手段2,於前述「粗研磨用」之研磨手段2之圖中右側,設有用以在研磨開始前檢測被研磨加工物W之加工面P之高度位置之高度位置檢測手段3。1 is a front view showing a polishing apparatus showing a grinding unit 1 stopped at a position before the start of grinding at the right end of the drawing, and a workpiece W which is placed on the base 4 and shown by a two-dot chain line. In the figure, the front end of the shaft 12A of the reference side which is slid by the cylinder driving of the holding means 5 The grip portion 6A and the grip portion 6B at the distal end of the gripping shaft 12B on the driven side are respectively retracted without holding the open state of the workpiece W, and the polishing unit 1 is connected to the left side from the right side of the drawing by three types of "thickness". Each of the polishing means 2 including the polishing brush which is selected and set to have different abrasive grain sizes for "grinding", "intermediate polishing" and "finished polishing" is used in the drawing of the polishing means 2 for "rough polishing" On the right side, there is provided a height position detecting means 3 for detecting the height position of the processed surface P of the workpiece W before the start of the polishing.

前述3連之研磨手段2中之「粗研磨用」,係為了磨除於表層部存在之大部分微裂痕而設置,「中研磨用」係為了除去藉由帶鋸或線鋸切斷時所產生之表面凹凸與為了使因前述「粗研磨」而變粗之表面微細化而設置,「完工研磨用」係為了作表面粗度之最後調整而設置。此外,若在前述「中研磨」之階段結束表面凹凸之除去與表面粗度之微細化調整,即研磨手段2設置兩連亦可。The "grinding" used in the above-mentioned three-way polishing means 2 is provided to remove most of the micro-cracks present in the surface layer portion, and the "inter-grinding" is used to remove the cutting by a band saw or a wire saw. The surface unevenness generated and the surface which is thickened by the "rough grinding" are made fine, and "finished polishing" is provided for the final adjustment of the surface roughness. Further, at the stage of the "intermediate polishing", the removal of the surface unevenness and the fine adjustment of the surface roughness, that is, the polishing means 2 may be provided in two.

如前所述,在決定研磨具10所含有之磨粒粒度不同之研磨手段2與其研磨粗度(粗、中、完工)之組合後,即將該研磨具10之「即使被研磨加工物W之研磨加工部位(稜角部或平面部)不同亦設成相同之旋轉速度」、「因研磨加工部位為稜角部或平面部之差異而為不同之研磨移送速度」、「藉由高度位置檢測手段3測定了研磨加工完成品之標準片(母工件)之研磨開始時之基準高度」、「對被研磨加工物W之加工面P之切入量」之各加工條件設定於控制手段13。As described above, after determining the combination of the polishing means 2 having different abrasive grain sizes contained in the polishing tool 10 and the polishing thickness (roughness, medium, and finishing), the "grinding material W" of the polishing tool 10 is The polishing processing portion (the corner portion or the flat portion) is also set to have the same rotation speed", "the polishing processing speed is different depending on the difference between the edge portion and the plane portion", and "the height position detecting means 3" Each processing condition in which the reference height at the start of polishing of the standard piece (mother workpiece) of the finished product is measured and the "cut amount of the processed surface P of the workpiece W to be polished" is measured is set in the control means 13.

在設定前述加工條件後,只要由作業人員將被研磨加工物W之四稜角部中任一加工面P於前述挾持手段5之把 持部6A,6B間之基台4上載置成水平朝上並將「研磨加工部位(稜角部或平面部)之設定開關」與「研磨開始開關」設定成「ON」,前述研磨單元1即往圖中左端移動,藉由前述挾持手段5之未圖示汽缸之啟動使基準側之挾持軸12A滑動,把持部6A前進至圖中「基準端面位置」而定位被研磨加工物W之一端面後,從動側之挾持軸12B亦滑動使把持部6B前進而接觸緊壓於被研磨加工物W之另一端面,藉以挾持固定前述被研磨加工物W。After setting the above-described processing conditions, the operator may place any one of the four processing corners of the workpiece W on the above-mentioned holding means 5 The base 4 between the holding portions 6A and 6B is placed horizontally upward and the "setting switch for the polishing portion (the corner portion or the flat portion) and the "polishing start switch" are set to "ON", and the polishing unit 1 is placed. Moving to the left end of the figure, the gripping shaft 12A of the reference side is slid by the activation of the cylinder (not shown) of the holding means 5, and the gripping portion 6A is advanced to the "reference end surface position" in the drawing to position one end surface of the workpiece W. Then, the gripping shaft 12B of the driven side also slides to advance the grip portion 6B and comes into contact with the other end surface of the workpiece W, thereby holding and fixing the workpiece W.

其次,研磨單元1往圖中右側移送,高度位置檢測手段3作動而偵測被研磨加工物W之加工面P高度並將其訊號發送至控制手段13作運算處理,在自動設定前述研磨手段2之研磨具10前端對該被研磨加工物W之加工面P之切入量後,將藉由前述「研磨加工部位(稜角部或平面部)之設定開關」而自動設定之前述研磨單元1進一步往圖中右側移送,而使各研磨手段2依「粗研磨」、「中研磨」、「完工研磨」之順序進行研磨加工。Next, the polishing unit 1 is transferred to the right side of the drawing, and the height position detecting means 3 is activated to detect the height of the processing surface P of the workpiece W to be processed and sent to the control means 13 for arithmetic processing, and the grinding means 2 is automatically set. After the cutting edge of the workpiece W of the workpiece W is cut by the tip end of the polishing tool 10, the polishing unit 1 automatically set by the "setting switch of the polishing portion (edge portion or plane portion)" is further moved to the polishing unit 1 In the figure, the right side is transferred, and each polishing means 2 is polished in the order of "rough grinding", "medium grinding", and "finish polishing".

在研磨加工結束後,係有下述兩種之第1發明之半自動類型之研磨裝置與第2發明之全自動類型,該第1發明之半自動類型之研磨裝置,係使挾持被研磨加工物W兩端面之前述挾持手段5之挾持軸12A,12B後退作動而自動解除挾持其前端之把持部6A,6B對被研磨加工物W之挾持狀態,藉由作業人員手動將載置於基台4之前述被研磨加工物W反轉成次一加工面P朝上後,使挾持手段5之挾持軸12A,12B再度前進作動而藉由把持部6A,6B挾持固定被研磨加工物W之兩端面,而自動研磨加工次一加工面P;該 第2發明之全自動類型,係在前述被研磨加工物W被挾持手段5之把持部6A,6B挾持之狀態下以未圖示升降手段使基台4下降並解除被研磨加工物W之載置固定狀態,藉由前述旋轉手段14A,14B使該被研磨加工物W以挾持軸12A,12B為中心旋轉既定角度,設定成次一研磨之加工面P水平朝上,在該時點,基台4上升而再次載置固定被研磨加工物W,而能依序對各稜角部與各平面部之任一者之加工面P之各面進行研磨加工、或藉由旋轉手段14A,14B使之連續旋轉並同時進行該各稜角部之研磨加工後,自動研磨加工各平面部之加工面P之各面。After the completion of the polishing process, there are two types of the above-described semi-automatic type polishing apparatus according to the first aspect of the invention and the fully automatic type of the second invention. The semi-automatic type of polishing apparatus according to the first aspect of the invention is configured to hold the workpiece W The holding shafts 12A, 12B of the holding means 5 of the both end faces are retracted to automatically release the gripping portions 6A, 6B holding the front end thereof against the workpiece W, and are manually placed on the base 4 by the operator. After the workpiece W is reversed so that the second processed surface P faces upward, the holding shafts 12A, 12B of the holding means 5 are moved forward again, and the grip portions 6A, 6B hold the both ends of the workpiece W, And automatically grinding the next processing surface P; In the fully automatic type of the second aspect of the invention, the workpiece W is lowered by the lifting means (not shown) and the workpiece W is removed by the lifting means 6a, 6B held by the holding means 5. In the fixed state, the workpieces W are rotated by a predetermined angle around the gripping shafts 12A, 12B by the rotating means 14A, 14B, and the processing surface P of the next grinding is set horizontally upward, at which point the abutment 4, when the workpiece W is fixed and placed, the surface of the processed surface P of each of the corner portions and each of the flat portions can be sequentially polished or rotated by the rotating means 14A, 14B. After the continuous rotation and simultaneous polishing of the respective corner portions, the respective surfaces of the processed surfaces P of the respective flat portions are automatically polished.

圖2(A)及圖2(B),係顯示作為前述研磨手段2之之研磨刷一例。此研磨刷係採用研磨具10,研磨具10係將混合有磨粒之尼龍等合成樹脂所構成之毛材綑束而構成。該研磨具10之基部拆裝自如地安裝於連結於旋轉驅動源可水平旋轉之旋轉盤11,該研磨具10之下端接觸旋轉於被研磨加工物W之加工面P以進行研磨。研磨具10磨耗後可將該研磨具10從旋轉盤11拆卸,並交換成新的研磨具10。此外,作為研磨手段2,並不限於採用了圖2所示之研磨具10之研磨刷圖2所示者,亦可係將混合有未圖示磨粒之毛材所構成之研磨具10直接安裝並永久固定於旋轉盤11之研磨刷(未圖示)。此情形下,在該研磨具10磨耗後係將研磨具10與旋轉盤11一起更換。2(A) and 2(B) show an example of a polishing brush as the polishing means 2. In the polishing brush, the polishing tool 10 is used, and the polishing tool 10 is configured by binding a hair material composed of a synthetic resin such as nylon mixed with abrasive grains. The base of the polishing tool 10 is detachably attached to a rotary disk 11 that is horizontally rotatable and coupled to a rotary drive source, and the lower end of the polishing tool 10 is in contact with the machined surface P that is rotated by the workpiece W to be polished. After the abrasive article 10 is worn, the abrasive article 10 can be detached from the rotary disk 11 and exchanged into a new abrasive article 10. Further, the polishing means 2 is not limited to the one shown in Fig. 2 in which the polishing tool 10 shown in Fig. 2 is used, and the polishing tool 10 in which the abrasive material of the abrasive grains (not shown) is mixed may be directly used. An abrasive brush (not shown) that is mounted and permanently fixed to the rotary disk 11. In this case, after the grinding tool 10 is worn, the polishing tool 10 is replaced with the rotary disk 11.

圖3係顯示基台4之一部分缺口之立體圖,該基台4可將前述被研磨加工物W之稜角部或平面部之任一面作為加工面載置成水平朝上,圖4係顯示立設於基台4之平板 狀承接構件7之製造過程之說明圖,該承接構件7,形成有在研磨前述被研磨加工物W之任一稜角部時以能將該一稜角部載置成水平朝上之方式載置其下側之平面部之缺口(V)8、且於前述缺口(V)8形成有在研磨前述被研磨加工物W之各平面部之任一平面部時以能將該一平面部載置成水平朝上之方式供其下側之稜角部所卡止之缺口(L)9。此外,前述圖3所示之基台4,雖顯示被研磨加工物W之加工面P即稜角部及平面部之兼用類型,但亦可係稜角部與平面部分開之專用類型。3 is a perspective view showing a part of the notch of the base 4, and the base 4 can mount any one of the edge portions or the flat portions of the workpiece W as a processing surface horizontally upward, and FIG. 4 shows the vertical display. Plate on the base 4 An explanatory view of a manufacturing process of the shape receiving member 7, wherein the receiving member 7 is formed such that when the edge portion of the workpiece W is polished, the edge portion can be placed horizontally upward. The notch (V) 8 of the lower planar portion is formed in the notch (V) 8 so that any one of the planar portions of the polished workpiece W can be placed so that the planar portion can be placed The notch (L) 9 is locked by the corner portion of the lower side in a horizontally upward manner. Further, although the base 4 shown in FIG. 3 described the processed surface P of the workpiece W to be processed, that is, the edge type and the flat portion, it may be of a special type in which the corner portion and the flat portion are opened.

圖5(A)及圖5(B)係顯示被研磨加工物W之形狀為四角柱狀之一例之立體圖,圖5(A)係由角形之原材料切出作為平面部之四面而其稜角部為角形並形成微小之C面,圖5(B)係由圓柱狀之原材料切出作為平面部之四面,且於該稜角部留下原材料之圓柱狀一部分而形成為R面。5(A) and 5(B) are perspective views showing an example in which the shape of the workpiece W is a square column shape, and FIG. 5(A) is an angular portion of the flat portion cut out from the corner material. In Fig. 5(B), the cylindrical material is cut out as a flat surface, and a cylindrical portion of the material is left at the corner portion to form an R surface.

圖6(A)及(B)係顯示將被研磨加工物(W)載置於基台4上時從側面觀看之截面圖,圖6(A)係顯示研磨加工被研磨加工物W之稜角部時將被研磨加工物W於基台4之承接構件7載置成其加工面P朝上之狀態,圖6(B)係顯示研磨加工被研磨加工物W之平面部時將被研磨加工物W於基台4之承接構件7載置成其加工面P朝上之狀態。6(A) and 6(B) are cross-sectional views from the side when the workpiece (W) is placed on the base 4, and Fig. 6(A) shows the corners of the workpiece W being polished. At the time of the part, the workpiece W is placed on the receiving member 7 of the base 4 so that the machined surface P faces upward, and FIG. 6(B) shows that the workpiece is polished when the flat portion of the workpiece W is polished. The material W is placed on the receiving member 7 of the base 4 with its processing surface P facing upward.

以下所敘述之實施例中,被研磨加工物W為四角柱狀之矽塊,使用本發明之研磨裝置研磨加工前述被研磨加工物W之四平面部與四稜角部而除去存在於其表層部之微裂痕與其表面之凹凸以將表面粗度微細化後,評估研磨效果,在藉由線鋸將該矽塊切片加工而形成矽晶圓時,能減 低該矽晶圓之裂痕、缺口等所導致之不良品之發生率。In the embodiment described below, the workpiece W is a square columnar block, and the four planar portions and the quadrangular corner portions of the workpiece W are polished by the polishing apparatus of the present invention to be removed from the surface layer portion. The micro-crack and the unevenness of the surface thereof are used to refine the surface roughness, and the polishing effect is evaluated. When the crucible is sliced by a wire saw to form a tantalum wafer, the thickness can be reduced. The incidence of defective products caused by cracks, gaps, etc. of the wafer.

實施例1Example 1

詳細說明作為前述被研磨加工物W之單結晶矽塊之規格如下,使用帶鋸或線鋸將截面為圓柱形狀所製造之單結晶矽晶棒切斷成500mm之長度(L),於其長度方向將圓柱壁面之四面切斷除去而形成四平面部,且將該兩平面部所交會之稜角部以殘留切斷前之圓柱壁面之一部分圓弧幅度(約25mm)之方式作成R形狀之如圖5(B)所示之四角柱狀,將其大小切斷形成為(□)125mm×125mm、(L)500mm者。The specification of the single crystal crucible as the workpiece W to be polished is as follows. A single crystal twin rod manufactured by cutting a cylindrical shape with a band saw or a wire saw is cut into a length (L) of 500 mm over the length thereof. The direction cuts off the four sides of the cylindrical wall surface to form a four-plane portion, and the edge portion where the two flat portions intersect is formed into an R shape such that a portion of the arc wall surface before the cutting is left (about 25 mm). In the square column shape shown in Fig. 5(B), the size is cut into (?) 125 mm × 125 mm, and (L) 500 mm.

於研磨加工前之前述被研磨加工物W之稜角部及平面部之表層部存在有深度為80~100μm之微裂痕且其表面粗度為(Ry)9~11μm,以線鋸對該矽塊進行切片加工而作成矽晶圓時之裂痕、缺口等導致之不良品發生率為5~6%。A micro-crack having a depth of 80 to 100 μm and a surface roughness of (Ry) 9 to 11 μm are present in the edge portion of the workpiece W and the surface portion of the planar portion before the polishing process, and the wire saw is used for the wire block. The rate of defective products caused by cracks, notches, etc. during slicing is 5 to 6%.

關於在本實施例所用之研磨裝置使用前述第1發明記載之研磨裝置研磨加工作為前述被研磨加工物(W)之矽塊並進行微裂痕及凹凸之除去與表面粗度之微小化後,對該矽塊進行切片加工而形成矽晶圓時之裂痕、缺口等導致之不良品發生率被減低之結果,敘述如下。In the polishing apparatus used in the present embodiment, the polishing apparatus described in the first aspect of the invention is used as the crumb of the workpiece (W), and the microcracks and the unevenness are removed, and the surface roughness is miniaturized. The result of the reduction in the rate of defective products caused by cracks, notches, and the like in the formation of the tantalum wafer by the slicing of the tantalum block is as follows.

下表1係顯示為了選擇設定研磨手段2所採用之研磨刷之磨粒粒度而作成之「與研磨刷之磨粒之粒度對應之被研磨加工物W之表面粗度(Ry)」之關係之參考資料。Table 1 below shows the relationship between the surface roughness (Ry) of the workpiece W to be polished corresponding to the particle size of the abrasive grains of the polishing brush, in order to select the abrasive grain size of the polishing brush used for setting the polishing means 2. Reference materials.

又,下表2係顯示為了設定使研磨手段2之研磨具10前端從被研磨加工物W之加工面P突出之切入量,而作成之「與各研磨刷之磨粒粒度之切入量對應之、切斷矽晶棒而形成矽塊之前步驟中因切斷手段之差異及切斷面之表面完工步驟之有無而不同之被研磨加工物W之切銷量(μm)」之關係之參考資料。Further, in the following Table 2, it is shown that "the amount of cutting of the tip of the polishing tool 10 from the processing surface P of the workpiece W to be polished is set to "the amount of the grain size of each of the polishing brushes." Reference material for the relationship between the cut sales volume (μm) of the workpiece W to be polished, and the difference between the cutting means and the surface finishing step of the cut surface in the step of cutting the twin rod.

作為研磨開始前之準備事項,係如下所示:決定a)[研磨手段2之研磨粗度之選擇設定]後安裝於研磨單元1,執行b)[研磨手段2之各研磨具10之基準高度之設定]並自動輸入設定於控制手段13後,將c)~e)之各加工條件手動輸入設定至控制手段13。The preparations before the start of the polishing are as follows: a) [Selection setting of the polishing thickness of the polishing means 2] is determined, and then attached to the polishing unit 1, and b) [the reference height of each polishing tool 10 of the polishing means 2 is performed. After setting and automatically setting the control means 13, the machining conditions of c) to e) are manually input to the control means 13.

a)[研磨手段2之研磨粗度之選擇設定]:參考上述表1,將研磨刷之磨粒之粒度選定粗研磨用:#240、中研磨用:#500、完工研磨用:#800之三種類而連設作為研磨手段2。a) [Selection setting of polishing thickness of polishing means 2]: Refer to Table 1 above to select the particle size of the abrasive grains of the polishing brush for rough polishing: #240, medium polishing: #500, finishing polishing: #800 The three types are connected as the polishing means 2.

b)[研磨手段2之各研磨具10之基準高度之設定]:將研磨加工完成品之標準片(母工件)載置於基台4,並以高度位置檢測手段3測定該標準片之稜角部及平面部之高度位置,藉此將其測定結果作為研磨手段2之各研磨具10之研磨開始前之基準高度自動設定於控制手段13。b) [Setting of the reference height of each polishing tool 10 of the polishing means 2]: The standard piece (female workpiece) of the finished polishing product is placed on the base 4, and the angular position of the standard piece is measured by the height position detecting means 3. The height position of the portion and the flat portion is used to automatically set the measurement result as the reference height before the start of polishing of each of the polishing tools 10 of the polishing means 2 to the control means 13.

c)[研磨手段2之研磨具10之旋轉速度之設定]:15m/secc) [Setting of the rotational speed of the polishing tool 10 of the polishing means 2]: 15 m/sec

d)[研磨手段2之研磨具10之研磨移送速度之設定]:(稜角部之固定研磨)4mm/sec、(平面部之研磨)20 mm/sec。d) [Setting of polishing transfer speed of the polishing tool 10 of the polishing means 2]: (fixed polishing of the corner portion) 4 mm/sec, (grinding of the flat portion) 20 mm/sec.

e)[研磨手段2之各研磨具10對加工面P之切入量之設定]:參考上述表2,將前述選擇設定之各研磨刷對加工面P之切入量,決定為粗研磨用(#240):0.5mm、中研磨用(#500):0.7mm、完工研磨用(#1100):0.8mm。e) [Setting of the amount of cutting of the processing surface P by each of the polishing tools 10 of the polishing means 2]: With reference to the above Table 2, the amount of cutting of each of the polishing brushes set to the processing surface P is determined to be rough polishing (# 240): 0.5 mm, medium grinding (#500): 0.7 mm, finished grinding (#1100): 0.8 mm.

本發明中,在以同一研磨粗度之研磨手段2研磨稜角部與平面部之研磨加工時有稜角部較平面部容易研磨之傾 向,其原因可知係取決於研磨部位之形狀差異。由上述可知,係將前述設定之稜角部與平面部之c)[研磨手段2之研磨具10之旋轉速度之設定](=15m/sec)設為同一速度,在d)[研磨手段2之研磨具10之研磨移送速度之設定]中,將平面部之研磨移送速度(20mm/sec)設為正而將稜角部之移送速度(40mm/sec)設定為較快速,而設定成能縮短研磨加工時間。In the present invention, when the edge portion and the flat portion are polished by the polishing means 2 having the same polishing thickness, the edge portion is more likely to be polished than the flat portion. The reason for this is that it depends on the difference in shape of the polishing portion. As described above, it is known that c) the above-mentioned angular portion and the flat portion c) [setting of the rotational speed of the polishing tool 10 of the polishing means 2] (= 15 m/sec) are the same speed, and d) [the polishing means 2 In the setting of the polishing transfer speed of the polishing tool 10, the polishing transfer speed (20 mm/sec) of the flat portion is set to be positive, and the transfer speed (40 mm/sec) of the angular portion is set to be fast, and the polishing can be shortened. Processing time.

只要將c)[研磨手段2之研磨具10之旋轉速度之設定]設定得較快,即能增大研磨力而縮短研磨加工時間,又,只要將稜角部與平面部之旋轉速度設定成不同之旋轉速度,即能進行稜角部與平面部之表面粗度調整。When c) [setting of the rotational speed of the polishing tool 10 of the polishing means 2] is set relatively fast, the polishing force can be increased to shorten the polishing processing time, and the rotational speed of the angular portion and the planar portion can be set to be different. The rotation speed allows the surface roughness of the corner portion and the flat portion to be adjusted.

只要將d)[研磨手段2之研磨具10之研磨移送速度之設定]設定得較快,即能縮小研磨力而縮短研磨加工時間。When d) [setting of the polishing transfer speed of the polishing tool 10 of the polishing means 2] is set to be fast, the polishing force can be reduced and the polishing processing time can be shortened.

如前所述結束準備事項之設定,將被研磨加工物W之稜角部之任一面於挾持手段5之把持部6A,6B間之基台4上載置成水平朝上後,即將控制手段13之研磨開始開關切成「ON」而開始研磨加工,伴隨著夾持手段5之挾持軸12A,12B之前進與後退,把持部6A,6B進行將被研磨加工物W之兩端面挾持並解除之作動,在前述被研磨加工物W之所設定之一加工面P之研磨加工結束而解除挾持狀態時,由作業人員將次一加工面P反轉成水平朝上,將四稜角部依各面研磨後將四平面部依各面依序研磨,而完成對三個矽塊之研磨加工。As described above, the setting of the preparation is completed, and any one of the corners of the workpiece W is placed on the base 4 between the gripping portions 6A, 6B of the holding means 5 so as to be horizontally upward, that is, the control means 13 When the polishing start switch is turned "ON", the grinding process is started, and the holding shafts 12A, 12B are moved forward and backward with the gripping means 5, and the gripping portions 6A, 6B perform the action of holding and releasing the both end faces of the workpiece W. When the polishing process of one of the processed surfaces P set by the workpiece W is completed and the gripping state is released, the operator reverses the next processed surface P to face horizontally, and grinds the square corners to each surface. After that, the four flat portions are sequentially polished according to the respective faces, and the grinding process of the three crotch blocks is completed.

其結果,亦包含被研磨加工物W之設置時間在內之一個矽塊之研磨加工所需研磨時間為24分34秒~24分45秒 (平均:24分40秒),一面之研磨量(=深度)為各稜角部108μm~126μm(平均:119μm)、各平面部98μm~110μm(平均:104μm)、微裂痕之最大深度為1.6μm、表面粗度為稜角部Ry0.7~1.0(平均:Ry0.8)、平面部Ry0.8~1.1(平均:Ry0.9),能除去微裂痕及凹凸且使表面粗度微小化,將該三個矽塊均以線鋸進行切片加工並作成矽晶圓後,調查因其裂痕、缺口等導致之不良品之發生率之結果顯示,可將其發生率減低至1.0%。As a result, the grinding time required for the grinding process of a block including the set time of the workpiece W is 24 minutes 34 seconds to 24 minutes 45 seconds. (Average: 24 minutes and 40 seconds), the polishing amount (=depth) on one side is 108 μm to 126 μm (average: 119 μm) for each angular portion, 98 μm to 110 μm (average: 104 μm) for each plane portion, and the maximum depth of micro cracks is 1.6 μm. The surface roughness is an angular portion Ry0.7 to 1.0 (average: Ry0.8) and a flat portion Ry0.8 to 1.1 (average: Ry0.9), which can remove microcracks and irregularities and miniaturize the surface roughness. After the three slabs were sliced by a wire saw and made into a ruthenium wafer, the incidence of defective products due to cracks, gaps, and the like was investigated, and the incidence was reduced to 1.0%.

此外,存在有前述微裂痕之最大深度(1.6μm)之部位,係圖7所示之「稜角部與平面部之接合部位」,存在於其他稜角部或平面部之微裂痕之深度均為0.7~1.0μm。由此可判斷,將各稜角部與各平面部之加工面P依各面研磨之手段,係難以進行如圖7之斜線部所示之「稜角部與平面部之接合部位」之研磨加工。Further, the portion having the maximum depth (1.6 μm) of the microcracks is the "joining portion of the corner portion and the flat portion" shown in Fig. 7, and the depth of the micro cracks existing in the other corner portions or the flat portion is 0.7. ~1.0μm. From this, it can be judged that it is difficult to perform the polishing process of the "joining portion of the edge portion and the flat portion" as shown by the oblique line portion in Fig. 7 by the means for polishing the respective edge portions and the processed surface P of each flat portion.

又,在裂痕之最大深度為2.3μm之範圍中,對切片加工成數十mm之厚度而作成矽晶圓時之裂痕、缺口等所導致不良品之發生率之影響較少,此點亦已查明。可知以往係因微裂痕之深度為「3.0μm以上」而使前述不良品之發生率增大。Further, in the range where the maximum depth of the crack is 2.3 μm, the influence of the occurrence of defective products caused by cracks, notches, etc. when the wafer is processed into a thickness of several tens of mm is small, and this has been Find out. In the related art, the depth of the microcracks was "3.0 μm or more", and the incidence of the defective product was increased.

實施例2Example 2

以下說明被研磨加工物W使用與前述實施例1相同之矽塊,研磨裝置使用前述第2發明之研磨裝置,使旋轉手段14A,14B連續旋轉而使被研磨加工物W一邊以挾持軸12A,12B之軸心為中心旋轉一邊同時進行四稜角部之研磨加工後,使旋轉手段14A,14B旋轉既定角度(本實施例中為 「90度」)而依各面研磨加工四平面部之經過,與矽塊中微裂痕之殘存狀況與表面粗度、以及將該矽塊切片加工而作成矽晶圓時之裂痕、缺口等導致之不良品發生率被減低之結果。In the following, the same processing block as the first embodiment is used for the workpiece W, and the polishing apparatus uses the polishing apparatus according to the second aspect of the invention to continuously rotate the rotating means 14A, 14B so that the workpiece W is held by the shaft 12A. When the axis of 12B is rotated centrally and the grinding process of the four corners is performed simultaneously, the rotation means 14A, 14B are rotated by a predetermined angle (in this embodiment "90 degrees"), depending on the surface of the four planes, and the residual state and surface roughness of the microcracks in the block, and the cracks and gaps when the block is sliced to form a wafer. The incidence of defective products is reduced.

作為研磨開始前之準備事項,係將a)[研磨手段2之研磨粗度之選擇設定]、b)[研磨手段2之各研磨具10之基準高度之設定]、c)[研磨手段2之研磨具10之旋轉速度之設定]、e)[研磨手段2之各研磨具10對加工面P之切入量之設定]與前述實施例1所設定條件同樣地設定後,將d)[研磨手段2之研磨具10之研磨移送速度之設定]:(稜角部之研磨)旋轉研磨之2mm/sec、(平面部之研磨)20 mm/sec與新的f)[旋轉手段14A,14B之旋轉條件之設定]:(稜角部之研磨)連續研磨之105min-1、(平面部之研磨)角度旋轉/90度手動輸入設定至控制手段13。As a preparation item before the start of polishing, a) [selection of the polishing thickness of the polishing means 2], b) [setting of the reference height of each polishing tool 10 of the polishing means 2], c) [grinding means 2] Setting of the rotational speed of the polishing tool 10], e) [setting of the cutting amount of the polishing tool 10 to the processing surface P by the polishing means 2] is set in the same manner as the conditions set in the first embodiment, and then d) Setting of the polishing transfer speed of the polishing tool 10 of 2]: (grinding of the corner portion) 2 mm/sec of the rotational polishing, (grinding of the flat portion) 20 mm/sec and the new f) [Rotation conditions of the rotating means 14A, 14B Setting]: (grinding of the corner portion) 105 min -1 of continuous polishing, (grinding of the flat portion), angular rotation, and 90-degree manual input are set to the control means 13.

如前所述結束準備事項之設定,將被研磨加工物W之稜角部或平面部之任一面於挾持手段5之把持部6A,6B間之基台4上載置成水平朝上後,即將控制手段13之研磨開始開關切成「ON」而開始研磨加工,夾持手段5之挾持軸12A,12B即前進而在把持部6A,6B挾持被研磨加工物W之兩端面之狀態下使前述基台4下降後,旋轉手段14A,14B使前述被研磨加工物W以105min-1之速度連續旋轉而同時進行四稜角部之研磨加工。在稜角部之研磨結束後,前述旋轉手段14A,14B使被研磨加工物W旋轉90度,依各平面部設定成朝上依序研磨加工,而與前述實施例1同樣地研磨加工三個矽塊。As described above, the setting of the preparation is completed, and any one of the edge portion or the flat portion of the workpiece W is placed on the base 4 between the grip portions 6A, 6B of the holding means 5 so as to be horizontally upward, and then the control is started. The polishing start switch of the means 13 is cut "ON" to start the polishing process, and the holding shafts 12A, 12B of the holding means 5 advance, and the bases are held while the grip portions 6A, 6B hold the both end faces of the workpiece W to be polished. After the stage 4 is lowered, the rotating means 14A, 14B continuously rotates the workpiece W at a speed of 105 min-1 and simultaneously grinds the four corner portions. After the polishing of the corner portions is completed, the rotating means 14A, 14B rotates the workpiece W by 90 degrees, and the respective flat portions are set to be sequentially polished upward, and the three workpieces are ground in the same manner as in the first embodiment. Piece.

其結果,亦包含被研磨加工物W之設置時間在內之一個矽塊之研磨加工所需研磨時間為27分46秒~27分57秒(平均:27分51秒),一面之研磨量(=深度)為各稜角部121μm~134μm(平均:127μm)、各平面部102μm~110μm(平均:106μm)、微裂痕之最大深度為0.9μm、表面粗度為稜角部Ry0.5~0.8(平均:Ry0.7)、平面部Ry0.7~1.0(平均:Ry0.9),能除去微裂痕及凹凸且使表面粗度微小化,將該三個矽塊均以線鋸進行切片加工並作成矽晶圓後,調查因其裂痕、缺口等導致之不良品之發生率之結果顯示,可將其發生率減低至1.8%。As a result, the polishing time required for the polishing of one of the blocks including the set time of the workpiece W is 27 minutes 46 seconds to 27 minutes 57 seconds (average: 27 minutes 51 seconds), and the amount of grinding on one side ( = depth) is 121 μm to 134 μm (average: 127 μm) for each angular portion, 102 μm to 110 μm (average: 106 μm) for each plane portion, and the maximum depth of microcracks is 0.9 μm, and the surface roughness is an angular portion Ry 0.5 to 0.8 (average : Ry0.7), plane portion Ry0.7~1.0 (average: Ry0.9), which can remove micro-cracks and irregularities and miniaturize the surface roughness, and slice and process the three blocks together with a wire saw. After 矽 wafers, the incidence of defective products due to cracks, gaps, etc., was investigated and the incidence was reduced to 1.8%.

又,存在於「圖7之斜線部所示之稜角部與平面部之接合部位」之微裂痕之最大深度,相較於在前述實施例1為1.6μm(最大深度),在本實施例能減少至0.8μm。此係藉由以旋轉手段14A,14B使前述被研磨加工物W連續旋轉而同時研磨加工四稜角部,藉以研磨圖7之斜線部所示之處並加以除去。Moreover, the maximum depth of the microcracks existing in the "joining portion between the corner portion and the flat portion shown by the hatched portion in Fig. 7" is 1.6 μm (maximum depth) in the first embodiment, and can be used in this embodiment. Reduced to 0.8μm. In this manner, the workpiece W is continuously rotated by the rotating means 14A, 14B, and the four corner portions are simultaneously polished, whereby the oblique portion shown in Fig. 7 is polished and removed.

除此以外之實施例Other embodiments

亦可不使用研磨具10,將含有磨粒之尼龍等之合成樹脂所構成之毛材植設於研磨手段2底部。前述毛材之植設可為環狀,亦即沿研磨手段2底部之外周且大致平行地植設。Instead of using the polishing tool 10, a hair material composed of a synthetic resin such as nylon containing abrasive grains may be implanted on the bottom of the polishing means 2. The planting of the aforementioned wool material may be annular, that is, implanted along the periphery of the bottom of the grinding means 2 and substantially parallel.

例如在陶瓷等之研磨加工或加工時研磨手段2接觸於呈大致90°之柱狀體之角部之情形等,因研磨具2與被研磨加工物W之接觸產生缺口(chipping)會成為問題之情形下,亦可使含有磨粒之合成樹脂所構成之纖維狀彈性體彼 此纏繞,並將該彈性體植設於研磨手段底部。此情形下,可適當選擇該彈性體彼此纏繞、且可保持接觸於被加工物時不會折斷程度之彈力之合成樹脂種類及磨粒之含有率。For example, in the case of polishing or processing of ceramics or the like, the polishing means 2 is in contact with the corner portion of the columnar body of substantially 90°, and the chipping of the polishing tool 2 and the workpiece W is problematic. In the case of a fibrous elastomer composed of a synthetic resin containing abrasive grains, This winding is carried out and the elastomer is implanted at the bottom of the grinding means. In this case, the type of the synthetic resin and the content of the abrasive grains in which the elastic bodies are entangled with each other and the elastic force is not broken when they are in contact with the workpiece can be appropriately selected.

在不需要「粗」→「細」之多段加工,僅一階段之加工即可取得所要求之表面之情形下(例如被研磨加工物W表面之微裂痕係微小且表面粗度相較於要求值不具有大差異時,即僅以「細」進行加工),植設於彼此連接之2個以上研磨手段2之毛材(或彈性體)所含有之磨粒之粒度,所有研磨手段亦可均大致相同。In the case where multi-stage processing of "rough" to "fine" is not required, only one stage of processing can obtain the desired surface (for example, the micro-cracks on the surface of the workpiece W are small and the surface roughness is higher than the requirements. When the value does not have a large difference, that is, only "fine" processing, the particle size of the abrasive grains contained in the hair material (or elastomer) of the two or more polishing means 2 connected to each other may be used, and all the polishing means may be used. Both are roughly the same.

例如,亦可設置複數個研磨手段2,以能同時加工如上面及相鄰於上面之稜角部之類之不同面。又,該情形下,亦可對為了加工各面而設置之研磨手段2連接複數個研磨手段2。For example, a plurality of grinding means 2 may be provided to simultaneously process different faces such as the upper and adjacent corners. Moreover, in this case, a plurality of polishing means 2 may be connected to the polishing means 2 provided for processing each surface.

如以上所述,本實施例係根據矽塊之研削方法作了說明,但本發明並不限定於矽塊,亦可非常合適地用於例如陶瓷等所有硬脆材料。As described above, the present embodiment has been described based on the grinding method of the block, but the present invention is not limited to the block, and can be suitably used for all hard and brittle materials such as ceramics.

1‧‧‧研磨單元1‧‧‧grinding unit

2‧‧‧研磨手段2‧‧‧ grinding means

3‧‧‧高度位置檢測手段3‧‧‧ Height position detection means

4‧‧‧基台4‧‧‧Abutment

5‧‧‧挾持手段5‧‧‧ Maintaining means

6A‧‧‧把持部(基準位置側)6A‧‧‧ gripping unit (reference position side)

6B‧‧‧把持部(從動側)6B‧‧‧ gripping department (slave side)

7‧‧‧承接構件7‧‧‧Receiving components

8‧‧‧缺口V8‧‧‧Gap V

9‧‧‧缺口L9‧‧‧ gap L

10‧‧‧研磨具10‧‧‧Brazil

11‧‧‧旋轉盤11‧‧‧ rotating disk

12A‧‧‧挾持軸(基準位置側)12A‧‧‧挟 axis (reference position side)

12B‧‧‧挾持軸(從動側)12B‧‧‧ holding shaft (driven side)

13‧‧‧控制手段13‧‧‧Control means

14A‧‧‧旋轉手段(基準位置側)14A‧‧‧Rotation means (reference position side)

14B‧‧‧旋轉手段(從動側)14B‧‧‧Rotating means (driven side)

W‧‧‧被研磨加工物W‧‧‧Abrased workpiece

P‧‧‧加工面P‧‧‧Processing surface

圖1係顯示本發明之研磨裝置整體之前視圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a front elevational view showing the entire polishing apparatus of the present invention.

圖2係顯示將研磨刷採用於本發明之研磨手段之研磨具一例之圖,圖2(A)係從其正面觀看時之一部分缺口截面圖,圖2(B)係仰視圖。Fig. 2 is a view showing an example of a polishing tool in which the polishing brush is used in the polishing method of the present invention, and Fig. 2(A) is a partially cutaway cross-sectional view when viewed from the front, and Fig. 2(B) is a bottom view.

圖3係本發明之基台之一部分缺口立體圖。Figure 3 is a partially broken perspective view of a base of the present invention.

圖4係顯示安裝於前述圖3之基台之承接構件之製造過程之說明圖。Fig. 4 is an explanatory view showing a manufacturing process of a receiving member attached to the base of Fig. 3;

圖5係顯示本發明之形狀為四角柱狀之被研磨加工物之立體圖,圖5(A)係顯示稜角部為微小C面之被研磨加工物,圖5(B)係顯示稜角部為R面之被研磨加工物。Fig. 5 is a perspective view showing a workpiece according to the present invention in the shape of a square column, wherein Fig. 5(A) shows a workpiece having a sharp C-corner portion, and Fig. 5(B) shows an R portion. The surface is ground.

圖6係顯示將圖5(B)所示之稜角部為R面之被研磨加工物載置於本發明之基台之狀態之截面圖,圖6(A)係顯示加工面為稜角部者,圖6(B)係顯示加工面為平面部者。6 is a cross-sectional view showing a state in which the object to be polished having the R-face shown in FIG. 5(B) is placed on the base of the present invention, and FIG. 6(A) shows the case where the processed surface is an angular portion. Fig. 6(B) shows that the machined surface is a flat portion.

圖7係前述圖5(B)所示之稜角部為R面之被研磨加工物之該稜角部與平面部之接合部位之放大圖。Fig. 7 is an enlarged view showing a joint portion between the corner portion and the flat portion of the workpiece to be polished on the R surface as shown in Fig. 5(B).

1...研磨單元1. . . Grinding unit

2...研磨手段2. . . Grinding means

3...高度位置檢測手段3. . . Height position detection

4...基台4. . . Abutment

5...挾持手段5. . . Holding means

6A...把持部(基準位置側)6A. . . Holding part (reference position side)

6B...把持部(從動側)6B. . . Holding part (slave side)

12A...挾持軸(基準位置側)12A. . . Holding axis (reference position side)

12B...挾持軸(從動側)12B. . . Holding shaft (driven side)

13...控制手段13. . . Control means

14A...旋轉手段(基準位置側)14A. . . Rotation means (reference position side)

14B...旋轉手段(從動側)14B. . . Rotating means (driven side)

W...被研磨加工物W. . . Grinded material

Claims (22)

一種多角柱狀構件之研磨裝置,係研磨被研磨加工物之形狀為多角柱狀之各平面部及各稜角部,其具備:基台,能將該被研磨加工物(W)之各平面部中之一平面部或各稜角部中之一稜角部之任一者作為研磨之加工面載置成水平朝上;由挾持軸構成之挾持手段,將在研磨加工前述被研磨加工物時挾持其兩端面、在研磨結束後解除前述挾持狀態之把持部安裝於前端,並前後動;研磨單元,在研磨加工前述被研磨加工物時,係移送一邊使研磨手段之前端接觸旋轉於前述加工面、一邊進行研磨加工之研磨手段;以及高度位置檢測手段,係在研磨加工前檢測出前述被研磨加工物之加工面之高度位置,並將該高度位置檢測訊號儲存於控制手段;前述控制手段藉由前述高度位置檢測訊號運算處理研磨手段之前端之切入量以進行研磨加工。 A polishing apparatus for a polygonal columnar member, wherein each of the planar portions and each of the angular portions in which the shape of the workpiece to be polished is a polygonal column is provided, and the base portion is provided with each of the flat portions of the workpiece (W) to be polished. Any one of the planar portion or one of the angular portions is placed horizontally upward as a polished processing surface; and the holding means constituted by the holding shaft holds the workpiece in the polishing process The grip portions that are released from the gripping state after the completion of the polishing are attached to the tip end and are moved forward and backward. When the polishing unit grinds the workpiece, the front end of the polishing means is rotated in contact with the processing surface. a polishing means for performing a polishing process; and a height position detecting means for detecting a height position of the processed surface of the workpiece to be polished before the polishing process, and storing the height position detection signal in the control means; The height position detecting signal is used to process the cutting amount at the front end of the polishing means to perform the grinding process. 如申請專利範圍第1項之多角柱狀構件之研磨裝置,其具備:旋轉手段,係選擇將兩端面被前述把持部挾持之被研磨加工物以前述挾持軸之軸心為中心設定既定旋轉角度而旋轉成被研磨加工面之加工面朝上之節距旋轉、或設定旋轉速度而旋轉之連續旋轉之任一者後進行旋轉;以及使前述基台升降之升降手段;在研磨加工前將欲研磨加工之被研磨加工物之多角柱 形狀之角數與該被研磨加工物之前述稜角部之研磨加工條件即前述旋轉手段之節距旋轉或連續旋轉中所選擇之任一者設定於前述控制手段。 A polishing apparatus for a polygonal columnar member according to the first aspect of the invention, further comprising: a rotating means for setting a workpiece to be polished by the gripping portion on both end faces to set a predetermined rotation angle around an axis of the grip axis And rotating to a pitch of the processed surface of the surface to be polished upward, or a rotation of the set rotation speed, and rotating, and rotating; and lifting means for raising and lowering the base; Grinding processed polygonal column The number of corners of the shape and the polishing processing condition of the edge portion of the workpiece to be polished, that is, the pitch rotation or the continuous rotation of the rotation means are set to the control means. 如申請專利範圍第1項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒之毛材於該研磨刷底部環狀植設有複數根之構造。 The polishing apparatus for a polygonal columnar member according to the first aspect of the invention, wherein the polishing means is a polishing brush having a structure in which a plurality of roots are planted in a ring shape at the bottom of the polishing brush. . 如申請專利範圍第2項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒之毛材於該研磨刷底部環狀植設有複數根之構造。 A polishing apparatus for a polygonal columnar member according to the second aspect of the invention, wherein the polishing means is a polishing brush having a structure in which a plurality of roots are planted in a ring shape at the bottom of the polishing brush. . 如申請專利範圍第1項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒之複數根毛材綑成之研磨具基部複數根植設於旋轉盤之構造。 A polishing apparatus for a polygonal columnar member according to the first aspect of the invention, wherein the polishing means is an abrasive brush having a plurality of bases of a plurality of abrasive materials including abrasive grains, which are implanted on a rotating disk. structure. 如申請專利範圍第2項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒之複數根毛材綑成之研磨具基部複數根植設於旋轉盤之構造。 A polishing apparatus for a polygonal columnar member according to claim 2, wherein the polishing means is an abrasive brush having a plurality of bases of a plurality of abrasive materials including abrasive grains, which are implanted on a rotating disk. structure. 如申請專利範圍第1項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒且彼此纏繞之纖維狀彈性體複數根植設於該研磨刷底部之構造。 The polishing apparatus of the polygonal columnar member according to the first aspect of the invention, wherein the polishing means is an abrasive brush having a plurality of fibrous elastic bodies containing abrasive grains and entangled with each other at a bottom of the polishing brush. structure. 如申請專利範圍第2項之多角柱狀構件之研磨裝置,其中,前述研磨手段係研磨刷,該研磨刷具有將含有磨粒且彼此纏繞之纖維狀彈性體複數根植設於該研磨刷底部之構造。 The apparatus for polishing a polygonal columnar member according to the second aspect of the invention, wherein the polishing means is an abrasive brush having a plurality of fibrous elastic bodies containing abrasive grains and entangled with each other at a bottom of the polishing brush. structure. 如申請專利範圍第3至8項中任一項之多角柱狀構件之研磨裝置,其中,係將複數台前述研磨手段連接成水平。 A polishing apparatus for a polygonal columnar member according to any one of claims 3 to 8, wherein the plurality of the above-mentioned polishing means are connected horizontally. 如申請專利範圍第3至8項中任一項之多角柱狀構件之研磨裝置,其中,係將前述研磨手段配置於前述多角柱狀構件之至少2個以上之不同面。 The polishing apparatus for a polygonal columnar member according to any one of claims 3 to 8, wherein the polishing means is disposed on at least two or more different surfaces of the polygonal columnar member. 如申請專利範圍第3至8項中任一項之多角柱狀構件之研磨裝置,其中,係將複數台前述研磨手段於前述多角柱狀構件之至少2個以上之不同面分別配置成水平。 The polishing apparatus for a polygonal columnar member according to any one of claims 3 to 8, wherein the plurality of polishing means are disposed horizontally on at least two or more different surfaces of the polygonal columnar member. 如申請專利範圍第9項之多角柱狀構件之研磨裝置,其中,混合於前述毛材之磨粒粒度為F180~#2000(JIS R6001:1998),選擇兩種類以上其粒度不同之研磨手段,並將該研磨手段連設成從粒度「粗」至「細」之順序進行研磨加工。 The polishing apparatus for a polygonal columnar member according to claim 9, wherein the abrasive grain size of the wool material is F180~#2000 (JIS R6001:1998), and two or more types of grinding means having different particle sizes are selected. The polishing means is connected to be polished in the order of "thickness" to "fine". 如申請專利範圍第11項之多角柱狀構件之研磨裝置,其中,混合於前述毛材之磨粒粒度為F180~#2000(JIS R6001:1998),選擇兩種類以上其粒度不同之研磨手段,並將該研磨手段連設成從粒度「粗」至「細」之順序進行研磨加工。 The grinding device for a polygonal columnar member according to claim 11, wherein the abrasive grain size of the wool material is F180~#2000 (JIS R6001:1998), and two or more types of grinding means having different particle sizes are selected. The polishing means is connected to be polished in the order of "thickness" to "fine". 如申請專利範圍第9項之多角柱狀構件之研磨裝置,其中,混合於前述毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段,並連接該研磨手段。 A polishing apparatus for a polygonal columnar member according to claim 9, wherein the abrasive material having a particle size of F180 to #2000 is mixed, and a polishing means having substantially the same particle size is selected, and the polishing means is connected. 如申請專利範圍第11項之多角柱狀構件之研磨裝置,其中,混合於前述毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段,並連接該研磨手段。 A polishing apparatus for a polygonal columnar member according to the eleventh aspect of the invention, wherein the abrasive material having a particle size of F180 to #2000 is mixed, and a polishing means having substantially the same particle size is selected, and the polishing means is connected. 如申請專利範圍第1至8項中任一項之多角柱狀構 件之研磨裝置,其中,於前述基台載置被研磨加工物之承接構件,形成有在研磨前述被研磨加工物之任一稜角部時為能將該一稜角部載置成水平朝上而其下側之平面部所接觸之缺口V、以及於該缺口V形成有在研磨前述被研磨加工物之各平面部之任一平面部時為能將該一平面部載置成朝上而其下側之稜角部能卡止之缺口L。 Polygonal columnar structure as claimed in any one of claims 1 to 8 In the polishing apparatus according to the aspect of the invention, the receiving member for placing the workpiece to be polished on the base is formed such that when the corner portion of the workpiece is polished, the corner portion can be placed horizontally upward The notch V that is in contact with the flat portion on the lower side, and the notch V is formed so that the flat portion can be placed upward when any one of the planar portions of the planar portion of the workpiece is polished. The corner of the lower side can be locked by the notch L. 一種多角柱狀構件之研磨方法,係於前述申請專利範圍第1項之多角柱狀構件之研磨裝置,在對載置於基台之被研磨加工物之複數個加工面中各加工面之研磨結束之時點,前述挾持手段之挾持軸後退而解除把持部之挾持狀態之前述被研磨加工物,由作業人員手動反轉成其次一加工面水平朝上後,使前述挾持手段之挾持軸前進而使一把持部到達被研磨加工物之基準端面位置並停止,使另一挾持軸進一步前進而使該把持部按壓挾持被研磨加工物之另一端面,藉以對依前述設定之次一加工面進行研磨加工,研磨加工所有加工面之程序,係以在結束各稜角部之研磨後對各平面部研磨加工之方式進行。 A polishing method for a polygonal columnar member, which is a polishing apparatus for a polygonal columnar member according to the first aspect of the invention, which grinds each of the plurality of processing faces of the workpiece to be polished placed on the base. At the end of the time, the workpiece to be retracted by the holding means is released, and the workpiece to be polished in the gripping state is released, and the operator manually reverses the second processing surface to the upper side, thereby advancing the holding axis of the holding means. The holding portion reaches the reference end surface position of the workpiece and stops, and the other holding shaft is further advanced to press the holding portion against the other end surface of the workpiece, thereby performing the processing of the next processing surface The polishing process and the process of polishing all the processed surfaces are performed by polishing the respective flat portions after polishing the respective corner portions. 一種多角柱狀構件之研磨方法,係於前述申請專利範圍第2項之多角柱狀構件之研磨裝置中,藉由選擇節距研磨或連續研磨之任一方法結束所有稜角部之研磨加工後,使設定有既定旋轉角度之前述旋轉手段旋轉而對每一平面部研磨加工,藉以進行所有平面部之研磨加工,該節距研磨係在以挾持手段之把持部挾持載置於基台之被研磨加工物兩端面之狀態下使前述基台下降而從被研磨加工物離開,使設定有既定旋轉角度之前述旋轉手段旋轉而對每 一稜角部以研磨面定位成朝上之方式進行研磨,藉此進行被研磨加工物之各稜角部之研磨,該連續研磨係使設定有旋轉速度之前述旋轉手段連續旋轉同時研磨各稜角部。 A method for polishing a polygonal columnar member, which is a polishing apparatus for a polygonal columnar member according to the second aspect of the present application, after finishing the grinding process of all the corner portions by any one of selecting a pitch grinding or a continuous grinding The above-described rotating means having a predetermined rotation angle is rotated to polish each of the flat portions, thereby performing polishing processing of all the flat portions, and the pitch polishing is carried by the holding portion held by the holding means on the base. When the both ends of the workpiece are in contact with each other, the base is lowered and separated from the workpiece, and the rotating means set with a predetermined rotation angle is rotated for each The edge portion is polished so that the polishing surface is positioned upward, thereby polishing the respective corner portions of the workpiece to be polished. The continuous polishing system continuously rotates the rotation means having the rotation speed while polishing the respective corner portions. 一種多角柱狀構件之研磨方法,於前述申請專利範圍第9項之多角柱狀構件之研磨裝置,混合於前述毛材之磨粒粒度為F180~#2000,選擇兩種類以上其粒度不同之研磨手段,並將該研磨手段連設成依其粒度「粗」至「細」之順序研磨加工。 A grinding method for a polygonal columnar member, wherein the grinding device of the polygonal columnar member according to the ninth aspect of the patent application is mixed with the abrasive grain size of the above-mentioned wool material is F180~#2000, and two or more kinds of grinding materials having different particle sizes are selected. Means, and the grinding means is connected to be processed in the order of "thickness" to "fineness" of the particle size. 一種多角柱狀構件之研磨方法,係於前述申請專利範圍第11項之多角柱狀構件之研磨裝置,混合於前述毛材之磨粒粒度為F180~#2000,選擇兩種類以上其粒度不同之研磨手段,並將該研磨手段連設成依其粒度「粗」至「細」之順序研磨加工。 A polishing method for a polygonal columnar member, which is a polishing apparatus for a polygonal columnar member according to Item 11 of the above patent application, wherein the abrasive grain size of the above-mentioned wool material is F180~#2000, and two or more types of particle sizes are selected. The polishing means is connected to the polishing means in the order of "thickness" to "fineness" of the particle size. 一種多角柱狀構件之研磨方法,係於前述申請專利範圍第9項之多角柱狀構件之研磨裝置,混合於前述毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段,並連接該研磨手段來進行研磨。 A grinding method for a polygonal columnar member, which is a grinding device for a polygonal columnar member according to item 9 of the above-mentioned patent application, wherein the abrasive grain size of the above-mentioned wool material is F180~#2000, and the grinding means having substantially the same particle size is selected. And the grinding means is connected to perform the grinding. 一種多角柱狀構件之研磨方法,係於前述申請專利範圍第11項之多角柱狀構件之研磨裝置,混合於前述毛材之磨粒粒度為F180~#2000,選擇其粒度大致相同之研磨手段,並連接該研磨手段來進行研磨。 A grinding method for a polygonal columnar member, which is a grinding device for a polygonal columnar member according to Item 11 of the aforementioned patent application, which is mixed with the abrasive grain size of the above-mentioned wool material, F180~#2000, and the grinding means having substantially the same particle size is selected. And the grinding means is connected to perform the grinding.
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