TWI366672B - - Google Patents

Info

Publication number
TWI366672B
TWI366672B TW097111286A TW97111286A TWI366672B TW I366672 B TWI366672 B TW I366672B TW 097111286 A TW097111286 A TW 097111286A TW 97111286 A TW97111286 A TW 97111286A TW I366672 B TWI366672 B TW I366672B
Authority
TW
Taiwan
Application number
TW097111286A
Other versions
TW200941000A (en
Inventor
Evan Huang
Darren Cheng
Spin Hua
Randy Ye
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW097111286A priority Critical patent/TWI366672B/zh
Publication of TW200941000A publication Critical patent/TW200941000A/en
Application granted granted Critical
Publication of TWI366672B publication Critical patent/TWI366672B/zh

Links

TW097111286A 2008-03-28 2008-03-28 TWI366672B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW097111286A TWI366672B (en) 2008-03-28 2008-03-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW097111286A TWI366672B (en) 2008-03-28 2008-03-28

Publications (2)

Publication Number Publication Date
TW200941000A TW200941000A (en) 2009-10-01
TWI366672B true TWI366672B (en) 2012-06-21

Family

ID=44868146

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097111286A TWI366672B (en) 2008-03-28 2008-03-28

Country Status (1)

Country Link
TW (1) TWI366672B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9201098B2 (en) 2012-07-13 2015-12-01 Mpi Corporation High frequency probe card
US9244018B2 (en) 2012-07-13 2016-01-26 Mpi Corporation Probe holding structure and optical inspection device equipped with the same

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI509254B (en) * 2013-03-06 2015-11-21 Omnivision Tech Inc Image sensor testing probe card and method of making the same
TWM520636U (en) * 2015-03-20 2016-04-21 Mpi Corp Multi-unit test probe card with luminance adjusting mechanism
TWI576591B (en) * 2016-02-03 2017-04-01 King Yuan Electronics Co Ltd Probe card assembling structure, assembling method thereof, and method of taking broken probe out therefrom

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9201098B2 (en) 2012-07-13 2015-12-01 Mpi Corporation High frequency probe card
US9244018B2 (en) 2012-07-13 2016-01-26 Mpi Corporation Probe holding structure and optical inspection device equipped with the same

Also Published As

Publication number Publication date
TW200941000A (en) 2009-10-01

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