TWI300481B - - Google Patents

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Publication number
TWI300481B
TWI300481B TW95114711A TW95114711A TWI300481B TW I300481 B TWI300481 B TW I300481B TW 95114711 A TW95114711 A TW 95114711A TW 95114711 A TW95114711 A TW 95114711A TW I300481 B TWI300481 B TW I300481B
Authority
TW
Taiwan
Prior art keywords
test
unit
semiconductor component
rotary
classification device
Prior art date
Application number
TW95114711A
Other languages
English (en)
Chinese (zh)
Other versions
TW200741219A (en
Inventor
liang-yu Xu
Original Assignee
Chroma Ate Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chroma Ate Inc filed Critical Chroma Ate Inc
Priority to TW095114711A priority Critical patent/TW200741219A/zh
Publication of TW200741219A publication Critical patent/TW200741219A/zh
Application granted granted Critical
Publication of TWI300481B publication Critical patent/TWI300481B/zh

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  • Testing Of Individual Semiconductor Devices (AREA)
TW095114711A 2006-04-25 2006-04-25 Rotary disk type testing and sorting device TW200741219A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095114711A TW200741219A (en) 2006-04-25 2006-04-25 Rotary disk type testing and sorting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095114711A TW200741219A (en) 2006-04-25 2006-04-25 Rotary disk type testing and sorting device

Publications (2)

Publication Number Publication Date
TW200741219A TW200741219A (en) 2007-11-01
TWI300481B true TWI300481B (ja) 2008-09-01

Family

ID=45069977

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095114711A TW200741219A (en) 2006-04-25 2006-04-25 Rotary disk type testing and sorting device

Country Status (1)

Country Link
TW (1) TW200741219A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412762B (zh) * 2009-09-03 2013-10-21 Jt Corp 半導體裝置分類設備
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
TWI593979B (zh) * 2016-02-22 2017-08-01 京元電子股份有限公司 轉塔式測試裝置之快拆式ic測試座

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI451100B (zh) * 2009-02-20 2014-09-01 King Yuan Electronics Co Ltd 翻轉測試模組及其測試系統
TWI472778B (zh) * 2013-08-30 2015-02-11 Chroma Ate Inc System - level IC test machine automatic retest method and the test machine
KR102401058B1 (ko) * 2015-05-12 2022-05-23 (주)제이티 소자핸들러
TWI638170B (zh) * 2017-12-29 2018-10-11 鴻勁精密股份有限公司 Electronic component working machine
CN112452821A (zh) * 2020-11-05 2021-03-09 方晓娟 一种电压内阻测试机快速抓取机械装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI412762B (zh) * 2009-09-03 2013-10-21 Jt Corp 半導體裝置分類設備
TWI418811B (zh) * 2011-02-14 2013-12-11 Youngtek Electronics Corp 封裝晶片檢測與分類裝置
TWI593979B (zh) * 2016-02-22 2017-08-01 京元電子股份有限公司 轉塔式測試裝置之快拆式ic測試座

Also Published As

Publication number Publication date
TW200741219A (en) 2007-11-01

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