TWI261674B - Device interface apparatus - Google Patents
Device interface apparatus Download PDFInfo
- Publication number
- TWI261674B TWI261674B TW093116076A TW93116076A TWI261674B TW I261674 B TWI261674 B TW I261674B TW 093116076 A TW093116076 A TW 093116076A TW 93116076 A TW93116076 A TW 93116076A TW I261674 B TWI261674 B TW I261674B
- Authority
- TW
- Taiwan
- Prior art keywords
- socket
- connector
- substrate
- signal
- plug
- Prior art date
Links
- 238000012360 testing method Methods 0.000 claims abstract description 143
- 239000000758 substrate Substances 0.000 claims abstract description 124
- 230000005540 biological transmission Effects 0.000 claims abstract description 60
- 238000012546 transfer Methods 0.000 claims description 16
- 230000013011 mating Effects 0.000 claims description 12
- 239000004020 conductor Substances 0.000 claims description 11
- 230000008878 coupling Effects 0.000 claims description 3
- 238000010168 coupling process Methods 0.000 claims description 3
- 238000005859 coupling reaction Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 241000282376 Panthera tigris Species 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000005070 sampling Methods 0.000 claims description 2
- 206010011469 Crying Diseases 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 241001272720 Medialuna californiensis Species 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000012212 insulator Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 210000000988 bone and bone Anatomy 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- NMFHJNAPXOMSRX-PUPDPRJKSA-N [(1r)-3-(3,4-dimethoxyphenyl)-1-[3-(2-morpholin-4-ylethoxy)phenyl]propyl] (2s)-1-[(2s)-2-(3,4,5-trimethoxyphenyl)butanoyl]piperidine-2-carboxylate Chemical compound C([C@@H](OC(=O)[C@@H]1CCCCN1C(=O)[C@@H](CC)C=1C=C(OC)C(OC)=C(OC)C=1)C=1C=C(OCCN2CCOCC2)C=CC=1)CC1=CC=C(OC)C(OC)=C1 NMFHJNAPXOMSRX-PUPDPRJKSA-N 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- 241000282994 Cervidae Species 0.000 description 1
- 241001494479 Pecora Species 0.000 description 1
- 235000010627 Phaseolus vulgaris Nutrition 0.000 description 1
- 244000046052 Phaseolus vulgaris Species 0.000 description 1
- 241000239226 Scorpiones Species 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 235000012054 meals Nutrition 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 210000002784 stomach Anatomy 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 210000002303 tibia Anatomy 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R33/00—Coupling devices specially adapted for supporting apparatus and having one part acting as a holder providing support and electrical connection via a counterpart which is structurally associated with the apparatus, e.g. lamp holders; Separate parts thereof
- H01R33/74—Devices having four or more poles, e.g. holders for compact fluorescent lamps
- H01R33/76—Holders with sockets, clips, or analogous contacts adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003161064 | 2003-06-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200508622A TW200508622A (en) | 2005-03-01 |
| TWI261674B true TWI261674B (en) | 2006-09-11 |
Family
ID=33508594
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093116076A TWI261674B (en) | 2003-06-05 | 2004-06-04 | Device interface apparatus |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JP4002935B2 (ja) |
| KR (1) | KR100609518B1 (ja) |
| CN (1) | CN100427955C (ja) |
| DE (1) | DE112004000029T5 (ja) |
| TW (1) | TWI261674B (ja) |
| WO (1) | WO2004109308A1 (ja) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7610538B2 (en) * | 2007-04-13 | 2009-10-27 | Advantest Corporation | Test apparatus and performance board for diagnosis |
| KR101069850B1 (ko) * | 2008-12-31 | 2011-10-04 | 삼성중공업 주식회사 | 로봇 제어회로 시험장치 |
| DE102013203536B4 (de) * | 2013-03-01 | 2016-03-31 | Multitest Elektronische Systeme Gmbh | Vorrichtung zum Prüfen von elektronischen Bauteilen |
| JP6276536B2 (ja) * | 2013-08-09 | 2018-02-07 | 東洋電子技研株式会社 | テスト装置と、それを構成するコンタクト装置 |
| JP7281273B2 (ja) * | 2018-12-04 | 2023-05-25 | 株式会社アドバンテスト | 導出器収容体 |
| JP7410708B2 (ja) * | 2019-12-24 | 2024-01-10 | 株式会社アドバンテスト | 電子部品試験装置、ソケット、及び、電子部品試験装置用の交換部品 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5954853U (ja) * | 1982-10-05 | 1984-04-10 | 東芝エンジニアリング株式会社 | 測定コ−ド |
| JPS6230970A (ja) * | 1985-08-01 | 1987-02-09 | Toshiba Corp | 半導体測定装置 |
| JP3534290B2 (ja) * | 1997-08-07 | 2004-06-07 | 矢崎総業株式会社 | シールドコネクタ |
| JPH1183934A (ja) * | 1997-09-05 | 1999-03-26 | Advantest Corp | 半導体試験装置 |
| TW456074B (en) * | 1998-02-17 | 2001-09-21 | Advantest Corp | IC socket |
-
2004
- 2004-06-01 DE DE112004000029T patent/DE112004000029T5/de not_active Withdrawn
- 2004-06-01 JP JP2005504506A patent/JP4002935B2/ja not_active Expired - Lifetime
- 2004-06-01 WO PCT/JP2004/007526 patent/WO2004109308A1/ja active Application Filing
- 2004-06-01 KR KR1020047017238A patent/KR100609518B1/ko active IP Right Grant
- 2004-06-01 CN CNB2004800000970A patent/CN100427955C/zh not_active Expired - Fee Related
- 2004-06-04 TW TW093116076A patent/TWI261674B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004109308A1 (ja) | 2004-12-16 |
| JPWO2004109308A1 (ja) | 2006-07-20 |
| KR100609518B1 (ko) | 2006-08-08 |
| TW200508622A (en) | 2005-03-01 |
| JP4002935B2 (ja) | 2007-11-07 |
| DE112004000029T5 (de) | 2005-07-28 |
| CN100427955C (zh) | 2008-10-22 |
| KR20050029119A (ko) | 2005-03-24 |
| CN1697978A (zh) | 2005-11-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MK4A | Expiration of patent term of an invention patent |