TWI258591B - Flat display panel tester - Google Patents
Flat display panel tester Download PDFInfo
- Publication number
- TWI258591B TWI258591B TW094104871A TW94104871A TWI258591B TW I258591 B TWI258591 B TW I258591B TW 094104871 A TW094104871 A TW 094104871A TW 94104871 A TW94104871 A TW 94104871A TW I258591 B TWI258591 B TW I258591B
- Authority
- TW
- Taiwan
- Prior art keywords
- display panel
- base
- flat
- flat display
- panel
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/13—Solid thermionic cathodes
- H01J1/20—Cathodes heated indirectly by an electric current; Cathodes heated by electron or ion bombardment
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040108130A KR100673795B1 (ko) | 2004-12-17 | 2004-12-17 | 평판 표시패널 검사장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200622262A TW200622262A (en) | 2006-07-01 |
TWI258591B true TWI258591B (en) | 2006-07-21 |
Family
ID=36788027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094104871A TWI258591B (en) | 2004-12-17 | 2005-02-18 | Flat display panel tester |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100673795B1 (ko) |
CN (1) | CN1790033A (ko) |
TW (1) | TWI258591B (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4808135B2 (ja) * | 2006-11-09 | 2011-11-02 | 株式会社日本マイクロニクス | プローブ位置合わせ方法及び可動式プローブユニット機構並びに検査装置 |
KR100861467B1 (ko) * | 2007-07-04 | 2008-10-02 | 호서대학교 산학협력단 | Lcd 패널 점등검사용 프로브 유닛 |
JP5432460B2 (ja) * | 2008-02-25 | 2014-03-05 | 株式会社日本マイクロニクス | 検査装置 |
KR101063774B1 (ko) * | 2009-08-27 | 2011-09-08 | (주)유비프리시젼 | 멀티 프로브 유니트 |
KR101292261B1 (ko) * | 2012-06-29 | 2013-08-07 | 주식회사 디이엔티 | 평면 디스플레이 검사장치 |
KR101920224B1 (ko) * | 2012-07-27 | 2018-11-20 | 엘지디스플레이 주식회사 | 액정패널 검사장비 및 검사방법 |
KR101616564B1 (ko) * | 2014-09-24 | 2016-04-29 | 주식회사 디이엔티 | 프로브 이동장치 |
CN115097660B (zh) * | 2022-06-07 | 2023-11-21 | 厦门特仪科技有限公司 | 一种ct灯箱 |
-
2004
- 2004-12-17 KR KR1020040108130A patent/KR100673795B1/ko not_active IP Right Cessation
-
2005
- 2005-02-18 TW TW094104871A patent/TWI258591B/zh not_active IP Right Cessation
- 2005-02-25 CN CNA2005100087453A patent/CN1790033A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
CN1790033A (zh) | 2006-06-21 |
KR20060069043A (ko) | 2006-06-21 |
KR100673795B1 (ko) | 2007-01-24 |
TW200622262A (en) | 2006-07-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TWI258591B (en) | Flat display panel tester | |
CN105445972B (zh) | 探针移动装置 | |
JP2005017179A (ja) | 表示パネルの検査装置および検査方法 | |
CN105910553A (zh) | 一种检测平面的检测仪及其检测方法 | |
TWI328121B (en) | Apparatus for inspecting display panel and method for inspecting display panel using the same | |
US8823949B2 (en) | Measurement apparatus | |
CN114441942A (zh) | Pcb板的飞针测试方法、系统、设备及存储介质 | |
TWI627414B (zh) | Probe card detection method and system | |
KR100489522B1 (ko) | 평면디스플레이 검사장치 | |
TW201913846A (zh) | 探針卡調針系統、調針機構模組及調針方法 | |
KR100934014B1 (ko) | 프로브 카드의 검사장치 | |
JP2002181882A (ja) | プローブカードとtabの位置決め装置 | |
JP2003114201A (ja) | X線透視撮影装置 | |
CN101995680B (zh) | Lcd检测设备的校准台 | |
CN108594495A (zh) | 一种全角度lcd宏观检查机 | |
JP4369158B2 (ja) | 表示用パネルの検査方法 | |
JP5319063B2 (ja) | 線幅測定装置 | |
TWI581035B (zh) | 液晶測試板定位方法 | |
JPH11101838A (ja) | 液晶表示体用基板の目印付加装置及び液晶表示体用基板検査装置 | |
JP3532670B2 (ja) | 表示パネル基板の検査装置 | |
JP2602303B2 (ja) | 移動テーブル装置 | |
TW201905464A (zh) | 探針裝置及針跡謄寫方法 | |
JP2001201464A (ja) | エックス線可変斜視角透視装置 | |
TWI784088B (zh) | 電子半導體組件之光學表示方法及裝置 | |
TW202104837A (zh) | 2d及3d量測裝置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |