TWI243908B - Visual inspection machine for electronic component - Google Patents

Visual inspection machine for electronic component Download PDF

Info

Publication number
TWI243908B
TWI243908B TW93131668A TW93131668A TWI243908B TW I243908 B TWI243908 B TW I243908B TW 93131668 A TW93131668 A TW 93131668A TW 93131668 A TW93131668 A TW 93131668A TW I243908 B TWI243908 B TW I243908B
Authority
TW
Taiwan
Prior art keywords
tray
inspection
electronic component
appearance
discharge
Prior art date
Application number
TW93131668A
Other languages
Chinese (zh)
Other versions
TW200613752A (en
Inventor
Liang-Hung Du
Robin Wu
Original Assignee
Hon Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hon Tech Inc filed Critical Hon Tech Inc
Priority to TW93131668A priority Critical patent/TWI243908B/en
Application granted granted Critical
Publication of TWI243908B publication Critical patent/TWI243908B/en
Publication of TW200613752A publication Critical patent/TW200613752A/en

Links

Abstract

A visual inspection machine for electronic component mainly uses a conveying mechanism of a feeder to push the tray for carrying electronic component in an elevating mechanism of a loading cassette onto an inspection equipment. The tooling mechanism of the inspection equipment then holds the tray to move to the bottom side of a tester for the tester (such as a CCD) to carry out a visual inspection of the electronic component in the tray. After the inspection is finished, the tooling mechanism further moves the tray to a discharge location. Moreover, another conveying mechanism moves and places the tray in a discharge cassette of a discharge device. Thereby it is capable of automating the inspection of appearance, feed and discharge of electronic component to increase the production efficiency and ensure the inspection quality.

Description

1243908 八、本案若有化學鱗’請揭示最能齡發明特徵的化學式 九、發明說明: 【發明所屬之技術領域】 【先前技術】 電子’以往必須由許多大型 了子禮結t才能完成之工作已漸漸由積體電路 即Γ曰T h rrcr ’簡稱1 c)所取代,而1 c之核心 曰之:ic:片輯之電路,以 於製作上,係將—呈4且具有驅,路’ (Die Saw)成複數個晶片,再、曰曰固(wafe)予以切割 作=片歷經數道製程,業者為確質至t盤制 作元成後,均會進行外觀檢測作業,以 日片衣 *外力刮損表面等石夕^=出==片及科 ,不良品’惟目前晶片外觀檢測作二工 二淘 僅須配置相當多之人力,且作幸:J大之曰曰片而舌,不 法作有效之提升,再者,人目=致生產效率無 生檢測疏漏之情況,造成性檢測,易發 求全面自動化及品f提升之 方式貫有改進之必要,如何設計_ j卜測 質之外觀檢測機,即為業者致力研發之標的。確保品 1243908 【發明内容】 其主供:種電子元件之外觀檢測機, 檢測器處,供檢測夹持料盤移動至 ί:另於=畢後,治具機構再帶動;盤卜觀 及作高生產效率,並確保檢人力 分別^ 一堇7 =的係在於該檢測裝置之檢測台入、出料严 ,‘囉尺降作動之^ 位移至入料處或出料;進而= 本發明之另-目的係在於該檢 二可調整位移之頂位結構,該頂 ^ 上設有 機構移載料盤之便難。貝頂抵他碰,進而提升治具 【實施方式】 為使貝審查委貝對本發明作爭;隹Jh . 較佳實施例並配合圖式,詳^^更進—步之瞭解’兹舉- 請參閱第1〜3圖所示,本^明包含 測裝置2及出料裝置3,其中,抑祖^糾衣置1、檢 構1 1及人升降機構i 2,該〜多,有-移料機 設有壓紅111,而壓紅丄i i之活塞产 3於機架上 1 1 3之滑座1 1 2,俾以令壓虹i ^ 頂桿 向伸縮作動,-設於頂桿i i 3側上1 1 3橫 係於機台下方設有一由馬達 !2439〇8 ^干l2 2上螺設有具數支頂桿12 4之支撑板12 3,而 杯124位於機台上方之另端則固設有一承板125, 有有Ϊ個料盤A之入 12 6,而料盤八則承置 ί Γι ;= 而以馬達1 2 1驅動螺桿1 2 2,而傳動支 降位二: 以帶動承板1 2 5及續1 2 6升 心=’請參閱第4〜7圖所示,該檢測裝置2係於-檢 雄:j1之頂面—側設有入料導引機構2 2,該入料導引播 置入2 171面上開設數«孔2 1 1 ’供分別 作動’—設於檢測台2 i上之治具機構2 3,係 :抖一f匸型之治具框架2 31,其係以滑座2 3 2連結二 以供帶ί::軌;勤2 3 4所組成之X-Y位移結構, 9 &向移動’並於滑座2 3 2上設有壓虹 =5以一作升降位移,另於治具框架2 3丄之 結構係於—支樓架2 3 6之-端固設壓虹口。又 2 3 9固设於治具框牟土庄 =3 1同步位移作動,另於檢;】台7以,:具 (:〇〇之檢測器25,—設於檢 =,叹-為 引機構2 6,係於檢測台2丄上開設數個穿U = 1導 別置入一導板2 61,而導板212,供分 2 6 2以控制升降作動,而檢測台6於出料缸 機構2 7,其亦於台面上開設有—滑槽有-移料 27 1,該推塊271由一壓缸2 ^3ί、置入一推塊 壓缸2 7 2之側方經-滑座2 7 3連動作升降位移,而 “3連叹於—壓缸274之活 1243908 基桿,以供帶動推塊2 71作橫向往復位r · 7料機構1 之料盤讀應 装置1之移料機構1 1以壓缸1 i i 之’該送料 伸作動’將入料E 1 2 6中之料盤A向側方二1 凸 仿預s又入料位置後,該壓缸1 1 1再控制頂俨"i 1 料導引機構22之壓缸2 2 2亦帶動以。下 且機參閱第1 1〜1 3圖所示,該檢測裝置2之户 2 1 = :;f横、縱向滑執2 3 3、2 3 4配 2 框架2 3 1至料盤A之上方,再利用壓缸 2 3 7即·牛而套置於料盤錯部’而頂位結構之壓缸 於料盤心 此時’該橫、縱向滑;2、3 ; 2】匕内=被夾持定位’ 2 3 1及料盤A位移匕動治具框架 之各晶片進杆H 2 5之下方’以供對料盤A中 芊2 3 ΐ及測作業,待檢測完畢後’即帶動治具框 2 3王再復塊2 7 1财’錢治具框架 設有工1 2〜1 7圖所示,該檢測台2 1之側方 螺機台下方設有—由馬達3i驅動之 1 5,供置放料厂=台上方之另端則固設有一承板 2 出枓匣3 6,進而可以馬達3丄驅動螺桿 1243908 3 2,而傳動支撐板3 3上下位移,以帶動承板3 5及出料 匣3 6升降位移作動;續之,該出料裝置3即以馬達3 =板3 5及出料E3 6上升至預設位置’令—空槽對應於 ;ft位置而出料導引機構2 6之壓缸2 6 2亦驅動Ϊ板 塊2 7位、:Γ後該移料機構2 7以壓缸2 7 2帶動推 SL —壓缸2 7 4帶動作橫向位移,將料 料匣Ί fi中此::6 1滑移至出料裝置3之出 用效ί 動化檢測晶片外觀及人、出料之實 綜上所述,本發明深具實用性及進步性,狹 刊物公開,從而允符發明專利中請料,爰依法目提 【圖式簡單說明】 第1圖··本發明之俯視圖。 f2圖··本發明送料展置之前視圖。 f3圖:本發明送料裝置之俯視圖。 t圖:本發明檢測裝置之俯視圖。 以5工:=!檢測裝置之前視圖。 笛β闫I义、移料機構之示意圖。 第7圖 第8圖 弟6圖:本發明檢測裝置 本發明檢測裝置之機構不思圖。 係入料ϋ及導板構示意圖。 第1 1圖 第1 2圖 第1 3圖 第1 4圖 第1 5圖 ;9圖:係頂桿頂移料盤至檢測 弟1〇圖:導板復位上f ==移载料;至::處 本發明出料裝置之前=枓處之示意圖。 係出料導引機構之=意圖。1243908 VIII. If there are chemical scales in this case, please disclose the chemical formula of the most capable invention. IX. Description of the invention: [Technical field to which the invention belongs] [Prior art] Electronics' had to be completed by many large-scale gift boxes. It has gradually been replaced by the integrated circuit, which is Γ: T h rrcr 'abbreviated as 1 c), and the core of 1 c is: ic: a circuit of the film series. For the production, it will be-4 and has a drive, circuit '(Die Saw) into a plurality of wafers, and then cut it as a wafer = After several processes, the industry will perform appearance inspection operations to verify the quality of the t-disk. Clothing * External force scratches the surface, etc. Shi Xi ^ = 出 == pieces and sections, defective products, but the current appearance inspection of the wafer requires only a considerable amount of manpower, and fortunately: Tongue, can not be effectively improved, in addition, human eyes = production efficiency is not the case of detection omissions, resulting in sexual testing, easy to find comprehensive automation and quality improvement methods always need to improve, how to design _ j 卜 测Quality appearance inspection machine of. Guaranteed product 1243908 [Summary of the invention] Its main supply: the appearance of a type of electronic components of the inspection machine, the detector for the detection of the holding tray to move to ί: after another =, the fixture mechanism will be driven again; High production efficiency, and ensure that the inspection manpower ^ Yijing 7 = is due to the tightness of the input and output of the detection platform of the detection device, the movement of the 啰 ruler moves to the input or output; and then = the invention Another purpose is that the top position structure with adjustable displacement can be used for the second inspection. It is difficult for the top to be provided with a mechanism for transferring the tray. Bei Ding touched him, and then improved the fixture. [Implementation] In order for the Peer Review Committee to contest the present invention; 隹 Jh. The preferred embodiment and the drawings are detailed. Please refer to the figures 1 to 3, the present invention includes a measuring device 2 and a discharging device 3, among them, the ancestor ^ correction set 1, the inspection structure 1 1 and the human lifting mechanism i 2, which are many, there are- The transfer machine is equipped with pressure red 111, and the pressure red piston ii produces 3 on the rack 1 1 3 slide 1 1 2 to make the pressure i ^ the top rod moves to the telescopic,-set on the top rod ii On the 3 side 1 1 3 is horizontally provided with a motor below the machine! 2439〇8 ^ dry l2 2 The upper screw is provided with a support plate 12 3 with a number of ejector rods 12 4 and the cup 124 is located above the machine. The other end is fixedly provided with a bearing plate 125, which has a feed tray A of 12 6 and a feed tray eight receives Γ Γ; = and the motor 1 2 1 drives the screw 1 2 2 and the transmission support is lowered 2: Drive the carrier plate 1 2 5 and continue 1 2 6 to lift the heart = 'Please refer to Figures 4 ~ 7, the detection device 2 is attached to the top surface of the inspection male: j1-side is equipped with a feed guide Number of openings of mechanism 2 2, the feed guide placement into 2 171 faces «holes 2 1 1 ' For separate operation'—the jig mechanism 2 3 provided on the testing platform 2 i is: a jig frame 2 31 of jitter type f, which is connected to the two by a slide 2 3 2 for the belt: rail The XY displacement structure composed of Qin 2 3 4 is 9 & move to the 'direction and a iris = 5 is set on the slide seat 2 3 2 to make a lifting displacement, and the structure of the fixture frame 2 3 丄 is attached to— At the end of the supporting frame 2 3 6-a crescent port is fixed. Another 2 3 9 is fixed on the jig frame Mu Tu Zhuang = 3 1 synchronous displacement operation, and the other is in the inspection;] the platform 7 is: the detector 25 with: (: 〇〇— set in the inspection =, sigh- for the lead mechanism 26. It is to set up several guide plates 2 through U = 1 on the inspection table 2 丄 and insert a guide plate 2 61, and the guide plate 212 is divided into 2 6 2 to control the lifting movement, and the inspection table 6 is in the discharge cylinder. The mechanism 27 is also provided on the table—the chute has a moving material 271. The pushing block 271 is composed of a pressing cylinder 2 ^ 3ί, and the side of the pushing block pressing cylinder 2 7 2 is passed through a sliding seat. 2 7 3 consecutive movements, lifting and displacement, and "3 consecutive sighs-the pressure cylinder 274 of the 1243908 base rod to drive the push block 2 71 for the horizontal reciprocating position r · 7 material mechanism 1 the tray reading device 1 shift The feeding mechanism 11 uses the "feeding and extending action" of the pressing cylinder 1 ii to move the feeding tray A in the feeding E 1 2 6 to the side two 1 after the feeding position is convex, and the pressing cylinder 1 1 1 again The control cylinder 2 2 2 of the top guide 22 is also driven. Refer to Figures 1 to 1 for the bottom and the machine, as shown in Figure 1 to Figure 1. The detection device 2 2 2 =:; Vertical slide 2 3 3, 2 3 4 with 2 frame 2 3 1 above the tray A, and then use the pressure cylinder 2 3 7 ie · And the sleeve is placed on the wrong part of the tray, and the pressure cylinder of the top structure is at the center of the tray. At this time, the horizontal and vertical sliding; 2, 3; 2] In the dagger = clamped and positioned 2 3 1 and tray A Displace the dagger to move the jig's frame below the rod H 2 5 'for the tray 2 in the tray A and perform the measurement operation. After the test is completed, the jig frame 2 3 will be driven and the block will be reassembled 2 7 A frame of 1 '' money fixture is provided with workers 1 2 to 17 as shown in the figure below. The side of the testing machine 21 is provided under the side screw machine-driven by the motor 3i and 1 5. The other end is fixedly provided with a carrier plate 2 out of the box 36, and then the motor 3 can drive the screw 1243908 3 2 and the transmission support plate 3 3 is moved up and down to drive the board 3 5 and the discharge box 36 to move up and down. Acting; continued, the discharging device 3 is raised to the preset position with the motor 3 = the plate 3 5 and the discharging E3 6 'order-the empty slot corresponds to the ft position and the pressure cylinder 2 of the discharging guide mechanism 2 6 6 2 also drives the Ϊ plate 2 7 position: After Γ, the material transfer mechanism 2 7 drives the SL with the pressure cylinder 2 7 2-the pressure cylinder 2 7 4 moves laterally with the action, and moves the material box Ί fi to this: 6 1Sliding to the discharge device 3 In summary, the appearance of the chip, the person and the material are summarized. The present invention is highly practical and progressive. The narrow publication is disclosed, which allows the invention patent to request the material. Figures ... Top view of the present invention. F2 Figures ... Front view of the feeding display of the present invention. F3 Figure: Top view of the feeding device of the present invention. Figure t: Top view of the detection device of the present invention. Take 5 steps: =! To check the front view of the device. Flute β Yan I meaning, the schematic diagram of the material transfer mechanism. Figure 7 Figure 8 Figure 6: Detection device of the present invention The mechanism of the detection device of the present invention is not shown. Schematic diagram of the structure of the incoming material and the guide plate. Fig. 11 Fig. 12 Fig. 13 Fig. 14 Fig. 14 Fig. 15 Fig. 9; Fig. 9: Move the material tray from the ejector to the tester 10 Fig .: reset the guide plate f == move the material; to :: Schematic diagram of = place before the discharge device of the present invention. It is the intention of the discharge guide mechanism.

It:,夾持料盤之示意圖 1243908 第16圖:移料機構推移料盤至出料裝置處收料之示意圖。 第17圖:係第16圖之局部前視圖。 【主要元件符號說明】 〔本發明〕 送料裝置:1 壓缸 頂桿 馬達 111 113 12 1 支撐板:12 3 承板:12 5 檢測裝置:2 穿孔:211 滑槽:2 1 3 導板:2 2 1 治具機構:2 3 滑座:2 3 2 縱向滑執:2 3 4 支撐架:2 3 6 頂塊:2 3 8 定位孔:2 4 0 出料導引機構:2 6 壓缸:2 6 2 推塊:2 7 1 滑座:2 7 3 出料裝置:3 螺桿:3 2 頂桿:3 4 出料匣:3 6 移料機構·11 滑座;1 1 2 入料匣升降機構: 螺桿;12 2 頂桿:12 4 入料匣:12 6 檢測台:21 穿孔:212 入料導引機構:2 壓缸:2 2 2 治具框架:2 31 橫向滑軌:2 3 3 壓缸:2 3 5 壓缸:2 3 7 基座· 2 3 9It: The schematic diagram of holding the tray 1243908 Figure 16: The schematic diagram of the material moving mechanism pushing the tray to the receiving device to receive the material. FIG. 17 is a partial front view of FIG. 16. [Description of Symbols of Main Components] [In the present invention] Feeding device: 1 Cylinder ejector motor 111 113 12 1 Support plate: 12 3 Support plate: 12 5 Detection device: 2 Perforation: 211 Chute: 2 1 3 Guide plate: 2 2 1 Fixture mechanism: 2 3 Slide: 2 3 2 Longitudinal slide: 2 3 4 Support frame: 2 3 6 Top block: 2 3 8 Positioning hole: 2 4 0 Outlet guide mechanism: 2 6 Cylinder: 2 6 2 Pushing block: 2 7 1 Slide: 2 7 3 Discharge device: 3 Screw: 3 2 Ejector: 3 4 Discharge box: 3 6 Material transfer mechanism · 11 Slide; 1 1 2 Feed box lift Mechanism: Screw; 12 2 Ejector: 12 4 Feeder box: 12 6 Inspection table: 21 Perforation: 212 Feeder guide mechanism: 2 Cylinder: 2 2 2 Fixture frame: 2 31 Lateral slide: 2 3 3 Cylinder: 2 3 5 Cylinder: 2 3 7 Base · 2 3 9

檢測器:2 5 導板:2 6 1 移料機構* 2 7 壓缸:2 7 2 壓缸:2 7 4 馬達:3 1 支撐板:3 3 承板:3 5 料盤》A 2Detector: 2 5 Guide plate: 2 6 1 Material transfer mechanism * 2 7 Cylinder: 2 7 2 Cylinder: 2 7 4 Motor: 3 1 Support plate: 3 3 Support plate: 3 5 Pallet》 A 2

Claims (1)

1243908 申請專利範圍: 1 · 一種電子元件之外觀檢測機,包含: 送料装置:===承置料盤,並設有移料麵用 檢測裝置n於赌裝置之财,並具有 ίί:盤另該檢測台設有檢測器用:檢;電 出料裝置====== 2 .=中專利元件之外觀檢測 以移載料盤。彳一。上方係林治具機構用 3 .:申頁所述之電子元件之外觀檢測 頂位設=及- 4 .架作X-Yj方向位移 機,^中,述之電子元件之外觀檢測 以供承置=====絲降伽,該承板用 =====件之外_ 6 桿作橫向往復位移。 /、機構係以驅動源控制-頂 之電子元件之外觀檢測 引機構,用;;;ϊ^ m利範圍第1項所述之電子元件之外觀檢測 用檢測台上之一側設有出料導 10 7 1243908 8 ·依申請專利範圍第1項所述之電子元件之外觀檢測 機,其中,該出料裝置係以驅動源控制一承板升降作 動,該承板用以供置放具數個料盤之出料匣。1243908 Scope of patent application: 1 · An appearance inspection machine for electronic components, including: feeding device: === supports the tray, and is equipped with a detection device for the moving surface, and has the following advantages: The test bench is provided with a detector for: inspection; electrical discharge device ====== 2. = Appearance inspection of Chinese patented components to transfer the tray.彳 一。 The upper part is the inspection of the appearance of the electronic components described in the 3 :. application page. The top position is set to = and-4. It is used as an X-Yj direction displacement machine, and the appearance inspection of the electronic components described in ^ is provided for placement. ===== Si Jiang, this bearing plate uses ===== other than the _ 6 rods for lateral reciprocating displacement. /, The mechanism is controlled by the drive source-the external appearance of the electronic component detection mechanism, used; Guide 10 7 1243908 8 · According to the appearance inspection machine for electronic components described in item 1 of the scope of patent application, wherein the discharging device controls the lifting movement of a carrier plate with a driving source, and the carrier plate is used for placing Out of the tray.
TW93131668A 2004-10-19 2004-10-19 Visual inspection machine for electronic component TWI243908B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93131668A TWI243908B (en) 2004-10-19 2004-10-19 Visual inspection machine for electronic component

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93131668A TWI243908B (en) 2004-10-19 2004-10-19 Visual inspection machine for electronic component

Publications (2)

Publication Number Publication Date
TWI243908B true TWI243908B (en) 2005-11-21
TW200613752A TW200613752A (en) 2006-05-01

Family

ID=37154643

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93131668A TWI243908B (en) 2004-10-19 2004-10-19 Visual inspection machine for electronic component

Country Status (1)

Country Link
TW (1) TWI243908B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101322971B (en) * 2007-06-14 2014-05-28 鸿劲科技股份有限公司 Memory body IC testing and sorting machine
CN101342531B (en) * 2007-07-13 2012-09-05 鸿劲科技股份有限公司 Memory body IC detecting and sorting machine
TWI394171B (en) * 2008-12-12 2013-04-21 Hon Tech Inc Flash drive test sorting machine

Also Published As

Publication number Publication date
TW200613752A (en) 2006-05-01

Similar Documents

Publication Publication Date Title
CN108355989A (en) A kind of tab cutting for electronic product battery detects mechanism for sorting
TWI677045B (en) Transport apparatus, transport method and inspection system
CN110125026B (en) Thickness measuring equipment
CN212711629U (en) Automatic feeding and discharging device for testing machine
CN110600963A (en) Automatic bending detection equipment for connector
CN211888000U (en) Automatic measuring equipment for camera lens
CN107572179A (en) Large Copacity frame loader
TWI243908B (en) Visual inspection machine for electronic component
CN112850012A (en) Automatic chip transfer equipment
CN210272978U (en) Automatic bending detection equipment for connector
CN215100592U (en) Auxiliary jig for testing performance of circuit board
CN106684208A (en) Bidirectional high-speed slice insertion machine
CN211027149U (en) Circuit board appearance detection equipment
CN210358132U (en) Thickness measuring equipment
CN112108392A (en) Chip packaging test automatic classification device
CN109545729B (en) Automatic basket equipment of inserting of semiconductor silicon chip dry process
CN218097607U (en) Wafer thickness test machine
CN207509719U (en) Blanking device for Blister product and the plastic uptake system comprising the blanking device
CN114530398A (en) High-precision glue ejecting, taking and placing equipment used after semiconductor module chip sputtering process
CN113990787A (en) Chip detection equipment for chip processing production
CN210614416U (en) PCB visual inspection equipment
CN110549087A (en) automatic installation equipment for processor frame
CN209994788U (en) High-speed chip mounter convenient to feed
CN208140025U (en) Automatic classification blanking mobile phone shell side opening and inside and outside length and width detection machine
CN206766492U (en) Test machine element testing mechanism