TW325907U - Inactive state termination tester - Google Patents

Inactive state termination tester

Info

Publication number
TW325907U
TW325907U TW086203300U TW86203300U TW325907U TW 325907 U TW325907 U TW 325907U TW 086203300 U TW086203300 U TW 086203300U TW 86203300 U TW86203300 U TW 86203300U TW 325907 U TW325907 U TW 325907U
Authority
TW
Taiwan
Prior art keywords
inactive state
state termination
termination tester
tester
inactive
Prior art date
Application number
TW086203300U
Other languages
English (en)
Inventor
Francis M Samela
Joseph R Llorens
Original Assignee
Methode Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Methode Electronics Inc filed Critical Methode Electronics Inc
Publication of TW325907U publication Critical patent/TW325907U/zh

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/14—Handling requests for interconnection or transfer
    • G06F13/36—Handling requests for interconnection or transfer for access to common bus or bus system
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
    • G06F11/3027—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a bus
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3051—Monitoring arrangements for monitoring the configuration of the computing system or of the computing system component, e.g. monitoring the presence of processing resources, peripherals, I/O links, software programs
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/3055—Monitoring arrangements for monitoring the status of the computing system or of the computing system component, e.g. monitoring if the computing system is on, off, available, not available

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computing Systems (AREA)
  • Quality & Reliability (AREA)
  • Mathematical Physics (AREA)
  • Computer Hardware Design (AREA)
  • Small-Scale Networks (AREA)
  • Debugging And Monitoring (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Dc Digital Transmission (AREA)
  • Tests Of Electronic Circuits (AREA)
TW086203300U 1994-08-04 1994-11-16 Inactive state termination tester TW325907U (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/285,970 US5465042A (en) 1994-08-04 1994-08-04 Inactive state termination tester
US08/333,777 US5510701A (en) 1994-08-04 1994-11-03 Inactive state termination tester

Publications (1)

Publication Number Publication Date
TW325907U true TW325907U (en) 1998-01-21

Family

ID=23096471

Family Applications (2)

Application Number Title Priority Date Filing Date
TW083107827A TW318221B (zh) 1994-08-04 1994-08-24
TW086203300U TW325907U (en) 1994-08-04 1994-11-16 Inactive state termination tester

Family Applications Before (1)

Application Number Title Priority Date Filing Date
TW083107827A TW318221B (zh) 1994-08-04 1994-08-24

Country Status (6)

Country Link
US (2) US5465042A (zh)
EP (1) EP0695995A1 (zh)
JP (1) JPH08123739A (zh)
KR (1) KR960008569A (zh)
SG (1) SG32441A1 (zh)
TW (2) TW318221B (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0742612A3 (en) * 1995-05-02 1997-07-23 Symbios Logic Inc Method and device for connecting multiple connectors
US6070206A (en) * 1997-03-31 2000-05-30 Lsi Logic Corporation Method and apparatus for terminating a bus
US6061806A (en) * 1997-05-12 2000-05-09 Lsi Logic Corporation Method and apparatus for maintaining automatic termination of a bus in the event of a host failure
US6029216A (en) * 1997-06-27 2000-02-22 Lsi Logic Corporation Auto-termination method and apparatus for use with either active high or active low terminators
US6092131A (en) * 1997-07-28 2000-07-18 Lsi Logic Corporation Method and apparatus for terminating a bus at a device interface
US6425025B1 (en) 1999-06-03 2002-07-23 Dell Usa, L.P. System and method for connecting electronic circuitry in a computer system
JP5083287B2 (ja) * 2009-09-11 2012-11-28 セイコーエプソン株式会社 検出装置、物理量測定装置及び電子機器
JP5710363B2 (ja) * 2011-04-28 2015-04-30 矢崎総業株式会社 バスシステム
US9264150B2 (en) 2012-03-28 2016-02-16 Globalfoundries Inc. Reactive metal optical security device and methods of fabrication and use
US20170138998A1 (en) * 2015-11-16 2017-05-18 Mediatek Inc. Testing Device for Connection Interface and Related Testing Methods

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4386242A (en) * 1981-03-02 1983-05-31 Bell Telephone Laboratories, Incorporated Impedance matching using active couplers
GB8901197D0 (en) * 1989-01-19 1989-03-15 British Aerospace Digital data bus loading monitors
US5179341A (en) * 1991-06-28 1993-01-12 Hewlett-Packard Company System and method for detecting an improper termination and a short circuit in a network
US5272396B2 (en) * 1991-09-05 1996-11-26 Unitrode Corp Controllable bus terminator with voltage regulation
US5313105A (en) * 1992-05-14 1994-05-17 Samela Francis M Signal line increased current kicker terminator apparatus
US5313595A (en) * 1992-12-10 1994-05-17 Digital Equipment Corporation Automatic signal termination system for a computer bus

Also Published As

Publication number Publication date
TW318221B (zh) 1997-10-21
SG32441A1 (en) 1996-08-13
US5465042A (en) 1995-11-07
JPH08123739A (ja) 1996-05-17
EP0695995A1 (en) 1996-02-07
KR960008569A (ko) 1996-03-22
US5510701A (en) 1996-04-23

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