TW201702395A - 低溫高可靠性合金 - Google Patents

低溫高可靠性合金 Download PDF

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Publication number
TW201702395A
TW201702395A TW105113666A TW105113666A TW201702395A TW 201702395 A TW201702395 A TW 201702395A TW 105113666 A TW105113666 A TW 105113666A TW 105113666 A TW105113666 A TW 105113666A TW 201702395 A TW201702395 A TW 201702395A
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TW
Taiwan
Prior art keywords
alloy
solder
bismuth
copper
balance
Prior art date
Application number
TW105113666A
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English (en)
Inventor
迪阿維拉里巴斯摩卡那
特魯蘇雷許
庫馬阿尼爾
喬杜里普里沙
潘德賀蘭吉特
沙卡蘇利
西恩寶瓦
Original Assignee
阿爾發金屬公司
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Publication date
Application filed by 阿爾發金屬公司 filed Critical 阿爾發金屬公司
Publication of TW201702395A publication Critical patent/TW201702395A/zh

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • B23K35/24Selection of soldering or welding materials proper
    • B23K35/26Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
    • B23K35/262Sn as the principal constituent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/02Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
    • B23K35/0222Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
    • B23K35/0233Sheets, foils
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/02Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
    • B23K35/0222Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
    • B23K35/0244Powders, particles or spheres; Preforms made therefrom
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/02Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
    • B23K35/0222Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
    • B23K35/0244Powders, particles or spheres; Preforms made therefrom
    • B23K35/025Pastes, creams, slurries
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B3/00Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
    • B32B3/02Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions
    • B32B3/08Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions characterised by added members at particular parts
    • B32B3/085Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions characterised by added members at particular parts spaced apart pieces on the surface of a layer
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/05Interconnection of layers the layers not being connected over the whole surface, e.g. discontinuous connection or patterned connection
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C13/00Alloys based on tin
    • C22C13/02Alloys based on tin with antimony or bismuth as the next major constituent
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    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/81Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a bump connector
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3463Solder compositions in relation to features of the printed circuit board or the mounting process
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00Articles made by soldering, welding or cutting
    • B23K2101/36Electric or electronic devices
    • B23K2101/42Printed circuits
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2250/00Layers arrangement
    • B32B2250/022 layers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2307/00Properties of the layers or laminate
    • B32B2307/50Properties of the layers or laminate having particular mechanical properties
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B32B2307/536Hardness
    • BPERFORMING OPERATIONS; TRANSPORTING
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    • B32B2307/558Impact strength, toughness
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    • B32B2307/732Dimensional properties
    • B32B2307/734Dimensional stability
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Abstract

一種無鉛焊料合金,其包含:20 wt.%至35 wt.%的鉍、0.01 wt.%至10 wt.%的銅、以下一或多者:0.001 wt.%至4 wt.%的銻、0.001 wt.%至1 wt.%的鈷、0.001 wt.%至1 wt.%的鍺、0.001 wt.%至1 wt.%的錳、0.001 wt.%至1 wt.%的鎳、0.001 wt.%至1 wt.%的鈦、視情況以下一或多者:至多3 wt.%的銦、至多10 wt.%的銀、至多3 wt.%的鎵、至多1 wt.%的金、至多1 wt.%的鉻、至多1 wt.%的磷、至多1 wt.%的鋅、至多1 wt.%的鐵、至多1 wt.%的鋁、至多1 wt.%的碲、至多1 wt.%的硒、至多1 wt.%的鈣、至多1 wt.%的釩、至多1 wt.%的鉬、至多1 wt.%的鉑、至多1 wt.%的鎂、至多1 wt.%的稀土元素,餘量為Sn及任何不可避免之雜質。

Description

低溫高可靠性合金
本發明總體上係關於冶金學領域,且係關於合金並尤其為無鉛焊料合金。合金尤其(但非排他地)適用於電子焊接應用,諸如波焊、表面安裝技術、熱風整平及球柵陣列、平面柵格陣列、底部端接封裝、LED及晶片尺度封裝。
波焊(或熔錫軟銲)為大量焊接電子總成之廣泛使用方法。其可用於例如通孔電路板,其中一波熔融焊料在電路板上經過,該熔融焊料抵靠電路板之底部搭接以便濕潤有待接合的金屬表面。另一焊接技術涉及在印刷電路板上之焊接墊上印刷焊錫膏,繼之以置放並傳送整體總成穿過回流烘箱。在回流製程期間,焊料熔融且濕潤電路板上之焊接表面以及各組件。另一焊接製程涉及將印刷線路板浸入熔融焊料中以便用可焊接保護層塗佈銅端接部。此製程係稱為熱風整平。典型地在兩個基板之間將球柵陣列接頭或晶片尺度封裝與焊料球組裝。此等接頭之陣列係用於將晶片安裝在電路板上。
由於無鉛焊接材料之使用變得廣泛,由於環境指令或來自最終使用者的壓力,此等材料之應用範圍亦變得廣泛。諸如SnAg3.0Cu0.5之高Ag焊料合金具有極佳機械性質及良好熱可靠性之益處。然而,此等合金之熔點為約217-221℃。此較高熔點需要約240-250℃之回流溫度,該回流溫度在某些狀況下可對印刷電路板(printed circuit board;PCB)及電子組件造成損壞。
在電子總成,通常存在超過一個焊接步驟。在回流焊接中,一些接頭必須經受超過一次的回流循環。在此種狀況下,通常第一個形成的接頭係使用相對高熔融溫度的焊料來形成,而較低熔融溫度的焊料係用於製成後續接頭。此確保第一個形成的接頭不在第二或第三回流循環期間再熔融。此等兩個類型之焊料具有完全不同的冶金學組成。在此等兩個類型之焊料不彼此接觸的大多數狀況下,就不存在問題。然而,在某些狀況下,諸如印刷電路板(printed circuit board;PCB)上之球柵陣列(ball grid array;BGA)總成,用於BGA衝撞之第一焊料與用於焊錫膏之第二類型之焊料進行接觸,該焊錫膏係用於電路板上的BGA組件附接。在此等狀況下,合金在第二回流期間混合,且最終互連件之組成及性質可有所不同。
此舉之替代方式為對BGA衝撞使用與用於第二總成之焊錫膏中的合金相同的合金。因為兩種合金相同,所以兩種回流分佈亦將相同。BGA組件上之焊料球將完全熔融,且在第二回流期間與來自焊錫膏之合金混合。此將造成BGA球在第二回流期間完全崩塌,從而顯著地減少間隙高度(standoff height),如第1圖所示。較低間隙高度意指接頭由於在高溫操作及溫度循環期間BGA組件材料與電路板材料之間的CTE失配而經歷的較高剪切應力。
本發明旨在解決與先前技術相關聯的至少一些問題或旨在提供商業上可接受的替代物。
因此,在第一態樣中,本發明提供一種無鉛焊料合金,其包含: 20 wt.%至35 wt.%的鉍, 0.01 wt.%至10 wt.%的銅, 以下一或多者: 0.001 wt.%至4 wt.%的銻, 0.001 wt.%至1 wt.%的鈷, 0.001 wt.%至1 wt.%的鍺, 0.001 wt.%至1 wt.%的錳, 0.001 wt.%至1 wt.%的鎳, 0.001 wt.%至1 wt.%的鈦, 視情況以下一或多者: 至多10 wt.%的銀, 至多3 wt.%的銦, 至多3 wt.%的鎵, 至多1 wt.%的金, 至多1 wt.%的鉻, 至多1 wt.%的磷, 至多1 wt.%的鋅, 至多1 wt.%的鐵, 至多1 wt.%的鋁, 至多1 wt.%的碲, 至多1 wt.%的硒, 至多1 wt.%的鈣, 至多1 wt.%的釩, 至多1 wt.%的鉬, 至多1 wt.%的鉑, 至多1 wt.%的鎂, 至多1 wt.%的稀土元素, 餘量為Sn及任何不可避免之雜質。
合金可展現尤其有利的機械性質,且可有利地例如用於球柵陣列或倒裝晶片組裝製程。
現將進一步描述本發明。在以下段落中,更詳細地定義本發明之不同態樣。除非明確地指示為相反,否則如此定義的每一態樣可與任何其他一或多個態樣組合。詳言之,指示為較佳或有利的任何特徵可與指示為較佳或有利的任何其他一或多個特徵組合。
本文使用的術語「焊料合金」涵蓋具有在90℃至400℃範圍內之熔點的易熔金屬合金。
本文使用的術語「稀土元素」涵蓋選自以下者之元素:Sc、Y、La、Ce、Pr、Nd、Pm、Sm、Eu、Gd、Tb、Dy、Ho、Er、Tm、Yb及Lu。
如本文所使用的術語「倒裝晶片」涵蓋在用於將半導體元件(諸如IC晶片及微機電系統 (microelectromechanical systems;MEMS))互連至具有焊料凸塊之外部電路系統之方法中使用的晶片,該等焊料凸塊已沉積在晶片墊上。焊料凸塊係於最終晶圓處理步驟期間沉積在晶圓之頂側上的晶片墊上。為將晶片安裝至外部電路系統(例如,電路板或另一晶片或晶圓),將晶片翻轉以便其頂側面向下,且加以對準以便其墊與外部電路上之匹配墊對準,且隨後使焊料回流以便完成互連。此舉係與導線結合形成對比,在該線結合中,晶片係直立地安裝且導線用於將晶片墊互連至外部電路系統。
本文使用的術語「球柵陣列」(或BGA)係指一個面由呈網格圖案之墊覆蓋(或部分覆蓋)的封裝,每一墊初始地具有卡塞至該墊之焊料球。在操作中,墊在積體電路與置放有積體電路之印刷電路板(printed circuit board;PCB)之間傳導電信號。焊料球可手動地置放或藉由自動化設備置放,且利用黏結助焊劑固持在適當位置中。將元件置放於具有銅墊之PCB上,該等銅墊呈匹配焊球之圖案。隨後將該總成於回流烘箱中加熱或藉由紅外線加熱器加熱,從而使球熔融。表面張力致使熔融焊料將封裝固持成與電路板對準並處於正確的分離距離,同時焊料冷卻並固化,從而在元件與PCB之間形成焊接連接部。
如本文所使用的術語「助焊劑」涵蓋常常為酸或鹼之物質,其用於促進金屬之熔化且尤其用於移除並防止金屬氧化物之形成。
如本文所使用的術語「固相線」涵蓋低於給定物質為完全固體(結晶)的溫度。固相線量化物質開始熔融所處的溫度,但未必是完全熔融,亦即固相線不必為熔點。
如本文所使用的術語「液相線」涵蓋晶體可與熔融物質共同存在所處的最大溫度。高於液相線溫度時,材料為均質的且為處於平衡狀態下之液體。低於液相線溫度的情況下,愈來愈多的晶體可能形成。固相線溫度及液相線溫度在所有狀況下並不對準或重疊。若固相線溫度與液相線溫度之間存在空隙,則該空隙係稱為「凝固範圍」或「漿狀範圍(mush range)」,在彼空隙內,物質由固相及液相之混合物組成。
本文描述的無鉛焊料合金可展現有利的機械性質及機械可靠性。機械性質、機械可靠性及熱可靠性可與共晶或非共晶Sn-Bi及Sn-In合金之彼者類似,或比其更為有利。例如,合金可展現與共晶Sn-Bi及Sn-In合金相比改良的熱震效能。
合金可展現低溫熔融範圍。低溫焊料合金之使用可減少能源成本,允許低溫相容組分之使用,及/或改良溫度敏感應用之集合。
合金可展現低液相線溫度,典型地小於210℃、更典型地小於205℃。此可允許合金在第二回流製程(例如,在220-230℃下)用於安裝較低溫度組件。就此而言,合金典型地展現至少140℃、更典型地至少150℃、甚至更典型地至少170℃之液相線溫度。
合金可有利地用於在單一電路板上使用多個回流製程之焊接方法。例如,在第一回流製程中,所有可耐受較高回流溫度之電子組件可焊接至使用標準合金(諸如,例如SnAg3.0Cu0.5)之電路板。在第二回流製程中,溫度敏感組件可使用本發明之合金來處理。在另一實例中,在第一回流製程中,一些電子組件可使用本發明之合金來焊接,且在第二回流製程中,剩餘組件將使用具有較低液相線溫度及固相線溫度之合金來處理。
合金典型地展現寬的固相線-液相線熔融範圍(所謂的「膏狀範圍」)。例如,固相線與液相線之間的溫度範圍可為至少30℃。
合金可有利地用作球柵陣列(ball grid array;BGA)之焊料球。詳言之,合金之使用可避免或減少在BGA組裝製程期間的球崩塌問題。在典型地於175℃或更小(例如160℃至175℃或170℃)之溫度下進行的第二回流期間,焊料球不會完全熔融,進而減少或消除球崩塌問題(亦即,產生較高間隙)。在第二回流期間球形合金之顯著分數保持在固體形式的情況下,球將減慢與膏狀合金混合。因此,最終互連件展現不利的、非所欲性質之問題亦可得以減少或消除。
合金可有利地展現在相對長時間範圍內的緩慢及逐漸凝固。此可允許合金在凝固點之前移動並沉降。因此,最終互連件中區域化應力點之出現將得以減少。
合金為無鉛的,此意指不有意地添加鉛。因此,鉛含量為零或不超過意外雜質量。
合金包含20 wt.%至35 wt.%的鉍。較佳地,合金包含21 wt.%至31 wt.%的鉍、更佳21 wt.%至26 wt.%的鉍、甚至更佳21.5 wt.%至25.5 wt.%的鉍。在一個較佳實施例中,合金包含21.5 wt.%至22.5 wt.%的鉍,例如,約22 wt.%。在一替代較佳實施例中,合金包含22.5 wt.%至23.5 wt.%的鉍,例如,約23 wt.%。在一替代較佳實施例中,合金包含24.5 wt.%至25.5 wt.%的鉍,例如,約25 wt.%。在一替代較佳實施例中,合金包含29.5 wt.%至30.5 wt.%的鉍,例如,約30 wt.%。呈指定量的鉍之存在可用以降低合金之熔點。鉍亦可經由固溶強化而改良機械性質。鉍亦可起作用以改良抗潛變性。鉍亦可改良濕潤及展佈。
合金包含0.01 wt.%至10 wt.%的銅。較佳地,合金包含0.1 wt.%至3 wt.%的銅、更佳0.1 wt.%至2.5 wt.%的銅、甚至更佳0.1 wt.%至1.5 wt.%的銅、仍甚至更佳0.15 wt.%至0.5 wt.%的銅、仍甚至更佳0.18 wt.%至0.3 wt.%的銅。在一個較佳實施例中,合金包含0.15 wt.%至0.25 wt.%的銅。在一替代較佳實施例中,合金包含0.8 wt.%至1.2 wt.%的銅。在一替代較佳實施例中,合金包含1.8 wt.%至2.2 wt.%的銅。呈指定量的銅之存在可用以經由金屬間化合物之形成而改良機械性質,例如強度。另外,銅之存在減少銅溶解且亦可改良抗潛變性。
焊料合金包含以下一或多者 0.001 wt.%至4 wt.%的銻, 0.001 wt.%至1 wt.%的鈷, 0.001 wt.%至1 wt.%的鍺, 0.001 wt.%至1 wt.%的錳, 0.001 wt.%至1 wt.%的鎳, 0.001 wt.%至1 wt.%的鈦。
在一較佳實施例中,合金包含此等元素之一者。在一替代較佳實施例中,合金包含此等元素之兩者。在一較佳實施例中,合金包含鍺及該等元素之一或多者、較佳此等元素之一者。合金較佳地包含鍺及鈷,或鍺及錳,或鍺及鎳。
合金可包含0.001 wt.%至4 wt.%的銻。較佳地,合金包含1 wt.%至3 wt.%的銻、更佳1.5 wt.%至2.5 wt.%的銻、甚至更佳1.8 wt.%至2.2 wt.%的銻、仍甚至更佳約2 wt.%的銻。銻可用作去氧劑。銻可用以改良強度、界面反應及抗潛變性。
合金可包含0.001 wt.%至1 wt.%的鈷。較佳地,合金包含0.01 wt.%至0.5 wt.%的鈷、更佳0.01 wt.%至0.1 wt.%的鈷、甚至更佳0.01 wt.%至0.08 wt.%的鈷、仍甚至更佳0.02 wt.%至0.04 wt.%的鈷、仍甚至更佳0.025 wt.%至0.035 wt.%的鈷、仍甚至更佳約0.03 wt.%的鈷。鈷可減慢在基板/焊料界面處IMC形成之速率,且增加耐落下式衝擊性。鈷亦改良抗潛變性及熱循環可靠性。
合金可包含0.001 wt.%至1 wt.%的鍺。較佳地,合金包含0.001 wt.%至0.1 wt.%的鍺、更佳0.001 wt.%至0.01 wt.%的鍺、甚至更佳0.002 wt.%至0.008 wt.%的鍺、仍甚至更佳0.003 wt.%至0.007 wt.%的鍺、仍甚至更佳0.004 wt.%至0.006 wt.%的鍺、仍甚至更佳約0.005 wt.%的鍺。呈指定量的鍺之存在可用以改良強度及界面反應。鍺亦可用作去氧劑。鍺可改良可濕性及展佈。
合金可包含0.001 wt.%至1 wt.%的錳。較佳地,合金包含0.005 wt.%至0.1 wt.%的錳、更佳0.005 wt.%至0.02 wt.%的錳、甚至更佳0.008 wt.%至0.012 wt.%的錳、仍甚至更佳0.009 wt.%至0.011 wt.%的錳、仍甚至更佳約0.01 wt.%的錳。呈指定量的錳之存在可用以改良強度、界面反應及抗潛變性。錳亦可改良落下式衝擊及熱循環可靠性。
合金可包含0.001 wt.%至1 wt.%的鎳。較佳地,合金包含0.01 wt.%至0.1 wt.%的鎳、更佳0.02 wt.%至0.08 wt.%的鎳、甚至更佳0.025 wt.%至0.035 wt.%的鎳、仍甚至更佳0.028至0.032 wt.%的鎳、仍甚至更佳約0.03 wt.%的鎳。呈指定量的鎳之存在可用以經由與錫的金屬間化合物之形成而改良機械性質,錫可產生析出強化。鎳亦可藉由減少基板/焊料界面處的IMC生長而增加耐落下式衝擊性。
合金可包含0.001 wt.%至1 wt.%的鈦。較佳地,合金包含0.005 wt.%至0.1 wt.%的鈦、更佳0.01 wt.%至0.05 wt.%的鈦。呈指定量的鈦之存在可用以改良強度、界面反應及抗潛變性。鈦亦可藉由控制基板/焊料界面處的銅擴散而改良落下式衝擊效能。
合金視情況包含至多10 wt.%的銀。較佳地,合金包含至多2 wt.%的銀、更佳0.1 wt.%至1.8 wt.%的銀、甚至更佳0.5 wt.%至1.5 wt.%的銀、仍甚至更佳0.9 wt.%至1.1 wt.%的銀、仍甚至更佳約1 wt.%的銀。呈指定量的銀之存在可用以經由金屬間化合物之形成而改良機械性質,例如強度。另外,銀之存在可起作用以改良濕潤、展佈、抗潛變性及熱循環可靠性。
合金視情況包含至多3 wt.%的銦。較佳地,合金包含至多1 wt.%的銦、更佳0.005 wt.%至1 wt.%的銦、甚至更佳0.01 wt.%至0.05 wt.%。銦之存在可起作用以經由固溶強化而改良機械性質。呈所列舉量的銦連同另一合金元素之存在亦可用以降低合金之液相線溫度。
合金視情況包含至多3 wt.%的之鎵。較佳地,合金包含至多2 wt.%的鎵、更佳0.005 wt.%至1 wt.%的鎵、甚至更佳0.01 wt.%至0.05 wt.%。鎵之存在可起作用以經由固溶強化而改良機械性質。鎵亦可用作去氧劑。鎵可改良可濕性及展佈。
合金可視情況含有以下一或多者:至多1 wt.%的金(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鉻(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋅(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鐵(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋁(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的碲(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的硒(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鉬(例如0.01 wt.%至0.1 wt.%)及至多1 wt.%的鉑(例如0.01 wt.%至0.1 wt.%)。此等元素可用作去氧劑。此等元素可用以改良強度及界面反應。鋅之存在可起作用以經由固溶強化而改良機械性質。
合金可視情況含有以下一或多者:至多1 wt.%的磷(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋁(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鈣(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鎂(例如0.01 wt.%至0.1 wt.%)及至多1 wt.%的釩(例如0.01 wt.%至0.1 wt.%)。此等元素可用作去氧劑。此等元素之存在可改良合金之可濕性。
合金可視情況含有至多1 wt.%的稀土元素(例如0.01 wt.%至0.1 wt.%)。稀土可起作用以改良展佈及可濕性。已發現就此而言鈰為尤其有效的。
合金將典型地包含至少74 wt.%的錫、更典型至少80 wt.%的錫、仍更典型至少85 wt.%的錫。
在一較佳實施例中,合金包含29 wt.%至31 wt.%的鉍、1.8 wt.%至2.2 wt.%的銅、1.8 wt.%至2.2 wt.%的銻,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含24 wt.%至26 wt.%的鉍、0.8 wt.%至1.2 wt.%的銅、0.03 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.008 wt.%至0.012 wt.%的錳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含24 wt.%至26 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鎳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鎳、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.005 wt.%至0.02 wt.%的錳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
在一較佳實施例中,合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
焊料合金較佳地具有210℃或更小、更佳205℃或更小之液相線溫度。
固相線溫度與液相線溫度之間的差異較佳為至少30℃、更佳為至少50℃。
將瞭解,本文描述的合金可含有不可避免的雜質,但總體上,此等雜質不可能超過組成物之1 wt.%。較佳地,合金含有呈以下量的不可避免的雜質:不超過組成物之0.5 wt.%、更佳不超過組成物之0.3 wt.%、仍更佳不超過組成物之0.1 wt.%、仍更佳不超過組成物之0.05 wt.%且最佳不超過組成物之0.02 wt.%。
本文描述的合金可主要由所列舉元素組成。因此將瞭解,除必須要求的彼等元素之外,其他非指定元素可存在於組成物中,條件是組成物之基本特性不受該等元素存在之實質影響。
合金可呈例如以下形式:棒材、棍材、實心或含銲劑芯銲線、箔或條、薄膜、預製件、或粉末或膏狀物(粉末加助焊劑摻合物)、或用於球柵陣列接頭或晶片尺度封裝之焊料球、或其他具有或不具有焊劑芯或焊劑塗層之預製焊料塊、或回流或固化焊料接頭、或諸如銅帶的任何可焊接材料上之預塗覆件。
在一較佳實施例中,焊料合金係呈膏狀物之形式。典型地,膏狀物包含分散在助焊劑中的焊料合金之粒子,典型地為粉末。
在一較佳實施例中,焊料合金係呈預製件之形式。預製件為經特別設計用於欲使用焊料之應用的預製形狀之焊料。許多方法可用以製造焊料預製件,例如衝壓。預製件可包含助焊劑。助焊劑可為焊料預製件內的內部助焊劑及/或塗佈焊料預製件之外部助焊劑。
在另一態樣中,本發明提供包含如本文描述的合金之焊料接頭。
在另一態樣中,本發明提供具有焊料凸塊之球柵陣列或晶片尺度封裝,該焊料凸塊包含如本文描述的合金。
在另一態樣中,本發明提供具有焊料凸塊之晶片尺度封裝,該焊料凸塊包含如本文描述的合金。
在另一態樣中,本發明提供包含如本文描述的合金之光伏打電池。
在另一態樣中,本發明提供包含本文描述的合金及助焊劑之焊錫膏。
在另一態樣中,本發明提供形成焊料接頭之方法,該方法包含: (i) 提供將接合的兩個或兩個以上工件; (ii) 提供如本文描述的焊料合金;及 (iii) 在將接合的工件附近加熱焊料合金。
在另一態樣中,本發明提供如本文描述的合金在焊接方法中之用途,該焊接方法諸如波焊、表面安裝技術(Surface Mount Technology;SMT)焊接、晶粒附接焊接、熱界面焊接、手工焊接、雷射及RF感應焊接、對太陽能模組之焊接、LED組件板之焊料及重加工焊接。
在另一態樣中,本發明提供如本文描述的合金用於增加球柵陣列或晶片尺度封裝之焊料接頭中之間隙高度的用途。典型地,焊料接頭由回流形成,該回流處於低於合金之液相線溫度的溫度下以產生合金之部分熔融。
在另一態樣中,本發明提供在電路板與球柵陣列或倒裝晶片或晶片尺度封裝之焊料凸塊之間形成焊料接頭之方法,該方法包含: 提供電路板; 提供具有焊料凸塊之球柵陣列或倒裝晶片或晶片尺度封裝,該焊料凸塊包含第一合金,該第一合金為如本文描述的合金; 將焊錫膏安置在電路板及焊料凸塊附近,該焊錫膏包含第二合金,該第二合金具有比第一合金之液相線溫度低的液相線溫度;及 加熱焊錫膏以在電路板與焊料凸塊之間形成焊料接頭。
電路板可例如印刷電路板(printed circuit board;PCB)。電路板可形成光伏打電池之部分。
焊錫膏可手動地安置或藉由使用自動化設備安置。焊錫膏典型地包含助焊劑。焊錫膏典型地為黏結的以便保持在其所欲位置中。第二合金典型地呈粉末形式。
加熱典型地在低於第一合金之液相線溫度的溫度下進行,典型地在160℃至175℃或160℃至170℃之溫度下進行。加熱可例如在習知回流烘箱中進行。此等烘箱此項技術中為已知的。用於加熱步驟之適合溫度在此項技術中為已知的,但可例如為200℃或更小、190℃或更小、180℃或更小、170℃或更小、150℃或更小、140℃或更小,大於130℃或大於140℃或大於150℃。
第二合金之液相線溫度可比第一合金之彼液相線溫度低至少10℃、較佳低至少20℃。 該方法可進一步包含例如將電路板併入光伏打電池中。
第二合金可包含例如SnBi合金或SnBi與其他合金化添加物,諸如,例如Ag及/或Cu及/或Ni及/或Co及/或Mn及/或Ti。
第二合金較佳地包含42Sn-58Bi或其他近共晶Sn-Bi合金,該等合金展現適用於針對低溫組分的第二或第三回流之低熔融溫度。
在另一態樣中,本發明提供在電路板與球柵陣列或倒裝晶片或晶片尺度封裝之焊料凸塊之間形成焊料接頭之方法,該方法包含: 提供電路板; 提供具有焊料凸塊之球柵陣列或倒裝晶片或晶片尺度封裝,該焊料凸塊包含第一合金; 將焊錫膏安置在電路板及焊料凸塊附近,該焊錫膏包含第二合金,該第二合金為如本文描述的合金;及 加熱焊錫膏以在電路板與焊料凸塊之間形成焊料接頭, 其中第一合金具有比第二合金之液相線溫度高的液相線溫度。
加熱可例如在習知回流烘箱中進行。此等烘箱此項技術中為已知的。用於加熱步驟之適合溫度在此項技術中為已知的,但可例如為240℃或更小、235℃或更小、230℃或更小、225℃或更小、220℃或更小,大於200℃或大於210℃。
第一合金可具有比第二合金之彼液相線溫度高至少10℃、較佳高至少20℃的液相線溫度。
第一合金較佳地包含Sn-3Ag-0.5Cu。Sn-3Ag-0.5Cu合金展現高熔融溫度及適用於第一回流之有利機械性質。在一較佳實施例中,第一合金包含Sn-4Ag-0.5Cu。在一較佳實施例中,第一合金包含Sn-Ag或Sn-Cu或Sn-Ag-Cu合金。
在另一態樣中,本發明提供無鉛焊料合金,其包含: 8 wt.%至12 wt.%的鉍 以下一或多者: 0.5 wt.%至7 wt.%的銦 0.1 wt.%至1.5 wt.%的銅 0.5 wt.%至1.5 wt.%的銀 視情況以下一或多者: 至多1 wt.%的鈷 至多1 wt.%的鎳 至多1 wt.%的鈦 至多1 wt.%的錳 至多2 wt.%的鎵 至多1 wt.%的鍺 至多1 wt.%的金 至多1 wt.%的鉻 至多1 wt.%的磷 至多1 wt.%的鋅 至多1 wt.%的鐵 至多1 wt.%的銻 至多1 wt.%的鋁 至多1 wt.%的碲 至多1 wt.%的硒 至多1 wt.%的鈣 至多1 wt.%的釩 至多1 wt.%的鉬 至多1 wt.%的鉑 至多1 wt.%的鎂 至多1 wt.%的稀土元素 余量為錫連同任何不可避免的雜質。
合金展現與第一態樣之合金類似的優點。合金可展現尤其有利的機械性質,且可有利地例如用於球柵陣列或晶片尺度封裝或倒裝晶片組裝製程。合金可展現與第一態樣之合金相比更有利的機械性質,例如較高硬度。
本發明之此態樣可與本發明之任何其他態樣組合。例如,本發明之此態樣之合金可用於如上所述的焊料接頭、球柵陣列、晶片尺度封裝、光伏打電池、方法及用途。
合金包含8 wt.%至12 wt.%的鉍。較佳地,合金包含8.5 wt.%至11.5 wt.%的鉍、更佳9 wt.%至11 wt.%的鉍、甚至更佳9.5 wt.%至10.5 wt.%的鉍、仍甚至更佳約10 wt.%的鉍。呈指定量的鉍之存在可用以降低合金之熔點。鉍亦可經由固溶強化而改良機械性質。鉍亦可起作用以改良抗潛變性。鉍亦可改良濕潤及展佈。
在此態樣中,焊料合金包含以下一或多者: 0.5 wt.%至7 wt.%的銦, 0.1 wt.%至1.5 wt.%的銅, 0.5 wt.%至1.5 wt.%的銀。
換言之,若銦存在於合金中,則銦必須以0.5 wt.%至7 wt.%之量存在,若銅存在於合金中,則銅必須以0.1 wt.%至1.5 wt.%的銅之量存在,且若銀存在,則銀必須以0.5 wt.%至1.5 wt.%之量存在。焊料合金較佳地包含銦、銅及銀中僅一者。合金可包含銅及銀但無銦。合金可包含銦及銀但無銅。合金可包含銦及銅但無銀。合金可包含銦、銅及銀。
合金可包含0.5 wt.%至7 wt.%的銦。合金較佳地包含1至6 wt.%的銦、更佳1.5 wt.%至3.5 wt.%的銦。合金可較佳地包含0.5 wt.%至1.5 wt.%的銦、更佳0.7 wt.%至1.2 wt.%的銦。替代地,合金較佳地包含1.5 wt.%至2.5 wt.%的銦、更佳1.8 wt.%至2.2 wt.%的銦。替代地,合金較佳地包含2.5 wt.%至3.5 wt.%的銦、更佳2.8 wt.%至3.2 wt.%的銦。替代地,合金較佳地包含5.5 wt.%至6.5 wt.%的銦、更佳5.8 wt.%至6.2 wt.%的銦。銦之存在可起作用以經由固溶強化而改良機械性質。呈列舉量的銦連同另一合金元素之存在亦可用以降低合金之液相線溫度。
合金可包含0.1 wt.%至1.5 wt.%的銅。較佳地,合金包含0.2 wt.%至1.2 wt.%的銅、更佳0.3 wt.%至1 wt.%的銅。合金可較佳地包含0.2 wt.%至0.4 wt.%的銅。替代地,合金可較佳地包含0.4 wt.%至0.6 wt.%的銅。替代地,合金可較佳地包含0.6 wt.%至0.8 wt.%的銅。替代地,合金可較佳地包含0.8 wt.%至1.2 wt.%的銅。呈指定量的銅之存在可用以經由金屬間化合物之形成而改良機械性質,例如強度。另外,銅之存在減少銅溶解且亦可改良抗潛變性。
合金可包含0.5 wt.%至1.5 wt.%的銀。較佳地,合金包含0.7 wt.%至1.3 wt.%的銀、更佳0.9 wt.%至1.1 wt.%的銀。呈指定量的銀之存在可用以經由金屬間化合物之形成而改良機械性質,例如強度。另外,銀之存在可起作用以改良濕潤及展佈。
合金視情況包含至多1 wt.%的鈷,例如0.01 wt.%至1 wt.%。若鈷存在,則合金較佳地包含0.005 wt.%至0.1 wt.%的鈷、更佳0.005 wt.%至0.05 wt.%的鈷、甚至更佳0.009 wt.%至0.04 wt.%的鈷。鈷可減慢在基板/焊料界面處IMC形成之速率,且增加耐落下式衝擊性。
合金視情況包含至多1 wt.%的鎳,例如0.01 wt.%至1 wt.%。若鎳存在,則合金較佳地包含0.01 wt.%至0.1 wt.%的鎳、更佳0.01 wt.%至0.05 wt.%的鎳、甚至更佳0.02 wt.%至0.04 wt.%的鎳。呈指定量的鎳之存在可用以經由與錫的金屬間化合物之形成而改良機械性質,錫可產生析出強化。鎳亦可藉由減少基板/焊料界面處的IMC生長而增加耐落下式衝擊性。
合金視情況包含至多1 wt.%的鈦,例如0.005 wt.%至1 wt.%。若鈦存在,則合金較佳地包含0.001 wt.%至0.1 wt.%的鈦、更佳0.01 wt.%至0.05 wt.%的鈦、甚至更佳0.02 wt.%至0.04 wt.%的鈦。呈指定量的鈦之存在可用以改良強度及界面反應。鈦亦可藉由控制基板/焊料界面處的銅擴散而改良落下式衝擊效能。
合金視情況包含至多1 wt.%的錳,例如0.005 wt.%至1 wt.%。若錳存在,則合金較佳地包含0.005 wt.%至0.1 wt.%的錳、更佳0.008 wt.%至0.05 wt.%的錳、甚至更佳0.009 wt.%至0.03 wt.%的錳。呈指定量的錳之存在可用以改良強度及界面反應。錳亦可改良落下式衝擊效能。
合金視情況包含至多1 wt.%的鎵,例如0.005 wt.%至1 wt.%。若鎵存在,則合金較佳地包含0.1 wt.%至1 wt.%的鎵、更佳0.3 wt.%至0.9 wt.%的鎵、甚至更佳0.5 wt.%至0.7 wt.%的鎵。鎵之存在可起作用以經由固溶強化而改良機械性質。
合金視情況包含至多1 wt.%的鍺,例如0.005 wt.%至1 wt.%。若鍺存在,則合金較佳地包含0.01 wt.%至0.1 wt.%的鍺、更佳0.02 wt.%至0.08 wt.%的鍺、甚至更佳0.03 wt.%至0.07 wt.%的鍺。呈指定量的鍺之存在可用以改良強度及界面反應。鍺亦可用作去氧劑。鍺可改良可濕性及展佈。
合金可視情況含有以下一或多者:至多1 wt.%的磷(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋁(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鈣(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鎂(例如0.01 wt.%至0.1 wt.%)及至多1 wt.%的釩(例如0.01 wt.%至0.1 wt.%)。此等元素可用作去氧劑。此等元素之存在可改良合金之可濕性。
合金可視情況含有以下一或多者:至多1 wt.%的金(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鉻(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋅(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鐵(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的銻(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鋁(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的碲(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的硒(例如0.01 wt.%至0.1 wt.%)、至多1 wt.%的鉬(例如0.01 wt.%至0.1 wt.%)及至多1 wt.%的鉑(例如0.01 wt.%至0.1 wt.%)。此等元素可用作去氧劑。此等元素可用以改良強度及界面反應。鋅之存在可起作用以經由固溶強化而改良機械性質。
合金可視情況含有至多1 wt.%的稀土元素(例如0.01 wt.%至0.1 wt.%)。稀土可起作用以改良展佈及可濕性。已發現就此而言鈰為尤其有效的。
合金將典型地包含至少74 wt.%的錫、更典型至少80 wt.%的錫、仍更典型至少85 wt.%的錫。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍及0.8 wt.%至1.2 wt.%的銅,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、2.5 wt.%至3.5 wt.%的銦及0.01 wt.%至0.05 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、0.3 wt.%至0.7 wt.%的鎵及0.1 wt.%至0.5 wt.%的銅,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含11 wt.%至12 wt.%的鉍、0.8 wt.%至1.2 wt.%的銅及0.01 wt.%至0.05 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含8 wt.%至9 wt.%的鉍、0.8 wt.%至1.2 wt.%的銅及0.01 wt.%至0.05 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、2.5 wt.%至2.5 wt.%的銦及0.005 wt.%至0.015 wt.%的錳,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、1.5 wt.%至2.5 wt.%的銦、0.3 wt.%至0.7 wt.%的銅及0.01 wt.%至0.05 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含8 wt.%至9 wt.%的鉍、2.5 wt.%至3.5 wt.%的銦、0.1 wt.%至0.5 wt.%的銅及0.01 wt.%至0.05 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、5.5 wt.%至6.5 wt.%的銦及0.4 wt.%至0.8 wt.%的鎵,餘量為錫連同任何不可避免的雜質。
在一較佳實施例中,合金包含9 wt.%至11 wt.%的鉍、0.5 wt.%至0.9 wt.%的銦、0.7 wt.%至1.1 wt.%的銦及0.005 wt.%至0.015 wt.%的鈷,餘量為錫連同任何不可避免的雜質。
焊料合金較佳地具有220℃或更小、更佳215℃或更小之液相線溫度。
在另一態樣中,本發明提供合金,其包含10 %wt至30 %wt的鉍、以下一或多者:Ag、Au、Cr、In、P、Cu、Zn、Co、Ge、Mn、Ni、Ti、Ga、Fe、Sb、Al、Te、Se、Ca、V、Mo、Pt、Mg、稀土,且餘量為Sn連同任何不可避免的雜質。在一個實施例中,合金包含10 %wt至30 %wt的Bi、以下一或多者:0.01%至10%的Ag、0.01%至10%的Cu、0.001 wt%至1 wt%的Co、0.001 wt%至1 wt%的Ni及0.001 wt%至3 wt%的In、0.001 wt%至4 wt%的Sb、0.001 wt%至1 wt%的Ti、0.001 wt%至3 wt%的Ga、0.001 wt%至1 wt%的Mn、0.001 wt%至1 wt%的Ge、0.001 wt%至1 wt%的Zn、0.001 wt%至1 wt%的Fe、0.001 wt%至1 wt%的Au、0.001 wt%至1 wt%的Cr、0.001 wt%至1 wt%的P、0.001 wt%至1 wt%的Al、0.001 wt%至1 wt%的Te、0.001 wt%至1 wt%的Se、0.001 wt%至1 wt%的Ca、0.001 wt%至1 wt%的V、0.001 wt%至1 wt%的Mo、0.001 wt%至1 wt%的Pt、0.001 wt%至1 wt%的Mg、0.001 wt%至1 wt%的稀土,且餘量為Sn連同不可避免的雜質。
在另一態樣中,本發明提供合金,其包含10 %wt至30 %wt的In、以下一或多者:Ag、Au、Cr、In、P、Cu、Zn、Co、Ge、Mn、Ni、Ti、Ga、Fe、Sb、Al、Te、Se、Ca、V、Mo、Pt、Mg、稀土,且餘量為Sn連同任何不可避免的雜質。在一個實施例中,合金包含10 %wt至30 %wt的In、以下一或多者:0.01%至10%的Ag、0.01%至10%的Cu、0.001 wt%至1 wt%的Co、0.001 wt%至1 wt%的Ni及0.001 wt%至3 wt%的Bi、0.001 wt%至4 wt%的Sb、0.001 wt%至1 wt%的Ti、0.001 wt%至3 wt%的Ga、0.001 wt%至1 wt%的Mn、0.001 wt%至1 wt%的Ge、0.001 wt%至1 wt%的Zn、0.001 wt%至1 wt%的Fe、0.001 wt%至1 wt%的Au、0.001 wt%至1 wt%的Cr、0.001 wt%至1 wt%的P、0.001 wt%至1 wt%的Al、0.001 wt%至1 wt%的Te、0.001 wt%至1 wt%的Se、0.001 wt%至1 wt%的Ca、0.001 wt%至1 wt%的V、0.001 wt%至1 wt%的Mo、0.001 wt%至1 wt%的Pt、0.001 wt%至1 wt%的Mg、0.001 wt%至1 wt%的稀土,且餘量為Sn連同不可避免的雜質。
參考第1圖,展示附接至電路板2之BGA組件1之圖解。形成BGA凸塊(球)之習知焊料3與用於將電路板2附接至BGA組件1的焊料4相同。習知焊料3、4展現低間隙5,此歸因於在第二回流期間球之完全崩塌。此低間隙總成產生在焊料-墊界面處經歷的高剪切應力。
參考第2圖,展示附接至電路板7之BGA組件6之圖解。形成BGA凸塊之焊料8為根據本發明的焊料,且用於將電路板7附接至BGA組件6之焊料9為習知SnBi共晶焊料。焊料8、9展現高的間隙10,因為本發明之焊料8之顯著分數在第二回流期間保持呈固體形式。因此,與習知焊料9混合較慢。此高間隙總成減少在焊料-墊界面處經歷的剪切應力。
現將進一步參考以下非限制性實例描述本發明。實例 1-12
許多合金經製備而具有表1中所列的組成。在表徵典型回流溫度之某些高溫下將固相線溫度及液相線溫度連同固體分數一起量測。結果展示於表1中。 表1:在各種溫度下之固相線溫度、液相線溫度及固體分數。(*比較實例。)
根據Sn-Bi相位圖,存在具有58 wt.%的鉍及42 wt.%的錫之共晶合金組成物,其具有大約138℃之熔點。減少鉍含量增加此合金之液相線溫度。例如,減少鉍含量至25 wt.% (比較實例2)產生207℃之液相線溫度,從而使得此合金為用於第二回流之良好候選物。然而,若鉍含量進一步減小,例如減小至20 wt.% (比較實例1),則其液相線溫度對於第二回流而言過高。對具有25 wt.%的銦及75 wt.%的錫之合金而言,液相線溫度為188℃,其亦適合於第二回流。然而,此合金之製造成本為25 wt.%的鉍及75 wt.%的錫之合金的成本之數倍,從而使得此合金難以在商業上使用,尤其難以用於具有極小利潤邊際之可攜式電子設備。
表1展示:具有在約20 wt.%與35 wt.%之間的鉍含量之合金將液相線溫度限制至約204℃,此取決於合金化添加物。在此等實例中,固相線溫度在133℃與136℃之間,並由於合金添加物而具有小的變化。相同實例展示:較高液相線溫度將確保較高間隙(此處由在165℃及175℃下之固體分數來例證)。根據本發明之實例與Sn-25Bi合金相比的較高固體分數產生用於上述目的的較好焊料接頭。
對表1之合金中的一些進行維氏硬度測試(Hv-0.5)且將結果展示於第3圖中。可見,與Sn-25Bi合金相比(比較實例2),合金化元素之添加引起硬度之增加。實例 13-23
許多合金根據本發明經製備而具有表2中所列的組成。在185℃下將固相線溫度及液相線溫度連同固體分數一起量測。結果展示於表2中。 表2:在185℃下之固相線溫度、液相線溫度及固體分數。
表2展示:鉍含量進一步減小至約15 wt.%或低於15 wt.%使相位圖中之Sn-Bi組成物移動,以使得固相線溫度增加至高於145℃,從而對此合金之熱機械性質(例如,耐落下式衝擊性及熱循環效能)有益。然而,如實例13及17所示,低於約10 wt.%之鉍含量產生高於215℃之液相線溫度,從而可使得合金較不適合用於Sn-Ag-Cu合金用於第一回流的總成中之第二回流。然而,Ga及In之小量添加在針對第二回流的可接受量內減少其液相線溫度。
第3圖展示:鉍含量之減小及In及Ga之小量添加增加了合金之硬度。例如,將實例15及22比較,存在硬度之25%增加,在不受理論約束的情況下,此增加被視為主要由6 wt.%的銦添加而產生。另外,在實例15與實例22之間,在185℃下之固體分數自1%增加至19%,從而將產生用於上述目的的較好焊料接頭。
前述詳細描述已藉助於說明及例示方式提供,且不欲限制隨附申請專利範圍之範疇。本文中例示的本發明之較佳實施例中的許多變化將對一般技藝人士而言為明顯的,且保持在隨附申請專利範圍及其等效物之範疇內。
1‧‧‧BGA組件 2‧‧‧電路板 3‧‧‧焊料 4‧‧‧焊料 5‧‧‧間隙 6‧‧‧BGA組件 7‧‧‧電路板 8‧‧‧焊料 9‧‧‧焊料 10‧‧‧間隙
現將參考以下圖式進一步藉助於此等合金之幾個非限制性實例及對其效能之概述來描述本發明,圖式中:
第1圖展示附接至電路板的展示低間隙之BGA之圖解。
第2圖展示附接至電路板的展示高間隙之BGA之圖解。
第3圖展示根據本發明之示例性合金及比較實例之硬度(Hv-0.5)圖。
國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無
國外寄存資訊 (請依寄存國家、機構、日期、號碼順序註記) 無
(請換頁單獨記載) 無
1‧‧‧BGA組件
2‧‧‧電路板
3‧‧‧焊料
4‧‧‧焊料
5‧‧‧間隙

Claims (38)

  1. 一種無鉛焊料合金,其包含: 20 wt.%至35 wt.%的鉍,0.01 wt.%至10 wt.%的銅,以下一或多者:0.001 wt.%至4 wt.%的銻,0.001 wt.%至1 wt.%的鈷,0.001 wt.%至1 wt.%的鍺,0.001 wt.%至1 wt.%的錳,0.001 wt.%至1 wt.%的鎳,0.001 wt.%至1 wt.%的鈦,視情況以下一或多者:至多3 wt.%的銦,至多10 wt.%的銀,至多3 wt.%的鎵,至多1 wt.%的金,至多1 wt.%的鉻,至多1 wt.%的磷,至多1 wt.%的鋅,至多1 wt.%的鐵,至多1 wt.%的鋁,至多1 wt.%的碲,至多1 wt.%的硒,至多1 wt.%的鈣,至多1 wt.%的釩,至多1 wt.%的鉬,至多1 wt.%的鉑,至多1 wt.%的鎂,至多1 wt.%的稀土元素,餘量為Sn及任何不可避免之雜質。
  2. 如請求項1所述之焊料合金,其中該合金包含21 wt.%至31 wt.%的鉍、較佳21 wt.%至26 wt.%的鉍、更佳21.5 wt.%至25.5 wt.%的鉍。
  3. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.1 wt.%至3 wt.%的銅、較佳0.1 wt.%至2.5 wt.%的銅、更佳0.1 wt.%至1.5 wt.%的銅、甚至更佳0.15 wt.%至0.5 wt.%的銅、仍甚至更佳0.18 wt.%至0.3 wt.%的銅。
  4. 如請求項1或請求項2所述之焊料合金,其中該合金包含1 wt.%至3 wt.%的銻、較佳1.5 wt.%至2.5 wt.%的銻、更佳1.8 wt.%至2.2 wt.%的銻。
  5. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.01 wt.%至0.5 wt.%的鈷、較佳0.01 wt.%至0.1 wt.%的鈷、更佳0.01 wt.%至0.08 wt.%的鈷、甚至更佳0.02 wt.%至0.04 wt.%的鈷、仍甚至更佳0.025 wt.%至0.035 wt.%的鈷。
  6. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.001 wt.%至0.1 wt.%的鍺、較佳0.001 wt.%至0.01 wt.%的鍺、更佳0.002 wt.%至0.008 wt.%的鍺、甚至更佳0.003 wt.%至0.007 wt.%的鍺、仍甚至更佳0.004 wt.%至0.006 wt.%的鍺。
  7. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.005 wt.%至0.1 wt.%的錳、較佳0.005 wt.%至0.02 wt.%的錳、更佳0.008 wt.%至0.012 wt.%的錳、甚至更佳0.009 wt.%至0.011 wt.%的錳。
  8. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.01 wt.%至0.1 wt.%的鎳、較佳0.02 wt.%至0.08 wt.%的鎳、更佳0.025 wt.%至0.035 wt.%的鎳、甚至更佳0.028至0.032 wt.%的鎳。
  9. 如請求項1或請求項2所述之焊料合金,其中該合金包含0.005 wt.%至0.1 wt.%的鈦、較佳0.01 wt.%至0.05 wt.%的鈦。
  10. 如請求項1或請求項2所述之焊料合金,其中該合金包含至多1 wt.%的銀、較佳0.1 wt.%至1.8 wt.%的銀、更佳0.5 wt.%至1.5 wt.%的銀、甚至更佳0.9 wt.%至1.1 wt.%的銀。
  11. 如請求項1所述之焊料合金,其中該合金包含29 wt.%至31 wt.%的鉍、1.8 wt.%至2.2 wt.%的銅、1.8 wt.%至2.2 wt.%的銻,餘量為Sn及任何不可避免的雜質。
  12. 如請求項1所述之焊料合金,其中該合金包含24 wt.%至26 wt.%的鉍、0.8 wt.%至1.2 wt.%的銅、0.03 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
  13. 如請求項1所述之焊料合金,其中該合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
  14. 如請求項1所述之焊料合金,其中該合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.008 wt.%至0.012 wt.%的錳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
  15. 如請求項1所述之焊料合金,其中該合金包含24 wt.%至26 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鎳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
  16. 如請求項1所述之焊料合金,其中該合金包含22 wt.%至24 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鎳、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
  17. 如請求項1所述之焊料合金,其中該合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.02 wt.%至0.04 wt.%的鈷、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
  18. 如請求項1所述之焊料合金,其中該合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.005 wt.%至0.02 wt.%的錳、0.003 wt.%至0.007 wt.%的鍺,餘量為Sn及任何不可避免的雜質。
  19. 如請求項1所述之焊料合金,其中該合金包含21 wt.%至23 wt.%的鉍、0.15 wt.%至0.25 wt.%的銅、0.003 wt.%至0.007 wt.%的鍺、0.5 wt.%至1.5 wt.%的銀,餘量為Sn及任何不可避免的雜質。
  20. 如請求項1所述之焊料合金,其中該合金具有210℃或更小、較佳205℃或更小之一液相線溫度。
  21. 如請求項1所述之焊料合金,其中該固相線溫度與該液相線溫度之間的差異為至少30℃、較佳為至少50℃。
  22. 如請求項1所述之焊料合金,其呈以下形式:一棒材、一棍材、一實心或含銲劑芯銲線、一箔或條、一薄膜、一預製件、或一粉末或膏狀物(粉末加助焊劑摻合物)、或用於球柵陣列接頭或晶片尺度封裝之焊料球、或其他具有或不具有一焊劑芯或一焊劑塗層之預製焊料塊、或一回流或固化焊料接頭、或諸如一銅帶的任何可焊接材料上之預塗覆件。
  23. 如請求項22所述之焊料合金,其其呈一膏狀物形式。
  24. 如請求項22所述之焊料合金,其呈一預製件形式。
  25. 一種焊料接頭,其包含一如請求項1至24中任一項所述之合金。
  26. 一種具有一焊料凸塊之球柵陣列,該焊料凸塊包含如請求項1至24中任一項所述之合金。
  27. 一種具有一焊料凸塊之晶片尺度封裝,該焊料凸塊包含如請求項1至24中任一項所述之合金。
  28. 一種光伏打電池,其包含如請求項1至24中任一項所述之合金。
  29. 一種形成一焊料接頭之方法,該方法包含以下步驟: (i)提供將接合的兩個或兩個以上工件;(ii)提供一如請求項1至24中任一項定義之焊料合金;及(iii)在該等將接合的工件附近加熱該焊料合金。
  30. 一種如請求項1至24中任一項所定義的合金在一焊接方法中之用途,該焊接方法諸如波焊、表面安裝技術(SMT)焊接、晶粒附接焊接、熱界面焊接、手工焊接、雷射及RF感應焊接、對一太陽能模組之焊接、LED組件板之焊料及重加工焊接。
  31. 一種如請求項1至24中任一項所述之合金用於增加一球柵陣列或晶片尺度封裝之一焊料接頭中之間隙高度的用途。
  32. 如請求項31所述之用途,其中該焊料接頭由回流形成,該回流處於低於該合金之該液相線溫度的一溫度下以產生該合金之部分熔融。
  33. 一種在一電路板與一球柵陣列或倒裝晶片或晶片尺度封裝之一焊料凸塊之間形成一焊料接頭之方法,該方法包含以下步驟: 提供一電路板;提供具有一焊料凸塊之一球柵陣列或倒裝晶片或晶片尺度封裝,該焊料凸塊包含一第一合金,該第一合金為如如請求項1至24中任一項所述之合金;將一焊錫膏安置在該電路板及該焊料凸塊附近,該焊錫膏包含一第二合金,該第二合金具有比該第一合金之該液相線溫度低的一液相線溫度;及加該熱焊錫膏以在該電路板與該焊料凸塊之間形成一焊料接頭。
  34. 如請求項33所述之方法,其中該第二合金包含42Sn-58Bi或SnBi與其他合金化添加物,諸如,例如Ag及/或Cu及/或Ni及/或Co及/或Mn及/或Ti。
  35. 一種在一電路板與一球柵陣列或倒裝晶片或晶片尺度封裝之一焊料凸塊之間形成一焊料接頭之方法,該方法包含以下步驟: 提供一電路板;提供具有一焊料凸塊之一球柵陣列或倒裝晶片或晶片尺度封裝,該焊料凸塊包含一第一合金;將一焊錫膏安置在該電路板及該焊料凸塊附近,該焊錫膏包含一第二合金,該第二合金為如請求項1至24中任一項所述之合金;及加熱該焊錫膏以在該電路板與該焊料凸塊之間形成一焊料接頭,其中該第一合金具有比該第二合金之液相線溫度高的一液相線溫度。
  36. 如請求項35所述之方法,其中該第一合金包含Sn-3Ag-0.5Cu。
  37. 如請求項35所述之方法,其中該第一合金包含Sn-4Ag-0.5Cu。
  38. 如請求項35所述之方法,其中該第一合金包含Sn-Ag或Sn-Cu或Sn-Ag-Cu合金。
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