TW201411117A - Inspection device - Google Patents

Inspection device Download PDF

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Publication number
TW201411117A
TW201411117A TW101132647A TW101132647A TW201411117A TW 201411117 A TW201411117 A TW 201411117A TW 101132647 A TW101132647 A TW 101132647A TW 101132647 A TW101132647 A TW 101132647A TW 201411117 A TW201411117 A TW 201411117A
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Taiwan
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unit
light
disposed
detecting device
stage
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TW101132647A
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Chinese (zh)
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TWI467160B (en
Inventor
Jen-Wei Lien
Nien-Ching Tsou
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Mas Automation Corp
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Abstract

The present invention provides an inspection device, which comprises a platform, a first inspection module and a second inspection module. The platform has a light-transmissive area. The first inspection module includes a moving unit and an image capturing unit. The moving unit moves with respect to the platform. The image capturing unit is installed on the moving unit, corresponds to the light-transmissive area, and can be driven by the moving unit to move with respective to the light-transmissive area. The second inspection module includes an oscillation unit and a conductive unit. The oscillation unit is installed on the platform and oscillates with respect to the light-transmissive area. The conductive unit is installed on the oscillation unit, and can be driven by the oscillation unit to relatively move close to or away from the light-transmissive area.

Description

檢測裝置 Testing device

本發明涉及一種檢測裝置的技術領域,特別是有關於一種可進行自動光學檢測及電性檢測的檢測裝置。 The present invention relates to the technical field of a detecting device, and more particularly to a detecting device capable of performing automatic optical detection and electrical detection.

無論是終端電子產品或中上游零組件,出貨的品質為客戶極為重視之一環,亦關係著製造商本身之商譽,因此產品檢測作業是不可或缺的一部分。一般而言,電子產品的產品檢測作業包含外觀及表面瑕疵檢測、電性瑕疵檢測。 Regardless of whether it is a terminal electronic product or a mid-stream component, the quality of the shipment is one of the most important aspects of the customer, and it is also related to the goodwill of the manufacturer itself. Therefore, the product inspection operation is an indispensable part. In general, product inspection operations for electronic products include appearance, surface flaw detection, and electrical flaw detection.

其中,外觀及表面瑕疵檢測是利用自動光學檢測(Automated Optical Inspection,AOI)方式檢測檢測一待測物的外觀及表面是否有瑕疵,例如平面顯示器(Flat Panel Display,FPD)的外觀及表面是否有亮點、暗點等瑕疵,又例如太陽能電池的外觀及表面是否有破碎等瑕疵。檢測方式是利用自動光學檢測(Automated Optical Inspection,AOI)方式檢測一待測物的瑕疵狀況。自動光學檢測方式是利用一具有影像擷取單元的檢測裝置擷取一待測物的影像,並比對該待測物的影像與一預設的影像之間的差異,藉以分析及判定該待測物的瑕疵狀況。該影像擷取單元包含一鏡頭及一電荷耦合元件(Charge-coupled Device,CCD)。 Among them, the appearance and surface flaw detection is an automatic optical inspection (AOI) method for detecting the appearance and surface of a test object, such as the appearance and surface of a flat panel display (FPD). Bright spots, dark spots, etc., and for example, the appearance and surface of the solar cell are broken. The detection method is to detect the flaw condition of a test object by using an automated optical inspection (AOI) method. The automatic optical detection method uses a detecting device having an image capturing unit to capture an image of an object to be tested, and compares and determines the difference between the image of the object to be tested and a predetermined image. The embarrassing condition of the object. The image capturing unit comprises a lens and a charge-coupled device (CCD).

電性檢測是利用一具有導電單元的檢測裝置接觸該待測物的接線而形成一迴路,藉以分析該迴路是否產生短路(short circuit)、斷路(open circuit)或漏電等電性瑕疵而判定該待測物是否功能正常。 The electrical detection uses a detecting device having a conductive unit to contact the wiring of the object to be tested to form a loop, thereby analyzing whether the loop generates a short circuit, an open circuit or an electric leakage. Whether the object to be tested is functional.

惟,上述是利用兩種相異的檢測裝置分別進行待測物 的自動光學檢測及電性檢測,因此待測物必須在兩種不同檢測裝置之間拆裝、搬移,對於待測物的受測效率而言並無助益。 However, the above is to use two different detection devices to perform the test object separately. The automatic optical detection and electrical detection, therefore, the object to be tested must be disassembled and moved between two different detection devices, which is not helpful for the measured efficiency of the object to be tested.

有鑑於解決傳統待測物在進行光學檢測及電性檢測時,必須於兩種檢測裝置之間拆裝、搬移受測物而造成受測效率不彰的問題,本發明特別提供一種檢測裝置,其技術手段,包括:一載台、一第一檢測模組及一第二檢測模組,其中:該載台具有一透光區域;該第一檢測模組包含一移動單元及一影像擷取單元,該移動單元相對該載台移動,該影像擷取單元設置在該移動單元上對應該透光區域,並接受該移動單元的帶動而相對該透光區域移動;及該第二檢測模組包含一擺動單元及一導電單元,該擺動單元設置在該載台上相對該透光區域擺動,該導電單元設置在該擺動單元上,並接受該擺動單元的帶動而相對靠近或遠離該透光區域。 In view of solving the problem that the conventional test object needs to disassemble and move the test object between the two test devices when performing optical detection and electrical detection, the test efficiency is not good, and the present invention particularly provides a detection device. The technical means includes: a loading platform, a first detecting module and a second detecting module, wherein: the loading platform has a light transmitting area; the first detecting module comprises a moving unit and an image capturing device a moving unit that moves relative to the stage, the image capturing unit is disposed on the moving unit corresponding to the light transmitting area, and is driven by the moving unit to move relative to the light transmitting area; and the second detecting module a swinging unit and a conductive unit are disposed on the stage, and the swinging unit is disposed on the swinging unit, and the conductive unit is disposed on the swinging unit, and is driven by the swinging unit to be relatively close to or away from the light transmitting unit. region.

在具體實施上,該移動單元設置在該載台下方,並包含一滑軌及一滑台,該滑軌設置在該載台下方,該滑台設置在該滑軌上;該移動單元還包含一皮帶輪及一皮帶,該皮帶輪設置在該滑軌端部,該皮帶設置在該皮帶輪上而連接該滑台;該擺動單元樞接在該載台上所形成的一樞孔內;該第一檢測模組還包含一發光單元,該發光單元設置在該載台下方對應該透光區域;該發光單元包含一鹵素燈;該第一檢測模組還包含一遮光元件,該遮光元件設置 在該載台上方對應該透光區域;該影像擷取單元包含一鏡頭及一電荷耦合元件。 In a specific implementation, the mobile unit is disposed under the loading platform, and includes a sliding rail and a sliding platform, the sliding rail is disposed under the loading platform, and the sliding platform is disposed on the sliding rail; the mobile unit further includes a pulley and a belt, the pulley is disposed at the end of the rail, the belt is disposed on the pulley to connect the sliding table; the swinging unit is pivotally connected to a pivot hole formed on the loading platform; the first The detection module further includes a light-emitting unit disposed under the stage corresponding to the light-transmitting area; the light-emitting unit includes a halogen lamp; the first detection module further includes a light-shielding component, and the light-shielding component is disposed A light transmissive area is disposed above the stage; the image capturing unit includes a lens and a charge coupled component.

藉此,該待測物只需於同一檢測裝置上,即可自動地進行光學檢測及電性檢測,操作人員無需再於兩種檢測裝置之間拆裝、搬移該待測物,以便於提升該待測物的受測效率及檢測操作上的方便性。 Thereby, the object to be tested can be automatically optically and electrically detected only on the same detecting device, and the operator does not need to disassemble and move the object to be tested between the two detecting devices, so as to facilitate lifting. The measured efficiency of the test object and the convenience of the detection operation.

為充分瞭解本發明上述技術手段及其效能,而據以實施本發明,請參閱實施方式內容並配合圖式說明如下: In order to fully understand the above technical means and the performance of the present invention, and to implement the present invention, please refer to the description of the embodiments and the following description:

請合併參閱圖1至圖3,揭示本發明一較佳實施例的圖式。其中,圖1揭示本發明的配置示意圖;圖2揭示圖1的側視圖;圖3揭示圖1的俯視圖。上述圖式說明檢測裝置,包括一載台11、一第一檢測模組112及一第二檢測模組113,其中:該載台11具有一透光區域111,該透光區域111實施上可以是由環氧樹脂、矽膠、石英及玻璃等透光材質製成(如圖3所示)。 Referring to Figures 1 through 3, a diagram of a preferred embodiment of the present invention is disclosed. 1 is a schematic view showing the configuration of the present invention; FIG. 2 is a side view of FIG. 1; and FIG. 3 is a top view of FIG. The above description of the detection device includes a loading stage 11, a first detecting module 112 and a second detecting module 113. The loading stage 11 has a light transmitting area 111, and the light transmitting area 111 can be implemented. It is made of light-transmitting materials such as epoxy resin, silicone rubber, quartz and glass (as shown in Figure 3).

該第一檢測模組112包含有一移動單元16及一影像擷取單元12,該移動單元16對於載台11能進行相對移動,而該影像擷取單元12設置在該移動單元16上對應透光區域111,並接受該移動單元11的帶動而相對於透光區域111進行移動。在具體實施上,該移動單元16是設置在載台11下方,並包含有一滑軌15及一滑台14,該滑軌15是設置在載台11下方,而該滑台14是設置在滑軌15上;該移動單元16還包含有一皮帶輪162及一皮帶161,該皮帶輪162 是設置在該滑軌15端部,而該皮帶161是設置在皮帶輪162上並連接滑台14。 The first detecting module 112 includes a moving unit 16 and an image capturing unit 12, wherein the moving unit 16 can relatively move the stage 11, and the image capturing unit 12 is disposed on the moving unit 16 to transmit light. The region 111 is moved by the movement unit 11 to move relative to the light-transmitting region 111. In a specific implementation, the mobile unit 16 is disposed under the stage 11 and includes a slide rail 15 and a slide table 14 disposed under the stage 11, and the slide table 14 is disposed on the slide The rail unit 15 further includes a pulley 162 and a belt 161, the pulley 162 It is disposed at the end of the slide rail 15, and the belt 161 is disposed on the pulley 162 and connected to the slide table 14.

該第二檢測模組113包含有一擺動單元17及一導電單元13,該擺動單元17設置在載台11上能相對於透光區域111進行擺動,該導電單元13是設置在擺動單元17上,並接受該擺動單元17的帶動而相對靠近或遠離透光區域111。在具體實施上,該擺動單元17是樞接在載台11上所形成的一樞孔171內。 The second detecting module 113 includes a swinging unit 17 and a conductive unit 13 . The swinging unit 17 is disposed on the stage 11 and can swing relative to the transparent area 111 . The conductive unit 13 is disposed on the swinging unit 17 . And the driving of the swing unit 17 is relatively close to or away from the light transmitting region 111. In a specific implementation, the swing unit 17 is pivotally connected to a pivot hole 171 formed on the stage 11 .

其中,該第一檢測模組112還包含一發光單元18(如圖5所示),而該發光單元18是設置在載台11下方相對應於透光區域111;該發光單元18包含有一鹵素燈,該發光單元18可依據實際需求調整鹵素燈的數量;該第一檢測模組112還包含一遮光元件19(如圖5所示),而該遮光元件19是設置在載台11上方相對應於透光區域111;該影像擷取單元12包含有一鏡頭及一電荷耦合元件。 The first detecting module 112 further includes a light emitting unit 18 (shown in FIG. 5), and the light emitting unit 18 is disposed under the stage 11 corresponding to the light transmitting area 111; the light emitting unit 18 includes a halogen. The light-emitting unit 18 can adjust the number of halogen lamps according to actual needs; the first detecting module 112 further includes a light-shielding component 19 (shown in FIG. 5), and the light-shielding component 19 is disposed on the upper surface of the loading platform 11. Corresponding to the transparent area 111; the image capturing unit 12 includes a lens and a charge coupled component.

在實際應用上,操作人員在將該一待測物2設置在該載台11的透光區域111上之後,可透過一處理模組(例如微處理器或微控制器)發出一第一檢測指令或一第二檢測指令給檢測裝置,使得檢測裝置要求第一檢測模組112進行自動光學檢測而取得待測物2的一影像資料或要求第二檢測模組113進行待測物2的電性檢測(I-V test)以取得待測物2的一電性資料。該處理模組即可依據影像資料或電性資料比對及分析以判定待測物2的瑕疵狀況或電性特性。 In practical applications, the operator can send a first detection through a processing module (such as a microprocessor or a microcontroller) after the object 2 is placed on the transparent area 111 of the stage 11. The command or a second detection command is sent to the detecting device, so that the detecting device requires the first detecting module 112 to perform automatic optical detection to obtain an image data of the object to be tested 2 or request the second detecting module 113 to perform the power of the object to be tested 2 IV test to obtain an electrical data of the test object 2. The processing module can compare and analyze the image data or the electrical data to determine the flaw condition or electrical characteristics of the object 2 to be tested.

該檢測裝置在接收到第一檢測指令之後是依據下述步驟命令該第一檢測模組112進行待測物2的自動光學檢測: 首先,命令該載台11下方相對應於透光區域111的發光單元18發出光線至該透光區域111,使得該載台11下方對應透光區域111的影像擷取單元12可清晰透過透光區域111擷取得待測物2的影像資料,並且藉由遮光元件19遮蔽透光區域111,可減少外界光線的干涉、衍射,以取得清晰的影像資料;接者,命令該移動單元16的皮帶輪162轉動,使得皮帶輪162上所設置的皮帶161帶動滑台14在滑軌15上移動,連帶使得影像擷取單元12相對於透光區域111進行移動,如此,該影像擷取單元12能擷取待測物2各部位的影像資料;例如,該待測物2可以是一太陽能模組,該太陽能模組具有多個太陽能電池,該影像擷取單元12則可擷取該太陽能模組中各太陽能電池的影像資料;最後,該處理模組比對該待測物2的影像資料與一預設的影像資料之間的差異,分析及判定該待測物2的瑕疵狀況;例如,非完好無損的太陽能模組中與完好無損的太陽能模組(該預設的影像資料),兩者的影像資料經比對後即可判定該太陽能模組中的太陽能電池是否破碎。 After receiving the first detection instruction, the detecting device commands the first detecting module 112 to perform automatic optical detection of the object 2 according to the following steps: First, the light-emitting unit 18 corresponding to the light-transmitting area 111 under the stage 11 is commanded to emit light to the light-transmitting area 111, so that the image capturing unit 12 corresponding to the light-transmitting area 111 under the stage 11 can be clearly transmitted through the light-transmitting area. The area 111 撷 obtains the image data of the object 2 to be tested, and shields the light-transmitting area 111 by the light-shielding element 19, thereby reducing interference and diffraction of external light to obtain clear image data; and receiving the pulley of the moving unit 16 The image 162 is rotated, so that the belt 161 disposed on the pulley 162 drives the slide table 14 to move on the slide rail 15 to move the image capturing unit 12 relative to the light-transmitting area 111. Thus, the image capturing unit 12 can capture The image data of each part of the object to be tested 2; for example, the object to be tested 2 may be a solar module, the solar module has a plurality of solar cells, and the image capturing unit 12 can capture each of the solar modules The image data of the solar cell; finally, the processing module analyzes and determines the defect state of the object to be tested 2 by comparing the difference between the image data of the object to be tested 2 and a predetermined image data; , Non-intact intact solar module with solar module (the preset image data), image data can be determined both by the ratio of the solar module in a solar cell or not broken.

接著,該檢測裝置在接收到該第二檢測指令之後則依據下述步驟命令該第二檢測模組113進行該待測物2的電性檢測:首先,命令載台11上相對於透光區域111的擺動單元17擺動,使得擺動單元17上的導電單元13由相對遠離透光區域111轉變為相對靠近透光區域111,進而接觸待測物2並形成迴路(如圖4a至圖4b所示); 最後,該處理模組藉由分析迴路是否產生短路、斷路或漏電等電性瑕疵而判定待測物2是否功能正常;例如該太陽能模組是否產生短路或斷路,而導致功能失常。 Then, after receiving the second detection command, the detecting device commands the second detecting module 113 to perform electrical detection of the object to be tested 2 according to the following steps: First, the command carrier 11 is opposite to the light transmitting region. The swinging unit 17 of the swinging portion 17 swings, so that the conductive unit 13 on the swinging unit 17 is changed from being relatively far away from the light transmitting region 111 to be relatively close to the light transmitting region 111, thereby contacting the object to be tested 2 and forming a loop (as shown in FIGS. 4a to 4b). ); Finally, the processing module determines whether the object to be tested 2 is functioning normally by analyzing whether the circuit generates a short circuit, an open circuit or an electric leakage such as a leakage; for example, whether the solar module generates a short circuit or an open circuit, thereby causing malfunction.

藉此,待測物2可以在同一台檢測裝置分別進行自動光學檢測及電性檢測,並且無須搬動及拆裝待測物2,可以更有效率地檢測待測物2,以及減少檢測裝置所須的佔置空間,進而提升受測效率及檢測操作上的方便性。 Thereby, the object to be tested 2 can perform automatic optical detection and electrical detection in the same detection device, and can detect the object to be tested 2 more efficiently, and reduce the detection device without moving and disassembling the object to be tested 2 The required space for the inspection, thereby improving the efficiency of the test and the convenience of the detection operation.

以上該僅為本發明的較佳實施例而已,並不用以限制本發明,凡在本發明的精神和原則之內所做的任何修改、替換、改進等,均應包含在本發明保護的範圍之內。 The above is only the preferred embodiment of the present invention, and is not intended to limit the present invention. Any modifications, substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of the present invention. within.

11‧‧‧載台 11‧‧‧ stage

111‧‧‧透光區域 111‧‧‧Lighting area

112‧‧‧第一檢測模組 112‧‧‧First detection module

113‧‧‧第二檢測模組 113‧‧‧Second test module

12‧‧‧影像擷取單元 12‧‧‧Image capture unit

13‧‧‧導電單元 13‧‧‧Conducting unit

14‧‧‧滑台 14‧‧‧Slide

15‧‧‧滑軌 15‧‧‧Slide rails

16‧‧‧移動單元 16‧‧‧Mobile unit

161‧‧‧皮帶 161‧‧‧Land

162‧‧‧皮帶輪 162‧‧‧ Pulley

17‧‧‧擺動單元 17‧‧‧Swing unit

171‧‧‧樞孔 171‧‧‧ pivot hole

18‧‧‧發光單元 18‧‧‧Lighting unit

19‧‧‧遮光元件 19‧‧‧ shading elements

2‧‧‧待測物 2‧‧‧Test object

圖1為本發明較佳實施例的示意圖;圖2為圖1的側視圖;圖3為圖1的俯視圖;圖4a至圖4b為擺動單元的示意圖;圖5為發光單元的示意圖。 1 is a side view of the preferred embodiment of the present invention; FIG. 2 is a side view of FIG. 1; FIG. 3 is a plan view of FIG. 1; FIG. 4a to FIG. 4b are schematic views of a swinging unit;

11‧‧‧載台 11‧‧‧ stage

112‧‧‧第一檢測模組 112‧‧‧First detection module

113‧‧‧第二檢測模組 113‧‧‧Second test module

12‧‧‧影像擷取單元 12‧‧‧Image capture unit

13‧‧‧導電單元 13‧‧‧Conducting unit

14‧‧‧滑座 14‧‧‧Slide

15‧‧‧導軌 15‧‧‧rail

16‧‧‧移動單元 16‧‧‧Mobile unit

161‧‧‧皮帶 161‧‧‧Land

162‧‧‧皮帶輪 162‧‧‧ Pulley

17‧‧‧擺動單元 17‧‧‧Swing unit

171‧‧‧樞孔 171‧‧‧ pivot hole

2‧‧‧待測物 2‧‧‧Test object

Claims (8)

一種檢測裝置,包括:一載台,具有一透光區域;一第一檢測模組,包含一移動單元及一影像擷取單元,該移動單元相對該載台移動,該影像擷取單元設置在該移動單元上對應該透光區域,並接受該移動單元的帶動而相對該透光區域移動;及一第二檢測模組,包含一擺動單元及一導電單元,該擺動單元設置在該載台上相對該透光區域擺動,該導電單元設置在該擺動單元上,並接受該擺動單元的帶動而相對靠近或遠離該透光區域。 A detecting device includes: a loading stage having a light transmitting area; a first detecting module comprising a moving unit and an image capturing unit, wherein the moving unit moves relative to the stage, and the image capturing unit is disposed at The moving unit is corresponding to the light-transmitting area and is driven by the moving unit to move relative to the light-transmitting area; and a second detecting module includes a swinging unit and a conductive unit, and the swinging unit is disposed on the loading stage The upper portion is oscillated relative to the light-transmitting region, and the conductive unit is disposed on the swinging unit and receives the swinging unit to be relatively close to or away from the light-transmitting region. 如申請專利範圍第1項所述檢測裝置,其中該移動單元設置在該載台下方,並包含一滑軌及一滑台,該滑軌設置在該載台下方,該滑台設置在該滑軌上。 The detecting device of claim 1, wherein the moving unit is disposed below the stage, and includes a sliding rail and a sliding table, the sliding rail is disposed under the loading platform, and the sliding platform is disposed on the sliding On the track. 如申請專利範圍第2項所述檢測裝置,其中該移動單元還包含一皮帶輪及一皮帶,該皮帶輪設置在該滑軌端部,該皮帶設置在該皮帶輪上而連接該滑台。 The detecting device of claim 2, wherein the moving unit further comprises a pulley and a belt, the pulley is disposed at the end of the rail, and the belt is disposed on the pulley to connect the sliding table. 如申請專利範圍第1項所述檢測裝置,其中該擺動單元樞接在該載台上所形成的一樞孔內。 The detecting device of claim 1, wherein the swinging unit is pivotally connected to a pivot hole formed in the loading platform. 如申請專利範圍第1項所述檢測裝置,其中該第一檢測模組還包含一發光單元,該發光單元設置在該載台下方對應該透光區域。 The detecting device of claim 1, wherein the first detecting module further comprises a light emitting unit disposed under the loading table corresponding to the light transmitting region. 如申請專利範圍第5項所述檢測裝置,其中該發光單元包含一鹵素燈。 The detecting device of claim 5, wherein the light emitting unit comprises a halogen lamp. 如申請專利範圍第5項所述檢測裝置,其中該第一 檢測模組還包含一遮光元件,該遮光元件設置在該載台上方對應該透光區域。 The detecting device according to claim 5, wherein the first The detection module further includes a shading element disposed above the stage to correspond to the light transmissive area. 如申請專利範圍第1項所述檢測裝置,其中該影像擷取單元包含一鏡頭及一電荷耦合元件。 The detecting device of claim 1, wherein the image capturing unit comprises a lens and a charge coupled component.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI568570B (en) * 2014-12-15 2017-02-01 Wei Kuang Automation Co Ltd Coating detection method and device thereof

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CN106230381A (en) * 2016-08-29 2016-12-14 安徽凯达能源科技有限公司 Solar panel power detection device
CN108426729A (en) * 2018-03-27 2018-08-21 芜湖鸣人热能设备有限公司 The detection work box of thermal hardware

Family Cites Families (4)

* Cited by examiner, † Cited by third party
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