201018926 ·* 六、發明說明： 【發明所屬之技術領域】 ·、 本翻侧於—纖觸如被航件、«航料電威元 件等電子元件的技術領域，尤指-種用於檢測電子元=電 壓、耐電流、電誠高觀壓等電氣躲的電子元件測試機構 及方法者。 ❹ 【先前技術】 請參閱台料利第526924、M258286號專利所示，係為吾 人早期申請的電子元件的檢測器，其結構主要包括—用以固定 在一機台上的基座，一可於該機台上昇降的探針座，一可驅動 該探針座昇降的電磁鐵’及四根呈矩形排列的探針。該探針係 一端具有細長狀的針部，另一端則具有一銅棒供利用導線連接 至一檢測儀器。當電子元件被一分割盤運送至對正該些探針 φ 時’該電磁鐵係會驅動該探針座昇降以使該些探針接觸該電子 元件兩侧的導接部，以達到檢測該電子元件之電氣特性的目 的。 然而’該習知的檢測器係具有四根非常細及長且呈矩形排 列的探針’因此該探針的針部與電子元件接觸的一端係非常容 易產生磨相’而且其易發生面頻溢散的情形而使檢測較為不準 確；另外當輸入的高電壓及高電流時其亦很容易使該探針的針 部發生燒毀的現像’因此其係僅只能適用於低電壓及低電流的 201018926 輸入。H其中有—根探針損壞便須停機難或更換因 此探針的触及㈣麵麵輕，而如此不但會影響到工作 效率，而且聰針_鱗亦是非常的高。 有馨於此，本發明人乃係針對上述的問題，而深入構思， 且積極研究改良而試做開發出本發明。 【發明内容】 本毛月之主要目的係在於提供—種可適用於高電屋、高電 流或高頻電壓、電感_試’而且具有損耗低、檢測準確及定 位效果佳之電子树檢峨淑方法者。 本發明所述之電子元件檢職構包括—機台、—分割盤、201018926 ·* VI. Description of the invention: [Technical field to which the invention belongs] · This aspect is used in the technical field of electronic components such as voyages, airborne components, and the like. Yuan = voltage, current resistance, electric high-pressure and other electrical components testing equipment and methods. ❹ 【Prior Art】 Please refer to the patents of No. 526924 and M258286, which are the detectors for electronic components that we applied for earlier. The structure mainly includes the base for fixing on a machine. A probe holder for lifting and lowering on the machine, an electromagnet that drives the probe holder to lift and lower, and four probes arranged in a rectangular shape. The probe has an elongated needle at one end and a copper rod at the other end for connection to a test instrument using a wire. When the electronic component is transported by a splitter disk to align the probes φ, the electromagnet drives the probe holder to move up and down to contact the probes on the sides of the electronic component to detect the The purpose of the electrical characteristics of electronic components. However, the conventional detector has four probes which are very thin and long and arranged in a rectangular shape. Therefore, the end of the probe which is in contact with the electronic component is very easy to produce a wear phase, and it is prone to surface frequency. In the case of overflow, the detection is inaccurate; in addition, when the input high voltage and high current, it is easy to burn the needle of the probe. Therefore, it can only be applied to low voltage and low current. 201018926 Input. H Among them, the root probe is damaged and it is necessary to stop the machine or replace it. Therefore, the probe touches (4) the surface is light, and this will not only affect the work efficiency, but also the needle scale is very high. In view of the above problems, the present inventors have intensively conceived the above problems, and actively researched and improved and tried to develop the present invention. [Summary of the Invention] The main purpose of this month is to provide an electronic tree inspection method that can be applied to high-voltage houses, high-current or high-frequency voltage, and inductance-testing, and has low loss, accurate detection, and good positioning effect. By. The electronic component inspection structure of the present invention includes a machine platform, a division disk,
一限位片、-檢測器及-頂桿。該機台具—驅動裝置及一穿 孔，該穿孔係職驅動裝置—距離。該分設於該機台上可 被該驅動裝置驅動耐轉，該分的觸具複朗隔排列的 缺槽供分聰納-電子元件’並可職電子元件制該穿孔的 正上方。該電子元件為電阻、電容、晶片保險絲等被動元件。 每-缺槽料側邊呈開口狀，_邊呈平絲，且具有兩平行 槽邊由該内侧邊兩端垂直延伸至該相邊。該限位片結合於該 機台上，且圍於該分難的厢，該限位片朝向該分割盤的一 側具有-®狐職壁。該檢測器設於該機台社方，且具有一 基座、兩檢測桿、-導線及一連接器，該基座結合於該機台上， 該兩檢測桿射_基紅籍，且其朗延伸至該穿孔 201018926 的上方，該導線係將該兩檢測桿連接至該連接器，該連接器設 於職座上供-檢嶋II雜。_桿係可昇_設於該穿孔 巾T將位在4牙孔正上方的電子元件向上頂使與該兩檢測桿 V 接觸，該頂桿中具有一吸孔貫通至端部，可將位在該穿孔正上 - 方的電子元件向下吸引。 如此，藉由該兩較粗、短的檢測桿係可使其適用於高電壓 及高電流的測試’而且該檢測桿的損耗率亦非常低，而且檢測 ❹ 辨確^另外，亦可藉由該贿的吸附*使檢麟，該電子元 件不會產生偏移，而具有良好的定位效果。 較佳的，本發明的機台係更具有一吸氣孔位在該穿孔的一 侧’且可產生吸力。該分割盤的底面具複數氣道，每一氣道的 -端係延伸貫通至-械躺之·_侧邊。其巾，當該缺 槽位在該穿孔正上方時’魏道係與該吸氣孔連通 。如此，該 電子元件更是可被該氣道吸引靠向該缺槽的内侧邊，而使其檢 〇 測時具有更佳的定位效果。 較佳的’本發明的限位片底部更具有一吸氣槽道貫通至該 圓弧形槽壁’且可產生吸力。該吸氣槽道於該圓弧形槽壁的開 係位在該穿孔正上方之缺槽的一側槽邊内侧。如此，該電子 元件更是可被該吸氣槽道吸引靠向該缺槽的一侧槽邊，而使其 檢測時具有更佳的定位效果。 本發明所述之電子元件檢測方法包括利用一分割盤將該 電子兀件運送到一檢測位置，該分割盤的周邊係間隔具有複數 201018926 缺槽供容納該電子元件’每-缺槽的外侧邊呈開口狀，内侧邊 呈平直狀’且具有兩平行槽邊__邊_垂直延伸至該外 ' 侧邊；再將該檢測位置的電子元件向下吸！丨及向該缺槽的内側 ·. 邊或-侧槽邊吸引；之後將該檢難置的電子元件向上頂以使 • 該電子70件的導接部接觸上方之-檢湘的兩檢測桿。 如此’於檢測前藉由該將該檢測位置的電子元件向下吸引 及向該缺槽的内側邊或一侧槽邊吸引的動作，係可將電子元件 ❹ 平正的定位在檢測位置，而且可使檢測時不會產生偏移晃動的 情形。 另外，本發明中該檢側器亦可設於該機台的下方，用以供 檢測電子兀件的高頻電壓或電感等。此時該電子元件為滤波晶 片、射頻晶片等高頻元件或其它電感元件。而且該檢測器設於 該機台下方時’該機台係具有一通孔供該檢測器之與兩檢測桿 導接的連接H凸露至該機台上方，以方便該檢繼器連接。而 ® 且藉由該較短的檢測桿係使其檢測時不會有高頻溢散的問 題，而可使檢測較準確。 【實施方式】 請參閱第一〜七圖係為本發明所述之電子元件檢測機構 的第一實施例，其主要用於檢測的電子元件為電阻、電容或晶 片保險絲等被動元件。其中指出該電子元件檢測機構包括一機 台1、一分割盤2、一限位片3、一檢測器4及一頂桿5。其中： 201018926 一穿孔11及-吸氣孔12。該 距離處之-檢;顺置上。該吸 (即該穿孔11與該驅動裝置 該機台1具一驅動裝置l〇、 穿孔11係位在該驅動裝置1〇 一 氣孔12係位在該穿孔11的内側 10之間），且其可產生吸力。 而：: 該機台1上，可被該驅動裝_動 ❹ 分割盤2的周邊具有複數間隔排列的缺槽分 別谷納一電子元件6，並可㈣電子元件6送_穿孔η的 正上方。母-補2G的相邊轉口狀，_邊21呈平直狀， ^具有兩平行槽邊22由該内側邊21兩端垂直延伸至該外側 邊。另外，該分割盤2的底面又具複數氣道23。每—氣道23 的端係延伸貫通至-相對應的之缺槽2〇的内侧邊^。當該 缺槽20位在該穿孔U正上方時，該氣道23係與該吸氣孔12 連通。 該限位片3係結合於該機台i上，且圍於該分割盤2的周 ❹ ®。該限位片3朝向該分_ 2的—侧係具有—圓弧形槽壁 30 〇 該檢測器4係如第三圖所示，其係設在該機台i的上方， 且具有-基座40、兩滑軌4卜^滑塊42、兩檢測桿座43、兩 彈性件44、兩檢測桿45、兩導片46、一導線47及一連接器 48 °該基座4G係-端結合於該機台卜另—端延伸至該分割 盤2上方且上侧具有一擋塊4〇〇〇該兩滑軌41係縱向設於該 基座40上，且並相互平行位於該擋塊4〇〇下方。該兩滑塊42 201018926 齡射雜地結合_兩魏41上。麵_桿座43係分 職合於該兩魏42上。該兩雜件44係為兩_彈菁且 分別設於該擋塊棚的底部與該兩檢測桿座43的頂部之間， '： 卩提供將該卿座43向下推的彈力。誠卿桿45係分 ： 職合於該兩檢鱗座43的底部，且其底端延伸魏穿孔π 的上方。該兩導片46係分別設於該兩檢測桿座43上，且該兩 導片46係與該兩檢測桿35電氣連接，該導線〇係將該兩導 〇 片46連接至該連接器48，該連接器48設於該基座40上供一 檢測儀器（圖中未示）連接。 該頂桿5係可昇降的設於該穿孔n中。可將位在該穿孔 11正上方的電子元件6向上頂，以使該電子元件6兩側的導 接部60分別與該兩檢測桿45的底端接觸。該頂桿5中具有一 吸孔50貫通至端部’可產生吸力將位在該穿孔丨丨正上方的電 子元件6向下吸引。 ® 在該第一、五、六圖中係指出，在該限位片3的頂面對應 該檢測桿35的位置係具有一絕緣片34。 在該第五〜七圖中係指出，該分割盤2可藉由其缺槽2〇 將該電子元件6運送到該穿孔η上方（即檢測位置）；然後該 頂桿5的吸孔會將該電子元件6向下吸引，該吸氣孔12會透 過該氣道23將該電子元件6向該缺槽20的内侧邊21吸引， 以使該電子元件6的一侧邊貼靠於該内侧邊21;之後該頂桿5 會將該電子元件5向上頂，以使該電子元件6兩侧的導接部 201018926 60接觸上方之檢測器4的兩檢測桿奶底端如第十二圖所示。 請參閱第八〜十圖所示係為本發明所述之電子元件檢測 : 冑構的第二實施例，其結構係與該第-實施例大致相同，差別 . 齡於該第二實施例之機台1上未設有吸氣孔12。該分割盤2 ； 的底面未具魏道23 ’而是於該限位>；3底部具有-吸氣槽 道31，s亥吸氣槽道31的一端貫通至該圓弧形槽壁，另一端 具有-吸氣孔32可產生-吸力。該吸氣槽道31於該圓弧形槽 ® 壁30的開口係位在該穿孔11正上方之缺槽20的一侧槽邊22 内侧。 在该第八、九圖中係指出，該分割盤2可藉由其缺槽2〇 將該電子元件6運送到該穿孔η上方（即檢測位置）；然後該 頂桿5的吸孔會將該電子元件6向下吸引，該吸氣孔32會透 過该吸氣槽道31將該電子元件6向該缺槽2〇的一側槽邊22 吸引’以使該電子元件6的一侧邊贴靠於該槽邊22 ;之後該 ❹ 頂桿5會將該電子元件5向上頂，贿該電子元件6兩側的導 接部60接觸上方之檢測器4的兩檢測桿45底端，如第十三圖 所示。 請參閱第十一圖所示，係為本發明所述之電子元件檢測機 構的第二實施例，其結構係與該第一實施例大致相同，差別僅 在於該第三實施例之機台1於該穿孔U的内侧具有一吸氣孔 12及於§亥限位片3上具有一吸氣孔32。該限位片3底部具有 一吸氣槽道31，該吸氣槽道31 —端貫通至該圓弧形槽壁3〇， 201018926 另-端與祕氣孔32相通。該吸氣槽道31於關弧形槽壁 30的開口係位在該穿孔Π正上方之缺槽2〇的一侧槽邊烈内 側。如此，該第三實施例係可依需要選擇要用該氣道23將該 電子元件6吸引向該内侧邊2卜還是要用該吸氣槽道31將該 電子元件6吸引向該一侧槽邊22。 本發明的檢測桿45係較粗及較短，所以其係可適用於高 電壓及高電流的輸入，而且該檢測桿45的損耗率亦非常低间 檢測亦較準確。糾’亦可藉由_桿5的吸附及該氣道烈 或該吸氣槽道31 _電子元件6的則，贿檢測時該電子 元件6不會產生偏移，而具有良好蚊位效果。 請參閱第十四、十五圖所示，係為本發明所述之電子元件 檢測機構的第四實施例，其結構大致與該第二實施例相同，差 別在於該第四實施例的檢· 7係設在該機台丨的下方，且其 ❹ 主要用於檢_電子元件域波晶片、㈣晶片等高頻元料 其它電感元件。其巾，該勤1雜耻飾卜側具有-定位 孔13及一通孔14。該限位片3對應該檢測位置的正上方係凸 出一擋部33。該檢測器7包括： 一基座7G，係螺_定在該機台1的下方，其-端延伸 2檢測位置且具有—絕緣片77，於該絕和 貫穿孔，姆錢_物—⑽7 2 側邊的上端係呈斜面狀，使可藉由該:= 01嵌入該機台1之定位孔13中而達到定位之目的，以便於 201018926 螺鎖安裝； 一連動塊71，係可於該基座70中昇降，且一端具有兩檢 : 測桿座710 ; 驅動器72 ’係設於該基座7〇可驅動該連動塊71昇降； 兩檢測桿73，係分別固定在該兩檢測桿座71〇上，可隨 著該連動塊71昇降以由下方伸出或縮人該貫穿孔7〇〇 ; 連接器74，係設於該基座70上，且凸露於該機台1的 ❹ 通孔14中’以便於供一檢測儀器（圖中未示）連接； 兩導片75，係分別設於該兩檢測桿座71〇上，且該兩導 片75係與該兩檢測桿73電氣連接；及 一導線76，係將該兩導片75連接至該連接器74。 清配合參閱第十四〜十六圖及第九圖所*，其係指出該分 °】盤2藉由其缺槽20將該電子元件6運送到該貫穿孔7〇〇上 方（即檢测位置）；該吸氣孔32會透過該吸氣槽道31將該電 ❹ 子几件6向該缺槽20的一侧槽邊22吸引，以使該電子元件6 的一侧邊貼靠於該槽邊22 ;之後該檢測器7的兩檢測桿73會 上昇以接觸該電子元件6進行檢測。 本發明的檢測桿73係較粗，所以損耗率非常低，而且該 兩檢喚73的長度綠短，因此其林會有高頻溢散的問 題，而可使檢測較準確。另外，亦可藉由該吸氣槽道31對該 元件6的吸引，以使檢測時該電子元件6不會產生偏移， 而具有良好的定位效果。 11 201018926 綜上所述，由於本發明具有上述優點及實用價值，而且在 同類產品中均未見有相同或類似之產品或發表，故本發明已符 合發明專利之新穎性及進步性要件，爰依法提出申請。A limit piece, a detector and a ejector. The machine is a driving device and a through hole, and the perforation is a driving device-distance. The sub-station is arranged on the machine to be driven to rotate by the driving device, and the sub-contact of the sub-contact is provided for the sub-clamp-electronic component's electronic component to be directly above the perforation. The electronic component is a passive component such as a resistor, a capacitor, or a chip fuse. The side of each of the slats is open, the _ side is flat, and the two parallel groove sides extend perpendicularly from the ends of the inner side to the side. The limiting piece is coupled to the machine table and surrounds the hard-working compartment, and the limiting piece has a -® fox wall facing one side of the dividing disk. The detector is disposed on the machine side of the machine, and has a base, two detecting rods, a wire and a connector. The base is coupled to the machine, and the two detecting rods are based on the red flag, and The ridge extends above the perforation 201018926, which connects the two test bars to the connector, and the connector is placed on the seat for inspection. _ the rod can be raised _ is disposed on the perforated towel T to position the electronic component directly above the 4th hole to contact the two detecting rods V, the ejector has a suction hole penetrating to the end, which can be placed The electronic component on the side of the perforation is attracted downward. In this way, the two thicker and shorter detection rods can be applied to the test of high voltage and high current' and the loss rate of the detection rod is also very low, and the detection is confirmed. The absorption of the bribe* makes the lining, the electronic component does not produce an offset, and has a good positioning effect. Preferably, the machine of the present invention has a suction opening on one side of the perforation and generates suction. The bottom plate of the split disk has a plurality of air passages, and the end of each air passage extends through to the side of the arm. The towel, when the notch is located directly above the perforation, the Weidao system communicates with the suction hole. In this way, the electronic component is more attracted to the inner side of the notch by the air passage, so that it has better positioning effect when the inspection is performed. Preferably, the bottom of the limiting piece of the present invention has a suction channel extending through the arcuate groove wall and generating suction. The suction channel is located at the inner side of the groove side of the notch directly above the perforation. In this way, the electronic component can be attracted to the side of the slot of the slot by the air intake channel, so that the detection can have better positioning effect. The electronic component detecting method of the present invention comprises: transporting the electronic component to a detecting position by using a dividing disk, the peripheral spacing of the dividing disk having a plurality of 201018926 slots for accommodating the outer side of the electronic component 'per-slot It is open-shaped, the inner side is flat and has two parallel groove edges __ sides _ vertically extending to the outer side; then the electronic components of the detection position are sucked down!吸引 吸引 吸引 的 的 的 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引 吸引. Thus, the electronic component is attracted to the inner side or the side of the notch before the detection, and the electronic component is positioned at the detection position. It can prevent the occurrence of offset sway during detection. In addition, in the present invention, the side detector may be disposed under the machine for detecting high frequency voltage or inductance of the electronic component. At this time, the electronic component is a high frequency component such as a filter wafer or a radio frequency chip or other inductance component. Moreover, when the detector is disposed under the machine, the machine has a through hole for the connection of the detector to the two detection rods to be exposed above the machine to facilitate the connection of the detector. And the ® and the shorter detection rod system make it detect that there is no high frequency overflow, which makes the detection more accurate. [Embodiment] Please refer to the first to seventh figures for the first embodiment of the electronic component detecting mechanism of the present invention. The electronic component mainly used for detecting is a passive component such as a resistor, a capacitor or a chip fuse. It is pointed out that the electronic component detecting mechanism comprises a machine 1, a dividing disk 2, a limiting piece 3, a detector 4 and a jack 5. Where: 201018926 a perforation 11 and - suction hole 12. The distance is checked - on the way. The suction (ie, the perforation 11 and the driving device, the machine 1 has a driving device 10, the perforation 11 is tied between the driving device 1 and the air hole 12 is located between the inner side 10 of the perforating 11), and Suction can be generated. And:: The machine 1 can be mounted by the drive _ ❹ 分割 分割 分割 2 2 2 2 的 的 的 2 的 的 2 2 2 2 2 2 2 2 2 2 2 2 的 谷 电子 电子 电子 电子 的 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子. The mother-filled 2G has a phase-turning shape, and the _ side 21 is flat, and has two parallel groove sides 22 extending perpendicularly from both ends of the inner side 21 to the outer side. In addition, the bottom surface of the dividing disk 2 has a plurality of air passages 23. The end of each air passage 23 extends through to the inner side of the corresponding missing slot 2〇. When the notch 20 is located directly above the perforation U, the air passage 23 is in communication with the suction hole 12. The limiting piece 3 is coupled to the machine table i and surrounds the circumference of the dividing disk 2. The limiting piece 3 has a circular arc-shaped groove wall 30 facing the side of the minute _ 2 . The detector 4 is as shown in the third figure, and is disposed above the machine i and has a base. The base 40, the two slide rails 4, the slider 42, the two detecting rods 43, the two elastic members 44, the two detecting rods 45, the two guiding pieces 46, a wire 47 and a connector 48 ° the base 4G-end The other end of the machine is extended to the top of the splitter disk 2 and has a stop 4 on the upper side. The two slide rails 41 are longitudinally disposed on the base 40 and are located parallel to each other. 4〇〇 below. The two sliders 42 201018926 age mixed with the combination of _ two Wei 41. The face _ pole seat 43 is divided into the two Wei 42. The two miscellaneous pieces 44 are two elastic pieces and are respectively disposed between the bottom of the block shed and the top of the two detecting rod holders 43. The : provides an elastic force for pushing the slab 43 downward. Chengqing rod 45 series points: The position is at the bottom of the two inspection scales 43, and the bottom end extends above the Wei perforation π. The two guiding pieces 46 are respectively disposed on the two detecting rod holders 43 , and the two guiding pieces 46 are electrically connected to the two detecting rods 35 , and the wire guiding system connects the two guiding pieces 46 to the connector 48 . The connector 48 is disposed on the base 40 for connection to a detecting device (not shown). The jack 5 is vertically movable in the through hole n. The electronic component 6 positioned directly above the through hole 11 can be topped so that the guiding portions 60 on both sides of the electronic component 6 are in contact with the bottom ends of the two detecting levers 45, respectively. The ram 5 has a suction hole 50 extending therethrough to the end portion to generate suction to attract the electronic component 6 positioned directly above the perforation cymbal. In the first, fifth and sixth figures, it is pointed out that the top surface of the limiting piece 3 corresponds to the position of the detecting lever 35 to have an insulating sheet 34. In the fifth to seventh figures, it is pointed out that the dividing disk 2 can transport the electronic component 6 above the through hole η (ie, the detecting position) by the slot 2; then the suction hole of the jack 5 will The electronic component 6 is attracted downwardly, and the air inlet hole 12 receives the electronic component 6 through the air channel 23 toward the inner side 21 of the notch 20 so that one side of the electronic component 6 abuts the inner side. 21; then the ram 5 will top the electronic component 5 so that the guiding portions 201018926 60 on both sides of the electronic component 6 contact the upper ends of the detectors 4 of the detector 4 as shown in FIG. . Please refer to the eighth to tenth drawings for detecting the electronic component according to the present invention: a second embodiment of the structure, the structure of which is substantially the same as that of the first embodiment, the difference is older than the second embodiment. The suction hole 12 is not provided on the machine table 1. The bottom surface of the dividing disk 2; does not have a Weidao 23' but has a suction channel 31 at the bottom of the limit; 3, and one end of the suction channel 31 penetrates to the arc-shaped groove wall. The other end has a suction port 32 which produces - suction. The opening of the intake channel 31 in the arcuate groove wall 30 is located inside the one side groove 22 of the notch 20 directly above the perforation 11. In the eighth and ninth drawings, the dividing disk 2 can transport the electronic component 6 above the through hole η (ie, the detecting position) by the slot 2; then the suction hole of the ejector pin 5 will The electronic component 6 is attracted downwardly, and the air intake hole 32 attracts the electronic component 6 to the side of the slot 22 of the slot 2 through the air intake channel 31 to make one side of the electronic component 6. Abutting against the edge 22 of the slot; the ram 6 will then lift the electronic component 5 upward, and the guiding portion 60 on both sides of the electronic component 6 contacts the bottom ends of the two detecting levers 45 of the detector 4 above, such as Figure 13 shows. Referring to FIG. 11 , it is a second embodiment of the electronic component detecting mechanism of the present invention, and the structure thereof is substantially the same as that of the first embodiment, and the difference lies only in the machine 1 of the third embodiment. There is an air suction hole 12 on the inner side of the through hole U and an air suction hole 32 on the § hai limit piece 3. The bottom of the limiting piece 3 has an air suction channel 31, and the end of the air suction channel 31 penetrates to the circular arc groove wall 3〇, and the other end of the 201018926 communicates with the secret air hole 32. The opening of the suction channel 31 in the arcuate groove wall 30 is located on the side of the groove side of the notch 2〇 directly above the perforation. Thus, in the third embodiment, whether the electronic component 6 is attracted to the inner side 2 by the air passage 23 or whether the electronic component 6 is attracted to the one side of the slot by the air suction channel 31 can be selected as needed. twenty two. The detecting rod 45 of the present invention is thicker and shorter, so that it can be applied to high voltage and high current input, and the detection rate of the detecting rod 45 is also very low and the detection is also relatively accurate. The correction can also be achieved by the adsorption of the _ rod 5 and the air channel or the air channel 31 _ the electronic component 6, and the electronic component 6 does not shift when the bribe is detected, and has a good mosquito bit effect. Referring to the fourteenth and fifteenth drawings, the fourth embodiment of the electronic component detecting mechanism of the present invention is substantially the same as the second embodiment, and the difference lies in the inspection of the fourth embodiment. The 7 series is located below the machine cymbal, and the ❹ is mainly used for detecting high-frequency components such as electronic component domain wave chips and (4) wafers. The towel has a positioning hole 13 and a through hole 14 on the side of the body. The stopper piece 3 protrudes from the upper side of the position to be detected by a stopper 33. The detector 7 comprises: a base 7G, which is fixed under the machine table 1 and has an end-extending position 2 detecting position and has an insulating sheet 77, and the through-hole, the money---(10)7 2 The upper end of the side is inclined, so that the := 01 can be embedded in the positioning hole 13 of the machine 1 to achieve the purpose of positioning, so as to facilitate the installation of the 201018926 screw; a linkage block 71 can be used for The base 70 has a lifting and lowering, and one end has two inspections: a rod base 710; a driver 72' is disposed on the base 7 to drive the linkage block 71 to move up and down; and two detecting rods 73 are respectively fixed to the two detecting rod bases. 71 〇, the connecting block 71 can be raised and lowered to protrude or retract from the through hole 7 〇〇; the connector 74 is attached to the base 70 and protrudes from the cymbal of the machine 1 The through holes 14 are configured to be connected to a detecting device (not shown); the two guiding pieces 75 are respectively disposed on the two detecting rod bases 71, and the two guiding pieces 75 are coupled to the two detecting rods 73. An electrical connection; and a wire 76 connecting the two guide vanes 75 to the connector 74. Referring to the fourteenth to sixteenth and ninth drawings, it is pointed out that the disk 2 carries the electronic component 6 above the through hole 7〇〇 by its notch 20 (ie, detection) Positioning the suction hole 32 through the suction channel 31 to attract the plurality of electric pieces 6 to one side of the groove 22 of the notch 20 so that one side of the electronic component 6 abuts The slot edge 22; then the two detection bars 73 of the detector 7 will rise to contact the electronic component 6 for detection. The detecting rod 73 of the present invention is relatively thick, so the loss rate is very low, and the lengths of the two calls 73 are short green, so that there is a problem of high frequency overflow in the forest, and the detection can be made more accurate. Further, the attraction of the element 6 by the suction channel 31 can be made such that the electronic component 6 does not shift during detection, and has a good positioning effect. 11 201018926 In summary, since the present invention has the above advantages and practical value, and no identical or similar products or publications are found in the similar products, the present invention has met the novelty and progressive requirements of the invention patents, Apply in accordance with the law.
12 201018926 【圖式簡單說明】 第圖係本發明之檢測機構之第一實施例的立體分解示意圖。 第一圖係本發明之檢測機構之第一實施例的分割盤底面放大 ' - 示意圖。 第一圖係本發明之檢測機構之第一實施例的檢測器立體放大 示意圖。 第四圖係本發明之檢測機構之第一實施例的立體組合放大示 ❹ 意圖。 第五圖係本發明之檢測機構之第—實施例的局部俯視放大示 意圖。 第六圖係本發明之檢測機構之第—實施例的局部剖面示意圖。 第七圖係本發明之檢測機構之第一實施例的動作示意圖。 第八圖係本發明之檢測機構之第二實施例的立體分解示意圖。 第九圖係本發明之檢測機構之第二實施例的局部俯視放大示 G 意圖。 第十圖係本發明之檢測機構之第二實施例的局部剖面示意圖。 第十一圖係本發明之檢測機構之第三實施例的局部俯視放大 示意圖。 第十二圖係本發明之檢測方法之第一實施例的流程方塊圖。 第十二圖係本發明之檢測方法之第二實施例的流程方塊圖。 第十四圖係本發明之檢測機構之第四實施例的檢測器立體示 意圖。 201018926 第十五圖係本發明之檢測機構之第四實施例的局部剖面示意 圖。 第十六圖係本發明之檢測方法之第四實施例的流程方塊圖。 【主要元件符號說明】 機台1 驅動裝置10 穿孔11 吸氣孔12 ❹ 調整孔13 通孔14 分割盤2 缺槽20 内侧邊21 槽邊22 氣道23 限位片3 圓弧形槽壁30 吸氣槽道31 吸氣孔32 擋部33 絕緣片34 〇 檢測器4 基座40 擋塊400 滑執41 滑塊42 檢測桿座43 彈性件44 檢測桿45 導片46 導線47 連接器48 頂桿5 吸孔50 電子元件6 導接部60 檢測器7 14 201018926 基座70 貫穿孔700 定位塊701 連動塊71 檢測桿座710 驅動器72 檢測桿73 連接器74 導片75 導線76 絕緣片77 ❹ 1512 201018926 [Simplified description of the drawings] The drawings are a perspective exploded view of the first embodiment of the detecting mechanism of the present invention. The first figure is an enlarged view of the bottom surface of the split disk of the first embodiment of the detecting mechanism of the present invention. The first drawing is a perspective enlarged view of the detector of the first embodiment of the detecting mechanism of the present invention. The fourth drawing is a perspective view of the first embodiment of the detecting mechanism of the present invention. The fifth drawing is a partial plan enlarged view of the first embodiment of the detecting mechanism of the present invention. Figure 6 is a partial cross-sectional view showing the first embodiment of the detecting mechanism of the present invention. Figure 7 is a schematic view showing the operation of the first embodiment of the detecting mechanism of the present invention. Figure 8 is a perspective exploded view of a second embodiment of the detecting mechanism of the present invention. The ninth drawing is a partial plan view of the second embodiment of the detecting mechanism of the present invention. Figure 11 is a partial cross-sectional view showing a second embodiment of the detecting mechanism of the present invention. Fig. 11 is a partially enlarged plan view showing the third embodiment of the detecting mechanism of the present invention. Figure 12 is a block diagram showing the flow of the first embodiment of the detection method of the present invention. Figure 12 is a block diagram showing the flow of a second embodiment of the detection method of the present invention. Fig. 14 is a perspective view showing the detector of the fourth embodiment of the detecting mechanism of the present invention. 201018926 The fifteenth diagram is a partial cross-sectional schematic view of a fourth embodiment of the detecting mechanism of the present invention. Fig. 16 is a block diagram showing the flow of the fourth embodiment of the detecting method of the present invention. [Main component symbol description] Machine 1 Drive unit 10 Perforation 11 Suction hole 12 ❹ Adjustment hole 13 Through hole 14 Separation plate 2 Notch 20 Inner side 21 Slot edge 22 Air passage 23 Limit piece 3 Arc-shaped groove wall 30 Suction Air channel 31 Air suction hole 32 Stop 33 Insulation sheet 34 〇 Detector 4 Base 40 Stop 400 Slip 41 Slider 42 Detector rod 43 Elastic member 44 Detector rod 45 Guide 46 Conductor 47 Connector 48 ejector 5 Suction hole 50 Electronic component 6 Conductor 60 Detector 7 14 201018926 Base 70 Through hole 700 Positioning block 701 Linking block 71 Detecting rod holder 710 Driver 72 Detector rod 73 Connector 74 Guide 75 Conductor 76 Insulation sheet 77 ❹ 15