TW200941654A - Die package including substrate with molded device - Google Patents

Die package including substrate with molded device Download PDF

Info

Publication number
TW200941654A
TW200941654A TW098100177A TW98100177A TW200941654A TW 200941654 A TW200941654 A TW 200941654A TW 098100177 A TW098100177 A TW 098100177A TW 98100177 A TW98100177 A TW 98100177A TW 200941654 A TW200941654 A TW 200941654A
Authority
TW
Taiwan
Prior art keywords
package
die
molded substrate
substrate
molding material
Prior art date
Application number
TW098100177A
Other languages
English (en)
Inventor
Yong Liu
Zhong-Fa Yuan
Original Assignee
Fairchild Semiconductor
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fairchild Semiconductor filed Critical Fairchild Semiconductor
Publication of TW200941654A publication Critical patent/TW200941654A/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49861Lead-frames fixed on or encapsulated in insulating substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49575Assemblies of semiconductor devices on lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/16Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
    • H01L25/167Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
    • H01L2224/05552Shape in top view
    • H01L2224/05553Shape in top view being rectangular
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45147Copper (Cu) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/4554Coating
    • H01L2224/45565Single coating layer
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/4554Coating
    • H01L2224/45599Material
    • H01L2224/456Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01046Palladium [Pd]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12041LED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3011Impedance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements
    • H01L33/60Reflective elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
  • Led Device Packages (AREA)

Description

200941654 六、發明說明: 【明所Λ ^-技^^領域j 本發明係關於一種包括具有模製裝置基材之晶粒封裝 體。 5 【先前技術】 背景 光耦合器含有至少一經由一光透射介質光學地耦合至 一光接收器裝置的光發射器裝置。此配置容許來自含有此 光發射器裝置之一電路的訊息傳輸至含有此光接收器装置 10 之另一電路。在此二電路之間維持高度電氣絕緣。因為訊 息係光學地通過絕緣間隙,此輸送是單向的。舉例而言, 光接收器裝置無法改良含有此光發射器裝置之電路的操 作。此特徵是所希望的,因為舉例而言,此發射器可使用 微處理器或邏輯閘,藉由低電壓電路來驅動,另一方面, 15 此輸出光接收器裝置可為高電壓DC或AC負載電路之部 分。光隔離亦防止因相對有害之輸出電路對輸入電路造成 的損害。 第1圖顯示傳統光耦合器封裝體10之側示圖。此例示說 明之光耦合器10包括基材24,及在基材24上的焊料球18。 2〇 包括光發射器表面16(a)之LED (發光二極體)裝置16及光 電晶體裝置12 (包括光接收器表面12(a))係在該基材24上 且由光透射介質22所覆蓋。 由於該光電晶體裝置12的低效率,接收由LED發出的 光非常有限,藉由該光電晶體(二極體)裝置12產生的輸 3 200941654 出電路是低的(例如約數nA,與雜訊的程度相同)。光電晶 體的接收器表面12(a)未面向LED裝置16之光發射器表面 16(a)。因此’來自LED裝置16之光線20撞擊光電晶體(或 二極體)之光接受器及光接收器表面12(a)的時間小於1〇%。 5 此外,LED裝置16及光電晶體12係藉由形成於基材24 中的墊來定義。此可限制形成具有不同裝置構形之光耦合 器封裝體的能力。 將1C驅動器裝置、LED裝置、光電晶體裝置(或二極 體裝置)與轉換阻抗式放大器組合於一封裝體中(封裝體 10中微耦合器SIP或系統)是可能的。建構此等元件於一封裝 體中的一方式是將此等元件全部放置於單一引線框結構 中,進行打線接合(wirebonding)製程及接著進行模塑製 程。然而’此封裝體的構形可能不是最有效率的構形,因 為此二個裝置在此引線框結構上是橫側地彼此間隔。舉例 15而言,若此配置是在S0IC型封裝體中,此封裝體將具有約4 x 5 mm2之尺寸及約3.6 mm之厚度。側引線距將為約6 mm。 對於某些應用而言是太大了。 本發明之實施例獨立地及集體地提及此問題及其他問 題。 20 【明内】 概要 本發明之貫施例是著重於光耦合器封裝體、光耦合器 總成、及其等之製造方法。 本發明之一實施例係著重於一種晶粒封裝體,包含一 200941654 預模製基材’該基材包含一引線框結構、一連接至該引線 框結構之第一裝置、及一覆蓋至少部分之該引線框結構及 該第一裝置的模塑材料。該第一裝置較佳為一控制裝置, 例如驅動器ic。第二裝置係連接至該預模製基材。該第二 5 裝置較佳為一光電裝置,例如發光二極體裝置(或LED裝 置)。 本發明之另一實施例係著重於一種形成封裝體之方 法。該方法包含形成一預模製基材,該基材包含一引線框 結構、一連接至該引線框結構之第一裝置、及一覆蓋至少 10 部分之該引線框結構及該第一裝置的模塑材料。於形成該 預模製基材之後,將一第二裝置連接至該預模製基材。 本發明之另一實施例係著重於一種晶粒封裝體,包 含:一基材’該基材包含一引線框結構;一連接至該引線 框結構之第一裝置;以及一連接至該基材之第二裝置,其 15中該第一裴置與該第二裝置為堆疊的關係,及其中該第一 裝置與該第二裝置中至少一者為光電裝置。 圖式簡單說明 本發明之此等及其他實施例係參考圖式而更詳細地描 述於下文中。 20 第1圖顯示傳統光輕合器封裳體之側視圖。 第2圖顯示根據本發明之一實施例之一光耦合器封裝 體的頂透視圖。 第3圖顯示根據本發明之一實施例之光耦合器封裝體 的底透視圖。 5 200941654 第4至5圖顯示部分内部元件被顯示之如第2圖中顯示 的光耦合器封裝體之頂透視圖。 第6圖顯示部分内部元件被顯示之如第2圖中顯示的光 耦合器封裝體之底透視圖。 5 第7圖顯示部分内部封裝體元件被顯示之如第2圖中顯 示的光耦合器封裝體之頂透視圖。 第8圖顯示部分内部封裝體元件被顯示之如第2圖中顯 示的光耦合器封裝體之底透視圖。 第9圖顯示部分内部封裝體元件被顯示之如第2圖中顯 10 示的光耦合器封裝體之側視圖。 第10圖顯示部分内部封裝體元件被顯示的一預模製基 材之側視圖。 第11(a)至ll(i)圖顯示當根據本發明之一實施例形成一 光耦合器封裝體時所形成之前驅體。 15 第12-13圖顯示部分内部封裝體元件被顯示之根據本 發明的另一實施例之光耦合器封裝體的頂透視圖。 第14圖顯示如第12圖所顯示之光耦合器封裝體的底透 視圖。 第15圖顯示如第13圖所顯示之光耦合器封裝體部分的 20 特寫圖。 第16圖顯示如第13圖所顯示之光耦合器封裝體的側視 圖。 第17(a)-17(e)圖顯示當根據本發明之一實施例形成一 光耦合器封裝體時所形成之前驅體。 200941654 在圖式中,類似的元件符號標明類似的元件且部分元 件的說明在某些例子中可能不重覆。 【貧施方式】 詳細說明 5 本發明之實施例係著重於封裝體,其包括例如I c驅動 器之預模製裝置,及引線框基材,以及製造此等封裝體之 方法。在一較佳實施例中,組合的方法包括在一預模製基 材上堆疊一 led裝置及光電晶體裝置,該預模製基材包含 一例如1C驅動器裝置之控制裝置及引線框結構。本發明之 10其他實施例將著重於可用於定位一 LED裝置之附件結 構,使得該LED裝置發出的光直接發射在一光電晶體裝置 的一接收器表面。在本發明之實施例中,該附件結構及該 預模製基材可組合。本發明之其他實施例可能著重於模製 方法凝膠圓頂之產生及模塑製程。 15 本發明之實施例提供一種微耦合器SIP (封裝體中系 統)的解決方法,其能以包括裝置及引線框結構之預模製 基材的觀念為基礎。在一實施例中,一LED裝置及/或一 光電晶體裝置可堆疊在一預模製基材中之一控制裝置上。 在另一實施例中,一 LED裝置可放置在一附件結構上,使 20 得其以相對於一光電晶體裝置之一光接收表面呈一角度來 定向。 本發明之實施例具有許多優點。第一,本發明之實施 例藉由在一光耦合器中容許一定向之LED發光表面部或完 全地面向一光電晶體裴置(或二極體裝置)之一接收器表 7 200941654 面,可改良一LED裝置與一光電晶體裝置(或二極體裳置) 之間的光電轉換率。第二,本發明之實施例可具有一標準 LGA (基板栅格陣列(land grid array))插腳輸出。第三,與 平面SOIC-8型封裝體相較,根據本發明之一實施例的封敦 5 體尺寸可降低56%,由4 X 5 mm2減小至2.5 X 3_5 mm2。在 第一設計實施例中,封裝體之厚度亦可降低約65%,由約 3.6 mm至約1.2 mm,且在第二設計實施例中,降低約55%, 由約3.6 mm至約1.60 mm。 本發明之一實施例係著重於一種包含一預模製基材之 〇 10 晶粒封裝體,該預模製基材包含一引線框結構、一連接至 該引線框結構之第一裝置’及一覆蓋至少部分之該引線框 結構及該第一裝置之模塑材料。該第一裝置較佳為一控制 裝置,例如驅動器1C (積體電路)。一第二裝置係連接至該 - 預模製基材。該第二裝置較佳為光電裝置,例如發光二極 15體裝置(或LED裝置)。使用於本發明之實施例的裝置可為 半導體晶粒的形式。 在本文中所述之特定實施例中,該第一裝置及該第二 〇 裝置較佳分別為一控制裝置及一光電裝置。典型的光電裝 置可包括電子及光學特性(例如電子輸入及光學輸出,或 20反之亦然)。然而,應瞭解到,本發明之實施例可應用於可 具有純電子特徵(例如不具有光學透射性)的封裝體。舉 例而言,該第一裝置及該第二裝置中一或二者可純為電子 裝置,例如本發明之其他實施例中的^1〇兕£丁8。 第2圖顯不根據本發明之一實施例之封裝體1〇〇的頂透 8 200941654 視圖。該封裝體100包括一預模製基材120,其包含一引線 框結構120(a)及一第一模塑材料120(b)。一第二模塑材料 140係形成在該預模製基材120上。該第一模塑材料120(b) 及該第—4吴塑材料140可相同或不同。在任^例子中’因為 5 該第一模塑材料120(b)及該第二模塑材料140是在不同時間 下模製’在該第一模塑材料120(b)與該第二模塑材料140之 間可具有平坦的界面。 在第2圖中,L可為約3·5 mm,W可為約2.5 mm,T1可 ❹ 為約〇·4 mm,及T2可為約1.20 mm。當然,本發明之實施例 10不受限於此等尺寸,且適當封裝體的大小可大於或小於此 等大小令任一者 第3圖顯示第2圖中顯示之封裝體100的底透視圖。第3 圖顯示底墊120(a)-l及側繫桿120(a)-2。該等底墊包括例示 說明之例子中的下述名稱:N C (未連接)、Vo (輸出數據)、 15 GND2 (輸出接地)、VDD1 (輸入供應電壓)、VDD2 (輸 出供應電壓)、Vin (輸入數據)' GND1 (輸入接地),及陽 極)。應瞭解到本發明之實施例不受限於第3圖所示之特定 墊標籤。 第4圖及第5圖各自顯示第1圖中顯示之封裝體1〇〇的頂 20 透視圖,顯示部分内部元件。 第4圖顯示形成在一預模製基材12〇上的一第二模塑材 料140。光透射材料190係存在於該第二模塑材料140與該預 模製基材120之間。該預模製基材12〇之該引線框結構120(a) 包括用於打線接合之多數導電墊區域12〇(a)_2。不同的接合 9 200941654 線184、193(a)、193(b)、193(c)穿過光透射材料且連結至不 同的導電墊區域120(a)-2。在封裝體1〇〇内部之導電塾區域 120(a)-2的表面實質上係與在封裝體丨00内部但在基材丨2〇 外部之模塑材料120(b)的表面共平面。 5 第5圖顯示安裝在引線框結構120(a)之第一晶粒接附塾 120(c)-1上的光發射器裝置112及安裝在第二晶粒接附塾 120(c)-2上的光接收器裝置116。例如焊料之導電性黏著劑 可用於使光接收器裝置116及光發射器裝置112連接至引線 框結構120之晶粒接附塾120(c)-l、120(c)-2。接合線184連 © 1〇 接光發射器裝置112之頂表面至墊區域120(a)-2中之一。三 接合線193(a)、193(b)、193(c)亦使光接收器裝置116之頂表 面的輸入及/或輸出連接至其他墊區域120(a)-2。如第4圖 所示,光發射器裝置112及光接收器裝置116係由光透射材 — 料190覆蓋,使得光訊號可通過光發射器裝置112至光接收 15 器裝置116。在一些例子中,光透射材料190亦可稱為“光 辆合凝膠”。 Ο 第6圖顯示第2圖所顯示之封裝體100的下侧。如所示 者,控制裝置56係安裝在與連接光發射器裝置112之表面相 對的墊120(c)-l之表面上。如所示者,多數接合線58、98使 20 墊區域120(a)-2連接至控制裝置56之外表面。在第5圖中, 與安裝有光接收器裝置116之表面相對之晶粒接附墊 120(c)-2的表面,未安裝有裝置。然而,在其他實施例中, 可安裝一裝置。 第7圖顯示第2圖中所顯示之光耦合器封裝體的頂視 10 200941654 圖,顯示部分内部封裝體元件。第8圖顯示第2圖中所顯示 之光耦合器封裝體的底視圖,顯示部分内部封裝體元件。 第9圖顯示第2圖中所顯示之光耦合器封裝體的側視圖,顯 示部分内部封裝體元件。第7圖至第9圖已描述於上文中。 5然而,如第7圖至第9圖所示,封裝體100具有矩形的側部輪 廓及頂部輪廓。因為引線未延伸通過第二模塑材料14〇的側 表面,其特徵亦在於“無引線”封裝體。雖然例示說明的 是無引線封裴體,但應暸解到本發明之實施例亦包括引線 封裝體。 10 第10圖顯示預模製基材120之側視圖,顯示部分内部封 裝體元件。如所示者,引線框結構12〇(a)之外表面與第—模 塑材料120(b)之外表面實質上共平面。 本發明之其他實施例可著重於製造類似上述之光麵合 器封裝體的方法。本發明之實施例著重於一種方法,包含 15形成一預模製基材’該預模製基材包含一引線框結構、— 連接至該引線框結構之第一裝置(例如驅動器〗c之控制裝 置),及一覆蓋至少部分之該引線框結構及該第一裝置的模 塑材料。於形成該預模製基材之後,將一第二裝置(例如 led裝置之光發射器裝置)及一第三裝置(例如光電晶體 20裝置之光接收器裝置)連接至該預模製基材。該裝置至該 基材之連接可透過包括附件結構及導電性黏著劑之不同結 構作成。 第11(a)圖至第ll(i)圖顯示根據本發明之一實施例,當 形成光搞合器封裝體時所形成之前驅體。 200941654 第11 (a)圖顯示一引線框結構120(a)。該引線框結構 120(a)可藉由蝕刻、衝鍛或其他適合方式而獲得。用於引線 框結構之適當材料包括銅、鋁,及其等之合金。在一些實 施例中’引線框結構可利用可焊性金屬或其他形式之金屬 5 (例如Ni、Pd等等)電鍍。再者,引線框結構可形成為金 屬之連續或不連續斷片。 如所示者’引線框結構120(a)可包括晶粒接附墊 120(c)-l、120(c)-2,及接合墊區域 120(a)-2及墊 12〇(a)-l。 如所示者’接合墊區域120(a)-2可自每一墊120(a)-l,以二 © 10 或三個方向側向延伸。一些區域可部分地被钱刻(例如半 蝕刻),以幫助一模塑材料鎖固在該第二引線框結構120(a) 上。 在第11(b)圖中,控制裝置56 (例如驅動器1C)係安裝 在引線框結構120之第一晶粒接附墊i2〇(c)_i上。如所示 15者,引線框結構丨2〇中的第二晶粒接附墊120(c)-2係與第一 晶粒接附墊120(c)-l分離。控制裝置56可使用包括焊料之任 何適當的導電性黏著劑,安裝在第一晶粒接附墊^0(04 Ο 上。 第11(c)圖顯示連接控制裝置56之外表面至接合塾區域 20 120(a)_2的多數接合線58。可使用任何適當的傳統打線接合 方法。再者’適當的接合線可包括銅、金或包括塗覆貴金 屬之銅線。 第11(d)圖顯示模塑後之預模製基材12〇。第一模塑材料 120(b)係環繞引線框結構120(a)而模製。如所示者,塾表面 12 200941654 120(a)-1係由第一模塑材料120(b)暴露且與模塑材料120(b) 之外表面實質上共平面。併入本案說明書以供參考之美國 專利第7,061,077號,揭露其他適當之預模塑方法。 5 10 15 20 第11(e)圖顯示翻轉的預模製基材12〇。晶粒接附墊 120(c)-l、120(c)-2’及接合墊區域12〇⑷_2之表面係由第一 模塑材料120暴露且與第一模塑材料丨2〇之表面實質上共平 面。 於翻轉基材120之後,如第ii(f)圖所示,光發射器裝置 112及光接收器裝置116可連接至預模製基材12〇之晶粒接 附墊120(c)-l、120(c)-2。包括焊料之任何適當的導電性黏 著劑可用於使光發射器裝置112及光接收器裝置116連接至 預模製基材120之晶粒接附墊i2〇(c)_i、i2〇(c)_2。 如第11(g)圖所示,於將光發射器裝置112與光接收器裝 置116接合至預模製基材12〇之晶粒接附塾12〇(c)_i、 l2〇(c)-2之後’線 184、193(a)、193(b)、193(c)可用於使光 發射器裝置112與光接收器裝置116打線接合至接合墊區域 120(a)-2。 於打線接合之後,如第11(h)圖所示,光透射材料190 可沈積在基材120上且覆蓋在光發射器裝置112與光接收器 裝置116上。光透射材料190可接著被固化或部分硬化。若 有需要,光反射塗層可沈積在光透射材料190,以使自光發 射器裝置112透射至光接收器裝置116的光保持在光透射材 料190内。 於在基材120上沈積光透射材料190之後,可在基材12〇 13 200941654 上形成第二模塑材料14〇,以形成封裝體1〇〇。可使用任何 適當之模塑方法,包括具有模麵之難王具的傳統模塑 方法於模塑之後,可進行單切(singulati〇n)方法,使封 裝體陣列中已形成之封裝體與其他封裝體分離。 5 第12圖至第13圖顯示本發明之另一光耦合器封裝體實 施例的透視圖,顯示部分内部封裝體元件。第14圖顯示第 12圖中所顯示之純合器封裝體的頂透視圖。第15圖顯示 第13圖中所顯示之光耦合器封裝體部分的特寫圖。第以圖 至第15圖中許多元件已於上文中描述且不再重覆說明。 10 第13圖特別顯示附件結構192,包括用於垂直安裝光發 射器裝置112之安裝墊。第15圖顯示連接至基材12〇之附件 …構192,具有連接至附件結構192之墊的垂直定位的光發 射器裝置112。 第16圖顯示第13圖中所顯示之光耦合器封裝體的側視 15圖。元件符號88顯示附件結構192之經部分蝕刻(例如半蝕 刻)區域。經部分蝕刻區域使第二模塑材料14〇更容易鎖固 附件結構190。再者,距離T3可為約〇 45顏。因為光發射 器裝置112的發射表面至少部分地面向光接收器裝置116之 接收表面,光自光發射器裝置112透射至光接收器裝置比第 20 1圖中例示說明的傳統封裝體更有效率。 附件結構192至基材120之安裝及後續晶粒封裝體1〇〇 之形成係顯示於第17⑷圖至第17(e)圖中。如第17(a)圖所 不,首先藉由蝕刻、衝鍛或任何其他適當方法獲得附件結 構192其可由銅或其他適當的導電性材料製成。附件結構 200941654 ' 192可包括第一區段192(a)及第二區段192(b)。第一區段 192(a)可包括第一基材接合部192(a)-l、第二垂直中間部 192(a)-2、第三垂直中間部192(a)-3,及第四線接合部 192(a)-4。第二區段192(b)可包括第一基材接合部192(b)-l、 5 第二垂直中間部192(b)-2、第三垂直中間部192(b)-3,及第 四裝置接合部192(b)-4。側繫桿178亦自第一區段192(a)及第 二區段192(b)側向地向外延伸。繫桿178可使此等區段結合 至具有其他附件結構的外框。 ® 於獲得附件結構192之後,光發射器裝置112可安裝在 10第四裝置接合部192(b)-4。於光發射器裝置112安裝在第四 裝置接合部192(b)-4後,如第17(b)圖所示,線可接合至第四 線接合部192(a)-4。 如第17(c)圖所示’接著將第17(b)圖中所顯示之前驅體 連接至預模製基材120。包括焊料之任何適當的黏著劑可用 15 於使附件結構192連接至基材120。預模製基材12〇之形成, 及光接收器裝置116之後續安裝係參考第U(a)圖至第11(f) ® 圖描述於上文中。線可自192(a)-l接合至i2〇(a)-2。 如第17(c)圖所例示說明者,第四裝置接合部192(b)_4 可使光發射器裝置112定向’使得其(及因此其發光表面) 20能與安裝在預模製基材120上之光接收器裝置116的光接收 表面呈一角度地定向(例如實質上垂直)。 第17(d)圖顯示光透射材料190之沈積。光透射材料19〇 可接著被固化,或部分硬化。若有需要,可在光透射材料 190上沈積光反射塗層,以使自光發射器裝置112透射至光 15 200941654 接收器裝置116的光保持在光透射材料19〇内。 於光透射材料190沈積在基材12〇上之後,可在基材 120上形成第一模塑材料14〇,以形成封裝體1〇〇。可使用 任何適當的模塑方法,包括使用具有模塑模之模塑工具之 5 傳統模塑方法。 上述之光耦合器封裝體可用於電子總成,包括電路基 材及可藉由行動電話及電腦具體實施的系統。 雖然前述係著重於本發明之特定較佳實施例,在未偏 離本發明之基本範圍之下,可設計出其他本發之實施例。 u 10此等可替代的實施例意欲包括在本發明之範圍内。再者, 在未偏離本發明之基本範圍之下,本發明之一或多個實施 例的特徵可與本發明之其他實施例的一或多個特徵組合。 【圖式簡单說明】 第1圖顯示傳統光麵合器封裝體之側視圖。 15 第2圖顯示根據本發明之一實施例之一光箱合器封裝 體的頂透視圖。 第3圖顯示根據本發明之一實施例之光耦合器封裝體 © 的底透視圖。 第4至5圖顯示部分内部元件被顯示之如第2圖中顯示 20 的光耦合器封裝體之頂透視圖。 第6圖顯示部分内部元件被顯示之如第2圖中顯示的光 耦合器封裝體之底透視圖。 第7圖顯示部分内部封裝體元件被顯示之如第2圖中顯 示的光耦合器封裝體之頂透視圖。 16 200941654 第8圖顯示部分内部封裝體元件被顯示之如第2圖中顯 不的光輕合器封裝體之底透視圖。 第9圖顯示部分内部封裝體元件被顯示之如第2圖中顯 示的光耦合器封裝體之側視圖。 5 第10圖顯示部分内部封裝體元件被顯示的一預模製基 材之側視圖。
第U(a)至ll(i)圖顯示當根據本發明之一實施例形成一 光搞合器封裝體時所形成之前驅體。 第12-13圖顯示部分内部封裝體元件被顯示之根據本 H)發明的另-實施例之光柄合器封裝體的頂透視圖。 第14圖顯示如第12圖所顯示之光麵合器封裝體的底透 視圖。 第15圖顯示如第13圖所顯示之光耦合器封震體部分的 特寫圖。 15 帛16®顯示如|第13圖賴示之練合ϋ封裝體的側視 圖0 第n(a)-17(e)圖顯示當根據本發明之—實施㈣成― 光耦合器封裝體時所形成之前驅體。 【主要元件符號說明】 18.. .焊料球 2〇...光線 22··.光透射介質 24·..基材 56.. .控制裝置 10.. .光麵合器 12…光電晶體裝置 12⑻…光接收器表面 16.. .LED (發光二極體)裝置 16(a)...光發射器表面 17 200941654 58.. .接合線 88.. .經部分蝕刻區域 98.. .接合線 100.. .封裝體 112.. .光發射器裝置 116.. .光接收器裝置 120.. .預模製基材 120(a)...引線框結構 120(a)-l...墊 120(a)-2·.·側繫桿,墊區域 120(b)...第一模塑材料 120(c)-l··.第一晶粒接附墊 120(c)-2···苐二晶粒接附塾 140.. .第二模塑材料 178.. .側繫桿 184.. .接合線 190.. .光透射材料 192.. .附件結構 192(a)...第一區段 192(a)-l...第一基材接合部 192(a)-2…第二垂直中間部 192(a)-3...第三垂直中間部 192(a)-4...第四線接合部 192(b)...第二區段 192(b)-l...第一基材接合部 192(b)-2...第二垂直中間部 192(b)-3...第三垂直中間部 192(b)-4...第四裝置接合部 193(a)...接合線 193(b)···接合線 193(c)...接合線 NC...未連接 GND1輸入接地 GND2...輸出接地 VDD1...輸入供應電壓 VDD2...輸出供應電壓 Vin…輸入數據 Vo...輸出數據
18

Claims (1)

  1. 200941654 七、申請專利範圍: 1,—種晶粒封裝體,包含: 預模製基材’包含—引線框結構、-接附至該 引線忙、.、。構之第一裝置,及—覆蓋至少部分之該引線 框結構及該第_裝置的模塑材料;以及 第一裝置,其係接附至該預模製基材。 如中1專利範圍第旧之晶粒封裝體,其中該第二裝置 包含一光電裝置。 如申凊專利範圍第1項之晶粒封裝體,其中該第一裝置 包含一控制裝置。 4.如申°月專利範圍第1項之晶粒封裝體,進一步包含一第 -裝置’其中該第三裝置係安裝在該預模製基材上。 5·如申請專利範圍第1項之晶粒封裝體,進-步包含一第 -裝置’其中該第三裝置係安裝在該預模製基材上, 其中該第—裝置及该第二裝置包含光電裝置以及其 中該第一裴置包含控制裝置。 6. 如申請專利範圍第旧之晶粒封裝體,其中該引線框結 構包含-晶粒接附塾,其中—第—晶粒係安裝在該晶 粒接附墊之第一表面上,及其中—第二晶粒係安裝在 該晶粒接附墊之第二表面上。 7. 如中請專利範圍第旧之晶粒封裝體,其中該晶粒封裝 體為一光耦合器封裝體。 8. 如申請專利範圍第i項之晶粒封㈣,其中該模塑材料 為一第一模塑材料,及其中該晶粒封裳體進一步包含 19 200941654 第-裝置’其巾該第三裝践安裝在該預模製基材 上其中该第二裝置及該第三裝置包含光電裝置,及 其中》亥第一裝置包含控制裝置,及其中該晶粒封裝體 進-步包含-覆蓋該第二裝置及該第三裝置之第二模 塑材料。 9. 如申請專利範圍第1項之晶粒封裝體,進一步包含一附 件結構,其中該附件結構包括一垂直結構,及其中該
    第-裝置係接附至該垂直結構,及其中該附件結構係 連接至該預模製基材。 10. 如申請專利範圍第9項之晶粒封裝體,其中該第一裝置 為一控制裝置。 U.—種方法,包含: 形成一預模製基材,該預模製基材包含一引線框 結構、一接附至該引線框結構之第一裝置,及一覆蓋 至少部分之該引線框結構及該第一裝置的模塑材料; 以及 12. 13. 接附一第二裴置至該預模製基材。 如申請專利範圍第11項之方法,其中該第二裝置包含 —光電裝置。 如申請專利範圍第11項之方法,其中該第一裝置包含 —控制裝置。 ❹ 14. 如申請專利範圍第11項之方法,進一步包含接附一第 三裝置至該預模製基材。 如申請專利範圍第11項之方法,進一步包含接附一第 20 15. 200941654 16. 17. e 18. 19. Q 20. 21. 三裝置至該預模製基材’及其中該第二裝置及該第三 裝置包含光電裝置,及其中該第一裝置包含控制裝置。 如申請專利範圍第11項之方法’其中該引線框結構包 含一晶粒接附墊,其中該第一晶粒係安裝在該晶粒接 附墊之第一表面上,及其中該第二晶粒係安裝在該晶 粒接附墊之第二表面上。 如申請專利範圍第11項之方法’其中於接附該第二裝 置至該預模製基材之後,形成一晶粒封裝體,以及其 中該晶粒封裝體為一光耦合器封裝體。 如申請專利範圍第11項之方法,其中該模塑材料為一 第一模塑材料,以及其中該方法進一步包含在該第二 裝置上模塑一第二模塑材料。 如申請專利範圍第11項之方法,進一步包含接附該第 —裝置至一附件結構,而後接附該附件結構至該預模 製基材。 如申請專利範圍第11項之方法,其中該第一裝置包含 —控制裝置及該第二裝置包含一光電裝置。 —種晶粒封裝體,包含: —基材,包含一引線框結構、一接附至該引線框 結構之第一裝置;以及 一第二裝置,其係接附至該基材,其中該第一裝 置與該第二裝置為堆疊的關係,以及其中該第一裝置 及该第二裝置中至少一者為一光電裝置。 21
TW098100177A 2008-01-09 2009-01-06 Die package including substrate with molded device TW200941654A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/971,556 US8106406B2 (en) 2008-01-09 2008-01-09 Die package including substrate with molded device

Publications (1)

Publication Number Publication Date
TW200941654A true TW200941654A (en) 2009-10-01

Family

ID=40843903

Family Applications (1)

Application Number Title Priority Date Filing Date
TW098100177A TW200941654A (en) 2008-01-09 2009-01-06 Die package including substrate with molded device

Country Status (3)

Country Link
US (2) US8106406B2 (zh)
CN (1) CN101483174A (zh)
TW (1) TW200941654A (zh)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7973393B2 (en) * 2009-02-04 2011-07-05 Fairchild Semiconductor Corporation Stacked micro optocouplers and methods of making the same
TW201133949A (en) * 2010-03-16 2011-10-01 Ying-Chia Chen Light emitting diode package and lamp with the same
US8577190B2 (en) 2010-03-23 2013-11-05 Avago Technologies General Ip (Singapore) Pte. Ltd. Optocoupler
US8412006B2 (en) * 2010-03-23 2013-04-02 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Optocoupler
US8571360B2 (en) * 2010-03-23 2013-10-29 Avago Technologies General Ip (Singapore) Pte. Ltd. Optocoupler with light guide defining element
US8421204B2 (en) 2011-05-18 2013-04-16 Fairchild Semiconductor Corporation Embedded semiconductor power modules and packages
FR2977714B1 (fr) * 2011-07-08 2013-07-26 St Microelectronics Grenoble 2 Boitier electronique optique
US8563337B2 (en) * 2011-10-24 2013-10-22 Avago Technologies General Ip (Singapore) Pte. Ltd. Simultaneous silicone dispension on coupler
USD731987S1 (en) * 2012-12-28 2015-06-16 Nichia Corporation Light emitting diode
USD763206S1 (en) * 2015-01-29 2016-08-09 Advanced Optoelectronic Technology, Inc. Light emitting diode package
JP6325471B2 (ja) 2015-03-02 2018-05-16 株式会社東芝 光結合装置および絶縁装置
JP6371725B2 (ja) * 2015-03-13 2018-08-08 株式会社東芝 半導体モジュール
CN105514055B (zh) * 2015-12-01 2019-03-19 世亿盟科技(深圳)有限公司 自发电且可光谱侦测的芯片模组及其设备
CN106783833A (zh) * 2016-12-30 2017-05-31 深圳市富友昌科技股份有限公司 一种化合物电池发光装置
DE102018100946A1 (de) * 2018-01-17 2019-07-18 Osram Opto Semiconductors Gmbh Bauteil und verfahren zur herstellung eines bauteils
DE102019127783A1 (de) * 2019-10-15 2021-04-15 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Optoelektronisches bauelement und verfahren zur herstellung eines solchen

Family Cites Families (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3956821A (en) 1975-04-28 1976-05-18 Fairchild Camera And Instrument Corporation Method of attaching semiconductor die to package substrates
US4058899A (en) 1976-08-23 1977-11-22 Fairchild Camera And Instrument Corporation Device for forming reference axes on an image sensor array package
US4680613A (en) 1983-12-01 1987-07-14 Fairchild Semiconductor Corporation Low impedance package for integrated circuit die
US4751199A (en) 1983-12-06 1988-06-14 Fairchild Semiconductor Corporation Process of forming a compliant lead frame for array-type semiconductor packages
US4772935A (en) 1984-12-19 1988-09-20 Fairchild Semiconductor Corporation Die bonding process
US5148243A (en) 1985-06-25 1992-09-15 Hewlett-Packard Company Optical isolator with encapsulation
US4890153A (en) 1986-04-04 1989-12-26 Fairchild Semiconductor Corporation Single bonding shelf, multi-row wire-bond finger layout for integrated circuit package
US4720396A (en) 1986-06-25 1988-01-19 Fairchild Semiconductor Corporation Solder finishing integrated circuit package leads
US4791473A (en) 1986-12-17 1988-12-13 Fairchild Semiconductor Corporation Plastic package for high frequency semiconductor devices
US4839717A (en) 1986-12-19 1989-06-13 Fairchild Semiconductor Corporation Ceramic package for high frequency semiconductor devices
US4731701A (en) 1987-05-12 1988-03-15 Fairchild Semiconductor Corporation Integrated circuit package with thermal path layers incorporating staggered thermal vias
US4796080A (en) 1987-07-23 1989-01-03 Fairchild Camera And Instrument Corporation Semiconductor chip package configuration and method for facilitating its testing and mounting on a substrate
US5327325A (en) 1993-02-08 1994-07-05 Fairchild Space And Defense Corporation Three-dimensional integrated circuit package
US5545893A (en) * 1994-12-23 1996-08-13 Motorola, Inc. Optocoupler package and method for making
JP3638328B2 (ja) * 1994-12-30 2005-04-13 株式会社シチズン電子 表面実装型フォトカプラ及びその製造方法
US5646446A (en) 1995-12-22 1997-07-08 Fairchild Space And Defense Corporation Three-dimensional flexible assembly of integrated circuits
US6133067A (en) * 1997-12-06 2000-10-17 Amic Technology Inc. Architecture for dual-chip integrated circuit package and method of manufacturing the same
US6133634A (en) 1998-08-05 2000-10-17 Fairchild Semiconductor Corporation High performance flip chip package
US6424035B1 (en) 1998-11-05 2002-07-23 Fairchild Semiconductor Corporation Semiconductor bilateral switch
KR100335480B1 (ko) 1999-08-24 2002-05-04 김덕중 칩 패드가 방열 통로로 사용되는 리드프레임 및 이를 포함하는반도체 패키지
KR100335481B1 (ko) 1999-09-13 2002-05-04 김덕중 멀티 칩 패키지 구조의 전력소자
US6720642B1 (en) 1999-12-16 2004-04-13 Fairchild Semiconductor Corporation Flip chip in leaded molded package and method of manufacture thereof
US6344687B1 (en) * 1999-12-22 2002-02-05 Chih-Kung Huang Dual-chip packaging
US6489653B2 (en) * 1999-12-27 2002-12-03 Kabushiki Kaisha Toshiba Lateral high-breakdown-voltage transistor
US6989588B2 (en) 2000-04-13 2006-01-24 Fairchild Semiconductor Corporation Semiconductor device including molded wireless exposed drain packaging
US6556750B2 (en) 2000-05-26 2003-04-29 Fairchild Semiconductor Corporation Bi-directional optical coupler
KR100370231B1 (ko) 2000-06-13 2003-01-29 페어차일드코리아반도체 주식회사 리드프레임의 배면에 직접 부착되는 절연방열판을구비하는 전력 모듈 패키지
KR100403608B1 (ko) 2000-11-10 2003-11-01 페어차일드코리아반도체 주식회사 스택구조의 인텔리젠트 파워 모듈 패키지 및 그 제조방법
KR100374629B1 (ko) 2000-12-19 2003-03-04 페어차일드코리아반도체 주식회사 얇고 작은 크기의 전력용 반도체 패키지
US6469384B2 (en) 2001-02-01 2002-10-22 Fairchild Semiconductor Corporation Unmolded package for a semiconductor device
US6891257B2 (en) 2001-03-30 2005-05-10 Fairchild Semiconductor Corporation Packaging system for die-up connection of a die-down oriented integrated circuit
US6645791B2 (en) 2001-04-23 2003-11-11 Fairchild Semiconductor Semiconductor die package including carrier with mask
US6893901B2 (en) 2001-05-14 2005-05-17 Fairchild Semiconductor Corporation Carrier with metal bumps for semiconductor die packages
US7061080B2 (en) 2001-06-11 2006-06-13 Fairchild Korea Semiconductor Ltd. Power module package having improved heat dissipating capability
US6683375B2 (en) 2001-06-15 2004-01-27 Fairchild Semiconductor Corporation Semiconductor die including conductive columns
US6633030B2 (en) 2001-08-31 2003-10-14 Fiarchild Semiconductor Surface mountable optocoupler package
US6774465B2 (en) 2001-10-05 2004-08-10 Fairchild Korea Semiconductor, Ltd. Semiconductor power package module
US6891256B2 (en) 2001-10-22 2005-05-10 Fairchild Semiconductor Corporation Thin, thermally enhanced flip chip in a leaded molded package
US6674157B2 (en) 2001-11-02 2004-01-06 Fairchild Semiconductor Corporation Semiconductor package comprising vertical power transistor
US6566749B1 (en) 2002-01-15 2003-05-20 Fairchild Semiconductor Corporation Semiconductor die package with improved thermal and electrical performance
US6830959B2 (en) 2002-01-22 2004-12-14 Fairchild Semiconductor Corporation Semiconductor die package with semiconductor die having side electrical connection
US6867489B1 (en) 2002-01-22 2005-03-15 Fairchild Semiconductor Corporation Semiconductor die package processable at the wafer level
JP2005520339A (ja) 2002-03-12 2005-07-07 フェアチャイルド セミコンダクター コーポレーション ウエハレベルのコーティングされた銅スタッドバンプ
US7122884B2 (en) 2002-04-16 2006-10-17 Fairchild Semiconductor Corporation Robust leaded molded packages and methods for forming the same
US6836023B2 (en) 2002-04-17 2004-12-28 Fairchild Semiconductor Corporation Structure of integrated trace of chip package
KR100843737B1 (ko) 2002-05-10 2008-07-04 페어차일드코리아반도체 주식회사 솔더 조인트의 신뢰성이 개선된 반도체 패키지
US7061077B2 (en) 2002-08-30 2006-06-13 Fairchild Semiconductor Corporation Substrate based unmolded package including lead frame structure and semiconductor die
US6777800B2 (en) 2002-09-30 2004-08-17 Fairchild Semiconductor Corporation Semiconductor die package including drain clip
US6943434B2 (en) 2002-10-03 2005-09-13 Fairchild Semiconductor Corporation Method for maintaining solder thickness in flipchip attach packaging processes
KR100958422B1 (ko) 2003-01-21 2010-05-18 페어차일드코리아반도체 주식회사 고전압 응용에 적합한 구조를 갖는 반도체 패키지
US7217594B2 (en) 2003-02-11 2007-05-15 Fairchild Semiconductor Corporation Alternative flip chip in leaded molded package design and method for manufacture
US7271497B2 (en) 2003-03-10 2007-09-18 Fairchild Semiconductor Corporation Dual metal stud bumping for flip chip applications
US6867481B2 (en) 2003-04-11 2005-03-15 Fairchild Semiconductor Corporation Lead frame structure with aperture or groove for flip chip in a leaded molded package
US7315077B2 (en) 2003-11-13 2008-01-01 Fairchild Korea Semiconductor, Ltd. Molded leadless package having a partially exposed lead frame pad
US7196313B2 (en) 2004-04-02 2007-03-27 Fairchild Semiconductor Corporation Surface mount multi-channel optocoupler
US7242076B2 (en) 2004-05-18 2007-07-10 Fairchild Semiconductor Corporation Packaged integrated circuit with MLP leadframe and method of making same
US7256479B2 (en) 2005-01-13 2007-08-14 Fairchild Semiconductor Corporation Method to manufacture a universal footprint for a package with exposed chip
US7285849B2 (en) 2005-11-18 2007-10-23 Fairchild Semiconductor Corporation Semiconductor die package using leadframe and clip and method of manufacturing
US7371616B2 (en) 2006-01-05 2008-05-13 Fairchild Semiconductor Corporation Clipless and wireless semiconductor die package and method for making the same
US7408245B2 (en) * 2006-12-22 2008-08-05 Powertech Technology Inc. IC package encapsulating a chip under asymmetric single-side leads
US7791084B2 (en) 2008-01-09 2010-09-07 Fairchild Semiconductor Corporation Package with overlapping devices
US7825502B2 (en) 2008-01-09 2010-11-02 Fairchild Semiconductor Corporation Semiconductor die packages having overlapping dice, system using the same, and methods of making the same
US20090194857A1 (en) 2008-02-01 2009-08-06 Yong Liu Thin Compact Semiconductor Die Packages Suitable for Smart-Power Modules, Methods of Making the Same, and Systems Using the Same
US7915721B2 (en) 2008-03-12 2011-03-29 Fairchild Semiconductor Corporation Semiconductor die package including IC driver and bridge
US8018054B2 (en) 2008-03-12 2011-09-13 Fairchild Semiconductor Corporation Semiconductor die package including multiple semiconductor dice
US7768108B2 (en) 2008-03-12 2010-08-03 Fairchild Semiconductor Corporation Semiconductor die package including embedded flip chip

Also Published As

Publication number Publication date
US20090174048A1 (en) 2009-07-09
US8525192B2 (en) 2013-09-03
CN101483174A (zh) 2009-07-15
US8106406B2 (en) 2012-01-31
US20120012993A1 (en) 2012-01-19

Similar Documents

Publication Publication Date Title
TW200941654A (en) Die package including substrate with molded device
US10497644B2 (en) Semiconductor device with first and second semiconductor chips connected to insulating element
US7423335B2 (en) Sensor module package structure and method of the same
TWI316747B (en) Surface mountable optoelectronic component and its production method
US8125080B2 (en) Semiconductor power module packages with simplified structure and methods of fabricating the same
US20130127033A1 (en) Semiconductor device
US8981550B2 (en) Semiconductor package with alternating thermal interface and adhesive materials and method for manufacturing the same
US7659531B2 (en) Optical coupler package
US9502395B2 (en) Power semiconductor package having vertically stacked driver IC
TWI590395B (zh) 多功率晶片的功率封裝模組及功率晶片單元的製造方法
US20090051019A1 (en) Multi-chip module package
US20120175755A1 (en) Semiconductor device including a heat spreader
CN103681607A (zh) 半导体器件及其制作方法
TW200901427A (en) Semiconductor device and semiconductor module using the same
KR20170086828A (ko) 메탈범프를 이용한 클립 본딩 반도체 칩 패키지
JP6709785B2 (ja) 半導体チップを有する電子システムのためのパッケージ
US7973393B2 (en) Stacked micro optocouplers and methods of making the same
KR20160115861A (ko) 리드프레임 상의 기판 인터포저
TW200939409A (en) Package structure of integrated circuit device and manufacturing method thereof
US20090140266A1 (en) Package including oriented devices
US20050189625A1 (en) Lead-frame for electonic devices with extruded pads
JP4367299B2 (ja) 発光素子デバイス及び発光素子デバイスの製造方法
JP2002359392A (ja) 半導体リレー
KR102465955B1 (ko) 멀티칩 스택 반도체 패키지 및 이의 제조방법
JP2008211225A (ja) 半導体パッケージ