TW200817859A - Method and system for automatic testing and its etep-by-etap testing method - Google Patents

Method and system for automatic testing and its etep-by-etap testing method Download PDF

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TW200817859A
TW200817859A TW95137874A TW95137874A TW200817859A TW 200817859 A TW200817859 A TW 200817859A TW 95137874 A TW95137874 A TW 95137874A TW 95137874 A TW95137874 A TW 95137874A TW 200817859 A TW200817859 A TW 200817859A
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signal
test
command signal
keyboard
input
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TW95137874A
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Chinese (zh)
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TWI344584B (en
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Xiao-Tie Wu
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Via Tech Inc
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  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A method and a system for automatic testing are disclose. The simulator with the functionalities for simulating the keyboard or mouse is used to be an input device of a computer for controlling a test platform to test the hardware or the software. Besides, an oscilloscope or the like is used to admeasure the signals of the tested hardware or the test platform for generating the testing data. The testing data is sent to the computer and evaluated by the computer. Then the oscilloscope may be adjusted by the computer according to the test data.

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200817859 九、發明說明: 【發明所屬之技術領域】 本發明秋-_試方法與錢,尤其是—種取代人工 輸入之量測方法與系統。 【先前技術】 在許多電腦設備的測試中,需要對眾多相關参數、瞬間 訊息進行快速、即時、連續、準確的捕捉與測量,而且需要完 目前大部分需要藉由手 動或人工測試才能完成,換言之,在設備測試方面需要耗費大 量的人力麵。尤其是在新產品測試時,更需要進行大量的基 礎參數測試,也因此大幅降低了工作的效率。 第-A圖為-種典型傳統測試環境,由測試平㈣盥量 測儀器Μ所組成。測試平台13連接輸入設備12,可供操作 人員鍵入齡臂辭台13可裝設㈣設備ΐ3ι,並依據操 作人員鍵人之指令進行職。於職_所產生的受測訊號交 由量測設備14:來制’操作人員可藉由目她察量測儀器以 判斷測試結果。對設置單—受繼備131 _試平台η而言, 往往可能需要反覆鍵入不關指令並經由上述流程來取得° 種或多次的數據。 200817859 在測試的過程中,如果手動或人工挪試的操作非常頻 繁,通常賴有專人等待設備_應,以進行下—階段的操 作’形成了“人等設備,,的情形,而浪費了人力資源。但是,: 果在某些職項目的測試過程中要求操作人㈣参^^ 高,而操作人s的素f不足,錄會造成“設備等人”的問= 降低了設備的利用率。 隨著技術的進步,-些自_試系統逐漸被應用於上述 之測試流程中。如第一 B圖所示,特殊的硬體與軟體133可 被加入測試平台13中,並且測試平台13可藉由—些適配器 I5的連接’從量測設備14得到受測訊號或得到量測設備μ 依據受測訊號所產生的量測資料。 傳統的自動測試系統需要在測試平台13運行某些特殊的 常駐程式(軟體、133) ’並結合特殊的量測硬體,_模擬出真 實的運行環境。例如,將需要人工操作之輸入加以程序化,以 執行軟體運算來施行;然而測試過程中尚有一些受測訊號需 要量測’目趙f要的硬體設備來歧這錢測訊號並回 饋給職平台。舰,麟^ 13除了需要職受測設備⑶ 外,還需要接吹量測資料、執行測試軟體之運算,其中任何一 個環節出錯都可能影響频結果,而尊轉·峨過程中 所產生的非預期錯誤。總而言之,這樣的自動制系統所模擬 的環境並不是實際真實的環境。 200817859 此外’這^的自動量測祕也有著許多的限制,例如傳 統的測試方法無法財轉式關戦平台後,再重新啟動測 試平台。因此,人卫的介人奴無可避免的。在需要人工介入 的情形^戦平台將需要另外加人—些通知操作人員的機 制’讓操作人員能及時進行處理,以減少“機器等人,,的情形。 然而’測試平台也有可能在測試過程中發生死機的狀 況二要讓處於當機狀態的職平台執行触操作人員的動作並 不谷易。因為測試平台一旦當機,所有運算皆會停止,更遑論 通知操作人員。 根據上述環境以及所衍生的問題,顯然地需要其他減少 需要人工介入的改良,以盡量避免“人等設備,,或‘‘設備等人,,的 糾另方面’相關的改良也應該盡量在不需要變動測試平 台的前提τ發展,以賊低職平纟魏__試平台這類 工作上的時間與成本。 【發明内容】、 、、鑒於上述之發明背景中,為了符合產業上某些利益之需 求本ι明提供-種自動測試方法與彡統可肋解決上述傳統 之自動測試方法與系統未能達成之標的。 本發明之-目的係降低人工参與度,本發明之自動測試 200817859 Ι=Γ、良了以往需以人工手動調整量測設備(如示波器) 化崎顧結果之傳統測試方法,將測試步驟完全簡單 化、知序化,具有良好的可重複性。 树明之另一目的係採用一種純外部的方法對測試平 °入任何斜軒擾,以確保量·果的真實性。 此外,本發明由於採用計算機通用的輪出/輸入介面因 此只要根據不同_試修改控制計算機上的軟體。開發系統所 需要的時·短,並具有良好的升級性及擴紐 多數計算機插卡電性能_試。 用、 。據此,本發明之一具體實施例提出一種鍵盤/滑鼠模擬 & ’可用以_一鍵盤或一滑鼠’或者同時類兩者。並且在 本發明之自_財法衫財,细具有上叙鍵盤/滑鼠 模擬器之功能的模擬設備,做為計算機控制測試平台之輸入設 備’以控伽m平台測試受測設備或軟體。再經由量測設備量 測測試平台或受測設備之受測峨後產生量測資料給計算 機’計算機可依據量晴料調整量職備之量測範圍。 【實施方式】 本發明在此所探討的方向為—種自動測試方法與系统。 為了能徹底地瞭解本發明,將在下列的描述中提出詳盡的步驟 200817859 =其組成。顯舰,本物施行並未限跋自動測試方法愈 糸統之技藝者所熟料特殊㈣。另_方面,眾二 或步驟並未贿杨料,崎免造穌發财岭 較佳實_铸細贿如下,細除了這些詳細描述 之外’本魏射簡泛地贿雜他的魏财,且本發明 的耗圍不魏定,其以之後的專利範圍為準。 參考第二圖所示,本發明之—具體實施例係—種自動測 試系統,包含-控制計算機21、一模擬設備22、一測試平台 23、一量測設備24。 ° 权擬設備22分別連接控制計算機u與測試平台幻,負 責將控制計算機2丨輸出之命令訊號212解譯為輸人訊號瓜 並將輸入訊號222輸人至測試平台23。換言之,模擬設備η 係測試平纟23讀人裝置,其連接於職平# 23之輸出/輸 入介面’此輸入介面可以是任何算機之輸出/輸入介面,例如: 鍵盤輸入介面:滑鼠.介面、串解(如印表鱗)、序列痒 (如RS232埠、狄S485埠)、聰槔、ffiEE1394埠紅外線蜂、 網路連接料#。藉此,槪設備22可峨絲何連接於這 些輸出/輸入介面的裝置,例如:鍵盤、滑鼠、印表機、數據 機、網路設備等等。 另外,挺擬没備22可以控制測試平台23之電源開關。 換言之,模擬設備22可依據命令訊號212開啟/關閉測試平台23。 200817859 同樣地,模擬設備22連接於控制計算機B之輸出/輸入 介面’上紅輸w輸人介_可岐任—麵謂算機輸出/ 輸入介面。此外,模擬設備22可與控制計算機21及測試平台 23間進行雙向資料傳輸,亦即可轉岭令簡或資料至控 制計算機21或接收來自職平台23的#料,靴制只能從控 制計算機21接受命令訊號加與輸出該輸入訊號炎至峨 平台23。 在本具體實施例之-較佳範例中,模擬設備Μ係一鍵盤 模擬器可連接於计算機之鍵盤輸入介面,例如:朽/2介面或 USB界面,此鍵盤模擬器輸入能輸出一鍵盤對鍵盤輸入介面 之所有輸人峨。林具體實麵之另—較絲例巾,模擬設 備22係-滑鼠模擬器,可連接於計算機之滑氣輸入介面,例 如:PS/2介面或USB界面,此滑鼠模擬諸人能輸出一滑鼠 對滑鼠輸入介面之所有輸入訊號。在本具體實施例之又一較佳 範例中,模擬設備22係一鍵盤及滑鼠模擬器,該鍵盤及滑鼠 模擬器可同時雜或部份連接上狀_輸人介面或滑鼠輸 入介面’並因應所連接之輸入界面達成上述之鍵盤模擬器及滑 ί 鼠模擬器之全部或部份功能,亦即該鍵盤及滑鼠模擬器可依據 命令訊號模擬鍵盤或滑鼠之訊號。 第二B圖為一種上述之鍵盤/滑鼠模擬器之示意圖,包含 一命令訊號接口 221、一可編程微控制器223、一鍵盤/滑鼠接 200817859 口、一繼電器與採樣器227。命令訊號接口 221用來接收上述 之命令訊號212,所接收之命令訊號212經由可編程微控制器 轉譯為輸入訊號222並傳送至測試平台23。採樣器227可用 來接收並反應測試平台23所回饋之訊號,例如測試平台23可 藉由回饋訊號的電位表示鍵盤上的“Num Lock”(數字鍵鎖定 功能鍵)是否鸽動。 如上述,模擬設備22可由控制計算機21接收一命令訊 號212,將命令訊號212轉譯為一輸入訊號222後輸出至測試 平台23之輸入介面。據此,模擬設備22可具有一轉譯元件 221,該轉譯元件221負責將上述之命令訊號212轉譯為輸入 訊號222。 因此轉譯元件221可以利用硬體或軟體來達成上述之轉 譯功能。例如,轉譯元件221可以利用一查表(i〇〇kup table)電 路,該查表電路依據命令訊號212輸出輸入訊號222。又例如 轉譯元件221可以運算一軟體,該軟體利用一查表索引出相應 於命令訊號212之輸入訊號222,該軟體與查表可以儲存於一 儲存元件。上述之儲存元件可以是一隨機存取記憶體、一唯讀 記憶體、一韌蟑、一快閃記憶體、一磁碟(包含軟碟或硬碟)、 一光碟或其他相關之電子儲存媒體。 在本具體實施例之一較佳範例中,上述之查表電路或查 表可以有複數個,亦即轉譯元件221有複數個查表電路或查表 11 200817859 可供選擇。其選擇方式可以由一切換電路或命令訊號212來達 成例如,切換電路可以是一多工器(multiplexer),由多工器 選擇其中一個查表電路或查表。多工器可由一切換開關或命令 訊號212來決定所要選擇的查表電路或查表。切換開關可以是 轉譯元件221之一電子元件,可藉由手動設定或命令訊號212 來設定。另外,上述之命令訊號可包含一查表代碼,轉譯元件 221依據查表代碼所相應之查表電路或查表將命令訊號212轉 譯為輸入訊號222。 上述之命令訊號212可以是一連串字元或滑鼠命令訊 號。因此在命令訊號與輸入訊號222的轉譯上可以是以一個字 元或滑鼠命令訊號對映一個輸入訊號,或是以該一連串字元或 /月鼠命令號轉譯為一輸入訊號或一連串的輸入訊號,本發明 並不加以限制。 因此,測試平台23由模擬設備22所收到輸入訊號222 便如门人工手動操作一般,其優點為人工輸入的過程可以完全 由控制計算機21操控模擬設備22所取代。換言之,根據本說 明書所揭露之帅,測試平台23在進行開機(_)、關機 (shutdown)、系統復位(reset)、輸入資料或其他相關之操作時, 完全避免了測試平台等待人工輸入的時間,進而可大幅增加工 作效率,並避免因人工輸入所造成的延誤。 測試平台23可用以測試一受測標的,該受測標的可以是 12 200817859 一受測設備23卜-受測軟體23 與受測軟體233,當受, 心剛設備231 , 田又成I铋的為夂測軟體233或 受測設備231與受測軟# > 、匕3’、!^式 又概體233時,受測軟體23 23執行運算。此外,受 由測试千口 、 、 係、、生由測試平台23與受測 設備231進行通訊。再者,受 ^ 财又測軟體233可以是受測設備231 之驅動程式或應用程式。 受測設備23i與測試平台23的連接可以為接觸式或非接 觸式,亦即受測設備231可以連接於測試平台23所提供之介 面(如上述之輸出/輸人介面或任何匯流排介面),或是以無線傳 輸方式與測试平台23通訊。換言之,受測設備况與測試平 台23在戦雜何以達絲朗的舰,無論是接觸式或 非接觸式,本f明並不加以限制。上述之匯流排介面可以是 PCI匯流排、EISA匯流排、ISA匯流排或其他規格之匯流排。 在測試過程中,量測設備24會量測測試平台23或受測 設備231之一個或多個受測訊號232,受測訊號232可以是由 測試平台23產生,亦可以是由受測設備231所產生。換言之, 量測設備24可由測試平台23或受測設備231之一條或多條線 路量測受測訊號。因此本具體實施例之量測設備24可能有一 個或多個,每一個量測設備24可同時量測一個或多個受測訊 號232,本發明^不限制受測訊號232、量測設備24以及單一量 測設備24可量測之受測訊號232的種類與數量。 13 200817859 里測設備24依據受測訊號232產生量測資料242,並且 將量測資料242傳送至控制計算機21,控制計算機21便可以 依據量測資料242發出命令訊號212進行下一階段之測試。因 此’量測設備24可以是以探針(PR0BE)、量測接腳、非接觸 式(如紅外線測温)來量測受測訊號232。同樣地,量測設備 24與控制計算機21間的連接亦可以是通用接口總線(General Purpose Interface Bus; GPIB)25 ^ 排介面。 、 另一方面,根據本實施例之自動測試系統的連接模式/訊 號傳遞模式亦可以如第二C圖所示。量測設備24可以是透過 模擬設備22與控制計算機21連接,亦即上述之通用接口總線 25、或上述之輸出輸入介面或匯流排介面係連接於模擬設備 22,由模擬設備負責控制計算機21與量測設備%之間的通 訊,如第二C所示。再者,測試平台23亦可以藉由模擬設備 22與控制计算機21通訊,或回饋受測訊號232給控制計算機 2卜 、 此外’控制計算機21除了依據量測資料242發出命令訊 號外,亦可以依據量測資料調整量測設備24。例如,當受測 訊號232超出量測設備24目前所設定的量測範圍時,控制計 算機21便可發出調整訊號214以調整量測範圍之設定。 據此,本發明之另一具體實施例係一種自動測試方法, 200817859 如第三圖示。首先如步驟310所示,由一計算機發出一命令訊 號至一模擬設備。然後如步驟320所示,模擬設備依據前述之 命令訊號送出二輸入訊號至測試平台。接下來,如步驟33〇所 示,測試平台依據輸入訊號測試一受測設備並產生受測訊號。 再接下來如步驟340所示,量測設備依據受測訊號產生量測資 料並送至計算機,最後如步驟350所示,計算機分析量測資料 並進行下一步驟之測試。 ! 本具體實私例之什鼻機、模擬設備、測試平台、量測設 備及其間相關之訊號如:命令訊號、輸入訊號、受測訊號、量 測資料之相關鳐節皆如前一實施例與第二A圖或第二c圖所 不’在此不再資述。 上述第二A圖、第二c圖與第三圖之計算機可具有一軟 體,計算機依據該軟體進行測試,因此在該軟體之運算期間, 計算依據該軟體發出命令訊號與調整量測設備。上述軟體之流 矛了以如本發明之再一具體實施例所示,係一自動量測方法, 請参照第四圖。 首先,如步驟510所示,初始化量測設備與測試平台, 以進入測試流程(步驟52〇至步驟6〇〇)。之後如步驟52〇所示, 計算機以命令飯號透過模擬設備對測試平台設定一數位/類比 轉換器之参數’經過一段延遲時剛如步驟53()所示),再由計 算機從里測設備讀取數位/類比轉換器之電壓(如步驟54〇所 15 200817859 示)並將量測資料儲存(如步驟550所示)。之後,增加數位/ 類比轉換器之参數(如步驟56〇所示),並比較量測資料是否超 出量測設備之__(如步驟57〇所利,如果纽量測設備 之顯不範15 ’計算機需麵&雜減以輕量測設備之量測 犯圍(如步驟580所示),並等待一段延遲時間(如步驟5%所 厂、)如果,又有大於量測設備之顯示範圍,檢查是否達到量測 之最大值(如雜600所示),如果制制之最大值,則測試 結束。如果尚未_量敗最大值,重複上狀戦流程(步 驟520至步驟600)。 由上述流程可以得知,計算機依次送出複數個命令訊 唬每一次命令訊號發送後量測設備會產生相應於該命令訊號 之料’並且計算機係於收到相應於命令訊號之量測資料 後送出下一個命令訊號。另外,上述之計算機係於下一次命令 訊號送出前送出調整訊號。 例如’以本發明來量測計算機顯示卡模擬量輸出DAC的 線性度為例,所需要量測的物理量為3個顏色通道(R、G、 b)dac的輸出電壓隨輸入數據的變化特性。依據上述流程, 首先初始化量測設備與測試平台,然後進入測試流程。在測試 / 瓜私中岭算機尽覆以命令訊號透過模擬設備對測試平台設定 一數位/類比轉換器之参數,例如測試流程共經過21G次,每次 參數遞增―増量,直到参數值麵制之最大值為止。每次的 200817859 測試流財,齡/齡轉㈣之参數在被蚊制延遲2〇 秒,以便DAe的輸出電壓穩定’並進行多次採樣去除噪聲 (noise) ’還能讓計算機能夠有足夠的時間從量測設備讀取dac 的輸出電壓’並且儲存起來° 3外’每次的測試流程中,計算 機需要檢查量測設備的量測範圍’如果輸出電壓超出量測範 圍’計算機便需要發出調整訊號調整量測設備的量程以符人 實際需求。在调整量測设備後’另外需要延遲_段時間,以避 免量測设備尚未調整完畢前進人下—次的測試流程。 本發明之自_試方法與錢改良了離㈣人工手動 調整量測設備c如示波器)並由人為酬測試結果之傳統測試 方法,將職步驟完全解化、程序化,具有良好的可重複性。 人只要根據要求編製好相應的控制程序,就能夠讓整個輸入過 程全自動進行,不需要人再進行干預,同時減低了人的勞動程 度。本發啊以自_整伽参數並且可以自動計時,並在測 試時間終了後够關定職結果,可防止人為操作不當或因 測試時間逾時而導致戦結果失效,以翻祕防呆的效果。 人 、 ’只需要將模擬設備連 接原有測試平台的触/輸騎面就可正f功q需要額外 的硬體’也不需要對測解台做任何修改,可以充分地利用現 有设備的功能,減少設備成本的投入。 傳統的自_試系統需要在測試平台運行某些特殊的常 17 200817859 駐程式,不能完全模擬最真實的運行環境。本系統係一種純外 的方法,對測试平台不引入任何的外部干擾,確保量測結果 的真實性。例如,傳統的測試方法無法以常駐程式關閉測試平 口後,再重新啟動測試平台,本發明可藉由模擬設備達成該項 操作。 、 此外,本發明由於採用計算機通用的輸出/輸入介面,因 此只要根據不同_絲改㈣計錢上的倾,開發系統所 需要的時間很短,並具有良好的升級性及擴充性,可以用於大 多數計算機插卡電性能的測試。 麵地,上面實_㈣描述,本發明可能有許多 的修正與差異。因此需要在其附加的權利要求項之範圍内加以 理解’除了上述詳細的描述外,本發明還可以廣泛地在其他的 實施例中把行。上述僅為本發明之較佳實施例而已,並非用以 限定本發明之申請專纖圍;凡其絲脫離本發騎揭示之精 神下所完賴較改輯修飾,均航含在下㈣料利範圍 内。 【圖式簡單說明】 第-A圖與第-B圖係為先前技術之示意圖; 第二A圖與第二B圖係為—本發明之—具體實施例之功 能方塊不意圖; 200817859 第二C圖係第二A圖之另一實施方式之功能方塊示意圖; 第三圖係本發明之另一具體實施例之流程示意圖;以及 第四圖係本發明之再一具體實施例之流程示意圖。 【主要元件符號說明】 12輸入設備 13測試平台 131受測設備 14量測設備 15適配器 21控制計算機 212命令訊號; 214調整訊號 22模擬設備 221命令訊號輸入接口 222輸入訊號~ 223可編程微控制器 225計算機鍵盤/滑鼠接口 227繼電器與採樣器 23測試平台 231受測設備 19 200817859 232受測訊號 233受測軟體 24量測設備 25通用接口總線 242量測資料 310 —計算機發出一命令訊號至一模擬設備 320模擬設備依據命令訊號送出一輸入訊號至測試平台 330測試平台依據輸入訊號測試一受測設備並產生受測訊號 340量測設備依據受測訊號產生量測資料並送至計算機 350計算機分析量測資料並進行下一步驟之測試 510初始化量測設備與測試平台 520設定一數位/類比轉換器之參數 530延遲 540讀取數位/類比轉換器之電壓 550儲存量測資料 560增加數位/類比轉換器之參數 570比較量測資料是否大於量測設備之顯示範圍 580調整量測設備之量測範圍 590延遲 6〇〇檢查是否埠到量測之最大值 20200817859 IX. Description of the invention: [Technical field to which the invention pertains] The autumn-test method and money of the present invention, in particular, a measurement method and system for replacing manual input. [Prior Art] In many computer equipment tests, many relevant parameters and instantaneous messages need to be captured, measured, and measured quickly, instantaneously, continuously, and accurately, and most of them need to be completed by manual or manual testing, in other words. In terms of equipment testing, it takes a lot of manpower. Especially in the testing of new products, a lot of basic parameter testing is needed, which greatly reduces the efficiency of the work. Figure-A is a typical traditional test environment consisting of a test (four) 盥 measuring instrument. The test platform 13 is connected to the input device 12, and is available for the operator to enter the age-old resignation 13 to install (4) the device ΐ3ι, and to perform the duties according to the instructions of the operator. The test signal generated by the job _ is sent to the measuring device 14: The operator can judge the test result by looking at the measuring instrument. For the setup order - by the relay 131 _ test platform η, it may often be necessary to repeatedly type the non-off command and obtain the data one or more times through the above process. 200817859 In the process of testing, if the manual or manual retrieving operation is very frequent, it usually takes a person to wait for the device _ should, in order to carry out the next-stage operation, forming a situation of "human devices," and wasting human resources. Resources. However,: In the test process of some jobs, the operator is required to (4) participate in the high, and the operator's prime f is insufficient, and the record will cause the "equipment, etc." question = reduce the utilization of the device. With the advancement of technology, some self-test systems have been gradually applied to the above test flow. As shown in FIG. B, special hardware and software 133 can be added to the test platform 13, and the test platform 13 The measured signal can be obtained from the measuring device 14 by the connection of the adapters I5 or the measuring data generated by the measuring device μ according to the measured signal. The conventional automatic test system needs to run some special tests on the test platform 13. The resident program (software, 133) 'and combined with special measurement hardware, _ simulates the real operating environment. For example, the input that requires manual operation is programmed to perform software operations to perform; In the course of the test, there are still some measured signals that need to be measured. The hardware equipment required by the target is to distinguish the money measurement signal and give back to the service platform. The ship, Lin ^ 13 needs to be in addition to the equipment under test (3). The measurement of the data and the execution of the test software, any one of the links may affect the frequency result, and the unexpected error caused by the process of reversing. In summary, the environment simulated by such an automated system is not The actual real environment. 200817859 In addition, the automatic measurement of this ^ also has many limitations. For example, the traditional test method can not restart the test platform after the platform is turned over. Therefore, the human slave is not a slave. Can be avoided. In situations where manual intervention is required, the platform will need to add additional personnel - a mechanism to notify the operator 'to enable the operator to process in time to reduce the situation of "machines, etc." However, the test platform may also be in a state of crash during the test. Second, it is not easy for the platform in the down state to perform the action of the operator. Because the test platform is down, all operations will stop, let alone notify the operator. According to the above environment and the problems arising from it, it is obvious that other improvements that require manual intervention are needed to avoid "people and other equipment," or "equipment," and other related aspects of improvement should also be The need to change the premise of the test platform τ development, the time and cost of the work such as the thief's low-level job, the Wei __ test platform. [Invention], in view of the above-mentioned invention background, in order to meet certain industrial interests The present invention provides an automatic test method and a system for solving the above-mentioned conventional automatic test methods and systems that fail to achieve the standard. The present invention aims to reduce the degree of human participation, the automatic test of the present invention 200817859 Ι = Γ, good In the past, it was necessary to manually adjust the measuring equipment (such as an oscilloscope) to test the results of the traditional test method, the test steps were completely simplified, orderly, and have good repeatability. A pure external method is used to flatten any slanting interference to ensure the authenticity of the quantity and fruit. In addition, the present invention adopts computer communication. The wheeling/input interface used therefore controls the software on the computer according to different _ trials. The development system requires time and short, and has good upgradeability and expansion of most computer card electrical performance _ test. Accordingly, one embodiment of the present invention provides a keyboard/mouse simulation & 'can be used with a keyboard or a mouse' or both. And in the present invention, The analog device with the function of the keyboard/mouse simulator is used as the input device of the computer controlled test platform to test the device or software under test with the control gamma platform. Then the measurement platform or the device under test is measured by the measuring device. After the measurement, the measurement data is generated to the computer. The computer can adjust the measurement range according to the quantity of the material. [Embodiment] The invention is directed to an automatic test method and system. In order to understand the present invention, detailed steps will be presented in the following description: 200817859 = its composition. The display of the ship, the implementation of the object is not limited to the automatic test method, the more skilled the craftsman (4). Another _ aspect, the public or the steps did not bribe Yang material, the smuggling of the escaping of the sacred sacred _ _ cast a bribe as follows, in addition to these detailed descriptions, 'this Wei shot simply batter him Wei Cai, and the cost of the present invention is not limited, which is based on the scope of the following patent. Referring to the second figure, the embodiment of the present invention is an automatic test system, including - control computer 21, An analog device 22, a test platform 23, and a measuring device 24. The weighting device 22 is connected to the control computer u and the test platform, respectively, and is responsible for interpreting the command signal 212 outputted by the control computer 2 into an input signal. The input signal 222 is input to the test platform 23. In other words, the analog device η is a test device, which is connected to the output/input interface of the job #23. This input interface can be any computer output/input. Interface, for example: Keyboard input interface: mouse. Interface, serial solution (such as printed scale), sequence itching (such as RS232埠, Di S485埠), Congyi, ffiEE1394埠 Infrared bee, network connection material#. Thereby, the device 22 can be connected to devices of these output/input interfaces, such as a keyboard, a mouse, a printer, a data machine, a network device, and the like. In addition, it is quite possible to control the power switch of the test platform 23. In other words, the analog device 22 can turn on/off the test platform 23 according to the command signal 212. 200817859 Similarly, the analog device 22 is connected to the output/input interface of the control computer B, which can be used as an output/input interface. In addition, the analog device 22 can perform bidirectional data transmission with the control computer 21 and the test platform 23, and can also transfer the data or the data to the control computer 21 or receive the material from the service platform 23, and the boot can only be controlled from the control computer. 21 accepts the command signal to add and output the input signal to the platform 23. In a preferred embodiment of the present embodiment, the analog device can be connected to a keyboard input interface of a computer, such as a *** interface or a USB interface, and the keyboard simulator input can output a keyboard pair. All the input of the keyboard input interface. The specific concrete surface of the forest - the silk case, the analog device 22 series - mouse simulator, can be connected to the computer's slip input interface, such as: PS/2 interface or USB interface, this mouse can simulate the output of the person A mouse enters all input signals to the mouse input interface. In another preferred embodiment of the present embodiment, the analog device 22 is a keyboard and a mouse simulator, and the keyboard and the mouse simulator can be connected at the same time or partially connected to the input interface or the mouse input interface. 'According to the connected input interface to achieve all or part of the above functions of the keyboard simulator and the mouse simulator, that is, the keyboard and mouse simulator can simulate the keyboard or mouse signal according to the command signal. Figure 2B is a schematic diagram of a keyboard/mouse simulator as described above, including a command signal interface 221, a programmable microcontroller 223, a keyboard/mouse connection 200817859 port, a relay and sampler 227. The command signal interface 221 is configured to receive the command signal 212, and the received command signal 212 is translated into the input signal 222 via the programmable microcontroller and transmitted to the test platform 23. The sampler 227 can be used to receive and reflect the signals fed back by the test platform 23. For example, the test platform 23 can indicate whether the "Num Lock" (numeric key lock function key) on the keyboard is doped by the potential of the feedback signal. As described above, the analog device 22 can receive a command signal 212 from the control computer 21, translate the command signal 212 into an input signal 222, and output it to the input interface of the test platform 23. Accordingly, analog device 22 can have a translation component 221 that translates the command signal 212 described above into an input signal 222. Therefore, the translation component 221 can utilize hardware or software to achieve the above-described translation function. For example, the translation component 221 can utilize a look-up table circuit that outputs an input signal 222 in response to the command signal 212. For example, the translation component 221 can calculate a software. The software uses a lookup table to index the input signal 222 corresponding to the command signal 212. The software and the lookup table can be stored in a storage component. The storage element may be a random access memory, a read-only memory, a firmware, a flash memory, a disk (including a floppy disk or a hard disk), a compact disk or other related electronic storage medium. . In a preferred embodiment of the present embodiment, the above-mentioned table lookup circuit or look-up table may have a plurality of, that is, the translation component 221 has a plurality of look-up tables or look-up tables 11 200817859. The selection mode can be implemented by a switching circuit or command signal 212. For example, the switching circuit can be a multiplexer, and one of the meter reading circuits or the look-up table is selected by the multiplexer. The multiplexer can determine the look-up table or look-up table to be selected by a switch or command signal 212. The switch can be an electronic component of the translation component 221 and can be set by manually setting or commanding the signal 212. In addition, the command signal may include a lookup table code, and the translation component 221 translates the command signal 212 into the input signal 222 according to the lookup circuit or lookup table corresponding to the lookup table code. The command signal 212 described above may be a series of character or mouse command signals. Therefore, in the translation of the command signal and the input signal 222, an input signal can be mapped by a character or a mouse command signal, or can be translated into an input signal or a series of inputs by the series of characters or the mouse command number. Signals, the invention is not limited. Therefore, the input signal 222 received by the analog platform 22 by the analog device 22 is manually operated as a manual operation. The advantage is that the manual input process can be completely replaced by the control computer 21 controlling the analog device 22. In other words, according to the disclosure disclosed in the present specification, the test platform 23 completely avoids the time for the test platform to wait for manual input when performing boot (_), shutdown, system reset, input data, or other related operations. , in turn, can greatly increase work efficiency and avoid delays caused by manual input. The test platform 23 can be used to test a test target, which can be 12 200817859 A device under test 23 - the software to be tested 23 and the software to be tested 233, when received, the device 231, Tian Yicheng I When the software 233 or the device under test 231 and the soft device under test # > , 匕 3 ', and the mode 233 are displayed, the test software 23 23 performs an operation. In addition, the test platform 23 communicates with the device under test 231 by the test platform, system, and student. Furthermore, the software 233 can be a driver or application of the device under test 231. The connection between the device under test 23i and the test platform 23 may be contact or non-contact, that is, the device under test 231 may be connected to the interface provided by the test platform 23 (such as the output/input interface or any bus interface described above). Or communicate with the test platform 23 by wireless transmission. In other words, the condition of the equipment under test and the test platform 23 are noisy, and whether it is contact or non-contact, this is not limited. The bus interface described above may be a PCI bus, an EISA bus, an ISA bus, or a bus of other specifications. During the test, the measuring device 24 measures one or more of the tested signals 232 of the test platform 23 or the device under test 231. The measured signal 232 may be generated by the test platform 23 or may be generated by the device under test 231. Produced. In other words, the measurement device 24 can measure the measured signal from one or more lines of the test platform 23 or the device under test 231. Therefore, the measuring device 24 of the specific embodiment may have one or more, each measuring device 24 can simultaneously measure one or more measured signals 232, and the present invention does not limit the measured signal 232 and the measuring device 24 And the type and quantity of the signal 232 to be measured that can be measured by the single measuring device 24. 13 200817859 The measuring device 24 generates the measuring data 242 according to the measured signal 232, and transmits the measuring data 242 to the control computer 21, and the control computer 21 can issue the command signal 212 according to the measuring data 242 for the next stage of testing. Therefore, the measuring device 24 can measure the signal under test 232 with a probe (PR0BE), a measuring pin, and a non-contact type (such as infrared temperature measurement). Similarly, the connection between the measurement device 24 and the control computer 21 may also be a General Purpose Interface Bus (GPIB) 25^ interface. On the other hand, the connection mode/signal transmission mode of the automatic test system according to this embodiment can also be as shown in the second C diagram. The measuring device 24 can be connected to the control computer 21 through the analog device 22, that is, the above-mentioned universal interface bus 25, or the above-mentioned output input interface or bus interface interface is connected to the analog device 22, and the analog device is responsible for controlling the computer 21 and The communication between the devices is measured as shown in the second C. In addition, the test platform 23 can also communicate with the control computer 21 through the analog device 22, or feed back the measured signal 232 to the control computer 2, and the control computer 21 can also issue a command signal according to the measurement data 242. The measuring device 24 is adjusted based on the measurement data. For example, when the signal under test 232 exceeds the measurement range currently set by the measuring device 24, the control computer 21 can issue an adjustment signal 214 to adjust the setting of the measurement range. Accordingly, another embodiment of the present invention is an automated test method, 200817859 as shown in the third illustration. First, as shown in step 310, a command signal is sent by a computer to an analog device. Then, as shown in step 320, the analog device sends the two input signals to the test platform according to the foregoing command signal. Next, as shown in step 33, the test platform tests a device under test according to the input signal and generates a signal to be tested. Then, as shown in step 340, the measuring device generates the measurement data according to the measured signal and sends it to the computer. Finally, as shown in step 350, the computer analyzes the measurement data and performs the test of the next step. The specific information of the nose machine, the analog device, the test platform, the measuring device and the related signals such as the command signal, the input signal, the measured signal, and the measurement data are as in the previous embodiment. It is not described here with the second A picture or the second c picture. The computer of the second A picture, the second C picture and the third figure may have a software, and the computer performs testing according to the software. Therefore, during the operation of the software, calculating a command signal and adjusting the measurement device according to the software. The above-mentioned soft body spear is an automatic measuring method as shown in still another embodiment of the present invention. Please refer to the fourth figure. First, as shown in step 510, the measurement device and the test platform are initialized to enter the test flow (step 52 to step 6). Then, as shown in step 52, the computer sets the parameter of a digit/analog converter to the test platform through the analog device through the analog device. 'After a delay, as shown in step 53()), the computer then measures the device from the internal device. The voltage of the digital/analog converter is read (as shown in step 54 200817859) and the measurement data is stored (as shown in step 550). After that, increase the parameters of the digital/analog converter (as shown in step 56), and compare whether the measured data exceeds the __ of the measuring device (as in step 57, if the measuring device is not displayed) 'Computer needs & subtraction to measure the weight of the device (as shown in step 580), and wait for a delay time (such as step 5% factory), if there is more than the display of the measurement device Range, check if the maximum value of the measurement is reached (as indicated by Miscellaneous 600), and if the maximum value is manufactured, the test ends. If the maximum value has not been exceeded, repeat the process (steps 520 to 600). It can be known from the above process that the computer sequentially sends a plurality of command messages. After each command signal is sent, the measuring device generates a material corresponding to the command signal, and the computer sends the measurement data corresponding to the command signal. The next command signal. In addition, the computer sends the adjustment signal before the next command signal is sent. For example, the linearity of the analog output DAC of the computer display card is measured by the present invention. The measured physical quantity is the variation characteristic of the output voltage of the three color channels (R, G, b) dac with the input data. According to the above process, the measurement device and the test platform are first initialized, and then the test flow is entered. The ridge computer uses the command signal to set the parameters of a digital/analog converter to the test platform through the analog device. For example, the test process passes through 21G times, and each parameter is incremented by 増 , until the maximum value of the parameter value. The 200817859 test flow, the age/age transition (four) parameters are delayed by 2 seconds in the mosquito system, so that the DAe output voltage is stable 'and multiple sampling to remove the noise (noise) can also allow the computer to have enough time Read the output voltage of the dac from the measuring device 'and store it. 'In the test flow, the computer needs to check the measuring range of the measuring device. 'If the output voltage exceeds the measuring range, the computer needs to send the adjustment signal. Adjust the measuring range of the measuring device to meet the actual needs of the person. After adjusting the measuring device, 'additional delay time is needed to avoid measuring the device yet. The whole test process is carried out. The self-test method and the money improvement of the present invention are improved by (four) manual manual adjustment measuring equipment c such as an oscilloscope) and the traditional test method of the human reward test result, the full step of the job steps It is programmed and has good repeatability. As long as the person prepares the corresponding control program according to the requirements, the entire input process can be fully automated, and no one needs to intervene again, and the degree of labor is reduced. This is a self-contained gamma parameter and can be automatically timed. After the test time is over, it is enough to prevent the result of improper operation or to prevent the result of the test time from being overdue. People, 'only need to connect the analog device to the touch/transport surface of the original test platform, you can use the extra hardware' and do not need to make any modifications to the test bench. You can make full use of the existing equipment. Function to reduce the investment in equipment costs. The traditional self-test system needs to run some special routines on the test platform, which cannot fully simulate the most realistic operating environment. This system is a purely external method that does not introduce any external interference to the test platform to ensure the authenticity of the measurement results. For example, the conventional test method cannot restart the test platform after the test module is closed by the resident program, and the present invention can achieve the operation by the analog device. In addition, the present invention adopts a computer-wide output/input interface, so that the time required to develop the system is short, and has good upgradeability and expandability, and can be used as long as the money is tilted according to different _ silk changes (4). Tested for electrical performance of most computer cards. In the above, the above description _ (four) describes that the present invention may have many modifications and differences. It is therefore to be understood that in the scope of the appended claims The above is only a preferred embodiment of the present invention, and is not intended to limit the application of the present invention. Where the wire is removed from the spirit of the present disclosure, it is included in the next (four) material. Within the scope. BRIEF DESCRIPTION OF THE DRAWINGS The first-A and second-B diagrams are schematic diagrams of the prior art; the second A-picture and the second-B diagram are--the functional blocks of the present invention are not intended; 200817859 second C is a functional block diagram of another embodiment of the second embodiment of the present invention; the third drawing is a schematic flow chart of another embodiment of the present invention; and the fourth drawing is a schematic flow chart of still another embodiment of the present invention. [Main component symbol description] 12 input device 13 test platform 131 device under test 14 measurement device 15 adapter 21 control computer 212 command signal; 214 adjustment signal 22 analog device 221 command signal input interface 222 input signal ~ 223 programmable microcontroller 225 computer keyboard / mouse interface 227 relay and sampler 23 test platform 231 device under test 19 200817859 232 test signal 233 test software 24 measurement device 25 universal interface bus 242 measurement data 310 - computer sends a command signal to a The analog device 320 sends an input signal to the test platform according to the command signal. The test platform tests a device under test according to the input signal and generates a signal to be tested. The measurement device generates measurement data according to the measured signal and sends it to the computer 350 for analysis. Measuring data and performing the next step of testing 510 Initialization measuring device and test platform 520 setting a digital/analog converter parameter 530 delay 540 reading digital/analog converter voltage 550 storing measurement data 560 increasing digits/analog The parameter 570 of the converter compares whether the measured data is larger than the measuring device Display range 580 Adjust the measuring range of the measuring device 590 delay 6〇〇 Check if the maximum value of the measurement is reached 20

Claims (1)

200817859 十、申請專利範圍: 1. 一種鍵盤/滑鼠模擬器,包含: -命令訊號輸入接口,該命令訊號輸入接口接收一命令訊號; -可編程微控制n,該可編程微㈣轉職命令訊號成為一 輸入訊號’其巾該輸人訊號係模擬鍵盤/滑鼠之訊號; -计异機鍵盤/滑鼠接口,該輸人訊號由該計算機鍵盤/滑鼠接口 輸出至一測試平台;以及 一採樣器,該採樣器由該測試平台回饋給鍵盤/滑鼠之一回饋訊 號。 2·根據申請專利麵第1項之鍵盤/滑鼠模擬器,其中上述之可編 紅微控制器具有至少一個查表,該可編程微控制器依據該命令 訊號選擇該命令訊號所指定之查表,並檢索該查表將該命令訊 號轉譯成為該輸入訊號。 3·根據申請專利範圍第2項之鍵盤/滑鼠模擬器,其中上述之查表 係由一查表電路>斤實施。 4·根據申請專利範闺第2項之鍵盤/滑鼠模擬器,其中上述之查表 係由一軟體所實施,該可編程微控制器經由運算該軟體來檢索 該查表。 5· —種自動測試系統,包含: 一控制計算機,該控制計算機輸出一命令訊號並接收一量測資 料; 21 200817859 一模擬設備,該模擬設備接收該命令訊號並轉譯該命令訊號成 為一輸入訊號, 一測試平台,該測試平台依據該輸入訊號測試一受測設備,該 測試平台與該受測設備之至少一線路輸出一受測訊號; 一量測設備,該量測設備量測每一個該受測訊號並據以產生該 量測資料。 6·根據申請專利範圍第5項之自動測試系統,其中上述之模擬設 備具有一轉譯元件,該轉譯元件具有至少一個查表,該轉譯元 件依據該命令訊號選擇該命令訊號所指定之查表,並檢索該查 表將該命令訊號轉譯成為該輸入訊號。 7·根據申請專利範園第6項之自動測試系統,其中上述之查表係 由一查表電路所實施。 8·根據申請專利範圍第6項之自動測試系統,其中上述之查表係 由一軟體所實施,該轉譯元件經由運算該軟體來檢索該查表。 9·根據申請專利範圍第5項之自動測試系統,其中上述之模擬設 備係一鍵盤/滑氱模擬器,該鍵盤/滑鼠模擬器依據該命令訊號模 擬鍵盤/滑鼠之訊號成為該輸入訊號。 10·根據申請專利範圍第5項之自動測試系統,其中上述之量測設 備與該控制計算機間係以一適配器連接,該適配器係一通用接 口總線。 11·根據申请專利範圍第5項之自動測試系統’其中上述之測試平 22 200817859 台依據該輸入訊號調整測試該受測設備之輸入電壓。 關閉該測試平台 12.ΓΓΓ咖軸5項之自_試_,其中上述之模触 ::::台之電源’其中該模擬設備依據該命令訊號開啟/ I3.根射糊範_5奴自_物,其 台運算一受測軟體,該受測斂i H判忒十 雜試料與該受測設備 通 §fl。 14·根據申請專卿第13項之自動測試系統,其中上述之受測 軟體係該受測設備之驅動程式/應用程式。 15. 根據申請專利軸5項之自動測試系統,其中上述之控制計 城更包含輸出—調整訊號至該量測設備,該控制計算機經由 該调整§fL號調整該量測設備。 16. 根射請專利_第5項之自動測試系統,其中上述之量測設 備係一試波器。 17· —種自動測試方法,包含: 由一控制計算機發出—命令訊號至-模擬設備; 該織設備依據該命令訊號模擬一輸入農置輸出一輸入訊號至 一測試平台; 該測試平台依據該輸入訊號測試一受測設備並產生至少一受測 訊號;以及 量測設備依據該受測訊號產生-量測資料並將該量啦料送至 23 200817859 該控制計算機。 18·根據申請專利範圍第17項之自動測試方法,更包含控制計算 機依據該量測資料送出一調整訊號,該控制計算機經由該調整 訊號調整該量測設備。 19·根據申請專利範圍第17項之自動測試方法,其中上述之控制 計算機依次送出複數個命令訊號,每一次命令訊號發送後該量 測設備產生相應於該命令訊號之量測資料,該控制計算機係於 收到相應於該命令訊號之量測資料後送出下一個命令訊號。 2〇·根據㈣專利範㈣15)項之自細試方法,其巾上述之控制 計算機係於下-次命令訊號送出前送出該調整訊號。 24200817859 X. Patent application scope: 1. A keyboard/mouse simulator, comprising: - a command signal input interface, the command signal input interface receives a command signal; - a programmable micro control n, the programmable micro (four) transfer command The signal becomes an input signal 'the towel input signal is an analog keyboard/mouse signal; - the different computer keyboard/mouse interface, the input signal is output from the computer keyboard/mouse interface to a test platform; A sampler that is fed back to the keyboard/mouse feedback signal by the test platform. 2. The keyboard/mouse simulator according to item 1 of the patent application, wherein the redistributable microcontroller has at least one look-up table, and the programmable microcontroller selects the command specified by the command signal according to the command signal. The table is retrieved and the lookup table translates the command signal into the input signal. 3. The keyboard/mouse simulator according to item 2 of the patent application scope, wherein the above-mentioned checklist is implemented by a look-up table circuit. 4. The keyboard/mouse simulator according to claim 2, wherein the look-up table is implemented by a software that retrieves the look-up table by computing the software. 5. An automatic test system comprising: a control computer, the control computer outputs a command signal and receives a measurement data; 21 200817859 an analog device, the analog device receives the command signal and translates the command signal into an input signal a test platform, the test platform tests a device under test according to the input signal, and the test platform outputs a measured signal with at least one line of the device under test; a measuring device, the measuring device measures each of the measured devices The measured signal is used to generate the measured data. 6. The automatic test system according to claim 5, wherein the analog device has a translation component, the translation component has at least one lookup table, and the translation component selects a lookup table specified by the command signal according to the command signal. And searching the lookup table to translate the command signal into the input signal. 7. According to the automatic test system of claim 6 of the patent application park, the above checklist is implemented by a look-up table circuit. 8. The automatic test system according to item 6 of the scope of the patent application, wherein the look-up table is implemented by a software, and the translation component retrieves the look-up table by computing the software. 9. The automatic test system according to claim 5, wherein the analog device is a keyboard/sliding simulator, and the keyboard/mouse simulator simulates the keyboard/mouse signal according to the command signal to become the input signal. . 10. The automatic test system according to claim 5, wherein the measuring device and the control computer are connected by an adapter, and the adapter is a universal interface bus. 11. The automatic test system according to item 5 of the scope of the patent application, wherein the above test unit 22 200817859 adjusts the input voltage of the device under test according to the input signal. Close the test platform 12. ΓΓΓ 轴 axis 5 items from the _ test _, the above model touch: :::: Taiwan power supply 'where the analog device is based on the command signal to open / I3. root paste van _5 slave _ object, its calculation of a tested software, the measured convergence of the H test sample and the device under test § fl. 14. According to the automatic test system of the application for the 13th item, the above-mentioned test software system is the driver/application of the device under test. 15. According to the automatic test system of claim patent axis 5, wherein the control program further comprises an output-adjustment signal to the measuring device, and the control computer adjusts the measuring device via the adjustment §fL number. 16. The automatic test system of the patent application _ 5, wherein the above measurement device is a test wave device. 17. An automatic test method comprising: issuing a command signal to an analog device by a control computer; the weaving device simulating an input farm outputting an input signal to a test platform according to the command signal; the test platform is based on the input The signal tests a device under test and generates at least one signal to be tested; and the measuring device generates a measurement data according to the signal to be measured and sends the amount to the control computer of 23 200817859. 18. The automatic test method according to claim 17 of the patent application scope, further comprising the control computer sending an adjustment signal according to the measurement data, the control computer adjusting the measurement device via the adjustment signal. 19. The automatic test method according to claim 17, wherein the control computer sequentially sends a plurality of command signals, and after each command signal is sent, the measurement device generates measurement data corresponding to the command signal, the control computer The system sends the next command signal after receiving the measurement data corresponding to the command signal. 2. According to the self-study method of (4) Patent (4), item 15), the control computer of the towel mentioned above sends the adjustment signal before the next-order command signal is sent. twenty four
TW95137874A 2006-10-14 2006-10-14 Method and system for automatic testing and its etep-by-etap testing method TW200817859A (en)

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