200813415 九、發明說明： 【發明所屬之技術領域】 本發明涉及-種間隔環正反放置狀態之檢測方法。 【先前技術】 隨著光學成像技術之發展，鏡頭模組於各種成像裝置 如數碼相機、攝像機中得到廣泛應用，而整合有鏡頭模植 之手機、筆記本電腦等電子裝置，則得到眾多消費者之青 先确之鏡頭杈組通常包括收容於鏡筒内之複數透 鏡、濾光片等光學元件’以及間隔環等。所述間隔環設置 ，兩相鄰之光學70件之間’其用於控制各光學元件之間距 離’以防止相鄰光學元件之間發生摩擦或碰撞，從而避免 透鏡、濾光片等光學元件受損。200813415 IX. Description of the Invention: [Technical Field] The present invention relates to a method for detecting a positive and negative placement state of a spacer ring. [Prior Art] With the development of optical imaging technology, the lens module has been widely used in various imaging devices such as digital cameras and video cameras, and electronic devices such as mobile phones and notebook computers integrated with lens molding have been widely used by consumers. The green lens group usually includes a plurality of optical elements such as a lens and a filter housed in the lens barrel, and a spacer ring. The spacer ring is disposed between two adjacent optical pieces 70, which are used to control the distance between the optical elements to prevent friction or collision between adjacent optical elements, thereby avoiding optical elements such as lenses and filters. Damaged.
之直後從第一表面1Q1 一側至第一矣 ^ J罘—表面1〇2 —侧沿間隔環 厚度方向逐漸變小。在此，定義間隔環1〇之第一表面 ^隔環1〇之正面，定義間隔10之第二表面皿為間隔 環10之沒而。 如圖1所不，常見之間隔環1〇包括相對設置之第一 表面101及第二表面102’用於與鏡筒内壁接觸之圓周侧 面103,以及可供光線透過之直徑沿間隔環1〇厚度方向漸 ，之圓台狀透光孔1〇4。所述圓台狀透光孔撕連通所述 第—表面ιοί及第二表面102’並且該圓台狀透光孔1〇4 參見圖2及圖3，當間隔環 10之正面朝向發散透鏡 6 200813415 之出射面時，間隔環10將會阻擔部分經由發散透鏡2〇 發散1有效光線，從而會影響鏡頭模組之成像品質；而當 間隔環10之反面朝向發散透鏡20之出射面時，由於圓= 狀透光孔104之直徑沿光線之傳播方向逐漸變大，從而可 ，免遮擋經由發散透鏡20發散之有效光線。因此，將間隔 環組裝入鏡頭模組之前，需要檢測待組裝間隔環之正 置狀態’以防止將間隔環之方向裝反。 φ 有鑒於此，有必要提供一種間隔環正反放置狀態之檢 測方法，其可快速、準確地檢測間隔環之正反放置狀態。 【發明内容】 ^ 、以下將以實施例說明一種間隔環正反放置狀態之檢測 方法其可快速、準確地檢測間隔環之正反放置狀態。 種間隔環正反放置狀態之檢測方法，其包括步驟： 提供-用於產生雷射光束之雷射產生裝置以&一用於探測 所述雷射光束之雷射探測裝置；將待測間隔環置於所述雷 φ射光束光路中之預定位置，該預定位置之設置可使待測= 隔環於正反兩種放置狀態時允許或阻止雷射光束透過其透 光孔，相應的，所述雷射探測裝置則能或不能探測到雷射 光束；啟動雷射產生裝置以產生雷射光束並藉由雷射探測 裝置探測雷射光束，根據雷射探測裝置是否探測到雷射光 束檢測間隔環之放置狀態。 相較于先前技術，所述間隔環正反放置狀態之檢測方 法，其採用雷射光束照射待測間隔環，由於待測間隔環處 於正反兩種不同之放置狀態時將允許或阻止雷射光束穿過 7 200813415 間隔環之透光孔，進而可根據雷射探測裝置是否探測到雷 射光束來判別間隔環之放置狀態，其可快速、準確地檢測 間隔環之正反放置狀態。 【實施方式】 下面結合附圖對本發明作進一步詳細說明。 參見圖4至圖5，本發明實施例提供之間隔環10正反 放置狀態之檢測方法包括步驟： (1) 提供一雷射產生裝置30及一雷射探測裝置40。 B 該雷射產生裝置30用於產生雷射光束。所述雷射產生 裝置30可採用紅外波段雷射器，如二氧化碳雷射器，二極 體雷射器，以及摻鈦釔鋁石榴石（Nd-YAG)雷射器、镱釔鋁 石榴石（Yd-YAG)雷射器、鈦釩酸鹽（Nd-Vanadate)雷射器等 固態雷射器。該雷射探測裝置40用於探測雷射產生裝置 30產生之雷射光束，從而所述雷射產生裝置30與雷射探 測裝置40之間形成雷射光束之光路（如圖中帶箭頭之直線 _所示）。該雷射探測裝置40可為雷射感測器。 (2) 提供一間隔環10，將該間隔環10置於所述雷射光 束光路中之預定位置。 所述間隔環10為環狀，其具有第一表面101，第二表 面102及圓台狀透光孔104。所述透光孔104之直徑沿間 隔環10之厚度方向漸變，並且該透光孔104與間隔環10 之第一表面101及第二表面102之交接處分別形成第一開 口 1041及第二開口 1042。所述第一開口 1041之直徑大於 第二開口 1042之直徑。間隔環10之第一開口 1041於第二 8 200813415 表面102上之投影與第二開口 1042之間形成一環形區域 1020。間隔環10之第二開口 1042於第一表面101所處平 面上之投影與第一開口 1041之間形成一虛擬之環形區域 1010。 將間隔環10置於雷射產生裝置30與雷射探測裝置40 之間之雷射光束光路中時，該間隔環10具有兩種放置狀 態：（a).正放置狀態，即間隔環10之第一表面101朝向雷 射產生裝置30，而第二表面102朝向雷射探測裝置40(如 ⑩圖4所示）。（b)·反放置狀態，即間隔環10之第二表面102 朝向雷射產生裝置30,而第一表面101朝向雷射探測裝置 40(如圖5所示）。 所述預定位置使得間隔環10處於正放置狀態時，雷射 光束可穿過間隔環10之透光孔104 ;間隔環10處於反放 置狀態時，雷射光束不能穿過間隔環10之透光孔104。 參見圖4,當間隔環10處於正放置狀態時，雷射產生 _裝置30產生之雷射光束照向環形區域1010，並且該雷射 光束與透光孔104軸截面之母線AAT平行。所述雷射光束 入射至虛擬之環形區域1010後，可穿過透光孔104進而到 達雷射探測裝置40。 參見圖5,當間隔環10處於反放置狀態時，雷射產生 裝置30產生之雷射光束照向環形區域1020。所述雷射光 束入射至環形區域1020後，被環形區域1020阻擋而無法 穿過透光孔104,從而雷射探測裝置40無法探測到雷射光 200813415 f (3)啟動雷射產生裝置30以產生雷射光束並藉由雷射 探測裝置40探測雷射光束，根據雷射探測裝置40是否探 測到雷射光束檢測間隔環10之放置狀態。參照第（2)步之 預定位置設置原則：當雷射探測裝置40可以探測到雷射光 束時，則間隔環10處於正放置狀態；當雷射探測裝置40 不能探測到雷射光束時，則間隔環10處於反放置狀態。 需要說明的係，上述間隔環正反放置狀態檢測方法之 步驟（2)中，入射之雷射光束並不局限于與透光孔104轴截 ⑩面之母線AA’平行，該雷射光束之入射方向也可根據其於 環形區域1010内入射點之不同而作適當調整，只要能保證 “間隔環10處於正放置狀態時，雷射光束可穿過間隔環 10之透光孔104 ;間隔環10處於反放置狀態時，雷射光束 不能穿過間隔環10之透光孔104”即可。 所述間隔環正反放置狀態之檢測方法，其採用雷射光 束照射待測間隔環10，由於待測間隔環10處於正反兩種 φ不同之放置狀態時將允許或阻止雷射光束穿過間隔環10 之透光孔104,進而可根據雷射探測裝置40是否探測到雷 射光束來判別間隔環10之放置狀態，其可快速、準確地檢 測間隔環之正反放置狀態。 綜上所述，本發明符合發明專利要件，爰依法提出專 利申請。惟，以上所述者僅為本發明之較佳實施例，舉凡 熟習本案技藝之人士，在援依本案發明之精神所作之等效 修飾或變化，皆應包含於以下之申請專利範圍内。 200813415 【圖式簡單說明】 圖1係先前之間隔環結構示意圖。 圖2係圖1所示間隔環與發散透鏡以第一種狀態配合 組裝時之入射光線光路圖。 圖3係圖1所示間隔環與發散透鏡以第二種狀態配合 組裝時之入射光線光路圖。 圖4係本發明實施例雷射探測裝置探測到雷射光束之 不意圖。 圖5係本發明實施例雷射探測裝置未探測到雷射光束 馨之示意圖。 【主要元件符號說明】 間隔環 10 第一表面 101 第二表面 102 環形區域 1010,1020 圓周側面 103 透光孔 104 第一開口 1041 第二開口 1042 發散透鏡 20 雷射產生裝置 30 雷射探測裝置 40 11Straight from the first surface 1Q1 side to the first 矣 ^ J 罘 - surface 1 〇 2 - the side gradually becomes smaller along the thickness direction of the spacer ring. Here, the first surface of the spacer ring 1 is defined as the front surface of the spacer ring 1 , and the second surface dish defining the interval 10 is the spacer ring 10. As shown in FIG. 1, the conventional spacer ring 1 includes a first side surface 101 and a second surface 102' which are oppositely disposed for contacting the inner side surface 103 of the inner wall of the lens barrel, and a diameter for the light to pass through the spacer ring. The thickness direction is gradually increased, and the truncated cone-shaped light transmission hole is 1〇4. The truncated-shaped light-transmissive aperture is torn away from the first surface ιοί and the second surface 102 ′ and the truncated-shaped light-transmissive aperture 1 〇 4 is seen in FIGS. 2 and 3 , when the front surface of the spacer ring 10 faces the diverging lens 6 When the exit surface of 200813415, the spacer ring 10 will disperse 1 effective light through the diverging lens 2, thereby affecting the imaging quality of the lens module; and when the opposite side of the spacer ring 10 faces the exit surface of the diverging lens 20, Since the diameter of the circular aperture 104 is gradually increased in the direction of propagation of the light, the effective light diverging through the diverging lens 20 can be prevented from being blocked. Therefore, before the spacer ring assembly is loaded into the lens module, it is necessary to detect the positive state of the spacer ring to be assembled to prevent the direction of the spacer ring from being reversed. φ In view of this, it is necessary to provide a detection method for the positive and negative placement state of the spacer ring, which can quickly and accurately detect the positive and negative placement state of the spacer ring. SUMMARY OF THE INVENTION In the following, a method for detecting the positive and negative placement state of a spacer ring will be described by way of an embodiment, which can quickly and accurately detect the positive and negative placement state of the spacer ring. A method for detecting a positive and negative placement state of a spacer ring, comprising the steps of: providing a laser generating device for generating a laser beam, & a laser detecting device for detecting the laser beam; The ring is placed at a predetermined position in the optical path of the lightning ray beam, and the predetermined position is set to allow the detecting ring to allow or prevent the laser beam from passing through the light transmitting hole when the spacer ring is placed in both the front and the back, correspondingly, The laser detecting device can or cannot detect the laser beam; activate the laser generating device to generate the laser beam and detect the laser beam by the laser detecting device, and detect whether the laser beam is detected according to the laser detecting device The placement state of the spacer ring. Compared with the prior art, the method for detecting the positive and negative placement state of the spacer ring uses a laser beam to illuminate the interval ring to be tested, and the laser or the anti-measurement ring will allow or block the laser when the spacer ring is in a positive or negative state. The light beam passes through the light-transmitting hole of the spacer of 200813415, and the position of the spacer ring can be discriminated according to whether the laser detecting device detects the laser beam, which can quickly and accurately detect the positive and negative placement state of the spacer ring. [Embodiment] The present invention will be further described in detail below with reference to the accompanying drawings. Referring to FIG. 4 to FIG. 5, the method for detecting the positive and negative placement state of the spacer ring 10 according to the embodiment of the present invention includes the following steps: (1) A laser generating device 30 and a laser detecting device 40 are provided. B The laser generating device 30 is for generating a laser beam. The laser generating device 30 may employ an infrared band laser such as a carbon dioxide laser, a diode laser, and a titanium-doped yttrium aluminum garnet (Nd-YAG) laser, yttrium aluminum garnet ( Yd-YAG) Solid-state lasers such as lasers and Nd-Vanadate lasers. The laser detecting device 40 is configured to detect a laser beam generated by the laser generating device 30, so that a laser beam path is formed between the laser generating device 30 and the laser detecting device 40 (such as a straight line with an arrow in the figure) _ shown). The laser detecting device 40 can be a laser sensor. (2) A spacer ring 10 is provided which is placed at a predetermined position in the laser beam path. The spacer ring 10 is annular and has a first surface 101, a second surface 102, and a truncated-shaped light-transmissive hole 104. The diameter of the transparent hole 104 is gradually changed along the thickness direction of the spacer ring 10, and the first opening 1041 and the second opening are respectively formed at the intersection of the transparent hole 104 and the first surface 101 and the second surface 102 of the spacer ring 10, respectively. 1042. The diameter of the first opening 1041 is larger than the diameter of the second opening 1042. An annular region 1020 is formed between the projection of the first opening 1041 of the spacer ring 10 on the surface 102 of the second 8 200813415 and the second opening 1042. A virtual annular region 1010 is formed between the projection of the second opening 1042 of the spacer ring 10 on the plane on which the first surface 101 is located and the first opening 1041. When the spacer ring 10 is placed in the laser beam path between the laser generating device 30 and the laser detecting device 40, the spacer ring 10 has two placement states: (a) the positive placement state, that is, the spacer ring 10 The first surface 101 faces the laser generating device 30 and the second surface 102 faces the laser detecting device 40 (as shown in Figure 4). (b) The reverse placement state, i.e., the second surface 102 of the spacer ring 10 faces the laser generating device 30, and the first surface 101 faces the laser detecting device 40 (shown in Fig. 5). The predetermined position is such that when the spacer ring 10 is in the positively placed state, the laser beam can pass through the light transmission hole 104 of the spacer ring 10; when the spacer ring 10 is in the reverse placement state, the laser beam cannot pass through the spacer ring 10 Hole 104. Referring to Fig. 4, when the spacer ring 10 is in the upright state, the laser beam generated by the laser generating device 30 is directed toward the annular region 1010, and the laser beam is parallel to the bus bar AAT of the axial section of the light transmission hole 104. After the laser beam is incident on the virtual annular region 1010, it can pass through the light transmission hole 104 to reach the laser detecting device 40. Referring to Fig. 5, when the spacer ring 10 is in the reversed state, the laser beam generated by the laser generating device 30 is directed toward the annular region 1020. After the laser beam is incident on the annular region 1020, it is blocked by the annular region 1020 and cannot pass through the light transmission hole 104, so that the laser detecting device 40 cannot detect the laser light 200813415 f (3) to activate the laser generating device 30 to generate The laser beam is detected by the laser detecting device 40, and the position of the laser beam detecting spacer ring 10 is detected based on whether or not the laser detecting device 40 detects the laser beam detecting device 40. Referring to the predetermined position setting principle of step (2): when the laser detecting device 40 can detect the laser beam, the spacer ring 10 is in the positive state; when the laser detecting device 40 cannot detect the laser beam, then The spacer ring 10 is in an inverted position. It should be noted that, in the step (2) of the method for detecting the positive and negative placement state of the spacer ring, the incident laser beam is not limited to be parallel to the bus line AA' of the plane 10 of the optical transmission hole 104, and the laser beam is The incident direction can also be appropriately adjusted according to the difference of the incident points in the annular region 1010, as long as the "the spacer beam 10 is in the positively placed state, the laser beam can pass through the light-transmitting hole 104 of the spacer ring 10; When the 10 is in the reverse placement state, the laser beam cannot pass through the light transmission hole 104" of the spacer ring 10. The method for detecting the positive and negative placement state of the spacer ring, which uses the laser beam to illuminate the spacer ring 10 to be tested, and allows the laser beam to pass through because the spacer ring 10 to be tested is in a different state of the front and the back. The light-transmitting hole 104 of the spacer ring 10 can further determine the placement state of the spacer ring 10 according to whether the laser detecting device 40 detects the laser beam, which can quickly and accurately detect the positive and negative placement state of the spacer ring. In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. However, the above description is only the preferred embodiment of the present invention, and equivalent modifications or variations made by those skilled in the art of the present invention should be included in the following claims. 200813415 [Simple description of the diagram] Figure 1 is a schematic diagram of the structure of the previous spacer ring. Fig. 2 is a view showing the optical path of the incident light when the spacer ring and the diverging lens of Fig. 1 are assembled in the first state. Fig. 3 is a view showing the optical path of the incident light when the spacer ring shown in Fig. 1 is assembled with the diverging lens in the second state. Fig. 4 is a schematic view showing the laser detecting device of the embodiment of the present invention detecting a laser beam. Fig. 5 is a schematic view showing that the laser detecting device does not detect the laser beam in the embodiment of the present invention. [Main component symbol description] spacer ring 10 first surface 101 second surface 102 annular region 1010, 1020 circumferential side 103 light transmission hole 104 first opening 1041 second opening 1042 diverging lens 20 laser generating device 30 laser detecting device 40 11