TW200718955A - Integrated circuit fault detection system and method - Google Patents

Integrated circuit fault detection system and method

Info

Publication number
TW200718955A
TW200718955A TW095106616A TW95106616A TW200718955A TW 200718955 A TW200718955 A TW 200718955A TW 095106616 A TW095106616 A TW 095106616A TW 95106616 A TW95106616 A TW 95106616A TW 200718955 A TW200718955 A TW 200718955A
Authority
TW
Taiwan
Prior art keywords
fault detection
integrated circuit
detection system
metal feature
circuit fault
Prior art date
Application number
TW095106616A
Other languages
English (en)
Other versions
TWI278646B (en
Inventor
Tai-Chun Huang
Chih-Hsiang Yao
Kuan-Shou Chi
Wen-Kai Wan
Original Assignee
Taiwan Semiconductor Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taiwan Semiconductor Mfg Co Ltd filed Critical Taiwan Semiconductor Mfg Co Ltd
Application granted granted Critical
Publication of TWI278646B publication Critical patent/TWI278646B/zh
Publication of TW200718955A publication Critical patent/TW200718955A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/585—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries comprising conductive layers or plates or strips or rods or rings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW095106616A 2005-11-02 2006-02-27 Integrated circuit fault detection system and method TWI278646B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/264,911 US7791070B2 (en) 2005-11-02 2005-11-02 Semiconductor device fault detection system and method

Publications (2)

Publication Number Publication Date
TWI278646B TWI278646B (en) 2007-04-11
TW200718955A true TW200718955A (en) 2007-05-16

Family

ID=37995064

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095106616A TWI278646B (en) 2005-11-02 2006-02-27 Integrated circuit fault detection system and method

Country Status (2)

Country Link
US (1) US7791070B2 (zh)
TW (1) TWI278646B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107068654A (zh) * 2016-02-10 2017-08-18 英飞凌科技股份有限公司 具有断裂探测的半导体芯片

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7791070B2 (en) * 2005-11-02 2010-09-07 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device fault detection system and method
US9601443B2 (en) * 2007-02-13 2017-03-21 Taiwan Semiconductor Manufacturing Company, Ltd. Test structure for seal ring quality monitor
KR100995558B1 (ko) 2007-03-22 2010-11-22 후지쯔 세미컨덕터 가부시키가이샤 반도체 장치 및 반도체 장치의 제조 방법
US20080258704A1 (en) * 2007-04-23 2008-10-23 Ryskoski Matthew S Method and apparatus for identifying broken pins in a test socket
US7977962B2 (en) * 2008-07-15 2011-07-12 Micron Technology, Inc. Apparatus and methods for through substrate via test
US8373254B2 (en) 2008-07-29 2013-02-12 Taiwan Semiconductor Manufacturing Company, Ltd. Structure for reducing integrated circuit corner peeling
US20120032693A1 (en) * 2010-08-03 2012-02-09 Cisco Technology, Inc. Crack detection in a semiconductor die and package
FR2973935A1 (fr) * 2011-04-11 2012-10-12 St Microelectronics Rousset Procede pour evaluer un processus de decoupe de wafer semi-conducteur
US8288871B1 (en) * 2011-04-27 2012-10-16 Taiwan Semiconductor Manufacturing Company, Ltd. Reduced-stress bump-on-trace (BOT) structures
US8963282B2 (en) 2011-09-14 2015-02-24 Nanya Technology Corp. Crack stop structure and method for forming the same
US9059191B2 (en) 2011-10-19 2015-06-16 International Business Machines Corporation Chamfered corner crackstop for an integrated circuit chip
TW201513242A (zh) * 2013-09-02 2015-04-01 Biotronik Se & Co Kg 晶片及晶片製造方法
US9568543B2 (en) * 2013-10-25 2017-02-14 Taiwan Semiconductor Manufacturing Co., Ltd. Structure and method for testing stacked CMOS structure
US9646897B2 (en) 2013-10-28 2017-05-09 Nxp Usa, Inc. Die crack detector with integrated one-time programmable element
US9287184B2 (en) 2013-12-13 2016-03-15 Micron Technology, Inc. Apparatuses and methods for die seal crack detection
WO2016180756A1 (de) * 2015-05-11 2016-11-17 Robert Bosch Gmbh Kontaktviakette als korrosionsdetektor
KR102611982B1 (ko) 2016-05-25 2023-12-08 삼성전자주식회사 반도체 장치
US10330726B2 (en) * 2017-06-19 2019-06-25 Micron Technology, Inc. Apparatuses including test segment circuits having latch circuits for testing a semiconductor die
EP3425664A1 (en) * 2017-07-07 2019-01-09 Nxp B.V. Integrated circuit with a seal ring
US11088037B2 (en) * 2018-08-29 2021-08-10 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor device having probe pads and seal ring
US10908210B2 (en) * 2018-09-28 2021-02-02 Sandisk Technologies Llc Die crack detection
EP3757585A1 (en) * 2019-06-28 2020-12-30 NXP USA, Inc. An apparatus comprising a defect sensor structure
US11105846B1 (en) * 2020-04-02 2021-08-31 Globalfoundries U.S. Inc. Crack detecting and monitoring system for an integrated circuit

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6365958B1 (en) * 1998-02-06 2002-04-02 Texas Instruments Incorporated Sacrificial structures for arresting insulator cracks in semiconductor devices
JP3538170B2 (ja) * 2001-09-11 2004-06-14 松下電器産業株式会社 半導体装置及びその製造方法
US7193296B2 (en) * 2004-01-26 2007-03-20 Yamaha Corporation Semiconductor substrate
US7256475B2 (en) * 2005-07-29 2007-08-14 United Microelectronics Corp. On-chip test circuit for assessing chip integrity
US7791070B2 (en) * 2005-11-02 2010-09-07 Taiwan Semiconductor Manufacturing Company, Ltd. Semiconductor device fault detection system and method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107068654A (zh) * 2016-02-10 2017-08-18 英飞凌科技股份有限公司 具有断裂探测的半导体芯片
CN107068654B (zh) * 2016-02-10 2020-03-10 英飞凌科技股份有限公司 具有断裂探测的半导体芯片

Also Published As

Publication number Publication date
US20070096092A1 (en) 2007-05-03
TWI278646B (en) 2007-04-11
US7791070B2 (en) 2010-09-07

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees