TW200641956A - Two dimensional stationary beam profile and angular mapping - Google Patents
Two dimensional stationary beam profile and angular mappingInfo
- Publication number
- TW200641956A TW200641956A TW094116753A TW94116753A TW200641956A TW 200641956 A TW200641956 A TW 200641956A TW 094116753 A TW094116753 A TW 094116753A TW 94116753 A TW94116753 A TW 94116753A TW 200641956 A TW200641956 A TW 200641956A
- Authority
- TW
- Taiwan
- Prior art keywords
- rods
- crossover
- horizontal
- measurement points
- measurements
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3171—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation for ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
- H01J2237/24514—Beam diagnostics including control of the parameter or property diagnosed
- H01J2237/24528—Direction of beam or parts thereof in view of the optical axis, e.g. beam angle, angular distribution, beam divergence, beam convergence or beam landing angle on sample or workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/304—Controlling tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/317—Processing objects on a microscale
- H01J2237/31701—Ion implantation
- H01J2237/31703—Dosimetry
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/850,298 US6872953B1 (en) | 2004-05-20 | 2004-05-20 | Two dimensional stationary beam profile and angular mapping |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200641956A true TW200641956A (en) | 2006-12-01 |
Family
ID=34314286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094116753A TW200641956A (en) | 2004-05-20 | 2005-05-23 | Two dimensional stationary beam profile and angular mapping |
Country Status (5)
Country | Link |
---|---|
US (1) | US6872953B1 (zh) |
EP (1) | EP1883946A1 (zh) |
JP (1) | JP2008546141A (zh) |
TW (1) | TW200641956A (zh) |
WO (1) | WO2006126997A1 (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6989545B1 (en) * | 2004-07-07 | 2006-01-24 | Axcelis Technologies, Inc. | Device and method for measurement of beam angle and divergence |
US7394073B2 (en) * | 2005-04-05 | 2008-07-01 | Varian Semiconductor Equipment Associates, Inc. | Methods and apparatus for ion beam angle measurement in two dimensions |
US7435977B2 (en) * | 2005-12-12 | 2008-10-14 | Axcelis Technologies, Inc. | Ion beam angle measurement systems and methods for ion implantation systems |
US7476876B2 (en) * | 2005-12-21 | 2009-01-13 | Axcelis Technologies, Inc. | Ion beam angle measurement systems and methods employing varied angle slot arrays for ion implantation systems |
US20080073553A1 (en) * | 2006-02-13 | 2008-03-27 | Ibis Technology Corporation | Ion beam profiler |
US7663125B2 (en) * | 2006-06-09 | 2010-02-16 | Varian Semiconductor Equipment Associates, Inc. | Ion beam current uniformity monitor, ion implanter and related method |
US7683348B2 (en) * | 2006-10-11 | 2010-03-23 | Axcelis Technologies, Inc. | Sensor for ion implanter |
NL2001369C2 (nl) * | 2007-03-29 | 2010-06-14 | Ims Nanofabrication Ag | Werkwijze voor maskerloze deeltjesbundelbelichting. |
US7897944B2 (en) * | 2008-07-21 | 2011-03-01 | Axcelis Technologies, Inc. | Method and apparatus for measurement of beam angle in ion implantation |
GB201401892D0 (en) * | 2014-02-04 | 2014-03-19 | Welding Inst | System and method for measuring properties of a charges particle beam |
JP6579985B2 (ja) * | 2016-03-18 | 2019-09-25 | 住友重機械イオンテクノロジー株式会社 | イオン注入装置および測定装置 |
JP6985951B2 (ja) * | 2018-02-08 | 2021-12-22 | 住友重機械イオンテクノロジー株式会社 | イオン注入装置および測定装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3911280A (en) * | 1974-04-11 | 1975-10-07 | Us Energy | Method of measuring a profile of the density of charged particles in a particle beam |
US3989946A (en) * | 1975-03-31 | 1976-11-02 | Texas Instruments Incorporated | Arrays for infrared image detection |
JPS5691366A (en) * | 1979-12-26 | 1981-07-24 | Fujitsu Ltd | Ion injector |
US4829243A (en) * | 1988-02-19 | 1989-05-09 | Microelectronics And Computer Technology Corporation | Electron beam testing of electronic components |
US4992742A (en) * | 1988-12-22 | 1991-02-12 | Mitsubishi Denki Kabushiki Kaisha | Charged-particle distribution measuring apparatus |
US5198676A (en) | 1991-09-27 | 1993-03-30 | Eaton Corporation | Ion beam profiling method and apparatus |
US5218210A (en) | 1992-02-18 | 1993-06-08 | Eaton Corporation | Broad beam flux density control |
US6677598B1 (en) | 2003-04-29 | 2004-01-13 | Axcelis Technologies, Inc. | Beam uniformity and angular distribution measurement system |
-
2004
- 2004-05-20 US US10/850,298 patent/US6872953B1/en not_active Expired - Lifetime
-
2005
- 2005-05-23 EP EP05773778A patent/EP1883946A1/en not_active Withdrawn
- 2005-05-23 WO PCT/US2005/018083 patent/WO2006126997A1/en active Application Filing
- 2005-05-23 TW TW094116753A patent/TW200641956A/zh unknown
- 2005-05-23 JP JP2008513437A patent/JP2008546141A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
JP2008546141A (ja) | 2008-12-18 |
EP1883946A1 (en) | 2008-02-06 |
US6872953B1 (en) | 2005-03-29 |
WO2006126997A1 (en) | 2006-11-30 |
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