TW200540404A - Miniature arbor revolving precision measurement device - Google Patents

Miniature arbor revolving precision measurement device Download PDF

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TW200540404A
TW200540404A TW093116743A TW93116743A TW200540404A TW 200540404 A TW200540404 A TW 200540404A TW 093116743 A TW093116743 A TW 093116743A TW 93116743 A TW93116743 A TW 93116743A TW 200540404 A TW200540404 A TW 200540404A
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Taiwan
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laser light
displacement
error
light source
measurement device
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TW093116743A
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Chinese (zh)
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TWI235233B (en
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Wen-Yuh Jywe
Chien-Hung Liu
Hao-Wei Li
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Nat Huwei Inst Technology
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Publication of TW200540404A publication Critical patent/TW200540404A/en

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Abstract

A miniature arbor revolving precision measurement device, adopting the conventional principle and framework of laser reflection. A testing standard probe is placed to an arbor of a machine bed of a miniature machine, such as a miniature lathe, a miniature drill, or a miniature carving machine. Spin errors in the arbor of the miniature machine bed would result in changes in reflected beam, so as to affect the location of a laser displacement detector towards which the reflected beam projects. The error value can then be obtained through mathematical computation.

Description

200540404 玖、發明說明: 【發明所屬之技術領域】 本發明係關於—種微型主袖迴轉精度量測裝置,特別是 指一種利用一般雷射光源反射的原理及架構來組成,再^ 數學運算後而得到其誤差值的微型主轴迴轉精度量測裝置。 【先前技術】 按近年來^工具機、各種產業機械、量測儀器的高精 度化’加上超精密加工機、半導體製程農置、電子資訊機器、^ 原子力顯微鏡等的需要高精密定位技術儀器的發展,不論是 在精密機械、半導體吝IX γ A, 一 千v體產業、μ (奈)米科技皆朝微小化、精 ,化與奈米級的方向前進,而且在機械加工方面,旋轉轴6 是:項非常重要的機械元件’性能的好壞會影響工具機整體 丨生靶目此,在精密機械領域之量測設備、製造技術、整合 技術的發展’旋轉軸6檢測技術之相關研究是刻不容緩的。 然而,目前-般旋轉軸6所產生的旋轉誤差源可分成六_ 個如圖、所不,而旋轉轴6誤差則定義為三個位置誤差占 )<5y(0)、(5z((9)’ 一個角度偏擺誤差^及―個角 度定位誤差ε z ( θ );而旋轉平台則將角度偏擺誤差細分成 曰Χ( ^ )、6 Υ( θ )。為了量測這六個誤差源’最早的旋轉軸 量測裝置,乃使用五個探頭7以分析旋轉軸6誤差,如圖七 所示。而隨著技術的發展’現有旋轉軸6的量測技術有以下 10 200540404 四種分類,如下所述: 一、 直接使用標準球/軸/棒,但不補償標準轴& 〈疾差: 此方法是最早的旋轉軸6量測技術,但會受限於伊、準才夫 /球的加工精度,因此不適用於高精度量測。在2 Q Q 〇 I 12 月Er i c的論文,其提供之技術可測得1 的解析声,然而 在E. G1 eason文章,他提出以目前加工技術極限,標準球之 球度(out of roundness)為 75 nm。以空氣主軸(Air Spindle) 之極限精度可達到50 _,故此第一類方法,以目前二二 而言尚無法達成。 二、 直接使用標準球/軸/棒,但補償標準軸之誤差,補 償方式為單探頭多次設定(multi-steps): 採用單(多)探頭多次設定是誤差分離的第_種方法。上 述旋轉軸6之誤差必須再加 析精度。有關此刀解才…丨所需之解 為輔… 學理論為主,部分以模擬 樣本/刀析是建立之模式。因此 基本原理說明俜為旦士 未“貝際之用途’ 資料,量-人$取一次 、鈴 式係依不同指定角度位置固定探頭7,因此,200540404 发明 Description of the invention: [Technical field to which the invention belongs] The present invention relates to a miniature main sleeve rotation accuracy measurement device, and particularly refers to a principle and structure composed of general laser light source reflection. And a miniature spindle rotation accuracy measuring device that obtains its error value. [Previous technology] In recent years, high precision positioning tools such as machine tools, various industrial machinery, and measuring instruments, plus ultra-precision processing machines, semiconductor process farms, electronic information equipment, and atomic force microscopes have been required. Whether it is in precision machinery, semiconductor 吝 IX γ A, the 1000-V industry, μ (nano) technology is moving towards miniaturization, refinement, nanotechnology and nano-level, and in mechanical processing, rotation Axis 6 is: the very important mechanical component 'The performance of the machine will affect the overall performance of the machine tool. Therefore, the development of measuring equipment, manufacturing technology and integration technology in the field of precision machinery is related to the detection technology of the rotation axis 6. Research is urgent. However, at present, the rotation error sources generated by the general rotation axis 6 can be divided into six_, as shown in the figure, but the rotation axis 6 error is defined as three position error accounts) < 5y (0), (5z (( 9) 'An angular yaw error ^ and an angular positioning error ε z (θ); and the rotating platform will subdivide the angular yaw error into X (^), 6 Υ (θ). In order to measure these six Error source 'The earliest rotating shaft measuring device used five probes 7 to analyze the error of rotating shaft 6, as shown in Figure 7. With the development of technology,' existing measuring technology of rotating shaft 6 has the following 10 200540404 IV This kind of classification is as follows: 1. Use standard ball / axis / rod directly, but do not compensate the standard axis & 〈Disease: This method is the earliest rotating axis 6 measurement technology, but it will be limited by Iran and Zhuncai. The processing accuracy of the ball / ball is not suitable for high-precision measurement. In the 2 QQ 〇I December Er ic thesis, the technology provided can measure the analytical sound of 1, but in the E. G1 eason article, he proposed Based on the current processing technology limit, the sphericity of the standard sphere is 75 nm. With the Air Spi The limit accuracy of ndle) can reach 50 _, so the first method cannot be achieved with the current two or two. Second, the standard ball / axis / rod is used directly, but the error of the standard axis is compensated, and the compensation method is more than a single probe. Multi-steps: Multi-steps using a single (multi) probe is the first method of error separation. The error of the above-mentioned rotation axis 6 must be added to the analysis accuracy. The required solution is ... It is mainly based on the theory of learning, and partly based on simulation samples / knife analysis. Therefore, the basic principle is explained as the data of Dan Shiwei's "Beijing use". Position the probe 7 so that

取困難之部份,就3 U 現象u 疋有偏心問題’而造成角位置定位不易的 現象。另外,頊士从、 、有待測標準軸及旋轉差 (repeatabUuv) R 4 寻差决差之重複性 處,…R及探頭7之重複性是此方法必須克服之 處’其不意圖如圖八所示。 200540404 三、直接使用標準球/軸/棒,但補償標準轴之誤差補償 方式多探頭單次設定為(multi〜pr〇ba): 其係採用多探頭7一次設定,由於它係採用一次設定, 仍然存有角度設定誤差,而且不易消除,所以,多次設定之 困難及誤差重複性問題不需考慮了。然而,此方法仍存在另 -大問題,諧波—s)數目不足,無法獲得高階, 故此方法只能做校準使用’不能做校正使用。也就是說,可 以用單探頭多次設定方式誤差分離之結果,作快速傅立葉轉 、(FT )屐開,將展開之低階譜波和使用多探頭單次設定 之結果作校準。 在多探頭法當中三點法是最廣為應用的—種方法,三點 法使用三個位移探頭7來同步價測真圓度以及旋轉軸" 差兀素’但是此方法無法量測到高頻的誤差元素,而且其他 '夕“碩7置測方法也具有類似的問題,如圖九所示。 、四、直接使用標準球/軸/棒,但補償標準軸之誤差補償 方式為反轉技術(Reversal technique): 反轉技術係量測技術中誤差分離中最早之發明,它提供Taking the difficult part, the 3 U phenomenon u 疋 has an eccentricity problem ', which makes it difficult to locate the angular position. In addition, the repeatability of the search for the difference from the standard axis to be measured and the rotation difference (repeatabUuv) R 4... The repeatability of R and probe 7 is where this method must be overcome. Eight. 200540404 III. Standard ball / axis / rod is used directly, but the error compensation method for compensating the standard axis is set to (multi ~ pr〇ba): The multi-probe 7 setting is used once, because it is set once. There is still an angle setting error, and it is not easy to eliminate. Therefore, the difficulty of multiple settings and the repeatability of errors need not be considered. However, this method still has another big problem, the number of harmonics-s) is insufficient, and high order cannot be obtained. Therefore, this method can only be used for calibration and cannot be used for calibration. In other words, the results of error separation using multiple settings of a single probe can be used for fast Fourier transform, (FT) opening, and the expanded low-order spectral waves and the results of single setting using multiple probes can be used for calibration. Among the multi-probe methods, the three-point method is the most widely used method. The three-point method uses three displacement probes 7 to synchronize the true roundness and the rotation axis " bad element ', but this method cannot be measured High-frequency error elements, and other 'Xi' Shuo 7 measurement methods also have similar problems, as shown in Figure 9. Fourth, the standard ball / axis / rod is used directly, but the standard axis error compensation method is reversed. Reversal technique: Reverse technique is the earliest invention of error separation in measurement technology. It provides

4b JL 、之貢獻。此方法,理論上也是單探頭多次設定之—種簡 :之方法。此方法最簡I、最直接卻不易達到高準確度,原 因如單探頭多次設定之困難點。其示意圖如圖十及逆轉i 8 〇後之圖十一所示。 200540404 但上述之所有方^ θ t 式’,、置測精度會受到試驗標準棒加工 精度的影響,而且對於微型 量測。 加工機械而言,無法做很精密的 由此可I ±述習用物品仍有諸多缺失,實非一良善之 设计者,而亟待加以改良。 本案發明人鑑於卜羽田 p 、 边白用工具機之迴轉軸檢測系統所衍 生的各員缺點’乃亟思加以改良創新,並經多年苦心孤詣潛 心研究後,終於成功研發完成本件微型主軸迴轉精度量測裝 置。 【發明目的】 本發明之目的即在於提供一種微型主軸迴轉精度量測裝 置係利用又幾何光學反射的原理為理論基礎,將準直擴 束後的雷射光源罩在彼覆一層反射面的微試驗標準棒,並由 微試驗標準棒上的反射面反射雷射光源,於反射光路上做光 路設計,將反射光打入不同位置的二個位移感測器即可得到馨 一個四自由度的量測位移(x、y、0 X、0 y ),再經由計算 後可求出主軸偏擺角及平移誤差值,此種方法可應用在各種 加工械械上,且不會因試驗標準棒的誤差而對量測精度有所 影響。 【發明内容】 可達成上述發明目的之微型主軸迴轉精度量測裝置,勺 13 200540404 括有: 雷射光源,係使用 般的半導體雷射光,或其他雷射 光源皆可;-位移量測裝置’係為一位移感測器,用來感測 雷射先源的位置,且該位移量測裝置所量測到的值為偏擺角 及平移的她,可經由計算分離誤差值;一角度量測裝 置,由-面凸透鏡及一位移感測器所組成,用來感測雷射光 源之位置,當反射光有位移產生時,會改變該位移感測哭上 除 面的《’藉此來量測誤差值’而加上該凸透鏡係為了消 平移誤差; 一光路設定單i係、有具有—準直擴偏正分 光鏡⑽)、—丨⑷波片及-分純所組成,而該準直擴 束系統具有-擴束用凸透鏡,用來產生準直擴束效果,進而 將雷射光源的直徑’調整為所需要的大小,而該偏正分光鏡 可用於改變雷射光源行進方向,進而將雷射光源分為穿透及 反射光,該1/4又玻片可將雷射光源之振動方向轉9。度,而 該分光鏡係可將反射光分為穿透光及反射光,並使穿透光將 打入位移量測裝置,而使反射光將打入角度量測裝置·, 一試驗標準棒,用來檢測該主軸的位移量,而當主軸有 誤差時,會造成打在該試驗標準棒末端上面之雷射光源的反 射光產生位置變化,即可藉由上述之各量測元件來量測主轴 誤差,且該試驗標準棒内具有一隻可置於工作母機之夾頭上 14 200540404 的微小圓棒,以及在該圓棒末端平面披覆上一層反射薄膜, 反射光即由該反射薄膜來造成,且該反射薄膜面積遠小於雷 射光源擴束後的投影面積; -數學運算系統,係利用角度量測褒置所測得之偏擺角 誤差,以及位移量測裝置所測得之綜合誤差值,經過此數學 運算後可得到各別誤差值,其運算系統如下 δ. _da d d.. h d a :==::==:: 中的4b JL, contribution. This method is theoretically a single probe multiple settings-a simple method. This method is the simplest, the most direct, but it is not easy to achieve high accuracy, because of the difficult point of multiple settings for a single probe. The schematic diagram is shown in Fig. 10 and Fig. 11 after reversing i 8 0. 200540404 However, in all of the above formulas ^ θ t ', the measurement accuracy will be affected by the processing accuracy of the test standard bar, and for micro-measurement. As far as processing machinery is concerned, it can not be very precise. Therefore, there are still many shortcomings in conventional articles. It is not a good designer and needs to be improved. In view of the shortcomings of the members of the rotary axis detection system of the machine tool used by Bu Yutian p and Bianbai, the inventor of this case was eager to improve and innovate. After years of painstaking and meticulous research, he finally successfully developed the micro-spindle rotation accuracy.测 装置。 Testing device. [Objective of the Invention] The purpose of the present invention is to provide a micro-spindle rotation accuracy measurement device that uses the principle of geometrical optical reflection as the theoretical basis to cover the laser light source after collimated and expanded beams on the other side of a reflective surface. Test the standard rod, and reflect the laser light source from the reflective surface on the micro-test standard rod, and design the optical path on the reflected light path, and enter the reflected light into two displacement sensors at different positions to get a four-degree-of-freedom Measure the displacement (x, y, 0 X, 0 y), and then calculate the spindle yaw angle and translation error value after calculation. This method can be applied to a variety of processing machinery and will not be affected by the test standard bar. The error will affect the measurement accuracy. [Summary] A micro-spindle rotation accuracy measurement device that can achieve the above-mentioned object of the invention, spoon 13 200540404 includes: laser light source, which is a semiconductor laser light, or other laser light sources;-displacement measurement device ' It is a displacement sensor used to sense the position of the laser source, and the values measured by the displacement measuring device are the deviation angle and the translation, which can be separated by calculating the error value; an angle quantity The measuring device is composed of a convex lens and a displacement sensor, and is used to sense the position of the laser light source. When the reflected light is displaced, the displacement sensing will be changed. The measurement error value is added to the convex lens in order to eliminate the translation error; a single optical path setting single i system, which has -collimation, expansion, and polarization beam splitter ⑽),-丨 ⑷ wave plate, and -pure purity, and the The collimating beam expanding system has a convex lens for beam expanding, which is used to produce a collimating beam expanding effect, and then the diameter of the laser light source is adjusted to the required size, and the polarization beam splitter can be used to change the direction of the laser light source. Laser light Penetrating and reflected light into the quarter-turn slide may turn the vibration direction of the laser light source 9. The beam splitter can divide the reflected light into transmitted light and reflected light, and the transmitted light will enter the displacement measuring device, and the reflected light will enter the angle measuring device. A test standard rod , Used to detect the amount of displacement of the main shaft, and when the main shaft has an error, it will cause the position of the reflected light of the laser light source on the end of the test standard rod to change, which can be measured by the above-mentioned measuring elements The spindle error is measured, and the test standard rod has a small round rod that can be placed on the collet of the working machine 14 200540404, and a reflective film is coated on the flat surface of the end of the circular rod, and the reflected light comes from the reflective film. Caused, and the area of the reflective film is much smaller than the projected area of the laser light source after the beam is expanded;-a mathematical operation system, which uses an angle measurement to measure the deviation of the yaw angle and a comprehensive measurement of the displacement measurement device The error value can be obtained after this mathematical operation. The operation system is as follows: δ. _Da d d .. hda: == :: == ::

cL 會因為座標定義上的 實施方式】 關係,而有正負號的變化 請參閱圖一至圖五所示,為一 裝置,係為-利用光反射原理為並;=轴=精度量測 四自由度的微型主軸迴轉精度量測裝置,:-::里測裝置之 -雷射光源i,係使用一般的半導體雷 射光源皆可。 、或,、他雷 -位移量測m,料_位移感_ 雷射光源1的位置,且該位移 用來感測 擺角及平移的人“ m 置2所1測到的值為偏 °成值,可經由計算分離誤差值。 -角度量測裝置3’由—面凸 0 1及—位移感測器 15 200540404 3 2所組成,用來感測雷射光源χ之位置,當反射光有位移 產生時,會改變該位移感測器3 2上面的訊號,藉此來量測 誤差值,而加上該凸透鏡3 1係為了消除平移誤差; 一光路設定單元4,係有具有一準直擴束系統4丄、一 偏正分光鏡4 2、- λ波片4 3及-分光鏡4 4所組成,而 該準直擴束系統4 1具有一擴束用凸透鏡4 1丄,用來產生 準直擴束效果,進而將雷射光源i的直徑,調整為所需要的 大小(大約為反射薄膜面積的2 i 4倍左右),而該偏正分籲 光鏡4 2可用於改變雷射光源!行進方向,進而將雷射光源 1分為穿透及反射光’該1/4λ玻片4 3可將雷射光源丄之 方向轉90度’而該分光鏡4 2係可將反射光分為穿透及反 射光’並使穿透光將打入位移量測裂置2,而使反射光將打 入角度量測裝置3。 旦一試驗標準棒5,用來檢測該主袖(圖十未示)的位cL will be changed according to the implementation of the coordinate definition], please refer to Figure 1 to Figure 5 for a device, which is-using the principle of light reflection to merge; = axis = precision measurement of four degrees of freedom The micro-spindle rotation accuracy measuring device:-:: of the inside measuring device-the laser light source i can use a general semiconductor laser light source. , Or ,, the thunder-displacement measurement m, material _ displacement sense _ position of the laser light source 1, and the displacement is used to sense the swing angle and translation of the person "m set 2 The measured value of 1 is bias ° The value can be calculated by calculating the separation error value. -The angle measuring device 3 'consists of -convex 0 1 and -displacement sensor 15 200540404 3 2 to sense the position of the laser light source χ, when the reflected light When a displacement occurs, the signal on the displacement sensor 32 will be changed to measure the error value, and the convex lens 31 is added to eliminate the translation error; an optical path setting unit 4 is provided with a standard A beam expanding system 4 丄, a polarizing beam splitter 4 2,-a λ wave plate 4 3, and-a beam splitter 4 4 are provided. The collimating beam expanding system 4 1 has a convex lens 4 1 丄 for beam expansion. To produce a collimated beam expansion effect, and then adjust the diameter of the laser light source i to the required size (about 2 i to 4 times the area of the reflective film), and the polarizing mirror 4 2 can be used to change Laser light source! The direction of travel, and further divide the laser light source 1 into penetrating and reflecting light. The 1 / 4λ slide 4 3 can separate the laser light source 丄The direction is turned 90 degrees 'and the beam splitter 4 2 can divide the reflected light into penetrating and reflecting light' and make the penetrating light break into the displacement measurement 2 and make the reflected light enter the angle measuring device. 3. Once a standard rod 5 is tested, it is used to detect the position of the main sleeve (not shown in Figure 10).

田主軸有块差時’會造成打在該試驗標準棒5末端 面之雷射光源!的反射光產生位置變化,即可藉由上述之 量測元件來量測主轴誤差,且該試驗標準棒5内呈有一隹 置於工作母機之夫頭上的微小圓棒51,以及在該圓棒5 末端平面披覆上—層反膽(圖中未示),反射光即由1 反射薄膜來造成’且該反射薄膜面積遠小於雷射光源工擴; 後的投影面積; 〃 16 200540404 量測裝置所測得之偏擺角 ’經過此數 一數學運算系統,係利用角度 块差’以及位移量測裝置2所測得之综合誤差值 學運算後可得到各別誤差值,其運算系統如下 ㊀。θα δ', da d, d、If there is a difference in the main axis of Tian, it will cause a laser light source hitting the end surface of the test standard rod 5! The reflected light produces a change in position, that is, the spindle error can be measured by the above-mentioned measuring element, and the test standard rod 5 presents a small round rod 51 placed on the husband's head of the working mother machine, and the round rod 5 The end plane is covered with a layer of anti-bladder (not shown in the figure), the reflected light is caused by 1 reflective film ', and the area of the reflective film is much smaller than the projected area of the laser light source; 〃 16 200540404 Measurement The yaw angle measured by the device 'after this mathematical operation system uses the angular block difference' and the comprehensive error value measured by the displacement measurement device 2 can be obtained by calculating the individual error values. The calculation system is as follows Alas. θα δ ', da d, d,

d a (Ld a (L

da cL 此運算系統包含使用傅立葉轉換及傅立葉級數理論級 數的方式來消除組袈設定誤差(Setup Er·),且上述之公 式中的 會因為座標定義上的關係,而有正負號的變化。 該微型主軸迴轉精度量測裝置之基本原理為,請參閱圖 二使用—般的雷射光源卜而當雷射光源u來時使用該準 直擴束系統41將雷射光源1擴束,且擴束後的雷射光源] 直徑應比試驗標準棒5上所彼覆的反㈣膜面積約大2至4 倍’接著通過偏正分光鏡42時會因為雷射光源]振動方向 不冋的關係,而產生穿透及反射這二道光,且此二道光之振 動方向相差90度。 \ 而當反射光出來時會經過一片1/4λ玻片43,於本實 施例中該1/4λ玻片4 3的功用為 、 災田射先源1振動方向轉 9°度,第一次通過時雷射光源1振動方向尚未轉90度,再 1丁入置於絲夹頭上之披覆有小面積反射面功能的試驗標 丰棒5 ’右主軸為理想無誤差時,反射光會在同一點,但若 200540404 主軸有誤差時會造成反射光產生位移變化,如圖三所示。 而經由位置反射後的光,再通過一次1 /4 λ玻片4 3後, 雷射光源1振動方向已轉90度,再穿過偏正分光鏡4 2,da cL This operation system includes the use of Fourier transform and Fourier series theoretical series to eliminate the setting error (Setup Er ·), and the above formula will have a sign change due to the relationship of the coordinate definition. . The basic principle of the micro-spindle rotation accuracy measurement device is as shown in Fig. 2. The general-purpose laser light source is used. When the laser light source u comes, the collimated beam expansion system 41 is used to expand the laser light source 1, and Laser light source after beam expansion] The diameter should be about 2 to 4 times larger than the area of the reflective film covered on the test standard rod 5 '. Then the laser light source will pass through the polarizing beam splitter 42. Relationship, and the two lights of transmission and reflection are generated, and the vibration directions of the two lights are different by 90 degrees. \ And when the reflected light comes out, it will pass through a 1 / 4λ slide 43. In this embodiment, the function of the 1 / 4λ slide 4 3 is to turn the vibration direction of the disaster source 1 to 9 ° for the first time. When passing, the laser light source 1 has not rotated 90 degrees in the vibration direction, and it is placed on the wire chuck and covered with a small-area reflective surface. The test standard Fengfeng rod 5 'When the right spindle is ideal and error-free, the reflected light will The same point, but if the main axis of 200540404 is wrong, the reflected light will be displaced, as shown in Figure 3. After the light reflected by the position passes through the 1/4 λ slide 4 3 again, the vibration direction of the laser light source 1 has been rotated 90 degrees, and then passes through the polarization beam splitter 42,

此時’雷射光源1會直接通過該偏正分光鏡4 2,並不會產 生反射光,因為,通過二次i /4 λ玻片4 3的關係會使雷射 光源1的振動方向轉90度,接下來反射光會通過該正分光 鏡4 2於本實施例中該正分光鏡4 2為一般普通的分光 鏡,此時,會產生穿透及反射二道光,反射光的路徑為乂方 向並於路徑中加上一面凸透鏡3 1後才打入該位移感測器 3 2,且在這邊加上一凸透鏡3丄的原因是為了使量測值單 純只剩下偏擺匕角所造成的位矛多,由此位矛多可推算出主轴之偏 杬角0 X 0 y,所以,在該位移感測器3 2上所量測到的值 即為偏擺角所造成的誤差值,其誤差值的數學關係式為At this time, the 'laser light source 1 will directly pass through the polarizing beam splitter 4 2 and will not generate reflected light, because the vibration direction of the laser light source 1 will be turned by the relationship of the secondary i / 4 λ glass 4 3 90 degrees, the reflected light will then pass through the positive beam splitter 42. In this embodiment, the positive beam splitter 42 is a general ordinary beam splitter. At this time, two lights are transmitted and reflected. The path of the reflected light is In the direction of 打, a convex lens 3 1 is added to the path, and then the displacement sensor 3 2 is driven. The reason for adding a convex lens 3 为了 here is to make the measured value only have a deflection angle. There are too many spears, and the deviation angle of the main axis can be calculated from 0 X 0 y. Therefore, the value measured on the displacement sensor 32 is caused by the yaw angle. Error value, the mathematical relationship of the error value is

、 、、 ,式中的da為位移感測器上所得到的誤差值,f為焦 、, ㊀ 當小’可改寫4 / ),可參考圖四來說明。 而牙透光的路技為原來的反射光路徑匕穿透光會直接 打入該位移量測裝置2的位移感測器2 1中 所量測到的值為偏擺角及平移誤差的合成誤差值,並非實際 的平私灰差值在該角度量測裝置3之位移感測器3 2上 18 200540404 可求出偏擺角的誤差值,再經由計算後即可得到平移誤差 值’其關係式為5今以,),㈣ds為該位移量測裝置 2 =位私感測器2丄,所量測到的誤差值,卜為裝置於主轴 的4驗標準棒5反射面到位移感測器2 1上表面式間的距 離’ “為偏擺角’ “P為平移誤差值。若將上 理即可得到相關之關係式為 cL /,,,, Where da is the error value obtained on the displacement sensor, f is the focus, and ㊀ can be rewritten 4 /) when it is small, and can be explained with reference to Figure 4. The transmission technology of the tooth is the original reflected light path. The penetrating light will directly enter the displacement sensor 21 of the displacement measurement device 2. The measured value is the combination of the deflection angle and translation error. The error value is not the actual ordinary gray difference value on the displacement sensor 3 2 of the angle measurement device 3 18 200540404 The error value of the yaw angle can be obtained, and the translation error value can be obtained after calculation. The relationship is 5 to 1), ㈣ds is the displacement measuring device 2 = position sensor 2 丄, the measured error value is the reflection surface of the 4 standard rod installed on the main shaft to the displacement sensor 2 The distance between the top surface of the measuring instrument 2 "" is the yaw angle "and" P "is the translation error value. If the above is obtained, the relevant relationship is cL /

(L “ds—h.TaDkd,h, 右將其擴充為二維的關係式,即為 % θα X δ d a d(L "ds—h.TaDkd, h, right to expand it into a two-dimensional relationship, which is% θα X δ d a d

X. cL h d ax d 〇y d 2 正負號的變2⑺中的"會因為座標定義上的關係,而有 女4 % s式驗標準棒5反射面不可能完全平行於 位私感測器3 2的上平 有偏+面,換言之,試驗標準棒5本身即具 中而造成誤差量以類似雜訊的方式參雜在訊號之 差)所幸其安裳的偏擺角誤差為定K在此稱為設定誤 立轉^㈣立葉級數理論(W⑻的觀念或是使用傅 及:換⑽…除設定誤差,在消除韻偏心量) 偏擺角在向度内所造成的旋轉半徑)後剩下來的值 19 200540404 即為主軸本身的誤差值。 而該微型主軸迴轉精度量測裝置使用時,如圖二及圖 所示,該雷射光源】發射後先通過一準直擴束系統4】及二 凸透鏡4!!所組成的準直擴束系統將雷射光源」做準直 擴束後,再通過偏正分光鏡4 2產光反射光,然後再經過㈧ A玻片43再打人置於絲上㈣驗標準棒^生反射 先’而反射後的光再通過一次1/4λ玻片4 3後,再穿過偏 正为先鏡4 2,而且,在這邊會因為雷射光源工經過二次㈧ 又玻片4 3故不會有分光效果出 兄接下來再經過分光鏡4 4 ’分光後的兩道光,其中一 ^反射先經過一凸透鏡3 1打 入位移感測器32’所得到的數 十昇θχ、ΘΥ偏擺 角的铁差值;另—道穿透以 的方向直接打入位移感 “。 ’從這個位移感測器所得到的數據為5χ…、0 χ、β y的合成誤差,經由 心* 式(1 )及公式(2 )的計算即 叮未出所有誤差值。若 ^ ^ ^决差產生時,會造成反射光的 所變化,進而改變雷射 ^ 9 ΛΑ 射九/原、1打入位移感測器2 1或 2的位置’本架構即以此原理來做量測。 【特點及功效】 本發明所提供之微型主軸 證$ π # ^ f、轉才月度置測裝置,與前述引 -案及其他習用技術相 誃 更具有下列之優點: / -生主軸迴轉精度量 及置係利用一般幾何光學反 20 200540404 射的原理為理論基礎’將準直擴束後的雷射㈣罩在披覆— 層反射面的微試驗標準棒’並由微試驗標準棒反射雷射光 源,於反射光路上做光路言史計,將反射光打人不同位置的二 個位移感測器即可得到—個四自由度的量測位移(x、y、Z X、θγ),再經由計算後可求出主轴偏擺角及平移誤差值, 且此種方法可應用在各種加卫機械上,且不會因試驗標準棒 的誤差而對量測精度有所影響。 上列詳細說明係針對本發明之一可行實施例之具體說鲁 明,惟該實施例並非心限制本發明之專利範圍,凡未脫離 本發明技藝精神所為之等效實施或變更,均應包含於本案之 專利範圍中。X. cL hd ax d 〇yd 2 The sign of "2" in the sign of "2" will be because of the definition of the coordinates, and there will be a female 4% s-type standard bar 5 The reflecting surface cannot be completely parallel to the position sensor 3 The upper level of 2 has a deflection + surface, in other words, the test standard rod 5 itself is included, which causes the amount of error to be mixed in the signal difference in a similar manner. Fortunately, the deviation angle error of the Anshang is fixed here. It is called setting the wrong turn ^ ㈣ 叶 series theory (the concept of W 或是 or use Fu and: change ⑽… except the setting error, eliminate the amount of rhyme eccentricity) The remaining radius after the yaw angle in the direction) The value 19 200540404 is the error value of the spindle itself. When the micro-spindle rotation accuracy measuring device is used, as shown in FIG. 2 and FIG., The laser light source] passes through a collimated beam expansion system 4] and two convex lenses 4 !! After the laser light source is collimated and expanded by the system, the reflected light is produced by the polarizing beam splitter 42, and then passed through the A glass slide 43 and placed on the wire to check the standard rod. After the reflected light passes through the 1 / 4λ glass 4 3 again, it passes through the first mirror 4 2, and it will not pass here because the laser light source passes through the glass 4 3 again. There will be a beam splitting effect. The next two beams will pass through the beam splitter 4 4 'after splitting. One of the reflections will pass through a convex lens 3 1 and enter the displacement sensor 32'. The iron difference of the angle; the other way is to directly enter the displacement sensation in the direction of the channel penetration. "The data obtained from this displacement sensor is a composite error of 5x ..., 0x, βy. The calculation of 1) and formula (2) means that all the error values are not given out. If ^ ^ ^ is generated, the reflected light will be changed. , And then change the laser ^ 9 ΛΑ shot nine / original, 1 into the position of the displacement sensor 2 1 or 2 'This architecture is used to measure based on this principle. [Features and effects] The miniature spindle provided by the present invention Certificate $ π # ^ f. The monthly transfer measurement device has the following advantages compared with the aforementioned quotation and other conventional technologies: /-The rotation accuracy of the primary spindle and the positioning system are measured using general geometric optics. 20 200540404 The principle is the theoretical basis. 'The collimated and expanded laser beam is covered with a micro-test standard rod of the reflecting surface.' The micro-test standard rod reflects the laser light source, and the optical path history meter is used on the reflected light path. A reflected light hits two displacement sensors at different positions to get a four-degrees-of-freedom measurement displacement (x, y, ZX, θγ), and then calculate the main axis yaw angle and translation error after calculation. Value, and this method can be applied to a variety of guarding machinery, and will not affect the measurement accuracy due to the error of the test standard rod. The detailed descriptions above are specific to one of the feasible embodiments of the present invention. However, this embodiment is not a limitation The patentable scope Ming, who have not departing from the spirit of the present invention skill whom equivalent embodiments or variations could be made in the scope of the patent in the present case.

絲上所述’本案不但在空間型態上確屬創新’並能較習 用物。σ增進上述多項功效,應已充分符合新穎性及進步性之 法足發明專利要件,爰依法提出巾請,懇冑貴局核准本件 發明專利申請案’以勵發明,至感德便。 【圖式簡單說明】 細說明及其附 的功效;有關 請參閱以下^本發明—車交佳實施例之詳 圖:將可進―步瞭解本發日月之技術内容及其目 該實施例之附圖為: 圖 圖一為本發明微型主軸迴轉精 度量測裝置之立體組裝 21 200540404 圖; 圖二為該微型主軸迴轉精度量硎裝置 之量測原理說明 圖二為該微型主轴迴轉精度量 跡圖; 測裝置之光路分析模型軌 位移與 圖四為該微型主軸迴轉精度量測裝置之反射光之 角度之關係圖; 圖五為該微型主軸迴轉精度量測裝置之量測流程圖; 圖六為習用旋轉軸迴轉精度量測裝置之旋轉平台的六個 自由度誤差示意圖; 八 量 、圖七為習用旋轉軸迴轉精度量測裳置之傳統的旋轉軸 測裝置示意圖; 置之多探頭多次設定 圖八為習用旋轉軸迴轉精度量測裝 旋轉轴量測示意圖; 圖九為習用旋轉軸迴轉精度量測裝置客 旦 衣直之夕权頭髮旋轉軸 I測方法示意圖; 圖十為習用旋轉軸迴轉精度量測敦置之使用示意圖;及 圖十—為習用旋轉軸迴轉精度量測裝置之使用反方向χ 方疋轉輛量測裝置示意圖。 主要部分代表符號】 1 雷射光源 2 位移量測裝置 22 200540404 2 1 位移感測器 3 角度量測裝置 3 1 凸透鏡 3 2 位移感測器 4 光路設定单元 4 1 準直擴束系統 11 凸透鏡 4 2 偏正分光鏡 4 3 λ玻片 4 4 分光鏡 5 試驗標準棒 5 1 圓棒 6 主軸 7 探頭 da 位移感測器上所得到的誤差值The 'this case is indeed not only innovative in terms of space type', but also can be compared with conventional ones. σ to enhance the above-mentioned multiple effects, should be in full compliance with the novelty and progress of the French foot invention patent requirements, according to the law to submit a request, and earnestly approve this invention patent application 'to encourage the invention, to the morale. [Brief description of the drawings] Detailed description and its attached effects; for details, please refer to the following ^ Detailed description of the present invention-Che Jiao Jia: a detailed understanding of the technical content of the sun and the moon and its embodiment The drawings are as follows: Figure 1 is a three-dimensional assembly of the micro-spindle rotation accuracy measuring device 21 200540404; Figure 2 is a description of the measurement principle of the micro-spindle rotation accuracy measurement device Figure 2 is the micro-spindle rotation accuracy measurement Trace diagram; The optical path analysis model of the measuring device, the track displacement and the angle of the reflected light of the micro-spindle rotation accuracy measurement device; Figure 5 is the measurement flowchart of the micro-spindle rotation accuracy measurement device; 6 is a schematic diagram of the six degrees of freedom error of the rotating platform of the conventional rotary axis rotation accuracy measurement device; eight and figure 7 are schematic diagrams of the traditional rotary axis measurement device for the conventional rotary axis rotation accuracy measurement device; Figure 8 is a schematic diagram of the measurement of the rotational accuracy of a conventional rotary shaft. Figure 9 is a schematic view of the measurement of a rotational accuracy of a conventional rotary shaft. Schematic diagram of the measurement method of the hair rotation axis I; Figure 10 is a schematic diagram of the use of a conventional rotary shaft rotation accuracy measurement installation; and Figure 10 is a schematic diagram of a conventional rotary axis rotation accuracy measurement device in the opposite direction. . Symbols of main parts] 1 Laser light source 2 Displacement measuring device 22 200540404 2 1 Displacement sensor 3 Angle measuring device 3 1 Convex lens 3 2 Displacement sensor 4 Optical path setting unit 4 1 Collimation beam expanding system 11 Convex lens 4 2 Polarizing beam splitter 4 3 λ slide 4 4 Beamsplitter 5 Test standard rod 5 1 Round rod 6 Spindle 7 Probe da Error value obtained on the displacement sensor

f焦距 0 a偏擺角 0 X 主軸X方向之偏擺角 (9 y 主軸Y方向之偏擺角 面的距離 h主軸的試驗標準棒反射面到位移感測器表 δ 平移誤差值 23f focal length 0 a deflection angle 0 X deflection angle of the X axis of the main axis (9 y deflection angle of the Y direction of the main axis distance of the h axis test standard reflection surface to the displacement sensor table δ translation error value 23

Claims (1)

200540404 拾、申請專利範圍: 1 · 一種微型主軸迴輕曰、理……“ H爾裝置,係為一利用光反射原 ’並整合二個 維量測裝置 轉精度量測裝置,其包括·· 之四自由度的微型主軸迴 雷射光源,係 使用一般的半導體雷射光; 一位移量剛裝f 二 置係用來感測雷射光源的位置,且 该位移量測裝罢a e 移的合成 衣置所置測到的值為偏擺角及平 值,可經由計算以分離誤差值; 一角度量測裝置,由一面 囬凸逍I兄及一位移感測器所 矣且成’用來感測雷射弁% 田考ί九源之位置,當反射光有位移產生 時’會改變該位移磺測考 名j态上面的讯唬,糟此來量測誤差 ^而加上孩凸透鏡係為了消除平移誤差; —光路設定單元,係有具有準直擴束系统、一偏 刀光i兄、一;I波片及一分光鏡所組成,而該准直擴束 系統具有一擴束用凸透鏡,用來產生準直擴束效果,進 而將雷射光源的直徑,調整為所需要的大小,而該偏正 刀光銳可用於改變雷射光源行進方向,進而將雷射光源 刀為穿透及反射光,該1/4λ玻片可將雷射光源之方向 轉90度,而該分光鏡係可將反射光分為穿透及反射 光’並使穿透光將打入位移量測裝置,而使反射光將打 入角度量測裝置;以及 24 200540404 一試驗標準棒,用來檢測該主軸的位移量,而當主 軸有誤差時,會造成打在該試驗標準棒末端上面之雷射 光源的反射光產生位置變化,即可藉由上述之各量測元 件來量測主軸誤差,且該試驗標準棒内具有一隻可置於 工作母機之夾頭上的微小圓棒,以及在該圓棒末端平面 彼覆上一層反射薄膜,反射光即由該反射面來造成,且 該反射薄膜面積遠小於雷射光源擴束後的投影面積。200540404 Scope of patent application: 1 · A miniature main shaft is used to lighten the back and forth ... "Hear device is a device that utilizes light reflectance and integrates two dimensional measuring devices to convert precision measuring devices, which includes ·· The four-degree-of-freedom miniature spindle return laser light source uses ordinary semiconductor laser light; a displacement amount is installed f and the two sets are used to sense the position of the laser light source, and the displacement measurement device is combined with the ae shift The measured values set by the clothing set are the yaw angle and the flat value, which can be separated by calculation to calculate the error value. An angle measuring device is formed by the convex side of a side and a displacement sensor. Sensing the position of the laser source field test, when there is a displacement of the reflected light, it will change the displacement of the displacement measurement test j state, and the measurement error is worse ^ and the child convex lens system is added. In order to eliminate the translation error;-the optical path setting unit is composed of a collimated beam expander system, a polarized knife light beam, an I wave plate and a beam splitter, and the collimated beam expander system has a beam expander Convex lens for collimated expanded beam As a result, the diameter of the laser light source can be adjusted to the required size, and the deflection knife can be used to change the direction of the laser light source, and the laser light source can be used to penetrate and reflect light. The glass slide can turn the direction of the laser light source by 90 degrees, and the beam splitter system can divide the reflected light into penetrating and reflecting light, and make the penetrating light enter the displacement measuring device, so that the reflected light will enter Angle measurement device; and 24 200540404, a test standard rod used to detect the displacement of the main shaft, and when the main shaft has an error, it will cause the position of the reflected light of the laser light source hitting the end of the test standard rod to change, The spindle error can be measured by the above-mentioned measuring elements, and the test standard rod has a small round rod that can be placed on the collet of the work machine, and a layer of reflection is coated on the end surface of the round rod. For a thin film, the reflected light is caused by the reflective surface, and the area of the reflective film is much smaller than the projection area of the laser light source after the beam is expanded. 2_如申請專利範圍第彳項所述之微型主軸迴轉精度量測裝 置係採用數學運异系統,係利用角度量測裝置所測 得之偏擺角誤差,以及位移量測裝置所測得之綜合誤差 值,經過此數學運算後可得到各別誤差值,其運算系統 如下2_ The micro-spindle rotation accuracy measurement device described in item 彳 of the patent application range uses a mathematical operation system, which uses the yaw angle error measured by the angle measurement device and the displacement measurement device. Synthesize the error values. After this mathematical operation, the individual error values can be obtained. The operation system is as follows 3·如中請專利範圍第2項所述之微型主軸迴轉精度量測裝 置,其中該運算系統包含使用傅立葉轉換及傅立葉級數 理論級數的方式來消除組裝設定誤差,且上述之公 Ή “ 的吵會因為座標定義上的關係,而有正負镜的變化。 4.如中請專利範㈣i項所述之微型主軸迴轉精度量測裝 25 200540404 置,其中該雷射光源、位移量測裝4、角度量測裝置及 光路設定單元等,均可模組化組裝,且使用特定的組裝 盒容置。 5. 如由 曱請專利範圍第!項所述之微型主軸迴轉精度量測裝 置’其中該位移感測器’可採用四象限雷射位移感測器。 請專利範圍第!項所述之微型主軸迴轉精度量測裝 ,其中該試驗標準棒,可採用鋼、鐵、 材質。 j站寺其他3. The micro-spindle rotation accuracy measuring device as described in item 2 of the patent scope, wherein the computing system includes a method of using Fourier transform and Fourier series theoretical series to eliminate assembly setting errors, and the above-mentioned public " The noise will change due to the definition of the coordinates. 4. The micro-spindle rotation accuracy measurement device 25 200540404 set as described in the patent claim ㈣i, among which the laser light source and displacement measurement device 4. The angle measuring device and the optical path setting unit can be modularized and assembled in a specific assembly box. 5. If the micro-spindle rotation accuracy measurement device described in 曱 Please patent scope! Among them, the displacement sensor can be a four-quadrant laser displacement sensor. Please refer to the scope of patent for the micro-spindle rotation accuracy measurement device, where the test standard rod can be made of steel, iron, material. J Station temple other 如申請專利範圍第6項所述之微型主 置’ JL中4 4 一平该成驗標準棒的半徑約為加 端坡覆有—s e ^ β 1 ^ 層反射薄膜。 軸迴轉精度As described in item 6 of the scope of the patent application, the micro-host ′ JL 4 4 is flat. The radius of the test standard bar is approximately plus the end slope covered with —s e ^ β 1 ^ reflective film. Shaft rotation accuracy 量測裝 刀具大小, 且末Measure the size of the tool 2626
TW93116743A 2004-06-10 2004-06-10 Miniature arbor revolving precision measurement device TWI235233B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401420B (en) * 2009-05-05 2013-07-11 Univ Nat Formosa A device for measuring the multi - axis error of the pick - and - place mechanism
CN111001829A (en) * 2019-10-25 2020-04-14 郑州旅游职业学院 Lathe rotation error detection monitoring device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI710748B (en) 2019-04-15 2020-11-21 財團法人工業技術研究院 Contour accuracy measuring system and method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI401420B (en) * 2009-05-05 2013-07-11 Univ Nat Formosa A device for measuring the multi - axis error of the pick - and - place mechanism
CN111001829A (en) * 2019-10-25 2020-04-14 郑州旅游职业学院 Lathe rotation error detection monitoring device

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