TW200514991A - Method and apparatus for testing a bridge circuit - Google Patents

Method and apparatus for testing a bridge circuit

Info

Publication number
TW200514991A
TW200514991A TW093125283A TW93125283A TW200514991A TW 200514991 A TW200514991 A TW 200514991A TW 093125283 A TW093125283 A TW 093125283A TW 93125283 A TW93125283 A TW 93125283A TW 200514991 A TW200514991 A TW 200514991A
Authority
TW
Taiwan
Prior art keywords
test clock
conversion unit
testing
bridge circuit
test
Prior art date
Application number
TW093125283A
Other languages
English (en)
Other versions
TWI289677B (en
Inventor
Bi-Yun Yeh
Victor Wu
Jiin Lai
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Publication of TW200514991A publication Critical patent/TW200514991A/zh
Application granted granted Critical
Publication of TWI289677B publication Critical patent/TWI289677B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW093125283A 2003-10-21 2004-08-20 Method and apparatus for testing a bridge circuit TWI289677B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US48153703P 2003-10-21 2003-10-21

Publications (2)

Publication Number Publication Date
TW200514991A true TW200514991A (en) 2005-05-01
TWI289677B TWI289677B (en) 2007-11-11

Family

ID=34519962

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093125283A TWI289677B (en) 2003-10-21 2004-08-20 Method and apparatus for testing a bridge circuit

Country Status (3)

Country Link
US (1) US7231309B2 (zh)
CN (1) CN100381833C (zh)
TW (1) TWI289677B (zh)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI289677B (en) 2003-10-21 2007-11-11 Via Tech Inc Method and apparatus for testing a bridge circuit
US7085874B2 (en) * 2004-04-02 2006-08-01 Arm Limited Synchronous/asynchronous bridge circuit for improved transfer of data between two circuits
US10324231B2 (en) 2013-04-04 2019-06-18 Sky Motion Research, Ulc Method and system for combining localized weather forecasting and itinerary planning
US10495785B2 (en) 2013-04-04 2019-12-03 Sky Motion Research, Ulc Method and system for refining weather forecasts using point observations
US10330827B2 (en) 2013-04-04 2019-06-25 Sky Motion Research, Ulc Method and system for displaying weather information on a timeline
TWI684022B (zh) 2013-06-26 2020-02-01 加拿大商天勢研究無限公司 用於在時間軸上顯示氣象資訊之方法及系統
DE102016107734B4 (de) 2016-04-26 2024-05-02 Infineon Technologies Ag Elektronische Schaltung und Verfahren zur Datenübertragung

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6263389B1 (en) * 1998-01-21 2001-07-17 Micron Technology, Inc. Apparatus for increasing the number of loads supported by a host bus
US6247102B1 (en) * 1998-03-25 2001-06-12 Compaq Computer Corporation Computer system employing memory controller and bridge interface permitting concurrent operation
JP2000122756A (ja) * 1998-10-19 2000-04-28 Fujitsu Ltd 電子機器
TWI289677B (en) 2003-10-21 2007-11-11 Via Tech Inc Method and apparatus for testing a bridge circuit

Also Published As

Publication number Publication date
US7231309B2 (en) 2007-06-12
CN1570660A (zh) 2005-01-26
TWI289677B (en) 2007-11-11
CN100381833C (zh) 2008-04-16
US20050086019A1 (en) 2005-04-21

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