TW200504349A - Automatic optical inspection system and method - Google Patents

Automatic optical inspection system and method

Info

Publication number
TW200504349A
TW200504349A TW092136716A TW92136716A TW200504349A TW 200504349 A TW200504349 A TW 200504349A TW 092136716 A TW092136716 A TW 092136716A TW 92136716 A TW92136716 A TW 92136716A TW 200504349 A TW200504349 A TW 200504349A
Authority
TW
Taiwan
Prior art keywords
optical inspection
inspection system
automatic optical
aoi
verification
Prior art date
Application number
TW092136716A
Other languages
English (en)
Other versions
TWI333058B (en
Inventor
Michael Levi
Doron Aspir
Bernard Solomon
Elad Fridman
Original Assignee
Orbotech Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Orbotech Ltd filed Critical Orbotech Ltd
Publication of TW200504349A publication Critical patent/TW200504349A/zh
Application granted granted Critical
Publication of TWI333058B publication Critical patent/TWI333058B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
TW092136716A 2002-12-24 2003-12-24 Automatic optical inspection system and method for manufacture of printed circuit boards TWI333058B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/327,115 US7203355B2 (en) 2002-12-24 2002-12-24 Automatic optical inspection system and method

Publications (2)

Publication Number Publication Date
TW200504349A true TW200504349A (en) 2005-02-01
TWI333058B TWI333058B (en) 2010-11-11

Family

ID=32594173

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092136716A TWI333058B (en) 2002-12-24 2003-12-24 Automatic optical inspection system and method for manufacture of printed circuit boards

Country Status (7)

Country Link
US (2) US7203355B2 (zh)
JP (1) JP2006515112A (zh)
KR (1) KR20050088416A (zh)
CN (1) CN100401312C (zh)
AU (1) AU2003288508A1 (zh)
TW (1) TWI333058B (zh)
WO (1) WO2004059567A2 (zh)

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CN102221563B (zh) * 2011-03-23 2013-05-08 梅州泰源科技有限公司 一种pcb电路板缺陷自动检查设备
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CN104281848B (zh) * 2013-07-01 2017-12-19 佛山市顺德区顺达电脑厂有限公司 光学影像校正系统
CN104698145A (zh) * 2013-12-05 2015-06-10 珠海格力电器股份有限公司 用于u形管的探伤装置
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CN104890372B (zh) * 2015-05-29 2017-03-29 歌尔股份有限公司 Pcb废板打标装置及其打标方法
CN105129408A (zh) * 2015-09-15 2015-12-09 黄石沪士电子有限公司 Pcb板自动光学检验装置及方法
CN105893670A (zh) * 2016-03-31 2016-08-24 国网福建省电力有限公司 变电站技改工程自动生成方法
CN105894187B (zh) * 2016-03-31 2021-05-04 国网福建省电力有限公司 一种变电站技改工程自动设计系统
CN106323600B (zh) * 2016-08-31 2020-04-24 武汉精测电子集团股份有限公司 一种级联分布式aoi缺陷检测系统及其检测方法
CN109115780A (zh) * 2017-06-23 2019-01-01 大陆泰密克汽车系统（上海）有限公司 用于监控多个自动光学检测设备的方法及其装置
CN107367682B (zh) * 2017-06-26 2019-11-19 王俊 印制电路板检修方法及系统
WO2019037019A1 (zh) * 2017-08-24 2019-02-28 深圳市华显光学仪器有限公司 自动坐标显微镜
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US11278375B2 (en) 2018-09-27 2022-03-22 Align Technology, Inc. Aligner damage prediction and mitigation
CN109540901A (zh) * 2018-11-02 2019-03-29 英业达(重庆)有限公司 自动光学检测不良信息反馈系统及方法
US11295444B2 (en) 2019-04-01 2022-04-05 Align Technology, Inc. Vision and geometric approaches to detect defects in dental appliances
TW202104876A (zh) * 2019-07-29 2021-02-01 由田新技股份有限公司 印刷電路板的檢修方法及其系統
CN111054638A (zh) * 2019-11-27 2020-04-24 奥特斯科技(重庆)有限公司 制造部件承载件的方法及在制造期间操控面板的设备
TW202208831A (zh) * 2020-08-21 2022-03-01 由田新技股份有限公司 集中式複判系統及方法
KR20220075071A (ko) 2020-11-27 2022-06-07 삼성디스플레이 주식회사 표시 장치 및 이의 불량 검사 방법
CN112669272A (zh) * 2020-12-22 2021-04-16 广州广合科技股份有限公司 一种aoi快速检测方法及快速检测系统
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Publication number Priority date Publication date Assignee Title
CN104568959A (zh) * 2013-10-15 2015-04-29 由田新技股份有限公司 一种检测混合类型待测物的方法
CN104568959B (zh) * 2013-10-15 2017-10-13 由田新技股份有限公司 一种检测混合类型待测物的方法

Also Published As

Publication number Publication date
JP2006515112A (ja) 2006-05-18
US7203355B2 (en) 2007-04-10
WO2004059567A3 (en) 2004-08-19
AU2003288508A1 (en) 2004-07-22
US20040120570A1 (en) 2004-06-24
WO2004059567A2 (en) 2004-07-15
TWI333058B (en) 2010-11-11
CN1732474A (zh) 2006-02-08
US7295696B2 (en) 2007-11-13
CN100401312C (zh) 2008-07-09
KR20050088416A (ko) 2005-09-06
US20070154081A1 (en) 2007-07-05
AU2003288508A8 (en) 2004-07-22

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