SU574172A3 - Спектрометр ионного рассе ни - Google Patents
Спектрометр ионного рассе ниInfo
- Publication number
- SU574172A3 SU574172A3 SU7502172007A SU2172007A SU574172A3 SU 574172 A3 SU574172 A3 SU 574172A3 SU 7502172007 A SU7502172007 A SU 7502172007A SU 2172007 A SU2172007 A SU 2172007A SU 574172 A3 SU574172 A3 SU 574172A3
- Authority
- SU
- USSR - Soviet Union
- Prior art keywords
- ions
- energy
- analyzer
- primary
- signal
- Prior art date
Links
- 238000004969 ion scattering spectroscopy Methods 0.000 title claims description 5
- 150000002500 ions Chemical class 0.000 claims description 47
- 238000001228 spectrum Methods 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 7
- 238000012935 Averaging Methods 0.000 claims description 6
- 238000010884 ion-beam technique Methods 0.000 claims description 6
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 235000002566 Capsicum Nutrition 0.000 claims 1
- 206010011703 Cyanosis Diseases 0.000 claims 1
- 239000006002 Pepper Substances 0.000 claims 1
- 235000016761 Piper aduncum Nutrition 0.000 claims 1
- 235000017804 Piper guineense Nutrition 0.000 claims 1
- 244000203593 Piper nigrum Species 0.000 claims 1
- 235000008184 Piper nigrum Nutrition 0.000 claims 1
- 238000004458 analytical method Methods 0.000 claims 1
- 238000006243 chemical reaction Methods 0.000 claims 1
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000005215 recombination Methods 0.000 description 1
- 230000006798 recombination Effects 0.000 description 1
- 210000004761 scalp Anatomy 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/295—Electron or ion diffraction tubes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/282—Static spectrometers using electrostatic analysers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Plasma & Fusion (AREA)
- Engineering & Computer Science (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US507713A US3920989A (en) | 1974-09-20 | 1974-09-20 | Ion scattering spectrometer utilizing charge exchange processes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SU574172A3 true SU574172A3 (ru) | 1977-09-25 |
Family
ID=24019819
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SU7502172007A SU574172A3 (ru) | 1974-09-20 | 1975-09-19 | Спектрометр ионного рассе ни |
Country Status (9)
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0722011B2 (ja) * | 1983-03-30 | 1995-03-08 | 日新電機株式会社 | 高分解能イオン散乱分析装置 |
| IT1246375B (it) * | 1990-04-11 | 1994-11-18 | Consiglio Nazionale Ricerche | Apparecchiatura e metodo per la determinazione assoluta dell'energia di un fascio di ioni |
| JP2642881B2 (ja) * | 1994-09-28 | 1997-08-20 | 東京大学長 | 低速多価イオンによる超高感度水素検出法 |
| US10206273B2 (en) * | 2017-01-18 | 2019-02-12 | Phoenix Llc | High power ion beam generator systems and methods |
| CN114252653B (zh) * | 2021-01-06 | 2023-12-12 | 中国科学院物理研究所 | 超快成像装置及其方法 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3480774A (en) * | 1967-05-26 | 1969-11-25 | Minnesota Mining & Mfg | Low-energy ion scattering apparatus and method for analyzing the surface of a solid |
| US3665182A (en) * | 1969-08-18 | 1972-05-23 | Minnesota Mining & Mfg | Elemental analyzing apparatus |
| US3665185A (en) * | 1970-10-19 | 1972-05-23 | Minnesota Mining & Mfg | Ion scattering spectrometer with neutralization |
-
1974
- 1974-09-20 US US507713A patent/US3920989A/en not_active Expired - Lifetime
-
1975
- 1975-07-22 NL NL7508730A patent/NL7508730A/xx not_active Application Discontinuation
- 1975-08-25 CA CA234,059A patent/CA1021882A/en not_active Expired
- 1975-09-19 FR FR7528800A patent/FR2285610A1/fr active Granted
- 1975-09-19 SU SU7502172007A patent/SU574172A3/ru active
- 1975-09-19 JP JP11353375A patent/JPS5435957B2/ja not_active Expired
- 1975-09-19 CH CH1216675A patent/CH594249A5/xx not_active IP Right Cessation
- 1975-09-19 GB GB38626/75A patent/GB1526787A/en not_active Expired
- 1975-09-19 DE DE2542362A patent/DE2542362C3/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1526787A (en) | 1978-09-27 |
| DE2542362C3 (de) | 1980-01-17 |
| JPS5157494A (enrdf_load_stackoverflow) | 1976-05-19 |
| FR2285610A1 (fr) | 1976-04-16 |
| NL7508730A (nl) | 1976-03-23 |
| DE2542362A1 (de) | 1976-04-01 |
| DE2542362B2 (de) | 1979-05-23 |
| FR2285610B1 (enrdf_load_stackoverflow) | 1981-08-07 |
| CA1021882A (en) | 1977-11-29 |
| JPS5435957B2 (enrdf_load_stackoverflow) | 1979-11-06 |
| US3920989A (en) | 1975-11-18 |
| CH594249A5 (enrdf_load_stackoverflow) | 1977-12-30 |
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